JPH0325143U

JPH0325143U -

Info

Publication number: JPH0325143U
Application number: JP8631189U
Authority: JP
Priority date: 1989-07-21
Filing date: 1989-07-21
Publication date: 1991-03-14

Description

[Brief explanation of the drawing]

第１図は、本考案の第１実施例に係るＡＴＲ法
による赤外線吸収強度測定装置の構成図である。
第２図は、本考案の第２実施例に係るＡＴＲ法に
よる赤外線吸収強度測定装置の構成図である。第
３図は、本考案の第３実施例に係るＲＡＳ法によ
るマイクロ高感度反射測定装置の構成図である。
第４図〜第６図は、従来技術を説明するための図
で、第４図は、従来のＡＴＲ法による赤外線吸収
強度測定装置の構成図、第５図は、従来のＡＴＲ
法による赤外線吸収強度測定装置の構成図、第６
図は、ＡＴＲ法による赤外線吸収強度測定装置に
おける問題点を説明するための図である。１……光源、２……検出器、７……光学媒体、
８……試料、９……偏光子、１４，１５，１６，
１８，１９……導光路。 FIG. 1 is a configuration diagram of an infrared absorption intensity measuring device using the ATR method according to a first embodiment of the present invention.
FIG. 2 is a configuration diagram of an infrared absorption intensity measuring device using the ATR method according to a second embodiment of the present invention. FIG. 3 is a configuration diagram of a micro high-sensitivity reflection measuring device using the RAS method according to the third embodiment of the present invention.
Figures 4 to 6 are diagrams for explaining the prior art. Figure 4 is a configuration diagram of an infrared absorption intensity measuring device using the conventional ATR method, and Figure 5 is a diagram for explaining the conventional ATR method.
Block diagram of the infrared absorption intensity measuring device according to the method, No. 6
The figure is a diagram for explaining problems in an infrared absorption intensity measuring device using the ATR method. 1... Light source, 2... Detector, 7... Optical medium,
8... Sample, 9... Polarizer, 14, 15, 16,
18, 19...Light guide path.

Claims

[Claims for Utility Model Registration] (1) A sample and an optical medium are provided so as to be in contact with each other in an optical path formed between a light source that emits infrared rays and a detector, and the infrared rays incident on the optical medium are In a sample analyzer using infrared irradiation, a sample analysis device using infrared irradiation is configured to analyze a component to be measured in a sample based on the intensity of infrared absorption absorbed by the component to be measured contained in the sample at the contact surface when totally reflected at the contact surface with the sample. 1. A sample analysis device using infrared irradiation, characterized in that a light guide path for passing infrared rays is provided on a side where infrared rays are introduced into an optical medium and on a side where infrared rays are taken out from the optical medium. (2) A sample and an optical medium are provided so as to be in contact with each other in an optical path formed between a light source that emits infrared rays and a detector, and the infrared rays incident on the optical medium are totally reflected at the contact surface with the sample. In the sample analysis device using infrared irradiation, which analyzes a component to be measured in a sample based on the intensity of infrared absorption absorbed by the component to be measured contained in the sample at the contact surface, the infrared rays are introduced into the optical medium. A sample analysis device using infrared irradiation, characterized in that it has a derivation function. (3) A sample is placed in the optical path formed between a light source that emits infrared rays and a detector. In a sample analyzer using infrared irradiation for analyzing components to be measured in the sample, a light guide path for passing infrared rays is provided on the infrared rays introduction side to the polarizer and the infrared rays reflected on the surface of the sample, respectively. A sample analysis device using infrared irradiation, characterized by the following: