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JPH0448289A - Light wave range finder - Google Patents

Light wave range finder

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Publication number
JPH0448289A
JPH0448289A JP2157499A JP15749990A JPH0448289A JP H0448289 A JPH0448289 A JP H0448289A JP 2157499 A JP2157499 A JP 2157499A JP 15749990 A JP15749990 A JP 15749990A JP H0448289 A JPH0448289 A JP H0448289A
Authority
JP
Japan
Prior art keywords
light
signal
measurement
phase difference
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2157499A
Other languages
Japanese (ja)
Other versions
JP2929387B2 (en
Inventor
Ikuo Oguri
小栗 郁雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sokkisha Co Ltd
Sokkia Topcon Co Ltd
Original Assignee
Sokkia Co Ltd
Sokkisha Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sokkia Co Ltd, Sokkisha Co Ltd filed Critical Sokkia Co Ltd
Priority to JP2157499A priority Critical patent/JP2929387B2/en
Publication of JPH0448289A publication Critical patent/JPH0448289A/en
Application granted granted Critical
Publication of JP2929387B2 publication Critical patent/JP2929387B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、特に近距離の測距に用いるのに好適な光波距
離計に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a light wave distance meter suitable for use in particular for short distance measurement.

(従来の技術) 従来の光波距離計は、第4図に示すように、主発振器a
に接続された信号変換器すで、周波数f1の信号と周波
数f2の信号を作成し、この信号をセレクタCにより選
択的に発光素子dに加えて、発光素子dから粗測定用の
変調周波数f。
(Prior art) As shown in Fig. 4, a conventional optical distance meter uses a main oscillator a
The signal converter connected to generates a signal with frequency f1 and a signal with frequency f2, and selector C selectively applies these signals to light emitting element d, and from light emitting element d, a modulation frequency f for rough measurement is generated. .

と精測定用の変調周波数f2の変調光を順次出射し、反
射鏡で反射した変調光を受光素子eで受信信号に変換し
、この受信信号をミキサg1フィルタh及び増幅器iを
介して位相検出器jに加え、この位相検出器jで基準信
号と比較して位相差を検出し、測距するようになってお
り、機械内部の光路の長さ分の測定誤差を無くすために
、発光素子dの前方に光路を測距光路し、から機械内部
の参照先路L2に選択的に切換えるミ上述の光波距離計
によれば、2つの周波数f1とf2の信号を作る必要が
あり、更にこの両者の信号を切替えるための回路が必要
である。また測距光の光路[1と参照光の光路[2の切
換えを変調周波数f、と12のそれぞれについて行なう
必要があるとともに位相差の測定も一方の周波数の信号
について行なった後他方の周波数の信号について行なう
ので、測距に時間がかかるという課題があった。
The modulated light with a modulation frequency f2 for precision measurement is sequentially emitted, the modulated light reflected by a reflecting mirror is converted into a received signal by a light receiving element e, and this received signal is phase-detected via a mixer g1 filter h and an amplifier i. In addition to the device j, this phase detector j compares the phase difference with the reference signal and measures the distance.In order to eliminate measurement errors due to the length of the optical path inside the machine, According to the above-mentioned optical distance meter, it is necessary to create signals of two frequencies f1 and f2, and furthermore, it is necessary to create signals of two frequencies f1 and f2. A circuit is required to switch between the two signals. In addition, it is necessary to switch the distance measuring light optical path [1] and the reference light optical path [2] for each of the modulation frequencies f and 12, and also to measure the phase difference for the signal of one frequency, and then for the signal of the other frequency. Since the distance measurement is performed on signals, there is a problem in that it takes time to measure the distance.

本発明は、従来のこのような課題を解決することをその
目的とするものである。
The present invention aims to solve these conventional problems.

(課題を解決するための手段) 本発明は、上記の目的を達成するために、異なる変調周
波数の変調光を送出し、反射鏡で反射した該変調光を受
光素子で受信信号に変換し、該受信信号と基準信号との
位相差から測距する光波距離計において、前記変調光は
粗測定用の基本波成分に精測定用の高調波成分を含む矩
形波で変調された変調光であり、前記受光素子で変換し
た受信信号を粗測定用の基本波成分と精測定用の高調波
成分に分離し、各々の成分と基準信号との位相差を並列
的に測定して測距するようにしたことを特徴とする。
(Means for Solving the Problems) In order to achieve the above object, the present invention transmits modulated light of different modulation frequencies, converts the modulated light reflected by a reflecting mirror into a received signal by a light receiving element, In the optical distance meter that measures distance from the phase difference between the received signal and the reference signal, the modulated light is modulated light with a rectangular wave containing a fundamental wave component for rough measurement and a harmonic component for precise measurement. , the received signal converted by the light receiving element is separated into a fundamental wave component for rough measurement and a harmonic component for precise measurement, and the phase difference between each component and the reference signal is measured in parallel to measure the distance. It is characterized by the following.

(作 用) 第2図示のような出射光の矩形変調波は次のフーリエ変
換の式 で表わされ、第3図に示されるように基本波成分と各種
高次高調波の灯波を含んでおり、この基本波5Irlx
を粗測定用とし、高調波の1つ例え成分は高次程測定精
度がよくなるが、振幅が小さくなるので測距可能距離が
短くなる。したがって短距離例えば500m位までの測
定にはこの矩形波の変調光は、受光素子で受信信号で変
換された後、基本波成分と所定の高調波成分例えば第1
1次高調波底分が取り出され、各々が基準信号との位相
差が求められ、粗測定と精測定が並行して行なわれる。
(Function) The rectangular modulated wave of the emitted light as shown in Figure 2 is expressed by the following Fourier transform equation, and as shown in Figure 3, it includes a fundamental wave component and various higher harmonic light waves. And this fundamental wave 5Irlx
is used for rough measurement, and the higher the harmonic component, the better the measurement accuracy, but the smaller the amplitude, the shorter the measurable distance. Therefore, for short-distance measurements up to about 500 m, this rectangular wave modulated light is converted into a received signal by a light-receiving element, and is then converted into a fundamental wave component and a predetermined harmonic component, such as the first harmonic component.
The first-order harmonic base is extracted, and the phase difference of each with respect to the reference signal is determined, and coarse and fine measurements are performed in parallel.

(実施例) 以下本発明の実施例を図面につき説明する。(Example) Embodiments of the present invention will be described below with reference to the drawings.

第1図において、1は主発振器2からの例えば8MHz
の信号を例えば800KHzの矩形波信号とする信号変
換器で、この800KHzの矩形波信号は増幅器3を介
して発光素子4に加えられる。5は発光素子4から出射
し反射鏡で反射された変調光を受信信号に変換する受光
素子で、この受光素子5は増幅器6.7as 7bを介
してフィルタ8aと8bに加えられ、かくして、このフ
ィルタ8aと8bにより基本波である800KHzの5
lrl信号と第11次高調波である8 、 8MHzの
5ffl信号が分離して取出されるようになっている。
In FIG. 1, 1 is for example 8MHz from the main oscillator 2.
This 800 KHz rectangular wave signal is applied to the light emitting element 4 via the amplifier 3. Reference numeral 5 denotes a light receiving element that converts the modulated light emitted from the light emitting element 4 and reflected by the reflecting mirror into a received signal. 5 of the fundamental wave of 800 KHz by filters 8a and 8b.
The lrl signal and the 5ffl signal of 8.8 MHz, which is the 11th harmonic, are extracted separately.

この800KHzと6.8MH2の受信信号はミキサ9
aと9bで信号変換器1から出力した630KHzと6
.63 MHzの参照信号により各々30 KHzと1
3..23MHzの信号に変換され、フィルタ10aと
lObを通すことにより受信信号の位相差を精密に測定
するに役立つ30 KHzの信号のみが鍛圧され、この
信号は各々増幅器11aとllbを経て位相検出器12
aと12bに加えられる。この位相検出器12aと12
bは各々30 KHzの受信信号と信号変換器1から出
力する30 KHzの基準信号との位相差を測定し、こ
の位相差信号をCPU13に出力する。
This 800KHz and 6.8MH2 received signal is sent to mixer 9.
630KHz and 6 output from signal converter 1 at a and 9b
.. 30 KHz and 1, respectively, with a 63 MHz reference signal.
3. .. Only the 30 KHz signal, which is useful for precisely measuring the phase difference of the received signal, is converted into a 23 MHz signal and passed through the filters 10a and 10b, and this signal is passed through the amplifiers 11a and 11b, respectively, to the phase detector 12.
added to a and 12b. These phase detectors 12a and 12
b measures the phase difference between each 30 KHz received signal and the 30 KHz reference signal output from the signal converter 1, and outputs this phase difference signal to the CPU 13.

この実施例では、従来例と同様に発光素子4の前方に光
路を測距光路L1から機械内部の参照光路L2に選択的
に切換えるミラー14を備えており、受信信号と基準信
号の位相差を測定した後、ミラー14を切換えて参照光
を参照光路L2を経て受光素子5に入射させ、受光素子
5で変換された参照信号と基準信号との位相差を位相検
出器12aと12bで測定し、この位相差信号をCPU
 13に出力する。CPU 13では、受信信号と基準
信号の位相差と、参照信号と基準信号の位相差から機械
内部の光路の長さ分の測定誤差を補正した測距値を算出
する。
In this embodiment, as in the conventional example, a mirror 14 is provided in front of the light emitting element 4 to selectively switch the optical path from the ranging optical path L1 to the reference optical path L2 inside the machine, and the phase difference between the received signal and the reference signal is After the measurement, the mirror 14 is switched to make the reference light enter the light receiving element 5 through the reference optical path L2, and the phase difference between the reference signal converted by the light receiving element 5 and the reference signal is measured by the phase detectors 12a and 12b. , this phase difference signal is sent to the CPU
Output to 13. The CPU 13 calculates a distance value corrected for a measurement error corresponding to the length of the optical path inside the machine from the phase difference between the received signal and the reference signal and the phase difference between the reference signal and the reference signal.

尚、第1図において、15は例えば15 MHzの信号
発生器で、位相検出器12aと12bは各々この15 
MHzの信号を前記位相差に相当する期間カウントして
そのカウント値を位相差信号として出力するようになっ
ている。
In FIG. 1, 15 is, for example, a 15 MHz signal generator, and the phase detectors 12a and 12b are connected to this 15 MHz signal generator.
The MHz signal is counted for a period corresponding to the phase difference, and the counted value is output as a phase difference signal.

(発明の効果) 本発明は、上述の通りの構成を有するから、粗測定と精
測定とを並列的に行なうことができ、測定時間を短縮す
ることができる。また、粗測定用の低周波信号と精測定
用の高周波信号を作る必要もなくさらにこれらを交互に
出力する必要もないので、回路構成が簡潔になる。測距
光路と参照光路とを切換えるように構成する場合には、
この切換えが一度ですみ、測距時間を更に短縮できる。
(Effects of the Invention) Since the present invention has the above-described configuration, rough measurement and fine measurement can be performed in parallel, and measurement time can be shortened. Further, since there is no need to create a low frequency signal for coarse measurement and a high frequency signal for precise measurement, and there is no need to output these signals alternately, the circuit configuration becomes simple. When configuring to switch between the distance measuring optical path and the reference optical path,
This switching only needs to be done once, and distance measurement time can be further shortened.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のブロック図、第2図はその
出射光の変調波の波形図、第3図はその含有成分波形図
、第4図は従来例のブロック図である。 1・・・信号変換器   4・・・発光素子5・・・受
光素子  8a、 8b・・・フィルタ10a 、 1
0b・・・フィルタ
FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a waveform diagram of a modulated wave of the emitted light, FIG. 3 is a waveform diagram of its contained components, and FIG. 4 is a block diagram of a conventional example. 1... Signal converter 4... Light emitting element 5... Light receiving element 8a, 8b... Filter 10a, 1
0b...filter

Claims (1)

【特許請求の範囲】[Claims] 矩形波に変調された変調光を送出し、反射鏡で反射した
該変調光を受光素子で受信信号に変換し、該受信信号と
基準信号との位相差から測距する光波距離計において、
前記変調光は粗測定用の基本波成分に精測定用の高調波
成分を含む矩形波で変調された変調光であり、前記受光
素子で変換した受信信号を粗測定用の基本波成分と精測
定用の高調波成分に分離し、各々の成分と基準信号との
位相差を並列的に測定して測距するようにしたことを特
徴とする光波距離計。
In a light wave distance meter that transmits modulated light modulated into a rectangular wave, converts the modulated light reflected by a reflecting mirror into a received signal by a light receiving element, and measures distance from the phase difference between the received signal and a reference signal,
The modulated light is modulated light with a rectangular wave that includes a fundamental wave component for coarse measurement and a harmonic component for precise measurement, and the received signal converted by the light receiving element is combined with the fundamental wave component for coarse measurement and the harmonic component for precision measurement. A light wave distance meter characterized in that the distance is measured by separating harmonic components for measurement and measuring the phase difference between each component and a reference signal in parallel.
JP2157499A 1990-06-18 1990-06-18 Lightwave rangefinder Expired - Fee Related JP2929387B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2157499A JP2929387B2 (en) 1990-06-18 1990-06-18 Lightwave rangefinder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2157499A JP2929387B2 (en) 1990-06-18 1990-06-18 Lightwave rangefinder

Publications (2)

Publication Number Publication Date
JPH0448289A true JPH0448289A (en) 1992-02-18
JP2929387B2 JP2929387B2 (en) 1999-08-03

Family

ID=15651024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2157499A Expired - Fee Related JP2929387B2 (en) 1990-06-18 1990-06-18 Lightwave rangefinder

Country Status (1)

Country Link
JP (1) JP2929387B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09236662A (en) * 1996-02-29 1997-09-09 Ushikata Shokai:Kk Electronic distance meter
JP2006138702A (en) * 2004-11-11 2006-06-01 Sokkia Co Ltd Light wave distance meter
JP2007155660A (en) * 2005-12-08 2007-06-21 Sokkia Co Ltd Light wave distance meter
CN106662641A (en) * 2014-11-06 2017-05-10 株式会社电装 Time-of-flight distance measurement device and method for same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62127685A (en) * 1985-11-28 1987-06-09 Matsushita Electric Ind Co Ltd Laser distance measuring instrument

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62127685A (en) * 1985-11-28 1987-06-09 Matsushita Electric Ind Co Ltd Laser distance measuring instrument

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09236662A (en) * 1996-02-29 1997-09-09 Ushikata Shokai:Kk Electronic distance meter
JP2006138702A (en) * 2004-11-11 2006-06-01 Sokkia Co Ltd Light wave distance meter
JP2007155660A (en) * 2005-12-08 2007-06-21 Sokkia Co Ltd Light wave distance meter
CN106662641A (en) * 2014-11-06 2017-05-10 株式会社电装 Time-of-flight distance measurement device and method for same
CN106662641B (en) * 2014-11-06 2019-08-16 株式会社电装 Light flight type range unit and its method

Also Published As

Publication number Publication date
JP2929387B2 (en) 1999-08-03

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