JP4796741B2 - Method for forming a layer containing metal, silicon, germanium and oxygen on a surface - Google Patents
Method for forming a layer containing metal, silicon, germanium and oxygen on a surface Download PDFInfo
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- JP4796741B2 JP4796741B2 JP2002590431A JP2002590431A JP4796741B2 JP 4796741 B2 JP4796741 B2 JP 4796741B2 JP 2002590431 A JP2002590431 A JP 2002590431A JP 2002590431 A JP2002590431 A JP 2002590431A JP 4796741 B2 JP4796741 B2 JP 4796741B2
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- 229910052760 oxygen Inorganic materials 0.000 title claims description 13
- 238000000034 method Methods 0.000 title claims description 12
- 239000001301 oxygen Substances 0.000 title claims description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 title description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title description 6
- 229910052710 silicon Inorganic materials 0.000 title description 6
- 239000010703 silicon Substances 0.000 title description 6
- 229910052732 germanium Inorganic materials 0.000 title description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 title description 4
- 229910052751 metal Inorganic materials 0.000 title description 3
- 239000002184 metal Substances 0.000 title description 3
- 150000001282 organosilanes Chemical class 0.000 claims description 26
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims description 13
- 229910000077 silane Inorganic materials 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 13
- 239000007789 gas Substances 0.000 claims description 4
- 125000000217 alkyl group Chemical group 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 230000001590 oxidative effect Effects 0.000 claims description 3
- 238000001179 sorption measurement Methods 0.000 claims 4
- 239000010410 layer Substances 0.000 description 57
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 11
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 7
- 239000002318 adhesion promoter Substances 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- -1 3-aminopropyl group Chemical group 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 239000003989 dielectric material Substances 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- VFUDMQLBKNMONU-UHFFFAOYSA-N 9-[4-(4-carbazol-9-ylphenyl)phenyl]carbazole Chemical group C12=CC=CC=C2C2=CC=CC=C2N1C1=CC=C(C=2C=CC(=CC=2)N2C3=CC=CC=C3C3=CC=CC=C32)C=C1 VFUDMQLBKNMONU-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- AWXGSYPUMWKTBR-UHFFFAOYSA-N 4-carbazol-9-yl-n,n-bis(4-carbazol-9-ylphenyl)aniline Chemical compound C12=CC=CC=C2C2=CC=CC=C2N1C1=CC=C(N(C=2C=CC(=CC=2)N2C3=CC=CC=C3C3=CC=CC=C32)C=2C=CC(=CC=2)N2C3=CC=CC=C3C3=CC=CC=C32)C=C1 AWXGSYPUMWKTBR-UHFFFAOYSA-N 0.000 description 2
- FJNCXZZQNBKEJT-UHFFFAOYSA-N 8beta-hydroxymarrubiin Natural products O1C(=O)C2(C)CCCC3(C)C2C1CC(C)(O)C3(O)CCC=1C=COC=1 FJNCXZZQNBKEJT-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- 101000837344 Homo sapiens T-cell leukemia translocation-altered gene protein Proteins 0.000 description 2
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 2
- 102100028692 T-cell leukemia translocation-altered gene protein Human genes 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000004305 biphenyl Substances 0.000 description 2
- 235000010290 biphenyl Nutrition 0.000 description 2
- 125000006267 biphenyl group Chemical group 0.000 description 2
- 239000000412 dendrimer Substances 0.000 description 2
- 229920000736 dendritic polymer Polymers 0.000 description 2
- 239000003599 detergent Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- UQEAIHBTYFGYIE-UHFFFAOYSA-N hexamethyldisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)C UQEAIHBTYFGYIE-UHFFFAOYSA-N 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 229910003437 indium oxide Inorganic materials 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- 229910052741 iridium Inorganic materials 0.000 description 2
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000009832 plasma treatment Methods 0.000 description 2
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical group CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910003849 O-Si Inorganic materials 0.000 description 1
- 229910003872 O—Si Inorganic materials 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 239000000075 oxide glass Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000037452 priming Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 239000003039 volatile agent Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
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Description
本発明は、表面に金属又はシリコン又はゲルマニウム及び酸素を含む層を形成する方法に関する。 The present invention relates to a method of forming a layer containing metal or silicon or germanium and oxygen on a surface.
有機電子発光ダイオード(OLED)を有する液晶ディスプレイのためのディスプレイ及びバックライトのような光学装置が大きく発展してきている。OLEDの重要な利点は、発光効率であり、これは、カンデラ/アンペア(candelas per amp)で示される外部量子効率、及び/又はルーメン/ワット(lumens per watt)で示される発光効率として、しばしば測定される。OLEDの発光効率は発光時のOLEDによる電力消費を決め、それによってポータブルデバイスの電池寿命を決めるため、特に重要である。 Optical devices such as displays and backlights for liquid crystal displays with organic electroluminescent diodes (OLEDs) have been greatly developed. An important advantage of OLEDs is the luminous efficiency, which is often measured as the external quantum efficiency , expressed in candelas per amp, and / or the luminous efficiency, expressed in lumens per watt. Is done. The luminous efficiency of the OLED is particularly important because it determines the power consumption by the OLED during light emission and thereby determines the battery life of the portable device.
OLEDの一般的な構造(図1で示される)は、ガラス基板(1)の内側表面がインジウム錫酸化物のような透明な導電体(2)によって被覆されており、その被膜上に電荷注入(3)、電荷輸送及び/又は発光(4)を行う有機及び/又は有機金属化学物質層、次にOLEDの第2電極を構成する1又は2以上の層(典型的には、アルミニウム層(6)でキャップされた非常に陽性である金属(5))からなる。 The general structure of OLED (shown in Figure 1) is a transparent conductor, such as inner surfaces of indium tin oxide glass substrate (1) (2) is covered by the charge injected onto the coating (3) an organic and / or organometallic chemical layer that performs charge transport and / or light emission (4), and then one or more layers (typically an aluminum layer ( made of metal is a very positive capped (5)) in 6).
インジウム錫酸化物層に隣接する二酸化ケイ素のような非常に薄い誘電層(例えば、1nm未満の厚さ)は、インジウム錫酸化物からの電荷注入を加速し、装置の発光効率を高める。しかしながら、特に、OLEDの製造で使用されるガラス基板、例えば、400×400mm2のような大面積にわたって薄い誘電層を均一に堆積させるのは非常に困難である。スパッタリングや電子ビーム蒸着のような従来の方法によってこのような堆積を試みた場合、一部の領域は1nmより厚い誘電層によって被覆される一方、他の領域は1nm未満の厚さの誘電層を有することになることがわかっている。誘電層の厚さのこの変化は、発光に要する電圧の変化を引き起こし、誘電層の厚みの増加に伴い電圧も増加する。電圧が増加すると、発光効率は減少し、したがってOLEDを使用するポータブル装置の電池寿命を減少させる。誘電層の厚さは少ないから、例えば、0.2nmのようなわずかな変化でもOLEDのパフォーマンスを大きく変化させる。 A very thin dielectric layer, such as silicon dioxide , adjacent to the indium tin oxide layer (eg, less than 1 nm thick ) accelerates charge injection from the indium tin oxide and increases the luminous efficiency of the device. However, in particular, a glass substrate used in manufacturing the OLED, for example, it is very difficult to uniformly sedimentary thin dielectric layer over a large area, such as 400 × 400 mm 2. Any attempt such deposited by conventional methods such as sputtering or electron beam evaporation, while some areas that will be covered by a thick dielectric layer than 1nm, the other areas of less than 1nm thick dielectric layer I know I will have it . This change in the thickness of the dielectric layer causes a change in voltage required for light emission, and the voltage increases as the thickness of the dielectric layer increases. As the voltage increases, the luminous efficiency decreases, thus reducing the battery life of portable devices using OLEDs. Since the thickness of the dielectric layer is small, a slight change such as 0.2 nm greatly changes the performance of the OLED.
本発明の第1の側面によれば、請求項1−7に記載される表面上に、シリコン(又はゲルマニウム)及び酸素を含む層を形成する方法が提供される。本発明の第2の側面によれば、請求項8及び9に記載される層を組み込んだ電子発光装置が提供される。
本発明の実施形態を、添付の概略図面を参照しながら以下に説明する。
According to a first aspect of the present invention there is provided a method of forming a layer comprising silicon (or germanium) and oxygen on a surface as defined in claims 1-7. According to a second aspect of the present invention there is provided an electroluminescent device incorporating a layer as claimed in
Embodiments of the present invention will be described below with reference to the accompanying schematic drawings.
本発明は、インジウム錫酸化物のような透明性導電性金属酸化物の表面に、非常に薄い均一な誘電材料層を提供することができる。誘電材料層の厚さは3nm未満、好ましくは2nm未満であり、非常に好ましくは1nm未満である。本発明を用いると、発光効率が1.5から2.3lm/Wに増加することを立証することができた。 The present invention can provide a very thin uniform dielectric material layer on the surface of a transparent conductive metal oxide such as indium tin oxide. The thickness of the dielectric material layer is less than 3 nm, preferably less than 2 nm, very preferably less than 1 nm. With the present invention, the luminous efficiency was able to demonstrate that increased from 1.5 to 2.3lm / W.
この新しい技術は、接着促進剤として一般的に使用されるために容易に入手可能である有機シラン材料のようなシリコン又はゲルマニウム含有有機材料の使用を含む。典型的な有機シラン接着促進剤は、3−アミノプロピル−トリエトキシシランであり、商標名VM651としてデュポン社より供給されている。他の材料、例えば、ヘキサメチルジシロキサンが代替品として使用され得る。 This new technology involves the use of organic materials containing silicon or germanium , such as organosilane materials that are readily available for general use as adhesion promoters. Typical organosilane adhesion promoter, 3-aminopropyl - a triethoxysilane, is supplied from the de Yupon Corporation under the tradename V M 651. Other materials such as hexamethyldisiloxane can be used as an alternative.
インジウム錫酸化物の表面は、第1に、接着促進剤としての従来からの使用態様である液体又は気体状態の有機シラン接着促進剤にさらされる。これにより、ケイ素−酸素結合を介してITO及びガラスの表面に結合する有機シランの非常に薄く均一な層が得られる。有機シラン層は、また、有機基を含む。VM651の場合、この基は、3−アミノプロピル基である。このような層を有する表面は、しばしば「下塗り」と呼ばれる。 The surface of indium tin oxide is first exposed to a liquid or gaseous organosilane adhesion promoter, which is a traditional use as an adhesion promoter. This results in a very thin and uniform layer of organosilane that bonds to the ITO and glass surfaces via silicon-oxygen bonds . The organosilane layer also contains organic groups. In the case of VM651, this group is a 3-aminopropyl group. A surface having such a layer is often referred to as a “priming”.
「下塗り」基体は、その後処理する、すなわち有機シランの非存在下で酸素プラズマ又は酸素ラジカルを含むグロー放電のような酸化媒体で処理する。酸化媒体は酸化すべき吸着層のこの一部に酸素を加え、酸化させるため、この例では、有機部を、水及び二酸化炭素のような揮発性種に酸化し、ITOの表面に二酸化ケイ素の薄い層を残すことになろう。したがって、この技法は誘電材料の薄い均一層を生成する容易な手段を提供する。この層は、水素及び炭素のような他の成分を含むことができるため、シリコン酸化物層は必ずしも化学量論的ではない。 "Subbing" substrate is subsequently processed, i.e. treated with an oxidizing medium such as a glow discharge comprising oxygen plasma or oxygen radicals in the absence of an organic silane. The oxidation medium adds oxygen to this part of the adsorbed layer to be oxidized and oxidizes, so in this example, the organic part is oxidized to water and volatile species such as carbon dioxide, and the surface of ITO is coated with silicon dioxide . It would be to leave a thin layer. This technique therefore provides an easy means of producing a thin uniform layer of dielectric material. This layer, because it is possible to contain other components such as hydrogen and carbon, silicon oxide layer is not necessarily stoichiometric.
その化学的構造から有機シラン接着促進剤は、適切な基板上に単一層を製造するものとしばしば述べられている。本発明者らは、これは必ずしもあてはまらないことを確認した。 Because of its chemical structure, organosilane adhesion promoters are often described as producing a single layer on a suitable substrate. The present inventors have, it was confirmed that this is not the case necessarily.
より詳細を記載したプロセスの例が次に挙げられ、本発明にしたがって製造された装置の断面図の例が図2に示される。インジウム錫酸化物の層(2)で被覆されたガラス基板(1)、これは、例えば、米国のアプライドフィルム、又は台湾のメルクディスプレイテクノロジーのようないくつかのサプライヤーから購入することができるが、標準の洗剤及びフォトリソグラフィープロセスを用いて洗浄され、パターン化される。 An example of a process that describes in more detail is given below, and an example of a cross-sectional view of an apparatus made according to the present invention is shown in FIG. A glass substrate (1) coated with a layer of indium tin oxide (2), which can be purchased from several suppliers such as, for example, US Applied Film or Taiwan Merck Display Technology, It is cleaned and patterned using standard detergents and photolithography processes .
フォトリソグラフィープロセスの最終段階の後、すなわち、フォトレジストのはく離後、基板は洗剤中で洗浄され、脱イオン水中で完全に洗浄、乾燥され、105℃で30分間焼成される。冷却後、基板は、メタノール(95ml)、水(5ml)及び3−アミノプロピル−トリエトキシシラン(3滴)からなる溶液でスピンコート(30秒間で2000rpm)により下塗りされ、次いで105℃で乾燥窒素雰囲気中で必要とされるまで保管する。 After the final stage of the photolithographic process, i.e., after stripping the photoresist, the substrate is washed in detergent, thoroughly washed with deionized water, dried and calcined at 105 ° C. 30 min. After cooling, the substrate is selected from the group consisting of methanol (95 ml), water (5ml) and 3-aminopropyl - primed by (2000 rpm in 30 seconds) by spin coating at solvent solution consisting of triethoxysilane (3 drops), then with 105 ° C. Store in dry nitrogen atmosphere until needed .
OLED装置の形成の直前に、下塗り基板はケイ素及び酸素からなる、又は含む薄い層(10)を形成するために酸素プラズマ中にさらされる。例として、エミテックK1050Xプラズマエッチング装置を2分間、100ワットで稼動して、許容できる処理ができた。基板は、次いで、真空蒸着システムに直ちに移送され、そこでは、例えば、次の層が連続的に蒸着される。すなわち、4,4−ビス[N−(1−ナフチル)−N−フェニル−アミノ]ジフェニル(NPD)(3)及びトリス(8−ヒドロキシ−キノラト)アルミニウム(AlQ)(4)、フッ化リチウム(5)及びアルミニウム(6)であり、それぞれ、厚さ50、50、1.5及び150nmである。比較のため、有機層を有しない、及び有機シラン層を有するが有機シランの酸化処理がなされていない、類似のOLED装置が製造された。外部量子効率(cd/A)及び発光効率(lm/W)が測定された。下の表1に示されている。 Just before the formation of OLED devices, primed substrate is exposed to an oxygen plasma to form consisting of silicon and oxygen, or a thin electroformed layer (10). As an example, an Emitech K1050X plasma etcher was run at 100 watts for 2 minutes, resulting in acceptable processing. The substrate is then immediately transferred to a vacuum deposition system where, for example, the next layer is continuously deposited. That is, 4,4-bis [N-(1-naphthyl) -N- phenyl - amino] diphenyl (NPD) (3) and tri scan (8-hydroxy - quinolato) aluminum (AlQ) (4), lithium fluoride (5) and aluminum (6) with thicknesses of 50, 50, 1.5 and 150 nm, respectively. For comparison, a similar OLED device was produced that did not have an organic layer and that had an organic silane layer but no organosilane oxidation treatment. External quantum efficiency ( cd / A ) and luminous efficiency (lm / W) were measured . It is shown in Table 1 below.
他の酸化有機シラン層の利点は、酸化有機シラン層を有しない装置に比較してこれを有する装置のOLED装置特性の再現性がよいことである。例として、酸化有機シラン層無しで製造された3つの装置の電流−電圧曲線が図3に示される。酸化有機シラン層を有する3つの装置の曲線が図4に示されている。両者において、この特性を与えるために使用される装置の構造はITO/NPD/ALQ/LiF/Alであった。 The advantage of other oxidized organic silane layers is that the reproducibility of the OLED device characteristics of a device having this is better than a device having no oxidized organic silane layer. As an example, the current-voltage curves of three devices made without an oxidized organosilane layer are shown in FIG. The curves for three devices with an oxidized organosilane layer are shown in FIG. In both, the structure of the device used to impart this characteristic ITO / NPD / ALQ / LiF / Al were Tsu der.
他の全ての点においては全く同じ方法で製造された装置にもかかわらず、酸化有機シラン層で作られた装置の電流−電圧曲線には非常に少ない広がりが見られる。 Despite the device manufactured in exactly the same way in all other respects, the current-voltage curve of the device made with the oxidized organosilane layer shows very little broadening.
有機シラン処理及び標準プラズマ処理ITO/NPD/AlQ/LiF/Al装置のNPD層(50nmから250nmの範囲)の厚さの影響が図5及び図6に示される。 The influence of the thickness of the NPD layer (in the range of 50 nm to 250 nm) of the organosilane treated and standard plasma treated ITO / NPD / AlQ / LiF / Al equipment is shown in FIGS.
図5は、有機シラン処理又は標準プラズマ処理装置のNPD厚さの変化に伴う電流密度と電圧の関係を示している。NPD厚さが増加するにしたがって電流は減少するが、減少はプラズマだけの装置のほうがより顕著である。図5の有機シラン処理装置で示されるNPD厚さに対する減少した感度は図6にも反映され、ここでは、有機シラン処理装置に比較して、標準プラズマ処理装置においては、NPD厚さの増加に伴い30cd/m2に必要な電圧がより顕著に増加することが示されている。これは、有機シラン層が正孔注入の効率を改良することを示している。有機シラン処理装置に比較して、標準プラズマ処理装置の場合の大きなNPD厚さでの高い電圧要求は、より低い発光結果にも示される。 FIG. 5 shows the relationship between the current density and the voltage accompanying the change in the NPD thickness of the organosilane treatment or standard plasma treatment apparatus. The current decreases as the NPD thickness increases, but the decrease is more pronounced for plasma-only devices. The reduced sensitivity to the NPD thickness shown in the organosilane processing apparatus of FIG. 5 is also reflected in FIG. 6, where the NPD thickness is increased in the standard plasma processing apparatus compared to the organosilane processing apparatus. Accordingly, it is shown that the voltage required for 30 cd / m 2 increases more remarkably. This indicates that the organosilane layer improves the efficiency of hole injection. Compared to organosilane processing equipment , the high voltage requirement at large NPD thickness in the case of standard plasma processing equipment is also shown in lower light emission results.
有機シランプロセスのさらなる比較例は、イリジウムデンドリマー材料をドープしたホストからなる発光層を有するOLEDを使用して提供される。特に、発光層は、4,4’−N、N’−ジカルバゾール−ビフェニル(CBP)ホスト中の20重量%第1世代イリジウムデンドリマー(G1IrDen)、又は4,4’,4’’−トリ(N−カルバゾリル)トリフェニルアミン(TCTA)ホスト中の13重量%G1IrDenのどちらかの混合物からなる。こうした混合物の溶液は、クロロホルム及びトルエンをそれぞれ使用して作られ、その後、有機シラン処理、又は標準プラズマ処理のITO基板にスピンコートされる。その後、電子輸送層(2,2’,2’’−(1,3,5−フェニレン)トリス[1−フェニル−1H−ベンズイミダゾリル](TPBI)50nm及びカソード層(LiF/Al)は、加熱蒸発により蒸着される。図7は,CBP及びTCTAホスト材料両方の標準プラズマ処理装置と比較した有機シラン処理装置の寿命における改良を示す。 A further comparative example of the organic silane process is provided using the OLED having a host or Ranaru emitting layer doped with iridium dendrimer material. In particular, the light emitting layer, 4,4'-N, N'-dicarbazole - biphenyl (CBP) 20 wt% first generation iridium dendrimer in the host (G1IrDen), or 4,4 ', 4''- tri ( consists N- carbazolyl) either a mixture of 13 wt% G1IrDen in triphenylamine (TCTA) host. The solution of such mixtures are made using chloroform and toluene, respectively, then, the organic silane treatment, or is spun on ITO substrate of a standard plasma treatment. Then, an electron transport layer (2, 2 ', 2''- (1,3,5-phenylene) tris [1-phenyl--1H- Ben's Imida zone Lil] (TPBI) 50 nm and a cathode layer (LiF / Al) is Ru are deposited by thermal evaporation. Figure 7 shows an improvement in lifetime of the organic silane treatment apparatus as compared to standard plasma processing apparatus both CBP and TCTA host material.
上記実施例の発光層に使用される有機部に加えて、本発明の方法により提供される有機シラン層は、高分子発光層に使用できることが考えられる。このような高分子を含む好ましい電子発光装置は、ITO/TOS/PFO/Ca/Al(青色発光体)及びITO/TOS/(PFO+5%BT)/Ca/Al(黄色発光体)であり、ここで、TOSは処理済有機シラン層であり、PFOはポリ[9,9−ジ−(2−エチルヘキシル)フルオレニル−2,7’]−ジイル])であり、BTはポリ[(9,9−ジ−n−オクチルフルオレニル−2,7’−ジイル)−co−(1,4−ベンゾ{2,1’,3−チアダゾール})]である。 In addition to the organic part used in the light-emitting layer of the above-described embodiment, an organosilane layer provided by the method of the invention it is believed to be usable in the polymer light-emitting layer. Such preferred electroluminescent device containing polymer, be ITO / TOS / PFO / Ca / Al ( blue emitter) and ITO / TOS / (PFO + 5 % BT) / Ca / Al ( yellow emitter) , wherein, TOS is processed organosilane layer, PFO is poly [9,9-di - (2-ethylhexyl) fluorenyl-2,7 '] - a di-yl]), BT is poly [(9 , 9-di-n-octylfluorenyl-2,7′-diyl) -co- (1,4-benzo {2,1 ′, 3-thiadazole})].
適切な有機シランは、式(X)3SiRを有する炭素含有化合物である。ここで、Xは、OEt,OMe又はClのような加水分解基であり、Rは、NH2のような官能基を選択的に含むアルキル鎖のような有機部分である。Rは、酸化し揮発性種とならなければならず、したがって、Rは次の要素、C,H,N,O及びSを含み得る。知られているように、この式を有するオルガノシランは、ITOに化学的に吸着して、O−Si結合によって結合された単層を形成することができる。 Suitable organosilanes are carbon-containing compounds having the formula (X) 3 SiR. Here, X is a hydrolyzable group such as OEt, OMe or Cl, and R is an organic moiety such as an alkyl chain that selectively contains a functional group such as NH 2 . R must oxidize to a volatile species , so R can include the following elements: C, H, N, O, and S. As is known, organosilanes having this formula can be chemically adsorbed on ITO to form a monolayer bonded by O-Si bonds .
使用される条件に依存して、複数の層が最初の層の表面上に形成され得るが、これは必ずしも欠点とはならない。しかしながら、この層は好ましくは12層の単分子層より薄い。
シロキサンも使用できる。これらは、次式を有する。
Siloxane can also be used. These have the following formula.
良好な誘電体である不揮発性酸化物(例えば、GeO x 、AlO x 、TiO x 等)を形成する要素Zを含み、分子の残りが酸化されて、揮発性化合物を形成する限り、有機シラン以外の化合物もまた好適である。好ましいその化合物も、好ましくは、均一な薄膜を形成するためにアノード表面に化学的又は物理的に吸着されよう。有機シランのように、有機チタン酸塩は、ITO上に薄膜を形成できる接着促進剤として知られている。生成する誘電膜の性質は、望ましい化合物を選択するための明らかに1つの基準となる。 Is a good dielectric volatile oxides (e.g., GeO x, AlO x, TiO x , etc.) viewed including the element Z to form a remainder of the molecule is oxidized, so long as to form a volatile compound, an organic silane Other compounds are also suitable. The preferred compound will also preferably be chemically or physically adsorbed to the anode surface to form a uniform thin film. As organosilane, organotitanate, known as adhesion promoters capable of forming a thin film on ITO. The nature of the dielectric film produced is clearly one criterion for selecting the desired compound.
ITO上の有機シランの単分子層の形成はよく知られており、自己集合技術一般はよく知られている。電子発光装置の製造における有機シランの使用例があり、例えば、米国特許5677545では、配向層を形成するために、固定基を有するポリマーがITO上に堆積される。日本特許06325345では、有機シラン化合物がカソード層上に化学的に吸収され、次いで、発光材料がその上に堆積される。しかしながら、これらの全てのケースでは、有機シラン化合物が装置に残留し、このため、本発明のものと異なる組成物であり、異なる目的を有する。 Formation of monomolecular layers of an organic silane on ITO are well known, self-assembled coupling techniques generally are well known. There is an example use of organic silane in the manufacture of electroluminescent devices, for example, in U.S. Patent 5677545, in order to form an alignment layer, a polymer having a fixed group is deposited on the ITO. In Japanese Patent 06325345, an organosilane compound is chemically absorbed on the cathode layer, and then a luminescent material is deposited thereon . However, in all these cases, the organosilane compound remains in the device and is therefore a composition different from that of the present invention and has a different purpose.
上記実施態様においては、誘電材料が形成される表面はITOからなる実質的に透明な導電性アノードであるが、もし望むなら、酸化錫、酸化インジウム、酸化亜鉛又は亜鉛ドープ酸化インジウムなどの他の材料が代替として使用され得る。 In the above embodiment, the surface of the dielectric material is formed is substantially transparent conductive anode made of ITO, if desired, tin oxide, indium oxide, zinc oxide or zinc-doped indium oxide other such Materials can be used as an alternative.
上記実施態様において、グロー放電用ガスは酸素であった。例えば、プラズマ中で酸素ラジカルを供給する亜酸化窒素のような他の酸化媒体が代替として使用され得る。 In the above embodiment , the glow discharge gas was oxygen . For example, other oxidizing media, such as nitrous oxide supply of oxygen radicals in the plasma may be used as an alternative.
1 ガラス基板
2 インジウム錫酸化物(ITO)層
3 4,4−ビス[N−(1−ナフチル)−N−フェニル−アミノ]ジフェニル
(NPD)層
4 トリス(8−ヒドロキシ−キノラト)アルミニウム(AlQ)層
5 フッ化リチウム層
6 アルミニウム層
10 ケイ素及び酸素を含む薄い層
1
Claims (4)
a.基板上に形成された透明導電性アノード表面を、有機シランを含む液体又は気体にさらすことにより、前記表面上に11層以下の単分子層吸着層を形成し、
b.前記吸着層が形成された前記表面を前記液体又は気体から離脱させ、
c.前記吸着層を酸化媒体にさらすことによって、前記吸着層を酸化有機シランを含む層に変換し、2nm未満の厚さの前記誘電体層を形成することを含み、
ここで、有機シランは、一般式(X)3SiRを充足し、この式において、Xは加水分解性基であり、Rは有機部である電子発光装置を製造する方法。A layer containing an oxidized organic silane is formed on the surface of the transparent conductive anode formed on the substrate, and a dielectric layer that promotes injection of holes from the anode to the light emitting layer is formed between the anode and the light emitting layer. A method of manufacturing an electroluminescent device comprising forming between,
a. By exposing the surface of the transparent conductive anode formed on the substrate to a liquid or gas containing organosilane, a monomolecular layer adsorption layer of 11 layers or less is formed on the surface,
b. Separating the surface on which the adsorption layer is formed from the liquid or gas;
c. Converting the adsorption layer to a layer comprising oxidized organosilane by exposing the adsorption layer to an oxidizing medium to form the dielectric layer having a thickness of less than 2 nm;
Here, the organic silane satisfies the general formula (X) 3 SiR, in which X is a hydrolyzable group, and R is an organic part.
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GB0111751.4 | 2001-05-14 | ||
GBGB0111751.4A GB0111751D0 (en) | 2001-05-14 | 2001-05-14 | A method of providing a layer including a metal or silicon or germanium and oxygen on a surface |
GBGB0208230.3A GB0208230D0 (en) | 2001-05-14 | 2002-04-10 | A method of providing a layer including a metal or silicon or germanium and oxygen on a surface |
GB0208230.3 | 2002-04-10 | ||
PCT/GB2002/002181 WO2002093662A2 (en) | 2001-05-14 | 2002-05-13 | A method of providing a layer including a metal or silicon or germanium and oxygen on a surface |
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2001
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