[go: up one dir, main page]

JPH05274668A - Production of magnetic thin film - Google Patents

Production of magnetic thin film

Info

Publication number
JPH05274668A
JPH05274668A JP9881592A JP9881592A JPH05274668A JP H05274668 A JPH05274668 A JP H05274668A JP 9881592 A JP9881592 A JP 9881592A JP 9881592 A JP9881592 A JP 9881592A JP H05274668 A JPH05274668 A JP H05274668A
Authority
JP
Japan
Prior art keywords
film
substrate
iron oxide
thin film
magnetic thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP9881592A
Other languages
Japanese (ja)
Inventor
Yutaka Aikawa
豊 相川
Atsushi Nakajima
淳 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiyo Yuden Co Ltd
Original Assignee
Taiyo Yuden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiyo Yuden Co Ltd filed Critical Taiyo Yuden Co Ltd
Priority to JP9881592A priority Critical patent/JPH05274668A/en
Publication of JPH05274668A publication Critical patent/JPH05274668A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Application Of Or Painting With Fluid Materials (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To enable fine patterning of an iron oxide film formed on a substrate by preventing the formation of a layer which blocks etching by a reaction of the iron oxide film with the substrate when the iron oxide film is formed by chemical atomization deposition or sputtering and patterend by etching. CONSTITUTION:A ZnO film 2 and an alpha-Fe2O3 film are successively formed on a heated substrate 1 by spraying, an iron oxide (alpha-Fe2O3) film pattern 3 having a prescribed mask shape is formed by etching and a gamma-Fe2O3 film is obtd. by subjecting the pattern 3 to reduction and oxidation modification.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、微細パタ−ニングが可
能な磁性薄膜の製法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a magnetic thin film capable of fine patterning.

【0002】[0002]

【従来の技術】従来の磁性薄膜はその製法において、ま
ず基板上に酸化鉄(α−Fe2 3 )をスプレ−法や化
学的霧化堆積法(CMD:chemical Mist Deposition)等によ
り成膜し、それを水素還元処理してFe3 4 とし、さ
らに酸化処理によってγ−Fe2 3 に変性して所望の
磁性薄膜とすることにより得られる。
2. Description of the Related Art In the conventional manufacturing method of a magnetic thin film, iron oxide (α-Fe 2 O 3 ) is first formed on a substrate by a spray method or a chemical atomization deposition method (CMD). Then, it is subjected to hydrogen reduction treatment to obtain Fe 3 O 4, and further modified to γ-Fe 2 O 3 by oxidation treatment to obtain a desired magnetic thin film.

【0003】上記化学的霧化堆積法による成膜装置は、
給気器、霧化器および成膜室から構成され、霧化器は給
気器および成膜室のそれぞれと導管で接続されている容
器並びに超音波発振装置からなり、容器には磁性薄膜作
製用原料溶液が収容されている。
A film forming apparatus using the above chemical atomization deposition method is
It consists of an air supply device, an atomizer, and a film formation chamber. The atomization device consists of a container connected to each of the air supply device and the film formation chamber by a conduit and an ultrasonic oscillator, and a magnetic thin film is formed in the container. The raw material solution is stored.

【0004】製法の手順は、まず純水に所定量のFeC
3 ・6H2 Oとエタノ−ルとを加えて磁性薄膜作製用
原料溶液を調製し、成膜室内に置かれた基板をホットプ
レ−トで加熱しその表面を所定温度に保った後、容器内
に貯えられた上記原料溶液を超音波発振装置によって霧
化し、給気器からの送風によりミスト状の原料溶液粒子
を成膜室に供給し、上記基板の表面に成膜する。
The manufacturing procedure is as follows. First, pure water is mixed with a predetermined amount of FeC.
l 3 · 6H 2 O and ethanol - adding and Le to prepare a magnetic thin film forming raw material solution, a substrate placed in the deposition chamber hot plate - heated with bets after maintaining the surface at a predetermined temperature, the container The raw material solution stored therein is atomized by an ultrasonic oscillating device, and mist-like raw material solution particles are supplied to the film forming chamber by blowing air from an air supply device to form a film on the surface of the substrate.

【0005】[0005]

【発明が解決しようとする課題】磁性薄膜のパタ−ニン
グは、化学的霧化堆積法により成膜した酸化鉄(α−F
2 3 )が塩酸に可溶なため酸化鉄の薄膜が形成され
た段階で行われるが、該薄膜は基板と強固に結合し基板
との境界部に基板と酸化鉄との反応層が形成されている
のでエッチングによるパタ−ニングが容易でない。この
反応層は通常は塩酸に浸漬するだけでは溶けないので亜
鉛粉を塗布してから塩酸に浸漬する工程を10回以上繰
り返し、さらに必要な場合には弗酸処理を施すことによ
りエッチングを完了する。
The patterning of a magnetic thin film is carried out by iron atomization (α-F) formed by a chemical atomization deposition method.
Since e 2 O 3 ) is soluble in hydrochloric acid, it is performed at the stage when a thin film of iron oxide is formed. The thin film is firmly bonded to the substrate and a reaction layer between the substrate and iron oxide is formed at the boundary with the substrate. Since it is formed, patterning by etching is not easy. Since this reaction layer does not usually dissolve only by dipping in hydrochloric acid, the steps of applying zinc powder and then dipping in hydrochloric acid are repeated 10 times or more, and if necessary, hydrofluoric acid treatment is applied to complete etching. ..

【0006】しかしこのようなエッチング工程の間にフ
ァインパタ−ンを形成するフォトレジストあるいはラフ
パタ−ンを形成する印刷レジストが侵食を受けるためレ
ジスト剥離後、パタ−ンの細りや断線などの不良となっ
て現れるという課題があった。
However, during the etching process, the photoresist forming the fine pattern or the printing resist forming the rough pattern is corroded, so that after the resist is peeled off, defects such as thinning of the pattern and disconnection may occur. There was a problem that appeared.

【0007】したがって本発明の目的は、基板上に酸化
鉄膜を化学的霧化堆積法やスプレ−法によって成膜し、
これをエッチングによりパタ−ニングする際、エッチン
グの阻害要因となる基板と酸化鉄膜との反応層が酸化鉄
膜の成膜時に形成されないようにしてエッチングによる
微細パタ−ニングが可能となるようにすることを特徴と
する磁性薄膜の製法を提供することにある。
Therefore, an object of the present invention is to form an iron oxide film on a substrate by a chemical atomization deposition method or a spray method,
When this is patterned by etching, it is possible to perform fine patterning by etching so that the reaction layer of the substrate and the iron oxide film, which is a factor that inhibits etching, is not formed during the formation of the iron oxide film. Another object of the present invention is to provide a method for producing a magnetic thin film.

【0008】[0008]

【課題を解決するための手段】本発明者は上記目的を達
成すべく研究の結果、以下に述べる成膜手順に従って基
板上に薄膜を形成した後、さらにこの薄膜に還元および
酸化処理を施すようにすれば、前記課題が解決され、精
度良く、微細パタ−ニングされた磁性薄膜が得られるこ
とを見出し、本発明に到達した。
Means for Solving the Problems As a result of research to achieve the above object, the present inventor found that a thin film was formed on a substrate according to the film forming procedure described below, and then the thin film was further subjected to reduction and oxidation treatments. The inventors have found that the above-mentioned problems can be solved, and a magnetic thin film can be obtained with high precision and fine patterning, and have reached the present invention.

【0009】すなわち本発明は、(イ)加熱した基板上
方から酢酸亜鉛の水溶液またはエタノ−ル溶液を化学的
霧化堆積法またはスプレ−法により適用して基板上にZ
nO膜を成膜する第1工程、(ロ)鉄化合物を溶媒に溶
解させた磁性薄膜作製用原料液を加熱した基板上方から
化学的霧化堆積法またはスプレ−法により適用して該Z
nO膜上にα−Fe2 3 膜を成膜する第2工程、
(ハ)成膜されたα−Fe2 3 膜にフォトレジストを
均一に塗布し、所定のマスクに合わせて紫外線を照射
し、未照射の非硬化レジストを溶解してα−Fe2 3
膜を露出させた後、エッチングにより該露出部分のα−
Fe2 3 膜を除去して所定のマスクパターンに対応す
るα−Fe2 3 膜パタ−ンを形成する第3工程、
(ニ)該パタ−ニングされたα−Fe2 3 膜を水素還
元処理してFe3 4 膜とし、さらに酸化・変性してγ
−Fe2 3 膜とする第4工程からなることを特徴とす
る磁性薄膜の製法を提供する。尚、形成する酸化亜鉛膜
の膜厚は、50〜1000nmが望ましい。50nmよ
り薄いと、かえって反応層が発生してしまい、望ましく
なく、1000nmより厚いと、製造困難すなわち、量
産効率が悪くなるからである。本発明の効果および量産
効率を考えると、特に100〜200nmの膜厚が最適
である。また、本明細書における実施例では、スプレー
法を用いたが、公知である化学的霧化堆積法によれば、
より一層量産が容易となる。
That is, according to the present invention, (a) an aqueous solution or ethanol solution of zinc acetate is applied from above the heated substrate by a chemical atomization deposition method or a spray method to form Z on the substrate.
The first step of forming an nO film, (b) applying the raw material liquid for magnetic thin film in which an iron compound is dissolved in a solvent is applied from above the heated substrate by a chemical atomization deposition method or a spray method
a second step of forming an α-Fe 2 O 3 film on the nO film,
(C) A photoresist is evenly applied to the formed α-Fe 2 O 3 film, and ultraviolet rays are irradiated according to a predetermined mask to dissolve the unirradiated uncured resist to dissolve α-Fe 2 O 3
After exposing the film, the α-
Fe 2 O 3 film is removed corresponding to a predetermined mask pattern alpha-Fe 2 O 3 film patterns - a third step of forming a down,
(D) The patterned α-Fe 2 O 3 film is subjected to hydrogen reduction treatment to form a Fe 3 O 4 film, which is further oxidized and modified to give γ.
Provided is a method for producing a magnetic thin film, which comprises a fourth step of forming a —Fe 2 O 3 film. The thickness of the zinc oxide film formed is preferably 50 to 1000 nm. If the thickness is less than 50 nm, a reaction layer is rather generated, which is not desirable, and if the thickness is more than 1000 nm, it is difficult to manufacture, that is, mass production efficiency is deteriorated. Considering the effect of the present invention and the mass production efficiency, a film thickness of 100 to 200 nm is particularly optimal. Further, in the examples of the present specification, the spray method was used, but according to the known chemical atomization deposition method,
Mass production becomes easier.

【0010】[0010]

【作用】酸化亜鉛は成膜条件により結晶配向性を制御す
ることが可能であり、これを下地としてその上に成膜す
る酸化鉄のエピタキシ−を制御することができる。すな
わち、酸化亜鉛の(100)配向の上にα−Fe2 3
の(0001)配向が成長し易く、さらにα−Fe2
3 の(0001)結晶軸は水素還元処理によって生じる
Fe3 4 (マグネタイト)の(111)結晶軸の方向
に一致する。ゆえに酸化亜鉛の初期の配向性が最終的に
生じるマグネタイトの配向性に影響する。
[Function] Zinc oxide can control the crystal orientation depending on the film forming conditions, and can control the epitaxy of the iron oxide film formed on the zinc oxide as a base. That is, α-Fe 2 O 3 is formed on the (100) orientation of zinc oxide.
(0001) orientation easily grows, and α-Fe 2 O
3 (0001) crystal axis coincides with the direction of the (111) crystal axes of Fe 3 O 4 produced by the hydrogen reduction treatment (magnetite). Therefore, the initial orientation of zinc oxide affects the orientation of the finally produced magnetite.

【0011】また、酸化亜鉛膜のエッチングは塩酸のみ
で容易に可能なため、この上に成膜した酸化鉄膜をエッ
チングによりパタ−ニングするとパタ−ンの凹部は酸化
亜鉛膜ごと払拭されるためエッチングが容易であり、反
応層が残らない。以下実施例により、さらに詳しく説明
する。
Further, since the zinc oxide film can be easily etched only with hydrochloric acid, when the iron oxide film formed thereon is patterned by etching, the recesses of the pattern are wiped off together with the zinc oxide film. Etching is easy and no reaction layer remains. This will be described in more detail with reference to the following examples.

【0012】[0012]

【実施例1】図1は本発明の実施例において、ガラス基
板上に成膜される酸化鉄磁性体パタ−ンを示す模式断面
図である。以下この図を参照して本発明の製法における
手順を説明する。 (1)ガラス基板を70mm角にスクライブし、溶剤およ
び純水による洗浄を行った。 (2)該基板1を400℃に加熱されたホットプレ−ト
上に設置し、基板上方から化学的霧化堆積法により酢酸
亜鉛0.05モル%のエタノ−ル溶液をスプレ−し、膜
厚100nmのZnO膜2を成膜した。 (3)純水150mlにFeCl3 ・6H2 Oを40g
溶解しさらにエタノ−ル15mlを加え磁性薄膜作製用
原料液とした。そして該基板を300℃に加熱されたホ
ットプレ−ト上に設置し、基板上方から前記原料液を用
いて化学的霧化堆積法により膜厚1μmのα−Fe2
3 (ヘマタイト)膜を成膜した。 (4)該基板にフォトレジストを均一に塗布し、120
℃で30分間プレベ−クした後、所定のマスクに合わせ
て紫外線を照射し、未照射のレジストを溶解除去して酸
化鉄膜を露出させた。続いて該基板を150℃で30分
間プレベ−クし、エッチング液(HCl)中に置き、露
出した部分の酸化鉄膜を除去した後、溶剤でレジストを
剥離して所定のマスク形状の酸化鉄膜パタ−ン3を形成
した。 (5)次いで前記のパタ−ニングされたヘマタイト膜を
水素ガス中350℃付近での還元を行いFe3 4 (マ
グネタイト)膜にした。 (6)さらに、酸化処理を施してFe3 4 膜をγ−F
2 3 (マグヘマイト)膜に変性して所望の磁性薄膜
とした。
[Embodiment 1] FIG. 1 is a schematic sectional view showing an iron oxide magnetic material pattern formed on a glass substrate in an embodiment of the present invention. The procedure in the manufacturing method of the present invention will be described below with reference to this figure. (1) A glass substrate was scribed in a 70 mm square and washed with a solvent and pure water. (2) The substrate 1 was placed on a hot plate heated to 400 ° C., and an ethanol solution of 0.05 mol% zinc acetate was sprayed from above the substrate by a chemical atomization deposition method to obtain a film thickness. A ZnO film 2 having a thickness of 100 nm was formed. (3) 40 g of FeCl 3 .6H 2 O in 150 ml of pure water
After dissolving, 15 ml of ethanol was further added to prepare a raw material liquid for producing a magnetic thin film. Then, the substrate was placed on a hot plate heated to 300 ° C., and α-Fe 2 O having a film thickness of 1 μm was formed from above the substrate by a chemical atomization deposition method using the raw material liquid.
A 3 (hematite) film was formed. (4) A photoresist is uniformly applied to the substrate, and 120
After prebaking at 30 ° C. for 30 minutes, ultraviolet rays were irradiated according to a predetermined mask to dissolve and remove the unirradiated resist to expose the iron oxide film. Subsequently, the substrate was prebaked at 150 ° C. for 30 minutes, placed in an etching solution (HCl) to remove the exposed portion of the iron oxide film, and then the resist was peeled off with a solvent to form an iron oxide having a predetermined mask shape. A membrane pattern 3 was formed. (5) Next, the patterned hematite film was reduced in hydrogen gas at around 350 ° C. to form a Fe 3 O 4 (magnetite) film. (6) Further, the Fe 3 O 4 film is subjected to oxidation treatment to form γ-F.
An e 2 O 3 (maghemite) film was modified to obtain a desired magnetic thin film.

【0013】[0013]

【比較例】実施例の手順(2)を省略した他は実施例と
同様な手順によりガラス基板上に所定のマスク形状に従
って酸化鉄膜パタ−ンを形成し、還元処理および酸化に
よる変性を行ったが、前記反応層生成のためのパタ−ニ
ングの際フォトレジストの細りが見られた。
[Comparative Example] An iron oxide film pattern was formed on a glass substrate according to a predetermined mask shape by the same procedure as in Example except that the step (2) in Example was omitted, and reduction treatment and modification by oxidation were performed. However, thinning of the photoresist was observed during the patterning for forming the reaction layer.

【0014】[0014]

【発明の効果】以上説明したように本発明の方法によれ
ば、基板と酸化鉄膜との間に1層の酸化亜鉛膜が設けら
れるので、基板と酸化鉄膜との間の反応層の析出が防止
されるためエッチングが容易となり、さらに酸化亜鉛の
結晶配向性を制御することにより、その上に成膜する酸
化鉄のエピタキシアル成長による配向性を初期のうちに
制御できるため最終的に所望の配向性をもつ磁性薄膜の
作製が容易となる。
As described above, according to the method of the present invention, since one layer of the zinc oxide film is provided between the substrate and the iron oxide film, the reaction layer between the substrate and the iron oxide film is formed. Etching is facilitated because precipitation is prevented.Furthermore, by controlling the crystal orientation of zinc oxide, it is possible to control the orientation due to the epitaxial growth of the iron oxide formed on the zinc oxide in the initial stage. The magnetic thin film having a desired orientation can be easily manufactured.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例において、ガラス基板上に成
膜された酸化鉄膜パタ−ンを示す模式断面図である。
FIG. 1 is a schematic cross-sectional view showing an iron oxide film pattern formed on a glass substrate in one embodiment of the present invention.

【図2】従来の磁性薄膜の製法において、ガラス基板上
に成膜された酸化鉄膜パタ−ンを示す模式断面図であ
る。
FIG. 2 is a schematic cross-sectional view showing an iron oxide film pattern formed on a glass substrate in a conventional method for producing a magnetic thin film.

【符号の説明】[Explanation of symbols]

1 ガラス基板 2 酸化亜鉛膜 3 酸化鉄膜パタ−ン 1 glass substrate 2 zinc oxide film 3 iron oxide film pattern

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 (イ)加熱した基板上方から酢酸亜鉛の
水溶液またはエタノ−ル溶液を化学的霧化堆積法または
スプレ−法により適用して基板上にZnO膜を成膜する
第1工程、(ロ)鉄化合物を溶媒に溶解させた磁性薄膜
作製用原料液を加熱した基板上方から化学的霧化堆積法
またはスプレ−法により適用して該ZnO膜上にα−F
2 3 膜を成膜する第2工程、(ハ)成膜されたα−
Fe23 膜にフォトレジストを均一に塗布し、所定の
マスクに合わせて紫外線を照射し、未照射の非硬化レジ
ストを溶解してα−Fe2 3 膜を露出させた後、エッ
チングにより該露出部分のα−Fe2 3 膜を除去して
所定のマスクパターンに対応するα−Fe2 3 膜パタ
−ンを形成する第3工程、(ニ)該パタ−ニングされた
α−Fe2 3 膜を水素還元処理してFe3 4 膜と
し、さらに酸化・変性してγ−Fe2 3 膜とする第4
工程からなることを特徴とする磁性薄膜の製法。
1. A first step of forming a ZnO film on a substrate by applying an aqueous solution of zinc acetate or an ethanol solution from above the heated substrate by a chemical atomization deposition method or a spray method, (B) A raw material liquid for magnetic thin film preparation in which an iron compound is dissolved in a solvent is applied from above the heated substrate by a chemical atomization deposition method or a spray method to form α-F on the ZnO film.
The second step of forming the e 2 O 3 film, (c) the formed α-
Photoresist is uniformly applied to the Fe 2 O 3 film, ultraviolet rays are irradiated according to a predetermined mask, the unirradiated uncured resist is dissolved to expose the α-Fe 2 O 3 film, and then etching is performed. third step of forming a down, (d) said pattern - - the exposed portion of the alpha-Fe 2 O 3 film is removed a predetermined alpha-Fe 2 O 3 film corresponding to the mask pattern pattern is training α- The Fe 2 O 3 film is hydrogen-reduced to form a Fe 3 O 4 film, and is further oxidized and modified to form a γ-Fe 2 O 3 film.
A method for producing a magnetic thin film, characterized by comprising steps.
JP9881592A 1992-03-25 1992-03-25 Production of magnetic thin film Withdrawn JPH05274668A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9881592A JPH05274668A (en) 1992-03-25 1992-03-25 Production of magnetic thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9881592A JPH05274668A (en) 1992-03-25 1992-03-25 Production of magnetic thin film

Publications (1)

Publication Number Publication Date
JPH05274668A true JPH05274668A (en) 1993-10-22

Family

ID=14229826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9881592A Withdrawn JPH05274668A (en) 1992-03-25 1992-03-25 Production of magnetic thin film

Country Status (1)

Country Link
JP (1) JPH05274668A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3725822A1 (en) * 1986-08-04 1988-02-18 Mitsubishi Electric Corp INTEGRATED SEMICONDUCTOR SWITCHING DEVICE
US6183554B1 (en) * 1998-10-13 2001-02-06 Director-General Of Agency Of Industrial Science And Technology Method for preparing dense, epitaxial metal oxide film

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3725822A1 (en) * 1986-08-04 1988-02-18 Mitsubishi Electric Corp INTEGRATED SEMICONDUCTOR SWITCHING DEVICE
US6183554B1 (en) * 1998-10-13 2001-02-06 Director-General Of Agency Of Industrial Science And Technology Method for preparing dense, epitaxial metal oxide film

Similar Documents

Publication Publication Date Title
JPH0553289A (en) Production of phase shift reticle
JP2008134614A (en) Pattern forming method and device production process using the method
US20080085479A1 (en) Pattern forming method and device production process using the method
US6689283B2 (en) Dry etching method, microfabrication process and dry etching mask
JPH05274668A (en) Production of magnetic thin film
JP3430632B2 (en) Method of forming metal pattern and method of manufacturing semiconductor device having metal wiring pattern
CN112516804A (en) PM2.5 protective equipment, PM2.5 filtering membrane and preparation method thereof
TWI241460B (en) The method of manufacturing nano pattern particles
JPS6218560A (en) Photomask blank and photomask
JP2654147B2 (en) Thin film magnetic head
JP2633088B2 (en) Manufacturing method of stamper
JPS61159731A (en) Method of forming fine pattern
CN119781243A (en) A method for controlling photolithography line width
JPH02165629A (en) Manufacture of conductive film pattern forming substrate
KR20250032170A (en) Development of patterning technology for gallium-based large-area heating film
JPH041492B2 (en)
GB1163463A (en) A Process for the Production of Metal Coating Connections in a Semiconductor System
JPS6365933B2 (en)
JPH10513013A (en) Method for manufacturing semiconductor device
JPS6386434A (en) Formation of resist pattern
JPS60110124A (en) Processing method of fine pattern
US20030039900A1 (en) Method for fabricating a mask configuration
JPH04131857A (en) Method for developing photoresist
JPH02205014A (en) Manufacture of semiconductor device
JPS61119062A (en) Formation of metal wiring pattern

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990608