JPH04133284A - Manufacturing method of thin film phosphor - Google Patents
Manufacturing method of thin film phosphorInfo
- Publication number
- JPH04133284A JPH04133284A JP2254646A JP25464690A JPH04133284A JP H04133284 A JPH04133284 A JP H04133284A JP 2254646 A JP2254646 A JP 2254646A JP 25464690 A JP25464690 A JP 25464690A JP H04133284 A JPH04133284 A JP H04133284A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- light emitting
- substrate
- phosphor
- film phosphor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Conversion Of X-Rays Into Visible Images (AREA)
- Electroluminescent Light Sources (AREA)
- Luminescent Compositions (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、例えば各種の表示機器および発光部[発明の
概要]
本発明は、表示機器および発光応用デバイスに使用され
る電場発光素子に関するもので、特に交流薄膜電場発光
素子に使用する薄膜蛍光体の製作に関するものである。Detailed Description of the Invention [Industrial Application Field] The present invention relates to, for example, various display devices and light emitting units [Summary of the Invention] The present invention relates to electroluminescent elements used in display devices and light emitting application devices. In particular, it relates to the production of thin film phosphors used in AC thin film electroluminescent devices.
具体的には、抵抗加熱法あるいは電子線蒸着法などの真
空蒸着によるアルカリ土金属硫化物(MgS、 CaS
、 SrS、 Ba5)を主要成分とした薄膜蛍光体を
、基板温度を高温(約400℃以上)にすることなく低
温(約400℃未満)で作製した後、電気炉やランプな
どの加熱装置により不活性ガス中でこれらの薄膜蛍光体
を加熱処理する。本発明によれば、基板温度を高温にし
て製作した場合と同じかそれ以上の特性を持つ電場発光
素子の薄膜蛍光体を製作することができる。また、基板
温度を高温にすることなく作製できるため、真空装置は
耐熱対策を必要としないから簡単な機構でよい。さらに
、カラー表示をするためにそれぞれの色に発光する薄膜
蛍光体を塗り分けるために必要なバターニングには、蒸
着マスクを使用できる。Specifically, alkaline earth metal sulfides (MgS, CaS
, SrS, Ba5) as main components is produced at a low temperature (less than about 400°C) without raising the substrate temperature to a high temperature (about 400°C or higher), and then heated using a heating device such as an electric furnace or a lamp. These thin film phosphors are heat treated in an inert gas. According to the present invention, it is possible to manufacture a thin film phosphor for an electroluminescent device that has the same or better characteristics than those manufactured at a high substrate temperature. Further, since the vacuum device can be manufactured without raising the substrate temperature to a high temperature, a simple mechanism is sufficient since the vacuum device does not require heat resistance measures. Furthermore, a vapor deposition mask can be used for the patterning required to separate thin-film phosphors that emit light in different colors for color display.
板温度を高温にすると、蒸着マスクが熱膨張のために変
形してしまい、薄膜電場発光蛍光体に対する高精細なバ
ターニングが困難となる。If the plate temperature is increased, the vapor deposition mask will be deformed due to thermal expansion, making it difficult to perform high-definition patterning on the thin film electroluminescent phosphor.
本発明の目的は、真空蒸着時の基板温度を低温化しても
良好な結晶性と高輝度発光性の薄膜電場発光蛍光体を製
造できる方法を提供することにある。An object of the present invention is to provide a method for manufacturing a thin film electroluminescent phosphor with good crystallinity and high brightness even when the substrate temperature during vacuum deposition is lowered.
[従来の技術1
従来の薄膜蛍光体の製造方法においては、基板温度を4
00℃以上の高温にした真空蒸着法を用いてアルカリ土
金属硫化物(MgS、 CaS、 SrS、 Ba5)
を主要成分とした良好な結晶性と高輝度発光性の薄膜電
場発光蛍光体を得ている。[Conventional technology 1] In the conventional thin film phosphor manufacturing method, the substrate temperature is
Alkaline earth metal sulfides (MgS, CaS, SrS, Ba5) are produced using a vacuum evaporation method at a high temperature of 00°C or higher.
We have obtained a thin film electroluminescent phosphor with good crystallinity and high brightness luminescence, which consists of .
[課題を解決するための手段]
本発明は、基板上にアルカリ土類金属硫化物を主要成分
とした薄膜蛍光体を前記基板の温度を400℃未満とし
た真空蒸着法によって作製したのち、前記薄膜蛍光体を
不活性ガス中で加熱処理することを特徴とする。[Means for Solving the Problems] The present invention provides a thin film phosphor containing an alkaline earth metal sulfide as a main component on a substrate by a vacuum evaporation method in which the temperature of the substrate is below 400°C. It is characterized by heat-treating the thin film phosphor in an inert gas.
[発明が解決しようとする課題1
しかしながら、薄膜蛍光体の製造時に用いられる蒸着装
置は、高温環境とこの高温環境下での硫化物による腐食
とに耐えられるものでなければならないため、高価なも
のとなっていた。また、基[作用]
本発明においては、真空蒸着時の基板温度を低温化して
も、不活性ガス中での加熱処理を施すことで、良好な結
晶性と高輝度発光性の薄膜電場発光蛍光体を製造できる
。そして、真空蒸着時における基板温度の低温化を実現
できるので、蒸着装置の構造簡素化や薄膜蛍光体のバタ
ーニングの高精細化を図ることができる。[Problem to be Solved by the Invention 1] However, the vapor deposition equipment used in the production of thin-film phosphors must be able to withstand high-temperature environments and corrosion caused by sulfides in this high-temperature environment, so they are expensive. It became. In addition, in the present invention, even if the substrate temperature during vacuum deposition is lowered, by applying heat treatment in an inert gas, thin film electroluminescent fluorescence with good crystallinity and high brightness luminescence can be obtained. You can manufacture your body. Since the substrate temperature can be lowered during vacuum deposition, the structure of the deposition apparatus can be simplified and the patterning of the thin film phosphor can be patterned with higher precision.
[実施例1 以下に本発明を実施例によって説明する。[Example 1 The present invention will be explained below by way of examples.
本発明を、例えば交流薄膜電場発光素子の製造に適用す
る場合について説明する。A case will be described in which the present invention is applied to, for example, manufacturing an AC thin film electroluminescent device.
まず、基板ガラス上にITO(インジウムスズ酸化物)
などの透明電極、その上に絶縁層として例えば五酸化タ
ンタル(Ta*Os )などの高誘電体薄膜をそれぞれ
通常の方法により形成する。ここで。First, ITO (indium tin oxide) is placed on the substrate glass.
A transparent electrode such as, for example, a high dielectric thin film such as tantalum pentoxide (Ta*Os) as an insulating layer is formed thereon by a conventional method. here.
高誘電体薄膜の上にバッファー層として例えば硫化亜鉛
(ZnS )などの誘電体薄膜を形成してもよい。A dielectric thin film such as zinc sulfide (ZnS) may be formed as a buffer layer on the high dielectric thin film.
次いで、上述した高誘電体薄膜または誘電体薄膜の上に
、発光層としてアルカリ土類金属硫化物(MgS、 C
aS、 SrS、 Ba5)を主成分とした例えばSr
S :Ceなどの薄膜蛍光体を形成する。このとき、薄
膜の形成は抵抗加熱あるいは電子線による蒸着法で行い
、基板温度を400℃未満とし、蒸着マスクによりバタ
ーニングを行う。この薄膜蛍光体の上には、バッファー
層として例えば硫化亜鉛(ZnS )などの誘電体薄膜
を形成してもよい。Next, alkaline earth metal sulfides (MgS, C
For example, Sr containing aS, SrS, Ba5) as the main component
S: Form a thin film phosphor such as Ce. At this time, the thin film is formed by resistance heating or electron beam vapor deposition, the substrate temperature is kept below 400° C., and patterning is performed using a vapor deposition mask. A dielectric thin film such as zinc sulfide (ZnS) may be formed as a buffer layer on this thin film phosphor.
次に、このようにして形成された薄膜素子を電気炉やラ
ンプなどの加熱装置により不活性ガス中で例えば600
℃以上の温度で加熱処理を施す。なお、二重絶縁型と呼
ばれるタイプの素子では、発光層の上に第二絶縁層を形
成することがあるが、この第二絶縁層の形成後に加熱処
理してもよい。Next, the thin film element thus formed is heated in an inert gas by a heating device such as an electric furnace or a lamp, for example, at 600°C.
Heat treatment is performed at a temperature of ℃ or higher. Note that in a type of device called a double insulation type, a second insulating layer is sometimes formed on the light emitting layer, and heat treatment may be performed after forming the second insulating layer.
但し、第二絶縁層を省略したタイプもある。However, there is also a type in which the second insulating layer is omitted.
最後に、加熱処理された発光層の上あるいは第二絶縁層
の上にアルミ電極を蒸着して、交流薄膜電場発光素子を
得る。Finally, an aluminum electrode is deposited on the heat-treated light emitting layer or the second insulating layer to obtain an AC thin film electroluminescent device.
[実験例I
ITOなどの透明電極を備えたガラス基板上に五酸化タ
ンタル(TB、Os)の絶縁層を高周波スパッターによ
り予め形成しておき、さらにバッファー層として硫化亜
鉛(ZnS)の蒸着を行った後、セリウム(Ce)を不
活した硫化ストロンチウム(SrS : Ce)の発光
層を基板温度200〜300℃の電子線蒸着によって形
成した。このとき蒸着マスクにより長さ50mm、幅0
.3mmの帯状パターンを形成した。次に、発光層の上
にさらにバッファー層として硫化亜鉛(ZnS)を蒸着
によって形成した。このようにして形成された薄膜素子
を電気炉でアルゴンガス中、約600〜700℃で加熱
し、冷却した後、Ta205からなる絶縁層およびアル
ミ電極を形成した。[Experimental Example I An insulating layer of tantalum pentoxide (TB, Os) was formed in advance by high-frequency sputtering on a glass substrate equipped with a transparent electrode such as ITO, and zinc sulfide (ZnS) was further vapor-deposited as a buffer layer. Thereafter, a light emitting layer of strontium sulfide (SrS:Ce) with cerium (Ce) inactivated was formed by electron beam evaporation at a substrate temperature of 200 to 300°C. At this time, the length is 50 mm and the width is 0 using the vapor deposition mask.
.. A 3 mm strip pattern was formed. Next, zinc sulfide (ZnS) was further formed as a buffer layer on the light emitting layer by vapor deposition. The thus formed thin film element was heated in an electric furnace in argon gas at about 600 to 700°C, and after cooling, an insulating layer made of Ta205 and an aluminum electrode were formed.
このように製作した交流薄膜電場発光素子に1kHzの
正弦波交流電圧を加えたときの輝度−電圧特性(実施例
)を第1図に示した。従来法により基板温度600℃で
製作した発光層を用いた電場発光素子の輝度−印加電圧
特性(比較例)と比較すると、本発明による交流薄膜電
場発光素子(実施例)は、より高い輝度発光性を示すこ
とがわかる。FIG. 1 shows the brightness-voltage characteristics (Example) when a 1 kHz sinusoidal AC voltage was applied to the AC thin film electroluminescent device manufactured in this way. Compared to the brightness-applied voltage characteristics (comparative example) of an electroluminescent device using a light-emitting layer manufactured by a conventional method at a substrate temperature of 600°C, the AC thin film electroluminescent device according to the present invention (example) has higher luminance. It can be seen that it shows gender.
[発明の効果1
以上説明したように、本発明の方法によれば、真空蒸着
時の基板温度を低温化しても、不活性ガス中での加熱処
理を施すことで、良好な結晶性と高輝度発光性を有する
薄膜蛍光体を製造できる。[Effect of the invention 1 As explained above, according to the method of the present invention, even if the substrate temperature during vacuum deposition is lowered, good crystallinity and high quality can be achieved by performing heat treatment in an inert gas. A thin film phosphor that emits luminance can be manufactured.
また、基板温度の低温化に伴ない、蒸着装置の構造簡素
化、薄膜蛍光体のバタ一二・ングの高精細化を図ること
もできる。さらに、薄膜蛍光体の種類によっては、発光
スペクトルの純度が向上するという効果も得られ、カラ
ーの三原色の一部として利用する場合に都合が良い。Furthermore, as the substrate temperature decreases, it is possible to simplify the structure of the vapor deposition apparatus and to increase the precision of the thin film phosphor film. Furthermore, depending on the type of thin film phosphor, the purity of the emission spectrum can be improved, which is convenient when used as part of the three primary colors.
第1図は、本発明に従って得られた薄膜蛍光体と従来の
薄膜蛍光体における交流薄膜電場発光素子の輝度−印加
電圧特性を示す図である。FIG. 1 is a diagram showing the brightness-applied voltage characteristics of an AC thin film electroluminescent device using a thin film phosphor obtained according to the present invention and a conventional thin film phosphor.
Claims (1)
薄膜蛍光体を前記基板の温度を400℃未満とした真空
蒸着法によって作製したのち、前記薄膜蛍光体を不活性
ガス中で加熱処理することを特徴とする薄膜蛍光体の製
造方法。1) After producing a thin film phosphor containing an alkaline earth metal sulfide as a main component on a substrate by a vacuum evaporation method at a temperature of the substrate below 400°C, the thin film phosphor is heat-treated in an inert gas. A method for producing a thin film phosphor, characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2254646A JPH04133284A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method of thin film phosphor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2254646A JPH04133284A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method of thin film phosphor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04133284A true JPH04133284A (en) | 1992-05-07 |
Family
ID=17267911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2254646A Pending JPH04133284A (en) | 1990-09-25 | 1990-09-25 | Manufacturing method of thin film phosphor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04133284A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5667607A (en) * | 1994-08-02 | 1997-09-16 | Nippondenso Co., Ltd. | Process for fabricating electroluminescent device |
-
1990
- 1990-09-25 JP JP2254646A patent/JPH04133284A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5667607A (en) * | 1994-08-02 | 1997-09-16 | Nippondenso Co., Ltd. | Process for fabricating electroluminescent device |
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