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JPH01291421A - Vapor growth apparatus - Google Patents

Vapor growth apparatus

Info

Publication number
JPH01291421A
JPH01291421A JP12060388A JP12060388A JPH01291421A JP H01291421 A JPH01291421 A JP H01291421A JP 12060388 A JP12060388 A JP 12060388A JP 12060388 A JP12060388 A JP 12060388A JP H01291421 A JPH01291421 A JP H01291421A
Authority
JP
Japan
Prior art keywords
susceptor
substrate
facing part
groove
counterbore
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12060388A
Other languages
Japanese (ja)
Inventor
Takashi Haraguchi
貴史 原口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP12060388A priority Critical patent/JPH01291421A/en
Publication of JPH01291421A publication Critical patent/JPH01291421A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To bring a crystalline substrate into close contact with a carbon susceptor and to form a thin uniform film by forming a spot facing part for holding the substrate in a reaction vessel, and providing a susceptor formed with a groove on the periphery of the facing part and heating means for heating the susceptor to a predetermined temperature. CONSTITUTION:A carbon susceptor 5 supported by a supporting rod 7 is mounted substantially at the center of a reaction tube 1. A spot facing part 8 slightly larger than a crystalline substrate 3 is formed on the susceptor 5, and the depth of the facing part 8 is formed substantially equally to the thickness of the substrate 3. A groove 11 deeper than the facing part 8 is formed on the periphery of the facing part 8. Thus, since reactive product is dropped and collected in the groove 1, the substrate 3 is always brought into contact with the susceptor 5, heat is preferably transferred from the susceptor 5 heated to a predetermined temperature by using a high frequency coil 4, and the temperature distribution of the substrate 3 can be uniformly kept at the predetermined temperature. Thus, the thickness of the thin film grown on the substrate 3 can be made uniform.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は化合物半導体等の製造に用いる気相成長装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a vapor phase growth apparatus used for manufacturing compound semiconductors and the like.

(従来の技術) ヘテロ構造の化合物半導体を製造するために従来よく使
われている気相成長装置を第3図を用いて説明する0石
英反応管1の中には支持棒7によって支えられたカーボ
ンサセプタ5があり、その上に結晶基板3の載せられて
いる。通常カーボンサセプタ5は高周波コイル4によっ
て700〜800℃に昇温されそれによって結晶基板3
も同温度に保たれる。そこへガス導入口2から反応ガス
が導入され、結晶基板上で反応成長する。しかしここで
反応ガス全部反応し成長するわけではなく、残った反応
ガスは主に反応管壁面9や下部6に反応生成物として付
着する。カーボンサセプタ5の表面は結晶基板を保持す
るために座ぐり部8が設けられ、その座ぐり面は結晶基
板3の厚さとほぼ同じ深さでかつ平面をなしており、そ
の理由はカーボンサセプタ5の熱を結晶基板3に均一に
伝えるためである。座ぐり部8の直径は結晶基板3より
もわずかに大きいため、第4図に示すようにすき間lO
が生ずる。反応生成物はこのすき間にも入り込み、わず
かに堆積する。気相成長が終了し結晶基板3を取り替え
て別の結晶基板を同様にカーボンサセプタ5にのせた時
に座ぐり部8の周辺に反応生成物が堆積していると結晶
基板3が座ぐり面に密着しない欠点がある。第4図は結
晶基板3と座ぐり部8の要部拡大断面を示している。結
晶基板3と座ぐり部8が密着しないとカーボンサセプタ
5から結晶基板3に均一に熱が伝わらないため結晶基板
3の温度分布が不均一になり均一な膜厚の薄膜が得られ
ない。
(Prior Art) A vapor phase growth apparatus commonly used in the past for manufacturing heterostructure compound semiconductors will be explained with reference to FIG. 3. A quartz reaction tube 1 is supported by a support rod 7 There is a carbon susceptor 5, on which a crystal substrate 3 is placed. Normally, the carbon susceptor 5 is heated to 700 to 800°C by the high frequency coil 4, and the crystal substrate 3 is heated to 700 to 800°C.
are also kept at the same temperature. A reaction gas is introduced therein from the gas inlet 2, and reacts and grows on the crystal substrate. However, not all of the reaction gas reacts and grows here, and the remaining reaction gas mainly adheres to the reaction tube wall surface 9 and lower part 6 as reaction products. A counterbore portion 8 is provided on the surface of the carbon susceptor 5 to hold the crystal substrate, and the counterbore surface has approximately the same depth as the thickness of the crystal substrate 3 and is flat.The reason for this is that the carbon susceptor 5 This is to uniformly transfer the heat to the crystal substrate 3. Since the diameter of the counterbore portion 8 is slightly larger than that of the crystal substrate 3, there is a gap lO as shown in FIG.
occurs. The reaction products also enter these gaps and accumulate slightly. When the vapor phase growth is completed and the crystal substrate 3 is replaced and another crystal substrate is similarly placed on the carbon susceptor 5, if reaction products are deposited around the counterbore portion 8, the crystal substrate 3 will be placed on the counterbore surface. There is a drawback that it does not stick tightly. FIG. 4 shows an enlarged cross-section of essential parts of the crystal substrate 3 and the counterbore portion 8. As shown in FIG. If the crystal substrate 3 and the counterbore portion 8 are not in close contact with each other, heat will not be uniformly transferred from the carbon susceptor 5 to the crystal substrate 3, and the temperature distribution of the crystal substrate 3 will become uneven, making it impossible to obtain a thin film with a uniform thickness.

(発明が解決しようとする課題) 以上述べたように結晶基板を保持するための座ぐり穴に
わずかに堆積する反応生成物により、結晶基板がサセプ
タに密着しないために基板の温度分布が不均一となり均
一な膜厚の薄膜が得られないという問題点がある。
(Problem to be solved by the invention) As mentioned above, due to reaction products slightly deposited in the counterbore for holding the crystal substrate, the crystal substrate does not come into close contact with the susceptor, resulting in uneven temperature distribution of the substrate. Therefore, there is a problem that a thin film having a uniform thickness cannot be obtained.

本発明は上記事情に鑑みてなされたものでその目的とす
るところは結晶基板をカーボンサセプタに密着するよう
な構造として、膜厚分布均一な薄膜の形成ができる気相
成長装置を提供することにある。
The present invention has been made in view of the above circumstances, and its purpose is to provide a vapor phase growth apparatus capable of forming a thin film with a uniform thickness distribution by having a structure in which a crystal substrate is closely attached to a carbon susceptor. be.

〔発明の構成〕[Structure of the invention]

(課題を解決するための手段) 本発明の気相成長装置においては、 反応容器と、 この反応容器内に反応ガスを導入するためのガス導入口
と。
(Means for Solving the Problems) The vapor phase growth apparatus of the present invention includes: a reaction vessel; and a gas introduction port for introducing a reaction gas into the reaction vessel.

前記反応容器外にガスを排出するガス排出口と、i膜が
形成される基板を保持するための座ぐり部が形成され、
この座ぐり部の周辺に溝部を形成したサセプタと、 このサセプタを所定温度に加熱する加熱手段とから成る
ことを特徴としている。
A gas outlet for discharging gas to the outside of the reaction vessel and a counterbore for holding a substrate on which an i-film is formed are formed,
It is characterized by comprising a susceptor in which a groove is formed around the counterbore, and a heating means for heating the susceptor to a predetermined temperature.

(作  用) このように構成されたものにあっては、基板とサセプタ
の隙間に反応生成物が入り込んだ場合にも、この反応生
成物は、座ぐり部の周辺に形成された溝部に落下補集さ
れる。その結果座ぐり部に反応生成物が堆積することは
なく基板とサセプタが常に密着し、双方で熱伝導が良好
に行なわれ、基板の温度分布を均一化でき、薄膜の均質
化が達成される。
(Function) With this structure, even if reaction products enter the gap between the substrate and the susceptor, the reaction products will fall into the groove formed around the counterbore. It will be supplemented. As a result, reaction products do not accumulate in the counterbore, the substrate and susceptor are always in close contact, and heat conduction is good on both sides, making the temperature distribution of the substrate uniform and achieving a homogeneous thin film. .

(実 施 例) 以下図面を参照して本発明の詳細な説明する。(Example) The present invention will be described in detail below with reference to the drawings.

第1図と第2図は本発明の第1の実施例に係る気相成長
装置の断面図と要部拡大図を示すもので第5図と第6図
と同一部分には同一符号を付してその説明は省略する0
反応管1のほぼ中央には支持棒7によって支持されたカ
ーボンサセプタ5が取付けられている。このカーボンサ
セプタ5には結晶基板3の大きさよりもわずかに大きな
座ぐり部8が形成され、この座ぐり部8の深さは結晶基
板3の厚さとほぼ等しく形成されている。そしてこの座
ぐり部8の周辺部分には座ぐり部8よりも深い溝部11
が形成されている。
1 and 2 show a cross-sectional view and an enlarged view of essential parts of a vapor phase growth apparatus according to a first embodiment of the present invention, and the same parts as in FIGS. 5 and 6 are given the same reference numerals. I will omit the explanation 0
A carbon susceptor 5 supported by a support rod 7 is attached approximately at the center of the reaction tube 1 . A counterbore 8 slightly larger than the crystal substrate 3 is formed in the carbon susceptor 5, and the depth of the counterbore 8 is approximately equal to the thickness of the crystal substrate 3. A groove 11 deeper than the counterbore 8 is located around the counterbore 8.
is formed.

このように構成される気相成長装置において。In the vapor phase growth apparatus configured in this manner.

反応管1のガス導入口2から反応ガスを導入して基板3
上に薄膜を形成させるが、余分な反応ガスはカーボンサ
セプタ5の表面にも反応生成物として付着する。カーボ
ンサセプタ5の座ぐり部8は基板3の形状誤差でも許容
できるように若干大きく形成されており、この座ぐり部
8と基板3との隙間から反応生成物が座ぐり部8に進入
する。この反応生成物は座ぐり部8の周辺部に設けられ
た溝部11に落下して補集される。
A reaction gas is introduced from the gas inlet 2 of the reaction tube 1 to the substrate 3.
Although a thin film is formed on the carbon susceptor 5, the excess reaction gas also adheres to the surface of the carbon susceptor 5 as a reaction product. The counterbore portion 8 of the carbon susceptor 5 is formed to be slightly large to allow for the shape error of the substrate 3, and the reaction product enters the counterbore portion 8 through the gap between the counterbore portion 8 and the substrate 3. This reaction product falls into the groove 11 provided around the counterbore 8 and is collected.

この溝部11が設けられていない従来においては、反応
生成物は座ぐり部8の底部に堆積し、基板3とカーボン
サセプタ5の密着を妨げていた。
In the conventional structure in which this groove portion 11 is not provided, reaction products accumulate at the bottom of the counterbore portion 8 and prevent the substrate 3 and the carbon susceptor 5 from coming into close contact with each other.

本発明のように座ぐり部8に溝部11を設けたものにお
いては、反応生成物はこの溝部11に落下補集されるた
めに常に基板3とカーボンサセプタ5が密着し、高周波
コイル4により所定温度に昇温させたカーボンサセプタ
5から基板3へ熱伝達が良好に行なわれ、基板3の温度
分布を均一に所定温度に保つことができる。これによっ
て基板3に成長される薄膜の膜厚を均一化させることが
可能となる。
In the case where the groove 11 is provided in the counterbore 8 as in the present invention, the reaction products fall and are collected in the groove 11, so that the substrate 3 and the carbon susceptor 5 are always in close contact with each other, and the high frequency coil 4 Heat transfer from the heated carbon susceptor 5 to the substrate 3 is performed well, and the temperature distribution of the substrate 3 can be maintained uniformly at a predetermined temperature. This makes it possible to make the thickness of the thin film grown on the substrate 3 uniform.

第3図と第4図は、本発明の第2の実施例を示すもので
あり反応管31の中に中空の公転用のサセプタ支持具3
5が設けられこのサセプタ支持具35は。
3 and 4 show a second embodiment of the present invention, in which a hollow susceptor support 3 for revolution is shown in a reaction tube 31.
5 is provided, and this susceptor support 35 is provided.

支持軸38に支持され軸受39で回転を許容されている
。このサセプタ支持具35は複数の基板を保持できるよ
うに例えば多角錐形をしており、その外周斜面には反応
管31に沿って流れる反応ガスとほぼ平行になるように
、つまり反応管31の内壁とほぼ平行にサセプタ34及
び基板33を内周方向に複数枚装着している。このサセ
プタ34は支持軸41に支持され支持軸41の他端にば
かさ歯車42が取付けられている。かさ歯車42は、支
持軸38に固定された受は歯車43に噛合している。
It is supported by a support shaft 38 and allowed to rotate by a bearing 39. The susceptor support 35 has, for example, a polygonal pyramid shape so as to be able to hold a plurality of substrates, and its outer peripheral slope is arranged so as to be almost parallel to the reaction gas flowing along the reaction tube 31. A plurality of susceptors 34 and substrates 33 are mounted in the inner peripheral direction substantially parallel to the inner wall. This susceptor 34 is supported by a support shaft 41, and a bevel gear 42 is attached to the other end of the support shaft 41. The bevel gear 42 is fixed to the support shaft 38 and meshes with the gear 43 .

そして、自公転用モータ36に取付けられたピニオンギ
ヤ44とサセプタ支持具35の下部に形成されたラック
45がかみ合っている。自公転用モータ36を駆動する
ことによって、サセプタ支持具35は回転する。これに
より、基板33は公転するが、かさ歯車42と受は歯車
43の作用で同時に自転もする。
A pinion gear 44 attached to the revolution motor 36 and a rack 45 formed at the lower part of the susceptor support 35 are engaged with each other. By driving the revolution motor 36, the susceptor support 35 is rotated. As a result, the base plate 33 revolves, but the bevel gear 42 and the bridge also rotate at the same time due to the action of the gear 43.

以上のような構成においては、基板33を自転させるた
めのかさ歯車42と受は歯車43はサセプタ支持具35
の内部を中空とし、内部に配置しているため反応生成物
の付着が生じにくい。これらかさ歯車42、受は歯車4
3等はサセプタ支持具35が例えば2つに分割できる構
造とすることで容易に内部に組込むことができる。
In the above configuration, the bevel gear 42 and the bearing gear 43 for rotating the substrate 33 are connected to the susceptor support 35.
Since the inside of the tube is hollow and placed inside, reaction products are less likely to adhere to it. These bevel gears 42, the receiver is the gear 4
The susceptor support 35 can be easily incorporated into the interior by having a structure in which the susceptor support 35 can be divided into two parts, for example.

また、先の実施例と同様にサセプタ34の座ぐり部38
の周辺部には溝部51が設けられており、反応生成物は
溝部51に落下補集される。
Further, as in the previous embodiment, the counterbore portion 38 of the susceptor 34 is
A groove 51 is provided around the periphery of the reaction product, and the reaction products fall into the groove 51 and are collected.

このように基板33を斜めに保持するも構成のものにお
いては、基板33はサセプタ34に座ぐり部38の周辺
により保持されているにすぎなく、特にこの実施例のよ
うに基板33を自転若しくは公転させるような場合には
基板33が落下しやすい、したがって、サセプタ34と
基板33の密着性がさらに要求され、溝部51の効果は
重要である。
In the structure in which the substrate 33 is held diagonally in this way, the substrate 33 is only held by the susceptor 34 around the counterbore 38, and in particular, as in this embodiment, the substrate 33 cannot be rotated or rotated. When the susceptor 34 and the substrate 33 are rotated, the substrate 33 is likely to fall. Therefore, the adhesiveness between the susceptor 34 and the substrate 33 is further required, and the effect of the groove portion 51 is important.

なお、溝部に補集された反応生成物はメンテナンス時に
取除かれる。
Note that the reaction products collected in the grooves are removed during maintenance.

なお、上記実施例では反応ガスを上方から下方へ流す縦
型の気相成長装置について示したが、これに限定される
ものではなく横型の気相成長装置等にも応用できる。つ
まり、本発明の要旨を逸脱しない範囲で種々変形して用
いることができる。
In the above embodiments, a vertical vapor phase growth apparatus in which the reaction gas flows from above to below has been described, but the present invention is not limited thereto and can be applied to a horizontal vapor phase growth apparatus. That is, various modifications can be made without departing from the gist of the present invention.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように本発明によれば、サセプタと基板が
常に密着状態に保たれるためにサセプタから基板への伝
熱が良好に行なわれ、均質な薄膜の成長を行なうことが
できる。
As described in detail above, according to the present invention, the susceptor and the substrate are always kept in close contact with each other, so that heat transfer from the susceptor to the substrate is performed well, and a homogeneous thin film can be grown.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図と第2図は、本発明の気相成長装置の一実施例を
示す断面図と要部拡大断面図、第3図と第4図は発明の
他の実施例に係る断面図と要部拡大断面図、第5図と第
6図は、従来の気相成長装置の断面図と要部拡大断面図
である。 1.31・・・反応管    3,33・・・基板4.
32・・・高周波コイル 5,34・・・サセプタ8.
38・・・座ぐり部   11.41・・・溝部代理人
 弁理士 則 近 憲 佑 同  松山光之 ′1 第2図
1 and 2 are a sectional view and an enlarged sectional view of essential parts showing one embodiment of the vapor growth apparatus of the present invention, and FIGS. 3 and 4 are sectional views of another embodiment of the invention. 5 and 6 are a sectional view and an enlarged sectional view of the main part of a conventional vapor phase growth apparatus. 1.31...Reaction tube 3,33...Substrate 4.
32... High frequency coil 5, 34... Susceptor 8.
38... Counterbore 11.41... Mizobe's agent Patent attorney Nori Chika Ken Yudo Mitsuyuki Matsuyama '1 Figure 2

Claims (1)

【特許請求の範囲】  反応容器と、 この反応容器内に反応ガスを導入するためのガス導入口
と、 前記反応容器外にガスを排出するガス排出口と、薄膜が
形成される基板を保持するための座ぐり部が形成され、
この座ぐり部の周辺に溝部を形成したサセプタと、 このサセプタを所定温度に加熱する加熱手段とから成る
ことを特徴とする気相成長装置。
[Claims] A reaction vessel, a gas inlet for introducing a reaction gas into the reaction vessel, a gas outlet for discharging the gas outside the reaction vessel, and holding a substrate on which a thin film is formed. A counterbore is formed for
A vapor phase growth apparatus comprising: a susceptor having a groove formed around the counterbore; and heating means for heating the susceptor to a predetermined temperature.
JP12060388A 1988-05-19 1988-05-19 Vapor growth apparatus Pending JPH01291421A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12060388A JPH01291421A (en) 1988-05-19 1988-05-19 Vapor growth apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12060388A JPH01291421A (en) 1988-05-19 1988-05-19 Vapor growth apparatus

Publications (1)

Publication Number Publication Date
JPH01291421A true JPH01291421A (en) 1989-11-24

Family

ID=14790342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12060388A Pending JPH01291421A (en) 1988-05-19 1988-05-19 Vapor growth apparatus

Country Status (1)

Country Link
JP (1) JPH01291421A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5800622A (en) * 1995-07-21 1998-09-01 Mitsubishi Denki Kabushiki Kaisha Vapor-phase growth apparatus and compound semiconductor device fabricated thereby
EP1533833A1 (en) * 2002-06-13 2005-05-25 Nikko Materials Co., Ltd. Vapor phase epitaxy device
JP2011018772A (en) * 2009-07-09 2011-01-27 Nippon Steel Corp Susceptor for silicon carbide single crystal film forming device
JP2020524892A (en) * 2017-06-23 2020-08-20 ジュソン エンジニアリング カンパニー リミテッド Substrate support device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5800622A (en) * 1995-07-21 1998-09-01 Mitsubishi Denki Kabushiki Kaisha Vapor-phase growth apparatus and compound semiconductor device fabricated thereby
EP1533833A1 (en) * 2002-06-13 2005-05-25 Nikko Materials Co., Ltd. Vapor phase epitaxy device
EP1533833A4 (en) * 2002-06-13 2007-01-17 Nippon Mining Co VAPOR PHASE EPITAXY DEVICE
US7344597B2 (en) 2002-06-13 2008-03-18 Nippon Mining & Metals Co., Ltd. Vapor-phase growth apparatus
JP2011018772A (en) * 2009-07-09 2011-01-27 Nippon Steel Corp Susceptor for silicon carbide single crystal film forming device
JP2020524892A (en) * 2017-06-23 2020-08-20 ジュソン エンジニアリング カンパニー リミテッド Substrate support device

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