JPH0485153U - - Google Patents
Info
- Publication number
- JPH0485153U JPH0485153U JP12743290U JP12743290U JPH0485153U JP H0485153 U JPH0485153 U JP H0485153U JP 12743290 U JP12743290 U JP 12743290U JP 12743290 U JP12743290 U JP 12743290U JP H0485153 U JPH0485153 U JP H0485153U
- Authority
- JP
- Japan
- Prior art keywords
- infrared rays
- infrared
- optical
- gas
- optical path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第1図は、本考案の一実施例としてのガス分析
計の構成を概略的に示す縦断面説明図である。ま
た、第2図aは、第1図に示されている構造とさ
れたガス分析計を用いてCO濃度を実測した際の
測定データを示すグラフであり、更に第2図bは
、チヨツパを備えた従来構造のガス分析計を用い
て同一条件下にCO濃度を実測した際の測定デー
タを示すグラフである。
10……ガス分析計、12……ハウジング、1
4……共同光路、16……第一の分割ハウジング
、18……分岐光路、20……第二の分割ハウジ
ング、22……第一の光路、24……第二の光路
、26……第三の分割ハウジング、28……透過
窓、32……赤外線源、36……第一のサーモパ
イル、38……第二のサーモパイル、44……被
測定ガス、46……(赤外線を殆ど吸収しない)
ガス、48……基準ガス、50……光学フイルタ
。
FIG. 1 is an explanatory longitudinal cross-sectional view schematically showing the configuration of a gas analyzer as an embodiment of the present invention. Furthermore, Fig. 2a is a graph showing measurement data when CO concentration was actually measured using the gas analyzer having the structure shown in Fig. It is a graph showing measurement data when CO concentration was actually measured under the same conditions using a gas analyzer with a conventional structure. 10...Gas analyzer, 12...Housing, 1
4... Common optical path, 16... First divided housing, 18... Branched optical path, 20... Second divided housing, 22... First optical path, 24... Second optical path, 26... Third Three divided housing, 28...Transmission window, 32...Infrared source, 36...First thermopile, 38...Second thermopile, 44...Measurement gas, 46...(Hardly absorbs infrared rays)
Gas, 48... Reference gas, 50... Optical filter.
Claims (1)
と、 該赤外線源から放射された赤外線が通過せしめ
られる、内部に被測定ガスが導入される測定セル
と、 該測定セルを通過した赤外線を二つの光路に分
岐せしめる光分配器と、 該光分配器により分岐された一方の光路を通じ
て導かれる赤外線が通過せしめられる、赤外線を
殆ど吸収しないガスが内部に封入された測定光路
と、 前記光分配器により分岐された他方の光路を通
じて導かれる赤外線が通過せしめられる、実質的
に測定対象ガス成分にて構成される基準ガス内部
に封入された基準光路と、 前記測定光路を通じて導かれた赤外線が照射せ
しめられて、かかる照射される赤外線の強度に応
じて電圧を出力する第一のサーモパイルと、 前記基準光路を通じて導かれた赤外線が照射せ
しめられて、かかる照射される赤外線の強度に応
じた電圧を出力する第二のサーモパイルとを 備え、前記第一のサーモパイルの出力と前記第二
のサーモパイルの出力とを比較することにより、
被測定ガスの成分に応じた測定出力を得るように
した赤外線式ガス分析計。 (2) 前記赤外線源と前記光分配器との間におけ
る、該赤外線源から放射された赤外線が通過せし
められる光路上に、測定に必要な所定波長域の赤
外線のみを透過する光学フイルタを配置した請求
項(1)記載の赤外線式ガス分析計。[Claims for Utility Model Registration] (1) An infrared source capable of continuously emitting infrared rays; a measurement cell into which a gas to be measured is introduced, through which the infrared rays emitted from the infrared source pass; An optical splitter that splits the infrared rays that passed through the measurement cell into two optical paths, and a gas that hardly absorbs infrared rays is sealed inside, allowing the infrared rays guided through one of the optical paths split by the optical splitter to pass through. a measurement optical path; a reference optical path sealed inside a reference gas substantially composed of a gas component to be measured, through which infrared rays guided through the other optical path branched by the optical splitter are passed; and the measurement optical path. a first thermopile that is irradiated with infrared rays guided through the reference optical path and outputs a voltage according to the intensity of the irradiated infrared rays; and a second thermopile that outputs a voltage according to the intensity of the thermopile, and by comparing the output of the first thermopile and the output of the second thermopile,
An infrared gas analyzer that obtains measurement output according to the components of the gas being measured. (2) An optical filter that transmits only infrared rays in a predetermined wavelength range necessary for measurement is arranged on an optical path between the infrared ray source and the optical distributor, through which infrared rays emitted from the infrared ray source pass. The infrared gas analyzer according to claim (1).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12743290U JPH0485153U (en) | 1990-11-29 | 1990-11-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12743290U JPH0485153U (en) | 1990-11-29 | 1990-11-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0485153U true JPH0485153U (en) | 1992-07-23 |
Family
ID=31874929
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12743290U Pending JPH0485153U (en) | 1990-11-29 | 1990-11-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0485153U (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4944786A (en) * | 1972-06-29 | 1974-04-27 | ||
JPS6348148B2 (en) * | 1980-03-28 | 1988-09-27 | Hitachi Ltd | |
JPH01193627A (en) * | 1988-01-28 | 1989-08-03 | Toshiba Tesuko Kk | Optical moisture meter |
-
1990
- 1990-11-29 JP JP12743290U patent/JPH0485153U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4944786A (en) * | 1972-06-29 | 1974-04-27 | ||
JPS6348148B2 (en) * | 1980-03-28 | 1988-09-27 | Hitachi Ltd | |
JPH01193627A (en) * | 1988-01-28 | 1989-08-03 | Toshiba Tesuko Kk | Optical moisture meter |
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