JPH0271269U - - Google Patents
Info
- Publication number
- JPH0271269U JPH0271269U JP15037788U JP15037788U JPH0271269U JP H0271269 U JPH0271269 U JP H0271269U JP 15037788 U JP15037788 U JP 15037788U JP 15037788 U JP15037788 U JP 15037788U JP H0271269 U JPH0271269 U JP H0271269U
- Authority
- JP
- Japan
- Prior art keywords
- test
- mode selection
- selection switch
- test device
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15037788U JPH0637347Y2 (ja) | 1988-11-18 | 1988-11-18 | Ｉｃ試験用スキャナ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15037788U JPH0637347Y2 (ja) | 1988-11-18 | 1988-11-18 | Ｉｃ試験用スキャナ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0271269U true JPH0271269U (da) | 1990-05-30 |
| JPH0637347Y2 JPH0637347Y2 (ja) | 1994-09-28 |
Family
ID=31423465
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15037788U Expired - Fee Related JPH0637347Y2 (ja) | 1988-11-18 | 1988-11-18 | Ｉｃ試験用スキャナ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0637347Y2 (da) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013124996A (ja) * | 2011-12-16 | 2013-06-24 | Fuji Electric Co Ltd | 半導体試験装置 |
-
1988
- 1988-11-18 JP JP15037788U patent/JPH0637347Y2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013124996A (ja) * | 2011-12-16 | 2013-06-24 | Fuji Electric Co Ltd | 半導体試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0637347Y2 (ja) | 1994-09-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |