JPH04280646A - Tab wiring board - Google Patents
Tab wiring boardInfo
- Publication number
- JPH04280646A JPH04280646A JP6910691A JP6910691A JPH04280646A JP H04280646 A JPH04280646 A JP H04280646A JP 6910691 A JP6910691 A JP 6910691A JP 6910691 A JP6910691 A JP 6910691A JP H04280646 A JPH04280646 A JP H04280646A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- wiring board
- resin flow
- lead opening
- tab
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920005989 resin Polymers 0.000 claims abstract description 52
- 239000011347 resin Substances 0.000 claims abstract description 52
- 230000002265 prevention Effects 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 6
- 229910052802 copper Inorganic materials 0.000 claims description 6
- 239000010949 copper Substances 0.000 claims description 6
- 238000007789 sealing Methods 0.000 abstract description 19
- 239000000463 material Substances 0.000 abstract description 6
- 239000004065 semiconductor Substances 0.000 abstract description 5
- 239000004642 Polyimide Substances 0.000 abstract description 2
- 238000000034 method Methods 0.000 abstract description 2
- 229920001721 polyimide Polymers 0.000 abstract description 2
- 230000003449 preventive effect Effects 0.000 abstract 3
- 230000007547 defect Effects 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明はTAB(Tape A
utomated Bonding)配線板に関し、
より詳しくは、IC封止樹脂が流れ込みアウターリード
部に侵入するのを防止したTAB配線板に関する。[Industrial Application Field] The present invention is directed to TAB (Tape A).
Regarding automated bonding) wiring boards,
More specifically, the present invention relates to a TAB wiring board that prevents IC sealing resin from flowing into the outer lead portion.
【0002】0002
【従来の技術】従来より、ICやLSI等の半導体装置
のチップを封止樹脂で封止する場合、図7、図8、図9
に示すように、インナーリード開口部(デバイスホール
)1に配置された半導体装置のチップ2をリード(配線
電極)3で電気的に接続し、封止樹脂4で封止が行われ
ている。[Prior Art] Conventionally, when a chip of a semiconductor device such as an IC or an LSI is sealed with a sealing resin, FIGS.
As shown in FIG. 2, a chip 2 of a semiconductor device placed in an inner lead opening (device hole) 1 is electrically connected with leads (wiring electrodes) 3, and sealed with a sealing resin 4.
【0003】なお、図7〜図9において5はパーフォレ
ーション、6はチェックパッド、7はアウターリード開
口部である。In FIGS. 7 to 9, 5 is a perforation, 6 is a check pad, and 7 is an outer lead opening.
【0004】0004
【発明が解決しようとする課題】ところが、インナー部
とアウター部とが均一につながっているために、封止樹
脂がリード3を伝わってアウターリード部まで侵入し、
アウターリード部に樹脂が付いてしまい、アウターボン
ディング不良が発生することがあった。However, since the inner part and the outer part are uniformly connected, the sealing resin penetrates through the leads 3 and reaches the outer lead part.
Resin may adhere to the outer lead portion, resulting in outer bonding failure.
【0005】このアウターボンティン不良を回避するた
めに、封止樹脂がアウターリード開口部7を越えないよ
うにインナーリード開口部1とアウターリード開口部7
との距離を充分に大きくとったり、封止樹脂の粘度を高
くして流動を抑制する等の方法を採用せざるを得なかっ
た。これらは製品寸法の増大、製造条件設定の困難を招
くという問題があった。In order to avoid this outer bonding defect, the inner lead opening 1 and the outer lead opening 7 are sealed so that the sealing resin does not exceed the outer lead opening 7.
We had no choice but to adopt methods such as making a sufficiently large distance from the sealing resin or increasing the viscosity of the sealing resin to suppress the flow. These problems have resulted in an increase in product size and difficulty in setting manufacturing conditions.
【0006】本発明は上記の点を解決しようとするもの
で、その目的はインナーリード開口部とアウターリード
開口部との距離が小さくても、また、封止樹脂の粘度が
低い場合にも、封止樹脂の流動が防止され、アウターボ
ンティング不良をなくすことができるTAB配線板を提
供することにある。The present invention aims to solve the above-mentioned problems, and its purpose is to solve the problem even when the distance between the inner lead opening and the outer lead opening is small or when the viscosity of the sealing resin is low. It is an object of the present invention to provide a TAB wiring board in which flow of sealing resin is prevented and outer bonding defects can be eliminated.
【0007】[0007]
【課題を解決するための手段】本発明のTAB配線板は
、インナーリード開口部とアウターリード開口部の中間
に樹脂流動防止手段を設けたことを特徴とする。[Means for Solving the Problems] The TAB wiring board of the present invention is characterized in that a resin flow prevention means is provided between the inner lead opening and the outer lead opening.
【0008】[0008]
【実施例】次に実施例を挙げて本発明をさらに詳しく説
明する。図1は本発明のTAB配線板の一実施例を示す
平面図であり、図2はその断面図である。図1のTAB
配線板においては、インナーリード開口部1とアウター
リード開口部7の中間に樹脂流動防止手段として孔9a
が設けられた例を示している。この実施例では孔9aを
開けやすい材質の基材10として、ポリイミドよりなる
テープまたは板状体が用いられている。EXAMPLES Next, the present invention will be explained in more detail with reference to Examples. FIG. 1 is a plan view showing an embodiment of the TAB wiring board of the present invention, and FIG. 2 is a sectional view thereof. TAB in Figure 1
In the wiring board, a hole 9a is provided between the inner lead opening 1 and the outer lead opening 7 as a means for preventing resin flow.
An example is shown in which . In this embodiment, a tape or plate made of polyimide is used as the base material 10, which is made of a material that allows holes 9a to be easily formed.
【0009】図1の実施例においては、封止樹脂4で半
導体製造のチップ2を封止する際に、樹脂流動防止手段
としての孔9aで封止樹脂4がその表面張力によりせき
止められ、アウターリード開口部7まで流れることがな
い。よって、インナーリード開口部1とアウターリード
開口部7の距離を小さくすることができ、小型化が可能
になる。また、封止樹脂4の粘度が小さい場合にも樹脂
流動防止手段としての孔9aでせき止められるために、
封止樹脂の粘度の管理、制御等を細かく行う必要がなく
なる。In the embodiment shown in FIG. 1, when the semiconductor manufacturing chip 2 is sealed with the sealing resin 4, the sealing resin 4 is blocked by the surface tension of the hole 9a, which serves as a resin flow prevention means, and the outer It does not flow to the lead opening 7. Therefore, the distance between the inner lead opening 1 and the outer lead opening 7 can be reduced, and miniaturization becomes possible. In addition, even when the viscosity of the sealing resin 4 is low, it is blocked by the holes 9a as means for preventing resin flow.
There is no need for detailed management and control of the viscosity of the sealing resin.
【0010】次に図3は樹脂流動防止手段が印刷により
形成された窓9bの付いたレジスト9cとした例を示す
平面図である。ここで、封止樹脂をエポキシ系樹脂とし
、レジストをシリコン系レジストとすることにより、互
いのぬれ性が悪いため油がはじくように流れ防止をより
効果的に達成することができる。Next, FIG. 3 is a plan view showing an example in which the resin flow preventing means is a resist 9c with a window 9b formed by printing. Here, by using an epoxy resin as the sealing resin and a silicone resist as the resist, since they have poor mutual wettability, it is possible to more effectively prevent the resin from flowing as if oil were repelled.
【0011】次に、図4に樹脂流動防止手段を多重印刷
により形成されたダム状の樹脂凸状体9dとした実施例
を示す。Next, FIG. 4 shows an embodiment in which the resin flow preventing means is a dam-shaped resin convex body 9d formed by multiple printing.
【0012】次に、図5に樹脂流動防止手段として銅配
線電極11に折曲げ部9eを設けた実施例を、図6には
樹脂流動防止手段として銅配線電極11に太さ変動部9
fを形成した実施例を示す。Next, FIG. 5 shows an embodiment in which a bent portion 9e is provided on the copper wiring electrode 11 as a means for preventing resin flow, and FIG. 6 shows an embodiment in which a bent portion 9e is provided on the copper wiring electrode 11 as a means for preventing resin flow.
An example in which f is formed is shown.
【0013】[0013]
【発明の効果】以上の説明で明らかなように、本発明の
TAB配線板によれば、IC封止樹脂がインナーリード
開口部とアウターリード開口部の中間に設けられた樹脂
流動防止手段によりせき止められる。従って、インナー
リード開口部とアウターリード開口部との距離が小さく
ても、また、封止樹脂の粘度が低い場合にも封止樹脂の
流動が防止され、アウターボンティング不良をなくすこ
とができる。Effects of the Invention As is clear from the above description, according to the TAB wiring board of the present invention, the IC sealing resin is stopped by the resin flow prevention means provided between the inner lead opening and the outer lead opening. It will be done. Therefore, even if the distance between the inner lead opening and the outer lead opening is small, or even if the viscosity of the sealing resin is low, flow of the sealing resin is prevented, and outer bonding defects can be eliminated.
【図1】樹脂流動防止手段として、孔を設けたTAB配
線板の実施例を示す平面図である。FIG. 1 is a plan view showing an embodiment of a TAB wiring board provided with holes as means for preventing resin flow.
【図2】図1の断面図である。FIG. 2 is a cross-sectional view of FIG. 1;
【図3】樹脂流動防止手段として、印刷により形成され
た窓を付したレジストを設けたTAB配線板の実施例を
示す平面図である。FIG. 3 is a plan view showing an example of a TAB wiring board provided with a resist with windows formed by printing as means for preventing resin flow.
【図4】樹脂流動防止手段として、多重印刷により形成
されたダム状の樹脂凸状体を設けたTAB配線板の実施
例を示す平面図である。FIG. 4 is a plan view showing an example of a TAB wiring board provided with a dam-shaped resin convex body formed by multiple printing as a resin flow prevention means.
【図5】銅配線電極を折曲げて樹脂流動防止手段を形成
したTAB配線板の実施例を示す平面図である。FIG. 5 is a plan view showing an example of a TAB wiring board in which a resin flow prevention means is formed by bending copper wiring electrodes.
【図6】銅配線電極の太さを変えて樹脂流動防止手段を
形成した例を示す平面図である。FIG. 6 is a plan view showing an example in which a resin flow prevention means is formed by changing the thickness of a copper wiring electrode.
【図7】従来のTAB配線板の構成を示す概略斜視図で
ある。FIG. 7 is a schematic perspective view showing the configuration of a conventional TAB wiring board.
【図8】図7のTAB配線板の部分拡大平面図である。8 is a partially enlarged plan view of the TAB wiring board of FIG. 7; FIG.
【図9】図7の部分断面図である。FIG. 9 is a partial cross-sectional view of FIG. 7;
1 インナーリード開口部 2 半導体装置のチップ 3 リード配線電極 4 封止樹脂 5 パーフォレーション 6 チェックパッド 7 アウターリード開口部 9a 孔 9b 窓 9c レジスト 9d ダム状の樹脂凸状体 9e 折曲げ部 9f 太さ変動部 10 基材 11 リード(配線電極) 1 Inner lead opening 2 Semiconductor device chips 3 Lead wiring electrode 4 Sealing resin 5 Perforation 6 Check pad 7 Outer lead opening 9a hole 9b Window 9c Resist 9d Dam-shaped resin convex body 9e Bending part 9f Thickness variation part 10 Base material 11 Lead (wiring electrode)
Claims (6)
ド開口部の中間に樹脂流動防止手段を設けたことを特徴
とするTAB配線板。1. A TAB wiring board characterized in that a resin flow prevention means is provided between an inner lead opening and an outer lead opening.
された孔である請求項1記載のTAB配線板。2. The TAB wiring board according to claim 1, wherein the resin flow preventing means is a hole bored in the resin tape.
れた窓付レジストである請求項1記載のTAB配線板。3. The TAB wiring board according to claim 1, wherein the resin flow prevention means is a window resist formed by printing.
形成されたダム状の樹脂凸状体である請求項1記載のT
AB配線板。4. The T according to claim 1, wherein the resin flow prevention means is a dam-shaped resin convex body formed by multiple printing.
AB wiring board.
げられた銅配線電極である請求項1記載のTAB配線板
。5. The TAB wiring board according to claim 1, wherein the resin flow prevention means are arranged and bent copper wiring electrodes.
変動部を有する銅配線電極である請求項1記載のTAB
配線板。6. The TAB according to claim 1, wherein the resin flow prevention means is a copper wiring electrode having arranged thickness varying portions.
wiring board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6910691A JPH04280646A (en) | 1991-03-08 | 1991-03-08 | Tab wiring board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6910691A JPH04280646A (en) | 1991-03-08 | 1991-03-08 | Tab wiring board |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04280646A true JPH04280646A (en) | 1992-10-06 |
Family
ID=13393047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6910691A Pending JPH04280646A (en) | 1991-03-08 | 1991-03-08 | Tab wiring board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04280646A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5763940A (en) * | 1995-04-24 | 1998-06-09 | Kabushiki Kaisha Toshiba | Tape mounted semiconductor apparatus |
-
1991
- 1991-03-08 JP JP6910691A patent/JPH04280646A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5763940A (en) * | 1995-04-24 | 1998-06-09 | Kabushiki Kaisha Toshiba | Tape mounted semiconductor apparatus |
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