JPH01137679A - Semiconductor light emitting element - Google Patents
Semiconductor light emitting elementInfo
- Publication number
- JPH01137679A JPH01137679A JP62296925A JP29692587A JPH01137679A JP H01137679 A JPH01137679 A JP H01137679A JP 62296925 A JP62296925 A JP 62296925A JP 29692587 A JP29692587 A JP 29692587A JP H01137679 A JPH01137679 A JP H01137679A
- Authority
- JP
- Japan
- Prior art keywords
- light
- light emitting
- electrode
- type
- emitting layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
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- Led Devices (AREA)
Abstract
Description
【発明の詳細な説明】 産業上の利用分野 本発明は発光ダイオードの構造に関するものである。[Detailed description of the invention] Industrial applications The present invention relates to the structure of a light emitting diode.
従来の技術
従来、この種の発光ダイオードは第2図(a) 、 (
b) 、 (C)に示すような断面2表面電極パターン
、裏面電極パターンの構成であった。第2図(a)にお
いて、1はn形G al−xAQ xA s (x =
0.4)、2はn形G al−xAe xA 5(x
−0,2>、3はp形GaAs発光層、4はp形G a
I−x A e x A s (x −0、35)、
5はp形Ga1−xAe、As (x=0.17)、6
はA u / B e電極、7はA u / G e電
極である。この従来例発光ダイオードでは、p形GaA
s発光層3より下方に設置されているn形Ga H−x
A i!xAs 2および同1が本発光ダイオードの発
光波長(880n m )に対して透明である。このよ
うに発光層より下方に設置された半導体結晶が発光波長
に対し透明な場合、裏面の電極7を第2図(C)のよう
に部分的に形成し、電極を形成しない部分で光を反射さ
せて光を表面から取り出す。Conventional technology Conventionally, this type of light emitting diode is shown in Fig. 2(a), (
b) It had a configuration of two cross-sections, a front electrode pattern and a back electrode pattern, as shown in (C). In FIG. 2(a), 1 is n-type Gal-xAQ xA s (x =
0.4), 2 is n-type Gal-xAe xA 5(x
-0,2>, 3 is p-type GaAs light emitting layer, 4 is p-type Ga
I-x A e x A s (x -0, 35),
5 is p-type Ga1-xAe, As (x=0.17), 6
is the A u/Be electrode, and 7 is the A u/G e electrode. In this conventional light emitting diode, p-type GaA
n-type Ga H-x installed below the s-emitting layer 3
A i! xAs 2 and xAs 1 are transparent to the emission wavelength (880 nm) of the present light emitting diode. If the semiconductor crystal placed below the light-emitting layer is transparent to the emission wavelength, the electrode 7 on the back surface is formed partially as shown in FIG. Light is extracted from the surface by reflection.
発明が解決しようとする問題点
表面の電極形状が第2図(b)のような場合、電流は、
概ね、第3図(a)のように拡がって流れるが、p形G
al−xAl! xA s 4および5の拡がり抵抗
のために発光層での電流密度は第3図(b)のように表
面電極直下の部分が最も高くなる。p形Ga (−、A
exAs4および5の厚さは通常数μmであり、これ
らの層が薄くなるほど表面電極直下の発光層への電流集
中の傾向が強くなる。一般に発光強度は電流密度に比例
するため発光層での発光強度は表面電極の直下が最も強
(なる。ところが、第2図(C)のように裏面の電極を
一様に分布させた場合、表面電極直下の発光層で発光し
下方に向かった光は裏面の電極部分では吸収され、平坦
な光反射面で反射した光も多くは上方に存在する表面電
極で遮られて取り出せない。このように従来のような裏
面の光反射面では発光強度の強い部分の光を有効に取り
出せず発光出力を高める上で不利であるという問題があ
った。Problem to be Solved by the Invention When the electrode shape on the surface is as shown in FIG. 2(b), the current is
The flow generally spreads as shown in Figure 3(a), but the p-type G
al-xAl! Due to the spreading resistance of xA s 4 and 5, the current density in the light emitting layer is highest in the portion immediately below the surface electrode as shown in FIG. 3(b). p-type Ga (-, A
The thickness of exAs 4 and 5 is usually several μm, and the thinner these layers are, the stronger the tendency for current to concentrate on the light emitting layer directly under the surface electrode. Generally, the luminescence intensity is proportional to the current density, so the luminescence intensity in the luminescent layer is strongest immediately below the front electrode. However, if the back electrodes are uniformly distributed as shown in Figure 2 (C), The light emitted by the light-emitting layer directly below the front electrode and directed downward is absorbed by the back electrode, and much of the light reflected by the flat light-reflecting surface is blocked by the upper surface electrode and cannot be extracted. However, there was a problem in that the conventional light reflecting surface on the back side could not effectively extract the light from the portion where the luminous intensity was strong, which was disadvantageous in increasing the luminous output.
本発明は、このような問題点を解決するもので表面電極
直下の発光層で光る発光強度の強い光を有効に取り出し
、発光出力を高めることを目的とするものである。The present invention is intended to solve these problems, and aims to effectively extract the high-intensity light emitted from the light-emitting layer immediately below the surface electrode, thereby increasing the light-emitting output.
問題点を解決するための手段
この問題点を解決するために本発明は、発光ダイオード
の裏面のうち、表面に形成された電極部分の直下の領域
を凹状で球面状の面となし、その半導体結晶面を露出さ
せたものである。Means for Solving the Problem In order to solve this problem, the present invention provides a concave and spherical surface for the region directly below the electrode portion formed on the front surface of the back surface of the light emitting diode. The crystal plane is exposed.
作用
このように裏面のうち表面電極の直下部分を凹状で球面
状の面にすることにより、この部分が結晶内部からみる
と凸状の光反射面となり、表面電極直下の発光強度の強
い部分の光を有効に取り出すことができる。Effect By making the part of the back surface directly below the front electrode into a concave and spherical surface, this part becomes a convex light-reflecting surface when viewed from inside the crystal, and the part directly under the front electrode with high emission intensity is reflected. Light can be extracted effectively.
実施例
第1図(a)は本発明の一実施例による発光ダイオード
の断面図、第1図(b)は表面電極形状、第1図(C)
は裏面電極形状である。第1図(a)において、1はn
形Ga+−xAex As (x=0.4)、2はn形
Ga+−xAexAs(x=0.2)、3はp形GaA
s発光層、4はp形Ga1−、AexAs(x=0.3
5)、5はp形Ga1−、A+2.As (x=0.1
7)、6は表面A u / B e電極、7は裏面A
u / G e電極である。基本的な構成は第2図の従
来例と同じであるが、裏面電極形状と裏面部分の形状が
従来例とは異なる。Embodiment FIG. 1(a) is a cross-sectional view of a light emitting diode according to an embodiment of the present invention, FIG. 1(b) is a surface electrode shape, and FIG. 1(C) is a sectional view of a light emitting diode according to an embodiment of the present invention.
is the shape of the back electrode. In Figure 1(a), 1 is n
Type Ga+-xAex As (x=0.4), 2 is n-type Ga+-xAexAs (x=0.2), 3 is p-type GaA
s light-emitting layer, 4 is p-type Ga1-, AexAs (x=0.3
5), 5 is p-type Ga1-, A+2. As (x=0.1
7), 6 is the front side A u / Be electrode, 7 is the back side A
It is a u/Ge electrode. The basic configuration is the same as the conventional example shown in FIG. 2, but the shape of the back electrode and the shape of the back surface are different from the conventional example.
このような発光ダイオードは第1図の各図を参照して説
明すると、以下のようにして作製される。Such a light emitting diode will be explained with reference to each figure in FIG. 1, and will be manufactured as follows.
まず、n形GaAs基板(不図示)上に液相エピタキシ
ャル成長法により、n形G al−xAex A 5(
x=0.4)1をgQμm、n形Ga1−、AexAs
(x−0,2)2を15μm、p形GaAs発光層3を
1 u m r p形Gap−xAexAs (x=0
.35)4を2am、p形Ga1−xAexAs (x
=0.17)5を4μmと順次成長する。次にp形Ga
1−、A e、As(x=0.17)5上にA u
/ B e合金を蒸着し、フォトリソグラフィ法により
直径120μmの電極6を形成する。ついで前記n形G
aAs基板(不図示)を過酸化水素:アンモニア=20
:1の混合液でエツチング除去し、n形Ga 1−xA
exAs(x−0,4)1面にA u / G e合
金を蒸着し、フォトリソグラフィ法により、第1図(C
)のような中央部が直径150μmあいた形状の電極7
を形成する。First, an n-type GaAs substrate (not shown) was grown by liquid phase epitaxial growth on an n-type GaAs substrate (not shown).
x=0.4) 1 as gQμm, n-type Ga1-, AexAs
(x-0,2)2 is 15 μm, p-type GaAs light emitting layer 3 is 1 u m r p-type Gap-xAexAs (x=0
.. 35) 4 is 2am, p-type Ga1-xAexAs (x
=0.17) 5 to 4 μm. Next, p-type Ga
1-, A e, As (x=0.17) A u on 5
/Be alloy is deposited, and an electrode 6 having a diameter of 120 μm is formed by photolithography. Then the n-type G
aAs substrate (not shown) with hydrogen peroxide: ammonia = 20
: Etched with a mixed solution of 1 to remove n-type Ga 1-xA
A u/G e alloy was deposited on one surface of exAs(x-0,4), and the photolithography method was used to deposit the A u/G e alloy as shown in Fig. 1 (C
) The electrode 7 has a shape with a diameter of 150 μm in the center.
form.
そして、直径150umのn形(:、 211−xA
exA 5(x−0,4)、1の裏面中央部分を過酸イ
、ヒ水素とリン酸との混合液で、深さ約8μmの球面状
の穴8を形成する。この部分が結晶内部からみると凸状
の光反射面となる。And an n-type with a diameter of 150 um (:, 211-xA
A spherical hole 8 having a depth of about 8 μm is formed in the center of the back surface of exA 5 (x-0, 4), 1 with a mixture of peroxide, arsenic, and phosphoric acid. This portion becomes a convex light-reflecting surface when viewed from inside the crystal.
このように発光層に対して表面電極と面対称な裏面部分
を凹状で球面状にすると、表面電極直下の発光層で発光
し下方に向かった光は、第1図(a)中に矢印で示した
ように、裏面の結晶内部からみると凸状で球面状の光反
射面で斜め上方に反射し、表面電極で遮られることな(
、表面から取り出せる。これを、従来例と対比して、特
性面でみると、従来例として、裏面側の直径70μmの
電極が第2図(C)のように106μm間隔で形成され
た従来構造の発光ダイオードの発光出力は50mAで6
.4mWであり、その時の駆動電圧は1.36Vであっ
たのに対し、第1図示の実施例による発光ダイオードの
発光出力は50mAで7.2mWであり、従来例による
発光ダイオードに比べ約12%発光出力が向上した。な
お、本発明の一実施例の裏面電極の面積割合は34%で
あり、発光ダイオードの駆動電圧は50mAで1.36
Vと従来例と同じである。このことから、光反射面の割
合は本発明の一実施例と従来例とは同じ筈であるが、発
光出力は本発明の一実施例による発光ダイオードの方が
約12%高(、裏面での反射光を効果的に取り出してい
ることがわかる。If the back surface of the light-emitting layer, which is plane-symmetrical to the front electrode, is made concave and spherical, the light emitted from the light-emitting layer directly under the front electrode and directed downward will be reflected as shown by the arrow in Figure 1(a). As shown, when viewed from inside the crystal on the back side, the light is reflected diagonally upward by the convex, spherical reflecting surface, and is not blocked by the front electrode (
, can be removed from the surface. Comparing this with the conventional example and looking at its characteristics, the light emitting diode has a conventional structure in which electrodes with a diameter of 70 μm on the back side are formed at intervals of 106 μm as shown in Figure 2 (C). Output is 6 at 50mA
.. 4 mW, and the driving voltage at that time was 1.36 V, whereas the light emitting output of the light emitting diode according to the embodiment shown in the first figure was 7.2 mW at 50 mA, which is about 12% compared to the conventional light emitting diode. Improved light output. In addition, the area ratio of the back electrode in one embodiment of the present invention is 34%, and the driving voltage of the light emitting diode is 1.36 at 50 mA.
V and the conventional example. From this, the proportion of the light reflecting surface should be the same between the embodiment of the present invention and the conventional example, but the light emitting output of the light emitting diode according to the embodiment of the present invention is about 12% higher (the light emitting diode according to the embodiment of the present invention has a It can be seen that the reflected light is effectively extracted.
発明の効果
以上のように本発明によれば、表面電極直下の発光層で
光る発光強度の強い児を、裏面部分に形成した結晶内部
からみると凸状で球面上の光反射面で反射させて表面電
極部分以外の表面から取り出すことができ、発光出力を
高めることができる。Effects of the Invention As described above, according to the present invention, the high-intensity light emitted from the light-emitting layer directly under the front electrode is reflected by the light-reflecting surface, which is convex and spherical when viewed from inside the crystal formed on the back surface. The light can be taken out from the surface other than the surface electrode portion, and the light emission output can be increased.
第1図(a) 、 (b) 、 (C)は本発明の一実
施例による発光ダイオードの断面図2表面電極パターン
、裏面電極パターン図、第2図(a) 、 (b) 、
(C)は従来例による発光ダイオードの断面図2表面
電極パターン。
裏面電極パターン図、第3図(a) 、 (b)は典型
として、断面でみた電流経路分布と発光層での電流密度
を示す特性図である。
1−−・・−n形Ga1−、AexAs (x=0.4
) 、2−−− ・−n形Ga+−xAexAs (x
=0.2) 、3−p形GaAs発光層、4−− p形
GaI−xAexAs(x=0.35)、5−・・−p
形Ga■−xAexAs(x=0.17) 、6−表面
A u / B e電極、7・・・・・・裏面A u
/ G e電極。
代理人の氏名 弁理士 中尾敏男 ほか1名第1図
第3図
(b)FIGS. 1(a), (b), and (C) are cross-sectional views of a light emitting diode according to an embodiment of the present invention; FIGS.
(C) is a cross-sectional view of a conventional light emitting diode and a surface electrode pattern. The back electrode pattern diagrams, FIGS. 3(a) and 3(b), are typical characteristic diagrams showing the current path distribution seen in cross section and the current density in the light emitting layer. 1--...-n type Ga1-, AexAs (x=0.4
), 2--- ・-n-type Ga+-xAexAs (x
=0.2), 3-p-type GaAs light emitting layer, 4--p-type GaI-xAexAs (x=0.35), 5-...-p
Type Ga■-xAexAs (x=0.17), 6-Surface A u / B e electrode, 7... Back surface A u
/ G e electrode. Name of agent: Patent attorney Toshio Nakao and one other person Figure 1 Figure 3 (b)
Claims (1)
形成された電極部分とは発光層に対して面対称である部
分もしくは同部分を含む領域に、凹状で球面状の面をそ
なえたことを特徴とする半導体発光素子。A concave, spherical surface is provided on the back surface of the crystal of a surface-emitting type light-emitting diode, in a region that is symmetrical to the light-emitting layer with respect to the electrode portion formed on the surface, or in a region that includes the same portion. Characteristic semiconductor light emitting device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62296925A JPH01137679A (en) | 1987-11-24 | 1987-11-24 | Semiconductor light emitting element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62296925A JPH01137679A (en) | 1987-11-24 | 1987-11-24 | Semiconductor light emitting element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01137679A true JPH01137679A (en) | 1989-05-30 |
Family
ID=17839952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62296925A Pending JPH01137679A (en) | 1987-11-24 | 1987-11-24 | Semiconductor light emitting element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01137679A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5189496A (en) * | 1990-12-27 | 1993-02-23 | Eastman Kodak Company | Light-emitting diode with current-blocking |
US5414281A (en) * | 1992-08-25 | 1995-05-09 | Mitsubishi Cable Industries, Ltd. | Semiconductor light emitting element with reflecting layers |
US6946788B2 (en) | 2001-05-29 | 2005-09-20 | Toyoda Gosei Co., Ltd. | Light-emitting element |
JP2007067198A (en) * | 2005-08-31 | 2007-03-15 | Harison Toshiba Lighting Corp | Light emitting element |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5228888A (en) * | 1975-08-29 | 1977-03-04 | Semiconductor Res Found | Emission semiconductor device |
JPS6017969A (en) * | 1983-07-12 | 1985-01-29 | Matsushita Electric Ind Co Ltd | Light emitting semiconductor device |
-
1987
- 1987-11-24 JP JP62296925A patent/JPH01137679A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5228888A (en) * | 1975-08-29 | 1977-03-04 | Semiconductor Res Found | Emission semiconductor device |
JPS6017969A (en) * | 1983-07-12 | 1985-01-29 | Matsushita Electric Ind Co Ltd | Light emitting semiconductor device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5189496A (en) * | 1990-12-27 | 1993-02-23 | Eastman Kodak Company | Light-emitting diode with current-blocking |
US5414281A (en) * | 1992-08-25 | 1995-05-09 | Mitsubishi Cable Industries, Ltd. | Semiconductor light emitting element with reflecting layers |
US6946788B2 (en) | 2001-05-29 | 2005-09-20 | Toyoda Gosei Co., Ltd. | Light-emitting element |
JP2007067198A (en) * | 2005-08-31 | 2007-03-15 | Harison Toshiba Lighting Corp | Light emitting element |
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