JP6313788B2 - X線コンピュータ断層撮影計測システムの性能評価用冶具 - Google Patents
X線コンピュータ断層撮影計測システムの性能評価用冶具 Download PDFInfo
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/58—Testing, adjusting or calibrating thereof
- A61B6/582—Calibration
- A61B6/583—Calibration using calibration phantoms
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B3/00—Measuring instruments characterised by the use of mechanical techniques
- G01B3/30—Bars, blocks, or strips in which the distance between a pair of faces is fixed, although it may be preadjustable, e.g. end measure, feeler strip
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
- G01N2223/3035—Accessories, mechanical or electrical features calibrating, standardising phantom
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Description
−ひとつ又は複数の支持板(2a,2b)と、
−少なくとも2つの球体(5a,5b)と、を備え、
各球体は、前記支持板(2a,2b)のうち一方の支持板の面(6a,6b,7a,7b)上に取り付けられている較正冶具(100)に関する。
本明細書において使用される場合、「備えている(comprising)」、「備える(comprises)」及び「から構成されている(comprised of)」という用語は、「からなっている(consisting of)」、「からなる(consists)」及び「からなる(consists of)」という用語を含むことが理解される。
−積み重ねられた2つの支持板(2)と、
−上端部の支持板に堅固に取り付けられている支持板を分離するスペーサ(3)と、
−基端部の支持板に堅固に取り付けられているスタンド(22)と、
−上端部における端部材(4)と、
−両支持板の上面(6a,6b)及び端部材(4)の上終端部(6c)に設けられている複数のルビー球(5a,5b,5c)と、を備え、
前記端部材(4)は、スペーサに取り外し可能に取り付けられるように構成され、前記スペーサは、一方の端部において前記端部材(4)に、また他方の端部において前記スタンドに取り外し可能に取り付けられる、冶具に関する。
−異なる大きさの2つの支持板(2)と、
−前記支持板(2)を分離するように構成されているスペーサ(3)と、
−前記基端部に設けられるように構成されているスタンド(22)と、
−前記上端部に設けられるように構成されている端部材(4)と、
−両支持板の上面(6a,6b)及び端部材(4)の上終端部(6c)上に設けられている複数の複数のルビー球(5a,5b,5c)と、を備え、
前記端部材(4)は、スペーサ(3)又はスタンド(22)に取り外し可能に取り付けられるように構成され、前記スペーサ(3)は、一方の端部が前記端部材(4)に取り外し可能に取り付けられるように構成され、また、別の端部が前記スタンド(22)に取り外し可能に取り付けられるように構成されている、キットに関する。
Claims (14)
- X線コンピュータ断層撮影計測機器の性能評価用冶具(100)の異なる構成を有する組み立てキットであって、
前記キットは、相互接続可能で且つ互いに隣り合うように配置可能な複数の支持板(2a,2b)を備え、各支持板(2a,2b)は、異なる面積を有し、少なくともひとつの球体(5a,5b)が設けられており、
前記球体(5a,5b)のそれぞれは、前記支持板(2a,2b)の面(6a,6b,7a,7b)上に設けられており、
隣り合う一対の支持板(2a,2b)を位置決めするように構成され、且つ、前記隣り合う一対の支持板(2a,2b)の一方又は双方に取り外し可能に取り付けられるように構成されている、細長部材であるスペーサ(3)をさらに備え、
前記スペーサ(3)の一方の端部又は両端部には、当該スペーサ(3)を支持板上の対応する板連結部(14b)に取り外し可能に取り付けるための、取り外し可能なスペーサ連結部(18)が設けられている、キット。 - 前記スペーサ(3)は、前記隣り合う一対の支持板(2a,2b)を形成するために、一方の端部が一方の支持板(2a)に取り外しできないように取り付けられ、また、他方の端部が別の支持板(2b)に取り外し可能に取り付けることができる、請求項1に記載のキット。
- 支持板(2a,2b)のいずれか一方に取り外し可能に取り付けられるように構成されている端部材(4)をさらに備え、
前記端部材(4)には、ひとつ又は複数の球体(5c)がさらに設けられており、
前記球体(5c)のそれぞれは、前記端部材(4)の面(6c)上に取り付けられている、請求項1又は請求項2に記載のキット。 - 前記端部材(4)によって、支持板(2a,2b)の隣り合うように配置可能な状態を終わらせることができる、請求項3に記載のキット。
- 前記端部材(4)は、少なくとも一部が黒鉛から作られている、請求項3又は請求項4に記載のキット。
- 前記端部材(4)は縦部材である、請求項3〜請求項5のいずれか1項に記載のキット。
- 前記端部材(4)及び前記スペーサ(3)が組み立てられた較正冶具(100)において直線軸に沿って配列するように構成されている、請求項3〜請求項6のいずれか1項に記載のキット。
- 前記端部材(4)の数はひとつである、請求項3〜請求項7のいずれか1項に記載のキット。
- 前記支持板(2a,2b)は円形である、請求項1〜請求項8のいずれか1項に記載のキット。
- 前記支持板(2a,2b)は、少なくとも一部が炭素繊維複合材料から作られている、請求項1〜請求項9のいずれか1項に記載のキット。
- 前記端部材(4)は、組み立てられた冶具において垂直に位置するように構成されている、請求項3〜請求項10のいずれか1項に記載のキット。
- 組み立てられた冶具において、前記球体の中心間のペアごとの距離が同じではないように構成されている、請求項1〜請求項11のいずれか1項に記載のキット。
- X線CT機器の較正及び/又は検証用キットであって、請求項1〜請求項12のいずれか1項に記載のキットの使用。
- 請求項1〜請求項12のいずれか1項に記載のキットから組み立てられる冶具(100)。
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EP13154760 | 2013-02-11 | ||
EP13154760.6 | 2013-02-11 | ||
US201361763515P | 2013-02-12 | 2013-02-12 | |
US61/763,515 | 2013-02-12 | ||
PCT/EP2014/052344 WO2014122218A1 (en) | 2013-02-11 | 2014-02-06 | Artefact for evaluating the performance of an x-ray computed tomography system |
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JP6313788B2 true JP6313788B2 (ja) | 2018-04-18 |
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US11278367B1 (en) * | 2019-10-31 | 2022-03-22 | The United States Of America As Represented By The Secretary Of The Navy | Portable and collapsible apparatus for holding fiducial markers |
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