JPH04134609A - Manufacturing method for thin film magnetic head - Google Patents
Manufacturing method for thin film magnetic headInfo
- Publication number
- JPH04134609A JPH04134609A JP25846590A JP25846590A JPH04134609A JP H04134609 A JPH04134609 A JP H04134609A JP 25846590 A JP25846590 A JP 25846590A JP 25846590 A JP25846590 A JP 25846590A JP H04134609 A JPH04134609 A JP H04134609A
- Authority
- JP
- Japan
- Prior art keywords
- gap
- protection film
- sliding protection
- magnetic
- sliding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 239000010409 thin film Substances 0.000 title claims description 9
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 239000004020 conductor Substances 0.000 claims abstract description 9
- 239000000463 material Substances 0.000 claims abstract description 7
- 239000010408 film Substances 0.000 claims description 35
- 230000001681 protective effect Effects 0.000 claims description 21
- 229910004205 SiNX Inorganic materials 0.000 claims 1
- 238000001312 dry etching Methods 0.000 claims 1
- 238000005498 polishing Methods 0.000 claims 1
- 238000005530 etching Methods 0.000 abstract description 16
- 238000000034 method Methods 0.000 abstract description 15
- 238000007747 plating Methods 0.000 abstract description 5
- 239000010410 layer Substances 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 239000000314 lubricant Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 230000001012 protector Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Magnetic Heads (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は薄膜磁気ヘッドの製造方法とくに平面型ヘッ
ドの製造方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method of manufacturing a thin film magnetic head, particularly a method of manufacturing a planar head.
薄膜磁気ヘッドは、半導体集積回路素子と同様な、蒸着
、スパッタ等の成膜技術、写真製版エツチング等のリン
グラフィ技it用いて製造されるもので、高精度なヘッ
ドが一活大量に生産できる点に特徴がある。Thin-film magnetic heads are manufactured using film-forming techniques such as vapor deposition and sputtering, as well as phosphorography techniques such as photolithography and etching, similar to semiconductor integrated circuit elements, and high-precision heads can be produced in large quantities. The points are distinctive.
薄膜磁気ヘッドとしては、従来から磁気ギャップを基板
面に水平方向(膜厚方向)に形成する垂直型と、磁気ギ
ャップを基板面内に形成する千面溢とが知られている。As thin film magnetic heads, a vertical type in which a magnetic gap is formed in the horizontal direction (film thickness direction) on a substrate surface, and a 1000-sided type in which a magnetic gap is formed in the substrate surface are conventionally known.
現在では、ギャップ形成の容易さや媒体摺動に対する耐
久性の点から垂直型が実用化されている・一方、千面塁
にヘッドの対向面が基板而になるため、基板内で一活し
て浮上面加工等が行え、さらに磁気ギャップ深さが膜厚
で決められるので、その制御が容易な点に利点がある。Currently, the vertical type is in practical use because of its ease of gap formation and durability against media sliding.On the other hand, since the surface facing the head becomes the substrate, it is not active inside the substrate. The advantage is that the air bearing surface can be processed, and furthermore, since the magnetic gap depth is determined by the film thickness, it is easy to control.
垂直型ヘッドでに、これらの加工を通常基板から切断分
離後1個々に行わねばならず、コスト上昇の一因となっ
ていた。With a vertical head, these processes usually have to be performed individually after cutting and separating from the substrate, which has been a factor in increasing costs.
Wcs図t−jIBM社の文献r A N tW A
PPROCHTo MAK工NG THIN
F工LM H凪ムD 8LよりIRDgvx
cz」(xgxz工NT元RMムG’ 89)に示され
た平面型agLヘッドの製造方法金示す断面図でろ抄1
図においてitは素子基板、121は摺動保護膜、13
)は磁気ギャップ、141は下部磁気コア、iIlは絶
縁層、(6)はコイル%+7+ Fi上部磁2コア、(
82はコイル引き出し導体、(9)は絶縁保#I膜、叫
は支持基板、dυに支持基板内に設けられた接続導体で
ある。Wcs diagram t-j IBM literature r A N tW A
PPROCHTo MAKENG THIN
IRDgvx from F Engineering LM H Nagimu D 8L
The manufacturing method of the flat type agL head shown in "cz" (XGXZ ENGINEERING RM G'89) is shown in the cross-sectional view.
In the figure, it is an element substrate, 121 is a sliding protective film, and 13
) is the magnetic gap, 141 is the lower magnetic core, iIl is the insulating layer, (6) is the coil % + 7 + Fi upper magnetic 2 core, (
82 is a coil lead-out conductor, (9) is an insulating film #I, 1 is a support substrate, and dυ is a connection conductor provided in the support substrate.
次に製造方法について第8図を用いて説明する。Next, the manufacturing method will be explained using FIG. 8.
基板(1)上に、媒体に対向する摺動保a # +21
を形成しH7gB図^ン、磁気ギャップ13+を形成す
る之めの凹みを、エツチングで摺動保!i # 121
に設ける(第3図1Bl)・
次に上記基板上にギャップ膜1r成護し、その上にレジ
ストt−噛布し、を子ビーム直光法によってサブミクロ
7幅に製版し、このレジストをマスクにしてエツチング
し、ギャップ411に形成する。(第3図IQ )・こ
の磁気ギャップ幅を小さくすることは、5i51Le録
の線密度を高くするために重要であり、サブミクロンの
パターン幅が要求される。次に、下部唸気コア14+が
メツキによって形成される。(第3図0)この時、磁気
ギャップ部VCは磁性膜は形成されない。この上ICl
lj次、絶縁層I釦、コイル16)、上部母気コアフ)
、コイル引き出し導体(8)%が成膜、リングラフィ技
#を用−で形成される。次いで、絶縁保護層(9)が積
層され、コイル引き出し導体接続部が露出するまで研磨
し、コイル端子の支持をかねた支持基板■が接合され1
次に、X子基板Ill全エツチング溶解除去して、磁気
ギャップ面を露出させる。この面に写真製版を施し、イ
オンビーム等で一活面加工(ハードディスク用ヘッドで
に浮動回加D1を行う。On the substrate (1), there is a sliding support a # +21 facing the medium.
The recess that forms the magnetic gap 13+ is protected against sliding by etching. i#121
(FIG. 3, 1Bl) Next, a gap film 1r is formed on the above substrate, a resist T-layer is applied on it, a plate is made into a sub-micro 7 width by the direct beam method, and this resist is masked. A gap 411 is formed by etching. (FIG. 3 IQ) - Reducing this magnetic gap width is important for increasing the linear density of the 5i51Le record, and submicron pattern width is required. Next, the lower blow core 14+ is formed by plating. (FIG. 30) At this time, no magnetic film is formed in the magnetic gap portion VC. On this ICl
lj order, insulation layer I button, coil 16), upper mother air core)
, the coil lead-out conductor (8)% is formed using phosphorography technique #. Next, an insulating protective layer (9) is laminated, polished until the coil lead-out conductor connection part is exposed, and a support substrate (2) that also supports the coil terminal is bonded (1).
Next, the entire X-substrate Ill is etched and dissolved to expose the magnetic gap surface. This surface is subjected to photolithography, and a single active surface is processed using an ion beam or the like (floating rotation D1 is performed using a hard disk head).
この方法によれば、磁気ギャップ:3)が平坦部すなわ
ち媒体対向面に杉収されるため、ギヤツブ閑さr膜厚で
制御でき、また、浮動面形状加工が基板毎に一活して行
え、スライダー加工のための時間が大幅に短縮できる利
点がある。According to this method, since the magnetic gap (3) is accommodated in the flat part, that is, the surface facing the medium, the gear gap can be controlled by the film thickness, and the floating surface shape can be processed for each substrate at once. , it has the advantage that the time for slider processing can be significantly shortened.
従来の平面型薄膜a気ヘッドに以上のように製造されて
おり1以上の褒造工程でのギヤツブ部形収方法では、摺
動保護S倉一部エッチングし、その上にギャップatス
パッタ後、レジストマスクを形成し、マスク以外をエツ
チングしギヤツブ全形成するが、この時、ギャップの幅
はサブミクロンになるため1次工程の下部磁気コアをメ
ツキで形成時に、素子基板とギャップ膜との界面から、
ギャップが剥離または傾斜して、正しいギャップが形成
できないという問題があった。The conventional planar thin film a-air head is manufactured as described above, and in one or more manufacturing processes, the gear part shape is formed by etching a part of the sliding protection S, and after gap AT sputtering on it, A resist mask is formed and the parts other than the mask are etched to form the entire gear. At this time, the width of the gap is submicron, so when forming the lower magnetic core in the first step by plating, the interface between the element substrate and the gap film is from,
There was a problem in that the gap was peeled off or tilted, making it impossible to form a correct gap.
この発明は、上記のような問題ζ倉解決するするために
なされたもので、ギャップ形成プロセスの簡略化と、ギ
ャップの剥離、傾@を防止できる薄膜磁気ヘッドの夷造
方法を得ることを目的とする。This invention was made to solve the above-mentioned problems, and aims to provide a manufacturing method for a thin-film magnetic head that can simplify the gap formation process and prevent gap peeling and tilting. shall be.
この発明に係わる薄膜磁気ヘッドの製造方法に、ギヤツ
ブ形成のた11eIVC摺動保護膜をエツチングする際
、摺動保護膜の−gtギャップ材として利用して、摺動
保IiI#4と一体に磁気ギャップを形成し、素子基板
除去後、露出されfc摺動保siI撲表面を研磨又はド
ライエツチングして。In the method for manufacturing a thin film magnetic head according to the present invention, when etching the 11eIVC sliding protective film for gear formation, it is used as a -gt gap material of the sliding protective film, and magnetically integrated with the sliding protection IiI #4. After forming a gap and removing the element substrate, the exposed fc sliding protection surface is polished or dry etched.
磁気ギャップを露出させるようにしたものである。The magnetic gap is exposed.
なお、摺動保S暎及び磁気ギャップは81Nχで形式す
るとよい。In addition, it is preferable that the sliding support S and magnetic gap be formatted as 81Nχ.
〔作用〕
この方法で框、摺動保護Stギャップ材として使用する
ため%新たにギャップ膜を成膜する必要がなく、成膜工
程が低減できる。さらに、下部磁気コア成膜時には、ギ
ャップと摺動保護撲が一体につながっているため、ギャ
ップが素子基板より剥離したり、傾斜したりすることが
防げる。[Function] Since this method is used as a frame and sliding protection St gap material, there is no need to newly form a gap film, and the film forming process can be reduced. Furthermore, when forming the lower magnetic core, since the gap and the sliding protection layer are integrally connected, it is possible to prevent the gap from peeling off from the element substrate or from tilting.
以上、この発明による製造方法の一実施例について説明
する。第1図のIAI〜1qriこの発明の一実施例に
係わるギヤツブ形成方法を示す断面図である。Il+は
素子基板 (りは摺動保l!!膜、13)に摺動保1i
#を利用した磁気ギャップ、・41は磁気コアである。An embodiment of the manufacturing method according to the present invention will be described above. FIG. 1 is a sectional view showing a method for forming a gear according to an embodiment of the present invention. Il+ is a sliding protector 1i on the element substrate (Li is a sliding protector!! film, 13)
A magnetic gap using #, 41 is a magnetic core.
第19囚に素子基板(例えばシリコン) Ill上に、
摺動保護膜(f%えば91N)+tl′Ikスパッタ等
で形成する。次Vc摺動保護膜(21上にレジストをマ
スクにしてエツチングし、摺動保護膜と同一材料でギャ
ップを形成する。この時%all!1図(8)に示すよ
うに摺動保護!Iを素子基板までエツチングせずに、数
100−1000ム残し、ギャップ(3)と摺動保護膜
((1)を一体につなぐ0次に第1図IQK示すように
下部磁気コア(41金メツキ形訳する。On the 19th prisoner is an element substrate (e.g. silicon) Ill,
It is formed by a sliding protective film (f%, for example, 91N)+tl'Ik sputtering. Next, etching is performed using a resist as a mask on the Vc sliding protective film (21) to form a gap using the same material as the sliding protective film.At this time, as shown in Figure (8), the sliding protective film 21 is etched. The lower magnetic core (41 gold plating) is then etched as shown in Figure 1 IQK, leaving several hundred to 1000 micrometers of the gap (3) and the sliding protective film (1) integrally, without etching it all the way to the element substrate. Translate.
これ以降の工程については、引用−j文献と同様に、上
部磁気コア、引き出し導体等を形成し。Regarding the subsequent steps, the upper magnetic core, lead-out conductor, etc. are formed in the same manner as in the cited document.
支持基板1に:接合後、素子基板を溶解する。セして摺
動保護−表面を露出させた後、この表面を軽くドライエ
ツチング又は研磨して、ギヤツブ全露出させる。To support substrate 1: After bonding, the element substrate is melted. After setting and exposing the sliding protection surface, lightly dry etch or polish this surface to fully expose the gear.
なお、上記実施例においては、素子を形成する素子基板
にシリコンを、摺動保護膜、ギャップにはEliNXを
用いた。この構成にすると支持基板接合後、素子基板を
除去する工程においてアルカリ系のエツチング液を用い
ることができ、なおかつ摺動保護膜、ギャップの81N
Zはアルカリ系のエツチング液には、耐える仁とができ
るので、摺動保Satエツチングストップ層として利用
でs1gツテング液による素子の損傷を防止すると共に
、*気ディスクとの潤滑剤としても利用できる利点が6
る・
なお、上記実施列では上述のように、−動保護瞑、ギャ
ップに5iNXを用いたが、素子基板を溶解除去するた
めのエツチング液の種類により、他の材料、例えばムj
’xos、DLo等を用いても構わない。In the above embodiment, silicon was used for the element substrate forming the element, and EliNX was used for the sliding protective film and the gap. With this configuration, an alkaline etching solution can be used in the step of removing the element substrate after bonding the support substrate, and the sliding protective film and the gap can be 81N.
Since Z can withstand alkaline etching solutions, it can be used as a sliding protection Sat etching stop layer to prevent element damage from S1G etching solutions, and can also be used as a lubricant with the air disk. 6 advantages
In the above example, as mentioned above, 5iNX was used for the dynamic protection shield and the gap, but depending on the type of etching solution for dissolving and removing the element substrate, other materials such as Muj
'xos, DLo, etc. may be used.
以上のように、この発明に:れげギャップ形成のために
摺動保11!膜とエツチングする際、摺動保護膜の一部
をギャップ材として利用して。As mentioned above, this invention: Sliding protection 11 for forming a gap! When etching the film, use part of the sliding protective film as a gap material.
摺動保護膜と一体に磁気ギャップを形成し、素子基板除
去後、露出された摺動保護膜表面を研磨又はドライエツ
チングして、磁気ギャップを露出させるようにしたので
、ギャップ形成のためのギャップSIt″、新たに成膜
する必要がなくなり、成膜工程全書くことができ、さら
に、下部磁気コア形成のメツキ工程(おいて、ギャップ
の剥離、傾きを防止でき1歩留まりが向上する効果があ
る。A magnetic gap is formed integrally with the sliding protective film, and after removing the element substrate, the exposed sliding protective film surface is polished or dry etched to expose the magnetic gap. SIt'', there is no need to form a new film, the entire film forming process can be completed, and in addition, it is possible to prevent gap peeling and tilting during the plating process for forming the lower magnetic core, thereby improving the yield. .
また摺動保護膜及び磁気ギャップを81Nχで形成すれ
ば素子基板のエツチング液による素子の損傷が防げ、さ
らには磁気ディスクとの潤滑剤としても利用でさる効果
がある。Further, by forming the sliding protective film and the magnetic gap with a thickness of 81 Nχ, it is possible to prevent the element from being damaged by the etching liquid on the element substrate, and furthermore, it can be used as a lubricant with the magnetic disk.
第1図−へQは各々この発明の一実施例に係わる磁気ギ
ャップ部の製造方法を示す断面図。
第2図に平l1illi型磁気ヘッドの構造を示す断面
図、及び第3図囚〜pは晶々従米の磁気ギャップ部の製
造方法を示す断面図である。
図において、巾は素子基板、121は摺動保護膜、13
1は磁気ギャップ、・41は下部磁気コア%+51は絶
縁層、(6)はコイル、17)は上部磁気コア、(8)
は引き出し導体、(9)は保S膜、IIωは支持基板1
口は接続導体である。
なお、図中、同−符′8に同−又は相当部分を示す。1-Q are sectional views showing a method of manufacturing a magnetic gap portion according to an embodiment of the present invention. FIG. 2 is a sectional view showing the structure of a flat-plane 11illi type magnetic head, and FIGS. In the figure, the width is the element substrate, 121 is the sliding protective film, 13
1 is the magnetic gap, 41 is the lower magnetic core% + 51 is the insulating layer, (6) is the coil, 17) is the upper magnetic core, (8)
is the lead-out conductor, (9) is the S retaining film, and IIω is the support substrate 1.
The mouth is a connecting conductor. In addition, in the figure, the same or equivalent part is indicated by the same reference numeral '8.
Claims (2)
つながり、上記摺動保護膜と同一材料で一体に形成され
た磁気ギャップを形成する工程、上記磁気ギャップをは
さんで下部磁気コアを形成する工程、上記摺動保護膜、
上記磁気ギャップ及び上記下部磁気コア上に絶縁層を介
してコイルを形成する工程、上記下部磁気コアと磁気的
に接合する上部磁気コアを形成する工程、上記絶縁層上
にコイル端子の接続導体と、ヘッド素子支持を兼ねた支
持基板を接着する工程、上記各工程終了後、素子基板を
除去する工程、並びに上記素子基板を除去して露出され
た摺動保護膜表面を研磨又はドライエッチングして上記
磁気ギャップを露出させる工程を施す薄膜磁気ヘッドの
製造方法。(1) Step of forming a sliding protective film on the element substrate surface and a magnetic gap connected to this sliding protective film and integrally formed of the same material as the sliding protective film, sandwiching the magnetic gap. a step of forming a lower magnetic core, the above-mentioned sliding protective film;
A step of forming a coil on the magnetic gap and the lower magnetic core via an insulating layer, a step of forming an upper magnetic core magnetically connected to the lower magnetic core, and a connecting conductor of a coil terminal on the insulating layer. , a step of adhering a support substrate that also serves as head element support, a step of removing the element substrate after each of the above steps, and a step of polishing or dry etching the surface of the sliding protective film exposed after removing the element substrate. A method of manufacturing a thin film magnetic head, which includes the step of exposing the magnetic gap.
た請求項1記載の薄膜磁気ヘッドの製造方法。(2) The method of manufacturing a thin film magnetic head according to claim 1, wherein the sliding protective film and the magnetic gap are formed of SiNx.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25846590A JPH04134609A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method for thin film magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25846590A JPH04134609A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method for thin film magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04134609A true JPH04134609A (en) | 1992-05-08 |
Family
ID=17320605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25846590A Pending JPH04134609A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method for thin film magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04134609A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2741470A1 (en) * | 1995-11-22 | 1997-05-23 | Commissariat Energie Atomique | METHOD FOR PRODUCING A PLANAR MAGNETIC HEAD AND HEAD OBTAINED BY THIS METHOD |
EP1143419A2 (en) * | 2000-03-30 | 2001-10-10 | Kabushiki Kaisha Toshiba | Magnetic head, method for producing same, and magnetic recording and/or reproducing system |
-
1990
- 1990-09-25 JP JP25846590A patent/JPH04134609A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2741470A1 (en) * | 1995-11-22 | 1997-05-23 | Commissariat Energie Atomique | METHOD FOR PRODUCING A PLANAR MAGNETIC HEAD AND HEAD OBTAINED BY THIS METHOD |
EP0775997A1 (en) * | 1995-11-22 | 1997-05-28 | Commissariat A L'energie Atomique | Process for producing a planar magnetic head and head obtained by this process |
EP1143419A2 (en) * | 2000-03-30 | 2001-10-10 | Kabushiki Kaisha Toshiba | Magnetic head, method for producing same, and magnetic recording and/or reproducing system |
EP1143419A3 (en) * | 2000-03-30 | 2004-05-06 | Kabushiki Kaisha Toshiba | Magnetic head, method for producing same, and magnetic recording and/or reproducing system |
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