JPH0262297A - Integrated circuit device and ic card using same - Google Patents
Integrated circuit device and ic card using sameInfo
- Publication number
- JPH0262297A JPH0262297A JP63213996A JP21399688A JPH0262297A JP H0262297 A JPH0262297 A JP H0262297A JP 63213996 A JP63213996 A JP 63213996A JP 21399688 A JP21399688 A JP 21399688A JP H0262297 A JPH0262297 A JP H0262297A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- resin layer
- card
- circuit device
- thin metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910052751 metal Inorganic materials 0.000 claims abstract description 72
- 239000002184 metal Substances 0.000 claims abstract description 72
- 229920005989 resin Polymers 0.000 claims abstract description 45
- 239000011347 resin Substances 0.000 claims abstract description 45
- 239000004840 adhesive resin Substances 0.000 claims abstract description 25
- 229920006223 adhesive resin Polymers 0.000 claims abstract description 25
- 238000007789 sealing Methods 0.000 claims description 38
- 238000000034 method Methods 0.000 abstract description 13
- 230000008595 infiltration Effects 0.000 abstract description 6
- 238000001764 infiltration Methods 0.000 abstract description 6
- 230000006866 deterioration Effects 0.000 abstract description 5
- 239000000853 adhesive Substances 0.000 abstract description 3
- 230000001070 adhesive effect Effects 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000010438 heat treatment Methods 0.000 abstract description 2
- 238000007650 screen-printing Methods 0.000 abstract description 2
- 238000004299 exfoliation Methods 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
- 239000004033 plastic Substances 0.000 description 9
- 229920003023 plastic Polymers 0.000 description 9
- 238000007747 plating Methods 0.000 description 8
- 238000005452 bending Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 239000012778 molding material Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 238000001721 transfer moulding Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910000640 Fe alloy Inorganic materials 0.000 description 1
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 210000003127 knee Anatomy 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000010970 precious metal Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
Landscapes
- Credit Cards Or The Like (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は例えばICカード等に用いられる集積回路装置
およびそれを用いたICカードに関する、ものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an integrated circuit device used, for example, in an IC card, and an IC card using the integrated circuit device.
従来の技術
近年ハ、マイクロコンピュータ、メモリ等の集積回路素
子をプラスチック製カードに搭載まだは内蔵したいわゆ
るICカードが実用に供されつつある。BACKGROUND OF THE INVENTION In recent years, so-called IC cards, in which integrated circuit elements such as microcomputers and memories are mounted on plastic cards, have been put into practical use.
このICカードは、すでに多量に使用されている磁気ス
トライプカードに比して、記憶容量が大きく防犯性に優
れていることから、従来の磁気ストライプカードの用途
ばかりでなく身分証明書等多様な用途に使用することが
考えられている。This IC card has a larger storage capacity and better security than the magnetic stripe cards that are already widely used, so it can be used not only for conventional magnetic stripe cards but also for a variety of other purposes such as identification cards. It is considered to be used for.
ところで、ICカードは、塩化ビニル樹脂等のプラスチ
ックカードに、リーダー・ライター等の外部装置との接
続用端子を有する集積回路装置が搭載された構成であシ
、この集積回路装置は、極めて薄型に構成することが必
要とされる。By the way, an IC card is a plastic card made of vinyl chloride resin or the like and has an integrated circuit device mounted thereon that has terminals for connecting to external devices such as a reader/writer, and this integrated circuit device can be made extremely thin. configuration is required.
ICカードにも多くの種類があるが、従来の磁気ストラ
イプカードと同じ寸法のICカードの規格化がrso(
国際標準化機構)で検討されている。There are many types of IC cards, but the standardization of IC cards with the same dimensions as conventional magnetic stripe cards is RSO (
International Organization for Standardization).
以下、従来のICカード及びこのカードに用いられる集
積回路装置について添付図面を参照しながら説明する。Hereinafter, a conventional IC card and an integrated circuit device used in this card will be explained with reference to the accompanying drawings.
第3図は工Cカードの斜視図、第4図は第3図における
ムーム′断面であり、集積回路装置の周辺を示す断面図
、第6図は従来の回路基板を用いた集積回路装置の縦断
面図である。Fig. 3 is a perspective view of the engineering C card, Fig. 4 is a cross-section of the Moom' in Fig. 3, showing the periphery of the integrated circuit device, and Fig. 6 is a cross-sectional view of the integrated circuit device using a conventional circuit board. FIG.
従来、ICカードの製造方法や構成には数多くの方法が
行われているが、たとえば、第3図および第4図に示す
ように、シート状の厚さ780μm程度の薄いプラスチ
ックカード1に、エンドミルやトムソン金型などを用い
て、集積回路装置30の大きさよりやや大きな穴2を設
け、プラスチックカード1よりやや薄い厚みの集積回路
装置30を挿入し、外部接続用端子32が露出するよう
に接着加工を施し、埋設して作成する。Conventionally, many methods have been used for manufacturing and configuring IC cards. For example, as shown in FIGS. Using a mold or Thomson mold, etc., make a hole 2 slightly larger than the size of the integrated circuit device 30, insert the integrated circuit device 30, which is slightly thinner than the plastic card 1, and glue it so that the external connection terminal 32 is exposed. Created by processing and burying.
従来の集積回路装置は、第6図に示すように、フィルム
状の絶縁基板31に外部接続用端子パターン32、回路
パターン33およびスルーホール34等の回路導体を形
成した薄型回路基板に、集積回路素子36をダイボンデ
ィングし、集積回路素子36の入出力電極と回路パター
ン33とをワイヤーボンディング方式等により金属線3
6で接続する。また樹脂封止時の樹脂流れ止め用の封止
枠37を回路基板に接着して設け、エポキシ樹脂等の封
止材38により封止して得られる。As shown in FIG. 6, a conventional integrated circuit device has an integrated circuit mounted on a thin circuit board in which circuit conductors such as an external connection terminal pattern 32, a circuit pattern 33, and a through hole 34 are formed on a film-like insulating substrate 31. The element 36 is die-bonded, and the input/output electrodes of the integrated circuit element 36 and the circuit pattern 33 are connected to the metal wire 3 by a wire bonding method or the like.
Connect with 6. Further, a sealing frame 37 for preventing resin flow during resin sealing is provided by adhering to the circuit board, and the circuit board is sealed with a sealing material 38 such as epoxy resin.
(特開昭55−56647号公報、特開昭68−925
97号公報)
また、前述のような高精度な精密回路基板を必要としな
い従来の集積回路装置として、金属薄板を所望形状に加
工したリードフレームを用い、リードフレームの片方の
一面を外部接続用端子とし、他面に集積回路素子を搭載
し、集積回路素子の入出力電極とリードフレームの他面
とを金属線で電気的に接続し、リードフレームの集積回
路素子側の而を封止樹脂で被覆した集積回路装置がある
。(Unexamined Japanese Patent Publication No. 55-56647, Unexamined Japanese Patent Publication No. 68-925
In addition, as a conventional integrated circuit device that does not require a high-precision precision circuit board as described above, a lead frame made of a thin metal plate processed into a desired shape is used, and one side of the lead frame is used for external connection. The integrated circuit element is mounted on the other side as a terminal, the input/output electrodes of the integrated circuit element and the other side of the lead frame are electrically connected with metal wires, and the integrated circuit element side of the lead frame is sealed with resin. There are integrated circuit devices coated with
(特開昭54−69068号公報、特開昭63−338
53号公報)
発明が解決しようとする課題
ICカードに搭載される集積回路装置においては、高信
頼性、薄型化と同時に、高寸法精度さらに低コストであ
ることが求められている。しかしながら、前述したよう
な回路基板を用いた集積回路装置においては、用いられ
る回路基板が、絶縁基板31の両面に配線導体を形成し
スルーホール34によって接続したスルーホール付両面
回路基板であるので次のような問題を有している。■回
路基板が高価である。■絶縁基板31の厚さのバラツギ
やスルーホール形成時のめつき厚のバラツキが回路基板
の総厚のバラツキとなり、良好な厚さ寸法精度が得にく
い。■集積回路素子36の樹脂封止時に、樹脂がスルー
ホール34より流出するので、流出防止のためスルーホ
ール34を封口する手段が必要である。(Unexamined Japanese Patent Publication No. 54-69068, Unexamined Japanese Patent Publication No. 63-338
53 Publication) Problems to be Solved by the Invention Integrated circuit devices mounted on IC cards are required to have high reliability, thinness, high dimensional accuracy, and low cost. However, in the integrated circuit device using the circuit board as described above, the circuit board used is a double-sided circuit board with through holes in which wiring conductors are formed on both sides of the insulating board 31 and connected through the through holes 34. It has the following problems. ■Circuit boards are expensive. (2) Variations in the thickness of the insulating substrate 31 and variations in the plating thickness when forming through holes cause variations in the total thickness of the circuit board, making it difficult to obtain good thickness dimensional accuracy. (2) When the integrated circuit element 36 is sealed with resin, the resin flows out from the through hole 34, so a means for sealing the through hole 34 is required to prevent the resin from flowing out.
一方、金属薄板を所望形状に加工したリードフレームを
用い、リードフレームの片方の一面を外部接続用端子と
し、他面に集積回路素子を搭載し、集積回路素子の入出
力電極とリードフレームの他面を金属線で電気的に接続
し、リードフレームの集積回路素子側の面を封止樹脂で
被覆した集積回路装置は、前述のような高精度な精密回
路基板を必要としないので、高寸法精度でかつ高能率に
製造できしかも安価な集積回路装置であるという長所が
ある。On the other hand, a lead frame made by processing a thin metal plate into a desired shape is used, one side of the lead frame is used as an external connection terminal, and the other side is equipped with an integrated circuit element, and the input/output electrodes of the integrated circuit element and the other side of the lead frame are used. Integrated circuit devices, whose surfaces are electrically connected with metal wires and whose surfaces on the integrated circuit element side of the lead frame are covered with sealing resin, do not require the high-precision precision circuit boards mentioned above, so they have high dimensions. It has the advantage of being an inexpensive integrated circuit device that can be manufactured with precision and high efficiency.
しかしながら、上記の金属薄板を用いた集積回路装置に
おいては、この集積回路装置を塩化ビニル樹脂等のプラ
スチックカードに搭載してICカードとして使用する際
、金属薄板と封止樹脂との密着性が極めて重要であり、
密着性が不十分な場合には、ICカードの使用時および
携帯時にカードが折り曲げられ機械的外力を受け、金属
薄板の剥離、脱落等の問題や、金属薄板と封止樹脂との
界面からの水分等の浸入による集積回路素子の劣化が起
こり、ICカードとして実用に耐え得ないという問題が
ある。However, in the integrated circuit device using the above metal thin plate, when this integrated circuit device is mounted on a plastic card such as vinyl chloride resin and used as an IC card, the adhesion between the metal thin plate and the sealing resin is extremely poor. important,
If the adhesion is insufficient, when the IC card is used or carried, the card will be bent and subjected to mechanical external force, resulting in problems such as peeling or falling off of the thin metal plate, or problems such as damage from the interface between the thin metal plate and the sealing resin. There is a problem in that the integrated circuit element deteriorates due to the infiltration of moisture and the like, making it unsuitable for practical use as an IC card.
本発明は、上記問題点に鑑みてなされたもので、高寸法
精度、高能率かつ安価に製造でき、しかもカードに搭載
してICカードとした場合、信頼性が高い薄型の集積回
路装置およびICカードを提供するものである。The present invention has been made in view of the above problems, and is a thin integrated circuit device and an IC that can be manufactured with high dimensional accuracy, high efficiency, and low cost, and that is highly reliable when mounted on a card to form an IC card. It provides a card.
課題を解決するだめの手段
上記課題を解決するために、本発明の集積回路装置は、
一面の少なくとも一部が外部接続用端子となり、これら
が略同一面をなす複数の金属薄板と、これらの金属薄板
の他面に設けられた接着樹脂層の一部に搭載されるとと
もに、その入出力電極がこれらの金属薄板の他面に電気
的に接続された集積回路素子と、前記金属薄板の他面側
において、少なくともmJ記記構積回路素子よびその入
出力電極と前記金属薄板の他面との電気的接続部を覆っ
た封止樹脂とを備え、前記接着樹脂層は、前記電気的接
続部を除いて前記金属薄板の他面の大部分に設けたもの
である。Means for Solving the Problems In order to solve the above problems, the integrated circuit device of the present invention includes:
At least a portion of one surface serves as an external connection terminal, and these are mounted on a plurality of thin metal plates that are substantially on the same surface and a portion of the adhesive resin layer provided on the other side of these thin metal plates, and the input terminals are an integrated circuit element whose output electrodes are electrically connected to the other surface of these thin metal plates, and at least an integrated circuit element with mJ written on the other side of the thin metal plates, its input/output electrodes, and the other side of the thin metal plates. and a sealing resin that covers an electrically connected portion with the surface, and the adhesive resin layer is provided on most of the other surface of the thin metal plate except for the electrically connected portion.
作用
本発明は、上記した構成によって、従来用いられていた
高価な精密回路基板を必要とせず、安価で極めて一般的
なリードフレーム形状に加工された金属薄板が使用でき
、集積回路装置として安価となるばかりでなく、ICカ
ードに適した薄型の集積回路装置として、高寸法精度か
つ高能率に製造できる構成である。また、封止樹脂を金
属薄板の他面に直接形成する場合には、封止成形時の型
離れを良くするために封止樹脂中に添加されているワッ
クス等の離型剤により、封止樹脂と金属薄板との密着性
は充分な強度が得難いが、上記した構成のように、金属
薄板の他面の大部分に設けた接着樹脂層を介して、封止
樹脂を金属薄板に密着形成することにより、その密着性
は著しく向上し、この集積回路装置をプラスチックカー
ドに搭載してICカードとして使用する際に、機械的外
力を受けても、金属薄板の剥離、脱落等の問題や、金属
薄板と封止樹脂との界面からの水分等の浸入による集積
回路素子の劣化の問題が発生しにくく、ICカードに適
した極めて信頼性の高い集積回路装置となる。Effect of the Invention With the above-described configuration, the present invention does not require the expensive precision circuit board used in the past, and can use a thin metal plate processed into an inexpensive and extremely common lead frame shape, making it possible to use an inexpensive integrated circuit device. In addition, it has a configuration that allows it to be manufactured with high dimensional accuracy and high efficiency as a thin integrated circuit device suitable for IC cards. In addition, when forming the sealing resin directly on the other side of the thin metal plate, a release agent such as wax added to the sealing resin is used to improve the mold release during sealing molding. Although it is difficult to obtain sufficient adhesion strength between the resin and the thin metal plate, as in the above configuration, the sealing resin can be formed in close contact with the thin metal plate through an adhesive resin layer provided on most of the other side of the thin metal plate. By doing so, the adhesion is significantly improved, and when this integrated circuit device is mounted on a plastic card and used as an IC card, even if it is subjected to external mechanical force, there will be no problems such as peeling or falling off of the thin metal plate, etc. The problem of deterioration of the integrated circuit element due to the infiltration of moisture etc. from the interface between the thin metal plate and the sealing resin is less likely to occur, resulting in an extremely reliable integrated circuit device suitable for IC cards.
実施例
以下、本発明の一実施例の集積回路装置について、図面
を参照しながら説明する。Embodiment Hereinafter, an integrated circuit device according to an embodiment of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例における集積回路装置の平面
図であり、説明のため封止樹脂は外形のみを図示してい
る。第2図は本発明の一実施例における集積回路装置の
縦断面図であシ、第1図のB−B’線での縦断面図であ
る。第1図および第2図において、11は金属薄板、1
2は接着樹脂層、13は集積回路素子、14は金属線、
16は封止樹脂である。FIG. 1 is a plan view of an integrated circuit device according to an embodiment of the present invention, and for the sake of explanation, only the outer shape of the sealing resin is shown. FIG. 2 is a longitudinal sectional view of an integrated circuit device according to an embodiment of the present invention, and is a longitudinal sectional view taken along line BB' in FIG. In FIGS. 1 and 2, 11 is a thin metal plate;
2 is an adhesive resin layer, 13 is an integrated circuit element, 14 is a metal wire,
16 is a sealing resin.
本実施例の集積回路装置の構成について、その製造方法
とともに以下に詳細に説明する。The configuration of the integrated circuit device of this example will be described in detail below along with its manufacturing method.
まず、板厚0.15 mの帯状の銅合金からなる金属素
材を打抜加工またはフォトエツチング加工を行なって、
所望のリードフレーム形状とし、この一方の面を外部接
続用端子112Lとするため、(ICカード用集積回路
装置の外部接続用端子は接触による接続端子であるので
)この一方の面に、ニッケルの下地メツキおよび金メツ
キを施こし、他方の面に、ワイヤーボンディング法によ
り金属線を接続するために、ニッケルの下地メツキのの
ち接続部に部分的に銀メツキまたは金メツキを施こし、
金属薄板11を作成した。なお、帯状の金属素材として
は、鉄や鉄・ニッケル合金等数多くのリードフレーム用
金属素材が使用でき、外部接続用端子面のメツキは、全
以外に接触端子として信頼性が確保できる白金、ロジウ
ム等の貴金属の、メツキを施こしてもよい。First, a strip-shaped metal material made of copper alloy with a thickness of 0.15 m was punched or photoetched.
In order to form the lead frame into the desired shape and use one side as the external connection terminal 112L (since the external connection terminal of an IC card integrated circuit device is a contact connection terminal), a nickel layer is applied to this one side. Undercoat plating and gold plating are applied, and on the other side, in order to connect metal wires by wire bonding, after the nickel undercoat plating, silver plating or gold plating is applied partially to the connection part,
A thin metal plate 11 was created. Many lead frame metal materials such as iron and iron-nickel alloys can be used as the band-shaped metal material, and the plating on the external connection terminal surface can be made of platinum or rhodium, which ensure reliability as a contact terminal. Plating of precious metals such as metals may be applied.
次に、金属薄板11の他方の而11bの後述する金属線
14をワイヤーボンディングするための電気的接続部1
1Cを除いた大部分に、絶縁性樹脂からなる接着剤を用
いて接着樹脂層12を形成した。接着樹脂層12の形成
は、スクリーン印刷法により行ない、パターン形状は、
金属薄板11の他方の而11bの形状よりわずかに小さ
く、電電的接続部110を除いた形状とした。接着樹脂
層12の厚みは、印刷後で約40μmとした。つづいて
、集積回路素子13を接着樹脂層12の所定位置に搭載
し、接着樹脂層12を加熱硬化して接着固定した。接着
樹脂層12として絶縁性樹脂を用いたのは、金属薄板の
外部接続用端子の位置、寸法に対して集積回路素子が大
であり各外部接続用端子にまたがって搭載した時に電気
的な短絡を防止するためであり、絶縁性樹脂を用い、各
外部接続用端子にまたがって集積回路素子13を搭載す
ることにより、搭載される集積回路素子13の寸法的な
制約および外部接続用端子112Lの位置、寸法に対す
る制約が、ともに大幅に軽減された。Next, the electrical connection part 1 for wire bonding the metal wire 14, which will be described later, on the other side 11b of the thin metal plate 11.
An adhesive resin layer 12 was formed on most of the area except for 1C using an adhesive made of an insulating resin. The adhesive resin layer 12 is formed by screen printing, and the pattern shape is as follows.
The shape is slightly smaller than that of the other thin metal plate 11b, excluding the electrical connection portion 110. The thickness of the adhesive resin layer 12 was approximately 40 μm after printing. Subsequently, the integrated circuit element 13 was mounted on the adhesive resin layer 12 at a predetermined position, and the adhesive resin layer 12 was cured by heating to be adhesively fixed. The reason why an insulating resin is used as the adhesive resin layer 12 is that the integrated circuit element is large compared to the position and dimensions of the external connection terminals on the thin metal plate, and when mounted across the external connection terminals, electrical short circuits may occur. By using an insulating resin and mounting the integrated circuit element 13 across each external connection terminal, the dimensional restrictions of the integrated circuit element 13 to be mounted and the external connection terminal 112L are avoided. Restrictions on both location and size have been significantly reduced.
次に、金属線14として直径25μmの金細線を用いて
、ワイヤーボンディング法により、集積回路素子13の
入出力電極13aと金属薄板11の他方の面11bの接
続部11Gとを電気的に接続した。この電気的な接続は
、金属線14による接続以外に、フリップチップ方式や
フィルムキャリア方式などのワイヤレスボンディング法
により行なうこともできる。Next, using a thin gold wire with a diameter of 25 μm as the metal wire 14, the input/output electrode 13a of the integrated circuit element 13 and the connection portion 11G on the other surface 11b of the thin metal plate 11 were electrically connected by wire bonding. . This electrical connection can be made by a wireless bonding method such as a flip chip method or a film carrier method other than the connection by the metal wire 14.
集積回路素子13の入出力電極13aと金属薄板11と
の必要な電気的接続を行なった後、エポキシ樹脂などの
封止成形材料を用いトランスフ1成形法で成形し、封止
樹脂16によシ集積回路素子13、金属線14および金
属薄板11の他方の面11b側を保護した。この後、リ
ードフレームの不要部分(図示せず)を切断除去した。After making the necessary electrical connections between the input/output electrodes 13a of the integrated circuit element 13 and the metal thin plate 11, they are molded using a sealing molding material such as epoxy resin by the transfer 1 molding method, and then molded with the sealing resin 16. The integrated circuit element 13, the metal wire 14, and the other surface 11b of the thin metal plate 11 were protected. After this, unnecessary portions (not shown) of the lead frame were cut and removed.
これにより第1図および第2図の本実施例の集積回路装
置が得られた。As a result, the integrated circuit device of this example shown in FIGS. 1 and 2 was obtained.
上記の封止樹脂16の形成方法について、さらに詳しく
説明する。集積回路素子13を搭載し接着固定し、金属
線14による必要な電気的接続を行なったリードフレー
ム形状の金属薄板11を、成形温度に加熱されたトラン
スファ成形の成形金型の下金型に外部接続用端子面を密
着させて当接し、下金型と上金型の型締めを行なったの
ち、エポキシ樹脂を主成分とし硬化剤、充填剤およびそ
の他の添加剤からなる封止成形材料を加熱加圧状態で金
型内に注入し、硬化のための一定時間保持したのち、ト
ランスファ成形金型よシ取り出して、封止樹脂15を形
成した。外部接続用端子111L而をトランスファ成形
金型の下金型に密着して当接させたのは、外部接続用端
子112L面への封止樹脂15の流れ込みを防止するた
めである。The method for forming the sealing resin 16 described above will be explained in more detail. A thin metal plate 11 in the shape of a lead frame, on which an integrated circuit element 13 is mounted and fixed with adhesive, and the necessary electrical connections are made with metal wires 14, is externally placed in the lower mold of a transfer molding mold heated to the molding temperature. After the connection terminal surfaces are brought into close contact and the lower mold and upper mold are clamped, the sealing molding material, which is mainly composed of epoxy resin and contains a curing agent, filler, and other additives, is heated. After being injected into a mold under pressure and held for a certain period of time for curing, the resin was taken out from the transfer molding mold to form a sealing resin 15. The reason why the external connection terminal 111L is brought into close contact with the lower mold of the transfer mold is to prevent the sealing resin 15 from flowing into the surface of the external connection terminal 112L.
第1図および第2図の本実施例の集積回路装置の寸法は
、タテ10朋、ヨコ12叫、4角の曲率半径1.5rf
anで、厚さ0.85mであり、極めて寸法精度が良く
、寸法のバラツキは、厚さ寸法で±1oμm以下であり
小さかった。厚さの各部寸法は、おおよそ金属薄板11
が0.15rrrm、集積回路素子13が0.25mm
、集積回路素子13の下の接着樹脂層12が0.03m
m、集積回路素子13上の封止樹脂16が0.22rr
anであった。The dimensions of the integrated circuit device of this embodiment shown in FIGS.
The thickness was 0.85 m, and the dimensional accuracy was extremely good, and the dimensional variation was small as the thickness was ±1 μm or less. The thickness of each part is approximately that of the thin metal plate 11.
is 0.15rrrm, and the integrated circuit element 13 is 0.25mm.
, the adhesive resin layer 12 under the integrated circuit element 13 is 0.03 m long.
m, the sealing resin 16 on the integrated circuit element 13 is 0.22rr
It was an.
また、第2図に示したように、本実施例の集積回路装置
では、外部接続用端子11&となる面の反対側の封止樹
脂16のコーナ一部分は、曲率半径約0.2朋の曲面と
した。これは、集積回路装置をプラスチックカードの穴
部に挿入接着して作成されたICカードが、折シ曲げら
れた場合に、集積回路装置のコーナ一部分によりプラス
チックカードの薄肉部分が破断されることを防止するた
めである。Further, as shown in FIG. 2, in the integrated circuit device of this embodiment, a portion of the corner of the sealing resin 16 on the opposite side to the surface that becomes the external connection terminal 11 is a curved surface with a radius of curvature of about 0.2 mm. And so. This prevents the thin wall part of the plastic card from being broken by a corner of the integrated circuit device when an IC card made by inserting and gluing an integrated circuit device into a hole in a plastic card is bent. This is to prevent this.
また、第2図に示したように、本実施例の集積回路装置
では、金属薄板11の外部接続用端子11&となる面と
この外部接続用端子111Lの周囲に表出した封止樹脂
16の面とは、略同一面としている。これは、外部接続
用端子面111Lを封止樹脂15より突出させた場合に
は、この集積回路装置を用いたICカードの携帯時およ
び使用時において、突出部分が外的な力を受けやすく、
これによって、金属薄板11の剥離や脱落等の問題を生
じやすく、また外部接続用端子11a面を封止樹脂よシ
後退させた場合には、ICカードのリーダー・ライター
等の外部装置の接触端子片との接触不良を生じやすく、
これらをさけるためである。In addition, as shown in FIG. 2, in the integrated circuit device of this embodiment, the sealing resin 16 is exposed around the surface of the thin metal plate 11 that becomes the external connection terminal 11& and around the external connection terminal 111L. The surface is approximately the same surface. This is because when the external connection terminal surface 111L is made to protrude from the sealing resin 15, the protruding portion is susceptible to external force when carrying and using an IC card using this integrated circuit device.
This tends to cause problems such as peeling or falling off of the thin metal plate 11, and if the surface of the external connection terminal 11a is moved back from the sealing resin, the contact terminal of an external device such as an IC card reader/writer etc. Easy to cause poor contact with the piece,
This is to avoid these.
なお、封止樹脂の形成方法について、エポキシ樹脂を主
成分とする封止成形材料を用いたトランスファ成形法を
説明したが、この他に、封止成形材料としてフェノール
系樹脂を用いてもよく、また、熱可塑性樹脂を用いた射
出成形法によシ行なうこともできる。Regarding the method of forming the sealing resin, a transfer molding method using a sealing molding material containing an epoxy resin as a main component has been described, but in addition to this, a phenolic resin may be used as the sealing molding material. It can also be carried out by injection molding using a thermoplastic resin.
以上のようにして得た本実施例の集積回路装置について
、耐環境性試験としてプレッシャークツカー試験(試験
条件;121°C,2気圧、100%RH,500時間
)および温度サイクル試験(試験条件ニー50’C,3
0分#100℃、30分、500サイクル)を行なった
結果、金属薄板11の浮きや剥離等の異常の発生はなく
、金属薄板11と封止樹脂15との界面からの水分等の
浸入による集積回路素子の劣化の問題も発生しなかった
。なお、同時に比較例とじて、接着樹脂層を金属薄板1
1の他面の大部分には設けず、集積回路素子の接着固定
部分のみに設けた集積回路装置を本実施例と同様な方法
で作成し、同様な耐環境性試験を行なった結果、プレッ
シャークツカー試験で10試料中1試料に集積回路素子
の不良が発生し、温度サイクル試験で、金属薄板と封止
樹脂との境界に間隙が発生した試料があった。Regarding the integrated circuit device of this example obtained as described above, as environmental resistance tests, a pressure couture test (test conditions: 121°C, 2 atm, 100% RH, 500 hours) and a temperature cycle test (test conditions knee 50'C, 3
As a result of performing 500 cycles at 100° C. for 0 minutes for 30 minutes, there were no abnormalities such as lifting or peeling of the thin metal plate 11, which was caused by the infiltration of moisture etc. from the interface between the thin metal plate 11 and the sealing resin 15. No problem of deterioration of integrated circuit elements occurred. At the same time, as a comparative example, the adhesive resin layer was
An integrated circuit device in which the integrated circuit device was not provided on most of the other surface of 1 but only on the adhesively fixed part of the integrated circuit element was fabricated using the same method as in this example, and the same environmental resistance test was conducted. In the Kutzker test, 1 out of 10 samples had a defective integrated circuit element, and in the temperature cycle test, some samples had a gap at the boundary between the thin metal plate and the sealing resin.
また、本実施例の集積回路装置を、穴部を設けたプラス
チックカードに搭載接着してICカードt−作成し、こ
のICカードについて耐折り曲げ性試験を行なった。耐
折り曲げ性試験の試験方法および試験条件は、カード基
体の長辺方向および短辺方向のそれぞれについて、表裏
面各250回、合計1000回の折り曲げを行ない、折
り曲げ時のたわみ寸法が、長辺方向折り曲げ時20mm
、短辺方向折シ曲げ時10mmとなる条件で行なった。Further, the integrated circuit device of this example was mounted and adhered on a plastic card provided with a hole to prepare an IC card, and a bending resistance test was conducted on this IC card. The test method and test conditions for the bending resistance test are as follows: The front and back sides of the card base are bent 250 times each, for a total of 1,000 times in each of the long and short sides of the card base. 20mm when bent
The bending process was carried out under conditions such that the bending distance in the short side direction was 10 mm.
耐折り曲げ性試験の結果、本実施例の集積回路装置を用
いたICカードは、全て異常が発生しなかった。As a result of the bending resistance test, no abnormality occurred in any of the IC cards using the integrated circuit device of this example.
以上のように、本実施例の集積回路装置は、金属薄板1
1の他面11bの電気的接続部を除いた大部分接着樹脂
層12に設け、その後に、集積回路素子13、金属線1
4および金属薄板11の他面11b側を保護するための
封止樹脂を設けたので、封止樹脂15と金属薄板11と
の密着性は著しく向上し、苛酷な環境や機械的外力を受
けても金属薄板11の浮き、剥離等の問題や、界面から
の水分等の浸入による集積回路素子13の劣化の問題が
発生しない信頼性の集積回路装置となった。As described above, the integrated circuit device of this embodiment has a thin metal plate 1
1, most of the other surface 11b of the adhesive resin layer 12, excluding the electrical connection portion, is provided on the adhesive resin layer 12, and then the integrated circuit element 13, the metal wire 1
4 and the other surface 11b of the thin metal plate 11, the adhesion between the sealing resin 15 and the thin metal plate 11 is significantly improved, and the sealing resin 15 can be protected against harsh environments or mechanical external forces. Also, a reliable integrated circuit device is obtained in which problems such as lifting and peeling of the thin metal plate 11 and deterioration of the integrated circuit element 13 due to infiltration of moisture from the interface do not occur.
また、この集積回路装置を用いたICカードも、ICカ
ードとして信頼性の高いものとなった。Moreover, an IC card using this integrated circuit device has also become highly reliable as an IC card.
発明の効果
以上のように本発明は、一面の少なくとも一部が外部接
続用端子となり、これらが略同一面をなす複数の金属薄
板と、これらの金属薄板の他面に設けられた接着樹脂層
の一部に搭載されるとともに、その入出力電極がこれら
の金属薄板の他面に電気的に接続された集積回路素子と
、前記金属薄板の他面側において、少なくとも前記集積
回路素子およびその入出力電極と前記金属薄板の他面と
の電気的接続部を覆った封止樹脂とを備え、前記接着樹
脂層は、前記電気的接続部を除いて前記金属薄板の他面
の大部分に設けたものである。このため従来用いられて
いた高価な精密回路基板を必要とせず、安価で極めて一
般的なリードフレーム形状に加工された金属薄板が使用
でき、集積回路装置として安価となるばかりでなく、I
Cカードに適した薄型の集積回路装置として、高寸法精
度かつ高能率に製造できる構成であるとともに、封止樹
脂を金属薄板の他面に直接形成するのと異なり、金属薄
板の他面の大部分に設けた接着樹脂層を介して、封止樹
脂は金属薄板に密着して形成されるので、その密着性は
著しく向上し、この集積回路装置をプラスチックカード
に搭載してICカードとして使用する際に、機械的外力
を受けても、金属薄板の剥離、脱落等の問題や、金属薄
板の封止樹脂との界面からの水分等の浸入による集積回
路素子の劣化の問題が発生しにくいものとなる。Effects of the Invention As described above, the present invention comprises a plurality of metal thin plates, each of which has at least a portion of one surface serving as an external connection terminal, and which are substantially on the same surface, and an adhesive resin layer provided on the other surface of these metal thin plates. an integrated circuit element mounted on a part of the thin metal plate and having input/output electrodes electrically connected to the other side of the thin metal plate; a sealing resin that covers an electrical connection between the output electrode and the other surface of the thin metal plate, and the adhesive resin layer is provided on most of the other surface of the thin metal plate except for the electrical connection. It is something that Therefore, there is no need for the expensive precision circuit board used in the past, and instead a thin metal plate processed into an inexpensive and extremely common lead frame shape can be used, which not only makes the integrated circuit device inexpensive but also
As a thin integrated circuit device suitable for C cards, it has a structure that can be manufactured with high dimensional accuracy and high efficiency, and unlike forming the sealing resin directly on the other surface of a thin metal sheet, Since the sealing resin is formed in close contact with the thin metal plate through the adhesive resin layer provided on the part, the adhesion is significantly improved, and this integrated circuit device can be mounted on a plastic card and used as an IC card. Even when subjected to external mechanical force, problems such as peeling or falling off of the thin metal plate, and problems of deterioration of the integrated circuit element due to infiltration of moisture etc. from the interface between the thin metal plate and the sealing resin are unlikely to occur. becomes.
第1図は本発明の一実施例における集積回路装置の平面
図、第2図は本発明の一実施例における集積回路装置の
縦断面図、第3図はICカードの斜視図、第4図は第3
図のICカードの一部の縦断面図、第6図は従来の集積
回路装置の縦断面図である。
11・・・・・・金属薄板、12・・・・・・接着樹脂
層、13・・・・・・集積回路素子、14・・・・・・
金属線、16・・・・・・封止樹脂。
代理人の氏名 弁理士 粟 野 重 孝 ほか1名11
−・
+3−m−
ta 薄 板
侵看樹11層
烏 fl 回 路 零
全a糟
村上領脂
子
///1
31 3’1 3334FIG. 1 is a plan view of an integrated circuit device according to an embodiment of the present invention, FIG. 2 is a vertical cross-sectional view of an integrated circuit device according to an embodiment of the present invention, FIG. 3 is a perspective view of an IC card, and FIG. 4 is the third
FIG. 6 is a vertical cross-sectional view of a part of the IC card shown in the figure, and FIG. 6 is a vertical cross-sectional view of a conventional integrated circuit device. 11...Thin metal plate, 12...Adhesive resin layer, 13...Integrated circuit element, 14...
Metal wire, 16...Sealing resin. Name of agent: Patent attorney Shigetaka Awano and 1 other person11
-.
Claims (2)
、これらが略同一面をなす複数の金属薄板と、これらの
金属薄板の他面に設けられた接着樹脂層の一部に搭載さ
れるとともに、その入出力電極がこれらの金属薄板の他
面に電気的に接続された集積回路素子と、前記金属薄板
の他面側において、少なくとも前記集積回路素子および
その入出力電極と前記金属薄板の他面との電気的接続部
を覆った封止樹脂とを備え、前記接着樹脂層は、前記電
気的接続部を除いて、前記金属薄板の他面の大部分に設
けられた集積回路装置。(1) At least a portion of one surface serves as an external connection terminal, and these are mounted on a plurality of thin metal plates substantially on the same surface and a portion of an adhesive resin layer provided on the other surface of these thin metal plates. , an integrated circuit element whose input/output electrodes are electrically connected to the other surface of these thin metal plates; a sealing resin that covers an electrically connected portion with the surface, and the adhesive resin layer is provided on most of the other surface of the thin metal plate except for the electrically connected portion.
Cカード。(2) An I in which the integrated circuit device of claim 1 is mounted on a card.
C card.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63213996A JPH0262297A (en) | 1988-08-29 | 1988-08-29 | Integrated circuit device and ic card using same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63213996A JPH0262297A (en) | 1988-08-29 | 1988-08-29 | Integrated circuit device and ic card using same |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0262297A true JPH0262297A (en) | 1990-03-02 |
Family
ID=16648530
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63213996A Pending JPH0262297A (en) | 1988-08-29 | 1988-08-29 | Integrated circuit device and ic card using same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0262297A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH07108138A (en) * | 1993-10-12 | 1995-04-25 | Agency Of Ind Science & Technol | Hazardous gas removal device |
WO1997019463A3 (en) * | 1995-11-21 | 1997-08-14 | Siemens Ag | Chip module |
JPH1046512A (en) * | 1996-08-06 | 1998-02-17 | Mitsubishi Materials Corp | Nox purifying block for pavement |
FR2794267A1 (en) * | 1999-05-27 | 2000-12-01 | Gemplus Card Int | PORTABLE DEVICE WITH INTEGRATED CIRCUIT, CHIP CARD TYPE OF REDUCED SIZE COMPARED TO THE STANDARD SIZE OF SMART CARDS AND MANUFACTURING PROCESS |
US6288904B1 (en) | 1996-09-30 | 2001-09-11 | Infineon Technologies Ag | Chip module, in particular for implantation in a smart card body |
US6498000B2 (en) | 1993-06-28 | 2002-12-24 | Ishihara Sangyo Kaisha, Ltd. | Photocatalyst composite and process for producing the same |
-
1988
- 1988-08-29 JP JP63213996A patent/JPH0262297A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6498000B2 (en) | 1993-06-28 | 2002-12-24 | Ishihara Sangyo Kaisha, Ltd. | Photocatalyst composite and process for producing the same |
JPH07108138A (en) * | 1993-10-12 | 1995-04-25 | Agency Of Ind Science & Technol | Hazardous gas removal device |
WO1997019463A3 (en) * | 1995-11-21 | 1997-08-14 | Siemens Ag | Chip module |
JPH1046512A (en) * | 1996-08-06 | 1998-02-17 | Mitsubishi Materials Corp | Nox purifying block for pavement |
US6288904B1 (en) | 1996-09-30 | 2001-09-11 | Infineon Technologies Ag | Chip module, in particular for implantation in a smart card body |
FR2794267A1 (en) * | 1999-05-27 | 2000-12-01 | Gemplus Card Int | PORTABLE DEVICE WITH INTEGRATED CIRCUIT, CHIP CARD TYPE OF REDUCED SIZE COMPARED TO THE STANDARD SIZE OF SMART CARDS AND MANUFACTURING PROCESS |
WO2000073987A1 (en) * | 1999-05-27 | 2000-12-07 | Gemplus | Portable integrated circuit device with a reduced format chip card in comparison with standard chip cards and method for the production thereof |
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