JP6482318B2 - 光学式変位計 - Google Patents
光学式変位計 Download PDFInfo
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- JP6482318B2 JP6482318B2 JP2015036754A JP2015036754A JP6482318B2 JP 6482318 B2 JP6482318 B2 JP 6482318B2 JP 2015036754 A JP2015036754 A JP 2015036754A JP 2015036754 A JP2015036754 A JP 2015036754A JP 6482318 B2 JP6482318 B2 JP 6482318B2
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- 238000006073 displacement reaction Methods 0.000 title claims description 26
- 230000003287 optical effect Effects 0.000 title claims description 19
- 238000005259 measurement Methods 0.000 claims description 79
- 238000003384 imaging method Methods 0.000 claims description 34
- 238000004904 shortening Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 15
- 239000003990 capacitor Substances 0.000 description 12
- 230000006870 function Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 10
- 230000008859 change Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 230000003321 amplification Effects 0.000 description 6
- 238000003199 nucleic acid amplification method Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 238000012544 monitoring process Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 3
- 238000007792 addition Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4209—Photoelectric exposure meters for determining the exposure time in recording or reproducing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
- H04N25/706—Pixels for exposure or ambient light measuring
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Automatic Focus Adjustment (AREA)
- Studio Devices (AREA)
Description
3:光学式変位計
5:受光素子(画素)
6:露光中の画素受光量監視部
7:受光量上限値指定部
8:比較部
10:論理回路
11:露光終了制御回路
12:露光終了時の画素読み出し部
21:測定距離演算部
24:露光時間計測部
25:データ出力・保存部
35、40:距離真値取得部
36:移動平均計算処理部
50:固体撮像素子本体
Claims (2)
- 被写体からの光を受光する複数の受光素子からなる画素群と、各画素の受光量上限値をそれぞれ指定する受光量上限値指定手段と、露光中の各画素の受光量を前記指定された上限値とそれぞれ比較する複数の比較器と、各比較手段の出力を論理和する論理回路とを有して、前記論理和した演算結果に従って、前記画素すべての露光を終了させる固体撮像素子を配設し、
前記固体撮像素子における露光開始から露光終了までの露光時間を計測する露光時間計測部と、
前記固体撮像素子における受光位置の変位に基づいて、被写体までの測定距離を演算する測定距離演算部と、
被写体までの実際の距離である距離真値の取得に関するデータとして、前記計測された露光時間とこの露光時間に演算された測定距離とを対応させた状態で、出力および/または保存するデータ出力・保存部とを備え、さらに、
被写体までの実際の距離である距離真値を取得する距離真値取得部を備えて、
前記距離真値取得部は、前記計測された露光時間が前回の値と比較して指定値以上に大きいとき、当該計測された露光時間に対応する演算された測定距離を無効とし、前回の露光時間に対応する演算された測定距離を有効として距離真値を取得する、光学式変位計。 - 被写体からの光を受光する複数の受光素子からなる画素群と、各画素の受光量上限値をそれぞれ指定する受光量上限値指定手段と、露光中の各画素の受光量を前記指定された上限値とそれぞれ比較する複数の比較器と、各比較手段の出力を論理和する論理回路とを有して、前記論理和した演算結果に従って、前記画素すべての露光を終了させる固体撮像素子を配設し、
前記固体撮像素子における露光開始から露光終了までの露光時間を計測する露光時間計測部と、
前記固体撮像素子における受光位置の変位に基づいて、被写体までの測定距離を演算する測定距離演算部と、
被写体までの実際の距離である距離真値の取得に関するデータとして、前記計測された露光時間とこの露光時間に演算された測定距離とを対応させた状態で、出力および/または保存するデータ出力・保存部とを備え、さらに、
被写体までの実際の距離である距離真値を取得する距離真値取得部を備えて、
前記距離真値取得部は、前記計測された露光時間が前回の値と比較して指定値以上に大きいとき、複数の測定距離の移動平均回数を短縮させて距離真値を取得する、光学式変位計。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015036754A JP6482318B2 (ja) | 2015-02-26 | 2015-02-26 | 光学式変位計 |
US15/044,698 US9846061B2 (en) | 2015-02-26 | 2016-02-16 | Optical displacement sensor having a light receiving level upper limit value specifying unit |
EP16157326.6A EP3062063B1 (en) | 2015-02-26 | 2016-02-25 | Optical displacement sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015036754A JP6482318B2 (ja) | 2015-02-26 | 2015-02-26 | 光学式変位計 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016156789A JP2016156789A (ja) | 2016-09-01 |
JP2016156789A5 JP2016156789A5 (ja) | 2018-01-18 |
JP6482318B2 true JP6482318B2 (ja) | 2019-03-13 |
Family
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JP2015036754A Active JP6482318B2 (ja) | 2015-02-26 | 2015-02-26 | 光学式変位計 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9846061B2 (ja) |
EP (1) | EP3062063B1 (ja) |
JP (1) | JP6482318B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6293220B2 (ja) * | 2016-08-09 | 2018-03-14 | 京楽産業.株式会社 | 遊技機 |
CN110088568B (zh) * | 2017-09-15 | 2020-07-17 | 三菱电机株式会社 | 信号处理装置、传感器装置及信号处理方法 |
DE102018214140A1 (de) * | 2018-08-22 | 2020-02-27 | Robert Bosch Gmbh | LIDAR-Sensor zur optischen Erfassung eines Sichtfeldes, Arbeitsvorrichtung oder Fahrzeug mit einem LIDAR-Sensor und Verfahren zur optischen Erfassung eines Sichtfeldes |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0193966A (ja) | 1987-10-06 | 1989-04-12 | Nikon Corp | イメージセンサ |
JPH093966A (ja) | 1995-06-15 | 1997-01-07 | Kobe Steel Ltd | 掘削機のカッター |
US7605852B2 (en) | 2004-05-17 | 2009-10-20 | Micron Technology, Inc. | Real-time exposure control for automatic light control |
JP2005326340A (ja) * | 2004-05-17 | 2005-11-24 | Keyence Corp | イメージセンサー利用機器、光学式変位計及び光学情報読取装置 |
JP5012188B2 (ja) * | 2007-05-14 | 2012-08-29 | コニカミノルタホールディングス株式会社 | 固体撮像装置 |
JP2010223950A (ja) | 2009-02-24 | 2010-10-07 | Keyence Corp | 光学式変位計 |
TW201331547A (zh) * | 2011-11-01 | 2013-08-01 | 尼康股份有限公司 | 形狀測定裝置、構造物製造系統、形狀測定方法、構造物製造方法、程式及記錄媒體 |
JP5922458B2 (ja) * | 2012-03-26 | 2016-05-24 | アンリツインフィビス株式会社 | 変位測定装置 |
-
2015
- 2015-02-26 JP JP2015036754A patent/JP6482318B2/ja active Active
-
2016
- 2016-02-16 US US15/044,698 patent/US9846061B2/en active Active
- 2016-02-25 EP EP16157326.6A patent/EP3062063B1/en active Active
Also Published As
Publication number | Publication date |
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JP2016156789A (ja) | 2016-09-01 |
US20160252370A1 (en) | 2016-09-01 |
EP3062063A1 (en) | 2016-08-31 |
EP3062063B1 (en) | 2017-09-13 |
US9846061B2 (en) | 2017-12-19 |
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