[go: up one dir, main page]

JPH0537013A - Injection type light emitting element and manufacture thereof - Google Patents

Injection type light emitting element and manufacture thereof

Info

Publication number
JPH0537013A
JPH0537013A JP3190388A JP19038891A JPH0537013A JP H0537013 A JPH0537013 A JP H0537013A JP 3190388 A JP3190388 A JP 3190388A JP 19038891 A JP19038891 A JP 19038891A JP H0537013 A JPH0537013 A JP H0537013A
Authority
JP
Japan
Prior art keywords
junction
light emitting
direct transition
porous silicon
transition type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3190388A
Other languages
Japanese (ja)
Inventor
Hajime Inuzuka
肇 犬塚
Kunihiko Hara
邦彦 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
NipponDenso Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NipponDenso Co Ltd filed Critical NipponDenso Co Ltd
Priority to JP3190388A priority Critical patent/JPH0537013A/en
Publication of JPH0537013A publication Critical patent/JPH0537013A/en
Pending legal-status Critical Current

Links

Landscapes

  • Led Devices (AREA)

Abstract

PURPOSE:To provide an injection type light emitting element, in which novel silicon is used. CONSTITUTION:Direct transition type porous silicon 8 has pn junction. The electrodes 10, 11 are arranged on both sides of pn junction of the direct transition type porous silicon 8. Then, inter electrode voltage impression causes injection of a small number of carriers in the direct transition type porous silicon 8 and recrystallization of carriers in the junction part so as to emit light.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は注入形発光素子に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an injection type light emitting device.

【0002】[0002]

【従来の技術】従来、可視の発光素子は、III −V族半
導体を代表とする化合物半導体材料によってのみ実現さ
れてきた。
2. Description of the Related Art Hitherto, visible light emitting devices have been realized only by compound semiconductor materials represented by III-V semiconductors.

【0003】[0003]

【発明が解決しようとする課題】しかし、化合物半導体
は材料のもつ機械的脆さ、毒性、安定な表面保護膜のな
いこと等が理由で、その特異な高機能が備わっているに
もかかわらず、シリコン半導体デバイスの如き爆発的な
技術進展並びに応用展開が図られてこなかった。従っ
て、もしシリコン半導体材料を用いて発光素子を実現で
きれば高度に進化したシリコンULSI技術に支えられ
て発光素子の急速なシリコン化が図られ、安全かつ低コ
スト化の革新が遂げられることは疑う余地がない。
However, the compound semiconductor has a unique high function because of its mechanical brittleness, toxicity, and lack of a stable surface protective film. , Explosive technological progress and application development such as silicon semiconductor devices have not been achieved. Therefore, if it is possible to realize a light emitting device using a silicon semiconductor material, there is no doubt that the rapid evolution of the light emitting device into silicon will be supported by the highly evolved silicon ULSI technology and the innovation of safe and low cost will be achieved. There is no.

【0004】この発明の目的は、新規なシリコンを用い
た注入形発光素子を提供することにある。
An object of the present invention is to provide a novel injection type light emitting device using silicon.

【0005】[0005]

【課題を解決するための手段】第1の発明は、pn接合
を有する直接遷移型多孔質シリコンと、前記直接遷移型
多孔質シリコンのpn接合の両側に配置された電極とを
備えた注入形発光素子をその要旨とする。
A first aspect of the present invention is an injection type device including a direct transition type porous silicon having a pn junction and electrodes arranged on both sides of the pn junction of the direct transition type porous silicon. A light-emitting element will be the gist.

【0006】第2の発明は、pn接合を有する単結晶シ
リコン基板を形成する第1工程と、前記pn接合部を含
む前記単結晶シリコン基板に陽極化成処理を行い、pn
接合を有する直接遷移型多孔質シリコンを形成する第2
工程と、前記直接遷移型多孔質シリコンの端部及び単結
晶シリコン基板にそれぞれ電極を形成する第3工程とを
備えた注入形発光素子の製造方法をその要旨とするもの
である。
A second aspect of the present invention is the first step of forming a single crystal silicon substrate having a pn junction, and the single crystal silicon substrate including the pn junction is anodized to form a pn junction.
Second Forming Direct Transition Type Porous Silicon With Bonding
The gist of the method is a method of manufacturing an injection type light emitting device, which includes a step and a third step of forming electrodes on the ends of the direct transition type porous silicon and the single crystal silicon substrate, respectively.

【0007】[0007]

【作用】第1の発明は、pn接合に対し順バイアスとな
るように、電極間に電圧を印加すると、直接遷移型多孔
質シリコンに少数キャリアの注入が起こり、pn接合部
でキャリアの再結合が起こり発光する。
According to the first invention, when a voltage is applied between the electrodes so that the pn junction is forward biased, minority carriers are directly injected into the transition type porous silicon, and the carriers are recombined at the pn junction. Occurs and emits light.

【0008】第2の発明は、第1工程によりpn接合を
有する単結晶シリコン基板が形成され、第2工程により
pn接合部を含む単結晶シリコン基板に陽極化成処理が
行われ、pn接合を有する直接遷移型多孔質シリコンが
形成される。さらに、第3工程により直接遷移型多孔質
シリコンの端部及び単結晶シリコン基板に電極がそれぞ
れ形成される。その結果、第1の発明の注入形発光素子
が製造される。
According to a second aspect of the present invention, a single crystal silicon substrate having a pn junction is formed in the first step, and a single crystal silicon substrate including a pn junction is anodized in the second step to have a pn junction. Direct transition type porous silicon is formed. Further, in the third step, electrodes are formed on the ends of the direct transition type porous silicon and the single crystal silicon substrate, respectively. As a result, the injection type light emitting device of the first invention is manufactured.

【0009】[0009]

【実施例】以下、この発明を具体化した一実施例を図面
に従って説明する。図1には本実施例の注入形発光素子
を示す。又、図2〜図6にはその製造工程を示す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 shows an injection type light emitting device of this example. 2 to 6 show the manufacturing process.

【0010】まず、図2に示すように、n型又はp型単
結晶シリコン基板1を用意し、単結晶シリコン基板1の
表面層に公知のイオン注入技術又は熱拡散技術によって
基板と反対の導電型の導電層2を形成してpn接合を形
成する。その後、単結晶シリコン基板1を洗浄液(硫酸
4:過酸化水素水1)にて洗浄する。
First, as shown in FIG. 2, an n-type or p-type single crystal silicon substrate 1 is prepared, and the surface layer of the single crystal silicon substrate 1 is made to have a conductivity opposite to that of the substrate by a known ion implantation technique or thermal diffusion technique. A conductive layer 2 of the mold is formed to form a pn junction. Then, the single crystal silicon substrate 1 is washed with a washing liquid (sulfuric acid 4: hydrogen peroxide solution 1).

【0011】引き続き、図3に示すように、単結晶シリ
コン基板1の裏面側にアルミ電極板3を配置し、導電層
2の表面が露出するように、アルミ電極板3をアルミ保
護用ワックス4で覆う。さらに、このようにした単結晶
シリコン基板1を濃度約25%のフッ酸5に浸し、白金
電極6を対向配置する。そして、単結晶シリコン基板1
を陽極とし、白金電極6を陰極として定電流源7から電
流を流して、単結晶シリコン基板1の表面部分を陽極化
成処理する。
Subsequently, as shown in FIG. 3, an aluminum electrode plate 3 is arranged on the back surface side of the single crystal silicon substrate 1, and the aluminum electrode plate 3 is covered with an aluminum protective wax 4 so that the surface of the conductive layer 2 is exposed. Cover with. Further, the thus-formed single crystal silicon substrate 1 is dipped in hydrofluoric acid 5 having a concentration of about 25%, and platinum electrodes 6 are arranged facing each other. Then, the single crystal silicon substrate 1
As an anode and a platinum electrode 6 as a cathode to flow a current from a constant current source 7 to anodize the surface portion of the single crystal silicon substrate 1.

【0012】これは、フッ酸5中において、O2-とOH
- が単結晶シリコン基板1に引きつけられ、単結晶シリ
コン基板1の表面においてO2-とOH- の電子が奪われ
活性な酸素が発生する。そして、この活性な酸素にてS
iO2 が形成され、このSiO2 がフッ酸5にて溶解さ
れる。このようなメカニズムのもとに陽極化成処理が行
われ、図4に示すように、pn接合部を含む単結晶シリ
コン基板1に、径が50Å程度の柱状の直接遷移型多孔
質シリコン8が形成される。この直接遷移型多孔質シリ
コン8内にpn接合を有することとなる。尚、図3中、
13は電流計である。
This is because O 2- and OH in hydrofluoric acid 5
Is attracted to the single crystal silicon substrate 1, electrons on O 2− and OH are deprived of the surface of the single crystal silicon substrate 1, and active oxygen is generated. Then, with this active oxygen, S
iO 2 is formed, and this SiO 2 is dissolved by hydrofluoric acid 5. The anodization treatment is performed under such a mechanism, and as shown in FIG. 4, the columnar direct transition type porous silicon 8 having a diameter of about 50 Å is formed on the single crystal silicon substrate 1 including the pn junction. To be done. The direct transition type porous silicon 8 has a pn junction. In addition, in FIG.
13 is an ammeter.

【0013】尚、pn接合部が逆バイアスとなる場合に
はシリコン基板1の表面に光を照射し、陽極化成に必要
な電流を流すようにすればよい。
When the pn junction is reversely biased, the surface of the silicon substrate 1 may be irradiated with light so that a current necessary for anodization may flow.

【0014】次に、希フッ酸中に単結晶シリコン基板1
を浸漬して直接遷移型多孔質シリコン8の表面に残って
いる酸化皮膜を除去する。引き続き、図5に示すよう
に、直接遷移型多孔質シリコン8を酸化して直接遷移型
多孔質シリコン8の空間に絶縁性充填材としてのSiO
2 9を満たし固定化する。尚、SiO2 9の代わりに絶
縁コーティング材を用いてもよい。
Next, the single crystal silicon substrate 1 is immersed in dilute hydrofluoric acid.
Is immersed to directly remove the oxide film remaining on the surface of the transition type porous silicon 8. Subsequently, as shown in FIG. 5, the direct transition type porous silicon 8 is oxidized to form SiO as an insulating filler in the space of the direct transition type porous silicon 8.
Immobilizing meet the 2 9. An insulating coating material may be used instead of SiO 2 .

【0015】さらに、図6に示すように、直接遷移型多
孔質シリコン8の表面を露出させる。そして、図1に示
すように、蒸着法により直接遷移型多孔質シリコン8の
表面に金属よりなる電極10を形成する。この電極10
は、ITOや金等による透明導電性薄膜が使用される。
さらに、単結晶シリコン基板1の裏面に電極11を形成
する。尚、図1中、12は直接遷移型多孔質シリコン8
を覆う保護膜である。
Further, as shown in FIG. 6, the surface of the direct transition type porous silicon 8 is exposed. Then, as shown in FIG. 1, an electrode 10 made of metal is formed directly on the surface of the transition type porous silicon 8 by a vapor deposition method. This electrode 10
For, a transparent conductive thin film made of ITO, gold, or the like is used.
Further, the electrode 11 is formed on the back surface of the single crystal silicon substrate 1. In FIG. 1, 12 is a direct transition type porous silicon 8
Is a protective film that covers.

【0016】次に、上記のように構成した注入形発光素
子の作用を説明する。両電極10,11を通してpn接
合に順バイアスを印加すれば、直接遷移型多孔質シリコ
ン8でのそれぞれの領域に少数キャリアの注入が起こ
り、pn接合付近ではそれらの再結合が起こり、発光す
る。発光波長は図7に示すように、直接遷移型多孔質シ
リコン8のバンド間遷移に基づく発光(イ)、ドナー電
子と自由正孔の再結合に基づく発光(ロ)、自由電子と
アクセプタ正孔の再結合に基づく発光(ハ)のそれぞれ
単独又は合成の発光が得られる。
Next, the operation of the injection type light emitting device constructed as above will be described. When a forward bias is applied to the pn junction through both electrodes 10 and 11, minority carriers are injected into the respective regions of the direct transition type porous silicon 8 and recombination occurs near the pn junction to emit light. As shown in FIG. 7, the emission wavelength is based on the band-to-band transition of the direct transition type porous silicon 8 (a), the emission based on the recombination of the donor electron and the free hole (b), the free electron and the acceptor hole. Emissions (c) based on the recombination of the above can be obtained individually or in combination.

【0017】このように本実施例では、pn接合を有す
る単結晶シリコン基板1を形成し(第1工程)、pn接
合部を含む単結晶シリコン基板1に陽極化成処理を行
い、pn接合を有する直接遷移型多孔質シリコン8を形
成し(第2工程)、直接遷移型多孔質シリコン8の端部
及び単結晶シリコン基板1にそれぞれ電極10,11を
形成した(第3工程)。
As described above, in this embodiment, the single crystal silicon substrate 1 having the pn junction is formed (first step), and the single crystal silicon substrate 1 including the pn junction is subjected to anodization treatment to have the pn junction. The direct transition type porous silicon 8 was formed (second step), and the electrodes 10 and 11 were formed on the end portion of the direct transition type porous silicon 8 and the single crystal silicon substrate 1 (third step).

【0018】その結果、pn接合を有する直接遷移型多
孔質シリコン8と、直接遷移型多孔質シリコン8のpn
接合の両側に配置された電極10,11とを備えた注入
形発光素子が製造される。この素子においては、電極間
の電圧印加により、直接遷移型多孔質シリコン8に少数
キャリアの注入が起こり、pn接合部でキャリアの再結
合が起こり発光する。このようにして、新規なシリコン
を用いた注入形発光素子とすることができる。
As a result, the direct transition type porous silicon 8 having a pn junction and the pn of the direct transition type porous silicon 8 are formed.
An injection type light emitting device is manufactured with electrodes 10 and 11 arranged on both sides of the junction. In this element, minority carriers are directly injected into the transition type porous silicon 8 by applying a voltage between the electrodes, and carriers are recombined at the pn junction to emit light. In this way, a novel injection type light emitting device using silicon can be obtained.

【0019】又、直接遷移型多孔質シリコン8の空間に
はSiO2 9(絶縁性充填材)が満たされ固定化してい
るので、直接遷移型多孔質シリコン8の強度を強くする
ことができる。
Further, since the space of the direct transition type porous silicon 8 is filled with and fixed by SiO 2 9 (insulating filler), the strength of the direct transition type porous silicon 8 can be increased.

【0020】[0020]

【発明の効果】以上詳述したようにこの発明によれば、
新規なシリコンを用いた注入形発光素子を提供すること
ができる優れた効果を発揮する。
As described above in detail, according to the present invention,
It exhibits an excellent effect of being able to provide an injection type light emitting device using a novel silicon.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例の注入形発光素子を示す図である。FIG. 1 is a diagram showing an injection type light emitting device of an example.

【図2】注入形発光素子の製造工程図である。FIG. 2 is a manufacturing process diagram of an injection type light emitting device.

【図3】注入形発光素子の製造工程図である。FIG. 3 is a manufacturing process diagram of an injection type light emitting device.

【図4】注入形発光素子の製造工程図である。FIG. 4 is a manufacturing process diagram of an injection type light emitting device.

【図5】注入形発光素子の製造工程図である。FIG. 5 is a manufacturing process diagram of an injection type light emitting device.

【図6】注入形発光素子の製造工程図である。FIG. 6 is a manufacturing process diagram of an injection type light emitting device.

【図7】エネルギーバンド図である。FIG. 7 is an energy band diagram.

【符号の説明】[Explanation of symbols]

1 単結晶シリコン基板 8 直接遷移型多孔質シリコン 9 絶縁性充填材としてのSiO2 10 電極 11 電極1 Single Crystal Silicon Substrate 8 Direct Transition Type Porous Silicon 9 SiO 2 10 Insulating Filler 11 Electrode

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 pn接合を有する直接遷移型多孔質シリ
コンと、 前記直接遷移型多孔質シリコンのpn接合の両側に配置
された電極とを備えたことを特徴とする注入形発光素
子。
1. An injection type light emitting device comprising: a direct transition type porous silicon having a pn junction; and electrodes arranged on both sides of the pn junction of the direct transition type porous silicon.
【請求項2】 前記直接遷移型多孔質シリコンは、その
空間が絶縁性充填材にて満たされ固定化されているもの
である請求項1に記載の注入形発光素子。
2. The injection type light emitting device according to claim 1, wherein the space of the direct transition type porous silicon is filled with an insulating filler and fixed.
【請求項3】 pn接合を有する単結晶シリコン基板を
形成する第1工程と、 前記pn接合部を含む前記単結晶シリコン基板に陽極化
成処理を行い、pn接合を有する直接遷移型多孔質シリ
コンを形成する第2工程と、 前記直接遷移型多孔質シリコンの端部及び単結晶シリコ
ン基板にそれぞれ電極を形成する第3工程とを備えたこ
とを特徴とする注入形発光素子の製造方法。
3. A first step of forming a single crystal silicon substrate having a pn junction, and anodizing the single crystal silicon substrate including the pn junction to form a direct transition type porous silicon having a pn junction. 2. A method of manufacturing an injection type light emitting device, comprising: a second step of forming; and a third step of forming electrodes on the ends of the direct transition type porous silicon and the single crystal silicon substrate, respectively.
JP3190388A 1991-07-30 1991-07-30 Injection type light emitting element and manufacture thereof Pending JPH0537013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3190388A JPH0537013A (en) 1991-07-30 1991-07-30 Injection type light emitting element and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3190388A JPH0537013A (en) 1991-07-30 1991-07-30 Injection type light emitting element and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH0537013A true JPH0537013A (en) 1993-02-12

Family

ID=16257340

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3190388A Pending JPH0537013A (en) 1991-07-30 1991-07-30 Injection type light emitting element and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH0537013A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6033928A (en) * 1993-11-02 2000-03-07 Matsushita Electric Industrial Co., Ltd. Method of manufacturing aggregate of semiconductor micro-needles
US6734451B2 (en) 1993-11-02 2004-05-11 Matsushita Electric Industrial Co., Ltd. Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same
JP2008187038A (en) * 2007-01-30 2008-08-14 Hitachi Maxell Ltd Crystalline silicon element
ITUB20152264A1 (en) * 2015-07-17 2017-01-17 St Microelectronics Srl DEVICE FOR EMISSION OF LIGHT IN POROUS SILICON AND ITS RELATED MANUFACTURING METHOD

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6033928A (en) * 1993-11-02 2000-03-07 Matsushita Electric Industrial Co., Ltd. Method of manufacturing aggregate of semiconductor micro-needles
US6087197A (en) * 1993-11-02 2000-07-11 Matsushita Electric Industrial Co., Ltd. Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same
US6177291B1 (en) 1993-11-02 2001-01-23 Matsushita Electric Industrial Co., Ltd. Method of making aggregate of semiconductor micro-needles
US6489629B1 (en) 1993-11-02 2002-12-03 Matsushita Electric Industrial Co., Ltd. Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same
US6734451B2 (en) 1993-11-02 2004-05-11 Matsushita Electric Industrial Co., Ltd. Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same
JP2008187038A (en) * 2007-01-30 2008-08-14 Hitachi Maxell Ltd Crystalline silicon element
ITUB20152264A1 (en) * 2015-07-17 2017-01-17 St Microelectronics Srl DEVICE FOR EMISSION OF LIGHT IN POROUS SILICON AND ITS RELATED MANUFACTURING METHOD
EP3118905A1 (en) * 2015-07-17 2017-01-18 STMicroelectronics Srl Porous-silicon light-emitting device and manufacturing method thereof
CN106356434A (en) * 2015-07-17 2017-01-25 意法半导体股份有限公司 Porous-silicon light-emitting device and manufacturing method thereof
US10002990B2 (en) 2015-07-17 2018-06-19 Stmicroelectronics S.R.L. Porous-silicon light-emitting device and manufacturing method thereof
US10825954B2 (en) 2015-07-17 2020-11-03 Stmicroelectronics S.R.L. Porous-silicon light-emitting device and manufacturing method thereof

Similar Documents

Publication Publication Date Title
US3710167A (en) Organic electroluminescent cells having a tunnel injection cathode
US5458735A (en) Process for the production of electroluminescent silicon structures
JPH05347413A (en) Method for manufacturing semiconductor device
JPH10107316A (en) Group III nitride semiconductor light emitting device
JP3828933B2 (en) Electroluminescent device containing porous silicon
US6017773A (en) Stabilizing process for porous silicon and resulting light emitting device
US4017881A (en) Light emitting semiconductor device and a method for making the same
JPH0537013A (en) Injection type light emitting element and manufacture thereof
US3909319A (en) Planar structure semiconductor device and method of making the same
JP3106569B2 (en) Light emitting element
JPH0555627A (en) Injection light emitting element
JP3211874B2 (en) Method for manufacturing semiconductor device
JPH0690018A (en) Light emitting device and manufacturing method thereof
JP3395810B2 (en) Method for manufacturing porous silicon light emitting device
US3585071A (en) Method of manufacturing a semiconductor device including a semiconductor material of the aiibvi type,and semiconductor device manufactured by this method
JP3140573B2 (en) Si light emitting device and method of manufacturing the same
JPH05206514A (en) Light-emitting element
JPH036069A (en) Formation of protective film for semiconductor light emitting device
JP3027101B2 (en) Method for forming porous silicon
JP3405773B2 (en) Micro field emission cathode device and method of manufacturing the same
JPH0563075A (en) Manufacture of porous semiconductor layer
JPS6237831B2 (en)
JP4960737B2 (en) Porous silicon substrate, light emitting device using the same, and method for producing the same
JPS605559A (en) Electrode structure of semiconductor element
JPH0697499A (en) Light emitting element