JP6262983B2 - 基板洗浄装置及び基板洗浄方法 - Google Patents
基板洗浄装置及び基板洗浄方法 Download PDFInfo
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- JP6262983B2 JP6262983B2 JP2013214958A JP2013214958A JP6262983B2 JP 6262983 B2 JP6262983 B2 JP 6262983B2 JP 2013214958 A JP2013214958 A JP 2013214958A JP 2013214958 A JP2013214958 A JP 2013214958A JP 6262983 B2 JP6262983 B2 JP 6262983B2
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- 239000000758 substrate Substances 0.000 title claims description 190
- 238000004140 cleaning Methods 0.000 title claims description 144
- 238000000034 method Methods 0.000 title claims description 11
- 238000005259 measurement Methods 0.000 claims description 7
- 238000012544 monitoring process Methods 0.000 claims description 6
- 239000007788 liquid Substances 0.000 description 11
- 230000003028 elevating effect Effects 0.000 description 10
- 238000001035 drying Methods 0.000 description 9
- 238000012545 processing Methods 0.000 description 9
- 238000012546 transfer Methods 0.000 description 9
- 238000005498 polishing Methods 0.000 description 8
- 238000003825 pressing Methods 0.000 description 6
- 230000001276 controlling effect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 230000032258 transport Effects 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000001174 ascending effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000005201 scrubbing Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/16—Rigid blades, e.g. scrapers; Flexible blades, e.g. wipers
- B08B1/165—Scrapers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/26—Acting in response to an ongoing measurement without interruption of processing, e.g. endpoint detection, in-situ thickness measurement
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning In General (AREA)
Description
図1は、本発明の実施形態に係る基板洗浄装置を備えた基板処理装置の全体構成を示す平面図である。図1に示すように、基板処理装置は、略矩形状のハウジング10と、多数の半導体ウェハ等の基板をストックする基板カセットが載置されるロードポート12を備えている。ロードポート12は、ハウジング10に隣接して配置されている。ロードポート12には、オープンカセット、SMIF(Standard Manufacturing Interface)ポッド、またはFOUP(Front Opening Unified Pod)を搭載することができる。SMIF、FOUPは、内部に基板カセットを収納し、隔壁で覆うことにより、外部空間とは独立した環境を保つことができる密閉容器である。
16,18 基板洗浄装置
20 基板乾燥装置
24 基板搬送ユニット
30 制御盤(操作パネル)
40 スピンドル
42,44 ロールホルダ
46,48 ロール洗浄部材
54,54a ロードセル
56,56a エアシリンダ(アクチュエータ)
60,60a 昇降機構
62,62a 電空レギュレータ(制御機器)
64,64a 表示計
66 調節計(制御部)
70,70a チルト機構
80 モニタ部
82 警報器
Claims (5)
- 長尺状に水平に延びるロール洗浄部材を支持して回転させるロールホルダと、
制御機器を備えたアクチュエータの駆動に伴って、基板洗浄時に前記ロール洗浄部材が基板にロール荷重を加えるように前記ロールホルダを昇降させる昇降機構と、
前記ロール荷重を測定するロードセルと、
前記ロードセルの測定値を基に前記制御機器を介して前記ロール荷重をフィードバック制御する制御部と、
予め求めた設定ロール荷重と制御機器の操作量基準値との関係に基づいて、設定ロール荷重に応じた操作量基準値の許容範囲を予め設定しておき、前記制御機器の操作量が予め設定した設定ロール荷重に応じた操作量基準値の許容範囲から外れていないかを監視するモニタ部とを有することを特徴とする基板洗浄装置。 - 前記制御機器の操作量が前記設定ロール荷重に応じて予め設定した操作量基準値の許容範囲から外れた時にアラームを発する警報器を有することを特徴とする請求項1に記載の基板洗浄装置。
- 前記アクチュエータは、エアシリンダであり、前記制御機器は、エアシリンダに供給されるエアの圧力を調整する調整弁の開度を制御する電空レギュレータであることを特徴とする請求項1または2に記載の基板洗浄装置。
- 制御機器を備えたアクチュエータの駆動に伴って昇降する長尺状に水平に延びるロール洗浄部材が基板に加えるロール荷重をロードセルで測定し、該ロードセルの測定値を基に前記制御機器を介して前記ロール荷重をフィードバック制御しながら、前記制御機器の操作量をモニタ部で監視する基板洗浄方法であって、
予め求めた設定ロール荷重と制御機器の操作量基準値との関係に基づいて、設定ロール荷重に応じた操作量基準値の許容範囲を前記モニタ部に予め設定しておき、
前記制御機器の操作量が予め設定した設定ロール荷重に応じた操作量基準値の許容範囲から外れていないかを前記モニタ部で監視することを特徴とする基板洗浄方法。 - 前記制御機器の操作量が前記設定ロール荷重に応じて予め設定した操作量基準値の許容範囲から外れた時にアラームを発することを特徴とする請求項4に記載の基板洗浄方法。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013214958A JP6262983B2 (ja) | 2012-10-25 | 2013-10-15 | 基板洗浄装置及び基板洗浄方法 |
US14/061,686 US9704728B2 (en) | 2012-10-25 | 2013-10-23 | Substrate cleaning apparatus and substrate cleaning method |
KR1020130126505A KR102114430B1 (ko) | 2012-10-25 | 2013-10-23 | 기판 세정 장치 및 기판 세정 방법 |
CN201310506970.4A CN103769376B (zh) | 2012-10-25 | 2013-10-24 | 衬底清洗装置及衬底清洗方法 |
TW102138407A TWI600474B (zh) | 2012-10-25 | 2013-10-24 | Substrate cleaning device and substrate cleaning method |
US15/616,582 US9842732B2 (en) | 2012-10-25 | 2017-06-07 | Substrate cleaning apparatus and substrate cleaning method |
KR1020200058990A KR102123880B1 (ko) | 2012-10-25 | 2020-05-18 | 기판 세정 장치 및 기판 세정 방법 |
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JP2012235403 | 2012-10-25 | ||
JP2012235403 | 2012-10-25 | ||
JP2013214958A JP6262983B2 (ja) | 2012-10-25 | 2013-10-15 | 基板洗浄装置及び基板洗浄方法 |
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JP2014103387A JP2014103387A (ja) | 2014-06-05 |
JP6262983B2 true JP6262983B2 (ja) | 2018-01-17 |
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US (2) | US9704728B2 (ja) |
JP (1) | JP6262983B2 (ja) |
KR (2) | KR102114430B1 (ja) |
CN (1) | CN103769376B (ja) |
TW (1) | TWI600474B (ja) |
Families Citing this family (6)
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JP6328577B2 (ja) | 2015-02-24 | 2018-05-23 | 株式会社荏原製作所 | 荷重測定装置および荷重測定方法 |
KR102596608B1 (ko) * | 2016-07-26 | 2023-11-01 | 주식회사 케이씨텍 | 기판 스피닝 장치 및 그 제어방법 |
CN108565228A (zh) * | 2018-01-02 | 2018-09-21 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 一种晶圆压力控制装置、方法及系统 |
JP7079164B2 (ja) | 2018-07-06 | 2022-06-01 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法 |
CN112599432B (zh) * | 2020-12-16 | 2022-04-01 | 无锡英诺赛思科技有限公司 | 一种芯片共晶焊接设备及共晶焊接方法 |
CN115815198A (zh) * | 2022-11-30 | 2023-03-21 | 西安奕斯伟材料科技有限公司 | 清洗装置 |
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KR0171491B1 (ko) * | 1994-09-20 | 1999-03-30 | 이시다 아키라 | 회전식 기판세정장치 |
JPH09326378A (ja) * | 1996-06-05 | 1997-12-16 | Sony Corp | 基板洗浄装置および基板洗浄方法 |
US6230753B1 (en) | 1996-07-15 | 2001-05-15 | Lam Research Corporation | Wafer cleaning apparatus |
JPH10199666A (ja) * | 1997-01-16 | 1998-07-31 | Nittetsu Semiconductor Kk | 漏液センサ付き直熱型ヒータ |
JP2000021838A (ja) * | 1998-06-29 | 2000-01-21 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2001044164A (ja) * | 1999-07-26 | 2001-02-16 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
US6446296B1 (en) * | 2000-03-06 | 2002-09-10 | Rite Track Equipment Services, Inc. | Substrate cleaning apparatus with brush force control and method |
JP2002043267A (ja) | 2000-07-21 | 2002-02-08 | Ebara Corp | 基板洗浄装置、基板洗浄方法及び基板処理装置 |
JP3953716B2 (ja) | 2000-08-01 | 2007-08-08 | 株式会社荏原製作所 | 基板洗浄装置 |
JP2005317576A (ja) * | 2004-04-27 | 2005-11-10 | Nikon Corp | 基板洗浄装置、及び基板洗浄装置における洗浄ブラシの基準位置の決定方法 |
JP2006332534A (ja) * | 2005-05-30 | 2006-12-07 | Tokyo Seimitsu Co Ltd | 基板洗浄装置 |
JP2008130820A (ja) * | 2006-11-21 | 2008-06-05 | Tokyo Seimitsu Co Ltd | 洗浄装置 |
KR100871135B1 (ko) * | 2007-03-13 | 2008-12-03 | 주식회사 에스에프에이 | 기판 세정장치 |
CN101380723A (zh) * | 2007-09-07 | 2009-03-11 | 斗山Mecatec株式会社 | 化学机械晶圆抛光设备的清洁刷升降装置 |
KR100908402B1 (ko) * | 2007-11-26 | 2009-07-20 | 주식회사 케이씨텍 | 기판 세정장치 |
KR101231308B1 (ko) * | 2008-06-03 | 2013-02-07 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치, 기판 처리 방법 및 컴퓨터 판독 가능한 기록 매체 |
JP2010102772A (ja) * | 2008-10-23 | 2010-05-06 | Showa Denko Kk | 磁気記録媒体用基板の洗浄装置及び磁気記録媒体用基板の洗浄方法 |
JP5878441B2 (ja) * | 2012-08-20 | 2016-03-08 | 株式会社荏原製作所 | 基板洗浄装置及び基板処理装置 |
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2013
- 2013-10-15 JP JP2013214958A patent/JP6262983B2/ja active Active
- 2013-10-23 KR KR1020130126505A patent/KR102114430B1/ko active Active
- 2013-10-23 US US14/061,686 patent/US9704728B2/en active Active
- 2013-10-24 CN CN201310506970.4A patent/CN103769376B/zh active Active
- 2013-10-24 TW TW102138407A patent/TWI600474B/zh active
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2017
- 2017-06-07 US US15/616,582 patent/US9842732B2/en active Active
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- 2020-05-18 KR KR1020200058990A patent/KR102123880B1/ko active Active
Also Published As
Publication number | Publication date |
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US9704728B2 (en) | 2017-07-11 |
TWI600474B (zh) | 2017-10-01 |
KR102123880B1 (ko) | 2020-06-17 |
CN103769376B (zh) | 2017-10-17 |
TW201420214A (zh) | 2014-06-01 |
CN103769376A (zh) | 2014-05-07 |
KR20140052876A (ko) | 2014-05-07 |
JP2014103387A (ja) | 2014-06-05 |
KR20200058344A (ko) | 2020-05-27 |
US9842732B2 (en) | 2017-12-12 |
US20170271178A1 (en) | 2017-09-21 |
KR102114430B1 (ko) | 2020-05-22 |
US20140116466A1 (en) | 2014-05-01 |
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