JPH0365987U - - Google Patents
Info
- Publication number
- JPH0365987U JPH0365987U JP12729789U JP12729789U JPH0365987U JP H0365987 U JPH0365987 U JP H0365987U JP 12729789 U JP12729789 U JP 12729789U JP 12729789 U JP12729789 U JP 12729789U JP H0365987 U JPH0365987 U JP H0365987U
- Authority
- JP
- Japan
- Prior art keywords
- module
- controller
- test head
- test
- optical fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 3
- 239000013307 optical fiber Substances 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000009429 electrical wiring Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12729789U JPH0365987U (fr) | 1989-10-31 | 1989-10-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12729789U JPH0365987U (fr) | 1989-10-31 | 1989-10-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0365987U true JPH0365987U (fr) | 1991-06-26 |
Family
ID=31675057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12729789U Pending JPH0365987U (fr) | 1989-10-31 | 1989-10-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0365987U (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998022829A1 (fr) * | 1996-11-15 | 1998-05-28 | Advantest Corporation | Testeur de dispositif a circuit integre |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59500891A (ja) * | 1982-05-24 | 1984-05-17 | マイクロ コンポ−ネント テクノロジ−.インコ−ポレイテイド | 集積回路試験装置 |
JPS60219571A (ja) * | 1984-04-16 | 1985-11-02 | Yokogawa Hokushin Electric Corp | アナログlsiテスタ |
JPS61117472A (ja) * | 1984-11-13 | 1986-06-04 | Yokogawa Electric Corp | テストシステム |
-
1989
- 1989-10-31 JP JP12729789U patent/JPH0365987U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59500891A (ja) * | 1982-05-24 | 1984-05-17 | マイクロ コンポ−ネント テクノロジ−.インコ−ポレイテイド | 集積回路試験装置 |
JPS60219571A (ja) * | 1984-04-16 | 1985-11-02 | Yokogawa Hokushin Electric Corp | アナログlsiテスタ |
JPS61117472A (ja) * | 1984-11-13 | 1986-06-04 | Yokogawa Electric Corp | テストシステム |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998022829A1 (fr) * | 1996-11-15 | 1998-05-28 | Advantest Corporation | Testeur de dispositif a circuit integre |
GB2322203A (en) * | 1996-11-15 | 1998-08-19 | Advantest Corp | Integrated circuit device tester |
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