JPH03226680A - Rf evaluation jig - Google Patents
Rf evaluation jigInfo
- Publication number
- JPH03226680A JPH03226680A JP2022750A JP2275090A JPH03226680A JP H03226680 A JPH03226680 A JP H03226680A JP 2022750 A JP2022750 A JP 2022750A JP 2275090 A JP2275090 A JP 2275090A JP H03226680 A JPH03226680 A JP H03226680A
- Authority
- JP
- Japan
- Prior art keywords
- microstrip line
- jig
- evaluation
- needle wire
- connector needle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
〔産業上の利用分野]
この発明は、fjえば数十MHz Id上、C帯(約5
GHz )あるいはX帯(約10GHz)に至るまでの
高周波帯で動作する半導体装置の烏周波特性の測定用治
具(以下RF評価治具という)に関るものである。
〔従来の技術〕
第6図は従来の高周波帯ICチップのRF評価治具を示
す斜視図、第7図ないし第9図は第6図のRF評価治具
に評価用ICパッケージを装着した状況を示す側面図で
、第7図はRF秤価治具が電気的に未接続の状態、第8
図はRF秤価治具を電気的に接続した状態、第9図はコ
ネクタ針線に曲りを生じた状態を示す。図において、山
はICチップ、(2)は誘電体基板、(3目zマイクロ
ストリツプライン、(4)は治具側板、(5)は同軸コ
ネクタ、(6)はコネクタ針線、(7)は同軸ケーブル
、181は治具ステージ、(9)は評価用ICパッケー
ジ、(13はねじである。
次に動作について説明する。評価用ICパッケージ(9
)のRF評価を行う際には治具ステージ(8)に評価用
ICパッケージ(9)を固定し、第8図に示すように治
具側板(4(を下刃に移動させ、コネクタ針線(63ヲ
マイクロストリップライン(31に接触させた状態でね
じα3を用いて治具側板(41を固定し、RF評価を行
っていた。[Industrial Application Field] This invention is applicable to fj, for example, several tens of MHz, Id, and C band (approximately 5 MHz).
The present invention relates to a jig (hereinafter referred to as an RF evaluation jig) for measuring the parasitic frequency characteristics of a semiconductor device that operates in a high frequency band up to the X band (about 10 GHz) or the X band (approximately 10 GHz). [Prior art] Fig. 6 is a perspective view showing a conventional RF evaluation jig for high-frequency band IC chips, and Figs. 7 to 9 show situations in which an evaluation IC package is mounted on the RF evaluation jig shown in Fig. 6. Figure 7 is a side view showing the RF weighing jig is electrically disconnected, and Figure 8 is a side view showing the RF weighing jig.
The figure shows a state in which the RF weighing jig is electrically connected, and FIG. 9 shows a state in which the connector needle wire is bent. In the figure, the crests are IC chips, (2) are dielectric substrates, (3) are microstrip lines, (4) are jig side plates, (5) are coaxial connectors, (6) are connector wires, (7) is a coaxial cable, 181 is a jig stage, (9) is an evaluation IC package, and (13 is a screw.) Next, the operation will be explained.Evaluation IC package (9)
), fix the evaluation IC package (9) on the jig stage (8), move the jig side plate (4) to the lower blade, and connect the connector needle line ( 63 was in contact with the microstrip line (31) and the jig side plate (41) was fixed using screw α3, and RF evaluation was performed.
【発明が留決しようとする課題]
従来のRF評価治具は以上のようKll成されているの
で、コネクタ針線をマイクロストリップラインに接触さ
せる際に第9図に示すようにコネクタ針線か破損し%<
、RFN価治具の耐久性が不充分という問題点があった
。
この発明は、上記のような問題点を解消するためになさ
れたもので、耐久性に優れ、再現性よくコネクタ針線か
コンタクトするRF評価治具を碍る事を目的とする。
〔課題を解決するための手段]
この発明に係るRF評価治具は治具側板に上下逆のマイ
クロストリップラインを設け、これとコネクタ針線とを
ハンダ材等を用いて接続し、上記逆マイクロストリップ
ラインとICチップ側のマイクロストリップラインとの
接続部分を”J動にしたものである。
〔作 用]
この発明におけるRF評価治具は、治具側板側の逆マイ
クロストリップラインを介してICチップ側のマイクロ
ストリップラインとコネクタ針線を接続するため、耐久
性に優れ、再現性よくコンタクトするRF評価治具か碍
られる。
〔実施例〕
以下、この発明の一実施例を図について説明する。
第1図は、RF評価治具を示す斜視図、第2図は第1図
において治具ステージ及び評価用ICパッケージを取外
した状態を示す斜視図、第3図及び第4図は第1図のR
F評価治具に評価用ICパッケージを装着した状況を示
す側面図で、第3図i! RF評価治具か電気的に未接
続の状態、第4図はRF評価治具を電気的に接続した状
態を示す。
第5図にこの発明の他の実施例によるRF評価冶具を示
す側面図である。図において(11〜(9)、Q31
i;!第6図及び第7図の従来V」に示したものと同等
であるので説明を省略する。dzは逆マイクロストリッ
プライン、t]DI +;x逆マイクロストリップライ
ンt121用接地金属、CIl+は誘導体の支持板であ
る。コネクタ針線(6)と逆マイクロストリップライン
t12とは、ハンダ材その他を用いて・接続されている
。
次に作用について説明する。RF評価を行うに(ば、治
具ステージ(8)に評他用ICパッケージ(9)を固定
し、第4図に示すように治具側板(4)を下方に移動さ
せてマイクロストリップライン(3)と逆マイクロスト
リップラインσ2を接触させた状態で、ねじ113を用
いて治具側板(4)を固定する。コネクタ針線+61
i;!支持板Gllによって支持されており、また直接
、マイクロストリップライン(3)と接触しないため、
過大な力が加わっても破損は生じない。
なお、上記実N例ではコネクタ針線(6)か支持板口υ
の内部に位置しているものを示したが、第5図に示すよ
うに誘電体基板(2)の内部に位置してもよく、上記実
施V】と同様の効果を有する。
〔発明の効果]
以上のように、この発明によれば、治具側板に上下逆の
逆マイクロストリップラインを設け、これとコネクタ針
線とをハンダ材等を用いて接続し、上記マイクロストリ
ップラインとICチップ側のマイクロストリップライン
との接続部分をoT@にしたので、耐久性に優れ、再現
性よくコネクタ針線かコンタクトするR1’評価治具か
得られる効果がある。[Problems to be solved by the invention] Since the conventional RF evaluation jig is constructed as described above, when the connector needle wire is brought into contact with the microstrip line, the connector needle wire may be damaged as shown in FIG. %<
However, there was a problem in that the durability of the RFN value jig was insufficient. This invention was made to solve the above-mentioned problems, and aims to provide an RF evaluation jig that has excellent durability and can contact a connector needle wire with good reproducibility. [Means for Solving the Problems] The RF evaluation jig according to the present invention provides an upside-down microstrip line on the side plate of the jig, connects this to a connector wire using solder material, etc., and forms the above-mentioned inverted microstrip. The connection part between the line and the microstrip line on the IC chip side is made into a "J-motion". In order to connect the side microstrip line and the connector needle wire, an RF evaluation jig with excellent durability and good reproducibility of contact can be created. [Example] An example of the present invention will be described below with reference to the drawings. Figure 1 is a perspective view showing the RF evaluation jig, Figure 2 is a perspective view of Figure 1 with the jig stage and evaluation IC package removed, and Figures 3 and 4 are the same as in Figure 1. R
Figure 3 i! is a side view showing the situation where the evaluation IC package is attached to the F evaluation jig. FIG. 4 shows a state in which the RF evaluation jig is electrically disconnected, and a state in which the RF evaluation jig is electrically connected. FIG. 5 is a side view showing an RF evaluation jig according to another embodiment of the present invention. In the figure (11-(9), Q31
i;! Since this is the same as that shown in "Conventional V" in FIGS. 6 and 7, the explanation will be omitted. dz is a reverse microstrip line, t]DI +; The connector needle wire (6) and the reverse microstrip line t12 are connected using solder material or the like. Next, the effect will be explained. To perform RF evaluation (for example, fix the evaluation IC package (9) on the jig stage (8), move the jig side plate (4) downward as shown in Figure 4, and place the microstrip line ( 3) and the reverse microstrip line σ2, fix the jig side plate (4) using the screws 113. Connector needle wire +61
i;! Because it is supported by the support plate Gll and does not come into direct contact with the microstrip line (3),
No damage will occur even if excessive force is applied. In addition, in the above example N, the connector needle wire (6) or the support plate opening υ
Although shown as being located inside the dielectric substrate (2), as shown in FIG. [Effects of the Invention] As described above, according to the present invention, an upside-down inverted microstrip line is provided on the side plate of the jig, and this and the connector needle wire are connected using a solder material or the like, and the above-mentioned microstrip line and Since the connection part with the microstrip line on the IC chip side is made OT@, it has the effect of providing an R1' evaluation jig that has excellent durability and makes contact with the connector needle wire with good reproducibility.
第1図は、この発明の一実施例によるRF評価治具を示
す斜視図、第2図に第1図において治具ステージ及び評
価用ICパッケージを取外した状態を示す斜視図、第3
図及び第4図は第1図のRF評価治具に評価用ICパッ
ケージを装着した状況を示す側面図で、第3図はRF評
価治具か電気的に未接続の状態、第4図はRF評価治具
を電気的に接続した状態を示す。第5図にこの発明の他
の実施例によるRF評価治具を示す側面図、第6図は従
来のRF評価治具を示す斜視図、第7図ないし第9図は
第6図のRF評価治具に評価用ICパッケージを装着し
た状況を示す側面図で、第7図はRF評価治具か電気的
に未接続の状態、第8図はRF治具を電気的に接続した
状態、第9図はコネクタ針線に曲りを生じた状態を示す
。
図において、(1)はICチップ、+2) f2誘電体
基板、(3)ハマイクロストリップライン、(4)は治
具側板、(5日は同軸コネクタ、(6)はコネクタ針線
、+7112同軸ケーブル、(8;は治具ステージ、(
9)は評価用ICパッケージ、tlGは逆マイクロスト
リップライン用接地金属、anは支持板、■は逆マイク
ロストリップラインである。
なお、図中、同一符号は同一、又1;柑当部分を示す。FIG. 1 is a perspective view showing an RF evaluation jig according to an embodiment of the present invention, FIG. 2 is a perspective view showing the state in which the jig stage and evaluation IC package are removed in FIG.
Figures 4 and 4 are side views showing the condition in which the evaluation IC package is mounted on the RF evaluation jig shown in Figure 1, Figure 3 shows the RF evaluation jig in a state where it is not electrically connected, and Figure 4 shows the condition where the RF evaluation jig is not electrically connected. This shows the state in which the RF evaluation jig is electrically connected. Fig. 5 is a side view showing an RF evaluation jig according to another embodiment of the present invention, Fig. 6 is a perspective view showing a conventional RF evaluation jig, and Figs. 7 to 9 are RF evaluation of Fig. 6. These are side views showing the state in which the evaluation IC package is mounted on the jig. Figure 7 shows the RF evaluation jig in a state where it is not electrically connected, Figure 8 shows the state in which the RF jig is electrically connected, and Figure 8 shows the state in which the RF evaluation jig is electrically connected. Figure 9 shows a state where the connector needle wire is bent. In the figure, (1) is an IC chip, +2) is an f2 dielectric substrate, (3) is a microstrip line, (4) is a jig side plate, (5 is a coaxial connector, (6) is a connector wire, and is a +7112 coaxial cable. , (8; is the jig stage, (
9) is an IC package for evaluation, tlG is a ground metal for an inverted microstrip line, an is a support plate, and ■ is an inverted microstrip line. In addition, in the figure, the same reference numerals are the same, and 1 indicates a part.
Claims (1)
するRF特性評価用治具において、治具側板に上下逆の
マイクロストリップラインを設け、これとコネクタ針線
とをハンダ材等を用いて接続し、上記逆マイクロストリ
ップラインとICチップ側のマイクロストリップライン
との接続部分を可動にした事を特徴とするRF評価治具
。In an RF characteristic evaluation jig that has a conversion part between a coaxial line and a microstrip line, an upside-down microstrip line is provided on the side plate of the jig, and this and the connector needle wire are connected using solder material, etc. An RF evaluation jig characterized by a movable connection part between the strip line and the microstrip line on the IC chip side.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2022750A JPH03226680A (en) | 1990-02-01 | 1990-02-01 | Rf evaluation jig |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2022750A JPH03226680A (en) | 1990-02-01 | 1990-02-01 | Rf evaluation jig |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03226680A true JPH03226680A (en) | 1991-10-07 |
Family
ID=12091368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022750A Pending JPH03226680A (en) | 1990-02-01 | 1990-02-01 | Rf evaluation jig |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03226680A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7688092B2 (en) | 2006-06-01 | 2010-03-30 | Advantest Corporation | Measuring board for electronic device test apparatus |
-
1990
- 1990-02-01 JP JP2022750A patent/JPH03226680A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7688092B2 (en) | 2006-06-01 | 2010-03-30 | Advantest Corporation | Measuring board for electronic device test apparatus |
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