JP4684619B2 - Method for preparing silica-based coating forming coating solution and silica-based coating forming coating solution - Google Patents
Method for preparing silica-based coating forming coating solution and silica-based coating forming coating solution Download PDFInfo
- Publication number
- JP4684619B2 JP4684619B2 JP2004308222A JP2004308222A JP4684619B2 JP 4684619 B2 JP4684619 B2 JP 4684619B2 JP 2004308222 A JP2004308222 A JP 2004308222A JP 2004308222 A JP2004308222 A JP 2004308222A JP 4684619 B2 JP4684619 B2 JP 4684619B2
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- Prior art keywords
- silica
- forming
- based film
- coating
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims description 122
- 239000000377 silicon dioxide Substances 0.000 title claims description 61
- 238000000576 coating method Methods 0.000 title claims description 60
- 239000011248 coating agent Substances 0.000 title claims description 59
- 238000000034 method Methods 0.000 title claims description 12
- 238000006243 chemical reaction Methods 0.000 claims description 21
- 239000007788 liquid Substances 0.000 claims description 20
- -1 silane compound Chemical class 0.000 claims description 16
- 238000006460 hydrolysis reaction Methods 0.000 claims description 15
- 239000007795 chemical reaction product Substances 0.000 claims description 14
- 239000000047 product Substances 0.000 claims description 12
- 239000007787 solid Substances 0.000 claims description 12
- 239000003377 acid catalyst Substances 0.000 claims description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 11
- 239000003960 organic solvent Substances 0.000 claims description 10
- 229910000077 silane Inorganic materials 0.000 claims description 10
- 229920001515 polyalkylene glycol Polymers 0.000 claims description 9
- 230000003301 hydrolyzing effect Effects 0.000 claims description 6
- 150000005622 tetraalkylammonium hydroxides Chemical class 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 238000002156 mixing Methods 0.000 claims description 2
- 239000000243 solution Substances 0.000 description 48
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 15
- 125000000217 alkyl group Chemical group 0.000 description 13
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 12
- 125000004432 carbon atom Chemical group C* 0.000 description 11
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 10
- 125000001183 hydrocarbyl group Chemical group 0.000 description 8
- 230000007062 hydrolysis Effects 0.000 description 7
- 239000002904 solvent Substances 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 5
- 239000002253 acid Substances 0.000 description 5
- 238000007654 immersion Methods 0.000 description 5
- 125000001424 substituent group Chemical group 0.000 description 5
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 5
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 4
- 229910017604 nitric acid Inorganic materials 0.000 description 4
- 150000007524 organic acids Chemical class 0.000 description 4
- LEEANUDEDHYDTG-UHFFFAOYSA-N 1,2-dimethoxypropane Chemical compound COCC(C)OC LEEANUDEDHYDTG-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 150000005846 sugar alcohols Polymers 0.000 description 3
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 3
- FFWSICBKRCICMR-UHFFFAOYSA-N 5-methyl-2-hexanone Chemical compound CC(C)CCC(C)=O FFWSICBKRCICMR-UHFFFAOYSA-N 0.000 description 2
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 2
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 2
- 150000002443 hydroxylamines Chemical class 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 2
- 150000007522 mineralic acids Chemical class 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229920001451 polypropylene glycol Polymers 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 125000000542 sulfonic acid group Chemical group 0.000 description 2
- 150000003460 sulfonic acids Chemical class 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 2
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 2
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 1
- VPBZZPOGZPKYKX-UHFFFAOYSA-N 1,2-diethoxypropane Chemical compound CCOCC(C)OCC VPBZZPOGZPKYKX-UHFFFAOYSA-N 0.000 description 1
- GDXHBFHOEYVPED-UHFFFAOYSA-N 1-(2-butoxyethoxy)butane Chemical compound CCCCOCCOCCCC GDXHBFHOEYVPED-UHFFFAOYSA-N 0.000 description 1
- HQSLKNLISLWZQH-UHFFFAOYSA-N 1-(2-propoxyethoxy)propane Chemical compound CCCOCCOCCC HQSLKNLISLWZQH-UHFFFAOYSA-N 0.000 description 1
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 1
- RWNUSVWFHDHRCJ-UHFFFAOYSA-N 1-butoxypropan-2-ol Chemical compound CCCCOCC(C)O RWNUSVWFHDHRCJ-UHFFFAOYSA-N 0.000 description 1
- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 1
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- DJCYDDALXPHSHR-UHFFFAOYSA-N 2-(2-propoxyethoxy)ethanol Chemical compound CCCOCCOCCO DJCYDDALXPHSHR-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- WBIQQQGBSDOWNP-UHFFFAOYSA-N 2-dodecylbenzenesulfonic acid Chemical compound CCCCCCCCCCCCC1=CC=CC=C1S(O)(=O)=O WBIQQQGBSDOWNP-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- YEYKMVJDLWJFOA-UHFFFAOYSA-N 2-propoxyethanol Chemical compound CCCOCCO YEYKMVJDLWJFOA-UHFFFAOYSA-N 0.000 description 1
- JZOPEAAYHHDTRJ-UHFFFAOYSA-N 3-(2-methoxyethoxy)propoxy-propylsilane Chemical compound C(CC)[SiH2]OCCCOCCOC JZOPEAAYHHDTRJ-UHFFFAOYSA-N 0.000 description 1
- RVDMGSOWQHKICR-UHFFFAOYSA-N 3-(2-methoxyethoxy)propoxysilane Chemical compound COCCOCCCO[SiH3] RVDMGSOWQHKICR-UHFFFAOYSA-N 0.000 description 1
- LDMRLRNXHLPZJN-UHFFFAOYSA-N 3-propoxypropan-1-ol Chemical compound CCCOCCCO LDMRLRNXHLPZJN-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- SCHYFEVPIBKUNB-UHFFFAOYSA-N CCCCCO[SiH](OCC)OCC Chemical compound CCCCCO[SiH](OCC)OCC SCHYFEVPIBKUNB-UHFFFAOYSA-N 0.000 description 1
- PBDYQPOAXBEPJI-UHFFFAOYSA-N CCCCO[SiH](OC)OC Chemical compound CCCCO[SiH](OC)OC PBDYQPOAXBEPJI-UHFFFAOYSA-N 0.000 description 1
- CEYKWTJRCMKNKX-UHFFFAOYSA-N CCCO[SiH](OCC)OCC Chemical compound CCCO[SiH](OCC)OCC CEYKWTJRCMKNKX-UHFFFAOYSA-N 0.000 description 1
- UGJLGGUQXBCUIA-UHFFFAOYSA-N CCO[SiH](OC)OC Chemical compound CCO[SiH](OC)OC UGJLGGUQXBCUIA-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- AVXURJPOCDRRFD-UHFFFAOYSA-N Hydroxylamine Chemical compound ON AVXURJPOCDRRFD-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 1
- 229960000583 acetic acid Drugs 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 125000002947 alkylene group Chemical group 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- 125000005428 anthryl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C3C(*)=C([H])C([H])=C([H])C3=C([H])C2=C1[H] 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- OAKGITOBDKUFBR-UHFFFAOYSA-N butoxy-butyl-ethoxy-methoxysilane Chemical compound CCCCO[Si](OCC)(OC)CCCC OAKGITOBDKUFBR-UHFFFAOYSA-N 0.000 description 1
- HUUOQEMAQQPKGS-UHFFFAOYSA-N butoxy-ethoxy-ethyl-methoxysilane Chemical compound CCCCO[Si](CC)(OC)OCC HUUOQEMAQQPKGS-UHFFFAOYSA-N 0.000 description 1
- YIGRUUCTKSBMGE-UHFFFAOYSA-N butoxy-ethoxy-methoxy-methylsilane Chemical compound CCCCO[Si](C)(OC)OCC YIGRUUCTKSBMGE-UHFFFAOYSA-N 0.000 description 1
- CCBRDEWXSJFAMO-UHFFFAOYSA-N butoxy-ethoxy-methoxy-propylsilane Chemical compound CCCCO[Si](CCC)(OC)OCC CCBRDEWXSJFAMO-UHFFFAOYSA-N 0.000 description 1
- GXVZLEWQJBFJRL-UHFFFAOYSA-N butoxy-ethoxy-propoxysilane Chemical compound CCCCO[SiH](OCC)OCCC GXVZLEWQJBFJRL-UHFFFAOYSA-N 0.000 description 1
- XGZGKDQVCBHSGI-UHFFFAOYSA-N butyl(triethoxy)silane Chemical compound CCCC[Si](OCC)(OCC)OCC XGZGKDQVCBHSGI-UHFFFAOYSA-N 0.000 description 1
- SXPLZNMUBFBFIA-UHFFFAOYSA-N butyl(trimethoxy)silane Chemical compound CCCC[Si](OC)(OC)OC SXPLZNMUBFBFIA-UHFFFAOYSA-N 0.000 description 1
- RUCGYSQSVJNDCX-UHFFFAOYSA-N butyl(tripentoxy)silane Chemical compound CCCCCO[Si](CCCC)(OCCCCC)OCCCCC RUCGYSQSVJNDCX-UHFFFAOYSA-N 0.000 description 1
- GNRBSDIBKIHSJH-UHFFFAOYSA-N butyl(tripropoxy)silane Chemical compound CCCC[Si](OCCC)(OCCC)OCCC GNRBSDIBKIHSJH-UHFFFAOYSA-N 0.000 description 1
- AAVHUXGAYVEBMM-UHFFFAOYSA-N butyl-[3-(2-methoxyethoxy)propoxy]silane Chemical compound CCCC[SiH2]OCCCOCCOC AAVHUXGAYVEBMM-UHFFFAOYSA-N 0.000 description 1
- BRKLXJLNOMYEPC-UHFFFAOYSA-N butyl-diethoxy-methoxysilane Chemical compound CCCC[Si](OC)(OCC)OCC BRKLXJLNOMYEPC-UHFFFAOYSA-N 0.000 description 1
- JFPQZHIIXIHEEG-UHFFFAOYSA-N butyl-methoxy-dipentoxysilane Chemical compound CCCCCO[Si](CCCC)(OC)OCCCCC JFPQZHIIXIHEEG-UHFFFAOYSA-N 0.000 description 1
- CFGAMKNEOXZXAN-UHFFFAOYSA-N butyl-methoxy-dipropoxysilane Chemical compound CCCC[Si](OC)(OCCC)OCCC CFGAMKNEOXZXAN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- AWQTZFCYSLRFJO-UHFFFAOYSA-N diethoxy(methoxy)silane Chemical compound CCO[SiH](OC)OCC AWQTZFCYSLRFJO-UHFFFAOYSA-N 0.000 description 1
- KWHPGQVFPWGFMG-UHFFFAOYSA-N diethoxy-ethyl-methoxysilane Chemical compound CCO[Si](CC)(OC)OCC KWHPGQVFPWGFMG-UHFFFAOYSA-N 0.000 description 1
- VUVODZCTKMTLTH-UHFFFAOYSA-N diethoxy-methoxy-methylsilane Chemical compound CCO[Si](C)(OC)OCC VUVODZCTKMTLTH-UHFFFAOYSA-N 0.000 description 1
- PJKZHPDNDUQMNP-UHFFFAOYSA-N diethoxy-methoxy-propylsilane Chemical compound CCC[Si](OC)(OCC)OCC PJKZHPDNDUQMNP-UHFFFAOYSA-N 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- RXBGEIGGCCSMHC-UHFFFAOYSA-N dimethoxy(propoxy)silane Chemical compound CCCO[SiH](OC)OC RXBGEIGGCCSMHC-UHFFFAOYSA-N 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 229940060296 dodecylbenzenesulfonic acid Drugs 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- DMSVKKSBEJFTSD-UHFFFAOYSA-N ethoxy(dipropoxy)silane Chemical compound CCCO[SiH](OCC)OCCC DMSVKKSBEJFTSD-UHFFFAOYSA-N 0.000 description 1
- ZWAZSNJGQLYZHX-UHFFFAOYSA-N ethoxy-methoxy-methyl-propoxysilane Chemical compound CCCO[Si](C)(OC)OCC ZWAZSNJGQLYZHX-UHFFFAOYSA-N 0.000 description 1
- BHXIWUJLHYHGSJ-UHFFFAOYSA-N ethyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OCC BHXIWUJLHYHGSJ-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- SBRXLTRZCJVAPH-UHFFFAOYSA-N ethyl(trimethoxy)silane Chemical compound CC[Si](OC)(OC)OC SBRXLTRZCJVAPH-UHFFFAOYSA-N 0.000 description 1
- CZZBVPSIWUGVPZ-UHFFFAOYSA-N ethyl(tripentoxy)silane Chemical compound CCCCCO[Si](CC)(OCCCCC)OCCCCC CZZBVPSIWUGVPZ-UHFFFAOYSA-N 0.000 description 1
- KUCGHDUQOVVQED-UHFFFAOYSA-N ethyl(tripropoxy)silane Chemical compound CCCO[Si](CC)(OCCC)OCCC KUCGHDUQOVVQED-UHFFFAOYSA-N 0.000 description 1
- NKRGKSMCFNVANI-UHFFFAOYSA-N ethyl-methoxy-dipentoxysilane Chemical compound CCCCCO[Si](CC)(OC)OCCCCC NKRGKSMCFNVANI-UHFFFAOYSA-N 0.000 description 1
- HIPNKAPHGKUQDM-UHFFFAOYSA-N ethyl-methoxy-dipropoxysilane Chemical compound CCCO[Si](CC)(OC)OCCC HIPNKAPHGKUQDM-UHFFFAOYSA-N 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 235000011087 fumaric acid Nutrition 0.000 description 1
- 238000005227 gel permeation chromatography Methods 0.000 description 1
- 239000012362 glacial acetic acid Substances 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 229940093915 gynecological organic acid Drugs 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- TZMQHOJDDMFGQX-UHFFFAOYSA-N hexane-1,1,1-triol Chemical compound CCCCCC(O)(O)O TZMQHOJDDMFGQX-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229940098779 methanesulfonic acid Drugs 0.000 description 1
- QBCNIGWTXULERZ-UHFFFAOYSA-N methoxy(dipropoxy)silane Chemical compound CCCO[SiH](OC)OCCC QBCNIGWTXULERZ-UHFFFAOYSA-N 0.000 description 1
- GQDLEOAFQKIWSO-UHFFFAOYSA-N methoxy-dipentoxy-propylsilane Chemical compound CCCCCO[Si](CCC)(OC)OCCCCC GQDLEOAFQKIWSO-UHFFFAOYSA-N 0.000 description 1
- NPKCRFQGOQDCPM-UHFFFAOYSA-N methoxy-dipropoxy-propylsilane Chemical compound CCCO[Si](CCC)(OC)OCCC NPKCRFQGOQDCPM-UHFFFAOYSA-N 0.000 description 1
- SPRNSXHIODBTJQ-UHFFFAOYSA-N methoxy-methyl-dipentoxysilane Chemical compound CCCCCO[Si](C)(OC)OCCCCC SPRNSXHIODBTJQ-UHFFFAOYSA-N 0.000 description 1
- JRUSMKPBJTYUCR-UHFFFAOYSA-N methoxy-methyl-dipropoxysilane Chemical compound CCCO[Si](C)(OC)OCCC JRUSMKPBJTYUCR-UHFFFAOYSA-N 0.000 description 1
- BDJSOPWXYLFTNW-UHFFFAOYSA-N methyl 3-methoxypropanoate Chemical compound COCCC(=O)OC BDJSOPWXYLFTNW-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- QRBAVICMCJULJS-UHFFFAOYSA-N methyl(tripentoxy)silane Chemical compound CCCCCO[Si](C)(OCCCCC)OCCCCC QRBAVICMCJULJS-UHFFFAOYSA-N 0.000 description 1
- RJMRIDVWCWSWFR-UHFFFAOYSA-N methyl(tripropoxy)silane Chemical compound CCCO[Si](C)(OCCC)OCCC RJMRIDVWCWSWFR-UHFFFAOYSA-N 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 150000004028 organic sulfates Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- JGTNAGYHADQMCM-UHFFFAOYSA-N perfluorobutanesulfonic acid Chemical compound OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F JGTNAGYHADQMCM-UHFFFAOYSA-N 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 150000003139 primary aliphatic amines Chemical class 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 150000005619 secondary aliphatic amines Chemical class 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-L sulfite Chemical class [O-]S([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-L 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 150000003510 tertiary aliphatic amines Chemical class 0.000 description 1
- UCSBCWBHZLSFGC-UHFFFAOYSA-N tributoxysilane Chemical compound CCCCO[SiH](OCCCC)OCCCC UCSBCWBHZLSFGC-UHFFFAOYSA-N 0.000 description 1
- NBXZNTLFQLUFES-UHFFFAOYSA-N triethoxy(propyl)silane Chemical compound CCC[Si](OCC)(OCC)OCC NBXZNTLFQLUFES-UHFFFAOYSA-N 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-N triflic acid Chemical compound OS(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-N 0.000 description 1
- HQYALQRYBUJWDH-UHFFFAOYSA-N trimethoxy(propyl)silane Chemical compound CCC[Si](OC)(OC)OC HQYALQRYBUJWDH-UHFFFAOYSA-N 0.000 description 1
- OMBAQAOBNOSBNU-UHFFFAOYSA-N tripentoxy(propyl)silane Chemical compound CCCCCO[Si](CCC)(OCCCCC)OCCCCC OMBAQAOBNOSBNU-UHFFFAOYSA-N 0.000 description 1
- XJXSSNSCWGKDOW-UHFFFAOYSA-N tripentoxysilane Chemical compound CCCCCO[SiH](OCCCCC)OCCCCC XJXSSNSCWGKDOW-UHFFFAOYSA-N 0.000 description 1
- OZWKZRFXJPGDFM-UHFFFAOYSA-N tripropoxysilane Chemical compound CCCO[SiH](OCCC)OCCC OZWKZRFXJPGDFM-UHFFFAOYSA-N 0.000 description 1
- 238000005292 vacuum distillation Methods 0.000 description 1
Landscapes
- Formation Of Insulating Films (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Paints Or Removers (AREA)
Description
本発明は、シリカ系被膜形成用塗布液、及びシリカ系被膜形成用塗布液の調製方法に関する。 The present invention relates to a coating liquid for forming a silica-based film and a method for preparing a coating liquid for forming a silica-based film .
半導体デバイスの高集積化に対する要求は益々高まっており、例えばULSI(超超LSI)の高速化・低消費電力化を達成するための技術に対する関心は高い。中でも配線抵抗・容量の低減化は重要であり、そのために低誘電率の層間絶縁膜の開発が求められている。
下記特許文献1には、(a)トリアルコキシシランを有機溶媒中、酸触媒下で加水分解して得られる縮合物、及び(b)ポリアルキレングリコール及び/またはその末端アルキル化物を含有するシリカ系被膜形成用の塗布液を用いて、誘電率3.2以下のシリカ系被膜を形成する技術が記載されている。
In Patent Document 1 below, a silica system containing (a) a condensate obtained by hydrolyzing trialkoxysilane in an organic solvent under an acid catalyst, and (b) a polyalkylene glycol and / or a terminal alkylated product thereof. A technique for forming a silica-based film having a dielectric constant of 3.2 or less using a coating solution for forming a film is described.
しかしながら、上記特許文献1に記載されているシリカ系被膜形成用塗布液を用いて形成されるシリカ系被膜は、ホトレジスト層を剥離液で除去する工程や、ホトレジスト層をアッシング処理した後に剥離液を用いて処理する工程等で剥離液に接触すると、シリカ系被膜の膜減りや誘電率上昇が生じ易いという問題がある。 However, the silica-based film formed using the silica-based film-forming coating solution described in Patent Document 1 described above includes a step of removing the photoresist layer with a stripping solution, and a step of removing the stripping solution after ashing the photoresist layer. There is a problem that when the film is contacted with the stripping solution in the process of using it, the silica-based film tends to decrease in film thickness or increase in dielectric constant.
本発明は、上記事情に鑑みてなされたものであって、低誘電率であり、かつ剥離液による膜減りや誘電率の上昇が生じ難いシリカ系被膜を形成できるシリカ系被膜形成用塗布液を提供することを目的とする。 The present invention has been made in view of the above circumstances, and provides a coating solution for forming a silica-based coating film that has a low dielectric constant and can form a silica-based coating that is unlikely to cause film loss or increase in dielectric constant due to a stripping solution. The purpose is to provide.
上記の目的を達成するために、本発明のシリカ系被膜形成用塗布液は、(A)アルキルトリアルコキシシランおよびトリアルコキシシランからなるシラン化合物を加水分解反応させて得られる反応生成物、(B)ポリアルキレングリコールおよびその末端アルキル化物からなる群から選ばれる1種以上、および(C)テトラアルキルアンモニウムハイドロオキサイドを含むことを特徴とする。
また、本発明のシリカ系被膜形成用塗布液の調製方法は、水、および酸触媒の存在下で、アルキルトリアルコキシシランおよびトリアルコキシシランからなるシラン化合物を加水分解反応させて反応生成物を含む反応溶液を得た後、ポリアルキレングリコールおよびその末端アルキル化物からなる群から選ばれる1種以上、およびテトラアルキルアンモニウムハイドロオキサイドを加えて混合することを特徴とする。
To achieve the above object, a silica-based film-forming coating liquid of the present invention, the reaction product obtained by hydrolysis of a silane compound consisting of (A) an alkyltrialkoxysilane and trialkoxysilanes, (B 1) one or more selected from the group consisting of polyalkylene glycol and its terminal alkylated product , and (C) tetraalkylammonium hydroxide .
The method for preparing a coating solution for forming a silica-based film of the present invention includes a reaction product obtained by hydrolyzing a silane compound composed of alkyltrialkoxysilane and trialkoxysilane in the presence of water and an acid catalyst. After obtaining the reaction solution, one or more selected from the group consisting of polyalkylene glycol and its terminal alkylated product, and tetraalkylammonium hydroxide are added and mixed.
本発明のシリカ系被膜形成用塗布液によれば、低誘電率であり、かつ剥離液による膜減りや誘電率の上昇が生じ難いシリカ系被膜を形成することができる。 According to the coating liquid for forming a silica-based film of the present invention, it is possible to form a silica-based film that has a low dielectric constant and is unlikely to cause film reduction or increase in dielectric constant due to the stripping solution.
<(A)成分>
本発明のシリカ系被膜形成用塗布液には(A)成分として、アルキルトリアルコキシシランおよびトリアルコキシシランからなるシラン化合物を加水分解反応させて得られる反応生成物が含まれる。
前記加水分解反応によりシロキサンポリマーが生成するが、前記反応生成物には、低分子量の加水分解物、および加水分解反応と同時に分子間で脱水縮合反応を生じて生成された縮合物(シロキサンオリゴマー)も含まれ得る。本発明における(A)成分は、反応生成物がシロキサンポリマーの他に、かかる加水分解物または縮合物を含む場合、これらをも含む全体を指すものとする。
上記反応生成物の質量平均分子量(Mw)(ゲルパーミエーションクロマトグラフィーによるポリスチレン換算基準、以下同様。)は特に限定されないが、1000〜10000が好ましく、より好ましい範囲は1000〜5000である。
<(A) component>
The coating solution for forming a silica-based film of the present invention contains, as the component (A), a reaction product obtained by hydrolyzing a silane compound composed of alkyltrialkoxysilane and trialkoxysilane.
A siloxane polymer is produced by the hydrolysis reaction. The reaction product includes a low molecular weight hydrolyzate and a condensate (siloxane oligomer) produced by a dehydration condensation reaction between molecules simultaneously with the hydrolysis reaction. May also be included. The component (A) in the present invention refers to the entire product including these hydrolysates or condensates in addition to the siloxane polymer.
Although the mass average molecular weight (Mw) (polystyrene conversion standard by gel permeation chromatography, the same applies hereinafter) of the reaction product is not particularly limited, 1000 to 10000 is preferable, and a more preferable range is 1000 to 5000.
アルキルトリアルコキシシランとして、下記一般式(I)で表されるアルキルトリアルコキシシランから選ばれる1種以上を用いることが好ましい。
R1Si(OR2)a(OR3)b(OR4)c …(I)
式中、R1は炭素数1〜20の直鎖状または分岐状のアルキル基であり、好ましくは炭素数1〜4の直鎖状または分岐状のアルキル基である。
R2、R3、及びR4は、それぞれ独立に、炭素数1〜5の直鎖状または分岐状のアルキル基である。特に加水分解速度の点から炭素数1または2のアルキル基が好ましい。
a、b、及びcは、0≦a≦3、0≦b≦3、0≦c≦3であって、かつ
a+b+c=3の条件を満たす整数である。
As the alkyltrialkoxysilane, it is preferable to use one or more selected from alkyltrialkoxysilanes represented by the following general formula (I).
R 1 Si (OR 2 ) a (OR 3 ) b (OR 4 ) c (I)
In the formula, R 1 is a linear or branched alkyl group having 1 to 20 carbon atoms, preferably a linear or branched alkyl group having 1 to 4 carbon atoms.
R 2 , R 3 , and R 4 are each independently a linear or branched alkyl group having 1 to 5 carbon atoms. In particular, an alkyl group having 1 or 2 carbon atoms is preferred from the viewpoint of hydrolysis rate.
a, b, and c are integers that satisfy 0 ≦ a ≦ 3, 0 ≦ b ≦ 3, 0 ≦ c ≦ 3, and satisfy the condition of a + b + c = 3.
アルキルトリアルコキシシランの具体例としては、メチルトリメトキシシラン、メチルトリエトキシシラン、メチルトリプロポキシシラン、メチルトリペンチルオキシシラン、エチルトリメトキシシラン、エチルトリプロポキシシラン、エチルトリペンチルオキシシラン、プロピルトリメトキシシラン、プロピルトリエトキシシラン、プロピルトリペンチルオキシシラン、ブチルトリメトキシシラン、ブチルトリエトキシシラン、ブチルトリプロポキシシラン、ブチルトリペンチルオキシシラン、メチルモノメトキシジエトキシシラン、エチルモノメトキシジエトキシシラン、プロピルモノメトキシジエトキシシラン、ブチルモノメトキシジエトキシシラン、メチルモノメトキシジプロポキシシラン、メチルモノメトキシジペンチルオキシシラン、エチルモノメトキシジプロポキシシラン、エチルモノメトキシジペンチルオキシシラン、プロピルモノメトキシジプロポキシシラン、プロピルモノメトキシジペンチルオキシシラン、ブチルモノメトキシジブロポキシシラン、ブチルモノメトキシジペンチルオキシシラン、メチルメトキシエトキシプロポキシシラン、プロピルメトキシエトキシプロポキシシラン、ブチルメトキシエトキシプロポキシシラン、メチルモノメトキシモノエトキシモノブトキシシラン、エチルモノメトキシモノエトキシモノブトキシシラン、プロピルモノメトキシモノエトキシモノブトキシシラン、ブチルモノメトキシモノエトキシモノブトキシシランなどが挙げられる。中でも、加水分解速度の点から、メチルトリメトキシシラン、メチルトリエトキシシランが好ましい。 Specific examples of the alkyltrialkoxysilane include methyltrimethoxysilane, methyltriethoxysilane, methyltripropoxysilane, methyltripentyloxysilane, ethyltrimethoxysilane, ethyltripropoxysilane, ethyltripentyloxysilane, propyltrimethoxy Silane, propyltriethoxysilane, propyltripentyloxysilane, butyltrimethoxysilane, butyltriethoxysilane, butyltripropoxysilane, butyltripentyloxysilane, methylmonomethoxydiethoxysilane, ethylmonomethoxydiethoxysilane, propylmono Methoxydiethoxysilane, butylmonomethoxydiethoxysilane, methylmonomethoxydipropoxysilane, methylmonomethoxydipentyloxysilane , Ethyl monomethoxy dipropoxy silane, ethyl monomethoxy dipentyloxy silane, propyl monomethoxy dipropoxy silane, propyl monomethoxy dipentyl oxy silane, butyl monomethoxy dipropyloxy silane, butyl monomethoxy dipentyl oxy silane, methyl methoxy ethoxy propoxy silane , Propylmethoxyethoxypropoxysilane, butylmethoxyethoxypropoxysilane, methyl monomethoxymonoethoxymonobutoxysilane, ethylmonomethoxymonoethoxymonobutoxysilane, propylmonomethoxymonoethoxymonobutoxysilane, butylmonomethoxymonoethoxymonobutoxysilane, etc. Can be mentioned. Of these, methyltrimethoxysilane and methyltriethoxysilane are preferable from the viewpoint of hydrolysis rate.
トリアルコキシシランとして、下記一般式(II)で表されるトリアルコキシシランから選ばれる1種以上を用いることが好ましい。
HSi(OR5)d(OR6)e(OR7)f …(II)
R5、R6、及びR7は、それぞれ独立に、炭素数1〜5の直鎖状または分岐状のアルキル基である。特に加水分解速度の点から炭素数1または2のアルキル基が好ましい。
d、e、及びfは、0≦d≦3、0≦e≦3、0≦f≦3であって、かつ
d+e+f=3の条件を満たす整数である。
As the trialkoxysilane, it is preferable to use one or more selected from trialkoxysilanes represented by the following general formula (II).
HSi (OR 5 ) d (OR 6 ) e (OR 7 ) f (II)
R 5 , R 6 , and R 7 are each independently a linear or branched alkyl group having 1 to 5 carbon atoms. In particular, an alkyl group having 1 or 2 carbon atoms is preferred from the viewpoint of hydrolysis rate.
d, e, and f are integers that satisfy 0 ≦ d ≦ 3, 0 ≦ e ≦ 3, and 0 ≦ f ≦ 3, and satisfy the condition of d + e + f = 3.
トリアルコキシシランの具体例としては、トリメトキシシラン、トリエトキシシラン、トリプロポキシシラン、トリブトキシシラン、トリペンチルオキシシラン、ジメトキシモノエトキシシラン、ジエトキシモノメトキシシラン、ジプロポキシモノメトキシシラン、ジプロポキシモノエトキシシラン、ジブトキシモノメトキシシラン、ジペンチルオキシモノメトキシシラン、ジペンチルオキシモノエトキシシラン、ジペンチルオキシモノプロポキシシラン、メトキシエトキシプロポキシシラン、ブトキシエトキシプロポキシシラン、
モノプロポキシジメトキシシラン、モノプロポキシジエトキシシラン、モノブトキシジメトキシシラン、モノペンチルオキシジエトキシシランなどが挙げられる。中でも加水分解速度の点から、トリメトキシシラン、トリエトキシシランが好ましい
Specific examples of the trialkoxysilane include trimethoxysilane, triethoxysilane, tripropoxysilane, tributoxysilane, tripentyloxysilane, dimethoxymonoethoxysilane, diethoxymonomethoxysilane, dipropoxymonomethoxysilane, dipropoxymono Ethoxysilane, dibutoxymonomethoxysilane, dipentyloxymonomethoxysilane, dipentyloxymonoethoxysilane, dipentyloxymonopropoxysilane, methoxyethoxypropoxysilane, butoxyethoxypropoxysilane,
Examples thereof include monopropoxydimethoxysilane, monopropoxydiethoxysilane, monobutoxydimethoxysilane, and monopentyloxydiethoxysilane. Of these, trimethoxysilane and triethoxysilane are preferable from the viewpoint of hydrolysis rate.
上記反応生成物は、1種以上のアルキルトリアルコキシシランと1種以上のトリアルコキシシランとからなるシラン化合物を、酸触媒および水の存下で加水分解、縮合反応せしめる方法で得ることができる。
該加水分解反応に用いるシラン化合物の内の、アルキルトリアルコキシシランとトリアルコキシシランとの割合は、アルキルトリアルコキシシラン/トリアルコキシシランのモル比が10/90〜90/10の範囲が好ましく、より好ましい範囲は20/80〜80/20、さらに好ましい範囲は30/70〜70/30である。
The reaction product can be obtained by a method in which a silane compound composed of one or more alkyltrialkoxysilanes and one or more trialkoxysilanes is hydrolyzed and condensed in the presence of an acid catalyst and water.
The ratio of alkyltrialkoxysilane and trialkoxysilane in the silane compound used for the hydrolysis reaction is preferably such that the molar ratio of alkyltrialkoxysilane / trialkoxysilane is in the range of 10/90 to 90/10. A preferred range is 20/80 to 80/20, and a more preferred range is 30/70 to 70/30.
上記酸触媒は有機酸、無機酸のいずれも使用できる。
無機酸としては、硫酸、リン酸、硝酸、塩酸などが使用でき、中でも、リン酸、硝酸が好適である。
上記有機酸としては、ギ酸、シュウ酸、フマル酸、マレイン酸、氷酢酸、無水酢酸、プロピオン酸、n−酪酸などのカルボン酸及び硫黄含有酸残基をもつ有機酸が用いられる。上記硫黄含有酸残基をもつ有機酸としては、有機スルホン酸が挙げられ、それらのエステル化物としては有機硫酸エステル、有機亜硫酸エステルなどが挙げられる。これらの中で、特に有機スルホン酸、例えば、下記一般式(III)で表わされる化合物が好ましい。
As the acid catalyst, either an organic acid or an inorganic acid can be used.
As the inorganic acid, sulfuric acid, phosphoric acid, nitric acid, hydrochloric acid and the like can be used, among which phosphoric acid and nitric acid are preferable.
Examples of the organic acid include carboxylic acids such as formic acid, oxalic acid, fumaric acid, maleic acid, glacial acetic acid, acetic anhydride, propionic acid, and n-butyric acid, and organic acids having sulfur-containing acid residues. Examples of the organic acid having a sulfur-containing acid residue include organic sulfonic acids, and examples of esterified products thereof include organic sulfates and organic sulfites. Among these, organic sulfonic acids such as compounds represented by the following general formula (III) are particularly preferable.
R−X …(III)
(式中、Rは、置換基を有していてもよい炭化水素基、Xはスルホン酸基である。)
RX (III)
(In the formula, R is a hydrocarbon group which may have a substituent, and X is a sulfonic acid group.)
上記一般式(III)において、Rとしての炭化水素基は、炭素数1〜20の炭化水素基が好ましく、この炭化水素基は飽和のものでも、不飽和のものでもよいし、直鎖状、枝分かれ状、環状のいずれであってもよい。
Rの炭化水素基が環状の場合、例えばフェニル基、ナフチル基、アントリル基などの芳香族炭化水素基がよく、中でもフェニル基が好ましい。この芳香族炭化水素基における芳香環には置換基として炭素数1〜20の炭化水素基が1個又は複数個結合していてもよい。該芳香環上の置換基としての炭化水素基は飽和のものでも、不飽和のものでもよいし、直鎖状、枝分かれ状、環状のいずれであってもよい。
また、Rとしての炭化水素基は1個又は複数個の置換基を有していてもよく、該置換基としては、例えばフッ素原子等のハロゲン原子、スルホン酸基、カルボキシル基、水酸基、アミノ基、シアノ基などが挙げられる。
上記一般式(III)で表わされる有機スルホン酸としては、シリカ系被膜上に形成されるレジストパターン下部の形状改善効果の点から、特にノナフルオロブタンスルホン酸、メタンスルホン酸、トリフルオロメタンスルホン酸、ドデシルベンゼンスルホン酸又はこれらの混合物などが好ましい。
In the general formula (III), the hydrocarbon group as R is preferably a hydrocarbon group having 1 to 20 carbon atoms, and this hydrocarbon group may be saturated or unsaturated, linear, It may be either branched or annular.
When the hydrocarbon group of R is cyclic, for example, an aromatic hydrocarbon group such as a phenyl group, a naphthyl group, and an anthryl group is preferable, and among them, a phenyl group is preferable. One or more hydrocarbon groups having 1 to 20 carbon atoms may be bonded to the aromatic ring in the aromatic hydrocarbon group as a substituent. The hydrocarbon group as a substituent on the aromatic ring may be saturated or unsaturated, and may be linear, branched or cyclic.
The hydrocarbon group as R may have one or more substituents, and examples of the substituent include halogen atoms such as fluorine atoms, sulfonic acid groups, carboxyl groups, hydroxyl groups, amino groups. And a cyano group.
As the organic sulfonic acid represented by the general formula (III), nonafluorobutanesulfonic acid, methanesulfonic acid, trifluoromethanesulfonic acid, in particular, from the viewpoint of the shape improvement effect at the bottom of the resist pattern formed on the silica-based film, Dodecylbenzenesulfonic acid or a mixture thereof is preferred.
上記酸触媒は、水の存在下でシラン化合物を加水分解するときの触媒として作用するが、使用する酸触媒の量は、例えば、加水分解反応の反応系中の濃度が1〜1000ppm、特に5〜800ppmの範囲になるように調製すればよい。
水の添加量は、使用するシラン化合物の合計1モル当たり、1.5〜4.0モルの範囲が好ましい。酸触媒は水を添加した後に加えてもよいし、あるいは、酸触媒と水とを予め混合してなる酸水溶液として加えてもよい。
The acid catalyst acts as a catalyst when hydrolyzing the silane compound in the presence of water. The amount of the acid catalyst to be used is, for example, 1 to 1000 ppm, particularly 5 in the reaction system of the hydrolysis reaction. What is necessary is just to prepare so that it may become in the range of -800 ppm.
The amount of water added is preferably in the range of 1.5 to 4.0 moles per mole of the total amount of silane compounds used. The acid catalyst may be added after adding water, or may be added as an acid aqueous solution obtained by previously mixing the acid catalyst and water.
前記加水分解反応の反応系には有機溶剤を含有させてもよい。
該有機溶剤の具体例としては、メタノール、エタノール、プロパノール、イソプロピルアルコール、n−ブタノールのような一価アルコール、メチル−3−メトキシプロピオネート、エチル−3−エトキシプロピオネートのようなアルキルカルボン酸エステル、エチレングリコール、ジエチレングリコール、プロピレングリコール、グリセリン、トリメチロールプロパン、ヘキサントリオール等の多価アルコール、エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテル、エチレングリコールモノプロピルエーテル、エチレングリコールモノブチルエーテル、ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノプロピルエーテル、ジエチレングリコールモノブチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル等の多価アルコールのモノエーテル類あるいはこれらのモノアセテート類、酢酸メチル、酢酸エチル、酢酸ブチルのようなエステル類、アセトン、メチルエチルケトン、メチルイソアミルケトンのようなケトン類、エチレングリコールジメチルエーテル、エチレングリコールジエチルエーテル、エチレングリコールジプロピルエーテル、エチレングリコールジブチルエーテル、プロピレングリコールジメチルエーテル、プロピレングリコールジエチルエーテル、ジエチレングリコールジメチルエーテル、ジエチレングリコールジエチルエーテル、ジエチレングリコールメチルエチルエーテルのような多価アルコールの水酸基をすべてアルキルエーテル化した多価アルコールエーテル類などが挙げられる。
上記有機溶剤は単独で用いてもよい、2種以上を組み合わせて用いてもよい。
The reaction system for the hydrolysis reaction may contain an organic solvent.
Specific examples of the organic solvent include methanol, ethanol, propanol, isopropyl alcohol, monohydric alcohols such as n-butanol, alkylcarboxylic acids such as methyl-3-methoxypropionate and ethyl-3-ethoxypropionate. Polyesters such as acid esters, ethylene glycol, diethylene glycol, propylene glycol, glycerin, trimethylolpropane, hexanetriol, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, diethylene glycol monomethyl ether , Diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol Monoethers of polyhydric alcohols such as monobutyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether or the like, monoacetates thereof, methyl acetate, ethyl acetate, butyl acetate, etc. Esters, acetone, methyl ethyl ketone, ketones such as methyl isoamyl ketone, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol dipropyl ether, ethylene glycol dibutyl ether, propylene glycol dimethyl ether, propylene glycol diethyl ether, diethylene glycol dimethyl ether, diethylene glycol Diethyl A Le, and the like such as diethylene glycol methyl ethyl polyhydric alcohol ethers which all alkyl-etherified hydroxyl of polyhydric alcohols such as ether.
The said organic solvent may be used independently and may be used in combination of 2 or more type.
ここで、塗布液の保存安定性や成膜性を向上させるうえでは、上記有機溶剤としてアルキレングリコールジアルキルエーテルを用いることがより好ましい。 Here, in order to improve the storage stability and film forming property of the coating solution, it is more preferable to use alkylene glycol dialkyl ether as the organic solvent.
<(B)成分>
本発明のシリカ系被膜形成用塗布液には(B)成分としてポリアルキレングリコールおよびその末端アルキル化物からなる群から選ばれる1種以上が含まれる。
ポリアルキレングリコールにおけるアルキレン基の炭素数は、1〜5が好ましく、1〜3がより好ましい。具体例としては、ポリエチレングリコール、ポリプロピレングリコールなどの低級アルキレングリコールが挙げられる。
ポリアルキレングリコールの末端アルキル化物とは、ポリアルキレングリコールの片末端または両末端の水酸基がアルキル基によってアルコキシ化されたものである。末端のアルコキシ化に用いられるアルキル基は直鎖状又は枝分かれ状のアルキル基であってよく、その炭素数は、1〜5が好ましく、1〜3がより好ましい。特に、メチル基、エチル基、プロピル基等の直鎖状のアルキル基が好ましい。
<(B) component>
The coating liquid for forming a silica-based film of the present invention contains at least one selected from the group consisting of polyalkylene glycol and its terminal alkylated product as component (B).
1-5 are preferable and, as for carbon number of the alkylene group in polyalkylene glycol, 1-3 are more preferable. Specific examples include lower alkylene glycols such as polyethylene glycol and polypropylene glycol.
The terminal alkylated product of polyalkylene glycol is obtained by alkoxylating one or both hydroxyl groups of polyalkylene glycol with an alkyl group. The alkyl group used for terminal alkoxylation may be a linear or branched alkyl group, and the number of carbon atoms thereof is preferably 1 to 5, and more preferably 1 to 3. In particular, a linear alkyl group such as a methyl group, an ethyl group, or a propyl group is preferable.
(B)成分の質量平均分子量(Mw)は100〜10000が好ましく、200〜5000がより好ましく、400〜4000がさらに好ましい。(B)成分のMwを上記範囲の上限値以下とすることにより、塗布液における相溶性を損なうことなく良好な塗布性が得られ、シリカ系被膜の膜厚均一性が良くなる。上記範囲の下限値以上とすることにより、シリカ系被膜をポーラスにすることができ、低誘電率化が可能となる。
(B)成分の使用量は、シリカ系被膜形成用塗布液における固形分(SiO2換算質量)に対して、25〜200質量%が好ましく、30〜150質量%がより好ましく、50〜120質量%がさらに好ましい。(B)成分の使用量を上記範囲の下限値以上とすることによりシリカ系被膜の誘電率を低下させることができ、上記範囲の上限値以下とすることにより十分な強度のシリカ系被膜を得ることができる。
(B) 100-10000 are preferable, as for the mass mean molecular weight (Mw) of a component, 200-5000 are more preferable, and 400-4000 are further more preferable. By making Mw of (B) component below the upper limit of the said range, favorable applicability | paintability is obtained without impairing the compatibility in a coating liquid, and the film thickness uniformity of a silica type coating improves. By setting it to be equal to or higher than the lower limit of the above range, the silica-based film can be made porous, and a low dielectric constant can be achieved.
The amount of component (B) used is preferably 25 to 200% by mass, more preferably 30 to 150% by mass, and more preferably 50 to 120% by mass with respect to the solid content (SiO 2 equivalent mass) in the coating solution for forming a silica-based film. % Is more preferable. The dielectric constant of the silica-based coating can be lowered by setting the amount of component (B) used to be equal to or higher than the lower limit of the above range, and a silica-based coating having sufficient strength can be obtained by setting the amount to be lower than the upper limit of the above range. be able to.
<(C)成分>
本発明のシリカ系被膜形成用塗布液には(C)成分としてテトラアルキルアンモニウムハイドロオキサイドを含有させることが好ましい。テトラアルキルアンモニウムハイドロオキサイドは下記一般式(IV)で表される。
R’4N+OH− …(IV)
(式中、R’はアルキル基を示す。)
R’としてのアルキル基は、好ましくは炭素数1〜5の直鎖状又は枝分かれ状のアルキル基であり、より好ましい炭素数は1〜3である。
かかる(C)成分をシリカ系被膜形成用塗布液に含有させることにより、形成されるシリカ系被膜をよりいっそう低誘電率化することができる。
<(C) component>
The coating liquid for forming a silica-based film of the present invention preferably contains tetraalkylammonium hydroxide as the component (C). Tetraalkylammonium hydroxide is represented by the following general formula (IV).
R ′ 4 N + OH − (IV)
(In the formula, R ′ represents an alkyl group.)
The alkyl group as R ′ is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and more preferably 1 to 3 carbon atoms.
By including the component (C) in the coating liquid for forming a silica-based film, the formed silica-based film can be further reduced in dielectric constant.
(C)成分の使用量は、シリカ系被膜形成用塗布液における固形分(SiO2換算質量)に対して、0.0005〜0.02質量%(5〜200ppm)が好ましく、0.005〜0.02質量%(50〜200ppm)がより好ましく、0.005〜0.015質量%(50〜150ppm)がさらに好ましい。(C)成分の使用量を上記範囲の下限値以上とすることにより、誘電率を低下させる効果が得られ、上記範囲の上限値以下とすることにより塗布液の良好な経時安定性が得られる。 Component (C) is preferably used in an amount of 0.0005 to 0.02 mass% (5-200 ppm), based on the solid content (SiO 2 equivalent mass) in the coating solution for forming a silica-based film, 0.005 to 0.02 mass% (50-200 ppm) is more preferable, and 0.005-0.015 mass% (50-150 ppm) is still more preferable. (C) By making the usage-amount of a component more than the lower limit of the said range, the effect which reduces a dielectric constant is acquired, and the favorable temporal stability of a coating liquid is acquired by making it below the upper limit of the said range. .
本発明のシリカ系被膜形成用塗布液を調製する方法としては、例えば、まず水、上記酸触媒、および好ましくは有機溶剤の存在下で、アルキルトリアルコキシシランおよびトリアルコキシシランからなるシラン化合物を加水分解反応させることにより、反応生成物(A)を含む反応溶液を得る。この反応溶液に(B)成分、および好ましくは(C)成分を加え、さらに必要に応じて希釈溶剤を加えて混合することにより、シリカ系被膜形成用塗布液が得られる。 As a method for preparing a coating solution for forming a silica-based film of the present invention, for example, a silane compound comprising an alkyltrialkoxysilane and a trialkoxysilane is first added in the presence of water, the above acid catalyst, and preferably an organic solvent. By carrying out the decomposition reaction, a reaction solution containing the reaction product (A) is obtained. By adding the component (B) and preferably the component (C) to this reaction solution, and further adding a diluting solvent as necessary, a coating solution for forming a silica-based film is obtained.
上記反応生成物(A)を含む反応溶液は、そのままシリカ系被膜形成用塗布液の調製に用いることもできるが、(A)成分以外の成分を加える前に加水分解によって生じたアルコールを除去することが好ましい。上記加水分解によって生じたアルコールを除去することにより、保存安定性、成膜性を向上させることができる。このアルコールの除去は、減圧蒸留による方法が好ましい。該減圧蒸留は真空度39.9×102〜39.9×103Pa(約30〜300mmHg)、好ましくは66.5×102〜26.6×103Pa(約50〜200mmHg)、温度20〜80℃で行うのが好ましい。 The reaction solution containing the reaction product (A) can be used as it is for the preparation of a coating solution for forming a silica-based film, but the alcohol generated by hydrolysis is removed before adding any component other than the component (A). It is preferable. By removing the alcohol generated by the hydrolysis, storage stability and film formability can be improved. This alcohol is preferably removed by distillation under reduced pressure. The vacuum distillation is performed at a degree of vacuum of 39.9 × 10 2 to 39.9 × 10 3 Pa (about 30 to 300 mmHg), preferably 66.5 × 10 2 to 26.6 × 10 3 Pa (about 50 to 200 mmHg), It is preferable to carry out at a temperature of 20 to 80 ° C.
前記反応溶液に(C)成分を添加する際は、該(C)成分を適宜の溶剤に溶解させた状態で添加してもよい。その場合の溶剤は特に限定されないが、例えば、前記加水分解反応の反応系に含有させる有機溶剤として挙げたものの中から適宜のものを用いることができる。
前記希釈溶剤は特に限定されないが、例えば、前記加水分解反応の反応系に含有させる有機溶剤として挙げたものの中から適宜のものを用いることができる。塗布液の保存安定性や成膜性を向上させるうえでは、希釈溶剤としてアルキレングリコールジアルキルエーテルを用いることがより好ましい。該希釈溶剤の使用量は、シリカ系被膜形成用塗布液の固形分濃度が好ましい範囲となるように調整することが好ましい。
シリカ系被膜形成用塗布液の固形分濃度(SiO2換算濃度)は特に限定されないが、1〜30質量%程度が好ましく、5〜25質量%程度がより好ましい。
When the component (C) is added to the reaction solution, the component (C) may be added in a state of being dissolved in an appropriate solvent. Although the solvent in that case is not particularly limited, for example, an appropriate one can be used from those listed as the organic solvent to be included in the reaction system of the hydrolysis reaction.
Although the said dilution solvent is not specifically limited, For example, an appropriate thing can be used from what was mentioned as an organic solvent contained in the reaction system of the said hydrolysis reaction. In order to improve the storage stability and film formability of the coating solution, it is more preferable to use alkylene glycol dialkyl ether as a diluent solvent. It is preferable to adjust the usage-amount of this dilution solvent so that the solid content density | concentration of the coating liquid for silica-type film formation may become a preferable range.
The solid content of the silica-based film-forming coating solution (SiO 2 concentration in terms) is not particularly limited, but is preferably about 1 to 30 wt%, more preferably about 5 to 25 wt%.
本発明のシリカ系被膜形成用塗布液は、層間絶縁膜としてのシリカ系被膜を形成するのに好適に用いられる。本発明のシリカ系被膜形成用塗布液を用いてシリカ系被膜を形成する方法としては、通常のSOG法を用いることができる。 The coating liquid for forming a silica-based film of the present invention is suitably used for forming a silica-based film as an interlayer insulating film. As a method of forming a silica-based film using the coating liquid for forming a silica-based film of the present invention, a normal SOG method can be used.
例えば、まず基体上にシリカ系被膜形成用塗布液を所定の膜厚となるように、回転塗布、流延塗布、ロール塗布等の塗布方法により塗布して塗膜を形成する。塗膜の厚さは適宜選択すればよい。
次いでホットプレート上でベークする。このベーク処理により塗膜中の有機溶剤が揮発し、さらにシロキサンポリマーの分子間で反応が生じて重合が進む。このときのベーク温度は、例えば80〜500℃程度であり、より好ましくは80〜300℃程度である。ベーク処理はベーク温度を変えつつ複数段階で行ってもよい。
この後、高温で焼成することによりシリカ系被膜が得られる。焼成温度は、通常、350℃以上で行われ、350〜450℃程度が好ましい。
For example, first, a coating film is formed by applying a coating solution for forming a silica-based film on a substrate by a coating method such as spin coating, cast coating, or roll coating so as to have a predetermined film thickness. What is necessary is just to select the thickness of a coating film suitably.
It is then baked on a hot plate. By this baking treatment, the organic solvent in the coating film is volatilized, and further a reaction occurs between the molecules of the siloxane polymer to proceed the polymerization. The baking temperature at this time is about 80-500 degreeC, for example, More preferably, it is about 80-300 degreeC. The baking process may be performed in a plurality of stages while changing the baking temperature.
Then, a silica-type film is obtained by baking at high temperature. The firing temperature is usually 350 ° C. or higher, preferably about 350 to 450 ° C.
本発明のシリカ系被膜形成用塗布液によれば、誘電率が低いシリカ系被膜を形成することができる。誘電率が低下する作用の一つとして、(B)成分を含有させることによりシリカ系被膜がポーラス化されることが考えられる。
本発明によれば、例えば、後述の実施例に記載した測定方法で測定される誘電率の値が3以下、好ましくは2.8以下である低誘電率のシリカ系被膜を形成することができる。
According to the coating liquid for forming a silica-based film of the present invention, a silica-based film having a low dielectric constant can be formed. As one of the actions of decreasing the dielectric constant, it is conceivable that the silica-based film is made porous by containing the component (B).
According to the present invention, for example, it is possible to form a low dielectric constant silica-based film having a dielectric constant value of 3 or less, preferably 2.8 or less, measured by a measurement method described in Examples described later. .
また、本発明のシリカ系被膜形成用塗布液を用いて形成されたシリカ系被膜は、レジスト膜の除去に用いられる剥離液に対する耐性が良好であり、剥離液に接触することによる膜減りや誘電率の上昇が抑えられる。
これらの剥離液の中でも、ヒドロキシルアミン類、第1級、第2級または第3級脂肪族アミン、脂環式アミン、芳香族アミン、複素環式アミン、アンモニア水、および低級アルキル第4級アンモニウム塩を含むアミン系剥離液、特にヒドロキシルアミンを含むアミン系剥離液に対する耐性が良好である。
In addition, the silica-based coating formed using the coating solution for forming a silica-based coating according to the present invention has good resistance to the stripping solution used for removing the resist film, and film thickness reduction or dielectric property due to contact with the stripping solution is good. An increase in rate is suppressed.
Among these stripping solutions, hydroxylamines, primary, secondary or tertiary aliphatic amines, alicyclic amines, aromatic amines, heterocyclic amines, aqueous ammonia, and lower alkyl quaternary ammoniums Good resistance to amine-based stripping solution containing salt, particularly amine-based stripping solution containing hydroxylamine.
(実施例1)
プロピレングリコールジメチルエーテル1432.8gに、トリエトキシシラン147.6g、およびメチルトリエトキシシラン122.4gを加えて撹拌した。次いで、純水97.2gおよび濃度が60質量%の硝酸120μlを加え、3時間撹拌した。その後、室温で10日間反応させることにより、反応生成物を含む反応溶液を得た。該反応生成物の質量平均分子量(Mw)は1600 であった。
得られた反応溶液を100mmHg以下、40℃にて減圧蒸留して、固形分濃度が12質量%となるまで濃縮した。
次いで、濃縮された反応溶液に、質量平均分子量400のポリプロピレングリコール(三洋化成製、製品名;ニューポールPP−400)108g(前記反応溶液中の固形分に対して100質量%)を加えた。
また、イソプロピルアルコール(IPA)中に濃度900ppmのテトラメチルアンモニウムハイドロオキサイド(TMAH)を含む溶液12g(前記反応溶液中の固形分に対するTMAH濃度100ppm)を加えた。
さらに、プロピレングリコールジメチルエーテル780gを加えて撹拌することによりシリカ系被膜形成用塗布液を得た。
Example 1
To 1432.8 g of propylene glycol dimethyl ether, 147.6 g of triethoxysilane and 122.4 g of methyltriethoxysilane were added and stirred. Subsequently, 97.2 g of pure water and 120 μl of nitric acid having a concentration of 60% by mass were added and stirred for 3 hours. Then, the reaction solution containing a reaction product was obtained by making it react at room temperature for 10 days. The mass average molecular weight (Mw) of the reaction product was 1600.
The obtained reaction solution was distilled under reduced pressure at 40 ° C. at 100 mmHg or less, and concentrated until the solid concentration was 12% by mass.
Next, 108 g (100% by mass with respect to the solid content in the reaction solution) of polypropylene glycol having a mass average molecular weight of 400 (product name; Newpol PP-400) manufactured by Sanyo Chemical Industries, Ltd. was added to the concentrated reaction solution.
Further, 12 g of a solution containing tetramethylammonium hydroxide (TMAH) having a concentration of 900 ppm in isopropyl alcohol (IPA) (TMAH concentration of 100 ppm relative to the solid content in the reaction solution) was added.
Further, 780 g of propylene glycol dimethyl ether was added and stirred to obtain a coating solution for forming a silica-based film.
シリコンウェーハ上に、上記で得られたシリカ系被膜形成用塗布液を、スピンコートにより塗布し、ホットプレートにてベーク処理を行った。ベーク処理における加熱条件は、80℃で3分間、次いで150℃で3分間、次いで300℃で3分間の多段ベークとした。この後、空気中(窒素雰囲気中)にて400℃で焼成して、膜厚2500Åのシリカ系被膜を得た。
得られたシリカ系被膜の誘電率を水銀プローブ式CV測定装置(日本SSM株式会社製、製品名;SSM495)を用いて測定したところ、誘電率は2.30であった。
さらに、上記で得られたシリカ系被膜を、70℃に保たれたヒドロキシルアミン類を含む剥離液に30分間浸漬した。膜減り(浸漬前の膜厚と浸漬後の膜厚との差)を調べたところ331Åであった。また浸漬後に、上記と同様にして誘電率を測定したところ5.67であった。
The silica-based film-forming coating solution obtained above was applied onto a silicon wafer by spin coating, and baked on a hot plate. The heating conditions in the baking treatment were multi-stage baking at 80 ° C. for 3 minutes, then at 150 ° C. for 3 minutes, and then at 300 ° C. for 3 minutes. Then, it baked at 400 degreeC in the air (in nitrogen atmosphere), and obtained the silica type film with a film thickness of 2500cm.
When the dielectric constant of the obtained silica-based coating was measured using a mercury probe CV measuring apparatus (manufactured by SSM Japan, product name: SSM495), the dielectric constant was 2.30.
Furthermore, the silica-based film obtained above was immersed in a stripping solution containing hydroxylamines kept at 70 ° C. for 30 minutes. When the film reduction (difference between the film thickness before immersion and the film thickness after immersion) was examined, it was 331 mm. Moreover, after immersion, it was 5.67 when the dielectric constant was measured like the above.
(比較例1)
実施例1におけるシラン化合物をトリエトキシシランに変更してシリカ系被膜形成用塗布液を調製した。
すなわち、トリエトキシシラン73.9gをエチレングリコールジメチルエーテル799.0gに溶解し撹拌した。次いで、純水24.2gおよび濃度が60質量%の硝酸3.2μlを加え、3時間撹拌した。その後、室温で6日間反応させることにより、反応生成物を含む反応溶液を得た。該反応生成物の質量平均分子量(Mw)は1300であった。
得られた反応溶液を120〜140mmHg以下、40℃にて減圧蒸留して、固形分濃度が8質量%になるまで濃縮した。
次いで質量平均分子量200のポリエチレングリコールの両末端メチル化物を、前記反応溶液中の固形分に対して100質量%加えた。
また、イソプロピルアルコール(IPA)中に濃度50ppmのテトラメチルアンモニウムハイドロオキサイド(TMAH)を含む溶液を、前記反応溶液中の固形分に対するTMAH濃度が5.5ppmとなるように添加し、撹拌することによりシリカ系被膜形成用塗布液を得た。
(Comparative Example 1)
A coating solution for forming a silica-based film was prepared by changing the silane compound in Example 1 to triethoxysilane.
That is, 73.9 g of triethoxysilane was dissolved in 799.0 g of ethylene glycol dimethyl ether and stirred. Subsequently, 24.2 g of pure water and 3.2 μl of nitric acid having a concentration of 60% by mass were added and stirred for 3 hours. Then, the reaction solution containing a reaction product was obtained by making it react at room temperature for 6 days. The mass average molecular weight (Mw) of the reaction product was 1300.
The obtained reaction solution was distilled under reduced pressure at 120 to 140 mmHg or less at 40 ° C., and concentrated until the solid content concentration became 8% by mass.
Next, 100% by mass of both terminal methylated products of polyethylene glycol having a mass average molecular weight of 200 was added to the solid content in the reaction solution.
Further, by adding a solution containing tetramethylammonium hydroxide (TMAH) with a concentration of 50 ppm in isopropyl alcohol (IPA) so that the TMAH concentration with respect to the solid content in the reaction solution is 5.5 ppm, and stirring. A coating liquid for forming a silica-based film was obtained.
得られたシリカ系被膜形成用塗布液を用い、実施例1と同様にして、シリコンウェーハ上に膜厚2500Åのシリカ系被膜を形成した。
得られたシリカ系被膜の誘電率を実施例1と同様にして測定したところ、2.5であった。
さらに、このシリカ系被膜について実施例1と同様にして剥離液に浸漬させた。浸漬後の膜減りおよび誘電率を調べたところ、膜減りは1004Å、誘電率は10であった。
Using the obtained coating liquid for forming a silica-based film, a silica-based film having a film thickness of 2500 mm was formed on a silicon wafer in the same manner as in Example 1.
When the dielectric constant of the obtained silica-based coating was measured in the same manner as in Example 1, it was 2.5.
Further, this silica-based film was immersed in a stripping solution in the same manner as in Example 1. When the film reduction and dielectric constant after immersion were examined, the film reduction was 1004 mm and the dielectric constant was 10.
上記結果に示されるように、実施例1および比較例1のいずれにおいても、誘電率が低いシリカ系被膜が得られた。
実施例1で得られたシリカ系被膜の方が、比較例1で得られたシリカ系被膜と比べて、剥離液に浸漬したときの膜減りが小さく、剥離液に浸漬したことによる誘電率の上昇幅も小さかった。
As shown in the above results, a silica-based film having a low dielectric constant was obtained in both Example 1 and Comparative Example 1.
The silica-based coating obtained in Example 1 has a smaller film loss when immersed in a stripping solution than the silica-based coating obtained in Comparative Example 1, and the dielectric constant due to immersion in the stripping solution is smaller. The rise was small.
Claims (6)
(B)ポリアルキレングリコールおよびその末端アルキル化物からなる群から選ばれる1種以上、および
(C)テトラアルキルアンモニウムハイドロオキサイドを含むことを特徴とするシリカ系被膜形成用塗布液。 (A) a reaction product obtained by hydrolyzing a silane compound comprising alkyltrialkoxysilane and trialkoxysilane ;
(B) one or more selected from the group consisting of polyalkylene glycols and terminal alkylated products thereof , and
(C) A coating liquid for forming a silica-based film, comprising tetraalkylammonium hydroxide .
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JP2004165402A (en) * | 2002-11-13 | 2004-06-10 | Shin Etsu Chem Co Ltd | Composition for forming porous film, porous film and its manufacturing method, interlayer insulation film, and semiconductor device |
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JP2004165402A (en) * | 2002-11-13 | 2004-06-10 | Shin Etsu Chem Co Ltd | Composition for forming porous film, porous film and its manufacturing method, interlayer insulation film, and semiconductor device |
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