JPH04299317A - Semiconductor device for light valve and production thereof - Google Patents
Semiconductor device for light valve and production thereofInfo
- Publication number
- JPH04299317A JPH04299317A JP3065065A JP6506591A JPH04299317A JP H04299317 A JPH04299317 A JP H04299317A JP 3065065 A JP3065065 A JP 3065065A JP 6506591 A JP6506591 A JP 6506591A JP H04299317 A JPH04299317 A JP H04299317A
- Authority
- JP
- Japan
- Prior art keywords
- light valve
- semiconductor device
- single crystal
- pixel
- pixel region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 14
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000000758 substrate Substances 0.000 claims abstract description 16
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims abstract description 13
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 9
- 229920005591 polysilicon Polymers 0.000 claims abstract description 9
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 7
- 239000012780 transparent material Substances 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 239000013078 crystal Substances 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- 230000001590 oxidative effect Effects 0.000 claims 1
- 230000003014 reinforcing effect Effects 0.000 claims 1
- CNQCVBJFEGMYDW-UHFFFAOYSA-N lawrencium atom Chemical compound [Lr] CNQCVBJFEGMYDW-UHFFFAOYSA-N 0.000 abstract description 6
- 230000002787 reinforcement Effects 0.000 abstract description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/103—Materials and properties semiconductor a-Si
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/104—Materials and properties semiconductor poly-Si
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/105—Materials and properties semiconductor single crystal Si
Landscapes
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は光弁装置、特にアクティ
ブマトリクス型光弁装置用半導体装置及びその製造方法
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light valve device, particularly a semiconductor device for an active matrix type light valve device, and a method for manufacturing the same.
【0002】0002
【従来の技術】従来、光弁装置としては、ポリシリコン
又はアモルファスシリコンをスイッチトランジスタとし
たものが知られていた。2. Description of the Related Art Conventionally, light valve devices using polysilicon or amorphous silicon as switch transistors have been known.
【0003】0003
【発明が解決しようとする課題】しかしながら、上記の
光弁装置では駆動回路が内蔵されておらず、別に製造し
た駆動用ICと外部で接続する必要があった。このため
、システムとしては実装コストが上乗せされ、また接続
部は、100μm以上のピッチでパッド部を形成しなけ
ればならないため、装置の小型化ができないという問題
点があった。[Problems to be Solved by the Invention] However, the above-mentioned light valve device does not have a built-in drive circuit, and needs to be externally connected to a separately manufactured drive IC. This increases the mounting cost for the system, and the pads must be formed at a pitch of 100 .mu.m or more, making it impossible to miniaturize the device.
【0004】また、一部ポリシリコンを材料に駆動回路
内蔵型の光弁装置も知られているが、駆動回路もポリシ
リコンで形成されているため、高速な回路を形成できな
いという問題点があった。本発明は、上記課題を解消し
て高速動作可能な駆動回路を内蔵した小型の光弁装置を
形成できる光弁用半導体装置及びその製造方法を提供す
ることを目的とする。[0004]Also, a light valve device with a built-in drive circuit made partially of polysilicon is known, but since the drive circuit is also made of polysilicon, there is a problem that a high-speed circuit cannot be formed. Ta. SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor device for a light valve and a method for manufacturing the same, which can solve the above-mentioned problems and form a small-sized light valve device incorporating a drive circuit capable of high-speed operation.
【0005】[0005]
【課題を解決するための手段】本発明の半導体装置が上
記目的を達成するために採用した主たる手段は、画素の
スイッチトランジスタをポリシリコン又はアモルファス
シリコンにより形成し、同一基板上に単結晶シリコンよ
り成る駆動回路を形成してあることを特徴とする。[Means for Solving the Problems] The main means adopted by the semiconductor device of the present invention to achieve the above object is to form the switch transistor of the pixel using polysilicon or amorphous silicon, and to use single crystal silicon on the same substrate. It is characterized by forming a drive circuit consisting of:
【0006】製造方法としては、単結晶シリコン基板上
に画素領域と駆動回路領域とを形成し、画素領域下の単
結晶シリコン基板を除去し、光透過を可能にしているこ
とを特徴とする。The manufacturing method is characterized in that a pixel region and a drive circuit region are formed on a single-crystal silicon substrate, and the single-crystal silicon substrate below the pixel region is removed to enable light transmission.
【0007】[0007]
【作用】上述したように、本発明は、従来のポリシリコ
ン又はアモルファスシリコンを用いた光弁装置に比べて
、小型、高速な光弁装置を形成することのできる、光弁
用半導体装置を得ることができる。[Operation] As described above, the present invention provides a semiconductor device for a light valve that can form a light valve device that is smaller and faster than a conventional light valve device using polysilicon or amorphous silicon. be able to.
【0008】[0008]
【実施例】以下、図面を参照して本発明の好適な実施例
を説明する。図1は本発明の半導体装置の一実施例を示
す模式的断面図である。単結晶シリコン基板101上に
駆動回路素子103が形成され、画素領域108におい
ては、フィールド酸化膜102上にスイッチトランジス
タ104が形成されている。なお、図示しないが駆動回
路素子103とスイッチトランジスタ104は、互いに
配線105で接続されている。また画素領域108下面
の単結晶シリコン基板101は除去され、補強のために
透明材料109が充填されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic cross-sectional view showing an embodiment of the semiconductor device of the present invention. A drive circuit element 103 is formed on a single crystal silicon substrate 101, and a switch transistor 104 is formed on a field oxide film 102 in a pixel region 108. Although not shown, the drive circuit element 103 and the switch transistor 104 are connected to each other by a wiring 105. Furthermore, the single crystal silicon substrate 101 on the lower surface of the pixel region 108 is removed and filled with a transparent material 109 for reinforcement.
【0009】図1の実施例によれば、駆動回路素子10
3は単結晶シリコン上に形成されており、高速動作が可
能である。また、スイッチトランジスタ104と駆動回
路素子103は、ICプロセス中に互いに配線されてい
るので、数μmピッチでの接続が可能であり、従来は光
弁装置と外部のICとを接続する場合に100μm程度
のピッチが必要であることに比べると、著しい微細化が
可能であり、接続部が無いので信頼性も向上する。According to the embodiment of FIG. 1, the drive circuit element 10
3 is formed on single crystal silicon and is capable of high-speed operation. Furthermore, since the switch transistor 104 and the drive circuit element 103 are wired to each other during the IC process, it is possible to connect them at a pitch of several μm. Compared to the fact that a certain pitch is required, significant miniaturization is possible, and since there are no connecting parts, reliability is also improved.
【0010】図2(a)〜(c)は、図1の実施例にか
かる光弁用半導体装置の製造方法の工程順断面図である
。図2(a)に示すように、通常のICプロセスを用い
、単結晶シリコン基板101上に駆動回路素子103及
びスイッチトランジスタ104を形成する。詳しくはフ
ィールド酸化膜102を形成した後、ポリシリコン又は
アモルファスシリコンを成膜し、画素領域108にのみ
スイッチトランジスタ104を形成するためにパターニ
ングして残し、続いて駆動回路素子103に従ってIC
プロセスによりゲート電極と一対のソース・ドレイン領
域を有するMOS型トランジスタを形成する。また、I
Cプロセス中、適当な工程で単結晶シリコン基板101
の裏面に窒化シリコン膜107を形成し、両面アライナ
ー等を用いてパターニングし、画素領域108に相当す
る部分をエッチング除去しておく。FIGS. 2(a) to 2(c) are cross-sectional views showing the method of manufacturing the semiconductor device for a light valve according to the embodiment of FIG. 1 in the order of steps. As shown in FIG. 2A, a drive circuit element 103 and a switch transistor 104 are formed on a single crystal silicon substrate 101 using a normal IC process. Specifically, after forming the field oxide film 102, polysilicon or amorphous silicon is deposited, patterned and left only in the pixel region 108 to form the switch transistor 104, and then an IC is formed according to the drive circuit element 103.
Through the process, a MOS transistor having a gate electrode and a pair of source/drain regions is formed. Also, I
During the C process, the single crystal silicon substrate 101 is removed at an appropriate step.
A silicon nitride film 107 is formed on the back surface of the substrate, patterned using a double-sided aligner, etc., and a portion corresponding to the pixel region 108 is removed by etching.
【0011】次に、図2(b)に示すように窒化シリコ
ン膜107をマスクとしてKOH溶液により単結晶シリ
コン基板101をエッチング除去する。このエッチング
はフィールド酸化膜102が露出した時点で進行が止ま
る。エッチャントにはKOHの他、ヒドラジン溶液を用
いてもよい。エッチングにより、画素領域108が薄膜
化し強度が保てない場合は、あらかじめ保護膜106上
に接着剤等を用いて支持用基板を固着しておくとよい。Next, as shown in FIG. 2B, the single crystal silicon substrate 101 is etched away using a KOH solution using the silicon nitride film 107 as a mask. The progress of this etching stops when the field oxide film 102 is exposed. In addition to KOH, a hydrazine solution may be used as the etchant. If the pixel region 108 becomes thinner due to etching and its strength cannot be maintained, it is preferable to fix a supporting substrate on the protective film 106 in advance using an adhesive or the like.
【0012】次に、図2(c)に示すように画素領域1
08下面の凹部に透明材料109を充填する。透明材料
109は、例えば樹脂又は無機のSiO2 を主材とす
るものからなり、スピンオン法又はポッティング法など
により塗布する。塗布後には、熱処理又は紫外線処理等
を施して完全に硬化させる。以上により図1に示す光弁
用半導体装置が完成する。Next, as shown in FIG. 2(c), the pixel area 1
A transparent material 109 is filled into the concave portion of the lower surface of 08. The transparent material 109 is made of, for example, resin or inorganic SiO2 as its main material, and is applied by a spin-on method or a potting method. After coating, it is completely cured by heat treatment or ultraviolet treatment. Through the above steps, the semiconductor device for a light valve shown in FIG. 1 is completed.
【0013】[0013]
【発明の効果】上述したように本発明によれば、従来の
アモルファスシリコンやポリシリコンを用いた光弁装置
に比べて、小型、高速動作可能な光弁装置を形成するこ
とのできる光弁用半導体装置を安価に製造することがで
きる。Effects of the Invention As described above, according to the present invention, a light valve device can be formed which is smaller and can operate at higher speed than light valve devices using conventional amorphous silicon or polysilicon. A semiconductor device can be manufactured at low cost.
【図1】本発明の半導体装置の一実施例を示す模式的断
面図である。FIG. 1 is a schematic cross-sectional view showing an embodiment of a semiconductor device of the present invention.
【図2】本発明の製造方法を示す模式的部分断面図であ
る。FIG. 2 is a schematic partial cross-sectional view showing the manufacturing method of the present invention.
101 単結晶シリコン基板 102 フィールド酸化膜 103 駆動回路素子 104 スイッチトランジスタ 105 配線 106 保護膜 107 シリコン窒化膜 108 画素領域 109 透明材料 101 Single crystal silicon substrate 102 Field oxide film 103 Drive circuit element 104 Switch transistor 105 Wiring 106 Protective film 107 Silicon nitride film 108 pixel area 109 Transparent material
Claims (3)
素のスイッチトランジスタはポリシリコンからなり、駆
動回路は単結晶シリコンにより形成されていることを特
徴とする光弁用半導体装置。1. A semiconductor device for a light valve, characterized in that a driving circuit is built into the same chip, a switch transistor of a pixel is made of polysilicon, and the driving circuit is formed of single crystal silicon.
ルファスシリコンからなる請求項1記載の光弁用半導体
装置。2. The semiconductor device for a light valve according to claim 1, wherein the switch transistor of the pixel is made of amorphous silicon.
し、画素領域を設ける工程と、ICプロセスにより駆動
回路を形成し、同時に画素のスイッチトランジスタ及び
画素電極を形成する工程と、画素領域下面のシリコン単
結晶基板を除去する工程と、露出した画素領域下面に補
強用の透明材料を充填する工程と、からなる光弁用半導
体装置の製造方法。3. A step of selectively oxidizing a silicon single crystal substrate to provide a pixel region, a step of forming a drive circuit by an IC process, and simultaneously forming a pixel switch transistor and a pixel electrode, and a step of forming a pixel region on the lower surface of the pixel region. A method for manufacturing a semiconductor device for a light valve, comprising the steps of: removing a silicon single crystal substrate; and filling a reinforcing transparent material into the lower surface of an exposed pixel region.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6506591A JP3076880B2 (en) | 1991-03-28 | 1991-03-28 | Semiconductor device for light valve and method of manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6506591A JP3076880B2 (en) | 1991-03-28 | 1991-03-28 | Semiconductor device for light valve and method of manufacturing the same |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04299317A true JPH04299317A (en) | 1992-10-22 |
JP3076880B2 JP3076880B2 (en) | 2000-08-14 |
Family
ID=13276184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6506591A Expired - Lifetime JP3076880B2 (en) | 1991-03-28 | 1991-03-28 | Semiconductor device for light valve and method of manufacturing the same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3076880B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0609809A1 (en) * | 1993-02-01 | 1994-08-10 | Canon Kabushiki Kaisha | Liquid crystal display device |
JPH06222391A (en) * | 1993-01-28 | 1994-08-12 | Canon Inc | Semiconductor device and liquid crystal display device |
EP0617313A3 (en) * | 1993-03-08 | 1995-05-10 | Seiko Instr Inc | Light modulator device with a protection circuit including a semiconductor component. |
EP0952611A2 (en) * | 1992-10-21 | 1999-10-27 | Seiko Instruments Inc. | Semiconductor device |
-
1991
- 1991-03-28 JP JP6506591A patent/JP3076880B2/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0952611A2 (en) * | 1992-10-21 | 1999-10-27 | Seiko Instruments Inc. | Semiconductor device |
JPH06222391A (en) * | 1993-01-28 | 1994-08-12 | Canon Inc | Semiconductor device and liquid crystal display device |
EP0609809A1 (en) * | 1993-02-01 | 1994-08-10 | Canon Kabushiki Kaisha | Liquid crystal display device |
US5691794A (en) * | 1993-02-01 | 1997-11-25 | Canon Kabushiki Kaisha | Liquid crystal display device |
EP0617313A3 (en) * | 1993-03-08 | 1995-05-10 | Seiko Instr Inc | Light modulator device with a protection circuit including a semiconductor component. |
Also Published As
Publication number | Publication date |
---|---|
JP3076880B2 (en) | 2000-08-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2866730B2 (en) | Method of forming semiconductor circuit | |
JP2001060697A5 (en) | Semiconductor device and method of manufacturing the same | |
JPH0667205A (en) | Semiconmductor device for light valve and its manufacture | |
KR20080059889A (en) | Array substrate for thin film transistor liquid crystal display device and manufacturing method thereof | |
JPH08505010A (en) | Method for producing single crystal silicon island on quartz substrate | |
US20040102022A1 (en) | Methods of fabricating integrated circuitry | |
CN100416802C (en) | Wafer level packaging method and structure | |
US9425133B2 (en) | Integrated circuits and methods of forming conductive lines and conductive pads therefor | |
JPH04299317A (en) | Semiconductor device for light valve and production thereof | |
US7033863B2 (en) | Semiconductor device and manufacturing method for the same | |
JP2824818B2 (en) | Active matrix liquid crystal display | |
JPH01181570A (en) | Manufacture of thin film transistor | |
US6888234B2 (en) | Semiconductor device and manufacturing method for the same | |
JP2003243646A (en) | Composite semiconductor element and its manufacturing method | |
US6128052A (en) | Semiconductor device applicable for liquid crystal display device, and process for its fabrication | |
JP3599813B2 (en) | Semiconductor device | |
JP3019047B2 (en) | Active matrix type TFT element array | |
EP0936668B1 (en) | Method of producing thin film transistor | |
JP3076705B2 (en) | Liquid crystal display device and method of manufacturing the same | |
JPH06347830A (en) | Light transmission type semiconductor device and its production | |
JPH06242469A (en) | Semiconductor device for light valve and its manufacture | |
JPH09244547A (en) | Production of display device | |
JPH04283727A (en) | Liquid crystal display device | |
JP3342732B2 (en) | Method of manufacturing semiconductor device for light valve | |
JPH01241868A (en) | Semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080616 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090616 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100616 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100616 Year of fee payment: 10 |
|
RD03 | Notification of appointment of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: R3D03 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100616 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110616 Year of fee payment: 11 |
|
EXPY | Cancellation because of completion of term |