JPH01129149A - Optical surface inspector - Google Patents
Optical surface inspectorInfo
- Publication number
- JPH01129149A JPH01129149A JP63255746A JP25574688A JPH01129149A JP H01129149 A JPH01129149 A JP H01129149A JP 63255746 A JP63255746 A JP 63255746A JP 25574688 A JP25574688 A JP 25574688A JP H01129149 A JPH01129149 A JP H01129149A
- Authority
- JP
- Japan
- Prior art keywords
- light
- line
- strip
- band
- fabric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims description 6
- 230000007547 defect Effects 0.000 claims abstract description 29
- 238000012545 processing Methods 0.000 claims abstract description 10
- 239000004744 fabric Substances 0.000 claims description 41
- 238000007689 inspection Methods 0.000 claims description 21
- 238000003384 imaging method Methods 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims 1
- 230000001360 synchronised effect Effects 0.000 claims 1
- 238000012800 visualization Methods 0.000 claims 1
- 239000004753 textile Substances 0.000 abstract description 16
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 230000003670 easy-to-clean Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
Ａ、産業上の利用分野
本発明は特許請求の範囲第１項の記載による織物の光学
表面検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to an optical surface inspection device for textiles according to claim 1.
Ｂ、従来技術
織物の自動表面横蓋には通常、レーザー走査装置が使用
され、移動方向にたいして横方向に位置する偏向ローラ
ー上を移動する織物を走査して、表面の欠陥を探しそれ
らを識別し登録する０本発明は特に、欠陥認識が特に難
しい織物に関わるものである。B. PRIOR ART Automated surface cross-covering of textiles typically uses a laser scanning device to scan the textile moving over deflection rollers positioned transversely to the direction of travel to locate and identify surface defects. Register 0 The invention particularly concerns textiles in which defect recognition is particularly difficult.
Ｃ１発明が解決しようとする問題点
本発明の目的は、光源としてレーザーを用いたり急速に
回転するミラー輪を使用することなく、織物製造中に発
生する最も不穏当な欠陥だけでも発見し識別できる、特
に織物を対照にする光学表面検出装置を提供することに
ある。欠陥を識別するため顛 様々な欠陥ができるだけ
区別できるように異なる信号や信号の組合せを供給しな
ければならない。C1 Problems to be Solved by the Invention It is an object of the invention to detect and identify even the most disturbing defects occurring during textile production without using a laser as a light source or a rapidly rotating mirror wheel. The object of the present invention is to provide an optical surface detection device that is particularly sensitive to textiles. To identify defects, different signals or combinations of signals must be provided so that the various defects can be distinguished as much as possible.
特許請求の範囲第１項に記載の特徴は、本目的を満たす
ために設けである。この方式では、汚れやオイル・スポ
ットを拡散反射が減少した点としく軽減： レミッショ
ン）て認識し指示することができるだけでなく、観察角
度を浅くすることで、けば立ち、節玉または糸のゆるみ
など材料表面から上方に突出している欠陥を局所陰影部
分として認識することも可能である。The features recited in claim 1 are provided to meet this objective. This method not only allows dirt and oil spots to be recognized and indicated as spots with reduced diffuse reflection (remissions), but also allows for shallow observation angles to reduce lint, knots, or threads. It is also possible to recognize defects that protrude upward from the material surface, such as loose parts, as local shadow areas.
特許請求の範囲第１項ないし第５項には、織物の表面上
に突出する欠陥を認識するときに装置の感度を変更した
り最適化することが可能な測定装置が記載しである。Claims 1 to 5 describe a measuring device with which the sensitivity of the device can be varied or optimized when recognizing defects protruding on the surface of a fabric.
特許請求の範囲第６項の実施例により、給送中に発見で
きる織物の欠陥をすべて認識したり登録することもでき
る。これらの欠陥には、織物の厚くなったり薄くなった
りした部分や２ｆｆｉ糸や糸の抜けなどが含まれている
。織物の孔もこの方法で認識できる。The embodiment of claim 6 also makes it possible to recognize and register all fabric defects that can be detected during feeding. These defects include thickened or thinned areas of the fabric, 2ffi yarns and missing threads. Holes in textiles can also be recognized in this way.
特許請求の範囲第７項に記載の実施例は、列カメラが暗
部に近づいて、実際の織物密度の映像が得られるので、
特に有益である。しかし、調査された織物は湯すぎるこ
ともなく、この目的のために黒く色を塗られてもない。The embodiment set forth in claim 7 provides an image of the actual fabric density as the row camera moves closer to the dark area.
Particularly useful. However, the fabrics studied were neither too hot nor painted black for this purpose.
受光手段のかさばらない構成は、特許請求の範囲第８項
による構成から得られる。この構成では、偏光ミラー帯
の長さを特許請求の範囲第９項に記載の方式で選択する
のが便利である。A less bulky construction of the light receiving means results from the construction according to claim 8. In this configuration, it is convenient to select the length of the polarizing mirror band in the manner described in claim 9.
その構成は、その２台の列カメラの観察角度が、１１査
材料または一般的な欠陥間瓶に応じて欠陥の認識のため
の理想値に設定されると特に有益である。The configuration is particularly advantageous if the viewing angles of the two row cameras are set to ideal values for defect recognition depending on the inspection material or the general defect bin.
本発明の表面検査装置の発光手段は、特許請求の範囲第
１１項ないし第１４項に基づいて構成されるのが好まし
い、ハロゲン・フィラメント・ランプまたは高圧ナトリ
ウム・ランプなどが光源として適当である。The light emitting means of the surface inspection apparatus of the present invention is preferably constructed based on claims 11 to 14, and a halogen filament lamp or a high pressure sodium lamp is suitable as a light source.
特許請求の範囲第１５項に記載の構成は、織物機から巻
上げリールに連続して送られる織物の移動にふされしい
。The arrangement according to claim 15 is suitable for the movement of textiles that are continuously fed from a textile machine to a take-up reel.
特許請求の範囲第１６項の実施例も有益であるが、それ
は、この方法では、検査ラインの領域に当たる織物に完
全にｆ８頼性のある織り部と欠陥のない糸道がｒｌられ
る一方で、給送中に帯状光内のｌｌ物の領域の観察は妨
げられないからである。The embodiment of claim 16 is also advantageous, since in this method a completely f8 reliable weave and a defect-free yarn path are provided in the fabric in the area of the inspection line, while This is because observation of the object area within the light strip is not obstructed during feeding.
本発明によると、凹面鏡は、製造費が比較的安く軸方向
に大きな孔があるため有益な円筒状鏡でもよい。円筒軸
に垂直な方向には、凹面鏡の口径角度は約３０度であり
、陰影端が鋭くなる。According to the invention, the concave mirror may be a cylindrical mirror, which is relatively cheap to manufacture and is advantageous because of its large axial hole. In the direction perpendicular to the cylinder axis, the aperture angle of the concave mirror is approximately 30 degrees, with a sharp shadow edge.
特に好ましい観察角度は特許請求第１８項により特徴付
けられている。A particularly preferred viewing angle is characterized by claim 18.
織物を観察中に織物の表面の状態を写す実際の偉を得る
には、特許請求の範囲第１９項にしたがってテレビ・モ
ニター上に偉を再生するのが有益である。この構成では
、複数のモニターが反射と透過用に設けである。しかし
、単一のモニターを設けてこれらの２つのイメージ間で
切り換えることにより反射または透過ｆ象を選択的に再
生することもできる。In order to obtain an actual pattern that reflects the condition of the surface of the fabric while observing the fabric, it is advantageous to reproduce the pattern on a television monitor according to claim 19. In this configuration, multiple monitors are provided for reflection and transmission. However, it is also possible to selectively reproduce reflection or transmission f-images by providing a single monitor and switching between these two images.
Ｄ、実施例
・第１図に示すように、ハウジング４０内に収容された
発光手段１１と受光手段１３は、角度ｔＲ整波装置８に
接続されている。受光手段１２は、おのおの２台の列カ
メラ１４、１４′と２台の偏光鏡帯２６．２７をもつ２
台の底浅ハウジング２９から構成される。この角度調整
装置２８は、織物１８の２つの端部に沿って構成された
２つの案内リングの形を取り、これらの案内リングは角
度調整装置２８の中心軸（１２）を中心に旋回可能であ
る。D. Embodiment As shown in FIG. 1, the light emitting means 11 and the light receiving means 13 housed in the housing 40 are connected to the angle tR wave straightening device 8. The light receiving means 12 comprises two row cameras each having two row cameras 14, 14' and two polarizing mirror bands 26,27.
It is composed of a shallow housing 29 with a base. This angle adjustment device 28 takes the form of two guide rings arranged along the two ends of the fabric 18, which guide rings are pivotable about the central axis (12) of the angle adjustment device 28. be.
検査をする織物１８は、矢印ｆの方向に角度調整装置２
２８と同軸上に並んだ２本の案内リングの間を走行する
ので、いつでも、織物１８の表面１９上の横方向線は角
度調整装Ｍ２８の中実軸（１２）と一致する。The fabric 18 to be inspected is moved by the angle adjusting device 2 in the direction of arrow f.
28, so that at any time the transverse line on the surface 19 of the fabric 18 coincides with the solid axis (12) of the angle adjustment device M28.
織物は、上方向に凸状の湾曲した透明円筒部３７により
この領域の下から支持されており、方向ｆによどみなく
送られる。The fabric is supported from below in this region by an upwardly convex curved transparent cylindrical portion 37, and is fed without stagnation in the direction f.
第１図と第３図に示しであるように、発光手段１１は、
直進スロット・ダイアフラム３６のスロットのすぐ前に
配置された直線光源３４を含む。As shown in FIGS. 1 and 3, the light emitting means 11 is
A straight slot diaphragm 36 includes a straight light source 34 located just in front of the slot.
帯状の凹面鏡３５はランプ３４に平行に、焦点距離より
長い距離分スロット・ダイアフラム３６まで延在してい
る。帯状の凹面鏡３５は、反射集束光線２１がハウジン
グ４０の基板の窓部４２を介して光源３４とスロット３
６を通過するように中央長手方向軸（第１図の時計方向
の意味）を中心に傾いている。第３図の表示には、第１
図の背面から斜方向に見られた透視図で発光手段１１を
示しである。A strip-shaped concave mirror 35 extends parallel to the lamp 34 to a slot diaphragm 36 for a distance greater than the focal length. The band-shaped concave mirror 35 allows the reflected and focused light beam 21 to pass through the window 42 of the substrate of the housing 40 to the light source 34 and the slot 3.
6 about the central longitudinal axis (meaning clockwise in FIG. 1). The display in Figure 3 shows the first
The light emitting means 11 is shown in a perspective view obliquely viewed from the back side of the figure.
発光手段１１の映像化条件は、円債形鏡として形成され
るのが好ましい帯状凹状！Ｊ１３５が、織物１８の表面
１９上の幅が狭くくっきりと境界付られた帯として、ス
ロット・ダイアフラム３６の開口部の縁部により境界付
けられた第２光源の映像を形成するものである。スロッ
ト・ダイアフラム３６と凹面＃ａ３５の光源３４の長手
方向は、移動ｆの方向に重直に、織物に平行に延在する
。織物は平坦に延在するので、生成される帯状光は織物
１８の進行方向に垂直に延在する。The imaging condition of the light emitting means 11 is that it is preferably formed as a circular concave mirror! J135 forms the image of the second light source bounded by the edge of the opening of the slot diaphragm 36 as a narrow, sharply delimited band on the surface 19 of the fabric 18. The longitudinal direction of the slot diaphragm 36 and the light source 34 of the concave surface #a35 extend parallel to the fabric, superimposed in the direction of the movement f. Since the fabric extends flat, the light band generated extends perpendicularly to the direction of travel of the fabric 18.
第３図によると、光源２４とそれに関連するスロット・
ダイアフラム３６は帯状凹面ｗ１３５より短く、その凹
面鏡３５は光源が生成する帯状光より短い、しかし、帯
状光１２は凹面＃１１３５の両端部を越えても生成され
るが、それは凹面５Ｊ１３５の両端部を越えて配置され
る織物の表面１９の領域も凹面鏡３５上の光源３４から
出るいく分類いた光により囲まれるからである。According to FIG. 3, the light source 24 and its associated slot
The diaphragm 36 is shorter than the strip concave surface w135, and its concave mirror 35 is shorter than the strip light generated by the light source.However, the strip light 12 is also generated beyond both ends of the concave surface #1135; This is because the area of the surface 19 of the fabric which is placed beyond is also surrounded by the classified light emanating from the light source 34 on the concave mirror 35.
しかし、光の長さは、凹面鏡３５の両噛を越えるといく
分弱くなる。複数の発光装置１１を凹面１３５から間隔
を保って、−列に、端部から端部に並べる場合、個々の
隣接する凹面鏡３５の発光領域は、帯状光１２のほぼ均
一な発光がその全長にわたってＩ ＰＩされるように隙
間に重なり合う。However, the length of the light becomes somewhat weaker when it crosses both sides of the concave mirror 35. When a plurality of light emitting devices 11 are arranged in rows from one end to the other with a distance from the concave surface 135, the light emitting area of each adjacent concave mirror 35 is such that the light emitting band 12 is emitted almost uniformly over its entire length. Overlap in the gap so that it will be I PI.
光電子受光手段１３はそれぞれ、底の浅いハウジング２
９に第１図と第２図にしたがって並べられている。入光
スロット３０は、帯状光１２に並列に延在し窓部により
閉じられるのが好ましい幅の狭い壁部３１の帯状光１２
の正反対に位置している。第２図に示すように、第１偏
光帯状鏡２６は、入光スロット３０に並列に隔置された
ハウジングの一方の側に配置され、帯状光１２より短く
なっている。より短い形の偏光鏡帯２７が入光スロット
３０に沿って備えてあり、第１偏光鋺帯２６から列カメ
ラ１４または１４’に反射された光を偏光させる。偏光
鏡帯２６．２７の長さとそれらの構成は、帯状光１２か
ら列カメラ１４または１４′の対物レンズ３２に延在す
る光線全体が採光できるように選択されている。おのお
のの場合、帯状光１２に並列に延在するダイオード列１
５は列カメラ１４．１４°内に配置されて、第１図に示
すように、それは電子処理回路１６に接続されている。Each of the photoelectronic receivers 13 has a housing 2 with a shallow bottom.
9 are arranged according to FIGS. 1 and 2. The light entry slot 30 extends parallel to the light strip 12 and is preferably closed by a window.
is located exactly opposite. As shown in FIG. 2, a first polarizing strip mirror 26 is located on one side of the housing spaced parallel to the light entry slot 30 and is shorter than the strip 12. A shorter polarizer strip 27 is provided along the light entry slot 30 to polarize the light reflected from the first polarizer strip 26 to the column camera 14 or 14'. The length of the polarizing mirror strips 26, 27 and their configuration are selected in such a way that the entire beam extending from the light strip 12 to the objective lens 32 of the column camera 14 or 14' is illuminated. In each case a diode array 1 extending parallel to the light strip 12
5 is located within the column camera 14.14° and it is connected to an electronic processing circuit 16, as shown in FIG.
織物速度測定装置４３から誘導される同期信号も電子処
理回路１６に供給される。テレビ・モニター１６が電子
処理回路１６に接続されており、列カメラ１４のダイオ
ード列１５または列カメラ１４′のダイオード列による
切換えスイッチ３９で選択的に制御できる。A synchronization signal derived from the fabric speed measuring device 43 is also supplied to the electronic processing circuit 16. A television monitor 16 is connected to the electronic processing circuit 16 and can be selectively controlled by a changeover switch 39 by the diode string 15 of the column camera 14 or the diode string of the column camera 14'.
列カメラ１４は織物１９上に配置され、その観察角度α
は約２０度である０列カメラ１４″は織物１８の下に、
発光光線２３と一定の角度を維持して配置されている。The row camera 14 is placed on the fabric 19 and its observation angle α
is approximately 20 degrees.The 0-row camera 14'' is placed under the fabric 18,
It is arranged to maintain a constant angle with the emitted light beam 23.
この発光光線２３は、列カメラ１４’がない場合には織
物１８の下の領域の発光手ａｌｌにより生成される。給
送中に動作する列カメラ１４’は、はとんど真暗な領域
で動作している。したがって、列カメラ１４’の概略的
に図示された＊素光２２は発光光線２３にまっすぐ沿っ
て進む。This luminescent beam 23 is generated by all the luminescent beams in the area below the fabric 18 in the absence of the row camera 14'. The row camera 14' that operates during feeding is mostly operating in a completely dark area. Therefore, the schematically illustrated elementary light 22 of the column camera 14' travels straight along the emitted light beam 23.
第１図に示すように発光手段１１が上方から垂直に織物
に光を当てる限り、ダイオード列カメラ１４°またはそ
のハウジング２９は、垂直方向に対して約１５度の観察
角度βを取るように配置されるのが好ましい。As long as the light-emitting means 11 illuminates the fabric vertically from above, as shown in FIG. Preferably.
第１図ないし第３図によると、列カメラ１４．１４′は
、帯状光１２内に配置されている織物の表面の検査ライ
ン１７のダイオード列１５上に映像を形成する。According to FIGS. 1 to 3, the array camera 14 , 14 ′ forms an image on the diode array 15 of the inspection line 17 of the surface of the fabric, which is arranged in the light strip 12 .
第１４図は、拡散反射で動作する列カメラ１４の動作方
式を示す、光が透過しないまたは部分的にしか透過しな
い欠陥２０が織物の表面１９上は突出していると仮定す
る。検査ライン１７は、帯状光の両側部の境界を定める
陰影縁部２４．２５と同じ方法で図面に垂直に延在して
いるようＩ：想像できる０発光手段１１から到来する集
束発光光線２１は同様に、第４図に示しである。２つの
観察光線またはｆｉ察中心方向２２゛または２２”は、
概略的に図示された列カメラ１４に向かう１点鎖線で示
してあり、その中１つは発光帯１２の中心、すなわち、
検査ライン１７に向けられ、池の１本２２″は、破線で
示しであるだけの列カメラ１４に隣接する帯状光１２の
陰影縁部１４に向けられている。FIG. 14 illustrates the mode of operation of the row camera 14 operating with diffuse reflection, assuming that a defect 20 is prominent on the surface 19 of the fabric through which no or only partially transmitting light is transmitted. The inspection line 17 extends perpendicularly to the drawing in the same way as the shadow edges 24.25 delimiting the sides of the light strip. The same is shown in FIG. The two observation rays or fi observation center directions 22゛ or 22'' are:
It is indicated by dash-dotted lines pointing towards the schematically illustrated row cameras 14, one of which is in the center of the luminous band 12, i.e.
Directed to the inspection line 17, one of the ponds 22'' is directed to the shadow edge 14 of the light strip 12 adjacent to the column camera 14, which is only indicated by a dashed line.
観察光線２２゛に沿って列カメラ１４を調整すると、欠
陥２０は、列カメラ１４が観察光ｌｌ５２２２に沿って
比較的明確な陰影縁部２４上に並べられているとき欠陥
２０は最も明確に認識される。When aligning the column camera 14 along the observation beam 22', the defect 20 is most clearly seen when the column camera 14 is aligned along the observation beam 115222 on a relatively clear shadow edge 24. be done.
欠陥認識は、それが検査ライン１７上に並べられている
ときより、ａＷＩ光１ｓ２２″にしたがっている列カメ
ラ１４の構成の方が敏感である。望ましい欠陥検出感度
は、位Ｗ１２２°と２２″の間の調整の変更はより実現
できる。Defect recognition is more sensitive with the configuration of the column camera 14 following the aWI light 1s22'' than when it is lined up on the inspection line 17. The desired defect detection sensitivity is Coordination changes between are more feasible.
記載の検査装置の動作方式は以下の通りである。The operating system of the described inspection device is as follows.
２つの列カメラ１４、１４’がそれぞれ、帯状光１８の
領域の１１８の表面にたいして適切な角度αとβに設定
された後、発光手段１１と列カメラ１４、１４°がオン
になり、織物１８も矢印ｆの方向へ進行するようになる
。電子処理回路１６は、織物１８の構造と欠陥にしたが
って形成された列カメラ１４、１４′のダイオード列１
５から信号を受信する。これらの信号はビデオ信号と呼
ばれるが、それは、それらがビデオ信号に対応する方式
で評価されるからである。織物１８の進行ｆの速度は、
ダイオード列１５の走査速度に関連して選択されている
ので織物１８の表面１９は横方向に抜けのないように走
査される。After the two row cameras 14, 14' have been set at suitable angles α and β, respectively, with respect to the surface of the region 118 of the light strip 18, the illuminating means 11 and the row cameras 14, 14° are switched on and the textile 18 The vehicle also begins to move in the direction of arrow f. The electronic processing circuit 16 includes a diode array 1 of the array camera 14, 14' formed according to the structure and defects of the fabric 18.
Receive signal from 5. These signals are called video signals because they are evaluated in a manner that corresponds to video signals. The speed of the movement f of the fabric 18 is
The selection is made in conjunction with the scanning speed of the diode array 15 so that the surface 19 of the fabric 18 is scanned transversely without omissions.
テレビ・モニター３８の線の飛越しは、織物速度測定袋
ｆｆ！４３から到来する同期信号により１ＩｌｌｆＪ４
されるので、ダイオード列１５により織物１８の線状走
査にしたがって複数の線がテレビ・モニター上でオンに
なる。テレビ・モニターに供給されたビデオ信号の振幅
はダイオード列１５の出力信号により制御されるので、
第４図に示しであるように、欠陥２０により陰影があら
れれたとき暗信号が生成される。この方式で、織物の所
定の長芋方向の領域の映像がテレビ・モニター３８上に
形成され、頂部から底部またはその逆に走行する。The skipping of the line on the TV monitor 38 is the fabric speed measurement bag ff! 1IllfJ4 due to the synchronization signal coming from 43
The diode array 15 turns on a plurality of lines on the television monitor according to the linear scan of the fabric 18. Since the amplitude of the video signal supplied to the television monitor is controlled by the output signal of the diode string 15,
As shown in FIG. 4, when the defect 20 is shaded, a dark signal is generated. In this manner, an image of a predetermined longitudinal area of the fabric is formed on the television monitor 38, running from top to bottom or vice versa.
個々の欠陥４４は明背景の晴位置としてこの映像で認識
できる。２台のテレビ・モニター３８を電子評価回路１
６に接続して、テレビ・モニターのおのおのはおのおの
の列カメラ１４．１４’に接続される。しかし、２つの
列カメラ１４、１４゜の１方または他方が単一テレビ・
モニター３８に選択的に１１続できる切換えスイッチ３
９を電子評価回路１６に備えることも可能である。Individual defects 44 can be recognized in this image as clear positions on a bright background. Two television monitors 38 connected to electronic evaluation circuit 1
6, each of the television monitors is connected to a respective row camera 14.14'. However, one or the other of the two row cameras 14, 14°
Selector switch 3 that can selectively connect 11 monitors 38
9 in the electronic evaluation circuit 16.
コンピュータ方式の動作欠陥分析機４５も電子処理回路
１６に接続できる。この電子処理回路によって、発生す
る欠陥はクラス別に検出でき、たとえばプリント・アウ
トして再生できる。そうすると、２つの列カメラ１４、
１４’のダイオード列の両信号並びに２つの出力信号か
ら結合された信号も使用できる０列カメラ１４．１４゛
は５０ｍｍ対物レンズ３２を備えるのが好ましい。A computer-based operational defect analyzer 45 may also be connected to the electronic processing circuit 16. With this electronic processing circuit, the defects that occur can be detected by class and, for example, printed out and reproduced. Then, two row cameras 14,
The zero column camera 14.14' is preferably equipped with a 50 mm objective lens 32, which can also use both signals of the diode array 14' as well as the combined signal from the two output signals.
２つの列カメラ１４または１４°とそれに関連する要素
２６．２７．２９は同様に構成されるとより有益になる
。It is more advantageous if the two row cameras 14 or 14° and their associated elements 26, 27, 29 are similarly configured.
窓部４２と入光スロット３０に絞けである窓部（オプシ
ョン）は、 ２重映像を回避するために本発明に従って
やや傾斜して配置されている。それらの窓部はハウジン
グから突出するように装着されており、清掃が容易であ
る０列カメラ１４、１４゛は焦点及びダイアフラム調整
機能をもつ、このため、１示してないハウジングの開口
部が設けられである。The window 42 and the optional window diaphragm to the light entry slot 30 are arranged at a slight angle in accordance with the invention to avoid double imaging. These windows are mounted so as to protrude from the housing and are easy to clean.The zero-row cameras 14, 14' have focus and diaphragm adjustment functions, so an opening in the housing (1) not shown is provided. It is rare.
凹面Ｍ１３５の映像化率は約１：１に達するが、やや拡
大率の高い１：１．５が好ましい。The imaging ratio of the concave surface M135 reaches approximately 1:1, but a slightly higher magnification ratio of 1:1.5 is preferable.
記載された表面検出装置の実際の表示では、寸法は以下
の通りである。In the actual representation of the surface sensing device described, the dimensions are as follows.
ハウジング２９の入力窓部までの距ｌｌｌ１：０ｃｍ
対物レンズ３２からハウシング２９の入力窓部への距離
： １３０−１４０ｃｍ
光線経路方向のハウジング２９の深さ８５０ｃｍ
折り返し光線経路の結果、ハウジングの長さを光線経路
の長さの約１／３に縮小できる。Distance to the input window of the housing 2911:0 cm Distance from the objective lens 32 to the input window of the housing 29: 130-140 cm Depth of the housing 29 in the direction of the ray path 850 cm As a result of the folded ray path, the length of the housing It can be reduced to about 1/3 of the length of the ray path.
本発明の検査装置の表面にはミラー・ホイールは不必要
であり、 レーザーの代わりに、眼には安全な庁ながら
の光源が使用できるので、視覚検査のための商品観察台
にこの装置を装着することも可能である。このようにし
て、検査官の訓練または自動検査システムの調整が容易
になる。The inspection device of the present invention does not require a mirror wheel on the surface, and instead of a laser, a commercially available light source that is safe for eyes can be used, allowing the device to be mounted on a product observation table for visual inspection. It is also possible to do so. In this way, training of inspectors or adjustment of automatic inspection systems is facilitated.
第１図は、織物平面に平行かつその進行方向に垂直な方
向から見た織物の光学表面検査装置の概略図である。
第２図は、第１図の線ＩＩ−ＩＩに従って第１図に使用
された受光手段の概略図である。
第３図は、第１図に使用された発光手段の概略投影図で
ある。
第４図は、本発明による欠陥認識を図示するために、織
物上で生成された帯状光の領域における、第１図ないし
第３図の表面検査装置でｉＡ査された織物の概略拡大断
面図である。
ＦＩＧ、２
ＦＩＧ、４FIG. 1 is a schematic diagram of an apparatus for inspecting the optical surface of textiles, viewed from a direction parallel to the plane of the textile and perpendicular to its direction of travel. FIG. 2 is a schematic diagram of the light receiving means used in FIG. 1 according to line II--II in FIG. FIG. 3 is a schematic projection view of the light emitting means used in FIG. FIG. 4 is a schematic enlarged cross-sectional view of a fabric inspected with the surface inspection apparatus of FIGS. 1 to 3 in the area of the band of light generated on the fabric to illustrate defect recognition according to the invention; FIG. It is. FIG, 2 FIG, 4
Claims (1)
段と帯状光により発光された表面領域から乱反射された
光を受け入れ、その光を受光構成に導く光電子受光手段
を含み、前記受光構成は織物の欠陥を表す信号を電子処
理回路におくる光学表面検査装置において、受光装置（
１３）がダイオード列（１５）をもち受光構成として作
用する少なくとも１つの列カメラ（１４）を含み、前記
列カメラ（１４）は帯状光（１２）が当たつた表面上の
線から送られた光を受信しダイオード列（１５）上に線
のイメージを形成し、前記列カメラは帯状光（１２）の
位置にある表面の接平面にたいして浅い観察角度αで配
置され、織物（１８）の表面（１９）から突出する低い
欠陥（２０）が帯状光（１２）の明るい背景にたいして
浅い輪郭として列カメラ（１４）に現れ、そのため対応
する電気信号がダイオード列（１５）から電子処理回路
（１６）送られることを特徴とする前記光学表面検査装
置。 ２、前記線が帯状光（１２）のほぼ中心にある検査ライ
ン（１７）であることを特徴とする請求項１に記載の装
置。 ３、前記線が列カメラ（１４）に向かって配置された帯
状光の陰影縁部であることを特徴とする請求項１に記載
の装置。 ４、前記線カメラ（１４）は検査ライン映像化位置（２
２’）と浅い縁部の映像化位置（２２”）の間で調整可
能であることを特徴とする請求項２または３に記載の装
置。 ５、前記検査ライン映像化位置と浅い縁部の映像化位置
の間の中間位置も選択できることを特徴とする請求項４
に記載の装置。 ６、前記帯状光により発光された表面領域により送られ
た光も受光する前記受光手段において、前記受光手段が
、受光構成としてダイオード列（１５）をもつ別の列カ
メラ（１４’）をもち、前記列カメラ（１４’）は帯状
光（１２）により発光された線、特に検査ライン（１７
）から織物を透過した光を受光して、前記線をダイオー
ド列（１５）上に映像化することを特徴とする 請求項１乃至５のいずれかに記載の装置。 ７、給送中に観察している前記列カメラ（１４’の観察
光線（２２）が、織物（１８）を通過する想像上の発光
光線（２３）の一定の角度をもった範囲のすぐ外側にあ
ることを特徴とする請求項６に記載の装置。 ８、列カメラ（１４、１４’）は、帯状光（１２）の反
対側に配置された幅の狭い壁（３１）をもつ浅いハウジ
ングに配置されて、前記幅の狭い壁（３１）は帯状光に
平行に延在し検査ライン（１７）とほぼ同じ長さの入光
スリット（３０）をもち、さらに、入光スロット（３０
）から隔置された領域において、入光スロットに平行に
延在する第１偏光鏡帯（２６）をもち、前記第１偏光鏡
帯（２６）は受け入れた光を前記第１偏光鏡帯に平行し
て構成された第２偏光鏡帯（２７）に偏光し、前記第２
偏光鏡帯（２７）は入光スロット（３０）により近い位
置に配置されているが、後者からは側面が離され、前記
第１偏光鏡帯（２６）に近い他端に装着されているが前
記帯からは側面が離されている列カメラ（１４、１４’
）に前記受け入れた光を方向付けることを特徴とする請 求項１乃至７のいずれかに記載の装置。 ９、前記第１および第２偏光鏡帯（２６、２７）は、前
記列カメラ（１４、１４’）の対物レンズ（３２）に集
束する受信光線（３３）にしたがって連続的に短くなる
ことを特徴とする請求 項８の装置。 １０、帯状光（１２）の位置の表面（１９）の接平面に
関して列カメラ（１４、１４’）の観察角度（α、β）
は、角度調節装置（２８）上に列カメラ（１４、１４’
）を配置することにより調整可能であることを特徴とす
る請求 項１乃至９のいずれかに記載の装置。 １１、発光手段（１１）は、共通直線上に配置された１
つまたは複数の直線状の光源をもち、前記光源は、前記
直線に並列に配置された帯状凹面鏡（３５）により、好
ましくは１：１の映像化規模で帯状に映像化され、帯状
光を形成することを特徴とする請求項１乃至１０のいず
れかに 記載の装置。 １２、光源（３４）の幅およびオプションとして長さは
光源のすぐ前に配置されたスロット・ダイアフラム（３
６）により限定されて、スロット・ダイアフラムの縁部
は、織物（１８）上に生成された帯状光（１２）を区切
り、２つの陰影縁部（２４、２５）を形成することを特
徴とする請求項１１に記載の装置。 １３、スロット・ダイアフラム（３６）をもつ複数の凹
面鏡（３５）と光源（３４）は、互いに列状に配列され
、複数の光の帯から成る光の通過帯を形成することを特
徴とする請求 項１１または１２に記載の装置。 １４、光源とスロット・ダイアフラム（３６）は凹面鏡
（３５）よりほぼ短いことと、凹面鏡（３５）は帯状光
（１２）よりほぼ短いことを特徴とする請求項１１乃至
１３のいずれか に記載の装置。 １５、織物（１８）はその平面に平行な方向に移動可能
で、帯状光（１２）はその移動方向にたいして横方向に
配置されていることを特徴とする装置。 １６、織物（１８）は硬化ガラスから成る浅い円筒部分
（３７）上の検査ライン（１７）に案内され、その円筒
軸は検査ライン（１７）に平行に延在することを特徴と
する請求項１乃至１５のいずれかに記載の装置。 １７、前記凹面鏡が円筒形鏡（３５）であり、その横断
面は部分的に円筒形（右側円筒形）または部分的に楕円
形状であることを特徴とする 請求項１乃至１６のいずれかに記載の装置。 １８、乱反射で作動する列カメラ（１４）の浅い観察角
度（α）が１０度ないし３０度、特に１５度ないし２５
度、好ましくは２０度に達することを特徴とする請求項
１乃至１７のいずれかに記載の装置。 １９、テレビ・モニター（３８）は電子処理回路（１６
）に接続され、ダイオード列の出力信号が線変調信号と
してテレビ・モニターに供給されて、テレビ・モニター
の線周波数はダイオード列（１５）の走査周波数と前記
織物の速度により線の進行と同期して、テレビ画面が、
テレビ・モニター（３８）状にある線の数に応じて帯状
の線（１２）の下で移動する織物の表面（１９）から生
成され、前記テレビ画面は暗位置として欠陥を再生する
ことを特徴とする請求項乃至１８のいずれかに記載の装
置。[Scope of Claims] 1. A light emitting means that generates a band of light on the surface of the fabric to be inspected, and a photoelectronic light receiving means that receives the light diffusely reflected from the surface area emitted by the band of light and guides the light to a light receiving configuration. in an optical surface inspection apparatus, wherein the light receiving arrangement sends a signal indicative of a defect in the fabric to an electronic processing circuit;
13) comprises at least one column camera (14) having a diode column (15) and acting as a light receiving arrangement, said column camera (14) being directed from a line on the surface impinged by the strip of light (12). receiving the light and forming a line image on the diode array (15), said array camera being positioned at a shallow viewing angle α to the tangential plane of the surface at the location of the strip of light (12), A low defect (20) protruding from (19) appears to the column camera (14) as a shallow outline against the bright background of the light strip (12), so that a corresponding electrical signal is transmitted from the diode column (15) to the electronic processing circuit (16). The optical surface inspection device is characterized in that it is sent. 2. Device according to claim 1, characterized in that said line is an inspection line (17) approximately in the center of the light strip (12). 3. Device according to claim 1, characterized in that the line is a shadow edge of a band of light arranged towards the column camera (14). 4. The line camera (14) is located at the inspection line visualization position (2).
The device according to claim 2 or 3, characterized in that it is adjustable between the inspection line imaging position (2') and the shallow edge imaging position (22'').5. Claim 4 characterized in that an intermediate position between the imaging positions can also be selected.
The device described in. 6. In the light receiving means which also receives the light transmitted by the surface area emitted by the light strip, the light receiving means has another row camera (14') having a diode row (15) as a light receiving arrangement; Said column camera (14') detects the line emitted by the light strip (12), in particular the inspection line (17).
6. The device according to claim 1, further comprising the step of receiving light transmitted through the fabric from a ray of light and imaging said line on a diode array (15). 7. The observation beam (22) of said row camera (14') observing during feeding is just outside the angular range of the imaginary emission beam (23) passing through the fabric (18) 8. The device according to claim 6, characterized in that the column camera (14, 14') is a shallow housing with a narrow wall (31) arranged opposite the light strip (12). , said narrow wall (31) has a light entrance slit (30) extending parallel to the light strip and having approximately the same length as the inspection line (17);
) having a first polarizing mirror band (26) extending parallel to the light entry slot, said first polarizing mirror band (26) directing received light into said first polarizing mirror band. The light is polarized to a second polarizing mirror band (27) configured in parallel;
The polarizing mirror strip (27) is located closer to the light entrance slot (30), but its side is separated from the latter, and is mounted at the other end closer to said first polarizing mirror strip (26). Row cameras (14, 14') whose sides are separated from the strip
8. Apparatus according to any preceding claim, characterized in that it directs the received light towards a light source. 9. The first and second polarizing mirror bands (26, 27) are continuously shortened according to the received light beam (33) converging on the objective lens (32) of the column camera (14, 14'); 9. The apparatus of claim 8, characterized in that: 10. Observation angle (α, β) of the column camera (14, 14') with respect to the tangent plane of the surface (19) at the location of the band light (12)
The row cameras (14, 14') are mounted on the angle adjustment device (28).
10. A device according to any one of claims 1 to 9, characterized in that it is adjustable by arranging. 11. The light emitting means (11) is arranged on a common straight line.
The light source has one or more linear light sources, and the light source is imaged in a band shape, preferably at a 1:1 imaging scale, by band-shaped concave mirrors (35) arranged in parallel with the straight line to form a band-shaped light source. The device according to any one of claims 1 to 10, characterized in that: 12. The width and optionally the length of the light source (34) is determined by the slot diaphragm (34) located immediately in front of the light source.
6), characterized in that the edge of the slot diaphragm delimits the light band (12) generated on the fabric (18) and forms two shadow edges (24, 25). Apparatus according to claim 11. 13. A plurality of concave mirrors (35) having a slot diaphragm (36) and a light source (34) are arranged in a line with each other to form a light passband consisting of a plurality of light bands. The device according to item 11 or 12. 14. The light source and the slot diaphragm (36) are substantially shorter than the concave mirror (35), and the concave mirror (35) is substantially shorter than the light strip (12). Device. 15. A device characterized in that the fabric (18) is movable in a direction parallel to its plane, and the light strip (12) is arranged transversely to the direction of movement. 16. Claim characterized in that the fabric (18) is guided in an inspection line (17) on a shallow cylindrical section (37) of hardened glass, the cylindrical axis of which extends parallel to the inspection line (17). 16. The device according to any one of 1 to 15. 17. Any one of claims 1 to 16, characterized in that the concave mirror is a cylindrical mirror (35), and its cross section is partially cylindrical (right-hand cylindrical) or partially elliptical. The device described. 18. The shallow observation angle (α) of the row camera (14) that operates by diffuse reflection is 10 degrees to 30 degrees, especially 15 degrees to 25 degrees.
18. Device according to any of claims 1 to 17, characterized in that it reaches a degree, preferably 20 degrees. 19. The television monitor (38) is equipped with an electronic processing circuit (16).
), and the output signal of the diode string is supplied as a line modulated signal to a television monitor, the line frequency of the television monitor being synchronized with the line progression by the scanning frequency of the diode string (15) and the speed of said fabric. So, the TV screen is
generated from the surface of the fabric (19) moving under the strip-like lines (12) according to the number of lines present on the television monitor (38), characterized in that said television screen reproduces defects as dark positions 19. A device according to any one of claims 1 to 18.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3734294.0 | 1987-10-09 | ||
| DE19873734294 DE3734294A1 (en) | 1987-10-09 | 1987-10-09 | OPTICAL SURFACE INSPECTION DEVICE |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01129149A true JPH01129149A (en) | 1989-05-22 |
Family
ID=6338047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63255746A Pending JPH01129149A (en) | 1987-10-09 | 1988-10-11 | Optical surface inspector |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4900153A (en) |
| EP (1) | EP0311014B1 (en) |
| JP (1) | JPH01129149A (en) |
| DD (1) | DD274903A5 (en) |
| DE (2) | DE3734294A1 (en) |
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| JP2006528286A (en) * | 2003-07-14 | 2006-12-14 | ウステル・テヒノロジーズ・アクチエンゲゼルシヤフト | Method and apparatus for monitoring a moved cloth web |
| JP2014190852A (en) * | 2013-03-27 | 2014-10-06 | Plex International Design Co Ltd | Clothes inspection device |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01310485A (en) * | 1988-06-08 | 1989-12-14 | Dainippon Printing Co Ltd | Defect information detecting device |
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| GB9008632D0 (en) * | 1990-04-17 | 1990-06-13 | Leicester Polytechnic | Inspecting garments |
| DE4031633A1 (en) * | 1990-10-05 | 1992-04-16 | Sick Optik Elektronik Erwin | OPTICAL INSPECTION DEVICE |
| GB9024936D0 (en) * | 1990-11-16 | 1991-01-02 | Leicester Polytechnic | Methods and apparatus for fabric inspection |
| FI92255C (en) * | 1992-10-16 | 1994-10-10 | Data Instmsto Oy | Device for monitoring the quality of the imprint produced with a printing machine |
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| FR2739879B1 (en) * | 1995-10-16 | 1997-11-21 | Ictb Macotex | DEVICE FOR THE AUTOMATIC INSPECTION AND DETECTION OF DEFECTS ON A TRAVELING BELT, SUCH AS A TEXTILE FABRIC |
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| IL131284A (en) * | 1999-08-05 | 2003-05-29 | Orbotech Ltd | Illumination for inspecting surfaces of articles |
| EP1337837A1 (en) * | 2000-11-27 | 2003-08-27 | Jensen Denmark A/S | An apparatus and a method of inspecting pieces of cloth |
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| ITUD20070151A1 (en) * | 2007-08-31 | 2009-03-01 | Ri Te S P A Ricambi Tessili | AUTOMATIC OPTICAL FABRIC INSPECTION EQUIPMENT |
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Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2382863A (en) * | 1943-03-02 | 1945-08-14 | Western Electric Co | Article handling apparatus |
| DE1144502B (en) * | 1960-07-28 | 1963-02-28 | Erwin Sick | Photoelectric scanning device |
| US3448279A (en) * | 1966-10-17 | 1969-06-03 | Lindly & Co Inc | Photoelectric defect detector having reflection test transmission test and edgewise test |
| US3695771A (en) * | 1970-08-06 | 1972-10-03 | Andras M Bardos | Method and apparatus for inspecting surfaces |
| DE2156638A1 (en) * | 1971-04-23 | 1972-11-16 | Nippon K ok an K.K., Tokio | Method for the detection of surface defects in a material passing through |
| US3834819A (en) * | 1973-07-05 | 1974-09-10 | Western Electric Co | Thickness measuring |
| US3841761A (en) * | 1973-10-24 | 1974-10-15 | Neotec Corp | Method and apparatus for detecting faults in fabric |
| JPS5140975A (en) * | 1974-10-02 | 1976-04-06 | Tsunemasa Okada | Jidotanshohoho oyobi sochi |
| GB1540066A (en) * | 1975-07-25 | 1979-02-07 | Nash P | Optical inspection systems |
| DE2827704C3 (en) * | 1978-06-23 | 1981-03-19 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optical device for determining the light exit angle |
| DE2827705C3 (en) * | 1978-06-23 | 1981-07-30 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Device for the detection of defects in web material |
| JPS55110905A (en) * | 1979-02-20 | 1980-08-27 | Hajime Sangyo Kk | Defect detecting device |
| DE2940262C2 (en) * | 1979-10-04 | 1982-09-30 | Karl Dipl.-Ing. 7500 Karlsruhe Armbruster | Method for determining the contour of an object moved past a measuring point |
| DE3004717C2 (en) * | 1980-02-08 | 1986-03-27 | Agfa-Gevaert Ag, 5090 Leverkusen | Device for the electronic scanning of objects to be recorded |
| US4472056A (en) * | 1980-07-23 | 1984-09-18 | Hitachi, Ltd. | Shape detecting apparatus |
| JPS58173456A (en) * | 1982-04-05 | 1983-10-12 | Showa Electric Wire & Cable Co Ltd | Automatic inspection device for foreign matter |
| DE3242447C2 (en) * | 1982-11-16 | 1986-01-23 | Sophokles 8062 Markt Indersdorf Papaioannou | Photoelectric control device for quality control of a moving material web |
| GB2133871A (en) * | 1982-12-23 | 1984-08-01 | Austin Rover Group | Apparatus for a method of inspecting automotive components |
| FI67448C (en) * | 1983-06-28 | 1985-03-11 | Enso Gutzeit Oy | PROCEDURE FOR THE DETECTION OF DETECTORS OF STRIMMERS AND MASKING PAPERS |
| DE3446355C2 (en) * | 1984-12-19 | 1986-11-06 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optical troubleshooting device |
| DE3544871A1 (en) * | 1984-12-19 | 1986-09-11 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optical fault-finding device |
| DE3534019A1 (en) * | 1985-09-24 | 1987-04-02 | Sick Optik Elektronik Erwin | OPTICAL RAILWAY MONITORING DEVICE |
| DE3601443A1 (en) * | 1986-01-20 | 1987-07-23 | Gebhard Birkle | Device for guiding and optically scanning flat objects |
| DE3636192C1 (en) * | 1986-10-24 | 1988-02-18 | Erhardt & Leimer Gmbh | Device for capturing the image of surface areas of running webs of goods |
-
1987
- 1987-10-09 DE DE19873734294 patent/DE3734294A1/en active Granted
-
1988
- 1988-10-04 EP EP88116402A patent/EP0311014B1/en not_active Expired - Lifetime
- 1988-10-04 DE DE88116402T patent/DE3883683D1/en not_active Expired - Fee Related
- 1988-10-06 DD DD88320538A patent/DD274903A5/en not_active IP Right Cessation
- 1988-10-06 US US07/254,331 patent/US4900153A/en not_active Expired - Fee Related
- 1988-10-11 JP JP63255746A patent/JPH01129149A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006528286A (en) * | 2003-07-14 | 2006-12-14 | ウステル・テヒノロジーズ・アクチエンゲゼルシヤフト | Method and apparatus for monitoring a moved cloth web |
| JP2005120563A (en) * | 2003-10-10 | 2005-05-12 | Truetzschler Gmbh & Co Kg | Device for detecting foreign material in plastic material in fiber flock in spinning preparation |
| JP2014190852A (en) * | 2013-03-27 | 2014-10-06 | Plex International Design Co Ltd | Clothes inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0311014A2 (en) | 1989-04-12 |
| EP0311014A3 (en) | 1990-05-30 |
| US4900153A (en) | 1990-02-13 |
| DE3883683D1 (en) | 1993-10-07 |
| DE3734294C2 (en) | 1991-06-27 |
| DE3734294A1 (en) | 1989-04-27 |
| DD274903A5 (en) | 1990-01-03 |
| EP0311014B1 (en) | 1993-09-01 |
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