JPH05129771A - Spare solder for printed wiring board - Google Patents
Spare solder for printed wiring boardInfo
- Publication number
- JPH05129771A JPH05129771A JP3288678A JP28867891A JPH05129771A JP H05129771 A JPH05129771 A JP H05129771A JP 3288678 A JP3288678 A JP 3288678A JP 28867891 A JP28867891 A JP 28867891A JP H05129771 A JPH05129771 A JP H05129771A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- copper
- weight
- wiring board
- added
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
(57)【要約】
【目的】 プリント配線基板の導体パターン上に被覆す
る予備はんだ、より詳しくは、そのはんだ合金組成に関
し、該導体パターン(銅)の酸化を防ぎかつはんだぬれ
性を確保するための予備はんだではあるが、その機能を
もっと向上させかつその厚さをもっと薄くする。
【構成】 プリント配線基板上に形成してある導体パタ
ーンを被覆するのに使用する予備はんだにおいて、該は
んだが錫−鉛合金にインジウム、銅、ゲルマニウムの一
種または二種以上を添加してなる。インジウムの添加量
が0.5重量%以下であり、銅の添加量が該錫−鉛合金の
固溶限以内であり、そしてゲルマニウムの添加量が0.1
重量%以下である。(57) [Abstract] [Purpose] Preliminary solder covering the conductor pattern of a printed wiring board, more specifically, regarding its solder alloy composition, to prevent oxidation of the conductor pattern (copper) and to secure solder wettability. Although it is a pre-solder, its function is further improved and its thickness is made thinner. In a preliminary solder used for coating a conductor pattern formed on a printed wiring board, the solder is a tin-lead alloy to which one or more of indium, copper and germanium are added. The added amount of indium is 0.5% by weight or less, the added amount of copper is within the solid solution limit of the tin-lead alloy, and the added amount of germanium is 0.1.
It is less than or equal to weight%.
Description
【0001】[0001]
【産業上の利用分野】本発明は、プリント配線基板の導
体パターン上に被覆する予備はんだ、より詳しくは、そ
のはんだ合金組成に関する。多数の情報を高速に処理す
る必要性から、情報処理装置は小型化および大容量化が
図られ、これを実現するために電子部品を小型化すると
ともに高密度実装が行われている。そして、このような
電子部品を搭載する配線基板として耐熱性の合成樹脂、
セラミックス、ガラスセラミックスなどからなる多層基
板が用いられている。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a pre-solder for coating a conductor pattern of a printed wiring board, and more particularly to a solder alloy composition thereof. Due to the necessity of processing a large amount of information at high speed, information processing apparatuses have been downsized and increased in capacity, and in order to achieve this, electronic components have been downsized and high-density mounting has been performed. And a heat-resistant synthetic resin as a wiring board for mounting such electronic parts,
Multilayer substrates made of ceramics, glass ceramics, etc. are used.
【0002】ガラスエポキシなどからなるプリント配線
基板の場合には、銅張り基板に写真蝕刻技術(フォトリ
ソグラフィ)で微細な導体パターンを形成して単位基板
とし、これを複数枚用意しプリプレグを挟んで熱圧着し
て一体化することで多層プリント配線板としている。ま
た、ガラスセラミックス(或いは、セラミックス)基板
の場合には、導体パターンをスクリーン印刷したグリー
ンシートを積層し、加熱焼成することで多層プリント配
線板としている。In the case of a printed wiring board made of glass epoxy or the like, a fine conductor pattern is formed on a copper-clad substrate by a photolithography technique (photolithography) to form a unit substrate, and a plurality of these are prepared and a prepreg is sandwiched therebetween. A multilayer printed wiring board is obtained by thermocompression bonding and integration. In the case of a glass ceramics (or ceramics) substrate, a multilayer printed wiring board is obtained by stacking green sheets on which conductor patterns are screen-printed and heating and firing.
【0003】配線基板での電子回路を構成する導体パタ
ーンは電気伝導度の点から、ほとんどの場合に、銅(C
u)が採用されているが、酸化され易いために、基板表
面の導体パターンの上に予備はんだ(ソルダーコート)
を薄く形成して、該導体パターンの酸化を防止するとと
もに、ここに装着する素子の端子とのはんだぬれ性を確
保している。In most cases, a conductor pattern forming an electronic circuit on a wiring board is made of copper (C) in terms of electrical conductivity.
u) is used, but pre-solder (solder coat) is applied on the conductor pattern on the substrate surface because it is easily oxidized.
Is formed thin to prevent the conductive pattern from being oxidized and to ensure the solder wettability with the terminals of the element mounted here.
【0004】[0004]
【従来の技術】配線基板の銅導体パターンの酸化防止お
よびはんだ付け性確保のための予備はんだは、配線基板
をはんだ浴に浸漬し、引き上げる際に熱風を吹きつけて
余計なはんだを除去することで該導体パターン上に形成
されている。実装する電子部品がIC、LSIなどの半
導体装置の場合に、これまでリード端子を熔着する(導
体パターンの)パッドの大きさが0.65mm幅であったも
のを、半導体装置の高集積化、微細化にともなって0.3
mm幅程度にまで小さくされかつパッド間隔も短くされて
きている。そこで、隣接するパッドとの絶縁を保証する
ために、パッド上に被覆する予備はんだの厚さを、従来
の0.8〜80μmより薄くする必要がある。2. Description of the Related Art Preliminary solder for preventing oxidation of a copper conductor pattern of a wiring board and ensuring solderability is to immerse the wiring board in a solder bath and blow hot air when pulling it up to remove excess solder. Is formed on the conductor pattern. If the electronic component to be mounted is a semiconductor device such as an IC or LSI, the size of the pad (of the conductor pattern) for welding the lead terminal has been 0.65 mm wide until now. , 0.3 due to miniaturization
It has been reduced to the mm width and the pad spacing has been shortened. Therefore, in order to ensure the insulation from the adjacent pads, it is necessary to make the thickness of the preliminary solder coated on the pads thinner than the conventional 0.8 to 80 μm.
【0005】従来より予備はんだの材料としては、錫−
鉛(Sn−Pb)共晶はんだが一般に使用されている。
そして、形成した予備はんだは半導体装置などの表面実
装が行われる前になされる熱処理の影響を受けて、酸化
されることが多い。以下、耐熱性樹脂のプリント配線基
板に予備はんだを被覆する場合の従来例を説明する。[0005] Conventionally, tin-
Lead (Sn-Pb) eutectic solder is commonly used.
The formed pre-solder is often oxidized under the influence of heat treatment performed before surface mounting of a semiconductor device or the like. Hereinafter, a conventional example in which a printed wiring board made of a heat resistant resin is coated with preliminary solder will be described.
【0006】通常の工程にしたがって作製されたプリン
ト配線基板の表面銅導体パターンに予備はんだをコーテ
ィングするために、該プリント配線基板をSn−Pbは
んだ浴に浸漬し、引き上げる際に熱風を吹きつけて余分
なはんだを飛散させている。この際にプリント配線基板
ははんだ浴によって加熱され、はんだは冷却過程で酸化
される。また、プリント配線基板のスルーホールに抵抗
器やコンデンサなどの個別部品を装着してから、フロー
ソルダリングではんだ付けを行うことがあり、この場合
にも基板は加熱され、予備はんだは酸化される。[0006] In order to coat the surface copper conductor pattern of a printed wiring board manufactured according to a usual process with preliminary solder, the printed wiring board is immersed in a Sn-Pb solder bath and hot air is blown when pulling it up. Excessive solder is scattered. At this time, the printed wiring board is heated by the solder bath, and the solder is oxidized in the cooling process. In addition, soldering may be performed by flow soldering after mounting individual components such as resistors and capacitors in the through holes of the printed wiring board. In this case as well, the board is heated and the preliminary solder is oxidized. ..
【0007】予備はんだの酸化の現象は次のように進行
する。 はんだ合金を構成している錫(Sn)は鉛(Pb)よ
りも酸化し易いので、錫が酸化する。 2Sn+O2 →2SnO 一方、鉛成分は錫成分の減少によって単独の鉛となっ
て表面に析出し、酸化される。The phenomenon of oxidation of the pre-solder proceeds as follows. Since tin (Sn) forming the solder alloy is more easily oxidized than lead (Pb), tin is oxidized. 2Sn + O 2 → 2SnO On the other hand, the lead component is converted to a single lead due to the decrease of the tin component, and is deposited on the surface and oxidized.
【0008】2Pb+O2 →2PbO このように予備はんだは加熱の影響を受けて酸化物が表
面に生じて、ぬれ性が低下する。さらに、導体パターン
の銅(Cu)がはんだ中へ拡散し、錫と反応してCu3
SnやCu6 Sn5 などの金属間化合物を生じさせ、こ
れらが予備はんだの表面にまで成長して、ぬれ性を低下
させる。これらのぬれ性低下ははんだ付け性をも低下さ
せることになる。2Pb + O 2 → 2PbO As described above, the pre-solder is affected by heating, and an oxide is generated on the surface, so that the wettability is deteriorated. Furthermore, the copper (Cu) of the conductor pattern diffuses into the solder and reacts with tin to form Cu 3
Intermetallic compounds such as Sn and Cu 6 Sn 5 are generated, and these grow up to the surface of the pre-solder to reduce the wettability. These reductions in wettability also reduce solderability.
【0009】その防止対策として、従来は、予備はんだ
層を厚くすることで対応していたが、上述したように半
導体装置の高集積化に伴って厚くすることは難しい。そ
こではんだ付けの前に、接合部分(パッド)を表面研磨
して薄くするという便法を採用することもある。しかし
ながら、このような表面研磨は面倒であり、その実施は
困難を伴う。Conventionally, as a countermeasure against the problem, the preliminary solder layer has been thickened, but as described above, it is difficult to thicken the semiconductor device with higher integration. Therefore, before soldering, a convenient method may be adopted in which the joint portion (pad) is surface-polished to be thin. However, such surface polishing is troublesome and difficult to carry out.
【0010】[0010]
【発明が解決しようとする課題】プリント配線基板の導
体パターン(銅)の酸化を防ぎかつはんだぬれ性を確保
するための予備はんだではあるが、その機能をもっと向
上させることが求められている。また、実装する半導体
装置の高集積化に応じて予備はんだの厚さをより薄くす
ることも求められている。Although it is a preliminary solder for preventing the oxidation of the conductor pattern (copper) of the printed wiring board and ensuring solder wettability, it is required to further improve its function. Further, it is required to reduce the thickness of the preliminary solder in accordance with the high integration of the mounted semiconductor device.
【0011】本発明の目的は、これらの要求に答える予
備はんだを提供することである。It is an object of the present invention to provide a presolder that meets these needs.
【0012】[0012]
【課題を解決するための手段】上述の目的が、プリント
配線基板上に形成してある導体パターンを被覆するのに
使用する予備はんだにおいて、該はんだが錫−鉛合金に
インジウム、銅、ゲルマニウムの一種または二種以上を
添加してなることを特徴とするプリント配線基板用予備
はんだによって達成される。SUMMARY OF THE INVENTION The above object is to provide a pre-solder used for coating a conductor pattern formed on a printed wiring board, wherein the solder is a tin-lead alloy containing indium, copper or germanium. This is achieved by pre-soldering for a printed wiring board, which is characterized by adding one kind or two or more kinds.
【0013】これら添加元素は、錫−鉛合金に対して、
インジウムの添加量が0.1〜0.5重量%であり、銅の
添加量が0.1重量%以上で該錫−鉛合金の固溶限以内
であり、そしてゲルマニウムの添加量が0.005〜0.
1重量%であることが好ましい。そして、錫−鉛合金
は、錫50〜70重量%と、鉛および不可避的不純物の
残部とからなり、最も好ましくは、錫63重量%の共晶
はんだ組成である。These additive elements are added to the tin-lead alloy.
The amount of indium added is 0.1 to 0.5% by weight, the amount of copper added is 0.1% by weight or more and is within the solid solubility limit of the tin-lead alloy, and the amount of germanium added is 0.1%. 005-0.
It is preferably 1% by weight. The tin-lead alloy is composed of 50 to 70% by weight of tin and the balance of lead and inevitable impurities, and most preferably has a eutectic solder composition of 63% by weight tin.
【0014】[0014]
【作用】本発明において、薄くしてもはんだぬれ性を確
保することのできる予備はんだとするには、次のような
添加元素効果を利用している。 はんだぬれ性を損なわずに錫−鉛(Sn−Pb)はん
だの上を覆い、酸化を妨げる金属(インジウムおよびゲ
ルマニウム)を添加する。In the present invention, the following additive element effect is utilized in order to prepare a pre-solder which can secure solder wettability even if it is thin. Metals (indium and germanium) are added to cover the tin-lead (Sn-Pb) solder and prevent oxidation without impairing the solder wettability.
【0015】インジウムの添加量が0.5重量%を越え、
あるいはゲルマニウムの添加量が0.1重量%を越える
と、インジウムは、表面張力が極度に低下し、はんだブ
リッジが生じる。また、Geは、はんだの融点が上昇
し、予備はんだ表面がざらつくなど不具合が生じる。 銅がはんだ中へ拡散して、金属間化合物を生じさせ、
これが成長することがぬれ性を損なう原因であるので、
銅の拡散を抑制する金属(銅)を添加する。The amount of indium added exceeds 0.5% by weight,
Alternatively, when the addition amount of germanium exceeds 0.1% by weight, the surface tension of indium is extremely lowered and a solder bridge is formed. Further, Ge has a problem that the melting point of the solder rises and the surface of the preliminary solder becomes rough. Copper diffuses into the solder, forming intermetallic compounds,
This is because the growth is a cause of impairing wettability,
A metal (copper) that suppresses the diffusion of copper is added.
【0016】銅の添加量ははんだの固溶限以内であり、
錫−鉛共晶はんだの240℃における銅の固溶限は0.4
2重量%である。銅を予備はんだに予め含有させておく
ことで、導体パターンからの銅拡散を阻止することがで
き、Cu3 SnやCu6 Sn 5 などの金属間化合物が予
備はんだ表面まで成長するのを防止することができる。The amount of copper added is within the solid solution limit of solder,
The solid solubility limit of tin-lead eutectic solder at 240 ℃ is 0.4.
It is 2% by weight. Pre-contain copper in pre-solder
This can prevent copper diffusion from the conductor pattern.
Cu3Sn and Cu6Sn FiveIntermetallic compounds such as
It is possible to prevent the solder from growing to the surface.
【0017】これらインジウム、銅、ゲルマニウムを組
み合わせて適量添加すると、添加効果がそのまま現れ、
良好なはんだ付けを行うことができる。When these indium, copper, and germanium are combined and added in appropriate amounts, the effect of addition appears as it is,
Good soldering can be performed.
【0018】[0018]
【実施例】以下、添付図面を参照して、本発明の実施態
様例および比較例によって本発明を詳細に説明する。実施例1(インジウム添加の場合) 試験片として銅板(形状寸法:50×5×1mm)に厚さ
20μmの銅メッキを施したものを用意した。Sn−P
b共晶はんだに対してInを0.1〜1.0重量%添加し、
あるいは添加しないで、溶融して予備はんだ浴とした。
これら溶融はんだ浴に試験片を5秒間浸漬して、厚さ0.
3μmの予備はんだ層を被覆した。予備はんだ表面の酸
化がぬれ性に及ぼす影響を調べるために、大気中にて1
70℃、1時間加熱した。そして、試験片の一端をSn
−Pb共晶はんだ浴に浸漬し、引き上げるメニスコグラ
フぬれ性試験法により、はんだぬれ時間を調べた。また
0.3mmピッチで形成されたパッドを含むプリント板に
ソルダーコートし、はんだ付け性を調べた。この試験結
果を表1に示す。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below with reference to the accompanying drawings by way of embodiments and comparative examples of the present invention. Example 1 (when indium was added) As a test piece, a copper plate (shape dimension: 50 × 5 × 1 mm) plated with copper having a thickness of 20 μm was prepared. Sn-P
b 0.1 to 1.0% by weight of In is added to the eutectic solder,
Alternatively, it was melted into a preliminary solder bath without addition.
The test piece is dipped in these molten solder baths for 5 seconds to obtain a thickness of 0.
A 3 μm pre-solder layer was coated. In order to investigate the effect of pre-solder surface oxidation on wettability, 1
It heated at 70 degreeC for 1 hour. Then, one end of the test piece is Sn
The solder wetting time was examined by the meniscograph wettability test method of immersing in a -Pb eutectic solder bath and pulling it up. A printed board including pads formed at a pitch of 0.3 mm was solder-coated and the solderability was examined. The test results are shown in Table 1.
【0019】[0019]
【表1】 [Table 1]
【0020】表1から分かるように、In添加はぬれ時
間について0.5重量%のときに最良の結果(最も短い)
が得られる。In添加量がそれよりも多くなると、ぬれ
時間は比較的短いが、はんだの表面張力が低下してブリ
ッジが発生し易くなる。これは、0.3mmピッチで形成
されたパッドを含む、プリント板を半田浴の中に浸漬し
てのデータである。なお、ブリッジとは導体パターンの
隣接するパッド間に生じるそれらを結ぶはんだの橋掛け
をいい、この場合には、0.5μmピッチ(ラインアンド
スペース)の間隔である。また、不良とははんだのはじ
き(一部ぬれていない)があった場合である。As can be seen from Table 1, the In addition has the best results (shortest) when the wetting time is 0.5% by weight.
Is obtained. When the amount of In added is larger than that, the wetting time is relatively short, but the surface tension of the solder is lowered, and a bridge is easily generated. This is data obtained by immersing a printed board in a solder bath, which includes pads formed with a pitch of 0.3 mm. The bridge means a bridging of solder that connects the adjacent pads of the conductor pattern and connects them, and in this case, the interval is 0.5 μm pitch (line and space). In addition, a defect is a case where the solder is repelled (partly wet).
【0021】実施例2(銅添加の場合) 実施例1と同じように銅メッキした銅板の試験片を用意
した。Sn−Pb共晶はんだに対してCuを0.1〜5重
量%添加し、あるいは添加しないで、溶融して予備はん
だ浴とした。実施例1と同様にして試験片に予備はんだ
層を被覆し、大気中で加熱した。そして、試験片の一端
をSn−Pb共晶はんだ浴に浸漬し、引き上げるメニス
コグラフぬれ性試験法により、はんだぬれ時間およびは
んだ付け性を調べた。この試験結果を表2に示す。 Example 2 (when copper was added) A copper-plated copper plate test piece was prepared in the same manner as in Example 1. Cu was added to the Sn-Pb eutectic solder with or without addition of 0.1 to 5% by weight, and melted to prepare a preliminary solder bath. A test piece was coated with a preliminary solder layer in the same manner as in Example 1 and heated in the atmosphere. Then, one end of the test piece was dipped in a Sn-Pb eutectic solder bath, and the pull-up meniscograph wettability test method was used to examine the solder wettability and solderability. The test results are shown in Table 2.
【0022】[0022]
【表2】 [Table 2]
【0023】表2から分かるように、Cu添加量が固溶
限(0.3%)の付近が最も良く(ぬれ時間が短く)、そ
れよりも多くなると、ぬれ時間は変わらないものの、は
んだの粘度が上昇するためにブリッジが発生し易くな
る。実施例3(ゲルマニウム添加の場合) 実施例1と同じように銅メッキした銅板の試験片を用意
した。Sn−Pb共晶はんだに対してGeを0.005〜
0.3重量%添加し、あるいは添加しないで、溶融して予
備はんだ浴とした。実施例1と同様にして試験片に予備
はんだ層を被覆し、大気中で加熱した。そして、試験片
の一端をSn−Pb共晶はんだ浴に浸漬し、引き上げる
メニスコグラフぬれ性試験法により、はんだぬれ時間お
よびはんだ付け性を調べた。この試験結果を表3に示
す。As can be seen from Table 2, the Cu addition amount is best near the solid solution limit (0.3%) (wetting time is short), and if it is more than that, the wetting time does not change, but the solder Since the viscosity increases, bridges are likely to occur. Example 3 (in the case of adding germanium) A test piece of a copper plate plated with copper was prepared in the same manner as in Example 1. Ge from 0.005 to Sn-Pb eutectic solder
With or without addition of 0.3% by weight, it was melted to prepare a preliminary solder bath. A test piece was coated with a preliminary solder layer in the same manner as in Example 1 and heated in the atmosphere. Then, one end of the test piece was dipped in a Sn-Pb eutectic solder bath, and the pull-up meniscograph wettability test method was used to examine the solder wettability and solderability. The test results are shown in Table 3.
【0024】[0024]
【表3】 [Table 3]
【0025】表3から分かるように、Ge添加はぬれ時
間について0.02重量%のときに最良の結果(最も短
い)が得られる。添加量がそれよりも多くなると、ぬれ
時間は比較的短いが、はんだの表面張力が増加し厚さの
バラツキが生じ易くなる。実施例4(インジウムおよび銅の添加の場合) 実施例1と同じように銅メッキした銅板の試験片を用意
した。Sn−Pb共晶はんだに対してInを0.1〜1.0
重量%かつ銅を0.3〜5重量%添加し、あるいは両方と
も添加しないで、溶融して予備はんだ浴とした。実施例
1と同様にして試験片に予備はんだ層を被覆し、大気中
で加熱した。そして、試験片の一端をSn−Pb共晶は
んだ浴に浸漬し、引き上げるメニスコグラフぬれ性試験
法により、はんだぬれ時間およびはんだ付け性を調べ
た。この試験結果を表4に示す。As can be seen from Table 3, the Ge addition gives the best results (shortest) at a wetting time of 0.02% by weight. If the addition amount is larger than that, although the wetting time is relatively short, the surface tension of the solder increases and the thickness tends to vary. Example 4 (in the case of adding indium and copper) As in Example 1, a copper-plated copper plate test piece was prepared. In is 0.1 to 1.0 for Sn-Pb eutectic solder
% By weight and 0.3 to 5% by weight of copper, or neither of them was added and the mixture was melted to prepare a preliminary solder bath. A test piece was coated with a preliminary solder layer in the same manner as in Example 1 and heated in the atmosphere. Then, one end of the test piece was dipped in a Sn-Pb eutectic solder bath and pulled up to examine the solder wettability and solderability by a meniscograph wettability test method. The test results are shown in Table 4.
【0026】[0026]
【表4】 [Table 4]
【0027】表4から分かるように、In添加量が0.5
重量%かつCu添加量が0.3重量%のときに最も良い結
果が得られる。添加量の最適値は実施例1および2と対
応しており、さらにはんだぬれ時間が0.76秒と実施例
1および2よりも更に短くなっている。実施例5(ゲルマニウムおよび銅の添加の場合) 実施例1と同じように銅メッキした銅板の試験片を用意
した。Sn−Pb共晶はんだに対してGeを0.005〜
0.05重量%かつ銅を0.3〜5重量%添加し、あるいは
両方とも添加しないで、溶融して予備はんだ浴とした。
実施例1と同様にして試験片に予備はんだ層を被覆し、
大気中で加熱した。そして、試験片の一端をSn−Pb
共晶はんだ浴に浸漬し、引き上げるメニスコグラフぬれ
性試験法により、はんだぬれ時間およびはんだ付け性を
調べた。この試験結果を表5に示す。As can be seen from Table 4, the amount of In added is 0.5.
The best results are obtained when the weight% and the amount of Cu added are 0.3% by weight. The optimum value of the addition amount corresponds to that of Examples 1 and 2, and the solder wetting time is 0.76 seconds, which is shorter than that of Examples 1 and 2. Example 5 (in the case of adding germanium and copper) A test piece of a copper plate plated with copper was prepared in the same manner as in Example 1. Ge from 0.005 to Sn-Pb eutectic solder
0.05% by weight and 0.3-5% by weight of copper were added, or neither of them was added to obtain a preliminary solder bath.
A test piece was coated with a preliminary solder layer in the same manner as in Example 1,
Heated in air. And, one end of the test piece is Sn-Pb
The solder wetting time and solderability were examined by the meniscograph wettability test method of immersing in a eutectic solder bath and pulling it up. The test results are shown in Table 5.
【0028】[0028]
【表5】 [Table 5]
【0029】表5から分かるように、Ge添加量が0.0
2重量%かつCu添加量が0.3重量%のときに最も良い
結果が得られる。添加量の最適値は実施例2および3と
対応しており、さらにはんだぬれ時間が0.75秒と実施
例2および3よりも更に短くなっている。実施例6(インジウム、ゲルマニウムおよび銅の添加の
場合) 実施例1と同じように銅メッキした銅板の試験片を用意
した。Sn−Pb共晶はんだに対してInを0.1〜0.5
重量%、Geを0.01〜0.02重量%かつ銅を0.3重量
%添加し、あるいは三者とも添加しないで、溶融して予
備はんだ浴とした。実施例1と同様にして試験片に予備
はんだ層を被覆し、大気中で加熱した。そして、試験片
の一端をSn−Pb共晶はんだ浴に浸漬し、引き上げる
メニスコグラフぬれ性試験法により、はんだぬれ時間お
よびはんだ付け性を調べた。この試験結果を表6に示
す。As can be seen from Table 5, the Ge addition amount is 0.0
The best results are obtained when the amount of Cu added is 2% by weight and the amount of Cu added is 0.3% by weight. The optimum value of the added amount corresponds to that of Examples 2 and 3, and the solder wetting time is 0.75 seconds, which is shorter than those of Examples 2 and 3. Example 6 (of the addition of indium, germanium and copper)
Case) A copper-plated copper plate test piece was prepared in the same manner as in Example 1. In is 0.1 to 0.5 for Sn-Pb eutectic solder
% By weight, 0.01 to 0.02% by weight of Ge and 0.3% by weight of copper were added, or none of the three was added to obtain a pre-solder bath. A test piece was coated with a preliminary solder layer in the same manner as in Example 1 and heated in the atmosphere. Then, one end of the test piece was dipped in a Sn-Pb eutectic solder bath and pulled up to examine the solder wettability and solderability by a meniscograph wettability test method. The test results are shown in Table 6.
【0030】[0030]
【表6】 [Table 6]
【0031】表6から分かるように、In添加量が0.5
重量%、Ge添加量が0.02重量%かつCu添加量が0.
3重量%のときに最も良い結果が得られる。添加量の最
適値は実施例1〜5と対応しており、さらにはんだぬれ
時間が0.69秒と実施例1〜5よりも更に短くなってい
る。はんだ付け性では、In添加によるブリッジ発生
(表面張力低下が原因)はGe添加(表面張力を大きく
する効果)によって抑えられて改善されている。このよ
うに複合添加の効果が現れている。As can be seen from Table 6, the amount of In added is 0.5.
% By weight, the amount of Ge added is 0.02% by weight and the amount of Cu added is 0.02%.
Best results are obtained at 3% by weight. The optimum value of the addition amount corresponds to that of Examples 1 to 5, and the solder wetting time is 0.69 seconds, which is shorter than that of Examples 1 to 5. In solderability, the generation of bridges (due to the decrease in surface tension) due to the addition of In is suppressed and improved by the addition of Ge (the effect of increasing the surface tension). In this way, the effect of composite addition appears.
【0032】[0032]
【発明の効果】以上説明したように、本発明に係る予備
はんだであれば、プリント配線基板の導体パターンを被
覆するその厚さを0.3μmのように薄くしても、良好な
はんだぬれ性を確保することができ、高集積化された半
導体装置の実装に適するプリント配線基板を提供するこ
とができる。As described above, with the preliminary solder according to the present invention, good solder wettability can be obtained even if the thickness of the conductor pattern of the printed wiring board is reduced to 0.3 μm. Therefore, a printed wiring board suitable for mounting a highly integrated semiconductor device can be provided.
Claims (3)
パターンを被覆するのに使用する予備はんだにおいて、
該はんだが錫−鉛合金にインジウム、銅、ゲルマニウム
の一種または二種以上を添加してなることを特徴とする
プリント配線基板用予備はんだ。1. Preliminary solder used for coating a conductor pattern formed on a printed wiring board,
A pre-solder for a printed wiring board, characterized in that the solder is made by adding one or more of indium, copper and germanium to a tin-lead alloy.
添加量は0.1〜0.5重量%であり、銅の添加量は0.
1重量%以上で該錫−鉛合金の固溶限以内であり、そし
てゲルマニウムの添加量は0.005〜0.1重量%であ
ることを特徴とする請求項1記載の予備はんだ。2. The amount of indium added is 0.1 to 0.5% by weight, and the amount of copper added is 0.1% with respect to the tin-lead alloy.
The pre-solder according to claim 1, characterized in that the content is 1% by weight or more and is within the solid solution limit of the tin-lead alloy, and the addition amount of germanium is 0.005-0.1% by weight.
と、鉛および不可避的不純物の残部とからなることを特
徴とする請求項1記載の予備はんだ。3. The tin-lead alloy is tin 50 to 70% by weight.
The pre-solder according to claim 1, characterized by comprising: and a balance of lead and unavoidable impurities.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3288678A JP2858494B2 (en) | 1991-11-05 | 1991-11-05 | Pre-soldering for printed wiring boards |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3288678A JP2858494B2 (en) | 1991-11-05 | 1991-11-05 | Pre-soldering for printed wiring boards |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05129771A true JPH05129771A (en) | 1993-05-25 |
JP2858494B2 JP2858494B2 (en) | 1999-02-17 |
Family
ID=17733273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3288678A Expired - Fee Related JP2858494B2 (en) | 1991-11-05 | 1991-11-05 | Pre-soldering for printed wiring boards |
Country Status (1)
Country | Link |
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JP (1) | JP2858494B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07202399A (en) * | 1993-12-21 | 1995-08-04 | Internatl Business Mach Corp <Ibm> | Method and nozzle for applying bonding agent for connecting parts to carrier and circuit base plate coated with bonding agent |
-
1991
- 1991-11-05 JP JP3288678A patent/JP2858494B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07202399A (en) * | 1993-12-21 | 1995-08-04 | Internatl Business Mach Corp <Ibm> | Method and nozzle for applying bonding agent for connecting parts to carrier and circuit base plate coated with bonding agent |
JP2533294B2 (en) * | 1993-12-21 | 1996-09-11 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Method and nozzle for applying a bonding agent for connecting components to a carrier, and a circuit board coated with the bonding agent |
Also Published As
Publication number | Publication date |
---|---|
JP2858494B2 (en) | 1999-02-17 |
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