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JPH0266957A - Pickup device of semiconductor element - Google Patents

Pickup device of semiconductor element

Info

Publication number
JPH0266957A
JPH0266957A JP63219311A JP21931188A JPH0266957A JP H0266957 A JPH0266957 A JP H0266957A JP 63219311 A JP63219311 A JP 63219311A JP 21931188 A JP21931188 A JP 21931188A JP H0266957 A JPH0266957 A JP H0266957A
Authority
JP
Japan
Prior art keywords
semiconductor element
picked
tape
semiconductor device
pickup
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63219311A
Other languages
Japanese (ja)
Inventor
Masahiko Ichise
理彦 市瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63219311A priority Critical patent/JPH0266957A/en
Publication of JPH0266957A publication Critical patent/JPH0266957A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68318Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H01L2221/68322Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To make it possible to prevent occurrence of flaws in a semiconductor element even if the semiconductor element to be picked up is moved in the lateral direction when a push-up pin is pushed up by providing a step part in a holder. CONSTITUTION:In a holder 3a, a step part 8 is provided between a central flat part 6a and a slant part 7a which is inclined downward at the peripheral part. Before an UV tape 2 is sucked, a neighboring semiconductor element 1a is located higher than the lowest surface of a semiconductor element 1 to be picked up. After the UV tape is sucked, the UV tape 2 is conformal to the shape of the upper surface of the holder 3a. The neighboring semiconductor element 1a is lowered and located lower than the lowest surface of the semiconductor element 1 to be picked up. When the UV tape 2 is sucked through sucking holes 5, the UV tape 2 which is located on a lower flat part 9a id lowered. The UV tape 2 is peeled off from the semiconductor element 1 to be picked up. Therefore, the semiconductor element 1 can be picked up without pushing up the semiconductor element 1 with a push-up pin 4.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体素子のピックアップ装置に関し、特に粘
着テープを吸着する機構を有するホルダーを用る半導体
素子のピックアップ装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device pickup device, and more particularly to a semiconductor device pickup device using a holder having a mechanism for adsorbing an adhesive tape.

〔従来の技術〕[Conventional technology]

紫外線照射により接着力が低下する接着面を一面に有す
る粘着テープ(以下、UVシートと称す)を用いて、半
導体ウェーハを完全切断するダイシング(以下、フルカ
ットダイシングと称す)を行った半導体素子を、フルカ
ットダイシング後に紫外線照射して接着力を低下させた
UVシートからUVシートを伸ばすことなしにピックア
ップする場合、それに用いる半導体素子のピックアップ
装置がある。
Semiconductor elements are processed by dicing (hereinafter referred to as full-cut dicing) in which a semiconductor wafer is completely cut using an adhesive tape (hereinafter referred to as UV sheet) that has an adhesive surface on one side whose adhesive strength decreases due to ultraviolet irradiation. When picking up a UV sheet that has been irradiated with ultraviolet rays after full-cut dicing to reduce its adhesive strength without stretching the UV sheet, there is a semiconductor device pickup device that is used for this purpose.

第4図は従来の半導体素子のピックアップ装置の一例の
断面図である。
FIG. 4 is a sectional view of an example of a conventional semiconductor device pickup device.

第4図に示すように、ホルダー3は中央の半導体製子1
をピックアップする領域が平坦部6となり、平坦部6の
周辺が下方に傾斜した傾斜部7になっていて、平坦部6
の下面及び傾斜部7の下面に吸着口5が配しである。半
導体素子1をピックアップするときは、吸着口5からU
Vシート2を吸着し、ホルダー3の上面の形状にUVシ
ート2を追従させて、ピックアップする半導体素子1と
隣接する半導体素子1aとのすき間を広げて、平坦部6
の中央の吸着口5から突き上げビン4を上昇させ、ピッ
クアップする半導体素子1を突き上げてピックアップし
ている。
As shown in FIG.
The area where the material is picked up is a flat part 6, and the periphery of the flat part 6 is a downwardly inclined slope part 7.
A suction port 5 is arranged on the lower surface of the lower surface and the lower surface of the inclined part 7. When picking up the semiconductor element 1, from the suction port 5
The UV sheet 2 is adsorbed, the UV sheet 2 is made to follow the shape of the upper surface of the holder 3, the gap between the semiconductor element 1 to be picked up and the adjacent semiconductor element 1a is widened, and the flat part 6 is
The push-up bottle 4 is raised through the central suction port 5, and the semiconductor element 1 to be picked up is pushed up and picked up.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の半導体素子のピックアップ装置は、U■
テープの吸着後にピックアップする半導体素子の最下面
より上に隣接する半導体素子が存在するので、ピックア
ップする半導体素子を突き上げる際に、ピックアップす
る半導体素子が突き上げ機構のバックラッシュ及び振動
による突き上げピンの上昇時に発生する振動のため、横
方向に動くと隣接する半導体素子と接触して、半導体素
子にきすを発生させて半導体素子を不良にしてしまうと
いう欠点がある。
The conventional semiconductor device pickup device described above is U■
Since there is an adjacent semiconductor element above the bottom surface of the semiconductor element to be picked up after the tape is adsorbed, when the semiconductor element to be picked up is pushed up, the semiconductor element to be picked up may be affected by backlash of the pushing-up mechanism and when the push-up pin rises due to vibration. Due to the generated vibrations, when the semiconductor device moves laterally, it comes into contact with an adjacent semiconductor device, causing scratches on the semiconductor device and causing the semiconductor device to become defective.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体素子のピックアップ装置は、上面に粘着
面を有し該粘着面に半導体ウェーハを貼(・1けて個々
の半導体素子に分割する粘着テープと、該粘着テープの
下面側に配置され中央にピックアップすべき半導体素子
のピックアップ領域と該ピックアップ領域の外側に下方
に傾斜する傾斜領域とを有し前記半導体素子のピックア
ップ時に前記ピックアップ領域と傾斜領域で前記粘着テ
ープを吸着するボルダ−とを備える半導体素子のピック
アップ装置において、前記半導体素子のピックアップ時
に前記ピックアップ領域上の前記半導体素子の最下面が
隣接する半導体素子の最上面より上にあるよう前記ピッ
クアップ領域に設けた段差を有している。
The semiconductor device pickup device of the present invention has an adhesive tape on the upper surface and a semiconductor wafer is pasted on the adhesive surface. a boulder having a pick-up area for a semiconductor element to be picked up in the center and an inclined area sloping downward outside the pick-up area, and adsorbing the adhesive tape in the pick-up area and the inclined area when picking up the semiconductor element; A pickup device for a semiconductor device comprising: a step provided in the pickup region such that the bottom surface of the semiconductor device on the pickup region is above the top surface of an adjacent semiconductor device when picking up the semiconductor device. .

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例の断面図である。FIG. 1 is a sectional view of a first embodiment of the invention.

第1図に示すように、ホルダー3.、には中央のピック
アップすべき半導体素子1のビ・ソファ・ンプ領域とし
ての平坦部6aと平坦部61の周辺の下方に傾斜した傾
斜部76との間に段差8を有している。段差8を有する
ほかは前述した第4図の半導体素子のピックアップ装置
とほぼ同構造であり説明を省略する。UVテープ2の吸
着前には、ピックアップする半導体素子1の最下面より
上に隣接する半導体素子1aが存在している。
As shown in FIG. , has a step 8 between a central flat portion 6a serving as a bias amplifier region of the semiconductor element 1 to be picked up and a downwardly inclined slope portion 76 around the flat portion 61. Other than having the step 8, this structure is almost the same as that of the semiconductor device pickup device shown in FIG. 4 described above, and the explanation thereof will be omitted. Before the UV tape 2 is adsorbed, an adjacent semiconductor element 1a exists above the bottom surface of the semiconductor element 1 to be picked up.

第2図はUVテープ吸着後の第1図の第1の実施例の断
面図である。
FIG. 2 is a sectional view of the first embodiment of FIG. 1 after adsorption of the UV tape.

第2図に示すように、UVテープ2がホルダー33の上
面形状に追従しており、そのため隣接する半導体素子1
aが引き落とされて、ピックアップする半導体素子1の
最下面より下に存在するようになる。
As shown in FIG. 2, the UV tape 2 follows the top surface shape of the holder 33, and therefore the adjacent semiconductor element 1
a is pulled down so that it exists below the bottom surface of the semiconductor element 1 to be picked up.

第3図は本発明の第2の実施例の断面図である。FIG. 3 is a sectional view of a second embodiment of the invention.

第3図に示すように、第2の実施例では、上述した第1
図の第1の実施例の平坦部6.を周囲を突出させた上位
平坦部つと上位平坦部9の内側の段差をつけた下位平坦
部9.とて構成している。
As shown in FIG. 3, in the second embodiment, the first
Flat portion 6 of the first embodiment shown. An upper flat part 9 with a protruding periphery and a lower flat part 9 with a step inside the upper flat part 9. It is composed of

このように構成することにより、吸着口5からtJ V
テープ2を吸着するとピックアップする半導体素子1の
最下面より下に隣接する半導体素子1aが存在すると同
時に、下位平坦部9.の上にあるUVテープ2が吸着に
よって下方に引かれて、ピックアップする半導体素子1
からUVテープ2が剥される。
With this configuration, tJ V from the suction port 5
When the tape 2 is attracted, an adjacent semiconductor element 1a exists below the bottom surface of the semiconductor element 1 to be picked up, and at the same time, a lower flat portion 9. The UV tape 2 on top is pulled downward by suction, and the semiconductor element 1 to be picked up is
The UV tape 2 is peeled off.

従って、突き上げピンでピックアップする半導体素子1
を突き上げることなくピックアップする半導体素子1を
ピックアップすることができる。
Therefore, the semiconductor element 1 to be picked up by the push-up pin
The semiconductor element 1 can be picked up without being pushed up.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、ホルダーに段差を設ける
ことにより、突き上げビンを突き上げた際にピックアッ
プする半導体素子が横方向に動いても半導体素子にきす
を発生することを防止できるという効果がある。
As explained above, the present invention has the effect that by providing a step in the holder, it is possible to prevent scratches from occurring on the semiconductor element even if the semiconductor element to be picked up moves laterally when the push-up bottle is pushed up. .

一実験例を示すと、従来の半導体素子のピックアップ装
置を用いた場合ピックアップ時の半導体素子のきず又は
かけの発生率は3.6%であったのに対し、第1の実施
例ではきず又はかけの発生は皆無であった。
To give an example of an experiment, when a conventional semiconductor device pickup device was used, the incidence of scratches or chips on the semiconductor device during pickup was 3.6%, whereas in the first embodiment, the occurrence rate of scratches or chips was 3.6%. There were no occurrences of chips.

又、第2の実施例によれば、平坦部を狭くして平坦部と
平坦部の間にピックアップする半導体素子に接しない平
坦部を段差をつけて設けることにより、突き上げビンで
ピックアップする半導体素子を突き上げることなくピッ
クアップできるので、突き上げ機構が不必要になるとと
もに、UVテープを突は上げビンで突き破ることがなく
なるため、突き破ったUVテープの破片がピックアップ
する半導体素子にこびりつくことがなく、その結果、半
導体素子をリードフレームへ搭載する際などに良好な搭
載が可能になるという効果がある。
Further, according to the second embodiment, by narrowing the flat portion and providing a stepped flat portion that does not contact the semiconductor device to be picked up between the flat portions, the semiconductor device to be picked up by the push-up bin is improved. Since the UV tape can be picked up without being pushed up, there is no need for a pushing up mechanism, and since the UV tape is not pierced by the lifting bottle, the broken pieces of the UV tape will not stick to the semiconductor element being picked up. This has the effect of enabling good mounting when mounting a semiconductor element on a lead frame.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例の断面図、第214はU
Vテープ吸着後の第1図の第1の実施例の断面図、第3
国は本発明の第2の実施例の断面図、第4図は従来の半
導体素子のピックアップ装置の一例の断面図である。 1・・・ピックアップする半導体素子、11・・・ピッ
クアップする半導体素子に隣接する半導体素子、2・・
・UVテープ、3,3.ボルダ−14・・・突き上げビ
ン、5・・・吸着口、6.6.・・・平坦部、7゜73
・・・傾斜部、8・・・段差、9・・・上位平坦部、9
゜・・・1;位平坦部。 代理人 弁理士  内 原  晋 あr呂 与 さび あ4(ト) 烹3囚
FIG. 1 is a sectional view of the first embodiment of the present invention, and 214 is a sectional view of the first embodiment of the present invention.
Cross-sectional view of the first embodiment in FIG. 1 after V-tape adsorption;
4 is a cross-sectional view of a second embodiment of the present invention, and FIG. 4 is a cross-sectional view of an example of a conventional semiconductor device pickup device. 1... Semiconductor element to be picked up, 11... Semiconductor element adjacent to the semiconductor element to be picked up, 2...
・UV tape, 3,3. Boulder-14... Push-up bottle, 5... Suction port, 6.6. ...Flat part, 7°73
...Slope part, 8...Step, 9...Upper flat part, 9
゜...1; flat area. Agent Patent Attorney Susumu Uchihara Arroyosabia 4 (G) 3rd Prisoner

Claims (1)

【特許請求の範囲】[Claims] 上面に粘着面を有し該粘着面に半導体ウェーハを貼付け
て個々の半導体素子に分割する粘着テープと、該粘着テ
ープの下面側に配置され中央にピックアップすべき半導
体素子のピックアップ領域と該ピックアップ領域の外側
に下方に傾斜する傾斜領域とを有し前記半導体素子のピ
ックアップ時に前記ピックアップ領域と傾斜領域で前記
粘着テープを吸着するホルダーとを備える半導体素子の
ピックアップ装置において、前記半導体素子のピックア
ップ時に前記ピックアップ領域上の前記半導体素子の最
下面が隣接する半導体素子の最上面より上にあるよう前
記ピックアップ領域に設けた段差を有することを特徴と
する半導体素子のピックアップ装置。
An adhesive tape having an adhesive surface on the upper surface and on which a semiconductor wafer is attached and divided into individual semiconductor elements; a pickup area for semiconductor elements arranged on the lower side of the adhesive tape and to be picked up in the center; and the pickup area. A pickup device for a semiconductor device, comprising: a holder which has a downwardly inclined sloped region on the outside of the semiconductor device, and a holder which attracts the adhesive tape at the pickup region and the sloped region when picking up the semiconductor device; A pickup device for a semiconductor device, characterized in that the pickup region has a step provided so that the bottom surface of the semiconductor device on the pickup region is above the top surface of an adjacent semiconductor device.
JP63219311A 1988-08-31 1988-08-31 Pickup device of semiconductor element Pending JPH0266957A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63219311A JPH0266957A (en) 1988-08-31 1988-08-31 Pickup device of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63219311A JPH0266957A (en) 1988-08-31 1988-08-31 Pickup device of semiconductor element

Publications (1)

Publication Number Publication Date
JPH0266957A true JPH0266957A (en) 1990-03-07

Family

ID=16733499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63219311A Pending JPH0266957A (en) 1988-08-31 1988-08-31 Pickup device of semiconductor element

Country Status (1)

Country Link
JP (1) JPH0266957A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5589029A (en) * 1994-07-21 1996-12-31 Matsushita Electric Industrial Co., Ltd. Semiconductor chip-supply method and apparatus
US6201306B1 (en) * 1995-12-05 2001-03-13 Kabushiki Kaisha Toshiba Push-up pin of a semiconductor element pushing-up device, and a method for separating
US6824643B2 (en) * 2001-10-23 2004-11-30 Fujitsu Limited Method and device of peeling semiconductor device using annular contact members
JP2008270417A (en) * 2007-04-18 2008-11-06 Canon Machinery Inc Device and method for manufacturing semiconductor device
US11642510B2 (en) 2012-06-15 2023-05-09 Carefusion 303, Inc. Fluid flow control by a non-pinching valve

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5589029A (en) * 1994-07-21 1996-12-31 Matsushita Electric Industrial Co., Ltd. Semiconductor chip-supply method and apparatus
US6201306B1 (en) * 1995-12-05 2001-03-13 Kabushiki Kaisha Toshiba Push-up pin of a semiconductor element pushing-up device, and a method for separating
US6555418B2 (en) 1995-12-05 2003-04-29 Kabushiki Kaisha Toshiba Method for separating a semiconductor element in a semiconductor element pushing-up device
US6824643B2 (en) * 2001-10-23 2004-11-30 Fujitsu Limited Method and device of peeling semiconductor device using annular contact members
JP2008270417A (en) * 2007-04-18 2008-11-06 Canon Machinery Inc Device and method for manufacturing semiconductor device
US11642510B2 (en) 2012-06-15 2023-05-09 Carefusion 303, Inc. Fluid flow control by a non-pinching valve
US12171976B2 (en) 2012-06-15 2024-12-24 Carefusion 303, Inc. Fluid flow control by a non-pinching valve

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