JP5070956B2 - Substrate inspection contact and substrate inspection jig - Google Patents

Description

The present invention relates to a substrate inspection contact and a substrate inspection jig. More specifically, the present invention is in contact with a predetermined inspection point set on a wiring pattern of a substrate to be inspected. It is related with the board | substrate test | inspection contactor which enables transmission of a test signal between.
The present invention is not limited to a printed wiring board, but includes, for example, various substrates and semiconductor wafers such as flexible substrates, multilayer wiring substrates, electrode plates for liquid crystal displays and plasma displays, and package substrates and film carriers for semiconductor packages. The present invention can be applied to inspection of electrical wiring, and in this specification, these various wiring boards are collectively referred to as “substrate”.

  Conventionally, a wiring pattern on a circuit board has to mount an electric / electronic component because it is necessary to accurately transmit an electric signal to an electric / electronic component such as a semiconductor such as an IC or a resistor mounted on the circuit board. Provided in the wiring pattern to be inspected against the previous printed wiring board, the circuit wiring board on which the wiring pattern was formed on the liquid crystal panel or plasma display panel, or the wiring pattern formed on the substrate such as a semiconductor wafer The resistance value between the inspection points was measured, and the quality was judged.

  In such a judgment inspection, inspections such as disconnection and short-circuiting of wiring patterns are made such that measurement terminals are brought into contact with inspection points provided at two locations of the wiring pattern to be inspected, one by one, between the measurement terminals. The voltage value between the measurement terminals is measured by passing a predetermined level of measurement current, and pass / fail is determined by comparing this voltage value with a predetermined threshold value.

  However, in such a method, a measurement terminal brought into contact with each of two inspection points of the wiring pattern is commonly used for supplying a measurement current and measuring a voltage (this measurement method is 2 The terminal measurement method) has a disadvantage that the contact resistance between the measurement terminal and the inspection point affects the measurement voltage, the measurement accuracy of the resistance value is lowered, and the reliability of the inspection result is lowered.

  Therefore, the current supply terminal and the voltage measurement terminal are brought into contact with each inspection point, and the measurement current is supplied between the current supply terminals brought into contact with the respective inspection points. A method of measuring the resistance value with high accuracy by measuring the voltage generated between the voltage measuring terminals brought into contact with each other to suppress the influence of the contact resistance between the measuring terminal and the inspection point (so-called 4 A terminal inspection method or a Kelvin method) is known, and a substrate inspection apparatus for inspecting a wiring pattern using this method is known (for example, see Patent Document 1).

  However, in the board inspection apparatus disclosed in Patent Document 1, when the wiring pattern is inspected using the four-terminal measurement method, the current supply terminal and the voltage measurement terminal are moved for each inspection point. It is necessary to abut while controlling. On the other hand, since the miniaturization of circuit boards has progressed in recent years and the lands that serve as inspection points have become narrower, it is extremely difficult to ensure that the two terminals are brought into contact with one land without being electrically connected to each other. There was a problem.

  In order to solve such a problem, the first terminal is formed in a cylindrical shape, and the second terminal is formed in a spiral spring that can slide in the axial direction along the outer peripheral surface of the cylindrical shape. Contact has been created (see Patent Document 2). By forming two terminals in this way, the two terminals can be easily brought into contact with a fine inspection point.

However, the contact as disclosed in Patent Document 2 has a complicated structure because it is necessary to form a fine spiral spring and fine plungers provided at both ends of the spring.
For this reason, the two terminals can be easily brought into contact with a minute inspection point without electrically conducting the two terminals, and the contact for four-terminal measurement has a configuration that can be manufactured simply and inexpensively. The creation of a child was required.

JP-A-6-66832 JP-A-2005-321211

  The present invention has been made in view of such a situation, and can easily abut a minute inspection point without electrically connecting two terminals to each other, and is inexpensive with a simple structure. Provided is a substrate inspection contact for four-terminal measurement having a structure that can be manufactured.

According to the first aspect of the present invention, the first conductive portion and the second conductive portion, each of which is pressed against a predetermined inspection point set on the wiring pattern of the substrate to be inspected, one of which is used for voltage measurement and the other is used for current application. The first conductive part is formed in a bar shape having flexibility and conductivity, and the second conductive part accommodates the first conductive part therein. And a flexible and conductive cylindrical member, and a gap is formed across the entire length in the length direction between the first conductive portion and the inner peripheral surface of the second conductive portion, On one side of the second conductive portion, a spring portion that slides in the axial length direction is provided on a part of the peripheral wall of the second conductive portion, and the first conductive portion and the second conductive portion of the contact for inspection of a substrate are provided. In use, when the part touches the inspection point, the spring part first contracts, and then the substrate further on the inspection point By 査用 contacts is pressed, the first conductive portion and the second conductive portion to provide a substrate inspection contactor, characterized by bending each independently.
According to a second aspect of the present invention, the first conductive portion includes a first protrusion that protrudes in the minor axis direction, the second conductive portion includes a second protrusion that protrudes from the peripheral wall into the cylinder, 2. The substrate inspection contact according to claim 1 , wherein the first projecting portion and the second projecting portion prevent the first conductive portion from slipping out of the second conductive portion. 3.
According to a third aspect of the present invention, there is provided the contact for inspecting a substrate according to the second aspect, wherein the first projecting portion of the first conductive portion is formed at one end and the other end of a rod shape. .
According to a fourth aspect of the present invention, the second conductive portion includes a cylindrical member having two outer diameters different from those of the other cylindrical member having an outer diameter substantially equal to the inner diameter of the one cylindrical member. The other cylindrical member is connected in communication with one open end of the one cylindrical member, and the spring portion is formed on a part of the peripheral wall on one side of the other cylindrical member. A contact for inspecting a substrate according to claim 1 or 2 is provided.
According to a fifth aspect of the present invention, one is pressed against a predetermined inspection point set on a wiring pattern of a substrate to be inspected, and the other is pressed against an electrode portion of an inspection apparatus for inspecting the electrical characteristics of the wiring pattern. A substrate inspection jig, comprising: a substrate inspection contact according to any one of claims 1 to 4, a distal end side holding portion having a guide hole for guiding a distal end of the substrate inspection contact to the inspection point, and the substrate. It has a rear end side holding part having a guide hole for guiding the rear end of the inspection contact to the electrode part, and the spring part of the substrate inspection contact is arranged inside the front end side holding hole. Provided is a substrate inspection jig that is formed as described above.
By providing these inventions, the above problems can be solved.

According to the first aspect of the present invention, the first conductive portion and the first conductive portion, each of which is pressed against a predetermined inspection point set on the wiring pattern of the substrate to be inspected, one of which is used for voltage measurement and the other is used for current application. A contact for inspecting a substrate having two conductive parts, wherein the first conductive part is formed in a bar shape having flexibility and conductivity, and the second conductive part is provided with the first conductive part inside. It is formed by a cylindrical member that accommodates and has flexibility and conductivity, and a gap is formed over the entire length in the length direction between the first conductive portion and the inner peripheral surface of the second conductive portion. The first conductive portion and the second conductive portion of the substrate inspection contact have a spring portion that slides in the axial direction on a part of the peripheral wall of the second conductive portion on one side of the second conductive portion. When the two conductive parts are in contact with the inspection point, the spring part first contracts and then the inspection point is updated. When the substrate inspection contact is pressed, the first conductive portion and the second conductive portion are each independently curved. Therefore, when the substrate inspection contact is used, the substrate inspection contact is By bending by pressing, it is possible to provide a board inspection contact for four-terminal measurement that is in a pressure contact state with respect to the inspection point and the electrode portion. In addition, since the spring portion is provided on the peripheral wall of the second conductive portion, even if the inspection point has an irregular shape such as a hemispherical shape, the spring portion is surely matched to the shape of the second conductive portion. The portion can be brought into conductive contact stably. Moreover, since the first and second conductive parts have a simple configuration, they can be manufactured at low cost.
According to a second aspect of the present invention, the first conductive portion includes a first protrusion that protrudes in the minor axis direction, and the second conductive portion includes a second protrusion that protrudes from the peripheral wall into the cylinder. The first projecting portion and the second projecting portion can prevent the first conductive portion from slipping out of the second conductive portion.
According to the invention described in claim 3, since the first projecting portion of the first conductive portion is formed at one end and the other end of the rod shape, the first conductive portion disposed in the second conductive portion is the first It can be arranged and held at the long axis position of the two conductive portions.
According to invention of Claim 4, said 2nd electroconductive part has the cylindrical member from which the two outer diameters of the other cylindrical member which have an outer diameter substantially the same as the internal diameter of one cylindrical member differ. Since the other cylindrical member is connected in communication with one open end of the one cylindrical member, and the spring portion is formed on a part of the peripheral wall on one side of the other cylindrical member, It is possible to appropriately cope with finer inspection points.
According to the fifth aspect of the present invention, one is pressed against a predetermined inspection point set on the wiring pattern of the substrate to be inspected, and the other is pressed against the electrode portion of the inspection apparatus for inspecting the electrical characteristics of the wiring pattern. A substrate inspection jig that is a substrate inspection contact according to any one of claims 1 to 4, and a tip side holding portion having a guide hole that guides the tip of the substrate inspection contact to the inspection point, A rear end holding portion having a guide hole for guiding the rear end of the substrate inspection contact to the electrode portion; and the spring portion of the substrate inspection contact is arranged inside the front end holding hole. It is possible to provide a substrate inspection jig which is formed so as to be disposed on the substrate.
For this reason, since the spring portion is provided on the peripheral wall of the second conductive portion, even if the inspection point has an irregular shape such as a hemispherical shape, the spring portion is surely matched to the shape. The conductive portion can be brought into conductive contact stably. Moreover, since the first and second conductive parts have a simple configuration, they can be manufactured at low cost.

The best mode for carrying out the present invention will be described.
FIG. 1 is a cross-sectional view showing the structure of a substrate inspection jig and electrode part according to the present invention.
In FIG. 1A, a substrate inspection jig 1 is shown, and in FIG. 1B, an electrode portion 2 is shown. The upper side of the substrate inspection jig 1 shown in FIG. 1A is electrically connected to the electrode portion 2, and the lower side of the paper is electrically connected to the inspection point.
The substrate inspection jig 1 includes a substrate inspection contact 3 and a holding member 4 that holds the substrate inspection contact 3.
The substrate inspection contact 3 has one end electrically connected to a predetermined inspection point set on the wiring pattern of the substrate to be inspected, and the other end electrode portion of an inspection apparatus for detecting the electrical characteristics of the wiring pattern. 2 is in conductive contact.
The substrate inspection contact 3 has a first conductive part and a second conductive part, one of which is used for voltage measurement and the other is used for current application. The first conductive portion and the second conductive portion are electrically independent from each other, and the first and second conductive portions are in conductive contact with each other for one inspection point. By conducting conductive contact in this way, the first conductive portion and the second conductive portion can receive independent electrical signals or supply power.

The first conductive portion 31 is formed in a bar shape having flexibility and conductivity. The first conductive portion 31 includes a core portion 311 having flexibility and conductivity, and a first insulating coating portion 312 having flexibility and non-conductivity.
The core 311 can be formed using a material having the above properties, and for example, tungsten (W) or beryllium copper (BeCu) can be used.
As shown in FIG. 1, the core 311 can be formed in a hemispherical shape at both ends or in a sharp shape.
The dimensions such as the length and thickness of the core 311 are not particularly limited, but are defined by the interrelationship with other components described later. For example, the length of the core 311 in the major axis direction 3 to The thickness is 5 cm and the thickness can be 30 to 70 μm.
The first insulating covering portion 312 covers the periphery of the core portion 311. The place where the first insulating covering portion 312 is covered is a place excluding both ends of the core portion 311 as shown in FIG. The place where the first insulating covering portions 312 at both ends are not covered is appropriately adjusted to about 50 to 3000 μm from the tip end.
The thickness of the first insulating covering portion 312 is, for example, 5 to 10 μm, but is not particularly limited, and can be accommodated in a cylindrical member of the second conductive portion 32 described later. It must be thick. Moreover, although mentioned later for details, this 1st insulation coating part 312 is provided with the protrusion part which protrudes in a short-axis direction, and this protrusion part needs to exist in the state protruded enough.

  The first insulating covering portion 312 has a protruding portion (first protruding portion) protruding in the minor axis direction. This protrusion has a function of preventing the protrusion from coming out from a second conductive portion 32 described later. For example, in the embodiment of FIG. 1, a protruding portion (second protruding portion 324) that protrudes from the inner peripheral wall of the second conductive portion 32 toward the inside is provided, and the second protruding portion 324 and the first protruding portion are provided. By providing the first conductive portion 31, it is possible to prevent the first conductive portion 31 from coming out of the second conductive portion 32.

As shown in FIG. 1, the first protrusions are preferably provided at the upper end (upper first protrusion 313) and the lower end (lower first protrusion 314) of the first conductive portion 31.
In this case, as described above, the lower first projecting portion 314 is caught by the second projecting portion 324 of the second conductive portion 32, and the first conductive portion 31 is separated from the second conductive portion 32 (the paper surface of FIG. 1). Prevents getting out (to the near side).
The upper first protrusion 313 is preferably formed in substantially the same shape as the lower first protrusion 314. It is because the core part of the 1st electroconductive part 31 can maintain a parallel state with the cylinder part of the 2nd electroconductive part 32 by providing this upper 1st protrusion part 313. FIG. For this reason, the 1st electroconductive part 31 can be arrange | positioned in the axial position (center position) of a cylinder part.

The second conductive portion 32 is formed by a cylindrical member 321 and has flexibility and conductivity. As shown in FIG. 1, the second conductive portion 32 accommodates a first conductive portion 31 having a rod shape inside the cylindrical member, and a gap is formed across the entire length in the length direction from the first conductive portion 31. To be arranged.
The length (major axis direction) and thickness of the second conductive portion 32 are not particularly limited, but are 3 to 5 cm in length, 50 to 150 μm in outer diameter, and 40 to 100 μm in inner diameter.
The material of the second conductive portion 32 is not particularly limited as long as the material has flexibility and conductivity, and for example, nickel (Ni) can be exemplified.

A spring portion 323 is formed on the tip side of the second conductive portion 32 that contacts the inspection point. The spring portion 323 slides in the axial direction. The spring portion 323 is formed with a spring portion 323 by providing a cutout portion in a part of the cylindrical member 321 that becomes the peripheral wall of the second conductive portion 32. The formation method of this spring part is not specifically limited, For example, the position for forming a notch part in the predetermined site | part of the cylindrical member 321 is set, and the cylindrical member 321 in the position where this notch part is set is used. By removing with a laser or the like, the spring portion 323 can be formed.
Thus, since the spring part 323 is formed in a part of the cylindrical member 321, there is no need to assemble a plurality of parts unlike a conventional probe.

The spring portion 323 is preferably formed so as to be disposed inside the guide hole of the holding portion that holds the substrate inspection contact 3. For example, in FIG. 1, the spring portion 323 is disposed inside the guide hole 423 of the distal end side holding member 42.
The reason for this arrangement is that the spring portion 323 is arranged in the guide hole so that the sliding of the spring portion 323 is guided in the long axis direction without shifting (sliding in the horizontal direction on the paper surface). Because it can.

  The place where the spring portion 323 is provided is not limited to the front end side of the second conductive portion 32 as described above, but may be the rear end side of the second conductive portion 32. In this case, the spring portion 323 is formed so as to be disposed inside the guide hole 413 of the rear end side holding member 41.

  This spring portion 323 does not need to have the ability to absorb all of the pushing amount when it comes into contact (pressure contact) with the inspection point, so that the spring portion 323 can stably contact the inspection point. It preferably works as a joint function. In such a case, first, when the inspection point and the electrode portion start to be in pressure contact, the spring portion 323 contracts so as to stably contact along the shape of the inspection point. When further pressed, the amount of contraction of the spring portion 323 is reached to the limit, and the first conductive portion 31 and the second conductive portion 32 are curved to absorb the amount of contraction (length) due to the pressure contact.

The second conductive portion 32 has a second protruding portion 324 that protrudes from the peripheral wall into the cylinder.
As shown in FIG. 1, the second projecting portion 324 projects from the peripheral wall into the cylinder, thereby forming a partial inner diameter inside the cylinder. The second protrusion 324 is formed at a position farther from the rear end side than the first protrusion. When the board inspection contact 3 is attached to the electrode part 2, the electrode part 2 and the second projecting part 324 are sandwiched between the first conductive part 31 and the second conductive part 32. Can be prevented. As shown in FIG. 1, the second protrusion 324 is formed on the inspection point side (lower side in the drawing) than the lower first protrusion 314.
The formation method of this 2nd protrusion part 324 is not specifically limited, For example, it can form by caulking by pressing the 2nd electroconductive part 321 inward from the outer surface.

The second conductive portion 32 has an insulating coating portion 322 that covers the outer periphery of the cylindrical member 321. The insulating coating portion 322 is made of an insulating material such as Teflon (registered trademark) or polyurethane. The insulating covering portion 322 is covered on the entire tubular member 321 except for both ends of the tubular member 321. When the plurality of substrate inspection contacts 3 are placed on the substrate inspection jig 1 and used when the substrate inspection contact 3 is curved, the insulation coating portion 322 is used as another substrate inspection contact. Even if the children come into contact with each other, they are provided so as not to be short-circuited.
As shown in FIG. 1, the insulating coating portion 322 is formed so as to be disposed in the space between the front end holding member 42 and the rear end holding member 41, but the front end holding member 42 and the rear end The insulating coating portion 322 may be formed up to the inside of the guide hole of the holding member 41.
Note that the insulating coating portion 322 may be formed to the outside of the guide hole 413 on the rear end portion side that is in conductive contact with the electrode portion 2. By being formed in this way, the clearance (space) between the guide hole 413 of the rear end side holding member 41 and the substrate inspection contact 3 is made smaller, the positional accuracy is improved more accurately, and the substrate inspection is performed. This is because the contact 3 for use can be brought into contact with the electrode portion 2 at a right angle.

The holding member 4 is formed of an insulating material, holds the substrate inspection contact 3, and guides the substrate inspection contact 3 to a predetermined inspection point and electrode portion.
The holding member 4 includes a front end side holding portion 42, a rear end side holding portion 41, and a support portion 43 that supports these holding portions.

The front end holding part 42 has a guide hole 423 for guiding the front end of the substrate inspection contact 3 to the inspection point. The guide hole 423 is formed to have a diameter slightly larger than the outer diameter of the substrate inspection contact 3. The diameter of the guide hole 423 is preferably larger than the outer diameter of the second conductive portion 321 and smaller than the outer diameter of the insulating coating portion 322. By being formed in this way, it is possible to prevent the tip end side holding portion 42 from coming out of the guide hole.
In FIG. 1, the first tip side holding portion 421 and the second tip side holding portion 422 in which holes having two types of large and small diameters are formed are used to form the guide hole. The structure is not particularly limited, and it may be formed with holes having one type of diameter, or may be formed with holes having three or more types of diameters.
The thickness of the tip side holding portion 42 can be 1 to 10 mm, but is not particularly limited. The length of the spring portion 323 and the conductive portion (insulation coating) on the tip side of the contactor 3 for substrate inspection are not limited. The length is appropriately changed according to the length of the portion).

The rear end side holding part 41 has a guide hole 413 for guiding the rear end of the board inspection contact 3 to the electrode part 2. The guide hole 413 has a diameter slightly larger than the outer diameter of the substrate inspection contact 3. By forming the guide hole 413 slightly larger than the outer diameter of the insulating coating portion 322 of the substrate inspection contact 3, the substrate inspection contact 3 can be inserted into and removed from the guide hole 413. The inspection contact 3 can be replaced.
In addition, like the front end side holding part 42, in FIG. 1, in order to form a guide hole, the 1st rear end side holding part 411 and the 2nd rear end side holding part in which the hole which has two types of diameters large and small is formed. 412 is used, but it is not particularly limited to such a structure, and may be formed in a hole having one type of diameter, or may be formed by a hole having three or more types of diameters. It doesn't matter.
The thickness of the rear end side holding portion 41 can be formed to be 1 to 10 mm, but is not particularly limited. The length of the spring portion 323 or the conductive portion (insulation on the front end side of the substrate inspection contact 3) is not limited. The length is appropriately changed according to the length of the portion not covered.

The support part 43 is provided in order to arrange the front end side holding part 42 and the rear end side holding part 41 with a predetermined space. The support portion 43 may employ a cylindrical member, but is not particularly limited, and the user can appropriately set the size, the arrangement position, the number of arrangements, and the like.
The length of the support portion 43 is such that the front-end-side holding portion 42 and the rear-end-side holding portion when the board inspection contact 3 is mounted in the guide holes of the front-end-side holding portion 42 and the rear-end-side holding portion 41. It is necessary to have such a length that the substrate inspection contact 3 protrudes outward from both guide holes 41. As described above, since the substrate inspection contact 3 protrudes from the guide holes of the front end side holding portion 42 and the rear end side holding portion 41, the substrate inspection jig 1 is attached to the electrode portion 2. In this case, the substrate inspection contact 3 is in pressure contact with the electrode portion 2 and in use, it is pressed from the inspection point of the substrate, and is securely clamped inward from both ends. It is because it will be in a state to be done.

The electrode part 2 has a first electrode part and a second electrode part for contacting the first conductive part 31 and the second conductive part 32 independently of each other.
The first electrode portion and the second electrode portion are formed electrically independently from each other. For example, in the structure of the electrode portion shown in FIG. 1B, the first electrode portion 21 is formed of a conductive rod-shaped member, and the side surface of the rod-shaped member is formed as a contact surface of the first conductive portion 311. Has been. Moreover, the 2nd electrode part 22 is formed with the electroconductive cylindrical member arrange | positioned coaxially with the 1st electrode part 21 of a rod-shaped member.
The thickness of the tube of the second electrode portion 22 is at least substantially the same as the thickness of the second conductive portion 321 or greater than the thickness. By being formed in this way, the second conductive portion 321 can stably contact the second electrode portion 22.

  It is preferable that an insulating insulating member 23 is interposed between the first electrode portion 21 and the second electrode portion 22. This is because the first electrode portion 21 and the second electrode portion 22 can be stably fixed by interposing the insulating member 23 in this way.

The electrode unit 2 includes a plate member 24 that holds the first electrode unit 21 and the second electrode unit 22. The plate member 24 is formed with a hole for holding the second electrode portion 22, and the first electrode portion 21 and the second electrode portion 22 are inserted into the hole. In this plate member 24, the first electrode portion 21 and the second electrode portion 22 are formed so as to be flush with each other (see FIG. 1B).
The above is description of the structure of one Embodiment of the board | substrate test | inspection jig | tool concerning this invention.

Next, another embodiment of the substrate inspection jig will be described.
FIG. 2 is a sectional view showing a second embodiment of the substrate inspection jig.
The basic structure of the substrate inspection jig according to the second embodiment is the same as that of the substrate inspection jig according to the first embodiment, and a different structure between the first embodiment and the second embodiment will be described.

The substrate inspection jig 1 of the second embodiment is provided with an auxiliary portion 326 on the tip side (inspection point) of the second conductive portion 321.
The auxiliary cylinder part 326 assists the thickness of the second conductive part 321. By providing the auxiliary portion 326, the thickness of the second conductive portion 321 is increased, and it is possible to prevent the inspection portion from penetrating.
For example, when the board inspection contact 3 is used at a hemispherical inspection point such as a solder bump, the tip of the contact 3 may penetrate into the inspection point. By providing this, the formation of a dent (penetration trace) at the inspection point is prevented.

As shown in FIG. 2, the auxiliary portion 326 can be formed by fitting a cylindrical portion having a diameter smaller than that of the second conductive portion 321 inside the tip of the second conductive portion 321. The auxiliary part 326 can be formed by fixing a small cylindrical part to the tip of the second conductive part 321 by welding or the like. In FIG. 2, a portion indicated by reference numeral 325 is shown as a welded portion.
In addition, it is preferable that the internal diameter of this auxiliary | assistant part 326 is formed larger than the outer diameter of the 1st electroconductive part 31 (insulation coating | coated part 312).

FIG. 3 shows a cross section of a third embodiment of the substrate inspection contact 3 according to the present invention.
In the substrate inspection contact 3 of the third embodiment, an auxiliary portion 326 of the substrate inspection contact 3 of the second embodiment is provided. Further, the lower first protrusion 314 formed in the first conductive portion 31 is formed at a position closer to the inspection point than the second protrusion 324. The lower first protrusion 314 is preferably provided so as to be positioned slightly above the auxiliary portion 326 as shown in FIG.
By forming in this way, it is possible to prevent the first conductive portion 31 from slipping out of the second conductive portion 32 by the auxiliary portion 326 and the lower first protruding portion 314.
The lower first protrusion 314 needs not to prevent the spring portion 323 from sliding, and the first conductive portion 31 and the second conductive portion 32 need to bend independently.

FIG. 4 shows a cross section of a fourth embodiment of the substrate inspection contact 3 according to the present invention.
In the substrate inspection contact 3 of the fourth embodiment, the second conductive portion 32 is formed from two cylindrical members having different diameters, and a spring portion 327 is formed on the peripheral wall of the cylindrical member that is in conductive contact with the inspection point. Has been.
The second conductive member 32 is formed with a cylindrical member 321 and a second cylindrical member 328 so as to extend from the tip thereof. The second cylindrical member 328 is formed so that the inner diameter of the cylindrical member 321 and the outer diameter of the second cylindrical member 328 are substantially the same, and these are fixed by welding (welding location 325).
By forming in this way, even when the inspection point is smaller, the contact can be made with high accuracy.
The second cylindrical member 328 plays a role in preventing the first conductive portion 31 from coming off.

Next, the operation of the substrate inspection jig according to the present invention will be described.
FIG. 5 is a cross-sectional view showing a usage state of the substrate inspection jig according to the present invention. In FIG. 5, the substrate inspection contact 3 is in conductive contact with the electrode part 2, the first conductive part 31 is in conductive contact with the first electrode part 21, and the second conductive part 32 is the second electrode part. 22 is in conductive contact.
The inspection points shown in FIG. 5 illustrate hemispherical inspection points such as solder bumps.

As shown in FIG. 5, when the substrate inspection contact 3 comes into contact with the inspection point P set on the substrate S, first, the spring portion 323 formed in the second conductive portion 32 contracts. In the board inspection contact 3, the spring part 323 of the second conductive part 32 contracts, and the first conductive part 31 is in conductive contact with the inspection point P. At this time, the first conductive portion 31 and the second conductive portion 32 are brought into conductive contact with the inspection point P independently.
Even if the first conductive portion 31 and the second conductive portion 32 are in conductive contact with the inspection point P, the board inspection contact 3 is further pressed against the inspection point P relatively. Then, since the first conductive portion 31 and the second conductive portion 32 have flexibility, the board inspection contact 3 is in a curved state as indicated by a curved line A in FIG.
As described above, the substrate inspection contact 3 has a curved shape, thereby pressing the electrode portion 2 and the inspection point P. For this reason, the board inspection contact 3 is in stable conductive contact with the inspection point P and the electrode portion 2.

(A) is a schematic sectional drawing of the board | substrate inspection jig | tool which concerns on this invention, (b) is a schematic sectional drawing of one Embodiment of the electrode part of the jig | tool for board | substrate inspection concerning this invention. It is a schematic sectional drawing of 2nd embodiment of the jig | tool for board | substrate inspection which concerns on this invention. It is a schematic sectional drawing of 3rd embodiment of the jig | tool for board | substrate inspection which concerns on this invention. It is a schematic sectional drawing of 4th embodiment of the jig | tool for board | substrate inspection which concerns on this invention. It is a schematic sectional drawing which shows operation | movement of one Embodiment of the jig | tool for board | substrate inspection which concerns on this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Board inspection jig 2 ... Electrode part 3 ... Board inspection contact 31 ... First conductive part 32 ... Second conductive part 4 .... Holding body 41 ... Rear end side holding member 42 ... Front end side holding member

Claims (5)

A substrate inspection contact having a first conductive portion and a second conductive portion, each of which is press-contacted to a predetermined inspection point set on a wiring pattern of a substrate to be inspected and one is used for voltage measurement and the other is used for current application Because
The first conductive portion is formed in a rod shape having flexibility and conductivity,
The second conductive portion is formed by a cylindrical member having flexibility and conductivity while accommodating the first conductive portion therein, and the first conductive portion and an inner peripheral surface of the second conductive portion. A gap is formed between the entire length in the length direction,
On one side of the second conductive part, a spring part that slides in the axial length direction is provided on a part of the peripheral wall of the second conductive part,
When the first conductive portion and the second conductive portion of the substrate inspection contact are in contact with the inspection point, the spring portion first contracts, and then the substrate inspection contact is further pressed against the inspection point. The contact for inspection of a substrate, wherein the first conductive portion and the second conductive portion are each independently curved. The first conductive portion includes a first protrusion that protrudes in the minor axis direction,
The second conductive portion includes a second protruding portion protruding from the peripheral wall into the cylinder,
The contact for inspection of a substrate according to claim 1, wherein the first projecting portion and the second projecting portion prevent the first conductive portion from slipping out of the second conductive portion. 3. The substrate inspection contact according to claim 2, wherein the first projecting portion of the first conductive portion is formed at one end and the other end of a rod shape. The second conductive portion includes a cylindrical member having two outer diameters different from those of the other cylindrical member having an outer diameter substantially equal to the inner diameter of the one cylindrical member.
The other cylindrical member is connected in communication with one open end of the one cylindrical member,
3. A contact for inspecting a substrate according to claim 1 , wherein the spring portion is formed on a part of a peripheral wall on one side of the other cylindrical member. A substrate inspection jig in which one is pressed against a predetermined inspection point set on a wiring pattern of a substrate to be inspected, and the other is pressed against an electrode portion of an inspection apparatus for inspecting the electrical characteristics of the wiring pattern,
A contact for inspecting a substrate according to any one of claims 1 to 4,
A tip-side holding portion having a guide hole for guiding the tip of the substrate inspection contact to the inspection point;
A rear end holding portion having a guide hole for guiding the rear end of the substrate inspection contact to the electrode portion;
The substrate inspection jig, wherein the spring portion of the substrate inspection contact is formed so as to be disposed inside the front end side holding hole.

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