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JPH05109870A - Die bonding apparatus - Google Patents

Die bonding apparatus

Info

Publication number
JPH05109870A
JPH05109870A JP29773091A JP29773091A JPH05109870A JP H05109870 A JPH05109870 A JP H05109870A JP 29773091 A JP29773091 A JP 29773091A JP 29773091 A JP29773091 A JP 29773091A JP H05109870 A JPH05109870 A JP H05109870A
Authority
JP
Japan
Prior art keywords
semiconductor chip
needles
die bonding
bonding apparatus
adhesive sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29773091A
Other languages
Japanese (ja)
Other versions
JP3208580B2 (en
Inventor
Hiroshi Ishiyama
弘 石山
Hitoshi Tamaki
仁 玉城
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP29773091A priority Critical patent/JP3208580B2/en
Publication of JPH05109870A publication Critical patent/JPH05109870A/en
Application granted granted Critical
Publication of JP3208580B2 publication Critical patent/JP3208580B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68318Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H01L2221/68322Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Die Bonding (AREA)
  • Dicing (AREA)

Abstract

PURPOSE:To prevent a semiconductor chip from being pushed up defectively and to prevent the semiconductor chip from being damaged by a method wherein a plurality of pushing-up needles are situated in such a way that the plane including tips of the pushing-up needles forms a definite angle to a horizontal plane. CONSTITUTION:An angle theta which is formed by a straight line L connecting tips of pushing-up needles 10 and by a horizontal plane H is set at 1 to 15 deg. the pushing-up needles 10 are attached to a needle holder 12. The needle holder 12 is situated at the lower part of a semiconductor chip 20 which has been attached to an adhesive sheet 30; it is moved upward. Then, the pushing-up needles pierce through the adhesive sheet 30; they push up the semiconductor chip 20. In a state that only one end part 22 of the semiconductor chip 20 has adhered to the adhesive sheet 30, the semiconductor chip 20 is stripped from the adhesive sheet 30. The semiconductor chip 20 which has been pushed up is picked up easily and sent to a die bonding process. Thereby, the semiconductor chip 20 can be pushed without affecting an adjacent semiconductor chip 20.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、改良された複数の突上
ニードルを有するダイボンディング装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improved die bonding apparatus having a plurality of protruding needles.

【0002】[0002]

【従来の技術】ダイボンディング工程において裏面突上
方式が用いられている。この方式は、ウェハの裏面に粘
着シートを張り合わせてウェハを半導体チップに分離す
るダイシング工程の後、図5に模式的に示すように、突
上ニードル110を粘着シート130の裏面から突き上
げてピックアップツール(図示せず)によって半導体チ
ップ120を直接ピックアップする方式である。ピック
アップされた半導体チップは次のダイボンディング工程
に送られる。
2. Description of the Related Art A back surface bumping method is used in a die bonding process. According to this method, after a dicing process in which an adhesive sheet is attached to the back surface of the wafer to separate the wafer into semiconductor chips, the push-up needle 110 is pushed up from the back surface of the adhesive sheet 130 as shown in FIG. This is a method in which the semiconductor chip 120 is directly picked up by (not shown). The semiconductor chip picked up is sent to the next die bonding step.

【0003】[0003]

【発明が解決しようとする課題】従来のダイボンディン
グ装置においては、複数の突上ニードル110の先端を
含む平面112は、図6に模式的に示すように、水平面
114と平行である。従って、半導体チップは概ね水平
に突き上げられる。そのため、かかる突上ニードル11
0によって半導体チップ120を突き上げた場合、図7
の(A)あるいは(B)に模式的に示すような半導体チ
ップの突き上げ不良を生じ、半導体チップ120のピッ
クアップツールによるピックアップが困難になるという
問題がある。
In the conventional die bonding apparatus, the plane 112 including the tips of the plurality of protruding needles 110 is parallel to the horizontal plane 114, as schematically shown in FIG. Therefore, the semiconductor chip is pushed up substantially horizontally. Therefore, the thrust needle 11
When the semiconductor chip 120 is pushed up by 0, as shown in FIG.
There is a problem that a semiconductor chip push-up failure as schematically shown in (A) or (B) occurs, and it becomes difficult to pick up the semiconductor chip 120 with a pickup tool.

【0004】従って、本発明の目的は、突上ニードルを
改良し、例えば図7の(A)あるいは(B)に示すよう
な半導体チップの突き上げ不良を生じないダイボンディ
ング装置を提供することにある。
Therefore, it is an object of the present invention to provide a die bonding apparatus which improves the thrust needle and does not cause the semiconductor chip push-up failure as shown in FIG. 7A or 7B, for example. ..

【0005】[0005]

【課題を解決するための手段】上記の目的は、本発明の
第1の態様により、一直線上に配列された複数の突上ニ
ードルを有するダイボンディング装置であって、突上ニ
ードルの先端を結んだ直線が水平面と一定の角度を成す
ことを特徴とするダイボンディング装置によって達成す
ることができる。
According to the first aspect of the present invention, there is provided a die bonding apparatus having a plurality of projecting needles arranged in a straight line, wherein the tip of the projecting needles is connected. This can be achieved by a die bonding apparatus characterized in that the straight line forms a constant angle with the horizontal plane.

【0006】更に、上記の目的は、本発明の第2の態様
により、一直線上に配置されていない複数の突上ニード
ルを有するダイボンディング装置であって、突上ニード
ルの先端を含む平面が水平面と一定の角度を成すことを
特徴とするダイボンディング装置によって達成すること
ができる。
Further, according to the second aspect of the present invention, there is provided a die bonding apparatus having a plurality of protruding needles which are not arranged in a straight line, and a plane including a tip of the protruding needle is a horizontal plane. Can be achieved by a die bonding apparatus characterized by forming a constant angle with.

【0007】本発明の第2の態様においては、複数の突
上ニードルが千鳥状に配列されていることが好ましい。
In the second aspect of the present invention, it is preferable that the plurality of protruding needles are arranged in a staggered pattern.

【0008】第1及び第2の態様において、突上ニード
ルによって突き上げられた状態の半導体チップの安定性
を考慮すると、上記の一定の角度(以下突上ニードル傾
斜角ともいう)は1乃至15度であることが望ましい。
In the first and second aspects, considering the stability of the semiconductor chip in the state of being pushed up by the thrusting needle, the above-mentioned constant angle (hereinafter also referred to as the thrusting needle inclination angle) is 1 to 15 degrees. Is desirable.

【0009】[0009]

【作用】本発明のダイボンディング装置においては、突
上ニードル10によって半導体チップ20が突き上げら
れたとき、図4に模式的に示すように、半導体チップ2
0の一端部22のみが粘着シート30に付着している。
それ故、突き上げられた半導体チップの姿勢が極めて安
定している。また、僅かな力で半導体チップを粘着シー
トから剥すことができる。更に、突上ニードルの突き上
げ位置精度を従来のダイボンディング装置程、高精度に
する必要がなくなる。
In the die bonding apparatus of the present invention, when the semiconductor chip 20 is pushed up by the push-up needle 10, as shown in FIG.
Only one end 22 of 0 is attached to the adhesive sheet 30.
Therefore, the posture of the pushed up semiconductor chip is extremely stable. Further, the semiconductor chip can be peeled off from the adhesive sheet with a slight force. Further, it is not necessary to make the push-up position accuracy of the push-up needle as high as that of the conventional die bonding apparatus.

【0010】[0010]

【実施例】図1に本発明の第1の態様にかかる好ましい
一実施例の拡大正面図を示す。また、図2にかかる実施
例の拡大平面図を示す。7本の突上ニードル10がニー
ドルホルダー12に取り付けられている。これらの突上
ニードル10は一直線上に配列されている。図1中、2
0は半導体チップ、30は粘着シートである。突上ニー
ドルの先端を結んだ直線Lが水平面Hと成す角度θは約
3.8度である。尚、図1の角度θは誇張して描かれて
いる。
1 is an enlarged front view of a preferred embodiment according to the first aspect of the present invention. Further, an enlarged plan view of the embodiment according to FIG. 2 is shown. Seven protruding needles 10 are attached to a needle holder 12. These protruding needles 10 are arranged in a straight line. 2 in FIG.
Reference numeral 0 is a semiconductor chip, and 30 is an adhesive sheet. The angle θ formed by the straight line L connecting the tips of the protruding needles and the horizontal plane H is about 3.8 degrees. The angle θ in FIG. 1 is exaggeratedly drawn.

【0011】本発明の第2の態様においては、複数の突
上ニードル10は一直線上に配列されていない。複数の
突上ニードル10は、千鳥状に配列されていることが好
ましい。突上ニードル10の千鳥状の配列状態を例示す
る拡大平面図を図3の(A)乃至(E)に示す。
In the second aspect of the present invention, the plurality of projecting needles 10 are not arranged in a straight line. The plurality of protrusion needles 10 are preferably arranged in a staggered pattern. 3A to 3E are enlarged plan views illustrating the staggered arrangement of the protruding needles 10.

【0012】図1に示したニードルホルダー12は、突
上ニードル用XYテーブル(図示せず)上に取り付けら
れている。突上ニードル用XYテーブルの移動によっ
て、ニードルホルダー12を、粘着シート30に取り付
けられた半導体チップ20の下方に位置させる。次いで
バキュームホルダー(図示せず)によって、ピックアッ
プすべき半導体チップの周囲にある半導体チップを固定
する。
The needle holder 12 shown in FIG. 1 is mounted on an XY table (not shown) for the protruding needle. The needle holder 12 is positioned below the semiconductor chip 20 attached to the adhesive sheet 30 by moving the XY table for the protruding needle. Then, the semiconductor chip around the semiconductor chip to be picked up is fixed by a vacuum holder (not shown).

【0013】次に、ニードルホルダー12をマイクロメ
ータヘッド(図示せず)によって上方に移動させる。ニ
ードルホルダー12が上方に移動させられると、突上ニ
ードル10は粘着シート30を貫通して半導体チップ2
0を突き上げる。図4に模式的に示すように、半導体チ
ップ20の一端部22のみが粘着シート30に付着した
状態で半導体チップ20は粘着シート30から剥され
る。尚、図4において半導体チップ20の剥がれた状態
の粘着シート30に対する角度は誇張して描かれてい
る。突き上げられた半導体チップ20は、図示していな
いピックアップツールによってピックアップされ次のダ
イボンディング工程に送られる。
Next, the needle holder 12 is moved upward by a micrometer head (not shown). When the needle holder 12 is moved upward, the protruding needle 10 penetrates the adhesive sheet 30 and the semiconductor chip 2
Push up 0. As schematically shown in FIG. 4, the semiconductor chip 20 is peeled from the adhesive sheet 30 with only one end 22 of the semiconductor chip 20 attached to the adhesive sheet 30. In FIG. 4, the angle of the semiconductor chip 20 with respect to the peeled adhesive sheet 30 is exaggerated. The semiconductor chip 20 pushed up is picked up by a pickup tool (not shown) and sent to the next die bonding step.

【0014】以上、本発明を好ましい実施例に基づき説
明したが、本発明のダイボンディング装置はこれらの実
施例に限定されるものではない。突上ニードルの本数、
突上ニードル傾斜角、突上ニードルの千鳥状の配置は、
半導体チップの大きさ、半導体チップの配列状態、ダイ
ボンディング装置の大きさ等に依存して適宜変更するこ
とができる。
Although the present invention has been described based on the preferred embodiments, the die bonding apparatus of the present invention is not limited to these embodiments. Number of thrust needles,
Plunge needle inclination angle, staggered arrangement of the thrust needles,
It can be appropriately changed depending on the size of the semiconductor chips, the arrangement state of the semiconductor chips, the size of the die bonding apparatus, and the like.

【0015】[0015]

【発明の効果】本発明のダイボンディング装置において
は、突上ニードルによって突き上げられた半導体チップ
の姿勢が極めて安定している。また、隣接した半導体チ
ップに影響を与えることなく半導体チップを突き上げる
ことができるので、半導体チップのピックアップを確実
に且つ容易に行うことができる。更には、僅かな力で半
導体チップを粘着シートから剥すことができるので、半
導体チップの破損等を防止することができ、歩留まりの
向上ができる。しかも、突上ニードルの突き上げ位置精
度を従来のダイボンディング装置程、高精度にする必要
がなくなる。
In the die bonding apparatus of the present invention, the posture of the semiconductor chip pushed up by the push-up needle is extremely stable. Further, since the semiconductor chips can be pushed up without affecting adjacent semiconductor chips, the semiconductor chips can be picked up reliably and easily. Furthermore, since the semiconductor chip can be peeled off from the adhesive sheet with a slight force, damage to the semiconductor chip can be prevented and the yield can be improved. Moreover, it is not necessary to make the push-up position accuracy of the push-up needle as high as that of the conventional die bonding apparatus.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の態様にかかる好ましい一実施例
の拡大正面図である。
FIG. 1 is an enlarged front view of a preferred embodiment according to the first aspect of the present invention.

【図2】図1に示す実施例の拡大平面図である。FIG. 2 is an enlarged plan view of the embodiment shown in FIG.

【図3】突上ニードルの千鳥状の配列状態の拡大平面図
である。
FIG. 3 is an enlarged plan view of a staggered arrangement of protrusion needles.

【図4】半導体チップが突き上げられた状態を示す模式
図である。
FIG. 4 is a schematic view showing a state where a semiconductor chip is pushed up.

【図5】従来のダイボンディング装置の突上ニードルに
よる半導体チップの突上状態を示す模式図である。
FIG. 5 is a schematic view showing a protruding state of a semiconductor chip by a protruding needle of a conventional die bonding apparatus.

【図6】従来のダイボンディング装置の突上ニードルの
先端の位置関係を示す模式図である。
FIG. 6 is a schematic view showing a positional relationship between tips of the protruding needles of a conventional die bonding apparatus.

【図7】従来のダイボンディング装置における半導体チ
ップの突き上げ不良を示す模式図である。
FIG. 7 is a schematic diagram showing a push-up failure of a semiconductor chip in a conventional die bonding apparatus.

【符号の説明】[Explanation of symbols]

10,110 突上ニードル 12 ニードルホルダー 20,120 半導体チップ 30,130 粘着シート 10,110 Projection needle 12 Needle holder 20,120 Semiconductor chip 30,130 Adhesive sheet

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】一直線上に配列された複数の突上ニードル
を有するダイボンディング装置であって、突上ニードル
の先端を結んだ直線が水平面と一定の角度を成すことを
特徴とするダイボンディング装置。
1. A die bonding apparatus having a plurality of projecting needles arranged in a straight line, wherein a straight line connecting the tips of the projecting needles forms a constant angle with a horizontal plane. ..
【請求項2】前記一定の角度は1乃至15度であること
を特徴とする請求項1に記載のダイボンディング装置。
2. The die bonding apparatus according to claim 1, wherein the constant angle is 1 to 15 degrees.
【請求項3】一直線上に配置されていない複数の突上ニ
ードルを有するダイボンディング装置であって、突上ニ
ードルの先端を含む平面が水平面と一定の角度を成すこ
とを特徴とするダイボンディング装置。
3. A die bonding apparatus having a plurality of protruding needles which are not arranged on a straight line, wherein a plane including a tip of the protruding needle forms a constant angle with a horizontal plane. ..
【請求項4】複数の突上ニードルが千鳥状に配列されて
いることを特徴とする請求項1又は請求項2に記載のダ
イボンディング装置。
4. The die bonding apparatus according to claim 1, wherein the plurality of protruding needles are arranged in a staggered pattern.
【請求項5】前記一定の角度は1乃至15度であること
を特徴とする請求項3又は請求項4に記載のダイボンデ
ィング装置。
5. The die bonding apparatus according to claim 3, wherein the constant angle is 1 to 15 degrees.
JP29773091A 1991-10-18 1991-10-18 Die bonding method and semiconductor device manufacturing method Expired - Fee Related JP3208580B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29773091A JP3208580B2 (en) 1991-10-18 1991-10-18 Die bonding method and semiconductor device manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29773091A JP3208580B2 (en) 1991-10-18 1991-10-18 Die bonding method and semiconductor device manufacturing method

Publications (2)

Publication Number Publication Date
JPH05109870A true JPH05109870A (en) 1993-04-30
JP3208580B2 JP3208580B2 (en) 2001-09-17

Family

ID=17850435

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29773091A Expired - Fee Related JP3208580B2 (en) 1991-10-18 1991-10-18 Die bonding method and semiconductor device manufacturing method

Country Status (1)

Country Link
JP (1) JP3208580B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009277906A (en) * 2008-05-15 2009-11-26 Denso Corp Method of manufacturing molded package
CN111092046A (en) * 2019-12-31 2020-05-01 广东晶科电子股份有限公司 Thimble method and device
CN112455813A (en) * 2020-11-27 2021-03-09 苏州茂特斯自动化设备有限公司 Tool apron of automatic unloading equipment of chip is torn open and is closed mechanism
WO2022176007A1 (en) * 2021-02-16 2022-08-25 株式会社Fuji Thrust-up device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009277906A (en) * 2008-05-15 2009-11-26 Denso Corp Method of manufacturing molded package
CN111092046A (en) * 2019-12-31 2020-05-01 广东晶科电子股份有限公司 Thimble method and device
CN112455813A (en) * 2020-11-27 2021-03-09 苏州茂特斯自动化设备有限公司 Tool apron of automatic unloading equipment of chip is torn open and is closed mechanism
CN112455813B (en) * 2020-11-27 2024-05-03 苏州茂特斯自动化设备有限公司 Tool apron of automatic unloading equipment of chip is torn open and is closed mechanism
WO2022176007A1 (en) * 2021-02-16 2022-08-25 株式会社Fuji Thrust-up device

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JP3208580B2 (en) 2001-09-17

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