JPH0330831B2 - - Google Patents
Info
- Publication number
- JPH0330831B2 JPH0330831B2 JP57122613A JP12261382A JPH0330831B2 JP H0330831 B2 JPH0330831 B2 JP H0330831B2 JP 57122613 A JP57122613 A JP 57122613A JP 12261382 A JP12261382 A JP 12261382A JP H0330831 B2 JPH0330831 B2 JP H0330831B2
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- preselector
- interference noise
- receiver
- noise
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
- G01R31/3161—Marginal testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Description
【発明の詳細な説明】
この発明は干渉雑音試験装置の改良に関するも
ので、詳しくは電子機器から発生する干渉雑音を
測定する感度と正確さを向上させた干渉雑音試験
装置を提供するものである。[Detailed Description of the Invention] The present invention relates to an improvement of an interference noise testing device, and more specifically, it provides an interference noise testing device that has improved sensitivity and accuracy in measuring interference noise generated from electronic equipment. .
さて、電子機器が発生する干渉雑音(以下、
EMIと呼ぶ)は、上記電子機器の信号ラインや
電源ライン等にて伝送される伝導性EMIと、上
記電子機器から電波や磁界として空間に放射され
る放射性EMIに大きく分類される。 Now, interference noise generated by electronic equipment (hereinafter referred to as
EMI) is broadly classified into conductive EMI, which is transmitted through the signal lines and power lines of the electronic devices, and radioactive EMI, which is emitted from the electronic devices into space as radio waves and magnetic fields.
これらのEMIは電子機器の動作に不具合をも
たらすので、そのレベルがある一定値内におさま
つていることが要求されている。このため電子機
器の上記EMIを計測し、その強度が一定値内に
おさまつているかどうかを試験しなければなら
ず、上記EMI試験装置が必要となるのである。 Since these EMIs cause malfunctions in the operation of electronic devices, it is required that their level be kept within a certain value. For this reason, it is necessary to measure the EMI of electronic equipment and test whether the intensity is within a certain value, which requires the EMI test equipment described above.
なおここでは説明の便宜上、計測の対象を上記
放射性EMIに限つて説明する。 Note that for convenience of explanation, the measurement target will be limited to the radioactive EMI described above.
まず従来のこの種装置について図を用いて簡単
に説明する。第1図は従来のこの種装置の構成ブ
ロツク図、第2図はEMI試験規格の一例を示す
図である。 First, a conventional device of this type will be briefly explained using figures. FIG. 1 is a block diagram of a conventional device of this kind, and FIG. 2 is a diagram showing an example of EMI test standards.
第1図において1は供試体、2は上記供試体1
から放射される放射性EMIを検出する受信アン
テナ、3は上記放射性EMIを伝送する高周波伝
送路(以下、RF伝送路と呼ぶ)、4は上記受信ア
ンテナ2で検出され、上記RF伝送路3により伝
送される上記放射性EMIを帯域制限するための
帯域通過フイルタで構成され、かつ中央処理装置
(以下、cpuと呼ぶ)8の制御により上記帯域通
過フイルタの中心周波数を掃引する機能を備えた
プリセレクタ、5は上記プリセレクタ4にRF伝
送路3を経由して接続され、上記放射性EMIの
強度を上記cpu8の制御に基づいて調節する減衰
器、6は上記減衰器5にRF伝送路3経由接続さ
れ、上記放射性EMIの強度を周波数スペクトラ
ムの形で、cpu8の制御によつて計測する機能を
備えた受信機(例えばスペクトラムアナライザや
電界測定器など)、7は、プリセレクタ4、減衰
器5、受信機6、出力表示装置10、入力装置1
1及びcpu8との中継を行う入出力インタフエー
ス、8は処理プログラムに従つてプリセレクタ
4、減衰器5、受信器6、出力表示装置10、入
力装置11を制御し、かつ上記受信機6で計測さ
れた上記放射性EMI計測値を収集し、その処理
を行うcpu、9は上記処理プログラム、計測値及
び試験条件などを記憶し、上記cpu8との間で情
報の授受を行う記憶装置、10は上記入出力イン
タフエースに接続され上記計測値などを出力表示
する出力表示装置(例えばプロツタやラインプリ
ンタなど)、11は上記入出力インタフエース7
に接続され試験条件などの情報をcpu8に入力す
る入力装置(例えばキーボードなど)、12は上
記入出力インタフエース7とプリセレクタ4、減
衰器5、受信機6、出力表示装置10及び入力装
置11を接続し、CPU8とプリセレクタ4、減
衰器5、受信器6、出力表示装置10及び入力装
置11との間で授受されるデイジタル信号を伝送
するインタフエースバスケーブルである。 In Fig. 1, 1 is the specimen, 2 is the specimen 1 mentioned above.
3 is a high frequency transmission line (hereinafter referred to as an RF transmission line) that transmits the radiated EMI; 4 is a radio frequency transmission line that is detected by the receiving antenna 2 and transmitted through the RF transmission line 3; a preselector comprising a bandpass filter for band-limiting the radioactive EMI that is transmitted, and having a function of sweeping the center frequency of the bandpass filter under the control of a central processing unit (hereinafter referred to as CPU) 8; 5 is an attenuator connected to the preselector 4 via the RF transmission line 3 and adjusts the intensity of the radiated EMI based on control of the CPU 8; 6 is connected to the attenuator 5 via the RF transmission line 3; , a receiver (such as a spectrum analyzer or an electric field measuring device) equipped with a function to measure the intensity of the radioactive EMI in the form of a frequency spectrum under the control of the CPU 8; 7 is a preselector 4, an attenuator 5, a receiver; machine 6, output display device 10, input device 1
1 and an input/output interface that relays with the CPU 8; 8 controls the preselector 4, attenuator 5, receiver 6, output display device 10, and input device 11 according to the processing program; A CPU 9 collects and processes the radioactive EMI measurement values, a storage device 9 stores the processing program, measurement values, test conditions, etc., and exchanges information with the CPU 8; An output display device (such as a plotter or a line printer) connected to the input/output interface and outputting and displaying the measured values, etc.; 11 is the input/output interface 7;
An input device (such as a keyboard) connected to the CPU 8 to input information such as test conditions to the CPU 8; This is an interface bus cable that connects the CPU 8 and the preselector 4, attenuator 5, receiver 6, output display device 10, and input device 11 to transmit digital signals.
第2図において、Sは放射性EMI規格の一例、
S、及びS2は上記放射性EMI規格の一例sにお
いて特に低い強度を適用した一例(例えば通信装
置に適用される放射性EMI規格)、Tは上記受信
アンテナ2、RF伝送路3、プリセレクタ4、減
衰器5、及び受信機6からなる受信系の受信感度
すなわちスレツシホールドレベルである。 In Figure 2, S is an example of the radioactive EMI standard,
S and S 2 are an example of the above-mentioned radiated EMI standard s in which particularly low intensity is applied (for example, the radiated EMI standard applied to communication devices), and T is the above-mentioned receiving antenna 2, RF transmission line 3, preselector 4, This is the receiving sensitivity of the receiving system consisting of the attenuator 5 and the receiver 6, that is, the threshold level.
次に、従来のこの種装置の動作を説明する。 Next, the operation of a conventional device of this type will be explained.
供試体1から発生した上記放射性EMIは受信
アンテナ2によつて検出され、RF伝送路3を通
つてプリセレクタ4へ入力する。 The radioactive EMI generated from the specimen 1 is detected by the receiving antenna 2 and input to the preselector 4 through the RF transmission line 3.
上記プリセレクタ4はcpu8の命令により通過
帯域が制御され上記放射性EMIを帯域制限する
から、その通過帯域内に落込む上記放射性EMI
だけがこれを通過し、RF伝送路3を通つて減衰
器5へ入力する。 The preselector 4 has its pass band controlled by the command of the CPU 8 and limits the band of the radioactive EMI, so the radioactive EMI that falls within the pass band
Only the signal passes through this and is input to the attenuator 5 through the RF transmission line 3.
上記減衰器5は上記放射性EMIの強度を適度
の値に調節して受信機6に過大な上記放射性
EMIが入力しないようにするものでcpu8により
その減衰値が制御される。 The attenuator 5 adjusts the intensity of the radiated EMI to an appropriate value and transmits the excessive radiated EMI to the receiver 6.
It prevents EMI from being input, and its attenuation value is controlled by the CPU 8.
そして、上記減衰器5を通過した上記放射性
EMIはRF伝送路3を通つて受信機6へ入力する。 Then, the radioactivity that has passed through the attenuator 5 is
EMI is input to the receiver 6 through the RF transmission line 3.
受信機6はcpu8の命令に従つて上記放射性
EMIの強度を周波数スペクトラムの形で計測す
る。この計測値は入出力インタフエース7経由
cpu8にとりこまれ、ここで上記受信アンテナ2
の利得、RF伝送路3の損失などを補正する処理
がなされ、工学単位に変換されて記憶装置9に記
憶される。そしてまた出力表示装置10に所定の
形式で表示される。 The receiver 6 transmits the radioactive material according to the instructions of the CPU 8.
Measures the intensity of EMI in the form of a frequency spectrum. This measured value is sent via input/output interface 7.
It is taken into cpu8, and here the above receiving antenna 2
Processing is performed to correct the gain of the RF transmission line 3, the loss of the RF transmission line 3, etc., and the converted data is converted into engineering units and stored in the storage device 9. Then, it is displayed again on the output display device 10 in a predetermined format.
この様な動作をするから上記供試体1が発する
上記放射性EMIの強度を自動的にかつ迅速に試
験することができる。 Because of this operation, the intensity of the radioactive EMI emitted by the specimen 1 can be automatically and quickly tested.
しかしながら上記放射性EMIの試験において
適用される規格は第2図に示されるようなもので
あつて、放射性EMI規格Sは、S1やS2のように
非常に低いレベルで設定されることが多い。 However, the standards applied in the above radioactive EMI test are as shown in Figure 2, and the radioactive EMI standard S is often set at a very low level such as S 1 or S 2 . .
上記S1やS2は上記供試体1が組みこまれるシス
テムの中に、例えば高感度の受信系がある場合、
これに干渉を与えないよう、その受信中心周波数
近辺で放射性EMIを低く抑える必要があるため
に設定されたものである。 The above S 1 and S 2 are set when the system in which the above specimen 1 is installed includes, for example, a highly sensitive receiving system.
This setting was made because it is necessary to keep the radiated EMI low near the receiving center frequency so as not to interfere with this.
したがつて上記S1やS2は極めて低い強度とな
り、受信系のスレツシホールドレベルTよりさら
に低い場合が多い。 Therefore, the intensity of S 1 and S 2 is extremely low, and is often even lower than the threshold level T of the receiving system.
このようなとき上記S1やS2の指示する周波数範
囲では上記放射性EMIの計測が不可能となる欠
点があつた。 In such a case, there was a drawback that the radioactive EMI could not be measured in the frequency range indicated by S1 or S2 .
さらに、上記放射性EMIの強度が低く上記T
近辺であるとき受信機6の内部雑音など測定系の
雑音により上記放射性EMIの計測値に大きな誤
差を与えるという欠点もあつた。 Furthermore, the intensity of the radioactive EMI is low and the T
There is also a drawback that when the radiated EMI is in the vicinity, noise in the measurement system such as internal noise of the receiver 6 causes a large error in the measured value of the radiated EMI.
このような欠点は放射性EMI計測において致
命的な問題であり、これを解決するEMI試験装
置が望まれていた。 These drawbacks are a fatal problem in radioactive EMI measurement, and an EMI test device that solves this problem has been desired.
この発明はこのような問題を解決するためにな
されたもので以下、図を用いてこの発明を詳述す
る。 This invention was made to solve such problems, and will be described in detail below with reference to the drawings.
第3図はこの発明の一実施例の構成ブロツク
図、第4図は処理の流れを示す流れ図である。図
中1から12は第1図と同じもの、13,14,
15はRF伝送路3の接続をcpu8の命令によつ
て切換える機能を備えた切換器、16は上記切換
器13に接続され、既知の漂準雑音をcpu8の制
御によつて発生する較正装置、17は上記切換器
14と15の間に挿入され上記放射性EMIの増
幅を行う増幅器、18は上記増幅器17に接続さ
れ、cpu8の制御によつて上記増幅器17の電源
投入、遮断を行う電源制御装置である。 FIG. 3 is a block diagram of the configuration of an embodiment of the present invention, and FIG. 4 is a flowchart showing the flow of processing. In the figure, 1 to 12 are the same as in Figure 1, 13, 14,
15 is a switching device having a function of switching the connection of the RF transmission line 3 according to a command from the CPU 8; 16 is a calibration device that is connected to the switching device 13 and generates known drifting noise under the control of the CPU 8; 17 is an amplifier inserted between the switching devices 14 and 15 to amplify the radioactive EMI; 18 is a power supply control device connected to the amplifier 17 to turn on and off the power to the amplifier 17 under control of the CPU 8; It is.
次にこの発明の動作を第3図及び第4図を用い
て説明する。 Next, the operation of the present invention will be explained using FIGS. 3 and 4.
記憶装置9に処理プログラムを予じめ記憶させ
ておくが、この処理プログラムによつてcpu8が
動き出す前に第4図Aで供試体1や受信アンテナ
2を所定の位置にセツトアツプする。次いでcpu
8が動き出したとき第4図Bで、試験周波数帯
域、受信アンテナ2の種類、規格の種類及び初期
較正の要否などの試験条件が入力装置11から入
力され、入出力インタフエース7経由、cpu8へ
送られ記憶装置9に記憶される。 A processing program is stored in advance in the storage device 9, and before the CPU 8 starts operating according to the processing program, the specimen 1 and the receiving antenna 2 are set up at predetermined positions as shown in FIG. 4A. then cpu
8 begins to move, in FIG. 4B, test conditions such as the test frequency band, the type of receiving antenna 2, the type of standard, and the necessity of initial calibration are input from the input device 11, and the CPU 8 and stored in the storage device 9.
次に第4図Cで切換器13,14,15、プリ
セレクタ4、減衰器5、受信機6、較正装置16
及び電源制御装置18の初期設定を行う。すなわ
ち上記各構成要素、プリセレクタ4、減衰器5、
受信機6、切換器13,14,15、較正装置1
6及び電源制御装置18をcpu8の命令待ち受け
状態に設定し、かつ減衰器5は最大減衰を与える
ように設定させるなどの動作がcpu8によつて行
われる。 Next, in FIG.
and performs initial settings of the power supply control device 18. That is, each of the above components, the preselector 4, the attenuator 5,
Receiver 6, switching devices 13, 14, 15, calibration device 1
The CPU 8 performs operations such as setting the CPU 6 and the power supply control device 18 to a standby state for commands from the CPU 8, and setting the attenuator 5 to provide maximum attenuation.
次に第4図Dでcpu8によつて較正動作の要否
が判断される。ここでの判断とは前述した初期較
正の要否に関する入力情報に従つて行われるもの
で、初期較正を要するときは直ちにEへ進む、上
記初期較正が不要のときは直ちに第4図Hへ移
る。 Next, in FIG. 4D, the CPU 8 determines whether or not a calibration operation is necessary. The judgment here is made according to the input information regarding the necessity of initial calibration as described above. If initial calibration is required, proceed to E immediately; if the above-mentioned initial calibration is not required, proceed immediately to H of Figure 4. .
次に第4図Eでcpu8によつて較正セツトアツ
プが行われる。ここでは切換器13をcpu8の命
令により駆動し、較正装置16が発生する標準雑
音をプリセレクタ4へ入力するよう接続が行われ
ると共に上記較正装置16からは較正を行うべき
周波数帯の標準雑音が出力される。 Next, in FIG. 4E, a calibration setup is performed by the CPU 8. Here, the switching device 13 is driven by a command from the CPU 8, and connection is made so that the standard noise generated by the calibration device 16 is input to the preselector 4, and the standard noise of the frequency band to be calibrated is output from the calibration device 16. Output.
次に第4図Fで、上記標準雑音を増幅器17で
増幅した後、減衰器5を通して受信機6に入力
し、上記標準雑音を計測する。ここで用いられる
標準雑音は予じめ較正されているので上記標準雑
音の計測により受信機6の受信精度が把握され
る。さらに上記標準雑音の計測において、標準雑
音の強度を2段階に切換えたときの受信機6の受
信強度をcpu8によつて読みとり所定の演算を行
うことで、プリセレクタ4増幅器17、及び受信
機6の内部雑音強度値を取得する。そして上記標
準雑音の計測値と内部雑音強度値とを記憶装置9
に記憶する。 Next, in FIG. 4F, after the standard noise is amplified by the amplifier 17, it is input to the receiver 6 through the attenuator 5, and the standard noise is measured. Since the standard noise used here is calibrated in advance, the reception accuracy of the receiver 6 can be grasped by measuring the standard noise. Furthermore, in the measurement of the standard noise, the CPU 8 reads the reception strength of the receiver 6 when the strength of the standard noise is switched to two levels, and performs a predetermined calculation, so that the preselector 4 amplifier 17 and the receiver 6 Obtain the internal noise strength value of Then, the measured value of the standard noise and the internal noise intensity value are stored in a storage device 9.
to be memorized.
次に第4図Gで、cpu8が較正動作の終了を判
断し、終了していない場合はFへ戻つて較正動作
を継続し終了の場合は第4図Hへ進む。 Next, in FIG. 4G, the CPU 8 determines whether the calibration operation has ended, and if it has not ended, the process returns to F to continue the calibration operation, and if it has ended, the process advances to FIG. 4H.
Hでは、cpu8の命令により所定の受信アンテ
ナ2を切換器13経由プリセレクタ4へ接続し、
所定の増幅器17へ切換器14経由接続し、減衰
器5へ切換器15経由接続し、上記放射性EMI
受信機6で計測されるよう上記各構成要素の接続
を行う。 In H, a predetermined receiving antenna 2 is connected to the preselector 4 via the switch 13 according to a command from the CPU 8,
Connected to a predetermined amplifier 17 via a switch 14, connected to an attenuator 5 via a switch 15, and
The above components are connected so that the receiver 6 can measure them.
次に第4図Iで供試体1から放射される放射性
EMIの計測を行う。ここではcpu8が受信機6に
命令を与え、所定の周波数範囲で受信機6の受信
周波数を所定分解能で連続的に掃引させることで
行われる。この結果、上記放射性EMIの強度周
波数スペクトラム計測値を得、記憶装置9に記憶
する。そして上記強度周波数スペクトラムの計測
を受信機6が行つている間に、cpu8は第4図J
で較正動作に入るタイミングをモニタし、計測を
開始してから所定の時間が経過したとき、あるい
は受信アンテナ2の切換を行つたときなどの事象
が発生した場合Iに割込みを発生してEへ飛び、
ここで上述の較正動作を行う。さらにcpu8は上
記強度スペクトラムの計測を行つている間に第4
図Kで上記内部雑音計測値からスレツシホールド
レベルTの計算を行い、例えば第2図のS1やS2の
領域において受信機6の感度が不足と判断された
とき、増幅器17を駆動するため電源制御装置1
8をcpu8の命令で駆動し、増幅器17に電源を
供給してこれを動作させる。これと同時にcpu8
は切換器14と15に命令を与え、増幅器17を
プリセレクタ4と減衰器5の間に挿入し、放射性
EMIを増幅する。 Next, in Figure 4 I, the radioactivity emitted from specimen 1
Measure EMI. Here, the CPU 8 gives a command to the receiver 6 to continuously sweep the reception frequency of the receiver 6 within a predetermined frequency range with a predetermined resolution. As a result, the measured value of the intensity frequency spectrum of the radioactive EMI is obtained and stored in the storage device 9. While the receiver 6 is measuring the above-mentioned intensity frequency spectrum, the CPU 8 is
monitors the timing to enter the calibration operation, and if an event occurs such as when a predetermined time has elapsed after the start of measurement or when switching the receiving antenna 2, an interrupt is generated to I and the process returns to E. Fly,
Here, the above-mentioned calibration operation is performed. Furthermore, while measuring the above intensity spectrum, cpu 8
In Figure K, the threshold level T is calculated from the above internal noise measurement value, and when it is determined that the sensitivity of the receiver 6 is insufficient, for example in the area S1 or S2 in Figure 2, the amplifier 17 is driven. Power supply control device 1
8 is driven by instructions from the CPU 8, and power is supplied to the amplifier 17 to operate it. At the same time, cpu8
gives a command to the switchers 14 and 15, inserts the amplifier 17 between the preselector 4 and the attenuator 5, and
Amplify EMI.
また、上記放射性EMIの強度が増幅器17の
線形動作領域を超えるほど強い場合は、cpu8の
命令により増幅器17の電源を電源制御装置18
が遮断し切換器14と15が動作して増幅器17
を取り外し替りにRF伝送路3を挿入する。この
様にして所要の受信感度で上記強度周波数スペク
トラムを計測し、かつ増幅器17の非線形動作に
起因する不要波の発生を防止することができる。 In addition, if the intensity of the radioactive EMI is so strong that it exceeds the linear operating region of the amplifier 17, the power supply control device 18 controls the power supply of the amplifier 17 according to a command from the CPU 8.
is cut off, switchers 14 and 15 operate, and amplifier 17
Remove it and insert RF transmission line 3 in its place. In this way, it is possible to measure the intensity frequency spectrum with the required receiving sensitivity and to prevent the generation of unnecessary waves due to the nonlinear operation of the amplifier 17.
次にLで、cpu8は上記強度スペクトラムの計
測が終了したかどうかを判断し、終了の場合はM
へ移り、ここで上記強度スペクトラムの計測値、
上記内部雑音強度値及び上記標準雑音の計測値を
記憶装置9から取り出し処理プログラム所定の補
正処理を行う。 Next, at L, cpu8 determines whether the measurement of the above intensity spectrum has been completed, and if it has been completed, M
Now, the measured value of the above intensity spectrum,
The internal noise intensity value and the measured value of the standard noise are retrieved from the storage device 9 and subjected to correction processing prescribed by the processing program.
次にNで上記補正処理の結果を出力表示装置1
0に出力表示する。 Next, output the result of the above correction processing with N to the display device 1.
Output and display on 0.
以上説明したようにこの発明によれば増幅器1
7を受信機6の前段に挿入し、かつ上記増幅器1
7の非線形動作を防ぎ、かつ上記増幅器17など
の内部雑音を補正し、かつ較正動作を必要に応じ
て行うから、受信系のスレツシホールドレベルT
より低いレベル放射性干渉雑音を計測することが
可能となるばかりでなく、上記計測の精度を著し
く高めることができるという利点が生ずる。 As explained above, according to the present invention, the amplifier 1
7 is inserted before the receiver 6, and the amplifier 1
7, corrects internal noise of the amplifier 17, etc., and performs a calibration operation as necessary, so the reception system threshold level T
The advantage arises that not only is it possible to measure lower level radiated interference noise, but also that the accuracy of said measurement can be significantly increased.
さらに、上記較正動作や上記増幅器の接続、取
外し動作が自動的に行われるためEMI試験を省
力化しかつ高速化するという利点も生ずる。 Furthermore, since the above-mentioned calibration operation and the above-mentioned amplifier connection/disconnection operation are automatically performed, there is an advantage that the EMI test is labor-saving and speedy.
なお、ここでは放射性EMIについてのみ説明
したが伝導正EMIについても同様である。 Note that although only radioactive EMI has been described here, the same applies to conductive positive EMI.
また、上述の実施例では各構成要素を一つずつ
分離した形で示したが、いくつかの構成要素を一
つにまとめて前記した各構成要素の機能を持たせ
ることができるなど装置の構成についてはこの発
明の要旨とする点を逸脱しない範囲において各種
の変形がある。 In addition, in the above embodiment, each component was shown as being separated one by one, but it is possible to combine several components into one and provide the functions of each of the components described above. Various modifications may be made without departing from the gist of the present invention.
第1図は従来の干渉雑音試験装置の構成ブロツ
ク図、第2図は干渉雑音試験規格の一例を示す
図、第3図はこの発明の一実施例の構成ブロツク
図、第4図はこの発明による処理の流れを示す流
れ図である。
図中1は供試体、2は受信アンテナ、3は高周
波伝送路、4はプリセレクタ、5は減衰器、6は
受信機、7は入出力インタフエース、8は中央処
理装置、9は記憶装置、10は出力表示装置、1
1は入力装置、12はインタフエースバスケーブ
ル、13は切換器、14は切換器、15は切換
器、16は較正装置、17は増幅器、18は電源
制御装置である。なお図中同一または相当部分に
は同一符号を付して示してある。
Fig. 1 is a block diagram of a conventional interference noise test device, Fig. 2 is a diagram showing an example of an interference noise test standard, Fig. 3 is a block diagram of an embodiment of the present invention, and Fig. 4 is a block diagram of the present invention. 2 is a flowchart showing the flow of processing by. In the figure, 1 is a specimen, 2 is a receiving antenna, 3 is a high-frequency transmission line, 4 is a preselector, 5 is an attenuator, 6 is a receiver, 7 is an input/output interface, 8 is a central processing unit, and 9 is a storage device , 10 is an output display device, 1
1 is an input device, 12 is an interface bus cable, 13 is a switch, 14 is a switch, 15 is a switch, 16 is a calibration device, 17 is an amplifier, and 18 is a power supply control device. In the drawings, the same or corresponding parts are designated by the same reference numerals.
Claims (1)
出器と、上記検出器によつて検出された上記干渉
雑音を帯域制限するプリセレクタと、上記プリセ
レクタにより帯域制限された上記干渉雑音の強度
を計測する受信機とを備え上記干渉雑音の強度を
計測する干渉雑音試験装置において、上記検出器
と上記プリセレクタとの間に接続された切換器
と、上記切換器に接続され、上記切換器経由上記
プリセレクタに入力する標準雑音を発生する較正
装置と、上記プリセレクタと上記受信機との間に
接続され上記帯域制限された干渉雑音を増幅する
増幅器と、上記増幅器に接続され上記増幅器の電
源を制御する電源制御装置と、上記増幅器の入力
側と出力側に接続され、上記プリセレクタと上記
受信機との間で上記増幅器を接続し、あるいは上
記増幅器の接続をはずして上記増幅器のかわりに
高周波伝送路を挿入する切換器と、上記干渉雑音
を処理するに必要なプログラム、試験条件及び上
記受信機で計測された上記干渉雑音の計測値を記
憶する記憶装置と、上記記憶装置との間で情報の
授受を行うと共に、上記切換器と、上記プリセレ
クタ、上記受信機、上記較正装置及び上記電源制
御装置を制御し、上記受信機から得られる上記干
渉雑音の計測値を収集し、上記計測値を基に所定
の処理を行う中央処理装置と、上記計測値の処理
結果を出力表示する出力表示装置と、上記試験条
件を入力する入力装置とを備え、上記試験条件に
従い、上記検出器を上記切換器で切換えるたびに
上記較正装置から送出される標準雑音を上記プリ
セレクタと上記増幅器経由上記受信機へ入力し、
上記標準雑音を計測し、もつて上記検出器と上記
プリセレクタと上記増幅器とから成る受信系の内
部雑音を計測し、さらに上記受信系の計測精度値
を求め、これら内部雑音の計測値と計測精度値と
を用いて上記干渉雑音強度の計測値の補正を行
い、さらに上記増幅器に入力する上記干渉雑音に
よつて上記増幅器が非線形動作をするとき上記増
幅器を上記プリセレクタと上記受信機との間で接
続を切りかえ上記高周波伝送路を挿入することを
上記中央処理装置によつて行うことを特徴とする
干渉雑音試験装置。1. A detector that detects interference noise generated from electronic equipment, a preselector that band-limits the interference noise detected by the detector, and measures the intensity of the interference noise band-limited by the preselector. An interference noise test device for measuring the intensity of the interference noise, comprising: a switch connected between the detector and the preselector; a calibration device that generates standard noise input to the preselector; an amplifier connected between the preselector and the receiver to amplify the band-limited interference noise; and a calibration device connected to the amplifier to supply power to the amplifier. A power supply control device to be controlled is connected to the input side and output side of the amplifier, and the amplifier is connected between the preselector and the receiver, or the amplifier is disconnected and a high frequency between a switching device for inserting a transmission line, a storage device for storing programs necessary for processing the interference noise, test conditions, and measurement values of the interference noise measured by the receiver; and the storage device; In addition to exchanging information, it also controls the switching device, the preselector, the receiver, the calibration device, and the power supply control device, collects the measured value of the interference noise obtained from the receiver, and performs the measurement. A central processing unit that performs predetermined processing based on the values, an output display device that outputs and displays the processing results of the measured values, and an input device that inputs the test conditions, and operates the detector according to the test conditions. inputting the standard noise sent from the calibration device to the receiver via the preselector and the amplifier each time the switch switches;
The above standard noise is measured, and the internal noise of the receiving system consisting of the above detector, the above preselector, and the above amplifier is measured. Furthermore, the measurement accuracy value of the above receiving system is determined, and the measured value of these internal noises and the measured value are measured. The measurement value of the interference noise intensity is corrected using the accuracy value, and when the amplifier performs nonlinear operation due to the interference noise input to the amplifier, the amplifier is adjusted between the preselector and the receiver. An interference noise testing device characterized in that the central processing unit switches the connection between the two and inserts the high frequency transmission line.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57122613A JPS5913963A (en) | 1982-07-14 | 1982-07-14 | Tester for interference noise |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57122613A JPS5913963A (en) | 1982-07-14 | 1982-07-14 | Tester for interference noise |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5913963A JPS5913963A (en) | 1984-01-24 |
JPH0330831B2 true JPH0330831B2 (en) | 1991-05-01 |
Family
ID=14840278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57122613A Granted JPS5913963A (en) | 1982-07-14 | 1982-07-14 | Tester for interference noise |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5913963A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60158741A (en) * | 1984-01-30 | 1985-08-20 | Yokogawa Hokushin Electric Corp | Optical data way |
JP4526643B2 (en) * | 2000-03-17 | 2010-08-18 | 三菱電機株式会社 | Radiation noise measurement data display method, radiation noise measurement system, and radiation noise measurement program storage medium |
-
1982
- 1982-07-14 JP JP57122613A patent/JPS5913963A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5913963A (en) | 1984-01-24 |
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