JPH01217241A - Reflectance and transmittance measuring device - Google Patents
Reflectance and transmittance measuring deviceInfo
- Publication number
- JPH01217241A JPH01217241A JP4316588A JP4316588A JPH01217241A JP H01217241 A JPH01217241 A JP H01217241A JP 4316588 A JP4316588 A JP 4316588A JP 4316588 A JP4316588 A JP 4316588A JP H01217241 A JPH01217241 A JP H01217241A
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- reflectance
- transmittance
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
[産業上の利用分野コ
本発明は、物体の光に対する反射率及び透過率を測定す
るための装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for measuring the reflectance and transmittance of an object to light.
[従来の技術]
第3図はこの種の従来の反射率及び透過率測定装置の概
略構成図である。同図において、光源1と被測定物体2
とが互いに離隔配置され、光源1に対して被測定物体2
はその表面が垂直になるように置かれているが、光源1
から放射される光波測定物体2に直接届かないように講
じられている。[Prior Art] FIG. 3 is a schematic diagram of a conventional reflectance and transmittance measuring device of this type. In the figure, a light source 1 and an object to be measured 2
are spaced apart from each other, and the object to be measured 2 is placed relative to the light source 1.
is placed so that its surface is vertical, but light source 1
Measures are taken to prevent the light waves radiated from directly reaching the measuring object 2.
そして、光源1と被測定物体2との略中間で、しかも、
左右対称の位置にミラー3a、3bが配設され、光源1
から放射される光を反射せしめて、同一の入射角で互い
に反対の方向から被測定物体2を照射している。また、
光源1と被測定物体2との間に、レンズ4及び受光素子
5が設けられ、被測定物体2の光照射面に対して垂直方
向に反射する光をレンズ4て集光し、受光素子5かこれ
を電気信号に変換する。一方、光源1から見て被測定物
体2の裏側に、レンズ6および受光素子7が設けられ、
被測定物体2を透過する光のうち、光照射面に対して垂
直方向に進む光をレンズ6で集光し、受光素子7がこれ
を電気信号に変換する。And, approximately halfway between the light source 1 and the object to be measured 2, and
Mirrors 3a and 3b are arranged in symmetrical positions, and the light source 1
The object to be measured 2 is irradiated by reflecting the light emitted from the object 2 from opposite directions at the same angle of incidence. Also,
A lens 4 and a light receiving element 5 are provided between the light source 1 and the object to be measured 2, and the lens 4 condenses the light reflected in the direction perpendicular to the light irradiation surface of the object to be measured 2. or convert this into an electrical signal. On the other hand, a lens 6 and a light receiving element 7 are provided on the back side of the object to be measured 2 when viewed from the light source 1.
Of the light transmitted through the object to be measured 2, the light traveling in a direction perpendicular to the light irradiation surface is collected by the lens 6, and the light receiving element 7 converts it into an electrical signal.
また、受光素子5及び7の電気信号か光量検出回路8に
取込まれ、ここで、反射率および透過率に対応する信号
に変換され、表示回路9に反射率及び透過率が表示され
る。Further, the electric signals of the light receiving elements 5 and 7 are taken into the light quantity detection circuit 8, where they are converted into signals corresponding to the reflectance and transmittance, and the reflectance and transmittance are displayed on the display circuit 9.
[発明が解決しようとする課題]
上述した従来の反射率及び透過率測定装置は、単一の光
源より放射される光を、それぞれミラーを用いて被測定
物体表面に導く構成になっていたがために、光路長か長
くなって装置が大型化すると同時に、光路幅の絞り込み
が難しくミラー、レンズ及び受光素子に対してそれぞれ
微妙な位置合わせが必要になるという問題点があった。[Problems to be Solved by the Invention] The conventional reflectance and transmittance measuring devices described above have a configuration in which the light emitted from a single light source is guided to the surface of the object to be measured using a mirror. Therefore, there are problems in that the optical path length becomes longer and the device becomes larger, and at the same time, it is difficult to narrow down the optical path width and delicate positioning is required for each of the mirrors, lenses, and light-receiving elements.
また、電源電圧の変動、時間の経過に伴う特性変動等に
より、光量か変化したときに発生する測定値の変動分補
正ができないという問題点もあった。There is also the problem that it is not possible to compensate for fluctuations in measured values that occur when the amount of light changes due to fluctuations in power supply voltage, fluctuations in characteristics over time, and the like.
本発明の目的は、装置の小型化を実現し得ると同時に微
妙な位置合わせを不要化し得る反射率及び透過率測定装
置を提供することである。An object of the present invention is to provide a reflectance and transmittance measuring device that can realize miniaturization of the device and at the same time eliminate the need for delicate positioning.
そして、もう一つの目的は、光源の光量変動に起因する
測定値の変動分補正を可能にする反射率及び透過率測定
装置を提供することである。Another object of the present invention is to provide a reflectance and transmittance measuring device that allows correction of fluctuations in measured values due to fluctuations in the amount of light from a light source.
[課題を解決するための手段]
本発明に係る反射率及び透過率+1111定装置は、単
一の光源より放射される光を、2本の光ファイバを用い
て被測定物体の表面に導くと共に、これら□ の光ファ
イバによって導かれた光が同一の入射角で互いに反対方
向より被測定物体表面を照射するように、2本の光ファ
イバの光軸を被l1llj定物体表面で交るように配置
したものである。[Means for Solving the Problems] The reflectance and transmittance +1111 constant device according to the present invention guides light emitted from a single light source to the surface of an object to be measured using two optical fibers, and , so that the optical axes of the two optical fibers intersect at the surface of the constant object so that the light guided by these □ optical fibers illuminates the surface of the object to be measured from mutually opposite directions at the same angle of incidence. This is what was placed.
また、被測定物体の表面から垂直に反射する反射光量及
び被測定物体の裏面へ垂直に透過する透過光量を、光フ
ァイバを用いて受光素子に導き、この受光素子の出力に
基づいて反射率及び透過率を1llll定するようにし
ている。In addition, the amount of reflected light that is vertically reflected from the surface of the object to be measured and the amount of transmitted light that is perpendicularly transmitted to the back surface of the object to be measured are guided to a light receiving element using an optical fiber, and based on the output of this light receiving element, the reflectance and the The transmittance is set at 1lllll.
さらにまた、光源の光量変動に伴う測定値の変動を補正
するために、光源の光量を検出する光量検出u路と、こ
の光量検出回路の出力に基づいて測定値を補正する測定
値補正回路とを備えたものである。Furthermore, in order to correct fluctuations in the measured value due to fluctuations in the light amount of the light source, a light amount detection circuit that detects the light amount of the light source and a measured value correction circuit that corrects the measured value based on the output of this light amount detection circuit are provided. It is equipped with the following.
[作 用コ
上記のように2本の光ファイバを用いて光源の光を導く
ようにすれば、被測定物体と光源との相対位置、光ファ
イバの長さに関係なく、単に光が放射される側の光フア
イバ端部の方向と位置を合わせるたけで済むことから、
ミラーを用いて被測定物体表面を照射する従来装置と比
較して装置の小型化を図り得ると共に、微妙な位置合わ
せが不要になる。[Function] If two optical fibers are used to guide the light from the light source as described above, the light will simply be emitted regardless of the relative position of the object to be measured and the light source or the length of the optical fiber. Because all you have to do is align the direction and position of the end of the optical fiber on the other side.
Compared to conventional devices that use mirrors to illuminate the surface of the object to be measured, the device can be made more compact, and delicate positioning is no longer necessary.
また、彼41す定物体表面に光を導くたけでなく、一
4 −
それぞれ反射光及び透過光をも光ファイバにより受光素
子に導くようにしたことで、レンズを用いる従来装置と
比べてより一層の小型化が図られると同時に、微妙な位
置合わせが不要化される。In addition, he not only guided light to the surface of a constant object, but also
4 - By guiding reflected light and transmitted light to the light-receiving element through optical fibers, it is possible to achieve further miniaturization compared to conventional devices that use lenses, and at the same time eliminates the need for delicate positioning. Ru.
さらに、光量検出回路と、測定値補正回路とを備えたこ
とにより、電源変動や特性変動により光源の光量が変化
したとしても、反射率及び透過率を常に正確に測定する
ことができ、これによって装置信頼性を高めることがで
きる。Furthermore, by being equipped with a light intensity detection circuit and a measured value correction circuit, even if the light intensity of the light source changes due to power fluctuations or characteristic fluctuations, reflectance and transmittance can always be accurately measured. Device reliability can be improved.
[実 施 例]
第1図は本発明の一実施例の概略構成図であり、図中第
3図と同一の符号を付したものはそれぞれ同一の要素を
示している。そして第3図中のミラー3 a 、3 b
% レンズ4,5を除去し、その代わりに2本の光フ
ァイバloa 、 tabを用いて光源1より放射され
る光を被測定物体表面に導くと共に、光ファイバLC1
a 、 IObの被測定物体2側の光軸が被nJ定物体
2の表面上で、所定の入射角をもって反対方向より交る
ように配置し、さらに、被測定物体2の表面からの反射
光を、光ファイバ」]を用いて受光素子5に導き、被a
l11定物体2からの透過光を、光ファイバ12を用い
て受光素子7に導くように構成したものである。[Embodiment] FIG. 1 is a schematic diagram of an embodiment of the present invention, and the same reference numerals as in FIG. 3 indicate the same elements. And mirrors 3a and 3b in Fig. 3
% Lenses 4 and 5 are removed, and instead, two optical fibers LOA and TAB are used to guide the light emitted from light source 1 to the surface of the object to be measured, and optical fiber LC1 is used.
a, IOb is arranged so that the optical axis of the object to be measured 2 crosses the surface of the nJ constant object 2 from the opposite direction at a predetermined angle of incidence, and the reflected light from the surface of the object to be measured 2 is is guided to the light-receiving element 5 using an optical fiber.
It is constructed so that the transmitted light from the l11 constant object 2 is guided to the light receiving element 7 using an optical fiber 12.
この場合、光ファイバloa 、 lObの被測定物体
2側の端部のみが所定の方向を向いておれば、光源1の
位置か変わっても測定には支障かなく、また、光ファイ
バ11.1.2の被測定物体2側の端部が、この被測定
物体表面に垂直になっておれば、その他端はとこであっ
てもよく、従って、受光素子5゜7の位置を任意に選択
することができる。In this case, as long as only the ends of the optical fibers loa and lOb on the object to be measured 2 side face in a predetermined direction, measurement will not be affected even if the position of the light source 1 changes; As long as the end of .2 on the side of the object to be measured 2 is perpendicular to the surface of the object to be measured, the other end may be anywhere. Therefore, the position of the light receiving element 5.7 can be arbitrarily selected. be able to.
ここで、反射率、透過率を測定する具体的手法としては
、先ず、被測定物体2の代わりに反射率が100%の標
準白板を装着して反射光量を測定する。次いて、この標
準白板を取り去った状態で透過光量を測定する。次に、
被測定物体2を装着して反射光量及び透過光量を測定し
た後、演算により反射率及び透過率を測定する。Here, as a specific method for measuring reflectance and transmittance, first, a standard white board with a reflectance of 100% is attached in place of the object 2 to be measured, and the amount of reflected light is measured. Next, the amount of transmitted light is measured with this standard white plate removed. next,
After attaching the object 2 to be measured and measuring the amount of reflected light and the amount of transmitted light, reflectance and transmittance are measured by calculation.
第2図は本発明の他の実施例の概略構成図であり、図中
、第1図と同一の符号を付したものはそれぞれ同一の要
素を示している。そして、新たに光源1の放射光を、光
ファイバ13を用いて受光素子14に導き、さらに、受
光素子14の出力に基いて光量検出回路15が光源1の
光量を測定するようにした点、この光量検出回路15の
出力と、前記反射光量及び透過光量を測定する光量検出
回路8の出力とを測定値補正回路16に入力すると、こ
の41す定値補正回路1Gか光源1の光量変動に伴う反
射率。FIG. 2 is a schematic diagram of another embodiment of the present invention, and in the figure, the same reference numerals as in FIG. 1 indicate the same elements. Further, the light emitted from the light source 1 is newly guided to the light receiving element 14 using the optical fiber 13, and the light amount detection circuit 15 measures the light amount of the light source 1 based on the output of the light receiving element 14. When the output of this light amount detection circuit 15 and the output of the light amount detection circuit 8 that measures the reflected light amount and transmitted light amount are input to the measured value correction circuit 16, the 41 fixed value correction circuit 1G or Reflectance.
透過率の各測定値の変動分を補正して表示回路9に与え
るようにした点が第1図と異っている。The difference from FIG. 1 is that variations in each measured value of transmittance are corrected and applied to the display circuit 9.
かかる構成によれば、電源電圧の変動、時間の経過に伴
う特性変動等があっても、反射率及び透過率を高精度に
て測定することができる。According to this configuration, reflectance and transmittance can be measured with high precision even if there are fluctuations in power supply voltage, characteristic fluctuations over time, etc.
なお、上記実施例を構成する受光素子5,7゜]4とし
てはフォトI・ランジスタを用いればよく、また、光量
検出回路8,15としては受光素子の出力を増幅する直
流増幅器、その出力をディジタル信号に変換するA−D
変換器、変換されたディジタルデータに基づいて反射率
及び透過率を演算するマイクロプロセッサで構成すれば
よい。また、測定値補正回路16としては利得制御可能
な増幅器を用いても、あるいはマイクロプロセッサを用
いてもよい。マイクロプロセッサを用いる場合には光量
検出回路8.」5の機能と測定値補正回路16の機能を
1つのマイクロプロセッサに持たせてもよ0゜
[発明の効果]
本発明の反射率及び透過率測定装置は、以上説明したよ
うに構成されているので、以下に記載するような効果を
奏する。Note that a photo-I transistor may be used as the light-receiving elements 5, 7°]4 constituting the above embodiment, and a DC amplifier that amplifies the output of the light-receiving element and a DC amplifier that amplifies the output of the light-receiving element as the light amount detection circuits 8, 15. A-D converting to digital signal
It may be configured with a converter and a microprocessor that calculates reflectance and transmittance based on the converted digital data. Furthermore, as the measured value correction circuit 16, an amplifier whose gain can be controlled may be used, or a microprocessor may be used. When using a microprocessor, a light amount detection circuit 8. 5 and the function of the measured value correction circuit 16 may be provided in one microprocessor. [Effects of the Invention] The reflectance and transmittance measuring device of the present invention is constructed as described above. As a result, the following effects can be achieved.
2本の光ファイバを用いて光源の光を導くことにより、
光が放射される側の光フアイバ端部の方向と位置を合わ
せるだけでよく、これによって装置の小型化を図り得る
と共に、微妙な位置合わせが不要化される。By guiding the light from the light source using two optical fibers,
It is only necessary to align the direction and position of the end of the optical fiber on the side from which light is emitted, which allows the device to be made more compact and eliminates the need for delicate alignment.
そして、反射光及び透過光をも、光ファイバを用いて受
光素子に導くようにしたことにより、−層の小型化が図
られると同時に、位置合わせが容易化される。By guiding the reflected light and the transmitted light to the light receiving element using optical fibers, the size of the -layer can be reduced, and at the same time alignment can be facilitated.
また、光源の光量変動に伴う測定値変動分の補正回路を
備えることにより41す定精度と信頼性を向−9=
上させることができる。In addition, by providing a correction circuit for the variation in measured values due to variations in the amount of light from the light source, the accuracy and reliability can be improved.
第1図は本発明の反射率及び透過率測定装置の一実施例
の概略構成図、第2図は他の実施例の概略構成図、第3
図は従来の反射率及び透過率測定装置の概略構成図であ
る。
1・・・光 源 2・・・被測定物体5、
7.14・・受光素子 8,15・・・光量検出回路9
・・・表示回路
10a、10b、11,12.13−=光ファイバ16
・・・測定値補正回路
発 明 者 布材 清 安原 幸三用嶋 伯夫
特許出願人 三菱レイヨン株式会社FIG. 1 is a schematic diagram of one embodiment of the reflectance and transmittance measuring device of the present invention, FIG. 2 is a schematic diagram of another embodiment, and FIG.
The figure is a schematic configuration diagram of a conventional reflectance and transmittance measuring device. 1... Light source 2... Measured object 5,
7.14... Light receiving element 8,15... Light amount detection circuit 9
...Display circuits 10a, 10b, 11, 12.13-=optical fiber 16
...Measurement value correction circuit inventor Cloth material Kiyoshi Yasuhara Kozo Yojima Hakuo Patent applicant Mitsubishi Rayon Co., Ltd.
Claims (3)
被測定物体表面を同一の入射角で互いに反対方向より照
射し、前記被測定物体表面から垂直に反射する反射光量
に対応する信号に基づいて反射率を測定し、裏面へ垂直
に透過する透過光量に対応する信号に基づいて透過率を
測定する反射率及び透過率測定装置において、前記光源
より放射される光を、2本の光ファイバを用いて前記被
測定物体の表面に導くと共に、これらの光ファイバの光
軸が前記被測定物体の表面上で交わるように配置したこ
とを特徴とする反射率及び透過率測定装置。(1) By guiding the light emitted from a single light source,
The surface of the object to be measured is irradiated from opposite directions at the same angle of incidence, and the reflectance is measured based on the signal corresponding to the amount of reflected light that is vertically reflected from the surface of the object to be measured, and the amount of transmitted light that is perpendicularly transmitted to the back surface is measured. In this reflectance and transmittance measurement device, the light emitted from the light source is guided to the surface of the object to be measured using two optical fibers, and the A reflectance and transmittance measuring device, characterized in that the optical axes of optical fibers are arranged so as to intersect on the surface of the object to be measured.
過光を、それぞれ光ファイバを介して受光素子に導き、
この受光素子の出力信号に基づいて反射率及び透過率を
測定する構成とした請求項1記載の反射率及び透過率測
定装置。(2) guiding the reflected light from the surface of the object to be measured and the transmitted light to the back surface to a light receiving element via optical fibers, respectively;
2. The reflectance and transmittance measuring device according to claim 1, wherein the reflectance and transmittance are measured based on the output signal of the light receiving element.
光量検出回路の出力に基づいて、前記光源の光量変動に
伴う測定値の変動分を補正する測定値補正回路とを備え
た請求項1または2記載の反射率及び透過率測定装置。(3) Claim comprising: a light amount detection circuit that detects the light amount of the light source; and a measured value correction circuit that corrects a variation in the measured value due to a change in the light amount of the light source based on the output of the light amount detection circuit. 3. The reflectance and transmittance measuring device according to 1 or 2.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4316588A JPH01217241A (en) | 1988-02-25 | 1988-02-25 | Reflectance and transmittance measuring device |
EP19890301870 EP0330501A3 (en) | 1988-02-25 | 1989-02-24 | Measurement arrangement with automatic gain control circuit |
CA000591953A CA1301859C (en) | 1988-02-25 | 1989-02-24 | Automatic gain control circuit |
US07/316,062 US4916406A (en) | 1988-02-25 | 1989-02-27 | Automatic gain control circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4316588A JPH01217241A (en) | 1988-02-25 | 1988-02-25 | Reflectance and transmittance measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01217241A true JPH01217241A (en) | 1989-08-30 |
Family
ID=12656263
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4316588A Pending JPH01217241A (en) | 1988-02-25 | 1988-02-25 | Reflectance and transmittance measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01217241A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011214941A (en) * | 2010-03-31 | 2011-10-27 | Caloria Japan Co Ltd | Device for discriminating foreign matter contamination in object |
Citations (3)
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---|---|---|---|---|
JPS53106080A (en) * | 1977-02-26 | 1978-09-14 | Ritsuo Hasumi | Reflection and transmission factor measuring instrument |
JPS56106144A (en) * | 1980-01-18 | 1981-08-24 | Univ Groningen | Optical reflectometer |
JPH01142441A (en) * | 1987-11-28 | 1989-06-05 | Satake Eng Co Ltd | Apparatus for measuring polishing degree of grain of rice |
-
1988
- 1988-02-25 JP JP4316588A patent/JPH01217241A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53106080A (en) * | 1977-02-26 | 1978-09-14 | Ritsuo Hasumi | Reflection and transmission factor measuring instrument |
JPS56106144A (en) * | 1980-01-18 | 1981-08-24 | Univ Groningen | Optical reflectometer |
JPH01142441A (en) * | 1987-11-28 | 1989-06-05 | Satake Eng Co Ltd | Apparatus for measuring polishing degree of grain of rice |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011214941A (en) * | 2010-03-31 | 2011-10-27 | Caloria Japan Co Ltd | Device for discriminating foreign matter contamination in object |
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