JP7644108B2 - 高周波検出方法および装置 - Google Patents
高周波検出方法および装置 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/024—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00 using polarisation effects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/88—Radar or analogous systems specially adapted for specific applications
- G01S13/89—Radar or analogous systems specially adapted for specific applications for mapping or imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/027—Constructional details of housings, e.g. form, type, material or ruggedness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/03—Details of HF subsystems specially adapted therefor, e.g. common to transmitter and receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
- G01N2021/177—Detector of the video camera type
- G01N2021/1772—Array detector
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- Radar Systems Or Details Thereof (AREA)
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Description
ΔT=Tsys/(t x B)1/2、
ここでΔTは、空間的に分解された領域の間の最小分解可能温度差である。変数Tsysは検出器エレクトロニクスのシステムノイズ温度であり、tはサンプルを収集するためにかかった時間であり、Bは検出器の帯域幅である。
Claims (14)
- 検出システム(300)であって、
第1の検出器ブロック(308、310、312、400)と、
局部発振器(LO)ソース(326)と、
1つ以上の中間周波数(IF)処理回路(320、321、322、460)と、を含み、
前記第1の検出器ブロックは、
1つ以上のヘテロダインミキサー素子(314)と、
前記LOソースからのLO信号を前記1つ以上のヘテロダインミキサー素子に提供するように構成された1つ以上のLO入力導波路チャネル(202、404)と、
検出された無線周波数(RF)信号を前記1つ以上のヘテロダインミキサー素子に提供するように構成された1つ以上の導波路フィードホーン(116、402)と、
前記1つ以上のヘテロダインミキサー素子からのIF信号を前記1つ以上のIF処理回路に提供するように構成された1つ以上のIF出力チャネル(208、406)と、を含み、
前記1つ以上の導波路フィードホーンおよび前記1つ以上のLO入力導波路チャネルは前記第1の検出器ブロックの第1の軸に沿って伸長し、前記1つ以上のIF出力チャネルは前記第1の検出器ブロックの第2の軸に沿って伸長し、前記第1の軸と前記第2の軸とは垂直であり
前記1つ以上の導波路フィードホーンは、前記第1の検出器ブロックの第1面に露出され、
前記1つ以上のLO入力導波路チャネルの入力は、前記第1の検出器ブロックの第2面に露出され、
前記第2面は、前記第1の検出器ブロックの前記第1面の反対側である、
システム。 - 請求項1に記載のシステムであって、
前記第1の検出器ブロックは、複数の前記ヘテロダインミキサー素子と、前記第1の検出器ブロックの表面上のアレイに構成された複数の前記導波路フィードホーンと、複数の前記IF処理回路と、を含み、
前記複数のIF処理回路は積み重ねられた構成で配置される、システム。 - 請求項1または請求項2に記載のシステムであって、
前記第1の検出器ブロックに隣接する第2の検出器ブロック(450)をさらに含み、前記第2の検出器ブロックは、第2の複数のヘテロダインミキサー素子と、前記第2の検出器ブロックの表面上のアレイに構成された第2の複数の導波路フィードホーンと、を含む、システム。 - 請求項3に記載のシステムであって、
第2の複数のIF処理回路をさらに含み、前記第2の複数のIF処理回路も積み重ねられた構成で配置される、システム。 - 請求項3または4に記載のシステムであって、
前記第1の検出器ブロックの前記複数の導波路フィードホーンは第1の周波数に対してサイズが定められ、前記第2の検出器ブロックの前記第2の複数の導波路フィードホーンは第2の異なる周波数に対してサイズが定められる、システム。 - 請求項3~5のいずれかに記載のシステムであって、
前記第1および前記第2の検出器ブロックの少なくとも一方は偏光回転素子を含む、システム。 - 請求項3~6のいずれかに記載のシステムであって、
前記LOソースは不均等電力スプリッタによって前記第1または前記第2の検出器ブロックに結合される、システム。 - 請求項3~7のいずれかに記載のシステムであって、
前記第1および前記第2の検出器ブロックに対して放射線を通過または反射させるように配置された偏光プレートをさらに含む、システム。 - 請求項3~8のいずれかに記載のシステムであって、
第3の検出器ブロックと、第4の検出器ブロックとを含み、
前記第3及び第4の検出器ブロックは、前記第1及び第2の検出器ブロックの上に積み重ねられ、
前記第3及び第4の検出器ブロックは、1つ以上のスタッキングノッチを用いて前記第1及び第2の検出器ブロックの上に取り付けられる、
システム。 - 請求項3~9のいずれかに記載のシステムであって、
前記第1および前記第2の検出器ブロックの少なくとも一つには、1つ以上の角度が付けられたスタッキングノッチが設けられている、
システム。 - 請求項3~10のいずれかに記載のシステムであって、
前記第1の検出器ブロックの前記複数の導波路フィードホーンは、第1の中央周波数を有する放射線に対してサイズが定められ、前記第2の検出器ブロックの前記複数の導波路フィードホーンは、第2の中央周波数を有する放射線に対してサイズが定められ、
前記第1の中央周波数は250GHzであり、前記第2の中央周波数は375GHzである、システム。 - 請求項3~9のいずれかに記載のシステムであって、
前記第1および前記第2の検出器ブロックの前記複数の導波路フィードホーンは、同じ中央周波数を有する放射線に対してサイズが定められる、システム。 - 請求項12に記載のシステムであって、
前記中央周波数は125GHzまたは250GHzである、システム。 - 請求項3~13のいずれかに記載のシステムであって、
前記IF処理回路の少なくとも1つは、前記第1または前記第2の検出器ブロックの2つのRFフィードホーンの間に位置する、システム。
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US201962916596P | 2019-10-17 | 2019-10-17 | |
US62/916,596 | 2019-10-17 | ||
PCT/IB2020/059775 WO2021074888A1 (en) | 2019-10-17 | 2020-10-16 | High frequency detection method and apparatus |
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JP2022552575A JP2022552575A (ja) | 2022-12-16 |
JP7644108B2 true JP7644108B2 (ja) | 2025-03-11 |
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US (1) | US12253464B2 (ja) |
EP (1) | EP4045941A1 (ja) |
JP (1) | JP7644108B2 (ja) |
KR (1) | KR20220079666A (ja) |
CN (1) | CN114502945B (ja) |
AU (1) | AU2020365585A1 (ja) |
CA (1) | CA3156477A1 (ja) |
IL (1) | IL292203A (ja) |
WO (1) | WO2021074888A1 (ja) |
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US12105181B2 (en) * | 2021-06-24 | 2024-10-01 | Teradar, Inc. | Terahertz sensors and related systems and methods |
GB2622388B (en) * | 2022-09-14 | 2024-12-04 | Horiba Mira Ltd | Electromagnetic radiation system and method |
WO2024231841A1 (en) | 2023-05-08 | 2024-11-14 | Thruvision Limited | Line scanning with deep learning |
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