JPH04246876A - Semiconductor laser element - Google Patents
Semiconductor laser elementInfo
- Publication number
- JPH04246876A JPH04246876A JP1181091A JP1181091A JPH04246876A JP H04246876 A JPH04246876 A JP H04246876A JP 1181091 A JP1181091 A JP 1181091A JP 1181091 A JP1181091 A JP 1181091A JP H04246876 A JPH04246876 A JP H04246876A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- heat sink
- heat
- laser device
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Lasers (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は半導体レーザ素子に関す
るものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor laser device.
【0002】0002
【従来の技術】従来の半導体レーザ素子は図3に示すよ
うに半導体レーザチップ1をヒートシンク3上にソルダ
ーを用いて融着し、さらにこのヒートシンク3をキャリ
ア4上にソルダーを用いて融着していた。2. Description of the Related Art As shown in FIG. 3, a conventional semiconductor laser device is manufactured by fusing a semiconductor laser chip 1 onto a heat sink 3 using a solder, and then fusing the heat sink 3 onto a carrier 4 using a solder. was.
【0003】この構造では、発光部2において発生した
熱は半導体レーザチップ片電極面とヒートシンク3の接
触面及びキャリア4上面とヒートシンク接触面を伝わり
、逃していた。In this structure, the heat generated in the light emitting section 2 is transmitted through the contact surface between the semiconductor laser chip electrode surface and the heat sink 3, and the contact surface between the upper surface of the carrier 4 and the heat sink, and is released.
【0004】0004
【発明が解決しようとする課題】この従来の半導体レー
ザ素子は半導体レーザチップ片電極部とヒートシンク及
びヒートシンクとキャリア上面の接触面により発光部に
おいて発生した熱を逃していた。In this conventional semiconductor laser element, heat generated in the light emitting part is dissipated through the contact surfaces between the semiconductor laser chip electrode section and the heat sink, and between the heat sink and the upper surface of the carrier.
【0005】ゆえに、放熱面積が小さく、放熱効果が悪
いため、半導体レーザ素子の温度特性を低下させ、さら
に信頼度の悪影響を及ぼすという欠点があった。Therefore, the heat dissipation area is small and the heat dissipation effect is poor, resulting in a disadvantage that the temperature characteristics of the semiconductor laser device are deteriorated and reliability is adversely affected.
【0006】[0006]
【課題を解決するための手段】本発明の半導体レーザ素
子は、キャリア中央に凹部を設けヒートシンクの上面の
みを出すようにキャリアの凹部にヒートシンクを埋込む
構造とした。この結果、ヒートシンクの放熱面積が増え
、放熱効果が向上し、熱抵抗を低減でき、半導体レーザ
素子の温度特性の向上かつ信頼度の向上になるとい利点
を有する。[Means for Solving the Problems] The semiconductor laser device of the present invention has a structure in which a recess is provided at the center of the carrier and the heat sink is embedded in the recess of the carrier so that only the upper surface of the heat sink is exposed. As a result, the heat dissipation area of the heat sink increases, the heat dissipation effect is improved, the thermal resistance can be reduced, and the temperature characteristics and reliability of the semiconductor laser device are improved.
【0007】[0007]
【実施例】次に、本発明について図面を参照して説明す
る。図1(a)は本発明の一実施例の半導体レーザ素子
の斜視図であり、図1(b)は本発明の半導体レーザ素
子の正面図である。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings. FIG. 1(a) is a perspective view of a semiconductor laser device according to an embodiment of the present invention, and FIG. 1(b) is a front view of the semiconductor laser device according to the present invention.
【0008】ヒートシンク3上に半導体レーザチップ1
をジャンクションダウンでソルダーを用いて融着し、こ
の半導体レーザチップ1を融着したヒートシンク3をキ
ャリア4の中央の凹部に組込みソルダーを用いて融着し
ている。Semiconductor laser chip 1 is placed on heat sink 3
The heat sink 3 to which the semiconductor laser chip 1 is fused is assembled into the recessed portion at the center of the carrier 4 and fused using solder.
【0009】これにより、ヒートシンク3の放熱面積を
拡大できる。ゆえに、放熱効果に優れ、半導体レーザ素
子の熱抵抗が低減でき、半導体レーザ素子の温度特性向
上、かつ信頼度向上ができるとい利点がある。[0009] Thereby, the heat dissipation area of the heat sink 3 can be expanded. Therefore, there are advantages in that the heat dissipation effect is excellent, the thermal resistance of the semiconductor laser device can be reduced, and the temperature characteristics and reliability of the semiconductor laser device can be improved.
【0010】例えば図1(a)のヒートシンクのように
、一辺がLmm,厚さがL/2mmの場合、本発明と従
来の放熱面積の比は(本発明/従来)=2.5L2 /
L2 ,すなわち、放熱面積は従来の2.5倍となり、
放熱効果向上となる。For example, in the case of the heat sink shown in FIG. 1(a), where one side is L mm and the thickness is L/2 mm, the ratio of the heat dissipation area between the present invention and the conventional one is (present invention/conventional) = 2.5 L2 /
L2, that is, the heat dissipation area is 2.5 times that of the conventional one,
Improves heat dissipation effect.
【0011】図2は本発明のもう1つの実施例の半導体
レーザ素子の正面図である。FIG. 2 is a front view of a semiconductor laser device according to another embodiment of the present invention.
【0012】半導体レーザチップ1をジャンクションア
ップでヒートシンク3にソルダーを用いて融着する場合
、発光部2の位置をヒートシンク3に近づけるため、ヒ
ートシンク3の中央に凹部を設け、この凹部に半導体レ
ーザチップ1を埋込み、この半導体レーザチップ1を融
着したヒートシンクをキャリア4中央の凹部に組込みソ
ルダーを用いて融着している。When the semiconductor laser chip 1 is junction-up bonded to the heat sink 3 using solder, a recess is provided in the center of the heat sink 3 in order to bring the light emitting part 2 closer to the heat sink 3, and the semiconductor laser chip is inserted into this recess. A heat sink with the semiconductor laser chip 1 embedded therein and fused thereto is incorporated into the recess at the center of the carrier 4 and fused using solder.
【0013】これにより、ヒートシンク3の放熱面積が
拡大できる。[0013] Thereby, the heat dissipation area of the heat sink 3 can be expanded.
【0014】ゆえに、放熱効果に優れ、半導体レーザ素
子の温度特性を向上させ、かつ信頼度向上ができるとい
う利点がある。[0014] Therefore, there are advantages in that the heat dissipation effect is excellent, the temperature characteristics of the semiconductor laser device can be improved, and the reliability can be improved.
【0015】[0015]
【発明の効果】以上説明したように、本発明の半導体レ
ーザ素子はキャリア中央に凹部を設けヒートシンク上面
だけを出すようにヒートシンクを組込むことにより、ヒ
ートシンクの放熱面積を増すことができるので、放熱効
果が向上し熱抵抗が低下でき、半導体レーザ素子の温度
特性向上かつ信頼度向上になるという効果を有する。Effects of the Invention As explained above, the semiconductor laser device of the present invention can increase the heat radiation area of the heat sink by providing a recess in the center of the carrier and incorporating the heat sink so that only the top surface of the heat sink is exposed. This has the effect of improving the thermal resistance and reducing the thermal resistance, thereby improving the temperature characteristics and reliability of the semiconductor laser device.
【図1】本発明による第1の実施例の半導体レーザ素子
の斜視図及び正面図である。FIG. 1 is a perspective view and a front view of a semiconductor laser device according to a first embodiment of the present invention.
【図2】本発明による第2の実施例の半導体レーザ素子
の正面図である。FIG. 2 is a front view of a semiconductor laser device according to a second embodiment of the present invention.
【図3】従来の実施例の半導体レーザ素子の正面図であ
る。FIG. 3 is a front view of a semiconductor laser device according to a conventional example.
1 半導体レーザチップ 2 発光部 3 ヒートシンク 4 キャリア(パッケージ) 1 Semiconductor laser chip 2 Light emitting part 3 Heat sink 4 Carrier (package)
Claims (1)
発生する熱源をヒートシンク近傍に置くように融着し、
このヒートシンクを、ヒートシンクの固定材であるキャ
リア内に埋込んだことを特徴とする半導体レーザ素子。Claim 1: A heat source generated in a light emitting part of a semiconductor laser chip is fused so as to be placed near a heat sink,
A semiconductor laser device characterized in that this heat sink is embedded in a carrier that is a fixing material for the heat sink.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1181091A JPH04246876A (en) | 1991-02-01 | 1991-02-01 | Semiconductor laser element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1181091A JPH04246876A (en) | 1991-02-01 | 1991-02-01 | Semiconductor laser element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04246876A true JPH04246876A (en) | 1992-09-02 |
Family
ID=11788177
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1181091A Pending JPH04246876A (en) | 1991-02-01 | 1991-02-01 | Semiconductor laser element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04246876A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002329918A (en) * | 2001-05-02 | 2002-11-15 | Sony Corp | Optical device |
JP2005191373A (en) * | 2003-12-26 | 2005-07-14 | Ricoh Co Ltd | Semiconductor laser device |
WO2008038574A1 (en) * | 2006-09-26 | 2008-04-03 | Kyocera Corporation | Wiring board for surface mounting type light emitting element and light emitting device |
JP2008218958A (en) * | 2007-03-07 | 2008-09-18 | Everlight Electronics Co Ltd | Socket-type led device |
-
1991
- 1991-02-01 JP JP1181091A patent/JPH04246876A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002329918A (en) * | 2001-05-02 | 2002-11-15 | Sony Corp | Optical device |
JP2005191373A (en) * | 2003-12-26 | 2005-07-14 | Ricoh Co Ltd | Semiconductor laser device |
WO2008038574A1 (en) * | 2006-09-26 | 2008-04-03 | Kyocera Corporation | Wiring board for surface mounting type light emitting element and light emitting device |
JP2008218958A (en) * | 2007-03-07 | 2008-09-18 | Everlight Electronics Co Ltd | Socket-type led device |
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