JPH0387324A - Copper alloy rolled foil for flexible printed wiring board - Google Patents
Copper alloy rolled foil for flexible printed wiring boardInfo
- Publication number
- JPH0387324A JPH0387324A JP6669189A JP6669189A JPH0387324A JP H0387324 A JPH0387324 A JP H0387324A JP 6669189 A JP6669189 A JP 6669189A JP 6669189 A JP6669189 A JP 6669189A JP H0387324 A JPH0387324 A JP H0387324A
- Authority
- JP
- Japan
- Prior art keywords
- foil
- less
- impurities
- copper alloy
- ppm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
Abstract
Description
【発明の詳細な説明】
[a業上の利用分野]
本発明は、フレキシブルプリント用銅合金圧延箔に係り
、詳細には、たとえば、プリント回路、テープキャリヤ
などの配線回路に使用されるフレキシブルプリント用銅
合金圧延箔に関するものである。さらに詳しくは、8i
微細加工性、Snめっき被覆時の耐ウィスカ性、耐熱性
および導電性に優れるフレキシブルプリント用銅合金圧
延箔に関するものである。Detailed Description of the Invention [Field of Application in Industry A] The present invention relates to a rolled copper alloy foil for flexible printing. The present invention relates to copper alloy rolled foil for use. For more information, see 8i
The present invention relates to a rolled copper alloy foil for flexible printing that has excellent microprocessability, whisker resistance when coated with Sn plating, heat resistance, and electrical conductivity.
[従来の技術]
プリント回路などの電気回路には5〜40μmの厚さの
銅箔が多用されている。このような銅箔には電解銅箔と
圧延銅箔がある。[Prior Art] Copper foil with a thickness of 5 to 40 μm is often used in electrical circuits such as printed circuits. Such copper foils include electrolytic copper foils and rolled copper foils.
プリント回路基板には、ガラスエポキシ、紙フエノール
などの基板上に銅箔をクラッドした後、レジストエツチ
ング法により所望の回路パターンに形成した基板のほか
に、ポリイミドなどのフィルムに銅箔を張り合せできる
フレキシブル回路基板もある。これらの一部はテープキ
ャリヤ、T A B (Tape Automated
Bonding )リードとして半導体チップの実装
に使用されている。フレキシブル回路基板にはフレキシ
ビリティの点で優る圧延箔が使用される。Printed circuit boards can be made by cladding copper foil on a substrate made of glass epoxy or paper phenol, and then forming the desired circuit pattern using a resist etching method, or by laminating the copper foil onto a film such as polyimide. There are also flexible circuit boards. Some of these are tape carriers, T A B (Tape Automated
Bonding) Used as a lead in mounting semiconductor chips. Rolled foil, which is superior in flexibility, is used for flexible circuit boards.
近年、電気機器の小型化と高密度化と多機能化にともな
って、プリント回路基板の高密度化が強く求められてお
り、このため小型チップ部品を高密度実装ができる表面
実装方式が次第に採用され始めた。In recent years, with the miniaturization, higher density, and multifunctionality of electrical equipment, there has been a strong demand for higher density printed circuit boards, and for this reason, surface mounting methods that can mount small chip components at high density are gradually being adopted. It started to happen.
テープキャリヤやTABのリードは、最近では、ピッチ
間距離が80μm以下にも近接するようになってきてい
る。Recently, the pitches of tape carriers and TAB leads have become closer to each other with a pitch distance of 80 μm or less.
[発明が解決しようとする課題]
圧延箔としては通常タフピッチ銅および無酸素銅が使用
されているが、いずれもリードとして使用する場合、電
子デバイスと接合する部分にまず厚さ5μmのNi下地
めつき苓形成し、さらに、その上に厚さ1μmのAuめ
つきを形成している。[Problems to be Solved by the Invention] Tough pitch copper and oxygen-free copper are usually used as rolled foils, but when using either as a lead, first a 5 μm thick Ni undercoat is applied to the part to be bonded to an electronic device. A 1 μm thick Au plating is formed thereon.
配線のリード間ピッチが80μmと狭い接続部分には上
記のようなNi下地めっきとAuめつき被覆が常識とさ
れていた。It has been common practice to use Ni underplating and Au plating as described above for connection parts where the lead-to-lead pitch of wiring is as narrow as 80 μm.
Ni下地めっき上にAuめつきを行ったものは信頼性の
高いものではあるが、高価なものであるため、それに代
る安価なSnめフきが試みられている。しかし、Snめ
っきの場合は短時間でのウィスカ発生による配線間の短
絡が生ずるという課題がある。Although Au plating on Ni underplating is highly reliable, it is expensive, so an inexpensive Sn plating has been attempted as an alternative. However, in the case of Sn plating, there is a problem in that short circuits between wirings occur due to the generation of whiskers in a short period of time.
一方、ウィスカ対策のためSnめっきの代りにはんだめ
っきが検討されている。しかし、はんだめっきでははん
だ密着性不良という不具合いが生じるため、この考え方
は実用化には至っていない。On the other hand, solder plating is being considered instead of Sn plating to prevent whiskers. However, this concept has not been put into practical use because solder plating causes problems such as poor solder adhesion.
本発明は銅合金圧延箔に係るもので、従来のCu圧延箔
の代りに、接合部およびその近傍のめっきを、Niめフ
きとAuめつきの2層めっきからSnめっきないしはん
だめっきに置き代えることが可能となり、しかも、その
Snめっき層がウィスカを全く生じず、はんだ接合時の
230℃での加熱によっても母材が軟化せず、錫および
はんだの剥離も150℃X1000Hr保持後にも起こ
らず、また、強度および導電率も高い箔であって、しか
も、5μmの厚さで80μm程度のピッチでレジストエ
ツチングしても目標通りに非常にきれいにエツチングで
きるフレキシブルプリント用銅合金圧延箔を提供するこ
とを目的とする。The present invention relates to a copper alloy rolled foil, and instead of the conventional Cu rolled foil, the plating at the joint and its vicinity is replaced with Sn plating or solder plating instead of two-layer plating of Ni plating and Au plating. Moreover, the Sn plating layer does not generate any whiskers, the base material does not soften even when heated at 230°C during soldering, and the tin and solder do not peel off even after being held at 150°C for 1000 hours. Further, to provide a rolled copper alloy foil for flexible printing, which is a foil having high strength and conductivity, and which can be etched very neatly according to the target even when resist etching is performed with a thickness of 5 μm and a pitch of about 80 μm. With the goal.
[課題を解決するための手段]
本発明の第1の要旨は、Ag:0.02〜0.3%(重
量%以下同じ)、P:02〜0.04%、Zn : 1
.0〜5.0%(ただし、1.0%は除く)、10pp
m以下のSを含有し、残部Cuと不純物とからなること
を特徴とするフレキシブルプリント用銅合金圧延箔に存
在する。[Means for Solving the Problems] The first gist of the present invention is that Ag: 0.02 to 0.3% (the same below weight%), P: 02 to 0.04%, Zn: 1
.. 0 to 5.0% (excluding 1.0%), 10pp
It is present in a rolled copper alloy foil for flexible printing, which is characterized by containing less than m of S, with the remainder consisting of Cu and impurities.
本発明の第2の要旨は、Ag:0.02〜0.3%、P
:0.02〜0.04%、Zn:1.0〜5.0%(た
だし、1.0%は除く)。The second gist of the present invention is that Ag: 0.02-0.3%, P
: 0.02 to 0.04%, Zn: 1.0 to 5.0% (excluding 1.0%).
10ppm以下のSを含有し、不純物と酸素との合計が
50ppm以下、残部Cuからなることを特徴とするフ
レキシブルプリント用銅合金圧延箔に存在する。It is present in a copper alloy rolled foil for flexible printing characterized by containing 10 ppm or less of S, the total amount of impurities and oxygen being 50 ppm or less, and the balance being Cu.
本発明の第3の要旨は、Sn:0.05〜0.2%、P
:02〜0.05%、Zn:1.0〜5.0%(ただし
、1.0%は除く)、10ppm以下のSを含有し、残
部Cuと不純物とからなることを特徴とするフレキシブ
ルプリント用銅合金圧延箔に存在する。The third gist of the present invention is that Sn: 0.05-0.2%, P
: 02 to 0.05%, Zn: 1.0 to 5.0% (excluding 1.0%), 10 ppm or less of S, and the balance consists of Cu and impurities. Present in printed copper alloy rolled foil.
本発明の第4の要旨は、Sn:0.05〜0.2%、P
:02〜0.05%、zn:1.0〜5.0%(ただし
、1.0%は除く)、10ppm以下のSを含有し、不
純物と酸素との合計が50ppm以下、残部Cuからな
ることを特徴とするフレキシブルプリント用銅合金圧延
箔に存在する。The fourth gist of the present invention is that Sn: 0.05-0.2%, P
: 02 to 0.05%, zn: 1.0 to 5.0% (excluding 1.0%), contains 10 ppm or less of S, the total of impurities and oxygen is 50 ppm or less, the balance is Cu A rolled copper alloy foil for flexible printing is characterized by:
本発明の′N%5の要旨は、co=0.15〜0225
%、P:0.04〜11.08%、Zn:1.0〜5.
0%(ただし、1.0%は除く)、10ppm以下のS
を含有し、残部Cuと不純物とから゛なることを特徴と
するフレキシブルプリント用銅合金圧延箔に存在する。The gist of 'N%5 of the present invention is co=0.15~0225
%, P: 0.04-11.08%, Zn: 1.0-5.
0% (excluding 1.0%), 10ppm or less S
The copper alloy rolled foil for flexible printing is characterized in that it contains Cu and the remainder is Cu and impurities.
本発明の第6の要旨は、Co:0.15〜0.25%、
P:04〜0.08%、Zn:1.0〜5.0%(ただ
し、1.0%は除く)、10ppm以下のSを含有し、
不純物と酸素との合計が50ppm以下、残部Cuから
なることを特徴とするフレキシブルプリント用銅合金圧
延箔に存在する。The sixth gist of the present invention is Co: 0.15 to 0.25%,
Contains P: 04 to 0.08%, Zn: 1.0 to 5.0% (excluding 1.0%), 10 ppm or less of S,
The copper alloy rolled foil for flexible printing is characterized in that the total amount of impurities and oxygen is 50 ppm or less, and the balance is Cu.
本発明の第7の要旨は、上記第1から第6の要旨におい
て、箔の厚さを40μm以下としたことを特徴とするフ
レキシブルプリント用銅合金圧延箔に存在する。A seventh aspect of the present invention resides in the copper alloy rolled foil for flexible printing, which is characterized in that the thickness of the foil is 40 μm or less in the first to sixth aspects.
[作 用]
本発明の含有元素の作用効果および限定理由を説明する
。[Function] The effects and reasons for limitations of the contained elements of the present invention will be explained.
(Zn)
Znは、Sn?!Ff材のウィスカ発生を抑制し、せ、
導電率を高める。そのためには、1%を超えてZnを含
有させる必要がある。(Zn) Zn is Sn? ! Suppresses the generation of whiskers in Ff materials,
Increases electrical conductivity. For this purpose, it is necessary to contain Zn in an amount exceeding 1%.
Znを1%を超えて含有させると、密着性を悪くする金
属間化合物(Cu、Sn)相の生成を抑制できる。これ
は、ZnはCu、Sn相の母材側に生ずるカーケンダー
ルホイドの生成を抑制し、密着性を向上させるものと考
えられる。When Zn is contained in an amount exceeding 1%, the formation of intermetallic compound (Cu, Sn) phases that deteriorate adhesion can be suppressed. This is thought to be because Zn suppresses the formation of Kirkendahloid that occurs on the base material side of the Cu and Sn phases, thereby improving adhesion.
また、Snめっき中へ微量のZnが拡散し、Snの内部
応力を緩和するため、ウィスカ成長を抑制していると思
われる。In addition, a small amount of Zn diffuses into the Sn plating and relieves the internal stress of Sn, which seems to suppress whisker growth.
しかし、Znが5%を超えると耐ウィスカ性には問題は
ないが、導電率が60%I ACS未満となったり、黄
銅独特の応力腐食割れを生じやすい性質を保有してくる
という短所が表れてくるので、Znは5%以下とする。However, if the Zn content exceeds 5%, although there is no problem with whisker resistance, there are disadvantages such as electrical conductivity being less than 60% IACS and the tendency to cause stress corrosion cracking that is unique to brass. Therefore, the Zn content is set to 5% or less.
(S) 次にSの含有量の上限を定めた理由について記述する。(S) Next, the reason for setting the upper limit of the S content will be described.
従来の銅合金においては、銅合金中ではSは多くはCu
Sとして存在し、MnあるいはMgが不純物として含有
されていると、MnSとしであるいはMgSとして存在
する。いずれも、粒界中に局在し、そのためにエツチン
グ時の不具合が生じることを知見した。従来の銅合金に
おいては、特に、5〜40μm厚さの箔となるとレジス
トエツチングする場合に、レジストの接着不良を起しに
リエッチング液をはじいたりして、エツチングむらなど
の不具合いを生じていた0本発明者は、その原因の探究
を行った。その結果、その原因はSに存在することを知
見した。したがって、不具合の発生を防ぐためには、S
を完全に除去することが望ましいが、原料・炉材、被覆
木炭、燃料などからの混入は避は難く、10ppm以下
と定めた。In conventional copper alloys, S is mostly Cu in copper alloys.
If Mn or Mg is contained as an impurity, it exists as MnS or MgS. It has been found that both of them are localized in grain boundaries, which causes problems during etching. With conventional copper alloys, when performing resist etching, especially when using foils with a thickness of 5 to 40 μm, the etching solution may be repelled due to poor adhesion of the resist, resulting in defects such as uneven etching. The present inventor investigated the cause. As a result, it was found that the cause of the problem was found in S. Therefore, in order to prevent problems from occurring, S
Although it is desirable to completely remove carbon dioxide, it is difficult to avoid contamination from raw materials, furnace materials, coated charcoal, fuel, etc., and the amount has been set at 10 ppm or less.
(酸素、不純物)
また、酸素と不純物とについても、不純物が酸化物の状
態で存在すると、5〜40μmの厚さの箔では、上記の
Sと同様、エツチング時の微細加工を阻害することが分
かり、50ppm以下と定めた。(Oxygen, impurities) Also, regarding oxygen and impurities, if the impurities exist in the form of oxides, they may inhibit microfabrication during etching in foils with a thickness of 5 to 40 μm, similar to S above. Understood, it was set at 50 ppm or less.
S1酸素および不純物は、厚さが0.1 mm以上の板
・条では、表面に現れても、それらの化合物の大きさ・
数・量は僅かであり、通常混入する量を制限する必要は
ないが、厚さ5〜40μmの箔になると、圧延時のピン
ホールの発生、圧延切れ、さらには、前述のレジストの
接着不良、エツチング不良などが生じることを本発明者
は知見し、前述の上限に定める。S1 Oxygen and impurities may appear on the surface of plates or strips with a thickness of 0.1 mm or more, but due to the size and
The number and amount is small and there is usually no need to limit the amount mixed in, but when the foil is 5 to 40 μm thick, pinholes occur during rolling, rolling breaks, and the aforementioned resist adhesion failure occurs. The inventor of the present invention has found that etching defects may occur, and has set the above-mentioned upper limit.
(Ag、P)
AgはCu中に固溶して強度と軟化温度を向上する効果
を有する。0.02%未満ではかかる効果は生じない、
0.3%を超えると効果は飽和し経済的ではないので0
.3%を上限とする。(Ag, P) Ag forms a solid solution in Cu and has the effect of improving strength and softening temperature. Such an effect does not occur at less than 0.02%.
If it exceeds 0.3%, the effect is saturated and it is not economical, so 0.
.. The upper limit is 3%.
Pはこの場合の製造工程中でのCu合金の脱酸のために
、また、焼鈍時の水素脆性割れ防止のために必要な元素
で、0.02%未満ではその効果は少なく、0.05%
を超えるとこれらの効果は十分発揮されるが固溶して導
電率を低下させる。In this case, P is an element necessary for deoxidizing the Cu alloy during the manufacturing process and for preventing hydrogen embrittlement cracking during annealing, and if it is less than 0.02%, the effect is small; %
If the amount exceeds 100%, these effects can be sufficiently exhibited, but solid solution occurs and the conductivity decreases.
したがって、Agを含有する場合のP含有量は0.02
〜0.05%とする。Therefore, the P content when containing Ag is 0.02
~0.05%.
(Sn、P)
SnはCu中に固溶して強度と軟化温度を向上する効果
を有する。0.05%未満では目標とする耐熱性を保有
することができない、0.2%を超えると導電率60%
I AC5を下まわるようになる。したがってSn含有
量は0.05〜0. 2%とする。(Sn, P) Sn forms a solid solution in Cu and has the effect of improving strength and softening temperature. If it is less than 0.05%, it will not be possible to maintain the target heat resistance, and if it exceeds 0.2%, the conductivity will be 60%.
I become lower than AC5. Therefore, the Sn content is 0.05 to 0. 2%.
Pはこの場合の製造工程中でのCu合金の脱酸のために
、また、焼鈍時の水素脆性割れ防止のために必要な元素
で、0.02%未満ではその効果は少なく、0.05%
を超えるとこれらの効果は十分発揮されるが固溶して導
電率を低下させる。In this case, P is an element necessary for deoxidizing the Cu alloy during the manufacturing process and for preventing hydrogen embrittlement cracking during annealing, and if it is less than 0.02%, the effect is small; %
If the amount exceeds 100%, these effects can be sufficiently exhibited, but solid solution occurs and the conductivity decreases.
したがって、Snを含有する場合のP含有量は0.02
〜0105%とする。Therefore, the P content when containing Sn is 0.02
~0105%.
(Co、P)
COはPと燐化コバルトを形成し、強度の向上とはんだ
付は温度条件での軟化を防止するための必須の元素であ
る。しかし、0.15%未満ではP(含有量0.04〜
0.08%)の一部と化合して燐化コバルトを形成して
も、強度向上の効果を超えると燐化コバルトを形成し得
ない固溶cOが増加し、導電率を低下させるようになる
。よって、COの含有量は0,15〜0.25%とする
。(Co, P) CO forms cobalt phosphide with P, which is an essential element for improving strength and preventing softening under temperature conditions. However, if it is less than 0.15%, P (content 0.04~
Even if cobalt phosphide is formed by combining with a part of cobalt phosphide (0.08%), if the effect of improving strength is exceeded, solid solute cO, which cannot form cobalt phosphide, will increase and reduce electrical conductivity. Become. Therefore, the content of CO is set to 0.15 to 0.25%.
PはCOと燐化コバルトを形成して強度の向上、軟化温
度の向上に寄与する元素であるが、含有量が0.04%
未満では強度向上等に寄与はどではなく、含有量が0.
08%を超えると燐化コバルトを形威し得ない固溶Pが
増加し、導電率を低下させるようになる。よって、CO
を含有する場合のP含有量は0.04〜0.08%とす
る。P is an element that forms cobalt phosphide with CO and contributes to improving strength and softening temperature, but the content is 0.04%.
If the content is less than 0.0%, it will not contribute to strength improvement, etc.
If it exceeds 0.8%, solid solution P which cannot form a form of cobalt phosphide will increase, leading to a decrease in electrical conductivity. Therefore, C.O.
The P content in the case of containing is 0.04 to 0.08%.
[実施例] 以下、本発明を実施例によって説明する。[Example] Hereinafter, the present invention will be explained by examples.
第1表〜第3表に示す各種合金を黒鉛ツボで溶解して、
金型鋳造した。Various alloys shown in Tables 1 to 3 are melted in a graphite pot,
Mold cast.
鋳塊を機械加工により表裏面を各2.5mm面削して5
0mmtx70mmwx200mmuとし、900℃の
温度で厚さ10mmまで熱間圧延去後厚さ0.2mmま
で冷間圧延し、ついで500℃XIHrの中間焼鈍を行
った。The ingot was machined to face 2.5 mm on each side.
0mmtx70mmwx200mmu, hot rolled at 900°C to a thickness of 10mm, cold rolled to a thickness of 0.2mm, and then intermediate annealed at 500°C x IHr.
次に、入念に酸洗し、ざらに冷間圧延を繰り返し、厚さ
35μmの箔を製作し、ピンホール、圧延切れを観察し
た。Next, the foil was carefully pickled and cold-rolled repeatedly to produce a foil with a thickness of 35 μm, and pinholes and rolling breaks were observed.
また、同様の手順によって、厚さ5μmと65μmの箔
とを作製した。In addition, foils with thicknesses of 5 μm and 65 μm were produced using the same procedure.
(エツチング性)
これらの箔について、幅100μm、間隔80μm1長
さ20μmで50本のレジストを焼きつけ、塩化第2鉄
溶液40%でケミカルミーリングして、50本のリード
を製作その健全性を調査した。(Etching properties) For these foils, 50 resists were baked with a width of 100 μm, an interval of 80 μm, and a length of 20 μm, and chemical milling was performed using a 40% ferric chloride solution to produce 50 leads and examine their soundness. .
(ウィスカの発生程度)
アルカリ中で電界脱脂後硫酸浴中で電流密度3A/dm
2によって厚さ15μmのSnめっきを行い、エポキシ
樹脂系の接着材でSnめっきと反対側面を0.2mm銅
合金板で貼りつけ、曲げによって約4kg/mm’の圧
縮応力を加え、室明細書の浄8(内容に変更なし)
温で1年間放置後、ウィスカの発生の有無を調査した。(Extent of whisker generation) After electric field degreasing in alkaline, current density 3A/d in sulfuric acid bath.
2, apply Sn plating to a thickness of 15 μm, attach a 0.2 mm copper alloy plate to the opposite side of the Sn plating using an epoxy resin adhesive, apply a compressive stress of approximately 4 kg/mm' by bending, and No. 8 (no change in content) After being left at room temperature for one year, the presence or absence of whiskers was investigated.
(軟化特性、導電率)
軟化特性については、木炭の被覆下で電気炉中でIHr
保持し、引張強度の6割の値を維持する温度を求めた。(Softening properties, electrical conductivity) Regarding the softening properties, IHr in an electric furnace under charcoal coating
The temperature at which 60% of the tensile strength was maintained was determined.
導電率は、JISHO505に基づいた。The conductivity was based on JISHO505.
以上の試験結果をまとめて第1表〜第3表に示した。The above test results are summarized in Tables 1 to 3.
Znを1〜5%含む合金は、表面にSnめっきが行われ
ても、ウィスカが生ずることもなく、また、Sおよび酸
素とその他の不純物とを規制することによって厚さ5〜
40μmの箔においてもレジストエツチング後の不良率
が2%以下と良好となった。Alloys containing 1 to 5% Zn do not generate whiskers even when Sn plating is applied to the surface, and by controlling S, oxygen, and other impurities, the thickness can be reduced to 5 to 5%.
Even for the 40 μm foil, the defect rate after resist etching was good at 2% or less.
特に、本発明合金箔以外の合金箔では、5〜40μmと
厚みが薄くなると、エツチング性の低下が著しいが、本
発明の合金ではほとんど低下しない、 また、はんだ付
けなどの加熱によっても、IHrの加熱によっても、軟
化温度280℃以上を示している。なお、表中には従来
合金としてタフピッチ銅(No、8)を併記した。In particular, with alloy foils other than the alloy foil of the present invention, when the thickness decreases to 5 to 40 μm, the etching property decreases significantly, but with the alloy of the present invention, there is almost no decrease. Even when heated, the softening temperature is 280°C or higher. In addition, tough pitch copper (No. 8) is also listed in the table as a conventional alloy.
[発明の効果]
本発明によれば、従来のNiとAuとのめっきの代わり
に、Snめっきを行っても、ウィスカ性を全く生ずるこ
ともない。[Effects of the Invention] According to the present invention, even if Sn plating is performed in place of the conventional Ni and Au plating, no whiskers occur at all.
また、極微細加工後の歩留も向上する。Furthermore, the yield after ultra-fine processing is also improved.
さらに、従来材より格段に優れる引張強度を有している
。Furthermore, it has a tensile strength that is significantly superior to conventional materials.
このように、本発明は、フレキシブルプリント用銅合金
箔として優れた特性を有しており、電子機器の小型化高
密度実装化、多機能化のための材料として優れた特性を
有している。As described above, the present invention has excellent properties as a copper alloy foil for flexible printing, and has excellent properties as a material for miniaturization, high-density packaging, and multifunctionalization of electronic devices. .
手続補正書
(方式)
%式%
1、事件の表示
平成1年特許願第66691号
2、発明の名称
フレキシブルプリント用銅合金圧延箔
3、補正をする者
事件との関係 特許出願人
住 所 兵庫県神戸布中央区脇浜町
1丁目3番18号
名 称 (119)株式会社神戸製鋼所代表者 亀高
素吉
4、代 理 人 〒160電話03 (358) 88
40住 所 東京都新宿区本塩町 12
平成2年9月25日
補正の対象
明細書の[特許請求の範囲コ
説明]の欄
及び
[発明の詳細なProcedural amendment (method) % formula % 1. Indication of the case 1999 Patent Application No. 66691 2. Name of the invention Copper alloy rolled foil for flexible printing 3. Person making the amendment Relationship to the case Patent applicant address Hyogo 1-3-18 Wakihama-cho, Fuchuo-ku, Kobe Prefecture Name (119) Kobe Steel, Ltd. Representative Sokichi Kametaka 4, Agent Address: 160 Telephone: 03 (358) 88
40 Address 12 Motoshio-cho, Shinjuku-ku, Tokyo 25th September 1990 The column of [Claims/Explanation] and [Details of the invention]
Claims (7)
、P:0.02〜0.04%、Zn:1.0〜5.0%
(ただし、1.0%は除く)、10ppm以下のSを含
有し、残部Cuと不純物とからなることを特徴とするフ
レキシブルプリント用銅合金圧延箔。(1) Ag: 0.02-0.3% (same below weight%)
, P: 0.02-0.04%, Zn: 1.0-5.0%
A rolled copper alloy foil for flexible printing, characterized in that it contains 10 ppm or less of S (excluding 1.0%), and the remainder consists of Cu and impurities.
.04%、Zn:1.0〜5.0%(ただし、1.0%
は除く)、10ppm以下のSを含有し、不純物と酸素
との合計が50ppm以下、残部Cuからなることを特
徴とするフレキシブルプリント用銅合金圧延箔。(2) Ag: 0.02-0.3%, P: 0.02-0
.. 04%, Zn: 1.0 to 5.0% (however, 1.0%
A rolled copper alloy foil for flexible printing, characterized in that it contains 10 ppm or less of S, the total amount of impurities and oxygen is 50 ppm or less, and the balance is Cu.
、P:0.02〜0.05%、Zn:1.0〜5.0%
(ただし、1.0%は除く)、10ppm以下のSを含
有し、残部Cuと不純物とからなることを特徴とするフ
レキシブルプリント用銅合金圧延箔。(3) Sn: 0.05-0.2% (same below weight%)
, P: 0.02-0.05%, Zn: 1.0-5.0%
A rolled copper alloy foil for flexible printing, characterized in that it contains 10 ppm or less of S (excluding 1.0%), and the remainder consists of Cu and impurities.
.05%、Zn:1.0〜5.0%(ただし、1.0%
は除く)、10ppm以下のSを含有し、不純物と酸素
との合計が50ppm以下、残部Cuからなることを特
徴とするフレキシブルプリント用銅合金圧延箔。(4) Sn: 0.05-0.2%, P: 0.02-0
.. 05%, Zn: 1.0 to 5.0% (however, 1.0%
A rolled copper alloy foil for flexible printing, characterized in that it contains 10 ppm or less of S, the total amount of impurities and oxygen is 50 ppm or less, and the balance is Cu.
)、P:0.04〜0.08%、Zn:1.0〜5.0
%(ただし、1.0%は除く)、10ppm以下のSを
含有し、残部Cuと不純物とからなることを特徴とする
フレキシブルプリント用銅合金圧延箔。(5) Co: 0.15-0.25% (same below weight%), P: 0.04-0.08%, Zn: 1.0-5.0
% (excluding 1.0%) and 10 ppm or less of S, with the remainder consisting of Cu and impurities.
0.08%、Zn:1.0〜5.0%(ただし、1.0
%は除く)、10ppm以下のSを含有し、不純物と酸
素との合計が50ppm以下、残部Cuからなることを
特徴とするフレキシブルプリント用銅合金圧延箔。(6) Co: 0.15~0.25%, P: 0.04~
0.08%, Zn: 1.0 to 5.0% (however, 1.0%
A rolled copper alloy foil for flexible printing, characterized in that it contains S of 10 ppm or less, the total amount of impurities and oxygen is 50 ppm or less, and the balance is Cu.
る請求項1ないし請求項6のいずれか1項に記載のフレ
キシブルプリント用銅合金圧延箔。(7) The rolled copper alloy foil for flexible printing according to any one of claims 1 to 6, wherein the foil has a thickness of 40 μm or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6669189A JP2809673B2 (en) | 1989-03-17 | 1989-03-17 | Copper alloy rolled foil for flexible printing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6669189A JP2809673B2 (en) | 1989-03-17 | 1989-03-17 | Copper alloy rolled foil for flexible printing |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0387324A true JPH0387324A (en) | 1991-04-12 |
JP2809673B2 JP2809673B2 (en) | 1998-10-15 |
Family
ID=13323215
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6669189A Expired - Fee Related JP2809673B2 (en) | 1989-03-17 | 1989-03-17 | Copper alloy rolled foil for flexible printing |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2809673B2 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003041333A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003041332A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003041334A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003055724A (en) * | 2001-08-10 | 2003-02-26 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003055723A (en) * | 2001-08-10 | 2003-02-26 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003064431A (en) * | 2001-08-20 | 2003-03-05 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
EP1630239A1 (en) | 2004-08-30 | 2006-03-01 | Dowa Mining Co., Ltd. | Copper alloy and method of manufacturing the same |
CN1305355C (en) * | 1998-11-17 | 2007-03-14 | 日矿金属株式会社 | Rolled copper foil as base plate for making flexible printed circuit board and its production method |
-
1989
- 1989-03-17 JP JP6669189A patent/JP2809673B2/en not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1305355C (en) * | 1998-11-17 | 2007-03-14 | 日矿金属株式会社 | Rolled copper foil as base plate for making flexible printed circuit board and its production method |
JP2003041333A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003041332A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003041334A (en) * | 2001-08-01 | 2003-02-13 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003055724A (en) * | 2001-08-10 | 2003-02-26 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003055723A (en) * | 2001-08-10 | 2003-02-26 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
JP2003064431A (en) * | 2001-08-20 | 2003-03-05 | Nippon Mining & Metals Co Ltd | Copper alloy foil for laminates |
EP1630239A1 (en) | 2004-08-30 | 2006-03-01 | Dowa Mining Co., Ltd. | Copper alloy and method of manufacturing the same |
US7563408B2 (en) | 2004-08-30 | 2009-07-21 | Dowa Metaltech Co., Ltd. | Copper alloy and method of manufacturing the same |
Also Published As
Publication number | Publication date |
---|---|
JP2809673B2 (en) | 1998-10-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR910001420B1 (en) | Film carrier and manufacturing method | |
KR930005072B1 (en) | Copper alloy for electronic instrument and method of manufacturing the same | |
KR100466062B1 (en) | Copper-alloy foil to be used for laminate sheet | |
JP4381574B2 (en) | Copper alloy foil for laminates | |
JPS63310929A (en) | Copper alloy for flexible print | |
US6939620B2 (en) | Copper alloy foil | |
US6808825B2 (en) | Copper alloy foil | |
JPH0387324A (en) | Copper alloy rolled foil for flexible printed wiring board | |
JP3911173B2 (en) | Rolled copper foil for copper clad laminate and method for producing the same (2) | |
JPS6260838A (en) | Copper alloy for lead frame | |
US20030096082A1 (en) | Copper alloy foil | |
JP2003041334A (en) | Copper alloy foil for laminates | |
JP2809713B2 (en) | Copper alloy rolled foil for flexible printing | |
JP4550263B2 (en) | Copper alloy foil for laminates | |
JPH11264037A (en) | Copper alloy foil | |
JP2531777B2 (en) | Copper alloy rolled foil for flexible printing | |
JP2002249835A (en) | Copper alloy foil for laminates | |
JP4254488B2 (en) | Copper foil for electronic parts and manufacturing method thereof | |
JP2005029826A (en) | Method for producing copper alloy foil for electronic parts | |
JP2003025489A (en) | Copper alloy foil for laminates | |
JP2003055722A (en) | Copper alloy foil for laminates | |
JP2003013156A (en) | Copper alloy foil for laminates | |
JP2003055723A (en) | Copper alloy foil for laminates | |
TW201238752A (en) | Copper foil with copper carrier, method for producing said copper foil, copper foil for electronic circuit, method for producing said copper foil, and method for forming electronic circuit | |
JPH11264038A (en) | Copper alloy foil |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20070731 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080731 Year of fee payment: 10 |
|
LAPS | Cancellation because of no payment of annual fees |