JP4601670B2 - Aqueous antioxidants of tin and tin alloys - Google Patents

Description

  The present invention relates to an aqueous antioxidant for tin and a tin alloy, and a surface treatment method using the same. Furthermore, the present invention relates to an electronic component treated with the water-based antioxidant, a solder ball, solder powder, a ball grid array using the solder ball, a solder paste using the solder powder, and the use thereof. Related to the mounted product.

  Soldering is a technique for joining objects using a material having a relatively low melting point, and is widely used in joining and assembling electronic devices in the modern industry. The commonly used solder is Sn—Pb alloy, and its eutectic composition (63% Sn—remainder Pb) has a melting point as low as 183 ° C., so the soldering is performed at 220 to 230 ° C. As a result, almost no thermal damage is caused to the electronic components and the substrate. In addition, the Sn-Pb alloy has excellent characteristics that it has good solderability and is solidified immediately during soldering, and hardly cracks or peels even if vibration is applied to the soldered portion. .

  In general, an electronic device is formed of a synthetic resin such as an outer frame or a substrate and a metal such as a conductor or a frame. When discarded, the electronic device is not incinerated and mostly buried in the ground. In recent years, rain on the ground tends to be acidic (acid rain), and it has become a problem that the solder of electronic devices buried in the ground is eluted to contaminate groundwater. For this reason, particularly in the electronic equipment industry, an alternative movement to lead-free solder (lead-free solder) is rapidly progressing.

  External lead terminals of electronic components are mainly subjected to solder plating (90% Sn-remainder Pb) in order to improve solder wettability and corrosion resistance, and it is desired to cope with lead-free. . Candidates for lead-free solder plating are broadly divided into pure Sn, Sn-Ag (Cu), Sn-Zn, and Sn-Bi, but each has its merits and demerits to completely replace Sn-Pb alloys. Has not yet reached.

  Pure Sn plating is considered to be the most powerful lead-free plating in terms of cost and workability of plating. However, pure Sn plating has a problem that solder wettability is likely to deteriorate with time in addition to the occurrence of whiskers due to surface oxidation and internal stress, and there is a strong demand for improvement.

  Since Sn—Zn alloy has a melting point close to that of a conventional Sn—Pb alloy, Sn—Zn plating is advantageous in that it does not need to change the current equipment and processes. Moreover, it is excellent in the mechanical strength of a plating film, and is excellent also in cost. However, since Zn is an active metal species, it is easily oxidized and the solder wettability of the Sn—Zn alloy is very poor. Therefore, at present, it is considered that the possibility of being put to practical use is the lowest.

  Solder paste is used to surface-mount electronic components on a substrate, and the amount of use has increased in recent years. The solder paste is generally composed of a solder alloy powder as a main component and added with a flux containing an adhesive, an activator, a thixotropic agent, a surfactant, a solvent, and the like. As a lead-free solder paste, Sn—Ag (Cu) alloy, Sn—Zn alloy, and Sn—Bi alloy have been studied. As described above, Sn—Zn alloy is a conventional Sn—Pb alloy. Because it is close to the eutectic temperature of a solder, it is considered as a promising alternative candidate. However, because of the ease of oxidation of Zn as described above, the solder paste using the Sn—Zn alloy as the solder powder causes an oxidation reaction with the activator contained in the flux, and the solder wettability and storage stability are remarkably poor. In addition, there is a disadvantage that an inert gas atmosphere is required during reflow.

  From the prior art, it has been confirmed that surface treatment using a phosphoric ester compound is superior in moisture resistance and lubricity of tin and tin alloy (see Patent Document 1, Patent Document 2, and Patent Document 3). . Patent Document 1 exemplifies a phosphate ester type surfactant that contains ethylene oxide and contains an alkylphenyl group having 8 to 30 carbon atoms as a lipophilic group. In such a structure, although the lubricity is excellent, ethylene oxide absorbs moisture because of hydrophilicity, and the antioxidant function during humidification is not sufficient. Patent Document 2 describes that phosphate esters containing a saturated or unsaturated alkyl group having 10 to 26 carbon atoms are preferable. Patent Document 3 describes a phosphoric ester containing a phenyl group or an alkyl group having 5 or less carbon atoms. In this case, although the antioxidant function at the time of humidification is excellent, the lubricating performance cannot be sufficiently obtained. In addition, the phosphoric acid ester compounds described in these three patent documents are less effective for discoloration and prevention of oxidation during heating.

In addition, lead-free soldering is scheduled to be implemented from July 2006 according to the RoHS Directive. However, several problems associated with lead-free soldering have not been solved, and JEITA has urgently completed lead-free soldering. The project was launched (JEITA Lead-Free Complete Urgent Proposal Report, March 2005, Japan Electronics and Information Technology Industries Association, Packaging Technology Standardization Committee). One of those problems is whiskers. It has been found that the internal stress of the coating is reduced and the whisker resistance is greatly improved by improving the tin plating solution or performing Ni plating before the tin plating as a copper diffusion barrier layer. The whisker resistance where an external stress is applied, such as an FPC (flexible printed circuit) or FFC (flexible flat cable) and connector fitting portion, has not yet been solved.
Japanese Patent Publication No. 5-22322 JP 2004-137574 A Japanese Patent No. 3155139

  An object of this invention is to provide the antioxidant which is excellent in the antioxidant performance at the time of a heating and humidification, and shows favorable solder wettability by processing a tin and a tin alloy. Furthermore, it aims at providing the antioxidant which is excellent also in the whisker characteristic at the time of applying external load and lubricity.

  As a result of intensive studies on the inhibition of oxidation of tin and tin alloy surfaces, the present inventors have already had two or more phosphonic acid groups in one molecule and no ester bond in the molecule, And / or surface treatment with a surface treatment agent containing at least 0.01 g / L or more of one or more of its salts to provide oxidation resistance, improve solder wettability, and generate whiskers. It was found that it can be suppressed (see International Publication No. 2005/085498 A1 pamphlet). However, in the surface treatment agent containing a compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule, the antioxidant performance during heating and humidification, solder wettability, whisker resistance Although excellent in performance, whisker resistance and lubrication performance of the portion where external stress is applied are insufficient, and sufficient characteristics were not obtained for use of the fitting portion between the FPC or FFC and the connector.

  Therefore, as a result of further investigation, phosphoric acid having two or more phosphonic acid groups in one molecule and no ester bond in the molecule, and / or a salt thereof, and an alkyl group having 6 to 10 carbon atoms. By surface-treating tin and tin alloys with an aqueous antioxidant containing an ester, it has excellent antioxidant performance during heating and humidification, solder wettability, whisker resistance, and whisker resistance in areas where external stress is applied. It has also been found that it is suitable for use on the tin or tin alloy plating surface of the fitting portion between the FPC or FFC and the connector, as well as excellent properties and lubrication performance.

That is, the present invention is as follows.
(1) A compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule and / or a salt thereof, and a phosphate ester having an alkyl group having 6 to 10 carbon atoms A water-based antioxidant for tin and tin alloys.
(2) The aqueous antioxidant for tin and tin alloy according to (1), wherein the pH of the aqueous antioxidant is 5 or less.
(3) The tin- and tin-alloy aqueous antioxidant according to (1) or (2) above, further containing 0.01 g / L to 10 g / L of a surfactant.

（式（Ｉ）中、Ｘ^１〜Ｘ^３及びＹ^１〜Ｙ^３は各々同一もしくは異なってもよく、水素原子、又は炭素数１〜５の低級アルキル基を表す。）(4) A compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule and / or a salt thereof is represented by the following formula (I), (II) or (III): The aqueous oxidation of tin and the tin alloy according to any one of (1) to (3) above, wherein the compound is a compound and / or a salt thereof with an alkali metal salt, an ammonium salt, or an amine compound Inhibitor.

(In formula (I), X ^{1 to} X ³ and Y ^{1 to} Y ³ may be the same or different and each represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms.)

（式（II）中、Ｒ^１、Ｒ^２及びＲ^４は、各々同一もしくは異なってもよく、以下の基（Ａ）を表し、Ｒ^３は、以下の基（Ａ）、又は炭素数１〜５の低級アルキル基を表し、ｎは１〜３の整数を表す。

基（Ａ）中、Ｘ^１、及びＹ^１は、一般式（Ｉ）における定義と同じである。）

(In the formula (II), R ¹ , R ² and R ⁴ may be the same or different and each represents the following group (A), and R ³ represents the following group (A) or 1 to 5 represents a lower alkyl group, and n represents an integer of 1 to 3.

In the group (A), X ¹ and Y ¹ are the same as defined in the general formula (I). )

（式（III）中、Ｘは水素原子、又は炭素数１〜５の低級アルキル基を表し、Ｙは水素原子、炭素数１〜５の低級アルキル基、水酸基、又はアミノ基を表す。）

(In formula (III), X represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms, and Y represents a hydrogen atom, a lower alkyl group having 1 to 5 carbon atoms, a hydroxyl group, or an amino group.)

(5) A surface treatment method characterized by treating the surface of tin or a tin alloy with the aqueous antioxidant according to any one of (1) to (4).
(6) After conducting tin or tin alloy plating on the conductor surface of the connection terminal portion of the electronic component, surface treatment is performed using the aqueous antioxidant according to any one of (1) to (4). Electronic parts characterized by having gone.
(7) A solder ball or solder powder, characterized by using a tin alloy that has been surface-treated with the aqueous antioxidant according to any one of (1) to (4).
(8) A ball grid array using the solder balls described in (7) as an electrical connection member.
(9) A mounted product comprising the solder ball according to (7) arranged on an electronic component and connected to a circuit board.
(10) A solder paste using the solder powder according to (7).
(11) A mounted product using the solder paste according to (10).

  A compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule and / or a salt thereof, and a phosphate ester having an alkyl group having 6 to 10 carbon atoms. By tin or tin alloy surface treatment with water-based antioxidants, tin has excellent anti-oxidation performance during heating and humidification, good solder wettability, and excellent whisker characteristics and lubricity when an external load is applied Or it becomes a tin alloy. Therefore, the water-based antioxidant of the present invention is suitable as an antioxidant for the tin or tin alloy plating portion of the fitting portion between the FPC or FFC and the connector.

It is the schematic which shows the measuring method of the static friction coefficient in an Example.

Hereinafter, the antioxidant of the present invention will be described in detail.
As a tin alloy treated with the aqueous antioxidant of tin and tin alloy of the present invention, a tin alloy containing no lead is more preferable from the viewpoint of environmental pollution and the like. Examples of the Sn alloy not containing lead include a solder alloy containing one or more of Zn, Bi, Cu, In, Ag, and Sb in Sn.

  The composition of the antioxidant of the present invention is an aqueous system comprising a phosphoric acid ester having a specific alkyl group and a compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule. It is a solution. It is difficult to dissolve a compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule and a phosphate ester having an alkyl group, and therefore the ester portion of the latter phosphate ester. It is necessary to select the number of carbon atoms of the alkyl group. When the carbon number of the alkyl group of the phosphate ester having an alkyl group is 11 or more, it was confirmed that the solubility as an aqueous solution was low. In addition, although an alkyl group having 5 or less carbon atoms dissolves, sufficient lubrication performance cannot be obtained. Therefore, it discovered that the phosphate ester which has a C6-C10 alkyl group was good as a balance of solubility and lubricity. In addition, the combination of this specific phosphate ester and a compound that has two or more phosphonic acid groups in one molecule and does not contain an ester bond in the molecule is also effective in suppressing whiskers when external stress is applied. Has been found to be.

  In the antioxidant, a compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule, and / or a salt thereof may be contained alone or in combination of two or more. It is preferable to contain 0.01 g / L or more. The effect is small as it is less than 0.01 g / L. On the contrary, there is no upper limit of the content because the property does not deteriorate even if the content is too much, but from the cost problem, the content is more preferably 0.01 to 500 g / L, and still more preferably. Is 0.1 to 100 g / L.

In addition, a compound having two or more phosphonic acid groups in one molecule has a more detailed mechanism than a compound having one phosphonic acid group in one molecule, but is superior in oxidation resistance. found. The number of phosphonic acid groups in one molecule is preferably 2 to 6 in view of cost.
Examples of the compound having two or more phosphonic acid groups in one molecule and not containing an ester bond in the molecule and / or a salt thereof are represented by the following general formulas (I), (II), and (III). Examples thereof include compounds and / or salts thereof with alkali metal salts, ammonium salts, and amine compounds.

（式（Ｉ）中、Ｘ^１〜Ｘ^３及びＹ^１〜Ｙ^３は各々同一もしくは異なってもよく、水素原子、又は炭素数１〜５の低級アルキル基を表す。）

(In formula (I), X ^{1 to} X ³ and Y ^{1 to} Y ³ may be the same or different and each represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms.)

（式（II）中、Ｒ^１、Ｒ^２及びＲ^４は、各々同一もしくは異なってもよく、以下の基（Ａ）を表し、Ｒ^３は、以下の基（Ａ）、又は炭素数１〜５の低級アルキル基を表し、ｎは１〜３の整数を表す。

基（Ａ）中、Ｘ^１、及びＹ^１は、一般式（Ｉ）における定義と同じである。）

(In the formula (II), R ¹ , R ² and R ⁴ may be the same or different and each represents the following group (A), and R ³ represents the following group (A) or 1 to 5 represents a lower alkyl group, and n represents an integer of 1 to 3.

In the group (A), X ¹ and Y ¹ are the same as defined in the general formula (I). )

（式（III）中、Ｘは水素原子、又は炭素数１〜５の低級アルキル基を表し、Ｙは水素原子、炭素数１〜５の低級アルキル基、水酸基、又はアミノ基を表す。）

(In formula (III), X represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms, and Y represents a hydrogen atom, a lower alkyl group having 1 to 5 carbon atoms, a hydroxyl group, or an amino group.)

As the compound represented by the general formula (I), nitrilotrismethylenephosphonic acid and the like are particularly preferable because they are industrially available.
Similarly, as the compound represented by the general formula (II), ethylenediaminetetrakismethylenephosphonic acid, diethylenetriaminepentakismethylenephosphonic acid and the like are particularly preferable. As the compound represented by the general formula (III), 1- Hydroxyethane-1,1-diphosphonic acid and the like are particularly preferable.

  The alkali metal salt of the above compound is preferably a sodium salt or potassium salt, and the salt with an amine compound is preferably a triethylamine salt or a triethanolamine salt.

  The phosphate ester having an alkyl group having 6 to 10 carbon atoms is preferably a monoalkyl ester or a dialkyl ester, and may be a mixture of a monoalkyl ester and a dialkyl ester. When it is obtained as a mixture of a monoalkyl ester and a dialkyl ester for production, it is not necessary to separate them, and the mixture can be used as it is, and in the case of a mixture, the mixture may be in any proportion. Examples of the phosphate ester include monohexyl phosphate ester, dihexyl phosphate ester, mono 2-ethylhexyl phosphate ester, di-2-ethylhexyl phosphate ester, monooctyl phosphate ester, dioctyl phosphate ester, and monoisodecyl ester. Phosphoric acid esters and diisodecyl phosphoric acid esters are preferred. The content is preferably 0.01 to 100 g / L in the antioxidant, and more preferably 0.1 to 10 g / L. When the content is less than 0.01 g / L, film formation is insufficient, and when the content exceeds 100 g / L, the stability of the liquid is significantly lowered.

  In addition, in the antioxidant, a compound (A) having two or more phosphonic acid groups in one molecule and no ester bond in the molecule, and a phosphate ester having an alkyl group having 6 to 10 carbon atoms ( The ratio of B) is preferably a weight ratio of A: B = 1: 2 to 1: 0.01, more preferably 1: 1 to 1: 0.1. Ratio (A / B) of compound (A) having two or more phosphonic acid groups in one molecule and no ester bond in the molecule and phosphate ester (B) having an alkyl group having 6 to 10 carbon atoms ) Is less than ½, the anti-humidity anti-oxidation performance decreases, and when it exceeds 100, the heat-resistant anti-oxidation performance decreases.

  The antioxidant of the present invention is a compound having two or more phosphonic acid groups in one molecule and no ester bond in the molecule, and / or a salt thereof, and phosphoric acid having an alkyl group having 6 to 10 carbon atoms. The ester can be used by dissolving in an aqueous solvent. As the aqueous solvent, water is preferable in consideration of solubility and cost, but alcohols, glycols, ketones and the like may be contained in addition to water.

  Moreover, the water-system antioxidant of this invention discovered that the oxidation resistance of the to-be-processed surface improved further by adjusting pH to 5 or less. The pH of the antioxidant is more preferably pH 1 to 5 in view of the influence on the material and the like. As the pH adjuster, generally available acids and alkalis can be used.

Furthermore, by adding 0.01 to 10 g / L of a surfactant to the water-based antioxidant, the oxidation resistance of the surface to be treated is further improved. Even if the addition amount of the surfactant is less than 0.01 g / L or exceeds 10 g / L, the effect of improving the oxidation resistance cannot be obtained. The addition amount of the surfactant is preferably 0.1 to 10 g / L.
As the surfactant, one or more commercially available anionic, cationic, nonionic, and amphoteric surfactants can be appropriately selected and used.
Anionic surfactants include sulfate ester type, sulfonate salt type, phosphate ester salt type, sulfosuccinate type, and cationic surfactants include quaternary ammonium salt type and amine salt type. Nonionic surfactants include higher alcohol ethylene oxide adducts, higher alcohol propylene oxide adducts, alkylphenol ethylene oxide adducts, polyoxyethylene polyoxypropylene block polymers, ethylenediamine polyoxyethylene polyoxypropylene block polymers, higher Aliphatic amine ethylene oxide adducts, aliphatic amide ethylene oxide adducts and the like, and amphoteric surfactants are preferably amino acid type, betaine type and the like.

  When using the pH in the range of 5 or less, it is preferable to use one or more of anionic and nonionic types as appropriate. Among these, polyethylene glycol type is particularly preferable for nonionic surfactants, and higher alcohol ethylene oxide adducts, higher alcohol propylene oxide adducts, alkylphenol ethylene oxide adducts, polyoxyethylene polyoxypropylene block polymers, etc. are particularly preferably used. In addition, as the anionic surfactant, a sulfate ester salt type and a phosphate ester salt type are particularly preferable.

  Further, the antioxidant of the present invention may contain an amount of an additive in a range that does not impair the original properties for the purpose of imparting desired performance. Examples of the additive include preservatives and pH buffering agents, and conventionally known additives can be used.

In order to surface-treat tin or a tin alloy using the antioxidant of the present invention, any method can be used as long as it forms a film on the surface of the tin or tin alloy. For example, tin or tin alloy is simply immersed in the antioxidant. And a method of applying the antioxidant using a shower or a device such as an air coater, blade coater, rod coater, knife coater, gravure coater, reverse coater, cast coater.
The temperature of the antioxidant during the surface treatment is preferably 15 to 80 ° C, more preferably 30 to 70 ° C.

The shape of the tin or tin alloy that is surface-treated with the antioxidant of the present invention may be any shape such as linear, plate / strip / foil, granular, powder, etc. Electronic parts, solder balls, solder powder, etc. can be processed.
By using the antioxidant of the present invention, tin or tin alloy plating is performed on the conductor surface of the connection terminal portion of the electronic component, and then surface treatment is performed to provide excellent oxidation resistance, solder wettability, whisker resistance, and lubrication. It can be set as an electronic component with favorable property. The electronic component in the present invention includes a substrate.
Solder balls using a tin alloy treated with the antioxidant of the present invention are excellent in oxidation resistance, and are arranged on electronic components as a ball grid array which is an electrical connection member and connected to a circuit board. It can be used favorably as a mounted product.

  Further, a tin alloy powder can be treated with the antioxidant of the present invention, and a flux containing an adhesive, an activator, a thixotropic agent, a surfactant, a solvent, etc. can be added to the tin alloy powder to be used as a solder paste. This solder paste is excellent in oxidation resistance and whisker resistance. Conventionally known pressure-sensitive adhesives, activators, thixotropic agents, surfactants and solvents can be used.

  EXAMPLES Next, although an Example demonstrates this invention, this invention is not limited by these Examples.

Examples 1-8 and Comparative Examples 1-8
As shown in Table 1, a compound or salt thereof having two or more phosphonic acid groups in one molecule and no ester bond in the molecule and a phosphate ester having an alkyl group having 6 to 10 carbon atoms are effective. Eight types of aqueous solutions as components were prepared (Examples 1 to 8).
Moreover, as a comparative example, as shown in Table 2, six types of aqueous solutions were prepared similarly to the examples (Comparative Examples 1 to 6). In Comparative Example 7, an antioxidant was not prepared because the antioxidant was not treated. Further, as Comparative Example 8, the hexyl phosphate ester in the solution of Example 2 was changed to oleyl phosphate ester, but it was suspended in brown and the active ingredient was not completely dissolved.
In Tables 1 and 2, hexyl phosphate ester, 2-ethylhexyl phosphate ester, isodecyl phosphate ester and butyl phosphate ester are all mixtures of monoalkyl phosphate ester and dialkyl phosphate ester.

On the other hand, the following pretreatment was performed on the copper material (C1020P, 10 mm × 25 mm × 0.2 ^t mm).
Alkaline electrolytic degreasing (room temperature, 15 A / dm ² , treatment for about 30 seconds) → water washing → acid immersion (10% sulfuric acid, room temperature, 5 seconds) → water washing → chemical polishing (CPB-40, room temperature, 1 minute immersion) → water washing → Acid soaking (10% sulfuric acid, room temperature, 5 seconds) → Washing The base material was subjected to tin plating with a film thickness of about 5 μm (plating bath: Tincoat K (manufactured by Nikko Metal Plating Co., Ltd.)), plating Conditions: cathode current density 2 A / dm ² , temperature 20 ° C., liquid flow and cathode swing plating).

The tin-plated base material (hereinafter referred to as Sn base material) was immersed in the above antioxidant for 10 seconds at a bath temperature of 60 ° C., then washed with water and dried to obtain a test substrate.
The following evaluations were performed on these test substrates. Tables 3 and 4 show the test results.

Thermal oxidation resistance These test substrates were heat-treated in an air furnace maintained at 220 ° C. for 1 hour in air, and then solder wettability (zero cross time) with lead-free solder was measured by the meniscograph method based on the following measurement conditions did.
Equipment; Solder Checker SAT-2000 (Resca)
Solder bath; tin: silver: copper = 96.5: 3: 0.5 (bath temperature 245 ° C.)
Flux; NA-200 (manufactured by Tamura Kaken)
Immersion depth: 2mm
Immersion speed: 4 mm / sec.
Immersion time: 5 sec.
The evaluation criteria are as follows.
◎: Zero cross time less than 1 second ○: Zero cross time from 1 second to less than 3 seconds △: Zero cross time from 3 seconds to less than 5 seconds ×: Zero cross time of 5 seconds or more

Moisture oxidation resistance After subjecting these test substrates to PCT treatment (leaving for 16 hours in a sealed kettle with a temperature of 105 ° C and a humidity of 100%), the solder wettability (zero cross time) with lead-free solder was measured by the menisographic method. Measured in the same manner as in the section of heat and oxidation resistance.
The evaluation criteria are as follows.
◎: Zero cross time less than 1 second ○: Zero cross time from 1 second to less than 3 seconds △: Zero cross time from 3 seconds to less than 5 seconds ×: Zero cross time of 5 seconds or more

Whisker Resistance The substrate was allowed to stand for 24 hours in a constant temperature and humidity atmosphere at a temperature of 85 ° C. and a humidity of 85%. Then, after fully drying the substrate, the surface was observed with a scanning electron microscope (SEM). As a result, no whiskers were observed in both the examples and the comparative examples.
In addition, a ball load test (a sample was subjected to a 150 g ball load at room temperature for 7 days and then the whisker generation length was observed with a microscope) was also performed.
The evaluation criteria are as follows.
○: Less than 10 μm Δ: 10 μm or more to less than 20 μm ×: 20 μm or more

Static friction coefficient The lubricity of the surface of the test substrate was evaluated by the static friction coefficient.
As shown in FIG. 1, a contact was placed on the sample, gradually tilted, and the friction coefficient was measured from the sliding angle (static friction coefficient = tan θ).

Examples 9-16 and Comparative Examples 9-15
The following pretreatment was performed on the phosphor bronze hoop material (18 mm × 100 mm).
Alkaline electrolytic degreasing (room temperature, 15 A / dm ² , treatment for about 30 seconds) → water washing → acid immersion (10% sulfuric acid, room temperature, 5 seconds) → water washing → chemical polishing (CPB-40, room temperature, 1 minute immersion) → water washing → Acid soaking (10% sulfuric acid, room temperature, 5 seconds) → Washing The substrate was plated with Sn-9% Zn with a film thickness of about 5 μm (plating bath: manufactured by Nikko Metal Plating Co., Ltd., plating conditions) : Cathode current density 3 A / dm ² , temperature 35 ° C., pH 4.0, liquid flow and cathode swing plating).

  For the solutions prepared in Examples 1 to 8 and Comparative Examples 1 to 6, the above-described Sn—Zn plated substrate (hereinafter referred to as “Sn—Zn substrate”) was immersed at 40 ° C. for 1 minute, and then washed with water. And what was dried with the dryer was used as the test board (Examples 9-16, Comparative Examples 9-14). The untreated base material was used as a test substrate of Comparative Example 15. These test substrates were evaluated in the same manner as in Examples 1 to 8 and Comparative Examples 1 to 7. Tables 5 and 6 show the test results.

Claims (11)

  A compound having two or more phosphonic acid groups in one molecule and having no ester bond in the molecule and / or a salt thereof, and a phosphate ester having an alkyl group having 6 to 10 carbon atoms An aqueous antioxidant for tin and tin alloys.   The aqueous antioxidant for tin and tin alloy according to claim 1, wherein the pH of the aqueous antioxidant is 5 or less.   The aqueous antioxidant for tin and tin alloy according to claim 1 or 2, further comprising 0.01 g / L to 10 g / L of a surfactant. A compound having two or more phosphonic acid groups in one molecule and not containing an ester bond in the molecule, and / or a salt thereof represented by the following formula (I), (II) or (III): And / or an alkali metal salt, an ammonium salt, or a salt thereof with an amine compound, wherein the aqueous antioxidant of tin and the tin alloy according to any one of claims 1 to 3 is used. Agent.

(In formula (I), X ^{1 to} X ³ and Y ^{1 to} Y ³ may be the same or different and each represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms.)

(In the formula (II), R ¹ , R ² and R ⁴ may be the same or different and each represents the following group (A), and R ³ represents the following group (A) or 1 to 5 represents a lower alkyl group, and n represents an integer of 1 to 3.

In the group (A), X ¹ and Y ¹ are the same as defined in the general formula (I). )

(In formula (III), X represents a hydrogen atom or a lower alkyl group having 1 to 5 carbon atoms, and Y represents a hydrogen atom, a lower alkyl group having 1 to 5 carbon atoms, a hydroxyl group, or an amino group.)   A surface treatment method comprising treating a surface of tin or a tin alloy with the aqueous antioxidant according to any one of claims 1 to 4.   After conducting tin or tin alloy plating on the conductor surface of the connection terminal portion of the electronic component, surface treatment is performed using the aqueous antioxidant according to any one of claims 1 to 4. An electronic component characterized by that.   Solder balls or solder powder, characterized by using a tin alloy that has been surface-treated with the aqueous antioxidant according to any one of claims 1 to 4.   A ball grid array, wherein the solder balls according to claim 7 are used as electrical connection members.   A mounting product comprising the solder ball according to claim 7 arranged on an electronic component and connected to a circuit board.   A solder paste using the solder powder according to claim 7.   A mounted product using the solder paste according to claim 10.

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