JP5797024B2 - Circuit board mounting component inspection apparatus and circuit board mounting component inspection method - Google Patents

Description

  The present invention relates to an inspection apparatus and an inspection method for a circuit board mounted component for inspecting an inspection target component mounted on a circuit board.

  As an inspection apparatus for this type of circuit board, the present applicant has already proposed a circuit board inspection apparatus disclosed in the following patent document. This circuit board inspection apparatus includes two probes and a measurement unit to which these probes are connected. In this circuit board inspection apparatus, each probe is brought into contact with each electrode of an electronic component (for example, a bypass capacitor) mounted on the circuit board, and the capacitance between the probes in this state is measured by a measuring unit. In this case, when the bypass capacitor is normally mounted, the measurement unit measures the capacitance of the bypass capacitor. When the bypass capacitor is not normally mounted (for example, when at least one electrode is When floating from the pattern (conductor pattern), the stray capacitance is measured. For this reason, according to this circuit board inspection apparatus, it is possible to inspect the soldering quality of the bypass capacitor based on the measured capacitance.

JP-A-2004-271294 (page 6-7, FIG. 3)

  However, this conventional circuit board inspection apparatus has the following problems to be improved. That is, in this circuit board inspection apparatus, the reason is that an electronic component (component to be inspected) whose electrical characteristic values such as a capacitance value and a resistance value are to be measured is arranged close to, for example, another electronic component. If the probe cannot be in contact with one of the electrodes and one of the conductor patterns connected to this electrode and the other electrode and any of the conductor patterns connected to this electrode at the same time, The electrical characteristic value of the target part cannot be measured. For this reason, the circuit board inspection apparatus has a problem that it is difficult to perform an inspection on such a component to be inspected.

  In addition, the probe can be simultaneously brought into contact with one of the electrodes and the conductor pattern connected to the electrode and the other electrode and the conductor pattern connected to the electrode. Even if it is a thing, when it is connected in parallel with other electronic parts of the same type, this causes the electrical characteristic value of such a part to be inspected to be not measured. For this reason, this circuit board inspection apparatus also has a problem to be solved that it is difficult to inspect such electronic components.

  The present invention has been made in order to improve such a problem, and it is difficult to inspect a component to be inspected that makes it difficult to simultaneously contact a probe with each electrode, or a component to be inspected that is connected in parallel with other electronic components of the same type. A main object of the present invention is to provide a circuit board mounting component inspection apparatus and a circuit board mounting component inspection method that enable inspection.

In order to achieve the above object, a circuit board mounting component inspection apparatus according to claim 1 is characterized in that an electrical characteristic value between any two points on a circuit board on which an electronic component is mounted is measured; A circuit board mounting component inspection apparatus comprising: a processing unit that inspects the electronic component mounted between the two points based on an electrical characteristic value as a component to be inspected, and is in an on state in a normal state When inspecting the component to be inspected mounted on the circuit board in a state of being connected in parallel with another electronic component of the same type via the switch element, the processing unit has shifted the switch element to the OFF state In the state, the electrical characteristic value of the inspection target part is measured, and the inspection target part is inspected based on the measured electrical characteristic value.

According to another aspect of the present invention, there is provided a method for inspecting a circuit board mounted component according to claim 2 , wherein the circuit board is connected in parallel with another electronic component of the same type via a switch element that is normally in an on state. A circuit board mounting component inspection method for inspecting an inspection target component based on an electrical characteristic value of the inspection target component mounted on the switch element, wherein the switch element is shifted to an off state, and the inspection target component The electrical characteristic value is measured.

In the inspection method of the circuit board mounted components of the inspection apparatus and the second aspect of the circuit board mounting part according to claim 1, wherein it is possible to connect a probe directly to its one electrode and the other electrode However, in the normal state, for the two parts to be inspected that are connected in parallel with each other by the on-state switch element, each inspection is performed by releasing the parallel state by controlling the switch element to the off state. The electrical property values of the target parts are individually measured and inspected based on the measured electrical property values. Therefore, according to the circuit board mounted component inspection apparatus and the circuit board mounted component inspection method, it is possible to inspect such components to be inspected, so that the inspection rate can be further increased.

1 is a configuration diagram of a circuit board mounting component inspection apparatus 1 and a circuit board 2. FIG.

  Hereinafter, embodiments of an inspection apparatus and inspection method for circuit board mounted components will be described with reference to the accompanying drawings.

  First, the configuration of the inspection apparatus 1 will be described with reference to FIG.

  As an example, the inspection apparatus 1 includes a plurality of probes 4 (two in this example as an example) that are brought into contact with a contact point 3 defined in advance on the circuit board 2, a moving mechanism (not shown) that moves the probes 4, and measurement. The unit 5, the processing unit 6, and the output unit 7 are provided, and an inspection is performed on an inspection target component among electronic components (mounted components) mounted on the circuit board 2.

  The two probes 4 are brought into contact with any two contact points 3 selected from among the plurality of contact points 3 defined on the circuit board 2 by a moving mechanism controlled by the processing unit 6.

  The measurement unit 5 is configured by using a digital multimeter (not shown) as an example, and an electrical characteristic value between two points (that is, two contact points 3) connected via two probes 4. Dm is measured. Further, the measuring unit 5 outputs the measured electrical characteristic value Dm to the processing unit 6. In this example, as will be described later, since the capacitor is a component to be inspected, the measurement unit 5 measures and outputs the capacitance value of the capacitor as the electrical characteristic value Dm.

  The processing unit 6 includes, as an example, a CPU and a memory (both not shown), a control process for the moving mechanism, a control process for the switch element mounted on the circuit board 2 (a control process for shifting to an on state or an off state) ), An inspection process for the part to be inspected, and an output process for causing the output unit 7 to output the result of the inspection process. The memory stores in advance position information about the contact point 3 for each part to be inspected and reference electrical characteristic values for each part to be inspected.

  For example, the output unit 7 includes a display device such as an LCD (Liquid Crystal Display). The output unit 7 inputs the result of the inspection process executed by the processing unit 6 from the processing unit 6 and displays the result on the screen.

  Next, a method for inspecting circuit board mounted components together with the operation of the inspection apparatus 1 will be described with reference to the drawings.

  First, the configuration of the circuit board 2 will be described. In this example, as shown in FIG. 1, as an example, the circuit board 2 includes a plurality of capacitors (in this example, seven capacitors 11, 12, 13, 14, 15, 16, 17) and switches as electronic components. An analog switch 18 as an element and relays 19 and 20 as other switch elements are mounted. Since each of the capacitors 11 to 17 is a component to be inspected, the memory of the processing unit 6 stores in advance a reference capacitance value for each of the capacitors 11 to 17 as a reference electrical characteristic value for each component to be inspected. Yes. In this example, as an example of the reference electrical characteristic values of the capacitors 11 to 17, the capacitors 11 to 17 are measured by the measuring unit 5 when a capacitor having a normal capacitance is mounted in a normal state. An upper limit capacity value and a lower limit capacity value indicating the range of the electrostatic capacity value are stored.

  The capacitor 11 has one electrode defined as the contact point 3 and connected to the conductor pattern 31, and the other electrode is a conductor pattern 32 (in this example, a reference potential conductor pattern (so-called ground pattern) in the circuit board 2 as an example). )It is connected to the. A part of the conductor pattern 32 is defined as the contact point 3. The capacitor 12 has one electrode defined as the contact point 3 and connected to the conductor pattern 33, and the other electrode connected to the conductor pattern 32.

  In the capacitor 13 (first component), one electrode 13 a is connected to one input / output electrode 18 a of the analog switch 18 via the conductor pattern 34, and the other electrode 13 b is connected to the conductor pattern 32. In this example, any one of the electrode 13 a of the capacitor 13, the input / output electrodes 18 a and 18 b of the analog switch 18, and the conductor pattern 34 on the structure of the capacitor 13 and the analog switch 18 and on the structure of the conductor pattern 34. Also, the probe 4 cannot be brought into direct contact. For this reason, the contact point 3 is not defined in any of the electrode 13a, the input / output electrodes 18a and 18b, and the conductor pattern 34.

  In the capacitor 14 (the other first component), one electrode 14 a is connected to one input / output electrode 19 a of the relay 19 through the conductor pattern 35, and the other electrode 14 b is connected to the conductor pattern 32. The capacitor 15 (second component) is another electronic component of the same type as the capacitor 14. One electrode is defined as the contact point 3 and connected to the conductor pattern 36, and the other electrode is connected to the conductor pattern 32. Has been. The capacitor 15 has one electrode connected to the other input / output electrode 19 b of the relay 19 through the conductor pattern 36.

  In this example, either the electrode 14a of the capacitor 14, the input / output electrodes 19a, 19b of the relay 19, or the conductor pattern 35 is determined on the structure of the capacitor 14 and the relay 19 and the structure of the conductor pattern 35. However, the probe 4 cannot be brought into direct contact. For this reason, the contact point 3 is not defined in any of the electrode 14a, the input / output electrodes 19a and 19b, and the conductor pattern 35.

  The capacitor 16 has one electrode defined as the contact point 3 and connected to the conductor pattern 37, and the other electrode connected to the conductor pattern 32. The capacitor 16 has one electrode connected to one input / output electrode 20 a of the relay 20 through a conductor pattern 37. The capacitor 17 is another electronic component of the same type as the capacitor 16, and one electrode is defined as the contact point 3 and connected to the conductor pattern 38, and the other electrode is connected to the conductor pattern 32. The capacitor 17 has one electrode connected to the other input / output electrode 20 b of the relay 20 through the conductor pattern 38.

  The on / off state of the analog switch 18 is controlled based on the control signal S1 output from the processing unit 6. Further, as described above, one input / output electrode 18 a of the analog switch 18 is connected to one electrode 13 a of the capacitor 13 via the conductor pattern 34. Further, the other input / output electrode 18 b of the analog switch 18 is connected to a conductor pattern 39 in which a part of the analog switch 18 is defined as the contact point 3.

  The relay 19 is controlled to be turned on / off based on a control signal S2 output from the processing unit 6. Specifically, the relay 19 is normally maintained in an off state, and is shifted to an on state only while the control signal S2 is being input. The relay 20 is controlled to be turned on / off based on a control signal S3 output from the processing unit 6. Specifically, the relay 20 is normally maintained in an on state and is shifted to an off state only while the control signal S3 is being input.

  The conductor patterns 31 to 39 are not connected to each other, and no capacitor other than the illustrated capacitor is connected to the conductor patterns 31 to 39.

  When the inspection is performed on each of the capacitors 11 to 17 mounted on the circuit board 2 as described above, in the inspection apparatus 1, the processing unit 6 uses the capacitors 11 to 17 ( In the following, the inspection target is to inspect the two probes 4 by sequentially reading out the positional information about the two contact points 3 for each of them (hereinafter also referred to simply as “parts to be inspected”) and executing the control process for the moving mechanism. Contact is made with two contact points 3 (two contact points 3 defined by the read position information) corresponding to the part.

  Next, the processing unit 6 performs an inspection corresponding to each contact point 3 based on the electrical characteristic value (capacitance value) Dm between the two contact points 3 output from the measurement unit 5 to the processing unit 6. Execute inspection processing for the target part.

  First, in a normal state, a common connection point 3 that is not connected in parallel with another capacitor and that is defined in one of its own electrodes and a conductor pattern 32 that is connected to each other electrode The inspection process for the capacitors 11, 12, and 15 in which the contact point 3 is defined as the two contact points 3 will be described.

  In the inspection process of the capacitors 11, 12, and 15, the processing unit 6 uses the two contact points 3 described above to directly connect the probe 4 to both electrodes of each capacitor 11, 12, and 15 (on the electrodes themselves). An electrical characteristic value (capacitance value) Dm measured by the measurement unit 5 is acquired (input) from the measurement unit 5 in a state in which the measurement unit 5 is in direct contact or directly through a conductor pattern connected to the electrode. The capacitors 11, 12, and 15 are inspected by comparing the acquired electrical characteristic value Dm with the reference electrical characteristic value (reference capacitance value) read from the memory.

  As described above, as the reference electrical characteristic value with respect to the electrical characteristic value Dm of each of the capacitors 11 to 17, the upper limit capacity when a capacitor having a normal capacitance is mounted in a normal state as each of the capacitors 11 to 17 Since the value and the lower limit capacity value are stored, the processing unit 6 compares the acquired electrical property value Dm with the reference electrical property value read from the memory, and the acquired electrical property value Dm is the reference electrical property value. If it is within the characteristic value range (within the range of the lower limit capacitance value and lower than the upper limit capacitance value), it is determined that the capacitor being inspected is normal, and the range of the reference electrical characteristic value If it is not included, it is determined that an abnormality has occurred in the capacitor being inspected. The processing unit 6 stores the determination result in the memory together with the capacitor identification information.

  Next, for the other electrode, the probe 4 can be brought into direct contact with the common contact point 3 defined in the conductor pattern 32. However, for one electrode, this electrode and the conductor connected to this electrode An inspection process for the capacitors 13 and 14 in which the contact point 3 for bringing the probe 4 into contact with any of the patterns is not defined will be described.

  First, for the capacitor 13, the contact point 3 defined in the conductor pattern 39 and the contact point 3 defined in the conductor pattern 32 are defined as two contact points 3 that contact the probe 4. For this reason, the processing unit 6 reads position information about the two contact points 3 with respect to the capacitor 13 as the inspection target component stored in the memory, and brings the two probes 4 into contact with the two contact points 3.

  Next, the processing unit 6 executes control processing for the analog switch 18 by outputting the control signal S1, and the electrical characteristic value Dm measured by the measuring unit 5 when the analog switch 18 is turned on. And a second electrical characteristic value Dm2 that is an electrical characteristic value measured by the measurement unit 5 when the analog switch 18 is shifted to the OFF state.

  Next, the processing unit 6 calculates an electrical property value (capacitance value) of the capacitor 13 based on the acquired first electrical property value Dm1 and second electrical property value Dm2. In this case, the on-resistance (resistance value in the on state) of the analog switch 18 is generally a small value of several Ω. Therefore, when the analog switch 18 is in the ON state, the capacitor 13 connected to one input / output electrode 18a of the analog switch 18 via the conductor pattern 34 and the other input / output electrode 18b of the analog switch 18 are connected. The electrostatic capacitance (for example, stray capacitance) Cf formed between the conductive pattern 39 and the conductive pattern 32 defined by the ground potential is in a parallel connection state.

  For this reason, the processing unit 6 includes the first electrical characteristic value Dm1 indicating the capacitance value of the parallel combined capacitance of the capacitor 13 and the capacitance Cf, and the second electrical characteristic value Dm2 indicating the capacitance value of the capacitance Cf. Based on the above, the electric characteristic value Dm of the capacitor 13 is calculated. Specifically, the capacitance Cf is subtracted from the capacitance value of the parallel combined capacitance to calculate the electrical characteristic value Dm of the capacitor 13. Subsequently, the processing unit 6 reads out the reference electrical characteristic value (reference capacitance value) of the capacitor 13 from the memory, compares the calculated electrical characteristic value Dm with the reference electrical characteristic value, and acquires the obtained electrical characteristic value. When the mechanical characteristic value Dm is included in the range of the reference electrical characteristic value, it is determined that the capacitor 13 that is inspecting is normal, and when it is not included in the range of the reference electrical characteristic value. Then, it is determined that an abnormality has occurred in the capacitor 13, and the determination result is stored in the memory together with the identification information of the capacitor 13.

  In general, the capacitance value of the capacitance Cf is sufficiently smaller than the capacitance value of the capacitor 13. For this reason, the first electrical characteristic value Dm1 indicating the capacitance value of the parallel combined capacitance of the capacitor 13 and the capacitance Cf may be substantially equal to the capacitance value of the capacitor 13 in some cases. In this case, the first electrical characteristic value Dm1 that is the electrical characteristic value Dm measured by the measurement unit 5 when the analog switch 18 is turned on is measured as the capacitance value of the capacitor 13. Can also be adopted.

  For the capacitor 14, the contact point 3 defined on the electrode of the capacitor 15 connected to the conductor pattern 36 and the two contact points 3 where the contact point 3 defined on the conductor pattern 32 contacts the probe 4. It is prescribed. For this reason, the processing unit 6 reads position information about the two contact points 3 with respect to the capacitor 14 as the inspection target component stored in the memory, and brings the two probes 4 into contact with the two contact points 3.

  Next, the processing unit 6 executes the control process for the relay 19 by outputting the control signal S2, and is the electrical characteristic value Dm measured by the measuring unit 5 when the relay 19 is turned on. A first electrical characteristic value Dm1, and a second electrical characteristic value Dm2 (capacitance value of the capacitor 15) that is an electrical characteristic value measured by the measuring unit 5 when the relay 19 is shifted to the off state. To get.

  Next, the processing unit 6 calculates the electrical characteristic values (capacitance values) of the capacitors 14 and 15 based on the acquired first electrical characteristic value Dm1 and second electrical characteristic value Dm2. In this case, the ON resistance of the relay 19 (resistance value in the ON state) is generally a small value less than 1Ω. Therefore, when the relay 19 is in the ON state, the capacitor 14 connected to one input / output electrode 19a of the relay 19 via the conductor pattern 35 and the conductor pattern connected to the other input / output electrode 19b of the relay 19 The capacitor 15 connected between 36 and the conductor pattern 32 is in a parallel connection state.

  Therefore, the processing unit 6 is based on the first electrical characteristic value Dm1 indicating the capacitance value of the parallel combined capacitance of the capacitors 14 and 15 and the second electrical characteristic value Dm2 indicating the capacitance value of the capacitor 15. Thus, the electrical characteristic values Dm of the capacitors 14 and 15 are calculated. Specifically, the electrical characteristic value Dm of the capacitor 15 is calculated based on the second electrical characteristic value Dm2. On the other hand, the electrical characteristic value Dm of the capacitor 14 is calculated by subtracting the second electrical characteristic value Dm2 from the first electrical characteristic value Dm1. Subsequently, the processing unit 6 reads out each reference electrical characteristic value for the capacitors 14 and 15 from the memory and compares the calculated electrical characteristic value Dm with the corresponding reference electrical characteristic value to obtain the acquired electrical When the characteristic value Dm is included in the range of the corresponding reference electrical characteristic value, it is determined that the capacitors 14 and 15 performing the inspection are normal and included in the range of the reference electrical characteristic value. If not, it is determined that an abnormality has occurred in the capacitors 14 and 15, and each determination result is stored in the memory together with the identification information of the corresponding capacitors 14 and 15.

  Subsequently, although it is possible to directly connect the probe 4 to one electrode and the other electrode of itself, in a normal state, they are parallel to each other by an on-state switch element (in this example, a relay 20). An inspection process for the capacitors 16 and 17 that are in the state of being connected to each other will be described.

  First, for the capacitor 16, the contact point 3 defined for one of the electrodes and the contact point 3 defined for the conductor pattern 32 are defined as two contact points 3 for contacting the probe 4. For this reason, the processing unit 6 first reads position information about the two contact points 3 with respect to the capacitor 16 from the memory, and brings the two probes 4 into contact with the two contact points 3.

  Next, the processing unit 6 executes the control process for the relay 20 by outputting the control signal S3, and shifts the relay 20 from the on state to the off state. Thereby, the parallel connection state of the capacitor 16 and the capacitor 17 is released. In this state, the processing unit 6 acquires the electrical characteristic value Dm measured by the measuring unit 5 as the electrical characteristic value Dm of the capacitor 16.

  Subsequently, the processing unit 6 reads out the reference electrical characteristic value for the capacitor 16 from the memory and compares the acquired electrical characteristic value Dm with the corresponding reference electrical characteristic value to obtain the electrical characteristic value Dm. When it is included within the range of the corresponding reference electrical characteristic value, it is determined that the capacitor 16 is normal, and when it is not included within the range of the reference electrical characteristic value, an abnormality has occurred in the capacitor 16. And the determination result is stored in the memory together with the identification information of the capacitor 16.

  On the other hand, for the capacitor 17, the contact point 3 defined for one of the electrodes and the contact point 3 defined for the conductor pattern 32 are defined as two contact points 3 for contacting the probe 4. For this reason, the processing unit 6 reads position information about the two contact points 3 with respect to the capacitor 17 from the memory, and brings the two probes 4 into contact with the two contact points 3.

  Next, the processing unit 6 acquires the electrical characteristic value Dm measured by the measurement unit 5 as the electrical characteristic value Dm of the capacitor 17 in a state where the parallel connection state of the capacitor 16 and the capacitor 17 is released.

  Subsequently, the processing unit 6 reads the reference electrical characteristic value for the capacitor 17 from the memory, and compares the acquired electrical characteristic value Dm with the corresponding reference electrical characteristic value to obtain the electrical characteristic value Dm. When it is included within the range of the corresponding reference electrical characteristic value, it is determined that the capacitor 17 is normal, and when it is not included within the range of the reference electrical characteristic value, an abnormality has occurred in the capacitor 17. And the determination result is stored in the memory together with the identification information of the capacitor 17. Thereby, the test | inspection with respect to the capacitors 11-17 mounted in the circuit board 2 as a test object component is completed.

  Finally, the processing unit 6 executes an output process, and causes the output unit 7 configured by a display device to display the inspection results for the capacitors 11 to 17 as the inspection target components stored in the memory.

  As described above, in this inspection apparatus 1 and circuit board mounting component inspection method, an analog switch as a switch element can be used even if the capacitor cannot directly measure the electrical characteristic value Dm by bringing the probe 4 into direct contact with both electrodes simultaneously. For the capacitor 13 as the first component connected to 18 and the capacitor 14 as another first component connected to the relay 19 as the switch element, when these switch elements are shifted to the ON state The electrical characteristic values Dm of the capacitors 13 and 14 are individually calculated on the basis of the first electrical characteristic value Dm, which is the electrical characteristic value Dm measured at the same time, and each capacitor is determined based on the calculated electrical characteristic value Dm. 13 and 14 are inspected.

  Therefore, according to the inspection apparatus 1 and the circuit board mounting component inspection method, it is possible to inspect the capacitors 13 and 14 that cannot measure the electrical characteristic value Dm by bringing the probe 4 into direct contact with both electrodes simultaneously. Therefore, it is possible to increase the inspection rate, which is the ratio of the inspection target parts that can actually be inspected in the inspection target parts (electronic parts to be inspected) mounted on the circuit board 2.

  Further, in this inspection apparatus 1 and circuit board mounting component inspection method, the capacitor 15 (capacitor 15) as the second component is controlled when the relay 19 as the switch element is controlled to be in the ON state, like the capacitor 14 as the first component. As for the capacitor connected in parallel with the other electronic component of the same type as that 14, the first electrical characteristic value Dm (capacitor 14, which is the electrical characteristic value Dm measured when the relay 19 is turned on). 15 composite electric characteristic values) and a second electric characteristic value Dm (electric characteristic value of the capacitor 15) which is an electric characteristic value Dm measured when the relay 19 is shifted to the OFF state. Thus, the electrical characteristic values Dm of the capacitors 14 and 15 are individually calculated, and the capacitors 14 and 15 are inspected based on the calculated electrical characteristic values Dm.

  Therefore, according to the inspection apparatus 1 and the circuit board mounting component inspection method, it is possible to inspect such a capacitor 14, so that the inspection rate can be further increased.

  In the inspection apparatus 1 and the circuit board mounting component inspection method, the probe 4 can be directly connected to one of its own electrodes and the other electrode. For the capacitors 16 and 17 that are connected in parallel with each other by the switch element (relay 20), the capacitors 16 and 17 are released by controlling the switch element (relay 20) to the off state and releasing the parallel state. Each of the electrical characteristic values Dm is measured individually, and an inspection is performed based on each of the measured electrical characteristic values Dm.

  Therefore, according to the inspection apparatus 1 and the method for inspecting circuit board mounted components, it is possible to inspect such capacitors 16 and 17, so that the inspection rate can be further increased.

  In the above-described inspection apparatus 1 and circuit board mounting component inspection method, a capacitor is described as an example of a component to be inspected. However, the present invention is not limited to the capacitor, and the resistance mounted on the circuit board 2 Of course, it can also be applied to inductors. In this case, the electrical characteristic value is a resistance value in the case of a resistor, and is an inductance in the case of an inductor.

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 2 Circuit board 5 Measuring part 6 Processing part 11-17 Capacitor 18 Analog switch 19,20 Relay Dm Electrical characteristic value Dm1 1st electrical characteristic value Dm2 2nd electrical characteristic value

Claims (2)

A measurement unit that measures an electrical characteristic value between any two points on a circuit board on which electronic components are mounted;
A circuit board mounting component inspection apparatus comprising: a processing unit that inspects the electronic component mounted between the two points as a component to be inspected based on the measured electrical characteristic value;
In the inspection of the inspection target component mounted on the circuit board in a state of being connected in parallel with the other electronic components of the same type via the switch element that is normally in an on state,
The processing unit measures the electrical characteristic value of the inspection target component in a state where the switch element is shifted to an off state, and inspects the inspection target component based on the measured electrical characteristic value Inspection equipment for board mounted components. Inspecting the inspection target component based on the electrical characteristic value of the inspection target component mounted on the circuit board in a state of being connected in parallel with another electronic component of the same type via a switch element that is normally turned on A circuit board mounting component inspection method
A circuit board mounting component inspection method for measuring the electrical characteristic value of the inspection target component by moving the switch element to an OFF state.

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