JPH03129826A - Resist film formation device - Google Patents
Resist film formation deviceInfo
- Publication number
- JPH03129826A JPH03129826A JP26959489A JP26959489A JPH03129826A JP H03129826 A JPH03129826 A JP H03129826A JP 26959489 A JP26959489 A JP 26959489A JP 26959489 A JP26959489 A JP 26959489A JP H03129826 A JPH03129826 A JP H03129826A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- photoresist
- exhaust fan
- resist film
- vacuum suction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000015572 biosynthetic process Effects 0.000 title 1
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 16
- 239000004065 semiconductor Substances 0.000 claims description 10
- 239000007788 liquid Substances 0.000 abstract description 6
- 239000002699 waste material Substances 0.000 abstract description 3
- 230000003449 preventive effect Effects 0.000 abstract 3
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 230000002265 prevention Effects 0.000 description 5
- 230000003068 static effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Formation Of Insulating Films (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体製造装置に関し、特に半導体ウェーハ表
面にレジストを滴下し、回転させることによりレジスト
膜を形成するレジスタ膜形成装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor manufacturing apparatus, and more particularly to a resist film forming apparatus that forms a resist film by dropping resist onto the surface of a semiconductor wafer and rotating the wafer.
従来、この種のレジスト膜形成装置は、半導体ウェーハ
を真空吸着台により吸着し、表面にその上部にあるノズ
ルからフォトレジスト液を滴下し、モーターにより真空
吸着台を高速回転させ、その遠心力により滴下された液
を外周部へフォトレジストを拡散させることにより、半
導体ウェーハ表面に均一なフォトレジスト膜を形成する
装置である。Conventionally, this type of resist film forming equipment adsorbs a semiconductor wafer using a vacuum suction table, drops photoresist liquid onto the surface from a nozzle at the top of the wafer, rotates the vacuum suction table at high speed with a motor, and uses the centrifugal force of the vacuum suction table. This is a device that forms a uniform photoresist film on the surface of a semiconductor wafer by spreading the photoresist onto the outer periphery of a dropped liquid.
上述した従来のレジスト膜形成装置は、半導体ウェーハ
表面にノズルから滴下されたフォトレジスト液を回転に
よって拡散する時に、ウェーハ外周部から余剰のフォト
レジストが微粒子状態で飛散する0通常、この飛散した
フォトレジストは、排気口から吸引される空気と共に装
置外へ排出されている。しかしながら、排気口の静圧の
変化により飛散フォトレジストの吸引力が変化し、排気
口の静圧が低下した場合に、−度飛散したフォトレジス
トが半導体ウェーハ表面に再付着する問題がある。本発
明の目的は、かかる問題を解消するレジスト膜形成装置
を提供することにある。In the conventional resist film forming apparatus described above, when a photoresist liquid dropped from a nozzle is spread onto the surface of a semiconductor wafer by rotation, excess photoresist is scattered in the form of fine particles from the outer periphery of the wafer. The resist is discharged to the outside of the apparatus together with the air sucked through the exhaust port. However, when the static pressure of the exhaust port changes, the suction force of the scattered photoresist changes, and the static pressure of the exhaust port decreases, there is a problem that the scattered photoresist re-adheres to the surface of the semiconductor wafer. An object of the present invention is to provide a resist film forming apparatus that solves this problem.
本発明のレジスト膜形成装置は、回転軸に垂直に固定さ
れた真空吸着台上に保持された半導体ウェーハ表面にフ
ォトレジストを滴下し、前記回転軸を回転させることに
より前記半導体ウェーハ表面にフォトレジスト膜を形成
するレジスト膜形成装置において、前記真空吸着台下の
回転軸に排気ファンの翼を有している。The resist film forming apparatus of the present invention drops photoresist onto the surface of a semiconductor wafer held on a vacuum suction stand fixed perpendicularly to a rotating shaft, and by rotating the rotating shaft, the photoresist is deposited on the surface of the semiconductor wafer. In a resist film forming apparatus for forming a film, an exhaust fan blade is provided on a rotating shaft under the vacuum suction table.
次に、本発明について図面を参照して説明する。第1図
は本発明の一実施例を示すレジスト膜形成装置の模式断
面図である。このレジスト膜形成装置は、同図に示すよ
うに、ウェーハ9上に配置されたノズル8と、周囲に飛
散防止カップ5に囲まれるとともにウェーハ9を載置す
る真空吸着台1と、この真空吸着台゛1の回転軸3に取
付けられた排気ファン2とを有している。また、この回
転軸3はモータ4に連結されている。さらに、真空吸着
台1と排気ファン2の回りは、飛散防止カップ5でおお
われており、この飛散防止カップ5の下部にはレジスト
廃液口6と排気ロアの穴が明けられている。このように
、回転軸3に排気ファン2のような翼を取付けることに
より、この翼の回転により、飛散したフォトレジストは
、この翼内に吸引され、ウェーハ9の表面に付着するこ
とがない。Next, the present invention will be explained with reference to the drawings. FIG. 1 is a schematic cross-sectional view of a resist film forming apparatus showing one embodiment of the present invention. As shown in the figure, this resist film forming apparatus includes a nozzle 8 arranged on a wafer 9, a vacuum suction table 1 surrounded by a scattering prevention cup 5 and on which the wafer 9 is placed, and a vacuum suction table 1 on which the wafer 9 is placed. It has an exhaust fan 2 attached to a rotating shaft 3 of the stand 1. Further, this rotating shaft 3 is connected to a motor 4. Further, the vacuum suction table 1 and the exhaust fan 2 are covered with a scattering prevention cup 5, and the lower part of the scattering prevention cup 5 has a resist waste liquid port 6 and a hole for an exhaust lower. In this manner, by attaching a blade such as the exhaust fan 2 to the rotating shaft 3, the scattered photoresist is sucked into the blade by rotation of the blade, and does not adhere to the surface of the wafer 9.
第2図は本発明の他の実施例を示すレジスト膜形成装置
の縦断面図である。このレジスト膜形成装置は、同図に
示すように、排気ファン2の回りに静流板9を設けたこ
とである。この実施例では排気ファン2により吸い込ま
れた空気流が整流板9により乱流から層流に近い状態に
調整され安定した排気流を得ることができる利点がある
。FIG. 2 is a longitudinal sectional view of a resist film forming apparatus showing another embodiment of the present invention. This resist film forming apparatus is provided with a static flow plate 9 around an exhaust fan 2, as shown in the figure. This embodiment has the advantage that the air flow sucked in by the exhaust fan 2 is adjusted from turbulent flow to a state close to laminar flow by the rectifying plate 9, and a stable exhaust flow can be obtained.
以上説明したように本発明は、真空吸着台の下に回転軸
とともに回転する排気ファンを設けることにより、ウェ
ーハ外周部と飛散防止カップとの間に下向きの空気流を
発生させ、ウェーハ外周部から飛散するレジスト微粒子
を真空吸着台の下に空気流と共に押し流すことが出来る
ので、ウェーハ表面に飛散するフォトレジストが再付着
することのないレジスト膜形成装置が得られるという効
果がある。As explained above, the present invention generates a downward air flow between the wafer outer periphery and the scattering prevention cup by providing an exhaust fan that rotates with the rotating shaft under the vacuum suction table. Since the scattered resist fine particles can be swept away with the air flow under the vacuum suction table, there is an effect that a resist film forming apparatus can be obtained in which the scattered photoresist does not adhere to the wafer surface again.
第1図は本発明の一実施例を示すレジスト膜形成装置の
模式断面図、第2図は本発明の他の実施例を示すレジス
ト膜形成装置の模式断面図である。
1・・・真空吸着台、2・・・排気ファン、3・・・回
転軸、4・・・モータ、5・・・飛散防止カップ、6・
・・レジスト廃液口、7・・・排気口、8・・・ノズル
、9・・・ウェーハ 10・・・整流板。
弗 1y!JFIG. 1 is a schematic sectional view of a resist film forming apparatus showing one embodiment of the present invention, and FIG. 2 is a schematic sectional view of a resist film forming apparatus showing another embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Vacuum adsorption stand, 2... Exhaust fan, 3... Rotating shaft, 4... Motor, 5... Scattering prevention cup, 6...
...Resist waste liquid port, 7.. Exhaust port, 8.. Nozzle, 9.. Wafer 10.. Current plate.弗 1y! J
Claims (1)
半導体ウェーハ表面にフォトレジストを滴下し、前記回
転軸を回転させることにより前記半導体ウェーハ表面に
フォトレジスト膜を形成するレジスト膜形成装置におい
て、前記真空吸着台下の回転軸に排気ファンの翼を取り
付けたことを特徴とするレジスタ膜形成装置。In a resist film forming apparatus that drops photoresist onto the surface of a semiconductor wafer held on a vacuum suction table fixed perpendicularly to a rotation axis, and forms a photoresist film on the semiconductor wafer surface by rotating the rotation axis. . A resistor film forming apparatus, characterized in that an exhaust fan blade is attached to a rotating shaft under the vacuum suction table.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26959489A JPH03129826A (en) | 1989-10-16 | 1989-10-16 | Resist film formation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26959489A JPH03129826A (en) | 1989-10-16 | 1989-10-16 | Resist film formation device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03129826A true JPH03129826A (en) | 1991-06-03 |
Family
ID=17474538
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26959489A Pending JPH03129826A (en) | 1989-10-16 | 1989-10-16 | Resist film formation device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03129826A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5863328A (en) * | 1996-02-15 | 1999-01-26 | Singulus Technologies Gmbh | Device for surface coating or lacquering of substrates |
JP2007139381A (en) * | 2005-11-22 | 2007-06-07 | Toto Ltd | Instantaneous hot water system |
JP2009052884A (en) * | 2008-12-12 | 2009-03-12 | Toto Ltd | Instantaneous hot water system |
JP2009052883A (en) * | 2008-12-12 | 2009-03-12 | Toto Ltd | Instantaneous hot water system |
-
1989
- 1989-10-16 JP JP26959489A patent/JPH03129826A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5863328A (en) * | 1996-02-15 | 1999-01-26 | Singulus Technologies Gmbh | Device for surface coating or lacquering of substrates |
JP2007139381A (en) * | 2005-11-22 | 2007-06-07 | Toto Ltd | Instantaneous hot water system |
JP2009052884A (en) * | 2008-12-12 | 2009-03-12 | Toto Ltd | Instantaneous hot water system |
JP2009052883A (en) * | 2008-12-12 | 2009-03-12 | Toto Ltd | Instantaneous hot water system |
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