JPH0287683A - Photodiode - Google Patents
PhotodiodeInfo
- Publication number
- JPH0287683A JPH0287683A JP63241483A JP24148388A JPH0287683A JP H0287683 A JPH0287683 A JP H0287683A JP 63241483 A JP63241483 A JP 63241483A JP 24148388 A JP24148388 A JP 24148388A JP H0287683 A JPH0287683 A JP H0287683A
- Authority
- JP
- Japan
- Prior art keywords
- region
- guard ring
- annode
- photodiode
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012535 impurity Substances 0.000 abstract description 8
- 239000000758 substrate Substances 0.000 abstract description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052782 aluminium Inorganic materials 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000000059 patterning Methods 0.000 abstract description 2
- 238000009792 diffusion process Methods 0.000 abstract 2
- 230000008020 evaporation Effects 0.000 abstract 1
- 238000001704 evaporation Methods 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 description 3
- 239000008188 pellet Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Light Receiving Elements (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はフォトダイオードに関する。[Detailed description of the invention] [Industrial application field] The present invention relates to photodiodes.
従来、フォトダイオードは第3図の様に高比抵抗n型シ
リコン基板31の表面に選択的にp型不純物を拡散ある
いはイオン注入してアノード32を形成し、さらにアノ
ード32の周囲にガードリング33をn型不純物を拡散
あるいはイオン注入して形成している。Conventionally, photodiodes are manufactured by selectively diffusing or ion-implanting p-type impurities into the surface of a high-resistivity n-type silicon substrate 31 to form an anode 32, as shown in FIG. is formed by diffusing or ion-implanting n-type impurities.
フォトダイオードの受光感度はアノード32の面積に比
例するので、大きな受光電流を得るには、アノード32
を大きく広げることが必要となる。このように上述した
従来のフォトダイオードでは受光感度とアノード面積が
正比例の関係にあるので、高感度化を計る時にアノード
、ひいてはペレット面積を大きくしなければならない。The light-receiving sensitivity of the photodiode is proportional to the area of the anode 32, so in order to obtain a large light-receiving current, the anode 32
It is necessary to greatly expand the As described above, in the conventional photodiode described above, the light-receiving sensitivity and the anode area are in a directly proportional relationship, so in order to increase the sensitivity, the anode, and therefore the pellet area, must be increased.
しかし、アノードを大きくするとアノードと基板とで形
成されるpn接合を全領域に渡って均一に作ることは難
しく、特性劣化、歩留り低下という問題点がある。However, when the anode is made larger, it is difficult to make the pn junction formed between the anode and the substrate uniform over the entire area, resulting in problems such as deterioration of characteristics and reduction in yield.
本発明はアノードを大きくすることなく大きな受光電流
が得られる構造として、上述の問題点を解決することを
目的としている。The present invention aims to solve the above-mentioned problems by providing a structure in which a large light-receiving current can be obtained without increasing the size of the anode.
本発明のフォトダイオードは、アノードを取り巻くガー
ドリングのなかにトランジスタを具備した構成になって
いる。The photodiode of the present invention has a structure in which a transistor is provided in a guard ring surrounding an anode.
〔実施例1〕 次に、本発明について図面を参照して説明する。[Example 1] Next, the present invention will be explained with reference to the drawings.
第1図(a)は本発明の一実施例の縦断面図で、第1図
(b)はその等価回路である。高比抵抗のn型基板(第
1導電型領域)1に、アノード2とする領域を囲むよう
にガードリング3をn型不純物(この実施例ではPを用
いた)の拡散により形成する。つぎに、ガードリングで
囲まれたアノード領域、及びガードリング内のベース領
域にp型不純物(この実施例ではBを用いた)をイオン
注入し、同時にアノード(第2導電型領域)2とベース
7を形成する。さらに、ベース内にn型不純物を拡散し
てエミッタ8を形成した後、表面の絶縁膜4に電極接続
用のコンタクトホールをあけ、アルミ蒸着、アルミのバ
ターニングを行ない各電極を形成してフォトダイオード
を製作する。FIG. 1(a) is a longitudinal sectional view of one embodiment of the present invention, and FIG. 1(b) is its equivalent circuit. A guard ring 3 is formed on a high resistivity n-type substrate (first conductivity type region) 1 by diffusing an n-type impurity (P is used in this embodiment) so as to surround a region to be an anode 2. Next, a p-type impurity (B was used in this example) is ion-implanted into the anode region surrounded by the guard ring and the base region within the guard ring, and at the same time, the anode (second conductivity type region) 2 and the base are implanted. form 7. Furthermore, after diffusing n-type impurities into the base to form an emitter 8, contact holes for electrode connection are made in the insulating film 4 on the surface, and aluminum vapor deposition and aluminum patterning are performed to form each electrode. Manufacture a diode.
このフォトダイオードはアノード2を含む受光部に加え
てガードリングをコレクタとするトランジスタを備え、
受光部で得られた光電流をアノード2、配線5を経てト
ランジスタで増幅して出力している。このため同じ受光
面積であれば従来のフォトダイオードに比べてトランジ
スタで増幅される分だけ多くの電流が取り出せる。In addition to a light receiving part including an anode 2, this photodiode is equipped with a transistor whose collector is a guard ring.
The photocurrent obtained in the light receiving section is passed through the anode 2 and the wiring 5, and is amplified by a transistor and output. Therefore, with the same light-receiving area, more current can be extracted than a conventional photodiode by the amount amplified by the transistor.
〔実施例2〕 第2図は本発明の実施例2の縦断面図である。[Example 2] FIG. 2 is a longitudinal sectional view of Example 2 of the present invention.
アノード2.ベース7を形成するまでは実施例1と同じ
構成、製法であるが、エミッタ8を形成する時にガード
リング3内のアノード側9にも同時に拡散することによ
り濃度をさらに高くしてガードリングとしての効果をよ
り高めたものである。Anode 2. The structure and manufacturing method are the same as in Example 1 until the base 7 is formed, but when the emitter 8 is formed, the concentration is further increased by simultaneously diffusing into the anode side 9 of the guard ring 3. It is more effective.
この他は実施例1と同じである。The rest is the same as in the first embodiment.
以上説明したように本発明は、フォトダイオードのガー
ドリング内にトランジスタを形成することにより、簡単
にトランジスタの集積が可能であるとともに、フォトダ
イオードの受光電流を増幅出来るので、受光面積を変え
ずに受光電流がh14倍され、さらにはペレットの縮小
が可能となる。As explained above, the present invention allows transistors to be easily integrated by forming a transistor in the guard ring of a photodiode, and also amplifies the light-receiving current of the photodiode without changing the light-receiving area. The light receiving current is multiplied by h14, and the pellet can be further reduced in size.
尚、実施例ではいずれも受光部はpn接合から成るフォ
トダイオードで構成されていたが、pin構造のいわゆ
るビンフォトダイオードであってもよい。また、ガード
リング内に設けたトランジスタもバイポーラ型に限らず
M O’ S型のトランジスタ、あるいはショットキ接
合型のトランジスタであってもよい。In each of the embodiments, the light-receiving section is composed of a photodiode having a pn junction, but it may also be a so-called bin photodiode having a pin structure. Further, the transistor provided in the guard ring is not limited to a bipolar type transistor, but may be a MO'S type transistor or a Schottky junction type transistor.
グ、4・・・絶縁膜、7・・・ベース、8・・・エミッ
タ、31・・・n型基板、32・・・アノード、33・
・・ガードリング、34・・・絶縁膜。4... Insulating film, 7... Base, 8... Emitter, 31... N-type substrate, 32... Anode, 33...
... Guard ring, 34... Insulating film.
Claims (1)
部を具備し、前記第2導電型領域の周囲に第1導電型の
ガードリングを備えたフォトダイオードにおいて、前記
ガードリングの内部に第1あるいは第2導電型または両
方の導電型領域を設けて前記ガードリングを活性領域の
一部としたトランジスタを形成し、前記トランジスタと
前記第2導電型領域とを電気的に接続したことを特徴と
するフォトダイオード。A photodiode comprising a light receiving section having at least a first conductivity type region and a second conductivity type region, and a first conductivity type guard ring around the second conductivity type region, wherein the inside of the guard ring is provided with a first conductivity type guard ring. A transistor is formed in which a region of a first conductivity type, a second conductivity type, or both conductivity types is provided, and the guard ring is a part of an active region, and the transistor and the second conductivity type region are electrically connected. Features photodiode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63241483A JPH0287683A (en) | 1988-09-26 | 1988-09-26 | Photodiode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63241483A JPH0287683A (en) | 1988-09-26 | 1988-09-26 | Photodiode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0287683A true JPH0287683A (en) | 1990-03-28 |
Family
ID=17074985
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63241483A Pending JPH0287683A (en) | 1988-09-26 | 1988-09-26 | Photodiode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0287683A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04265863A (en) * | 1991-02-20 | 1992-09-22 | Mitsubishi Electric Corp | Probe needle |
JP2011082513A (en) * | 2009-10-06 | 2011-04-21 | National Central Univ | Silicon photodetection module |
-
1988
- 1988-09-26 JP JP63241483A patent/JPH0287683A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04265863A (en) * | 1991-02-20 | 1992-09-22 | Mitsubishi Electric Corp | Probe needle |
JP2011082513A (en) * | 2009-10-06 | 2011-04-21 | National Central Univ | Silicon photodetection module |
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