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JPH05119089A - Electromagnetic radiation visualizing device - Google Patents

Electromagnetic radiation visualizing device

Info

Publication number
JPH05119089A
JPH05119089A JP28247091A JP28247091A JPH05119089A JP H05119089 A JPH05119089 A JP H05119089A JP 28247091 A JP28247091 A JP 28247091A JP 28247091 A JP28247091 A JP 28247091A JP H05119089 A JPH05119089 A JP H05119089A
Authority
JP
Japan
Prior art keywords
lamp
brightness
electromagnetic radiation
recorded
measuring unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28247091A
Other languages
Japanese (ja)
Other versions
JP3043490B2 (en
Inventor
陽子 ▲高▼橋
Yoko Takahashi
Tokuji Yoshida
篤司 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
NEC Engineering Ltd
Original Assignee
NEC Corp
NEC Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, NEC Engineering Ltd filed Critical NEC Corp
Priority to JP3282470A priority Critical patent/JP3043490B2/en
Publication of JPH05119089A publication Critical patent/JPH05119089A/en
Application granted granted Critical
Publication of JP3043490B2 publication Critical patent/JP3043490B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Geophysics And Detection Of Objects (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To visualize the radiated position, direction, and intensity of electromagnetic waves from an object to be measured in a three-dimensional image so that an appropriate measure can be quickly taken against a radio wave absorption trouble. CONSTITUTION:The length of the variable length dipole antenna 3 of a measurement unit 1 is fixed to the length meeting a measuring frequency and the inside of a radio wave dark room 7 is scanned with a three-dimensionally moving mechanism 4. At the time of scanning the inside of the dark room 7, the inside is optically made darker and the brightness of a lamp 2 proportional to the electric field intensity at each measuring point is recorded with a stereo camera 5 under bulb exposure.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は被測定物から輻射される
電界強度を測定してその大きさと方向から被測定物の姿
を可視化する電磁輻射可視化装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electromagnetic radiation visualization device for measuring the electric field intensity radiated from an object to be measured and visualizing the appearance of the object to be measured from its size and direction.

【0002】[0002]

【従来の技術】従来の電磁輻射測定においては、輻射の
大きさと方向は数値で結果を得ていた。例えば方向は被
測定物を水平回転し、測定器のアンテナを上下して探
し、大きさはその位置での電界強度を測定して得てい
た。
2. Description of the Related Art In conventional electromagnetic radiation measurement, the magnitude and direction of radiation have been numerically obtained. For example, in the direction, the object to be measured is horizontally rotated, the antenna of the measuring device is searched up and down, and the size is obtained by measuring the electric field strength at that position.

【0003】[0003]

【発明が解決しようとする課題】この従来の電磁輻射測
定方法により輻射強度と方向を探るためには、数値から
イメージを把まなければならなかった。このため、各周
波数の測定ポイントにイメージを描き、周波数の変化に
伴いどのように輻射の様子が変化するかを把握するに
は、多くの経験を要するという問題点があった。
In order to search the radiation intensity and direction by this conventional electromagnetic radiation measuring method, it was necessary to grasp the image from numerical values. Therefore, it takes a lot of experience to draw an image at the measurement points of each frequency and to understand how the state of radiation changes as the frequency changes.

【0004】[0004]

【課題を解決するための手段】本発明の電磁輻射可視化
装置は、長さ可変のダイポールアンテナと、輝度を変化
できるランプと、広帯域または複数の周波数帯のアンプ
と、検波器及び電源を電波吸収処理した筺体に収納して
なる測定ユニットと、この測定ユニットを3次元の座標
の各点へ移動するユニット移動手段と、前記測定ユニッ
トの位置の電界強度に比例して前記ランプの明るさを変
化させる制御手段とを備え、3次元で被測定物を走査し
て前記ランプの明るさの変化を記録しこの記録内容を編
集再生して可視化することを特徴とする。
SUMMARY OF THE INVENTION An electromagnetic radiation visualization device of the present invention includes a dipole antenna having a variable length, a lamp capable of changing brightness, an amplifier in a wide band or a plurality of frequency bands, a detector and a power source. A measuring unit housed in a treated housing, a unit moving means for moving the measuring unit to each point of three-dimensional coordinates, and a change in the brightness of the lamp in proportion to the electric field strength at the position of the measuring unit. And a control means for controlling the brightness of the lamp to be recorded by scanning the object to be measured three-dimensionally and editing and reproducing the recorded content for visualization.

【0005】[0005]

【実施例】次に、本発明について図面を参照して説明す
る。図1は本発明の一実施例を示す透視斜視図、図2は
図1における測定ユニットの斜視図、図3は図2におけ
る測定ユニットのブロック図、図4は図1における被測
定物からの電磁輻射放射パターンの一例を示す透視斜視
図である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a perspective view of a measuring unit in FIG. 1, FIG. 3 is a block diagram of the measuring unit in FIG. 2, and FIG. It is a perspective view showing an example of an electromagnetic radiation radiation pattern.

【0006】本実施例では、図1に示すように測定ユニ
ット1の可変長ダイポールアンテナ3の長さを測定周波
数に合わせた長さに固定し、3次元移動機構4で電波暗
室7の中を走査する。このとき、電波暗室7の中を光学
的に暗くし、測定各点の電界強度に比例したランプ2の
明るさを露出開放のステレオカメラ5に記録する。これ
によって図4に例示するように、被測定物6からの電磁
輻射の方向と大きさが立体のイメージで、電磁輻射放射
パターン8として得られる。
In the present embodiment, as shown in FIG. 1, the length of the variable length dipole antenna 3 of the measuring unit 1 is fixed to the length corresponding to the measuring frequency, and the three-dimensional moving mechanism 4 is used to move the inside of the anechoic chamber 7. To scan. At this time, the inside of the anechoic chamber 7 is optically darkened, and the brightness of the lamp 2 proportional to the electric field strength at each measurement point is recorded in the stereo camera 5 with open exposure. As a result, as illustrated in FIG. 4, the direction and size of the electromagnetic radiation from the DUT 6 is obtained as a three-dimensional image, and the electromagnetic radiation pattern 8 is obtained.

【0007】図2に示した測定ユニット1の筺体には電
波吸収処理を施して輻射電波のじょう乱を低減する。ま
た、ランプ2は単色あるいは複色光でいずれも強度変化
に比例し、再現性の高いものを用いる。可変長ダイポー
ルアンテナ3は測定周波数毎に手動あるいは自動で長さ
を設定する。
The housing of the measuring unit 1 shown in FIG. 2 is subjected to radio wave absorption processing to reduce disturbance of radiated radio waves. Further, the lamp 2 uses monochromatic or multi-colored light, which is proportional to the intensity change and has high reproducibility. The length of the variable length dipole antenna 3 is set manually or automatically for each measurement frequency.

【0008】そして、図3に示すように可変長ダイポー
ルアンテナ3から受けた高周波を同期回路9で同調し、
アンプ10で増幅した後、検波回路11で検波し、ロー
パスフィルタ12を通した後の電圧をアンプ13で電力
増幅してランプ2を光らせる。また、測定ユニット1へ
の配線による電波のじょう乱を避けるため、電源14を
ユニット内へ内蔵する。
Then, as shown in FIG. 3, the high frequency received from the variable length dipole antenna 3 is tuned by the synchronizing circuit 9,
After being amplified by the amplifier 10, it is detected by the detection circuit 11, and the voltage after passing through the low-pass filter 12 is power-amplified by the amplifier 13 so that the lamp 2 is illuminated. Also, in order to avoid radio wave disturbance due to wiring to the measurement unit 1, the power supply 14 is built into the unit.

【0009】[0009]

【発明の効果】以上説明したように本発明の電磁輻射可
視化装置は、今迄捉えることの困難だった被測定物から
の電磁波の輻射位置,方向,強度をイメージで立体視で
きるようにしたので、電波吸収障害(EMI)対策を適
切かつ速やかに行なうことができるという効果を有す
る。
As described above, the electromagnetic radiation visualization device of the present invention enables the radiation position, direction, and intensity of electromagnetic waves from an object to be measured, which has been difficult to capture up to now, to be viewed stereoscopically. Therefore, it is possible to appropriately and promptly take countermeasures against electromagnetic wave interference (EMI).

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す透視斜視図である。FIG. 1 is a perspective view showing an embodiment of the present invention.

【図2】図1における測定ユニットの斜視図である。2 is a perspective view of the measurement unit in FIG. 1. FIG.

【図3】図2における測定ユニットのブロック図であ
る。
FIG. 3 is a block diagram of the measurement unit in FIG.

【図4】図1における被測定物からの電磁輻射放射パタ
ーンの一例を示す透視斜視図である。
FIG. 4 is a perspective view showing an example of an electromagnetic radiation pattern from an object to be measured in FIG.

【符号の説明】[Explanation of symbols]

1 測定ユニット 2 ランプ 3 可変長ダイポールアンテナ 4 3次元移動機構 5 ステレオカメラ 6 被測定物 7 電波暗室 8 電磁輻射放射パターン 9 同調回路 10 アンプ 11 検波回路 12 ローパスフィルタ 13 アンプ 14 電源 1 Measuring Unit 2 Lamp 3 Variable Length Dipole Antenna 4 3D Moving Mechanism 5 Stereo Camera 6 DUT 7 Anechoic Chamber 8 Electromagnetic Radiation Pattern 9 Tuning Circuit 10 Amplifier 11 Detection Circuit 12 Low Pass Filter 13 Amplifier 14 Power Supply

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 長さ可変のダイポールアンテナと、輝度
を変化できるランプと、広帯域または複数の周波数帯の
アンプと、検波器及び電源を電波吸収処理した筺体に収
納してなる測定ユニットと、この測定ユニットを3次元
の座標の各点へ移動するユニット移動手段と、前記測定
ユニットの位置の電界強度に比例して前記ランプの明る
さを変化させる制御手段とを備え、3次元で被測定物を
走査して前記ランプの明るさの変化を記録しこの記録内
容を編集再生して可視化することを特徴とする電磁輻射
可視化装置。
1. A variable length dipole antenna, a lamp whose brightness can be changed, an amplifier for a wide band or a plurality of frequency bands, a detector and a power supply unit which are housed in a housing that has been subjected to electromagnetic wave absorption processing. The object to be measured is three-dimensionally provided with unit moving means for moving the measuring unit to each point of three-dimensional coordinates and control means for changing the brightness of the lamp in proportion to the electric field strength at the position of the measuring unit. The electromagnetic radiation visualization device is characterized in that the change in the brightness of the lamp is recorded by scanning, and the recorded contents are edited and reproduced for visualization.
JP3282470A 1991-10-29 1991-10-29 Electromagnetic radiation visualization device Expired - Lifetime JP3043490B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3282470A JP3043490B2 (en) 1991-10-29 1991-10-29 Electromagnetic radiation visualization device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3282470A JP3043490B2 (en) 1991-10-29 1991-10-29 Electromagnetic radiation visualization device

Publications (2)

Publication Number Publication Date
JPH05119089A true JPH05119089A (en) 1993-05-14
JP3043490B2 JP3043490B2 (en) 2000-05-22

Family

ID=17652850

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3282470A Expired - Lifetime JP3043490B2 (en) 1991-10-29 1991-10-29 Electromagnetic radiation visualization device

Country Status (1)

Country Link
JP (1) JP3043490B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6300779B1 (en) 1998-08-28 2001-10-09 Nec Corporation Semiconductor device evaluation apparatus and semiconductor device evaluation program product
WO2009028186A1 (en) * 2007-08-29 2009-03-05 Kanazawa University Electromagnetic field space distribution visualizing device, electromagnetic field space distribution visualizing method, and program thereof
JP2010085362A (en) * 2008-10-02 2010-04-15 Ojima Shisaku Kenkyusho:Kk Apparatus for measuring electric field intensity
CN103941106A (en) * 2014-04-29 2014-07-23 工业和信息化部电子第五研究所 Electromagnetic field near-field scanning device and scanning method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6300779B1 (en) 1998-08-28 2001-10-09 Nec Corporation Semiconductor device evaluation apparatus and semiconductor device evaluation program product
US6661243B2 (en) 1998-08-28 2003-12-09 Nec Corporation Semiconductor device evaluation apparatus and semiconductor device evaluation program product
WO2009028186A1 (en) * 2007-08-29 2009-03-05 Kanazawa University Electromagnetic field space distribution visualizing device, electromagnetic field space distribution visualizing method, and program thereof
JP5589226B2 (en) * 2007-08-29 2014-09-17 国立大学法人金沢大学 Electromagnetic field spatial distribution visualization device, electromagnetic field spatial distribution visualization method, and program thereof
US9063180B2 (en) 2007-08-29 2015-06-23 Kanazawa University Electromagnetic field space distribution visualizing device, electromagnetic field space distribution visualizing method, and program thereof
JP2010085362A (en) * 2008-10-02 2010-04-15 Ojima Shisaku Kenkyusho:Kk Apparatus for measuring electric field intensity
CN103941106A (en) * 2014-04-29 2014-07-23 工业和信息化部电子第五研究所 Electromagnetic field near-field scanning device and scanning method

Also Published As

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JP3043490B2 (en) 2000-05-22

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