JPH01252902A - Low reflection diffraction grating and its fabrication method - Google Patents
Low reflection diffraction grating and its fabrication methodInfo
- Publication number
- JPH01252902A JPH01252902A JP8033288A JP8033288A JPH01252902A JP H01252902 A JPH01252902 A JP H01252902A JP 8033288 A JP8033288 A JP 8033288A JP 8033288 A JP8033288 A JP 8033288A JP H01252902 A JPH01252902 A JP H01252902A
- Authority
- JP
- Japan
- Prior art keywords
- diffraction grating
- low
- reflection
- reflection diffraction
- uneven structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明は、CDプレイヤーやカラー撮像装置等のオプ
トエレクトロニクス製品に用いられる回折格子に関する
。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a diffraction grating used in optoelectronic products such as CD players and color imaging devices.
[従来の技術]
撮像装置の光学的ローパスフィルタとして用いられる回
折格子においては、格子表面での反射による像か画像を
変化することを防止するために。[Prior Art] In a diffraction grating used as an optical low-pass filter of an imaging device, it is necessary to prevent the image from being changed due to reflection on the grating surface.
格子表面の反射率を低減した反射回折格子とする必要か
ある。Is it necessary to use a reflective diffraction grating with reduced reflectance on the grating surface?
第5図を参照して従来の低反射回折格子の構成を説明す
る。従来は、真空蒸着法等により回折格子の表面にMg
F2,5iOz 、Sin、A1201等の無機誘電体
膜51.52を多層コートすることにより低反射回折格
子が作製されている。The structure of a conventional low reflection diffraction grating will be explained with reference to FIG. Conventionally, Mg was deposited on the surface of the diffraction grating by vacuum evaporation method etc.
A low reflection diffraction grating is fabricated by coating multiple layers of inorganic dielectric films 51, 52 such as F2,5iOz, Sin, A1201, etc.
[発明か解決しようとする課題]
ところて、第5図に示される低反射回折格子は、真空蒸
着法により無機誘電体膜51.52を多層コートするた
め、どうしても高価になってしまうという問題点かあっ
た。また、格子基板50の材料としてプラスチックを用
いた場合は、プラスチックと無機誘電体膜との密着性が
悪く信頼性か低いという問題かあった。[Problem to be Solved by the Invention] However, the low reflection diffraction grating shown in FIG. 5 has the problem that it is inevitably expensive because it is coated with multiple layers of inorganic dielectric films 51 and 52 by vacuum evaporation. There was. Furthermore, when plastic is used as the material for the grid substrate 50, there is a problem in that the adhesion between the plastic and the inorganic dielectric film is poor and reliability is low.
この発明は、このような点に鑑みてなされたものて、安
価で信頼性の高い低反射回折格子を提供することを目的
とする。The present invention has been made in view of these points, and an object of the present invention is to provide a low-reflection diffraction grating that is inexpensive and highly reliable.
[問題点を解決するための手段]
この発明による低反射回折格子は、上記の目的を達成す
るために回折格子の表面に周期が可視光線の波長以下の
凹凸構造を設けたことを特徴とする。[Means for Solving the Problems] In order to achieve the above object, the low-reflection diffraction grating according to the present invention is characterized in that the surface of the diffraction grating is provided with an uneven structure whose period is equal to or less than the wavelength of visible light. .
第1図にこの発明による低反射回折格子の断面図を示す
。この発明では、回折格子lの表面を低反射性にするた
めの方法として、周期か可視光線の波長以下の凹凸構造
2を回折格子lの表面に設けだものである。この結果、
凹凸構造2の作用により回折格子lの表面の屈折率か空
気の屈折率nOから格子材3の屈折率nまて連続的に変
化するため、表面か実質的に低反射面となる。また、凹
凸構造2は干渉露光法を用いて作製した。FIG. 1 shows a cross-sectional view of a low reflection diffraction grating according to the present invention. In this invention, as a method for making the surface of the diffraction grating l low reflective, an uneven structure 2 with a period less than the wavelength of visible light is provided on the surface of the diffraction grating l. As a result,
Due to the effect of the uneven structure 2, the refractive index of the surface of the diffraction grating 1 changes continuously from the refractive index nO of air to the refractive index n of the grating material 3, so that the surface substantially becomes a low reflection surface. Moreover, the uneven structure 2 was produced using an interference exposure method.
[実施例]
以下、この発明の実施例を図面を参照して詳しく説明す
る。[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.
実施例 1
第1の実施例による低反射回折格子の作製手順を第2図
に示す。第2図(A)に示すように、基板21として厚
さ1mm(直径3 cm)のガラスを用いた。第2図(
B)に示すように、ガラス基板21上に感光性透明膜2
2を形成する。この感光性透明膜22の感光性樹脂とし
て、メチルメタクリレートとクロメチルメタクリレート
の等モル共重合体を合成し、この共重合体中のクロチル
メタクリレ−1〜成分と等モルのベンゾフェノンを加え
、41匿%ベンゼン溶液を調整した。この溶液をスピン
コード法によりガラス基板21に塗布し、感光性透明膜
22を形成した。次に、第2図(C)に示すように、こ
の感光性透明膜22を周期30gmの回折格子用フォト
マスク23を介して超高圧水銀灯により2000mJ
/crm”程度露光し、次いて第2rJ (D)に示す
ように、波長325nmのHe−Cdレーザをθ=54
.3゜の角度で左右の斜め上方から二光束干渉露光させ
て、1000mJ /c+s2程度露光し、ベンゾフェ
ノンをクロチルメタクリレート成分に結合させた。最後
に、試料を圧力0.2mmHg、温度100°Cの条件
で減圧加熱して未反応のベンゾフェノンを昇華させ、第
2図(E)に示す低反射回折格子20を作製1ノだ。凹
凸構造24の周期は0.2ルm、凹凸構造24の段差は
0.2ルmとなり、反射率か全可視域で1%以下の低反
射回折−格子20か得られた。Example 1 The procedure for manufacturing a low reflection diffraction grating according to the first example is shown in FIG. As shown in FIG. 2(A), glass with a thickness of 1 mm (diameter 3 cm) was used as the substrate 21. Figure 2 (
As shown in B), a photosensitive transparent film 2 is formed on a glass substrate 21.
form 2. As the photosensitive resin of this photosensitive transparent film 22, an equimolar copolymer of methyl methacrylate and cromethyl methacrylate is synthesized, and benzophenone is added in an equimolar amount to the components of crotyl methacrylate-1 in this copolymer. A 41% benzene solution was prepared. This solution was applied to a glass substrate 21 by a spin code method to form a photosensitive transparent film 22. Next, as shown in FIG. 2(C), this photosensitive transparent film 22 was heated at 2000 mJ using an ultra-high pressure mercury lamp through a photomask 23 for a diffraction grating with a period of 30 gm.
/crm", and then, as shown in the second rJ (D), a He-Cd laser with a wavelength of 325 nm was applied to θ=54
.. Two-beam interference exposure was performed diagonally upward on the left and right at an angle of 3°, and exposure was performed at approximately 1000 mJ/c+s2 to bond benzophenone to the crotyl methacrylate component. Finally, the sample was heated under reduced pressure at a pressure of 0.2 mmHg and a temperature of 100° C. to sublimate unreacted benzophenone, thereby producing a low-reflection diffraction grating 20 as shown in FIG. 2(E). The period of the concavo-convex structure 24 was 0.2 lm, the step height of the concavo-convex structure 24 was 0.2 lm, and a low reflection diffraction grating 20 with a reflectance of 1% or less in the entire visible range was obtained.
実施例 2
第2の実施例による低反射回折格子の作製手順を第3図
に示す。第3図(A)に示すように、基板21として厚
さ1mm(直径3 cn)のガラスな用いた。第3図(
B)に示すように、前記第1の実施例と同様の方法によ
りガラス基板31上に感光性透明ll!I32を塗布し
た。この感光性透明膜32を波長422nmのHe−C
dレーザ光33を用いレンズ34を使用したレーザ直接
描画により、周期かloopmの回折格子状に露光した
。Example 2 The procedure for manufacturing a low reflection diffraction grating according to the second example is shown in FIG. As shown in FIG. 3(A), a glass substrate 21 having a thickness of 1 mm (diameter 3 cm) was used. Figure 3 (
As shown in B), photosensitive transparent ll! is deposited on the glass substrate 31 by the same method as in the first embodiment. I32 was applied. This photosensitive transparent film 32 is coated with He-C with a wavelength of 422 nm.
By direct laser writing using a lens 34 using a d laser beam 33, exposure was carried out in the form of a diffraction grating with a period of 1 to 2 pm.
次いて、第3図(D)に示すように第1の実施例と同様
の方法て三光束干渉露光しで、最後に、試料を同様の条
件で減圧加熱して現像し、第3図(E)に示される低反
射回折格子30を作製した。凹凸構造35の周期は0.
2μm、凹凸構造35の段差は0.2gmとなり、反射
率が全可視域で1%以下の低反射回折格子か得られた。Next, as shown in FIG. 3(D), three-beam interference exposure was performed in the same manner as in the first embodiment, and finally, the sample was developed by heating under reduced pressure under the same conditions. A low reflection diffraction grating 30 shown in E) was manufactured. The period of the uneven structure 35 is 0.
2 μm, the height difference of the uneven structure 35 was 0.2 gm, and a low reflection diffraction grating with a reflectance of 1% or less in the entire visible range was obtained.
実施例 3
第3の実施例による低反射回折格子の作製手順を第4図
に示す。先ず、第4図(A)に示される前記第1或いは
第2の実施例により得られた低反射回折格子41に、第
4図(B)に示す真空蒸着法によりAg膜42を蒸着し
、次いで、第4図(C)に示すように電鋳法により膜厚
か300牌mのNi膜43を形成し、第4図CD)に示
されるNiスタンバ−44を作製した。次いて、第4図
(E)に示すように、2P用UV樹脂45をNiスタン
バ−44に塗布し、次いて、第4図(F)に示すように
、その上にガラス基板46をのせ、そのガラス基板46
側から超高圧水銀灯による光で10100O/cm2程
度露光して第4図(G)に示される低反射回折格子40
を複製した。複製された凹凸構造40の段差は、原型よ
りも若干小さくなったが、反射率は全可視域て1%以下
てあった。Example 3 The procedure for manufacturing a low reflection diffraction grating according to the third example is shown in FIG. First, on the low reflection diffraction grating 41 obtained by the first or second embodiment shown in FIG. 4(A), an Ag film 42 was deposited by the vacuum evaporation method shown in FIG. 4(B), Next, as shown in FIG. 4(C), a Ni film 43 having a thickness of 300 m was formed by electroforming to produce a Ni stub bar 44 shown in FIG. 4(CD). Next, as shown in FIG. 4(E), 2P UV resin 45 is applied to the Ni stand bar 44, and then, as shown in FIG. 4(F), a glass substrate 46 is placed on it. , the glass substrate 46
The low reflection diffraction grating 40 shown in FIG. 4(G) was exposed from the side to light of about 10,100 O/cm2 from an ultra-high pressure mercury lamp.
was duplicated. Although the level difference of the replicated concavo-convex structure 40 was slightly smaller than that of the original, the reflectance was less than 1% in the entire visible range.
[発明の効果]
以上説明したように、この発明によれば1回折格子の表
面に周期か可視光線の波長以下の凹凸構造を形成するこ
とにより、安価で信頼性の高い低反射回折格子を提供す
ることかてきる。[Effects of the Invention] As explained above, according to the present invention, an inexpensive and highly reliable low-reflection diffraction grating is provided by forming an uneven structure with a period or less than the wavelength of visible light on the surface of a single diffraction grating. I have something to do.
第1図は、本発明による低反射回折格子の一部分の拡大
断面図、
第2図(A)〜(E)は、第1の実施例による低反射回
折格子の作製方法を示す拡大断面図、第3図(A)〜(
E)は第2の実施例による低反射回折格子の作製方法を
示す拡大断面図、第4図(A)〜(G)は第3の実施例
による低反射回折格子の作製方法を示す拡大断面図、第
5図は、従来の低反射回折格子の拡大断面図である。
1.20,30.40・・・・回折格子2.24,35
.47・・・・周期か可視光線の波長以下の凹
凸構造
特許出願人 株式会社 り ラ しFIG. 1 is an enlarged cross-sectional view of a portion of a low-reflection diffraction grating according to the present invention, and FIGS. 2 (A) to (E) are enlarged cross-sectional views showing a method for manufacturing a low-reflection diffraction grating according to the first embodiment. Figure 3 (A) - (
E) is an enlarged cross-sectional view showing a method for manufacturing a low-reflection diffraction grating according to the second embodiment, and FIGS. 4(A) to (G) are enlarged cross-sectional views showing a method for manufacturing a low-reflection diffraction grating according to the third example. FIG. 5 is an enlarged cross-sectional view of a conventional low reflection diffraction grating. 1.20, 30.40... Diffraction grating 2.24, 35
.. 47...Concave and convex structure with a period less than the wavelength of visible light Patent applicant: Rira Shi Co., Ltd.
Claims (1)
格子の表面に周期が可視光線の波長以下の凹凸構造を設
けたことを特徴とする低反射回折格子。 2、撮像装置の光学的ローパスフィルタとして用いられ
る回折格子において、表面反射率を低減させるために、
上記回折格子の表面に周期が可視光線の波長以下の凹凸
構造を設けたことを特徴とする低反射回折格子。 3、基板の表面に感光性樹脂を塗布し、次いで上記回折
格子を作製するためのフォトマスク露光および上記凹凸
構造を作製するための干渉露光を行なった後で、上記回
折格子と上記凹凸構造のパターンを現像することを特徴
とする請求項1または請求項2記載の低反射回折格子の
作製方法。 4、基板の表面に感光性樹脂を塗布し、次いで上記回折
格子を作製するためのレーザビーム直接描画および上記
凹凸構造を作製するための干渉露光を行なった後で、上
記回折格子と上記凹凸構造のパターンを現像することを
特徴とする請求項1または請求項2記載の低反射回折格
子の作製方法。 5、回折格子の表面反射率を低減するために、上記回折
格子の表面に周期が可視光線の波長以下の凹凸構造を設
けた回折格子の成形用の母型により複製することを特徴
とする低反射回折格子の作製方法。 6、請求項3および請求項4記載の方法により作製され
た上記低反射回折格子から成形用の母型を作製し、上記
成型用母型により複製することを特徴とする請求項1ま
たは請求項2記載の低反射回折格子の作製方法。 7、上記回折格子が形成された成型用の型の表面に感光
性樹脂を塗布し、次いで上記凹凸構造を作製するための
干渉露光を行なった後で、上記感光性樹脂の現像、上記
成型用の型のエッチングを行なうことにより低反射回折
格子の成型用の型を作製し、上記成型用型により複製す
ることを特徴とする請求項1または請求項2記載の低反
射回折格子の作製方法。[Scope of Claims] 1. A low-reflection diffraction grating, characterized in that, in order to reduce the surface reflectance of the diffraction grating, the surface of the diffraction grating is provided with a concavo-convex structure with a period less than the wavelength of visible light. 2. In order to reduce surface reflectance in a diffraction grating used as an optical low-pass filter for an imaging device,
A low reflection diffraction grating characterized in that the surface of the diffraction grating is provided with an uneven structure having a period less than the wavelength of visible light. 3. After applying a photosensitive resin to the surface of the substrate, and then performing photomask exposure to create the diffraction grating and interference exposure to create the uneven structure, the diffraction grating and the uneven structure are 3. The method for producing a low reflection diffraction grating according to claim 1, further comprising developing the pattern. 4. After applying a photosensitive resin to the surface of the substrate, and then performing laser beam direct writing to create the diffraction grating and interference exposure to create the uneven structure, the diffraction grating and the uneven structure are formed. 3. The method for producing a low-reflection diffraction grating according to claim 1 or 2, wherein a pattern of the following is developed. 5. In order to reduce the surface reflectance of the diffraction grating, the surface of the diffraction grating is reproduced using a matrix for molding the diffraction grating, which has an uneven structure with a period less than the wavelength of visible light. How to make a reflection diffraction grating. 6. A molding mold is prepared from the low-reflection diffraction grating produced by the method according to claim 3 or claim 4, and replication is performed using the molding mold. 2. The method for producing a low reflection diffraction grating according to 2. 7. After applying a photosensitive resin to the surface of the molding mold on which the above-mentioned diffraction grating is formed and then performing interference exposure to create the above-mentioned uneven structure, developing the above-mentioned photosensitive resin and applying the above-mentioned molding method. 3. The method of manufacturing a low-reflection diffraction grating according to claim 1, wherein a mold for molding the low-reflection grating is produced by etching the mold, and the low-reflection diffraction grating is replicated using the mold.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8033288A JPH01252902A (en) | 1988-04-01 | 1988-04-01 | Low reflection diffraction grating and its fabrication method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8033288A JPH01252902A (en) | 1988-04-01 | 1988-04-01 | Low reflection diffraction grating and its fabrication method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01252902A true JPH01252902A (en) | 1989-10-09 |
Family
ID=13715301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8033288A Pending JPH01252902A (en) | 1988-04-01 | 1988-04-01 | Low reflection diffraction grating and its fabrication method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01252902A (en) |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5455178A (en) * | 1990-05-03 | 1995-10-03 | Hoffmann-La Roche Inc. | Microoptical sensor and method |
US5504621A (en) * | 1992-08-28 | 1996-04-02 | Matsushita Electric Industrial Co., Ltd. | Two-dimensional optical low-pass filter |
US5694247A (en) * | 1994-05-02 | 1997-12-02 | U.S. Philips Corporation | Optical transmissive component with anti-reflection gratings |
WO2001029828A1 (en) * | 1999-10-19 | 2001-04-26 | Spectradisc Corporation | Methods and apparatus for rendering an optically encoded medium unreadable and tamper-resistant |
JP2001264520A (en) * | 2000-03-16 | 2001-09-26 | Dainippon Printing Co Ltd | Reflection preventing film, polarizing element, display device and method for manufacturing reflection preventing film |
JP2002311221A (en) * | 2001-04-18 | 2002-10-23 | Alps Electric Co Ltd | Optical member and optical device which uses the same |
US6709802B2 (en) | 1998-06-25 | 2004-03-23 | Flexplay Technologies, Inc. | Methods and apparatus for rendering an optically encoded medium unreadable |
US6747930B1 (en) | 1996-12-24 | 2004-06-08 | Hide & Seek Technologies, Inc. | Data protection on an optical disk |
JP2005050708A (en) * | 2003-07-29 | 2005-02-24 | Samsung Sdi Co Ltd | Optical element substrate, organic electroluminescence element, and organic electroluminescence display device |
US7256947B2 (en) | 2003-08-13 | 2007-08-14 | Canon Kabushiki Kaisha | Optical element having minute periodic structure |
JP2007219006A (en) * | 2006-02-14 | 2007-08-30 | Ricoh Co Ltd | Pattern forming method and optical device |
JP2008124467A (en) * | 2006-11-15 | 2008-05-29 | Asml Netherlands Bv | System and method of determining critical dimension using alignment sensor of lithographic apparatus |
JP2009134287A (en) * | 2007-11-06 | 2009-06-18 | Seiko Epson Corp | Diffractive optical element, manufacturing method thereof, and laser processing method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4920105A (en) * | 1972-06-22 | 1974-02-22 | ||
JPS5070040A (en) * | 1973-05-10 | 1975-06-11 | ||
JPS58174906A (en) * | 1982-04-07 | 1983-10-14 | Ricoh Co Ltd | Method for preventing surface reflection of optical element |
-
1988
- 1988-04-01 JP JP8033288A patent/JPH01252902A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4920105A (en) * | 1972-06-22 | 1974-02-22 | ||
JPS5070040A (en) * | 1973-05-10 | 1975-06-11 | ||
JPS58174906A (en) * | 1982-04-07 | 1983-10-14 | Ricoh Co Ltd | Method for preventing surface reflection of optical element |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5455178A (en) * | 1990-05-03 | 1995-10-03 | Hoffmann-La Roche Inc. | Microoptical sensor and method |
US5504621A (en) * | 1992-08-28 | 1996-04-02 | Matsushita Electric Industrial Co., Ltd. | Two-dimensional optical low-pass filter |
US5694247A (en) * | 1994-05-02 | 1997-12-02 | U.S. Philips Corporation | Optical transmissive component with anti-reflection gratings |
US6747930B1 (en) | 1996-12-24 | 2004-06-08 | Hide & Seek Technologies, Inc. | Data protection on an optical disk |
US6709802B2 (en) | 1998-06-25 | 2004-03-23 | Flexplay Technologies, Inc. | Methods and apparatus for rendering an optically encoded medium unreadable |
WO2001029828A1 (en) * | 1999-10-19 | 2001-04-26 | Spectradisc Corporation | Methods and apparatus for rendering an optically encoded medium unreadable and tamper-resistant |
JP2001264520A (en) * | 2000-03-16 | 2001-09-26 | Dainippon Printing Co Ltd | Reflection preventing film, polarizing element, display device and method for manufacturing reflection preventing film |
JP2002311221A (en) * | 2001-04-18 | 2002-10-23 | Alps Electric Co Ltd | Optical member and optical device which uses the same |
JP2005050708A (en) * | 2003-07-29 | 2005-02-24 | Samsung Sdi Co Ltd | Optical element substrate, organic electroluminescence element, and organic electroluminescence display device |
US7256947B2 (en) | 2003-08-13 | 2007-08-14 | Canon Kabushiki Kaisha | Optical element having minute periodic structure |
JP2007219006A (en) * | 2006-02-14 | 2007-08-30 | Ricoh Co Ltd | Pattern forming method and optical device |
JP2008124467A (en) * | 2006-11-15 | 2008-05-29 | Asml Netherlands Bv | System and method of determining critical dimension using alignment sensor of lithographic apparatus |
JP2009134287A (en) * | 2007-11-06 | 2009-06-18 | Seiko Epson Corp | Diffractive optical element, manufacturing method thereof, and laser processing method |
JP2013210680A (en) * | 2007-11-06 | 2013-10-10 | Seiko Epson Corp | Diffraction optical element, method of manufacturing the same, and laser machining method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2501621B2 (en) | Volume phase reflection hologram | |
US4402571A (en) | Method for producing a surface relief pattern | |
US4013465A (en) | Reducing the reflectance of surfaces to radiation | |
KR100415714B1 (en) | Micro Relief Element and Manufacturing Method | |
EP0724740B1 (en) | Retroreflective sheeting material, a method of its production and its use | |
EP1645903A1 (en) | Wire grid polarizer and fabrication method thereof | |
KR910005879B1 (en) | Production of transmissivity modulation type photomask and production of diffraction grating using the photomask | |
JPH01252902A (en) | Low reflection diffraction grating and its fabrication method | |
WO1999038040A1 (en) | Phase mask for manufacturing diffraction grating, and method of manufacture | |
JPH03266842A (en) | Reflection photolithography method, reflection photolithography apparatus and reflection photomask | |
JP3877444B2 (en) | Diffraction grating | |
JPH05228946A (en) | Optical component manufacturing method and optical component master block | |
JPS6139641B2 (en) | ||
JPH07174902A (en) | Microlens array and its production | |
JPH09127319A (en) | Reflecting mirror, method of manufacturing the same, and projection exposure apparatus using the same | |
JP4507928B2 (en) | Holographic grating manufacturing method | |
JPH0226851B2 (en) | ||
JP4363837B2 (en) | Method for forming fine irregularities on curved surface and optical member | |
KR100212905B1 (en) | High picture quality image mask due to tir hologram | |
JPH11212246A (en) | Phase mask for forming diffraction grating | |
JPH0322601B2 (en) | ||
JPS63271265A (en) | Transmittance modulation photomask, its manufacturing method, and diffraction grating manufacturing method using the same | |
JPS5999475A (en) | Manufacture of hologram with diffraction grating | |
JPH05343806A (en) | Manufacture of phase-shifting diffraction | |
KR20070072949A (en) | Nano-patterned structure and multilayer optical sheet having the structure, backlight unit |