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JP6820892B2 - Printing wiring board and manufacturing method of printed wiring board - Google Patents

Printing wiring board and manufacturing method of printed wiring board Download PDF

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JP6820892B2
JP6820892B2 JP2018183606A JP2018183606A JP6820892B2 JP 6820892 B2 JP6820892 B2 JP 6820892B2 JP 2018183606 A JP2018183606 A JP 2018183606A JP 2018183606 A JP2018183606 A JP 2018183606A JP 6820892 B2 JP6820892 B2 JP 6820892B2
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insulating resin
cavity
foil
resin layer
carrier foil
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JP2020053621A (en
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淳男 川越
淳男 川越
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Kyocera Corp
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Description

本開示は、キャビティを有する印刷配線板および印刷配線板の製造方法に関するものである。 The present disclosure relates to a printed wiring board having a cavity and a method for manufacturing the printed wiring board.

近年、配線の高集積化および高密度化に伴い、多層印刷配線板にキャビティを設けて、そこに電子部品を実装するケースがあるが、キャビティに電子部品を実装する上では、キャビティ底部に形成する配線パターンのピール強度を向上することが望まれる。 In recent years, with the increase in the integration and density of wiring, there are cases where a cavity is provided in a multilayer printed wiring board and electronic components are mounted there. However, when mounting electronic components in the cavity, it is formed at the bottom of the cavity. It is desired to improve the peel strength of the wiring pattern to be used.

従来の印刷配線板では、以下に示すようにキャビティを形成している。例えばドリルやレーザを利用した座繰り加工で印刷配線板にキャビティを形成する場合、予め印刷配線板の内部に剥離層を設けておき、印刷配線板の表面からドリルまたはレーザで剥離層まで加工し、剥離層を境に剥離層の上部構造体を除去してキャビティを形成する。その後、剥離層を除去する。 In the conventional printed wiring board, a cavity is formed as shown below. For example, when forming a cavity in a printed wiring board by counterbore processing using a drill or a laser, a release layer is provided inside the printed wiring board in advance, and the surface of the printed wiring board is processed to the release layer by a drill or a laser. , The superstructure of the peeling layer is removed at the boundary of the peeling layer to form a cavity. After that, the release layer is removed.

これ以外に、例えば剥離層と同様の目的で、予め印刷配線板内部にダミーパターンを設けて、印刷配線板の表面からレーザを照射し、ダミーパターンをレーザの受けにして上部構造体を除去し、キャビティを形成する技術がある。この場合、ダミーパターンは、エッチングで除去する。 In addition to this, for example, for the same purpose as the release layer, a dummy pattern is provided inside the printed wiring board in advance, a laser is irradiated from the surface of the printed wiring board, and the dummy pattern is used as a laser receiver to remove the superstructure. , There is a technique to form a cavity. In this case, the dummy pattern is removed by etching.

特開平9−148744号公報Japanese Unexamined Patent Publication No. 9-148744 特開2012−146983号公報Japanese Unexamined Patent Publication No. 2012-146983 特開2017−069446号公報JP-A-2017-06946

上述した従来の技術では、以下のような問題がある。
印刷配線板の内部に剥離層を設ける技術では、副資材である剥離層を使用するため、部材コストおよび剥離層の形成コストが増えるという問題がある。また、この技術の場合、剥離層の上層と周辺の層との層構成のコントロールが難しく、さらに絶縁層や配線がたわみ、周囲の板厚も厚くなるという問題もある。また、ダミーパターンを設ける従来の技術では、最終的にダミーパターンをエッチングで除去するため、パッドに接続する配線が形成できず、キャビティに収容する電子部品と底部で回路配線を接続することが困難になる。
The above-mentioned conventional technique has the following problems.
In the technique of providing the release layer inside the printed wiring board, since the release layer as an auxiliary material is used, there is a problem that the member cost and the formation cost of the release layer increase. Further, in the case of this technique, it is difficult to control the layer structure between the upper layer of the release layer and the surrounding layer, and there is also a problem that the insulating layer and the wiring are bent and the surrounding plate thickness is increased. Further, in the conventional technique of providing the dummy pattern, since the dummy pattern is finally removed by etching, the wiring to be connected to the pad cannot be formed, and it is difficult to connect the circuit wiring to the electronic component housed in the cavity at the bottom. become.

また、ダミーパターンや剥離層を用いずにドリル加工で底部を平坦化する技術もあるが、切削加工時の深さ調整の精度の問題で、削りすぎや切削不足になることがある。削り残渣の除去不足になることもある。 There is also a technique for flattening the bottom by drilling without using a dummy pattern or a peeling layer, but due to the problem of depth adjustment accuracy during cutting, over-cutting or under-cutting may occur. Insufficient removal of shaving residue may occur.

本発明はこのような課題を解決するためになされたもので、キャビティ内の電子部品とキャビティ外の回路との接続をキャビティ底部で行えるようにしつつキャビティ底部に形成する配線パターンのピール強度を向上することができ、キャビティ底部に上部構造体の除去残渣が残らない印刷配線板および印刷配線板の製造方法を提供することにある。 The present invention has been made to solve such a problem, and improves the peel strength of the wiring pattern formed at the bottom of the cavity while enabling the connection between the electronic component inside the cavity and the circuit outside the cavity at the bottom of the cavity. It is an object of the present invention to provide a printed wiring board and a method for manufacturing a printed wiring board, which can be used and does not leave a removal residue of an upper structure on the bottom of the cavity.

本開示の1つの態様の印刷配線板は、
絶縁樹脂の基板の下層に絶縁樹脂により絶縁樹脂層を積層した多層基板の一部領域に、前記基板側に開口し前記基板を貫通し前記絶縁樹脂層の面を底面とするキャビティと、
前記絶縁樹脂層の面の周縁部を除く内側部と同等の高さの面を有しその面が前記底面の一部を形成するように前記絶縁樹脂層に埋め込まれた導体層と
を備え、
前記周縁部が前記内側部より深く形成されており、前記導体層は前記内側部のみに形成されており、
前記キャビティの底面の前記導体層は、前記キャビティの周囲の前記絶縁樹脂層より、キャリア箔付き金属箔の厚さ分低くなっている
The printed wiring board of one aspect of the present disclosure is
A cavity that opens to the substrate side, penetrates the substrate, and has the surface of the insulating resin layer as the bottom surface in a part of a multilayer substrate in which an insulating resin layer is laminated with an insulating resin on the lower layer of the insulating resin substrate.
It is provided with a conductor layer having a surface having the same height as the inner portion excluding the peripheral portion of the surface of the insulating resin layer and being embedded in the insulating resin layer so that the surface forms a part of the bottom surface.
The peripheral portion is formed deeper than the inner portion, and the conductor layer is formed only on the inner portion .
The conductor layer on the bottom surface of the cavity is lower than the insulating resin layer around the cavity by the thickness of the metal foil with the carrier foil .

本開示の1つの態様の印刷配線板の製造方法は、
第1の面および第2の面を有する絶縁樹脂の基板の前記第2の面に設けたキャリア箔付き金属箔の一部領域の上に、ニッケル、銅の順に連続してパターンめっきを施して導体層を形成する工程と、
前記基板の前記第1の面に第1の絶縁樹脂層を形成し、前記基板の前記第2の面に第2の絶縁樹脂層を形成する工程と、
前記第1の絶縁樹脂層の側から前記キャリア箔付き金属箔に向けて積層方向に切削加工して前記キャリア箔付き金属箔の途中まで又は前記キャリア箔付き金属箔を貫通するまで、キャビティ形成領域の輪郭線に沿って切削し、前記キャリア箔付き金属箔のキャリア箔と金属箔とを互いに剥離して前記キャリア箔付き金属箔の剥離面から上の上部構造体を除去してキャビティを形成し、前記キャリア箔付き金属箔を構成する箔を前記キャビティの底部に露出させる工程と、
前記キャビティの底部に露出した前記箔をフラッシュ・エッチングにより除去して、前記第2の絶縁樹脂層の面と前記第2の絶縁樹脂層に埋め込まれた前記導体層の面とを露出させる工程と
を備える。
A method for manufacturing a printed wiring board according to one aspect of the present disclosure is described.
On a part of the metal foil with the carrier foil provided on the second surface of the insulating resin substrate having the first surface and the second surface , nickel and copper are continuously patterned in this order. The process of forming the conductor layer and
A step of forming a first insulating resin layer on the first surface of the substrate and forming a second insulating resin layer on the second surface of the substrate.
Cavity forming region from the side of the first insulating resin layer toward the metal leaf with carrier foil in the laminating direction until halfway through the metal leaf with carrier foil or until it penetrates the metal leaf with carrier foil. The carrier foil and the metal foil of the metal foil with the carrier foil are separated from each other by cutting along the contour line of the above, and the upper superstructure is removed from the peeled surface of the metal foil with the carrier foil to form a cavity. The step of exposing the foil constituting the metal foil with the carrier foil to the bottom of the cavity, and
A step of removing the foil exposed at the bottom of the cavity by flash etching to expose the surface of the second insulating resin layer and the surface of the conductor layer embedded in the second insulating resin layer. To be equipped.

本開示の多層印刷配線板によれば、キャビティ内の電子部品とキャビティ外の回路との接続をキャビティ底部で行えるようにしつつキャビティ底部に形成する配線パターンのピール強度を向上することができる。更に、キャビティ底部に上部構造体の除去残渣が残らない。 According to the multilayer printed wiring board of the present disclosure, it is possible to improve the peel strength of the wiring pattern formed at the bottom of the cavity while enabling the connection between the electronic component inside the cavity and the circuit outside the cavity at the bottom of the cavity. Furthermore, no removal residue of the superstructure remains at the bottom of the cavity.

一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板の製造方法を説明する断面図である。It is sectional drawing explaining the manufacturing method of the printed wiring board of one Embodiment. 一つの実施の形態の印刷配線板及びその製造方法を説明する断面図である。It is sectional drawing explaining the printed wiring board of one Embodiment and the manufacturing method thereof. 一つの実施の形態の印刷配線板及びその製造方法を説明する断面図である。It is sectional drawing explaining the printed wiring board of one Embodiment and the manufacturing method thereof.

本開示の実施形態の印刷配線板について図面を参照して説明する。 The printed wiring board of the embodiment of the present disclosure will be described with reference to the drawings.

〔製造方法〕
まず、図1から図11を参照して一つの実施の形態の印刷配線板の製造方法を説明する。
近年、高密度配線を実現するための薄い金属箔(主に銅箔)の回路形成までのハンドリングを容易にするために、キャリア箔と呼ばれる支持体上に剥離層を形成しその上に薄い金属箔を形成したキャリア箔付き金属箔が利用可能となっている。
本方法は、キャリア箔付き金属箔の金属箔とキャリア箔との剥離機能を利用して上部構造体を分離除去しキャビティを形成する方法である。
〔Production method〕
First, a method of manufacturing a printed wiring board according to an embodiment will be described with reference to FIGS. 1 to 11.
In recent years, in order to facilitate the handling up to the circuit formation of a thin metal foil (mainly copper foil) for realizing high-density wiring, a release layer is formed on a support called a carrier foil and a thin metal is formed on the support. A metal leaf with a carrier foil on which the foil is formed is available.
This method is a method of forming a cavity by separating and removing the superstructure by utilizing the peeling function between the metal foil of the metal foil with the carrier foil and the carrier foil.

(基板準備工程)
図1に示すように、基板10の絶縁樹脂の上面(第1の面)および下面(第2の面)のうち下面(第2の面)にキャリア箔付き金属箔11が設けられたものを準備する。基板10は絶縁樹脂層や配線層が積層された積層基板でもよく、上面(第1の面)および下面(第2の面)は、積層された絶縁樹脂層の表面によるものであってもよい。
上面及び下面にキャリア箔付き金属箔が接合されたものでも構わないが、その場合は上面のキャリア箔を剥がすことが望ましい。本実施形態では、キャリア箔付き金属箔11を構成する箔である金属箔11aとキャリア箔11bのうち金属箔11aが基板10の下面(第2の面)に着設されたものを用いる。上述したようにキャリア箔付き金属箔11の金属箔11aとキャリア箔11bとの剥離機能を利用するだけであり、金属箔11aで配線を形成するわけではないので、どちらの箔を基板10側としても構わない。
キャリア箔付き金属箔11のそれぞれの厚みは12μm以上が好ましい。図3の構成では、キャリア箔11bは、後述のフラッシュ・エッチング可能な厚みである18μm以下が好ましい。両面積層板の上側の銅箔は、極力薄い12μm以下が望ましい。なお、キャリア箔付き銅箔は、後述のフラッシュ・エッチング前に、剥離面の除去が不要なMT−EX(三井金属鉱業株式会社製)が適している。
(Board preparation process)
As shown in FIG. 1, a metal foil 11 with a carrier foil is provided on the lower surface (second surface) of the upper surface (first surface) and the lower surface (second surface) of the insulating resin of the substrate 10. prepare. The substrate 10 may be a laminated substrate on which an insulating resin layer or a wiring layer is laminated, and the upper surface (first surface) and the lower surface (second surface) may be due to the surface of the laminated insulating resin layer. ..
A metal foil with a carrier foil may be bonded to the upper surface and the lower surface, but in that case, it is desirable to peel off the carrier foil on the upper surface. In the present embodiment, of the metal foil 11a and the carrier foil 11b, which are the foils constituting the metal foil 11 with the carrier foil, the metal foil 11a is attached to the lower surface (second surface) of the substrate 10. As described above, only the peeling function between the metal foil 11a and the carrier foil 11b of the metal foil 11 with the carrier foil is used, and the wiring is not formed by the metal foil 11a. Therefore, which foil is used as the substrate 10 side. It doesn't matter.
The thickness of each of the metal leaf 11 with the carrier foil is preferably 12 μm or more. In the configuration of FIG. 3, the carrier foil 11b preferably has a thickness of 18 μm or less, which will be described later, and is capable of flash etching. The copper foil on the upper side of the double-sided laminated plate is preferably as thin as possible, 12 μm or less. As the copper foil with a carrier foil, MT-EX (manufactured by Mitsui Mining & Smelting Co., Ltd.), which does not require removal of the peeled surface before flash etching described later, is suitable.

基板10を形成する絶縁樹脂としては、例えば、エポキシ樹脂、ビスマレイミド−トリアジン樹脂、ポリイミド樹脂、ポリフェニレンエーテル(PPE)樹脂、フェノール樹脂、ポリテトラフルオロエチレン(PTFE)樹脂、ケイ素樹脂、ポリブタジエン樹脂、ポリエステル樹脂、メラミン樹脂、ユリア樹脂、ポリフェニレンサルファイド(PPS)樹脂、ポリフェニレンオキシド(PPO)樹脂などが挙げられる。これらの樹脂は2種以上を混合してもよい。 Examples of the insulating resin forming the substrate 10 include epoxy resin, bismaleimide-triazine resin, polyimide resin, polyphenylene ether (PPE) resin, phenol resin, polytetrafluoroethylene (PTFE) resin, silicon resin, polybutadiene resin, and polyester. Examples thereof include resins, melamine resins, urea resins, polyphenylene sulfide (PPS) resins, and polyphenylene oxide (PPO) resins. Two or more of these resins may be mixed.

(キャリア箔付き金属箔エッチング処理工程)
次に、図2に示すようにキャビティ形成領域C1以外のキャリア箔付き金属箔11を、フォトリソグラフィを用いたマスクパターン形成とエッチング処理により除去する。
(Metal leaf etching process with carrier foil)
Next, as shown in FIG. 2, the metal leaf 11 with a carrier foil other than the cavity forming region C1 is removed by mask pattern formation and etching treatment using photolithography.

(パターンめっき処理工程)
続いて、キャリア箔付き金属箔11の一部領域(キャビティ形成領域C1内)の上にフォトリソグラフィを用いてパターンめっきを施して導体層を形成する。
この工程により、図3に示すように基板10の上面、下面の一部領域の上にパターンめっきを施して下面側キャビティ形成領域C1内の導体層12のほか、下面側キャビティ形成領域C1外の導体層13、上面側の導体層14を形成する。このとき、下面側キャビティ形成領域C1内の導体層12は、キャリア箔11b上に形成する。
具体的には、基板10の上面側及び下面側にドライフィルム15をラミネート加工で貼り付けた上で、露光および現像してマスクパターンを形成し、めっき処理を施して導体層12,13,14を形成する。
図ではパッドのみ示すが、配線パターンも任意に形成する。但し、下面側キャビティ形成領域C1内の周縁部C11は、後工程で座繰り加工するので、導体パターンを形成せず、座繰り加工対象の周縁部C11より内側の内側部C12においてキャリア箔11b上の導体パターンを完結する。
(Pattern plating process)
Subsequently, a conductor layer is formed by performing pattern plating on a partial region (inside the cavity forming region C1) of the metal foil 11 with a carrier foil by using photolithography.
By this step, as shown in FIG. 3, pattern plating is applied on a part of the upper surface and the lower surface of the substrate 10, and in addition to the conductor layer 12 in the lower surface side cavity forming region C1, the outside of the lower surface side cavity forming region C1. The conductor layer 13 and the conductor layer 14 on the upper surface side are formed. At this time, the conductor layer 12 in the lower surface side cavity forming region C1 is formed on the carrier foil 11b.
Specifically, after the dry film 15 is laminated on the upper surface side and the lower surface side of the substrate 10, the mask pattern is formed by exposure and development, and the conductor layers 12, 13, 14 are subjected to plating treatment. To form.
Although only the pad is shown in the figure, the wiring pattern is also formed arbitrarily. However, since the peripheral edge portion C11 in the lower surface side cavity forming region C1 is countersunk in a later process, a conductor pattern is not formed, and the inner peripheral portion C12 inside the peripheral edge portion C11 to be counterbored is on the carrier foil 11b. Complete the conductor pattern of.

パターンめっきは、銅めっきが基本である。ここでのパターンめっきは、後工程でキャリア箔11bを除去する際に、キャリア箔11b以外のパターンめっき部分もややエッチングされてしまうことに懸念がある場合、キャリア箔11bの除去に対するバリアとして、パターンニッケルめっき+パターン銅めっきの連続めっきを行う。この場合、ニッケルめっきの厚みは、2μm以上とする。 The pattern plating is basically copper plating. In the pattern plating here, when there is a concern that the pattern plating portion other than the carrier foil 11b is also slightly etched when the carrier foil 11b is removed in the subsequent process, the pattern is used as a barrier against the removal of the carrier foil 11b. Performs continuous plating of nickel plating + pattern copper plating. In this case, the thickness of the nickel plating is 2 μm or more.

このニッケルめっき処理を「バリアめっき」という。この段階のめっきで、部品実装の表面処理用のめっきも兼ねる場合は、ニッケル、金、ニッケル、銅めっきの連続めっきを行う。この場合もニッケルめっきの厚みは、1回目を2μm以上、2回目を3μm以上とし、金めっきは、部品の実装方法によるが、ワイヤボンディングの場合は0.3μm以上とする。 This nickel plating process is called "barrier plating". If the plating at this stage also serves as plating for surface treatment of component mounting, continuous plating of nickel, gold, nickel, and copper is performed. In this case as well, the thickness of the nickel plating is 2 μm or more for the first time and 3 μm or more for the second time, and the gold plating is 0.3 μm or more in the case of wire bonding, although it depends on the mounting method of the parts.

パターンめっき処理の後、残ったドライフィルム15を剥離して、図4に示すように、キャリア箔付き金属箔11を露出させる。 After the pattern plating treatment, the remaining dry film 15 is peeled off to expose the metal foil 11 with the carrier foil as shown in FIG.

(ビルドアップ層形成工程)
次に、図5に示すように、基板10の上面(第1の面)に第1の絶縁樹脂層16を形成し、基板10の下面(第2の面)に第2の絶縁樹脂層17を形成する。第1の絶縁樹脂層16及び第2の絶縁樹脂層17として、それぞれ一層又は任意の複数層を形成する。
(Build-up layer formation process)
Next, as shown in FIG. 5, the first insulating resin layer 16 is formed on the upper surface (first surface) of the substrate 10, and the second insulating resin layer 17 is formed on the lower surface (second surface) of the substrate 10. To form. As the first insulating resin layer 16 and the second insulating resin layer 17, one layer or an arbitrary plurality of layers are formed, respectively.

すなわち、基板10の上層(上面)および下層(下面)に、任意回数のビルドアップを行ない、多層基板B1を作製する。つまりこの工程では、キャビティ形成領域C1にキャリア箔付き金属箔11を残したまま、基板10に絶縁樹脂層16,17を形成することで、キャリア箔付き金属箔11が内部の基板10と絶縁樹脂層17(下部構造体)との間に埋め込まれた多層基板B1を作製(形成)する。 That is, the upper layer (upper surface) and the lower layer (lower surface) of the substrate 10 are built up an arbitrary number of times to produce the multilayer substrate B1. That is, in this step, the insulating resin layers 16 and 17 are formed on the substrate 10 while the metal foil 11 with the carrier foil is left in the cavity forming region C1, so that the metal foil 11 with the carrier foil is formed with the internal substrate 10 and the insulating resin. A multilayer substrate B1 embedded between the layer 17 (substructure) is manufactured (formed).

図6に示すように、層間接続用のビア18,19を含めて回路を多層基板B1に形成する。多層基板B1への回路形成には、例えば回路として不要な導体をエッチングで除去するサブトラクティブ法のみならず、M−SAP、SAPなどが適用できる。
ビア18,19の形成は、レーザ加工によって基板10、絶縁樹脂層16,17の所定の領域にビアホール下穴を形成する工程と、ビアホール下穴を含む前記領域にめっきを施す工程を実施して行う。
特に、キャリア箔11b上に形成された導体層12に接続するビア18を、第2の絶縁樹脂層16を貫通したビアホール下穴に形成することで、キャビティ形成領域C1内の導体層12を、キャビティ形成領域C1外に引き出すように回路を形成することができる。
As shown in FIG. 6, a circuit is formed on the multilayer board B1 including vias 18 and 19 for interlayer connection. For forming a circuit on the multilayer board B1, for example, not only a subtractive method of removing unnecessary conductors as a circuit by etching but also M-SAP, SAP and the like can be applied.
The vias 18 and 19 are formed by performing a step of forming a via hole pilot hole in a predetermined region of the substrate 10 and the insulating resin layers 16 and 17 by laser processing and a step of plating the region including the via hole pilot hole. Do.
In particular, the conductor layer 12 in the cavity forming region C1 is formed by forming the via 18 connected to the conductor layer 12 formed on the carrier foil 11b in the via hole pilot hole penetrating the second insulating resin layer 16. The circuit can be formed so as to be pulled out of the cavity forming region C1.

なお、図6に示すように多層基板B1の上面側のキャビティ形成領域C1内は、導体層を除去しておくことが好ましい。これは後述のキャビティ形成工程での座繰り加工をし易くするためである。 As shown in FIG. 6, it is preferable to remove the conductor layer in the cavity forming region C1 on the upper surface side of the multilayer substrate B1. This is to facilitate counterbore processing in the cavity forming step described later.

(キャビティ形成工程)
この工程では、まず、図7に示すように多層基板B1の上面、すなわち、第1の絶縁樹脂層16の側からキャリア箔付き金属箔11に向けて積層方向に切削加工してキャリア箔付き金属箔11の途中まで又はキャリア箔付き金属箔11を貫通するまで、キャビティ形成領域C1の輪郭線に沿って切削する。
本実施形態では、キャリア箔付き金属箔11を貫通するまで切削するものとする。また、先端にセンサーが設けられたドリルビットD1を用いることが良い。同センサーにより金属箔11aを信号検知した後、金属箔11aとキャリア箔11bの厚み分を考慮し、金属箔11aの上端から約30μm程ドリルで掘り下げる。これにより、キャリア箔11bまで貫通させる。掘り下げた穴をエンドミルにより横方向に切削してキャビティ形成領域C1の輪郭線に沿って切削する(周縁部C11を切削する。)。
本切削加工により形成した穴内に、金属箔11aとキャリア箔11bとの剥離境界が露出する。
(Cavity forming process)
In this step, first, as shown in FIG. 7, a metal with a carrier foil is cut from the upper surface of the multilayer substrate B1, that is, from the side of the first insulating resin layer 16 toward the metal foil with the carrier foil 11 in the stacking direction. Cutting is performed along the contour line of the cavity forming region C1 until the middle of the foil 11 or the metal foil 11 with the carrier foil is penetrated.
In the present embodiment, cutting is performed until the metal foil 11 with the carrier foil is penetrated. Further, it is preferable to use a drill bit D1 provided with a sensor at the tip. After the signal of the metal foil 11a is detected by the sensor, the thickness of the metal foil 11a and the carrier foil 11b is taken into consideration, and the metal leaf 11a is dug down by a drill about 30 μm from the upper end. As a result, the carrier foil 11b is penetrated. The dug hole is cut laterally with an end mill and cut along the contour line of the cavity forming region C1 (cutting the peripheral edge portion C11).
The peeling boundary between the metal foil 11a and the carrier foil 11b is exposed in the hole formed by this cutting process.

次に、図8に示すようにキャリア箔11bと金属箔11aとを互いに剥離してキャリア箔付き金属箔11の剥離面から上の上部構造体B11を除去して、図9に示すようにキャビティCを形成し、キャリア箔11bをキャビティCの底部に露出させる。
なお、上記切削加工の切削深さは、キャリア箔11bと金属箔11aのうち上部構造体B11に含まれる箔(11a)の層厚を超え、キャビティCの底部に露出させる箔(11b)に到達するまでの深さ範囲とすればよい。この場合であれば、上部構造体B11に含まれる箔(11a)を周辺から分離して、キャビティCの底部に露出させる箔(11b)から剥離することができるからである。
しかし、本実施形態のように比較的厚い絶縁樹脂層17内で切削を止める方が、厳しい切削深さ(位置)精度が求められることもなく、キャリア箔付き金属箔11の切削が不十分となるおそれもなく、容易かつ確実に製造可能である。
Next, as shown in FIG. 8, the carrier foil 11b and the metal foil 11a are separated from each other to remove the upper upper structure B11 from the peeled surface of the metal foil 11 with the carrier foil, and the cavity is as shown in FIG. C is formed and the carrier foil 11b is exposed to the bottom of the cavity C.
The cutting depth of the cutting process exceeds the layer thickness of the foil (11a) contained in the upper structure B11 of the carrier foil 11b and the metal foil 11a, and reaches the foil (11b) exposed at the bottom of the cavity C. It may be the depth range until it is done. In this case, the foil (11a) contained in the superstructure B11 can be separated from the periphery and peeled off from the foil (11b) exposed at the bottom of the cavity C.
However, if the cutting is stopped in the relatively thick insulating resin layer 17 as in the present embodiment, strict cutting depth (position) accuracy is not required, and the cutting of the metal leaf 11 with the carrier foil is insufficient. It can be manufactured easily and reliably without any risk of becoming.

(キャリア箔除去工程)
この工程では、キャビティCの底部に露出したキャリア箔11bをフラッシュ・エッチングにより除去して、図10に示すように第2の絶縁樹脂層17の面17aと第2の絶縁樹脂層17に埋め込まれた導体層12の面とを内側部C12に露出させる。
絶縁樹脂層17の面の粗度はキャリア箔11bの粗度が転写されるため、樹脂絶縁層17の面の粗度を調整する必要がある場合に、キャリア箔11b側の箔を切り替える。MT−EXのキャリア箔による絶縁樹脂層に転写したRaは280〜400nmで、薄銅箔による絶縁樹脂層に転写したRaは180〜300nmになる。MT−EX以外のキャリア箔付き銅箔を選択することで、更に異なる粗度を実現できる。
(Carrier foil removal process)
In this step, the carrier foil 11b exposed at the bottom of the cavity C is removed by flash etching and embedded in the surface 17a of the second insulating resin layer 17 and the second insulating resin layer 17 as shown in FIG. The surface of the conductor layer 12 is exposed to the inner portion C12.
Since the roughness of the surface of the insulating resin layer 17 is transferred to the roughness of the carrier foil 11b, the foil on the carrier foil 11b side is switched when it is necessary to adjust the roughness of the surface of the resin insulating layer 17. Ra transferred to the insulating resin layer made of the carrier foil of MT-EX is 280 to 400 nm, and Ra transferred to the insulating resin layer made of the thin copper foil is 180 to 300 nm. By selecting a copper foil with a carrier foil other than MT-EX, a further different roughness can be realized.

詳述すると、この工程では、キャビティ形成領域C1の底部をフラッシュ・エッチングすることにより、キャリア箔11bを除去する。これにより、基板10の下層の絶縁樹脂層17の面17aと、この面17aと同等な高さ(位置)に表面が露出して絶縁樹脂層17に埋め込まれた導体層12がキャビティCの底面の一部(内側部C12)を形成する。このようにキャビティCの底面の内側部C12に平坦に露出した導体層12が部品実装ランドとして機能し、この多層基板B2内の回路配線とキャビティCに収容される電子部品とを接続できるようになる。 More specifically, in this step, the carrier foil 11b is removed by flash etching the bottom of the cavity forming region C1. As a result, the surface 17a of the insulating resin layer 17 under the substrate 10 and the conductor layer 12 whose surface is exposed at the same height (position) as the surface 17a and embedded in the insulating resin layer 17 are the bottom surface of the cavity C. (Inner part C12) is formed. In this way, the conductor layer 12 flatly exposed on the inner portion C12 of the bottom surface of the cavity C functions as a component mounting land so that the circuit wiring in the multilayer board B2 and the electronic component accommodated in the cavity C can be connected. Become.

フラッシュ・エッチングによって、最外層の導体厚みを減らしたくない場合には、キャビティC以外をマスクするとよい。 If it is not desired to reduce the conductor thickness of the outermost layer by flash etching, it is preferable to mask the area other than the cavity C.

バリアめっきとしてニッケルめっきした場合は、さらにニッケルをエッチングする。ニッケルのエッチングは、ニッケル除去剤NH-1860シリーズ(メック株式会社製)などが適している。 When nickel plating is performed as barrier plating, nickel is further etched. For nickel etching, the nickel remover NH-1860 series (manufactured by MEC COMPANY Ltd.) is suitable.

ワイヤボンディング用途でバリアめっきのニッケルめっきの下に金めっきをしている場合、サブトラクティブ法の代表的なエッチング液である塩化第二鉄溶液、塩化第二銅溶液は金を溶かさないので原理的には可能だが、界面への浸透力が強いために、金めっきと絶縁材料の界面に浸透し、金めっきの更に下のニッケルめっき、銅めっきを溶かすサイドエッチングが起きるため、不適である。 When gold plating is performed under the nickel plating of barrier plating for wire bonding applications, the ferric chloride solution and cupric chloride solution, which are typical etching solutions of the subtractive method, do not dissolve gold, so in principle. However, it is not suitable because it penetrates into the interface between gold plating and the insulating material due to its strong penetrating power to the interface, and side etching occurs that melts the nickel plating and copper plating below the gold plating.

(ソルダーレジスト工程)
この工程では、図11に示すように導体層のコンタクトエリアを残してソルダーレジスト21を形成する。ソルダーレジストは、ドライフィルムタイプ、液状タイプが使用可能である。
(Solder resist process)
In this step, as shown in FIG. 11, the solder resist 21 is formed while leaving the contact area of the conductor layer. As the solder resist, a dry film type and a liquid type can be used.

(電子部品装着場所形成工程)
この工程以降は、部品実装ランドに段差が必要な場合に行うものとする。
この工程では、キャビティCの底部に露出した導体層12の上にめっきを施して金属めっき層22を形成し、底面から段差を持たせた部品実装ランドである接続パッドを形成する。
(Electronic component mounting location formation process)
After this step, it shall be performed when a step is required in the component mounting land.
In this step, the conductor layer 12 exposed at the bottom of the cavity C is plated to form the metal plating layer 22, and a connection pad which is a component mounting land having a step from the bottom surface is formed.

必要に応じて電子部品を実装する工程を次のように追加してもよい。すなわち、キャビティCに電子部品を収容し、電子部品の底部に設けた電極と導体層12上の金属めっき層22とを当接させて互いの回路を接続する。なお、ここでは電子部品を実装せず、他で実装する場合は電子部品実装工程以下の工程は不要である。 If necessary, the process of mounting the electronic component may be added as follows. That is, the electronic component is housed in the cavity C, and the electrode provided at the bottom of the electronic component and the metal plating layer 22 on the conductor layer 12 are brought into contact with each other to connect the circuits to each other. It should be noted that, when the electronic component is not mounted here and is mounted elsewhere, the steps below the electronic component mounting step are unnecessary.

〔印刷配線板〕
以上の製造方法によって製造された本実施形態の印刷配線板B2又はBは、図10又は図11に示すように、絶縁樹脂の基板10の下層に絶縁樹脂により絶縁樹脂層17を積層した多層基板の一部領域(C1)に、基板10側に開口し基板10を貫通し絶縁樹脂層17の面を底面とするキャビティCと、絶縁樹脂層17の面の周縁部C11を除く内側部C12と同等の高さの面を有しその面が前記底面の一部を形成するように絶縁樹脂層17に埋め込まれた導体層12とを備える。
周縁部C11が内側部C12より深く形成されており、導体層12は内側部のみに形成されている。
かかるキャビティCの底面の周縁部C11に溝が形成された構造を有することで、上述したようにキャリア箔付き金属箔11を利用したキャビティCの形成を容易かつ確実にする。
[Printed circuit board]
As shown in FIG. 10 or 11, the printed wiring board B2 or B of the present embodiment manufactured by the above manufacturing method is a multilayer substrate in which an insulating resin layer 17 is laminated with an insulating resin on a lower layer of the insulating resin substrate 10. Cavity C which opens to the substrate 10 side and penetrates the substrate 10 and has the surface of the insulating resin layer 17 as the bottom surface, and the inner portion C12 excluding the peripheral edge C11 of the surface of the insulating resin layer 17 in a part of the region (C1). A conductor layer 12 having a surface having the same height and being embedded in the insulating resin layer 17 so that the surface forms a part of the bottom surface is provided.
The peripheral edge portion C11 is formed deeper than the inner portion C12, and the conductor layer 12 is formed only on the inner portion.
By having a structure in which a groove is formed in the peripheral edge portion C11 of the bottom surface of the cavity C, the formation of the cavity C using the metal foil 11 with the carrier foil is easily and surely made as described above.

印刷配線板B2又はBにおいてキャビティCの底面の導体層12は、キャビティCの周囲の絶縁樹脂層17より、キャリア箔付き金属箔の厚さ11t(図10参照)に相当する分低くなっている。かかるキャビティCの底面の構造により、上述したようにキャリア箔付き金属箔11を利用したキャビティCの形成が可能である。
さらに上述したように導体層12が、電子部品との接続パッドを含む。さらに導体層12が当該接続パッドに対して面方向に接続される回路配線を含んでいてもよい。但し、かかる接続パッド及び回路配線は、内側部C12内に収まっている。かかるキャビティの底面の構造により、上述したようにキャリア箔付き金属箔11及び座繰り加工を利用したキャビティCの形成が容易となる。
In the printed wiring board B2 or B, the conductor layer 12 on the bottom surface of the cavity C is lower than the insulating resin layer 17 around the cavity C by a thickness corresponding to the thickness of the metal leaf with the carrier foil of 11t (see FIG. 10). .. Due to the structure of the bottom surface of the cavity C, it is possible to form the cavity C using the metal foil 11 with the carrier foil as described above.
Further, as described above, the conductor layer 12 includes a connection pad for electronic components. Further, the conductor layer 12 may include a circuit wiring in which the conductor layer 12 is connected in the plane direction to the connection pad. However, the connection pad and the circuit wiring are housed in the inner portion C12. The structure of the bottom surface of the cavity facilitates the formation of the metal leaf 11 with the carrier foil and the cavity C by counterbore processing as described above.

以上のように形成予定のキャビティ輪郭に沿って周縁部C11を切削加工し、キャリア箔付き金属箔11を剥離して上部構造体B11の除去後、キャビティCの底部に露出したキャリア箔11bをフラッシュ・エッチングにより除去して残った基板10の下に位置する絶縁樹脂層17の面17aに上面がほぼ面一に並ぶように埋め込まれた導体層12が構成されることで、キャビティC内に収容した電子部品と基板側との回路接続を電子部品の底部で行うことができるようになる。 As described above, the peripheral edge C11 is cut along the contour of the cavity to be formed, the metal foil 11 with the carrier foil is peeled off to remove the superstructure B11, and then the carrier foil 11b exposed at the bottom of the cavity C is flushed. A conductor layer 12 embedded in the surface 17a of the insulating resin layer 17 located under the substrate 10 that remains after being removed by etching so that the upper surface is substantially flush with each other is formed so as to be housed in the cavity C. The circuit connection between the electronic component and the substrate side can be made at the bottom of the electronic component.

このようにキャビティCの底面とほぼ面一の導体層12を接続パッド(部品実装ランド)として形成して電子部品の底部の電極と接続することで、キャビティCの底部の配線パターンとしての部品実装ランドのピール強度を向上することができる。 By forming the conductor layer 12 substantially flush with the bottom surface of the cavity C as a connection pad (component mounting land) and connecting it to the electrode at the bottom of the electronic component in this way, the component mounting as a wiring pattern at the bottom of the cavity C The peel strength of the land can be improved.

キャビティCの形成予定空間を占めていた上部構造体B11の剥離材としてキャリア箔付き金属箔11を用いることから、キャビティCの底部に微細配線が可能である。
キャビティCの底部の配線は、途中工程までキャリア箔付き金属箔11に覆われており直接層間絶縁樹脂に触れないため、座繰り加工後でもキャビティCの底部の配線上に樹脂残渣が全く残らない。キャビティCの底部の配線に金めっき処理し、耐腐食試験を行っても、樹脂残渣が皆無であることから、耐腐食性に優れる。
回路基板形成プロセスに用いられるキャリア箔付き金属箔11は耐熱性に優れており、熱処理が含まれたプロセスを経た後も、金属箔11aとキャリア箔11bの剥離性を失わず、キャビティCを形成することができる。
Since the metal foil 11 with a carrier foil is used as the release material for the upper structure B11 that occupies the space where the cavity C is planned to be formed, fine wiring can be performed at the bottom of the cavity C.
Since the wiring at the bottom of the cavity C is covered with the metal leaf 11 with a carrier foil until the middle process and does not come into direct contact with the interlayer insulating resin, no resin residue remains on the wiring at the bottom of the cavity C even after counterbore processing. .. Even if the wiring at the bottom of the cavity C is gold-plated and a corrosion resistance test is performed, there is no resin residue, so that the corrosion resistance is excellent.
The metal foil 11 with a carrier foil used in the circuit board forming process has excellent heat resistance, and even after undergoing a process including heat treatment, the metal foil 11a and the carrier foil 11b do not lose their peelability and form a cavity C. can do.

上記実施形態における印刷配線板の製造手順の例は一例であり、各処理工程を入れ替え、また新たな処理工程を追加し、一部の処理工程を削除することで、処理工程をさまざまに変えることも可能である。 The example of the manufacturing procedure of the printed wiring board in the above embodiment is an example, and the processing processes can be changed in various ways by exchanging each processing process, adding a new processing process, and deleting some processing processes. Is also possible.

以上本開示の実施形態を説明したが、この実施形態は、例として示したものであり、この他の様々な形態で実施が可能であり、発明の要旨を逸脱しない範囲で、構成要素の省略、置き換え、変更を行うことができる。 Although the embodiments of the present disclosure have been described above, the embodiments are shown as examples, and can be implemented in various other embodiments, and components are omitted as long as the gist of the invention is not deviated. , Can be replaced or changed.

10 基板
11 キャリア箔付き金属箔
11a 金属箔
11b キャリア箔
12,13,14 導体層
16,17 絶縁樹脂層
18,19 ビア
B1 多層基板(中間体)
B11 上部構造体
B2,B 印刷配線板
C キャビティ
C1 キャビティ形成領域
C11 周縁部
C12 内側部
10 Substrate 11 Metal foil with carrier foil 11a Metal foil 11b Carrier foil 12,13,14 Conductor layer 16,17 Insulation resin layer 18,19 Via B1 Multilayer substrate (intermediate)
B11 Superstructure B2, B Printed wiring board C Cavity C1 Cavity formation area C11 Peripheral part C12 Inner part

Claims (7)

絶縁樹脂の基板の下層に絶縁樹脂により絶縁樹脂層を積層した多層基板の一部領域に、前記基板側に開口し前記基板を貫通し前記絶縁樹脂層の面を底面とするキャビティと、
前記絶縁樹脂層の面の周縁部を除く内側部と同等の高さの面を有しその面が前記底面の一部を形成するように前記絶縁樹脂層に埋め込まれた導体層と
を備え、
前記周縁部が前記内側部より深く形成されており、前記導体層は前記内側部のみに形成されており、
前記キャビティの底面の前記導体層は、前記キャビティの周囲の前記絶縁樹脂層より、キャリア箔付き金属箔の厚さ分低くなっている印刷配線板。
A cavity that opens to the substrate side, penetrates the substrate, and has the surface of the insulating resin layer as the bottom surface in a part of a multilayer substrate in which an insulating resin layer is laminated with an insulating resin on the lower layer of the insulating resin substrate.
It is provided with a conductor layer having a surface having the same height as the inner portion excluding the peripheral portion of the surface of the insulating resin layer and being embedded in the insulating resin layer so that the surface forms a part of the bottom surface.
The peripheral portion is formed deeper than the inner portion, and the conductor layer is formed only on the inner portion .
A printed wiring board in which the conductor layer on the bottom surface of the cavity is lower than the insulating resin layer around the cavity by the thickness of the metal foil with a carrier foil .
絶縁樹脂の基板の下層に絶縁樹脂により絶縁樹脂層を積層した多層基板の一部領域に、前記基板側に開口し前記基板を貫通し前記絶縁樹脂層の面を底面とするキャビティと、
前記絶縁樹脂層の面の周縁部を除く内側部と同等の高さの面を有しその面が前記底面の一部を形成するように前記絶縁樹脂層に埋め込まれた導体層と、
を備え、
前記周縁部が前記内側部より深く形成されており、前記導体層は前記内側部のみに形成されており、
前記キャビティの底面の前記導体層は、前記キャビティの周囲の前記絶縁樹脂層より低くなっている印刷配線板。
A cavity that opens to the substrate side, penetrates the substrate, and has the surface of the insulating resin layer as the bottom surface in a part of a multilayer substrate in which an insulating resin layer is laminated with an insulating resin on the lower layer of the insulating resin substrate.
A conductor layer having a surface having the same height as the inner portion excluding the peripheral portion of the surface of the insulating resin layer and being embedded in the insulating resin layer so that the surface forms a part of the bottom surface.
With
The peripheral portion is formed deeper than the inner portion, and the conductor layer is formed only on the inner portion.
Wherein the conductive layer of the bottom surface of the cavity, the insulating resin layer by Ri printed wiring board that has a low Kuna' around the cavity.
前記導体層が、電子部品との接続パッドを含む請求項1又は請求項2に記載の印刷配線板。 The printed wiring board according to claim 1 or 2, wherein the conductor layer includes a connection pad with an electronic component. 前記導体層が、前記接続パッドに面方向に接続される回路配線を含む請求項3記載の印刷配線板。 The printed wiring board according to claim 3, wherein the conductor layer includes a circuit wiring in which the conductor layer is connected to the connection pad in the plane direction. 第1の面および第2の面を有する絶縁樹脂の基板の前記第2の面に設けたキャリア箔付き金属箔の一部領域の上に、ニッケル、銅の順に連続してパターンめっきを施して導体層を形成する工程と、
前記基板の前記第1の面に第1の絶縁樹脂層を形成し、前記基板の前記第2の面に第2の絶縁樹脂層を形成する工程と、
前記第1の絶縁樹脂層の側から前記キャリア箔付き金属箔に向けて積層方向に切削加工して前記キャリア箔付き金属箔の途中まで又は前記キャリア箔付き金属箔を貫通するまで、キャビティ形成領域の輪郭線に沿って切削し、前記キャリア箔付き金属箔のキャリア箔と金属箔とを互いに剥離して前記キャリア箔付き金属箔の剥離面から上の上部構造体を除去してキャビティを形成し、前記キャリア箔付き金属箔を構成する箔を前記キャビティの底部に露出させる工程と、
前記キャビティの底部に露出した前記箔をフラッシュ・エッチングにより除去して、前記第2の絶縁樹脂層の面と前記第2の絶縁樹脂層に埋め込まれた前記導体層の面とを露出させる工程と
を備える印刷配線板の製造方法。
On a part of the metal foil with the carrier foil provided on the second surface of the insulating resin substrate having the first surface and the second surface , nickel and copper are continuously patterned in this order. The process of forming the conductor layer and
A step of forming a first insulating resin layer on the first surface of the substrate and forming a second insulating resin layer on the second surface of the substrate.
Cavity forming region from the side of the first insulating resin layer toward the metal leaf with carrier foil in the laminating direction until halfway through the metal leaf with carrier foil or until it penetrates the metal leaf with carrier foil. The carrier foil and the metal foil of the metal foil with the carrier foil are separated from each other by cutting along the contour line of the above, and the upper superstructure is removed from the peeled surface of the metal foil with the carrier foil to form a cavity. The step of exposing the foil constituting the metal foil with the carrier foil to the bottom of the cavity, and
A step of removing the foil exposed at the bottom of the cavity by flash etching to expose the surface of the second insulating resin layer and the surface of the conductor layer embedded in the second insulating resin layer. A method for manufacturing a printed wiring board.
第1の面および第2の面を有する絶縁樹脂の基板の前記第2の面に設けたキャリア箔付
き金属箔の一部領域の上に、ニッケル、金、ニッケル、銅の順に連続してパターンめっきを施して導体層を形成する工程と、
前記基板の前記第1の面に第1の絶縁樹脂層を形成し、前記基板の前記第2の面に第2の絶縁樹脂層を形成する工程と、
前記第1の絶縁樹脂層の側から前記キャリア箔付き金属箔に向けて積層方向に切削加工して前記キャリア箔付き金属箔の途中まで又は前記キャリア箔付き金属箔を貫通するまで、キャビティ形成領域の輪郭線に沿って切削し、前記キャリア箔付き金属箔のキャリア箔と金属箔とを互いに剥離して前記キャリア箔付き金属箔の剥離面から上の上部構造体を除去してキャビティを形成し、前記キャリア箔付き金属箔を構成する箔を前記キャビティの底部に露出させる工程と、
前記キャビティの底部に露出した前記箔をフラッシュ・エッチングにより除去して、前記第2の絶縁樹脂層の面と前記第2の絶縁樹脂層に埋め込まれた前記導体層の面とを露出させる工程と
を備える印刷配線板の製造方法。
With a carrier foil provided on the second surface of an insulating resin substrate having a first surface and a second surface.
A process of forming a conductor layer by continuously pattern-plating nickel, gold, nickel, and copper on a part of the metal leaf .
A step of forming a first insulating resin layer on the first surface of the substrate and forming a second insulating resin layer on the second surface of the substrate.
Cavity forming region from the side of the first insulating resin layer toward the metal leaf with carrier foil in the laminating direction until halfway through the metal leaf with carrier foil or until it penetrates the metal leaf with carrier foil. The carrier foil and the metal foil of the metal foil with the carrier foil are separated from each other by cutting along the contour line of the above, and the upper superstructure is removed from the peeled surface of the metal foil with the carrier foil to form a cavity. The step of exposing the foil constituting the metal foil with the carrier foil to the bottom of the cavity, and
A step of removing the foil exposed at the bottom of the cavity by flash etching to expose the surface of the second insulating resin layer and the surface of the conductor layer embedded in the second insulating resin layer.
A method of manufacturing a printed wiring board.
前記第2の絶縁樹脂層の前記導体層に対応する部位にビアホール下穴を形成する工程と、
前記ビアホール下穴を含む前記領域にパターンめっきを施す工程と
を備える請求項5又は請求項6に記載の印刷配線板の製造方法。
A step of forming a via hole pilot hole in a portion of the second insulating resin layer corresponding to the conductor layer,
The method for manufacturing a printed wiring board according to claim 5 or 6 , further comprising a step of performing pattern plating on the region including the via hole pilot hole.
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