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JPH03192800A - Component mounting recognition method for printed board - Google Patents

Component mounting recognition method for printed board

Info

Publication number
JPH03192800A
JPH03192800A JP1331688A JP33168889A JPH03192800A JP H03192800 A JPH03192800 A JP H03192800A JP 1331688 A JP1331688 A JP 1331688A JP 33168889 A JP33168889 A JP 33168889A JP H03192800 A JPH03192800 A JP H03192800A
Authority
JP
Japan
Prior art keywords
board
component
light
image
mounting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1331688A
Other languages
Japanese (ja)
Inventor
Yutaka Iwata
裕 岩田
Nobuaki Kakimori
伸明 柿森
Yuichi Yamamoto
裕一 山本
Makoto Kishimoto
真 岸本
Sachikuni Takahashi
高橋 祐邦
Toshihiro Harada
原田 登志太
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP1331688A priority Critical patent/JPH03192800A/en
Publication of JPH03192800A publication Critical patent/JPH03192800A/en
Pending legal-status Critical Current

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  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To realize an automatic mounting check through a simple lighting equipment, to reduce a product in cost, and to enable the mounting check device concerned to be easily maintained and controlled in quality by a method wherein the image of a board obliquely illuminated is picked up by a camera provided in a vertical direction, and the positional data of component electrodes are measured. CONSTITUTION:A board 10 is mounted on an X-Y table 20 and positioned so as to enable a check object to be located in the visual field of an image pick-up camera 40. In this case, the camera 40 is installed just above the board 10. The board 10 is obliquely illuminated by an oblique lighting device 30, the board is discriminated from the component electrode in the image data through a lightness difference between them basing on the light scattering characteristic difference between the board 10 and the component electrode, the positional data of the component electrode is measured, and a component is checked in mounting state. By this setup, an automatic mounting check of a component can be realized through a simple lighting equipment, a product can be reduced in cost, and the mounting check device concerned can be easily maintained and controlled in quality.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本願発明はプリント基板上に実装された部品の実装検査
に利用できる検査方法に関する。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to an inspection method that can be used for mounting inspection of components mounted on a printed circuit board.

〈従来の技術〉 プリント回路基板の製造工程では、プリント基板上に電
子部品を装着し、半田付けを行うことにより回路を構成
するが、部品の装着工程における誤装着などにより、部
品の欠落、位置ずれ等が発生し、結果として不良基板に
なることがある。
<Conventional technology> In the manufacturing process of printed circuit boards, electronic components are mounted on the printed circuit board and soldered to form circuits. Misalignment may occur, resulting in a defective board.

従来は、人間の目視による部品実装検査の他、自動実装
検査として、斜め方向よりスリット光を照射する光切断
方式や部品にレーザ光を照射し、反射光の量を測定する
方式等があった。
In the past, in addition to human visual inspection of component mounting, automated mounting inspection methods included a light cutting method that irradiated a slit light from an oblique direction, and a method that irradiated the component with laser light and measured the amount of reflected light. .

〈発明が解決しようとする課題〉 しかしながら、人間の目視による検査では、疲労による
検査精度の低下や品質管理が困難であり、又人件費によ
る製品へのコスト上昇などの問題がある。
<Problems to be Solved by the Invention> However, human visual inspection has problems such as reduced inspection accuracy due to fatigue, difficulty in quality control, and increased product costs due to labor costs.

自動検査において、スリット光を用いた光切断方式やレ
ーザ光による方式では、光学系部分に高価な部品を使用
することによるコスト上昇や、機構が複雑なため、調整
、保守が難しいという問題があった。
In automatic inspection, optical cutting methods using slit light and methods using laser light have problems such as increased costs due to the use of expensive parts in the optical system, and difficult adjustments and maintenance due to the complicated mechanism. Ta.

本発明は上記事情に鑑みて創案されたもので、前記スリ
ット光やレーザ光を使用することなく、筒型な照明設備
により、部品の自動実装検査が可能になり、製品コスト
の削減や装置の保守、品質管理が容易で精度の高い新規
なプリント基板の部品実装認識方法を提供することを目
的としている。
The present invention was devised in view of the above circumstances, and enables automatic component mounting inspection using cylindrical lighting equipment without using the slit light or laser light, thereby reducing product costs and equipment efficiency. The objective is to provide a new method for recognizing component mounting on printed circuit boards that is easy to maintain and control quality and has high accuracy.

〈課題を解決するための手段〉 本願発明に係る検査方法は、プリント基板上に実装され
た部品の実装状態を認識する方法であって、斜め方向よ
り照明された基板画像を基板面に対して垂直方向に設け
た撮像カメラにより撮像し、基板と部品電極の照明光の
拡散特性の差異により、撮像データ上の基板と部品電極
を明度の違いにより区別し、部品電極の位置データを測
定することにより部品の実装状態を検査することを特徴
としている。
<Means for Solving the Problems> The inspection method according to the present invention is a method for recognizing the mounting state of components mounted on a printed circuit board, and is a method for recognizing the mounting state of components mounted on a printed circuit board, in which a board image illuminated from an oblique direction is displayed on the board surface. An image is captured by an imaging camera installed vertically, and the substrate and component electrodes on the imaged data are distinguished by differences in brightness based on differences in the diffusion characteristics of illumination light between the substrate and component electrodes, and position data of the component electrodes is measured. It is characterized by inspecting the mounting state of components.

〈作用〉 基板10をX−Yテーブル20上に装着し、撮像カメラ
40の視野内に検査対象が位置するように位置決めする
。この場合、前記撮像カメラ40は基板10の真上方向
に設置する。
<Operation> The substrate 10 is mounted on the XY table 20 and positioned so that the inspection target is within the field of view of the imaging camera 40. In this case, the imaging camera 40 is installed directly above the substrate 10.

斜方照明30により、基板lOに対して斜方照明を行う
The oblique illumination 30 performs oblique illumination on the substrate IO.

基板10と部品電極の照明光の拡散特性の差異に基づい
て撮像データ上の基板と部品電極を明度の違いにより区
別し、部品電極の位置データを測定し、部品の実装状態
を検査する。
Based on the difference in the diffusion characteristics of illumination light between the substrate 10 and the component electrodes, the substrate and component electrodes on the imaged data are distinguished by the difference in brightness, the position data of the component electrodes is measured, and the mounting state of the component is inspected.

〈実施例〉 以下、図面を参照して本発明に係る一実施例を説明する
。第1図は本願発明を用いた検査装置の概略図である。
<Example> Hereinafter, an example according to the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram of an inspection apparatus using the present invention.

第1図において、10は検査対象である基板、20は基
板10を移動・位置決めするX−Yテーブル、30は基
板10に斜め横方向より均一の白色光を照射する斜方照
明、40は垂直方向上部より基板面を撮像する撮像カメ
ラ、50は撮像カメラ40により撮像した画像を処理す
る画像処理判定部である。
In FIG. 1, 10 is a substrate to be inspected, 20 is an X-Y table for moving and positioning the substrate 10, 30 is an oblique illumination illumination that irradiates the substrate 10 with uniform white light from diagonally horizontally, and 40 is vertically An imaging camera takes an image of the substrate surface from above in the direction, and 50 is an image processing determination unit that processes the image taken by the imaging camera 40.

第2図は基板と部品に対して斜め方向から光を照射する
場合の概略図である。第2図において、60は基板IO
の上に実装された例えば角チツプ部品である。
FIG. 2 is a schematic diagram when light is irradiated from an oblique direction onto a board and components. In FIG. 2, 60 is the board IO
For example, it is a square chip component mounted on top of a square chip.

第3図は第2図に示した基板を撮像カメラ40により撮
像した画像であり、70は基板上面に設けられたランド
である。
FIG. 3 is an image taken by the imaging camera 40 of the board shown in FIG. 2, and 70 is a land provided on the top surface of the board.

以下本願発明方法の手順について説明する。The procedure of the method of the present invention will be explained below.

■基板10をX−Yテーブル20上に装着し、撮像カメ
ラ40の視野内に検査対象が位置するように位置決めす
る。この場合、前記撮像カメラ40は基板10の真上方
向に設置する。
(2) Mount the substrate 10 on the XY table 20 and position it so that the object to be inspected is within the field of view of the imaging camera 40. In this case, the imaging camera 40 is installed directly above the substrate 10.

■斜方照明30により、基板10に対して斜方照明を行
う。
(2) The substrate 10 is illuminated obliquely by the oblique illumination 30.

■基板10と部品電極の照明光の拡散特性の差異に基づ
いて撮像データ上の基板と部品電極を明度の違いにより
区別し、部品電極の位置データを測定し、部品の実装状
態を検査する。
(2) Distinguish the board and component electrodes on the image data based on the difference in brightness based on the difference in the diffusion characteristics of illumination light between the board 10 and the component electrodes, measure the position data of the component electrodes, and inspect the mounting state of the component.

基板面は部品の電極部との接点であるランド部分と配線
パターン、配線のない基板部より構成されており、ラン
ド部分は通常半田付は不良を防止するために、ハンダプ
リコートされているか、又は銅箔の状態てあり、又ラン
ド部分以外の部分も配線パターンを保護するための保護
膜が表面にあり、従って、どちらも鏡面に近い反射特性
を有している。
The board surface consists of a land part that is a contact point with the electrode part of the component, a wiring pattern, and a board part without wiring.The land part is usually pre-coated with solder or soldered to prevent soldering defects. It is in the state of copper foil, and there is a protective film on the surface to protect the wiring pattern in areas other than the land area, so both have reflective characteristics close to mirror surfaces.

一方、斜方照明30からの光は基板面に水平方向に近い
方向より照射されるため、照射光の殆どは反対方向へ反
射され、基板面に対して垂直方向にある撮像カメラ40
への入光は非常に少ない。
On the other hand, since the light from the oblique illumination 30 is irradiated onto the substrate surface from a direction close to the horizontal direction, most of the irradiated light is reflected in the opposite direction, and the imaging camera 40 which is perpendicular to the substrate surface is reflected.
There is very little light entering.

部品面はプラスチック等のボディ部及び電極部により構
成されており、従ってボディ部は鏡面に近い光の反射特
性を持ち、又拡散特性を持っていても表面色が暗く、電
極部は光の反射特性を持っているが、光を拡散する特性
も持っており、また表面色も白に近く明るいため、電極
部の拡散光の多くが撮像カメラ40に入光される。
The component surface is composed of a body part made of plastic, etc., and an electrode part. Therefore, the body part has light reflection characteristics close to a mirror surface, and even if it has diffusion characteristics, the surface color is dark, and the electrode part has light reflection characteristics. However, it also has the property of diffusing light, and the surface color is bright, close to white, so much of the diffused light from the electrode section enters the imaging camera 40.

このように、斜方照明された基板・部品を撮像した画像
が第3図である。第3図を見ても判るように、斜線部は
撮像カメラ40への入光が多く、明度の高い部分であり
、他の部分は明度の低い部分である。すなわち、第3図
から判るように、部品の電極部が明るく、他は暗く見え
るため、画像処理判定部50により、画像を明度の高低
により2値化し、明度の高い部分の重心位置を計算する
ことにより、電極部の位置を測定し、検査するのである
FIG. 3 shows an image taken of the board/component that is obliquely illuminated in this way. As can be seen from FIG. 3, the shaded areas are areas where much light enters the imaging camera 40 and have high brightness, and the other areas are areas with low brightness. That is, as can be seen from FIG. 3, since the electrode portion of the component appears bright and the other parts appear dark, the image processing judgment unit 50 binarizes the image based on the brightness level and calculates the center of gravity position of the high brightness part. This allows the position of the electrode section to be measured and inspected.

本願発明の検査方式は上記実施例に限定されない。The inspection method of the present invention is not limited to the above embodiment.

すなわち、判定例としては、ランド上の電極中心位置が
ランド上にない、又は部品の全電極の中心位置の平均等
により部品の位置を計算し、所定の位置からの位置ずれ
星の多少により判定する方法、ランド上の電極面積の多
少により判定する方法などがある。回倒として角チツプ
部品を述べたが、モールド部品、IC等においても前記
同様の検査が可能である。
In other words, as an example of determination, the center position of the electrode on the land is not on the land, or the position of the component is calculated based on the average of the center positions of all the electrodes of the component, and the determination is made based on the amount of position deviation from the predetermined position. There are two methods: one method to determine the area of the electrode on the land, and another method to determine it based on the area of the electrode on the land. Although square chip parts have been described as turning, the same inspection as described above is also possible for molded parts, ICs, and the like.

また装置例については、カメラ、画像処理判定部は白黒
、カラーを問わず、明度の変化を認識できればよく、斜
方照明は斜め横方向に均一に近い光を照射する照明であ
れば、丸形蛍光灯のみでなく、直管蛍光灯を正方形に組
合せた光源や、ハロゲンランプ光をリングファイバー等
で均一に照射する方式などでもよい。
Regarding equipment examples, the camera and image processing judgment unit need only be able to recognize changes in brightness regardless of whether it is black and white or color, and oblique lighting can be round if it is lighting that emits light almost uniformly in the diagonal horizontal direction. In addition to fluorescent lamps, a light source that combines straight tube fluorescent lamps in a square shape, or a method that uniformly irradiates light from a halogen lamp using a ring fiber or the like may be used.

〈発明の効果〉 以上説明したように、本願発明によれば、スリット光を
照射する光切断方式や部品にレーザ光を照射する方式を
使用することなく、簡単な照明設備により、部品の自動
実装検査が可能になり、製品コストの削減や装置の保守
、品質管理が容易で精度の高い新規なプリント基板の部
品実装認識方法を提供することが可能となった。
<Effects of the Invention> As explained above, according to the present invention, components can be automatically mounted using simple lighting equipment without using a light cutting method that irradiates slit light or a method that irradiates laser light onto components. Inspection has become possible, and it has become possible to provide a new method for recognizing component mounting on printed circuit boards that is highly accurate, reduces product costs, facilitates equipment maintenance, and quality control.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本願発明を用いた検査装置の概略図、第2図は
基板と部品に対して斜め方向から光を照射する場合の概
略図、第3図は第2図に示した基板を撮像カメラ40に
より撮像した画像であ為。 lO・・・・プリント基板 20・・・・X−Yテーブル 30・・・・斜方照明 40・・・・撮像カメラ 50・・・・画像処理判定部 60・・・・角チツプ部品 70・・・・ランド
Fig. 1 is a schematic diagram of an inspection device using the present invention, Fig. 2 is a schematic diagram of a case where light is irradiated from an oblique direction to a board and components, and Fig. 3 is an image of the board shown in Fig. 2. An image captured by the camera 40 is used. lO...Printed circuit board 20...X-Y table 30...Oblique illumination 40...Imaging camera 50...Image processing determination section 60...Square chip parts 70... ···land

Claims (1)

【特許請求の範囲】[Claims] (1)プリント基板上に実装された部品の実装状態を認
識する方法であって、斜め方向より照明された基板画像
を基板面に対して垂直方向に設けた撮像カメラにより撮
像し、基板と部品電極の照明光の拡散特性の差異により
、撮像データ上の基板と部品電極を明度の違いにより区
別し、部品電極の位置データを測定することにより部品
の実装状態を検査することを特徴とするプリント基板の
部品実装認識方法。
(1) A method for recognizing the mounting state of components mounted on a printed circuit board, in which an image of the board illuminated from an oblique direction is captured by an imaging camera installed perpendicularly to the board surface, and the board and components are A print that is characterized by distinguishing the substrate and component electrodes on imaged data by differences in brightness based on differences in the diffusion characteristics of illumination light of the electrodes, and inspecting the mounting state of the component by measuring position data of the component electrodes. A method for recognizing component mounting on a board.
JP1331688A 1989-12-21 1989-12-21 Component mounting recognition method for printed board Pending JPH03192800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1331688A JPH03192800A (en) 1989-12-21 1989-12-21 Component mounting recognition method for printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1331688A JPH03192800A (en) 1989-12-21 1989-12-21 Component mounting recognition method for printed board

Publications (1)

Publication Number Publication Date
JPH03192800A true JPH03192800A (en) 1991-08-22

Family

ID=18246470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1331688A Pending JPH03192800A (en) 1989-12-21 1989-12-21 Component mounting recognition method for printed board

Country Status (1)

Country Link
JP (1) JPH03192800A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004264026A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and image recognition method
JP2004264025A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and image recognition method
JP2007017379A (en) * 2005-07-11 2007-01-25 Gen Tec:Kk Surface shape measuring device
KR20210118742A (en) * 2020-03-23 2021-10-01 파스포드 테크놀로지 주식회사 Die bonding apparatus and manufacturing method of semiconductor device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004264026A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and image recognition method
JP2004264025A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and image recognition method
JP2007017379A (en) * 2005-07-11 2007-01-25 Gen Tec:Kk Surface shape measuring device
KR20210118742A (en) * 2020-03-23 2021-10-01 파스포드 테크놀로지 주식회사 Die bonding apparatus and manufacturing method of semiconductor device

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