JPH044285U - - Google Patents
Info
- Publication number
- JPH044285U JPH044285U JP4595890U JP4595890U JPH044285U JP H044285 U JPH044285 U JP H044285U JP 4595890 U JP4595890 U JP 4595890U JP 4595890 U JP4595890 U JP 4595890U JP H044285 U JPH044285 U JP H044285U
- Authority
- JP
- Japan
- Prior art keywords
- pin probe
- test object
- poor contact
- prevent
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 4
- 238000002788 crimping Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000011990 functional testing Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4595890U JPH044285U (fr) | 1990-04-27 | 1990-04-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4595890U JPH044285U (fr) | 1990-04-27 | 1990-04-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH044285U true JPH044285U (fr) | 1992-01-16 |
Family
ID=31560606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4595890U Pending JPH044285U (fr) | 1990-04-27 | 1990-04-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH044285U (fr) |
-
1990
- 1990-04-27 JP JP4595890U patent/JPH044285U/ja active Pending