JPH05272968A - Laser surveying instrument - Google Patents

Abstract

PURPOSE:To obtain a laser surveying instrument which can easily perform sighting while this is a semiconductor laser light source for emitting an elliptic shape. CONSTITUTION:A laser surveying instrument comprises a projecting optical system 4 for projecting an elliptic beam emitted from a semiconductor laser light source it for sighting, and the elliptic beam is projected while being rotated with an optical axis O1 of an observation optical system 3 as the center by a rotating image rotator 13 as an elliptic beam rotating means provided in a light path of the projecting optical system 4.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a theodolite (transit) capable of flattening work with a laser beam.
It is related to laser surveying equipment such as.

[0002]

2. Description of the Related Art Generally, in civil engineering work, when lands are constructed horizontally or at a design angle, or when a structure or the like is installed horizontally or at a design angle, angle and leveling work is performed. It is often done.

As an instrument used for this kind of work, for example, a light source for aiming is provided in the main body of the apparatus, and a light beam emitted from this light source is aimed at a symmetrical object provided at a measuring point. Things are known.

For such a light source for aiming, helium neon (He-Ne) or the like has been used because it is desirable to project in a perfect circular shape in order to clarify the aiming point. With helium neon, there is a problem that it is not possible to miniaturize the product and drive the battery because it is large and consumes a large amount of current, and in order to solve this problem, a semiconductor laser light source was used as a light source for aiming. There is something.

[0005]

By the way, in the case where a semiconductor laser light source is used as such a light source for aiming, an elliptical beam is emitted due to its characteristics, and therefore the determination of the center point is not possible. There was a new problem that it was very difficult and it was difficult to set the aiming point.

Therefore, an object of the present invention is to provide a laser surveying instrument which can easily aim at a semiconductor laser light source which emits an elliptical shape.

[0007]

To achieve this object, the present invention provides a laser surveying instrument having a semiconductor laser light source for aiming an elliptical beam, and a projection optical system for projecting the elliptical beam. The gist is that an elliptical beam rotating means is provided in the optical path of the projection optical system so that the elliptical beam is projected while rotating about the optical axis of the projection optical system.

[0008]

DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment in which the present invention is applied to an angle measuring device will be described below with reference to FIG.

In FIG. 1, an angle measuring device 1 includes a hollow device body 2 mounted on a base (not shown) so as to be horizontally and vertically rotatable, and an observation optical system arranged in the device body 2. 3 and a projection optical system 4 for guiding the laser beam to the optical path of the observation optical system 3.

The observation optical system 3 is roughly composed of an objective lens 5, a beam splitter 6, an inner focusing lens 7, a roof prism 8, a focusing mirror 9, and an eyepiece lens 10. In the figure, O1 is the optical axis of the observation optical system 3. Further, the horizontal rotation angle and the vertical rotation angle of the apparatus main body 1 can be read by an angle reading means (not shown). A well-known one is used for this angle reading means.

The projection optical system 4 is provided with a semiconductor laser light source 11, a condenser lens 12, an image rotator 13 as an elliptical beam rotating means, a beam splitter 6, which is provided at a position branched from the observation optical system 3 in the apparatus main body 2. It is composed of the objective lens 5. In the figure, O2 is the optical axis of the projection optical system 4.

The image rotator 13 is set to rotate about the optical axis O2 by a rotation drive mechanism (not shown).

The elliptical laser beam flux emitted from the semiconductor laser light source 11 is collimated by the condenser lens 12, guided to the image rotator 13 and the beam splitter 6, and reflected by the beam splitter 6 to be reflected by the objective lens. Project the target point from 5. The reflected light flux reflected from the target point is guided from the objective lens 5 to the beam splitter 6, passes through this beam splitter 6, and is guided to the inner focusing lens 7, the roof prism 8, the focusing mirror 9, and the eyepiece lens 10. .. At this time, as shown in FIG. 2, the observer on the side of the apparatus main body 2 or the observer at the target point receives the elliptical aiming light H emitted from the semiconductor laser light source 11 as the image rotator 13 rotates. It is observed as a perfect circle aiming light H ′ due to the afterimage effect.
In addition, since the overlapping center portion of the perfect circle aiming light H ′ is brighter than the outer peripheral portion, it becomes easy to confirm the center point of the perfect circle aiming light H ′, that is, the aiming point P, and the center of the aiming light H ′. Can be accurately positioned.

In the above embodiment, as the rotating means of the present invention, the structure in which the image rotator 13 is provided in the optical path of the projection optical system 4 to rotate about the optical axis O2 is disclosed. If the laser beam is rotating on the optical axis O1, the arrangement position and the structure for rotating the laser beam are not limited thereto. For example, the semiconductor laser light source itself may be rotated.

[0015]

Since the present invention is configured as described above, it is possible to easily aim a semiconductor laser light source that emits an elliptical shape. Further, the laser surveying instrument can be manufactured at low cost.

[Brief description of drawings]

FIG. 1 is a schematic explanatory view showing an embodiment of an optical system of an apparatus of the present invention.

FIG. 2 is a schematic explanatory diagram of a main part of the same.

[Explanation of Codes] 1 ... Angle measuring device (laser surveying instrument) 4 ... Projection optical system 11 ... Semiconductor laser light source 13 ... Image rotator (elliptical beam rotating means) O1 ... Optical axis H ... Elliptical beam

Claims (1)

[Claims] 1. A laser surveying instrument having a semiconductor laser light source for aiming an elliptical beam and a projection optical system for projecting the elliptical beam, wherein the elliptical beam rotates about an optical axis of the projection optical system. The laser surveying instrument is characterized in that an elliptical beam rotating means is provided in the optical path of the projection optical system so as to be projected.