JP4418954B2 - データ・パターン発生装置 - Google Patents
データ・パターン発生装置 Download PDFInfo
- Publication number
- JP4418954B2 JP4418954B2 JP2005156464A JP2005156464A JP4418954B2 JP 4418954 B2 JP4418954 B2 JP 4418954B2 JP 2005156464 A JP2005156464 A JP 2005156464A JP 2005156464 A JP2005156464 A JP 2005156464A JP 4418954 B2 JP4418954 B2 JP 4418954B2
- Authority
- JP
- Japan
- Prior art keywords
- clock
- data
- position control
- circuit
- delay
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000002194 synthesizing effect Effects 0.000 claims description 3
- 230000000630 rising effect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000007257 malfunction Effects 0.000 description 3
- 230000001934 delay Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31709—Jitter measurements; Jitter generators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Pulse Circuits (AREA)
- Manipulation Of Pulses (AREA)
Description
12 クロック発振回路
14 遅延フリップフロップ
16 遅延回路
18 出力フリップフロップ(データ出力制御手段)
160 デマルチプレクサ
162 第1遅延回路
164 第2遅延回路
166 クロック分周回路
168 合成回路
Claims (1)
- クロックを供給するクロック供給手段と、
データ・パターン及び対応する位置制御データを記憶し、上記クロックに応じて出力するデータ出力手段と、
上記クロックを分周比k(kは自然数)で分周し、分周クロックを生成する分周手段と、
上記分周クロックに従って上記位置制御データを順次受けて、上記クロックを上記位置制御データに応じて遅延し、位置制御クロックとして夫々出力するk個の並列な遅延手段と、
上記位置制御クロックを上記分周クロックに従って順次合成し、合成位置制御クロックとして出力する合成手段と、
上記合成位置制御クロックに応じて対応する上記データ・パターンを出力するデータ出力制御手段とを具えるデータ・パターン発生装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005156464A JP4418954B2 (ja) | 2005-05-27 | 2005-05-27 | データ・パターン発生装置 |
US11/439,405 US7583460B2 (en) | 2005-05-27 | 2006-05-22 | Edge controlled fast data pattern generator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005156464A JP4418954B2 (ja) | 2005-05-27 | 2005-05-27 | データ・パターン発生装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006333272A JP2006333272A (ja) | 2006-12-07 |
JP4418954B2 true JP4418954B2 (ja) | 2010-02-24 |
Family
ID=37462580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005156464A Expired - Fee Related JP4418954B2 (ja) | 2005-05-27 | 2005-05-27 | データ・パターン発生装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7583460B2 (ja) |
JP (1) | JP4418954B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9501085B2 (en) | 2007-02-01 | 2016-11-22 | Keithley Instruments, Llc | Method and apparatus for pulse generation |
US8683254B2 (en) | 2011-01-07 | 2014-03-25 | Anue Systems, Inc. | Systems and methods for precise event timing measurements |
US8533518B2 (en) | 2011-01-07 | 2013-09-10 | Anue Systems, Inc. | Systems and methods for precise timing measurements using high-speed deserializers |
US8788867B2 (en) | 2011-01-07 | 2014-07-22 | Anue Systems, Inc. | Systems and methods for playback of detected timing events |
US8850259B2 (en) | 2011-01-07 | 2014-09-30 | Anue Systems, Inc. | Systems and methods for precise generation of phase variation in digital signals |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1203019A (en) * | 1982-01-19 | 1986-04-08 | Tetsu Watanabe | Apparatus for recording and reproducing a digital signal |
DE3311677A1 (de) * | 1983-03-30 | 1984-10-04 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zur rueckgewinnung eines taktes aus einer signalfolge |
US5028824A (en) * | 1989-05-05 | 1991-07-02 | Harris Corporation | Programmable delay circuit |
US5124669A (en) * | 1990-09-18 | 1992-06-23 | Silicon Systems, Inc. | One-shot circuit for use in a PLL clock recovery circuit |
JPH0563525A (ja) * | 1991-08-29 | 1993-03-12 | Nec Corp | パルス幅可変回路 |
JPH0818414A (ja) * | 1994-04-26 | 1996-01-19 | Hitachi Ltd | 信号処理用遅延回路 |
JP3013713B2 (ja) * | 1994-08-16 | 2000-02-28 | 日本ビクター株式会社 | 情報信号処理方法 |
CA2204089C (en) * | 1997-04-30 | 2001-08-07 | Mosaid Technologies Incorporated | Digital delay locked loop |
US6628157B1 (en) * | 1997-12-12 | 2003-09-30 | Intel Corporation | Variable delay element for use in delay tuning of integrated circuits |
US6463092B1 (en) * | 1998-09-10 | 2002-10-08 | Silicon Image, Inc. | System and method for sending and receiving data signals over a clock signal line |
US6390579B1 (en) * | 1999-04-15 | 2002-05-21 | Hewlett-Packard Company | Pulse width modulator using delay-line technology with automatic calibration of delays to desired operating frequency |
JP3327256B2 (ja) * | 1999-06-17 | 2002-09-24 | 日本電気株式会社 | クロックリカバリ回路及び位相比較方法 |
JP3453133B2 (ja) * | 1999-08-16 | 2003-10-06 | 株式会社アドバンテスト | Ic試験装置のタイミング校正方法及びその校正方法を用いた校正機能を有するic試験装置 |
JP3921321B2 (ja) * | 2000-01-27 | 2007-05-30 | 株式会社ルネサステクノロジ | 記録メディア読み出しシステム |
US6448824B1 (en) * | 2000-09-29 | 2002-09-10 | Intel Corporation | Method and apparatus for integrated circuit power up |
JP4507459B2 (ja) * | 2001-02-26 | 2010-07-21 | ソニー株式会社 | ディレイロックループ回路、可変遅延回路および記録信号補償回路 |
US6721114B1 (en) * | 2001-05-09 | 2004-04-13 | Marvell International, Ltd. | Precompensation circuit for magnetic recording |
US7019926B2 (en) * | 2002-06-27 | 2006-03-28 | Hitachi Global Storage Technologies Netherlands B.V. | Self-servo-writing multi-slot timing pattern |
JP4113447B2 (ja) * | 2002-12-02 | 2008-07-09 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | ジッタ付加回路及び方法並びにパルス列生成回路及び方法 |
CN100521597C (zh) * | 2003-05-01 | 2009-07-29 | 三菱电机株式会社 | 时钟数据恢复电路 |
US7171601B2 (en) * | 2003-08-21 | 2007-01-30 | Credence Systems Corporation | Programmable jitter generator |
US7310752B2 (en) * | 2003-09-12 | 2007-12-18 | Micron Technology, Inc. | System and method for on-board timing margin testing of memory modules |
-
2005
- 2005-05-27 JP JP2005156464A patent/JP4418954B2/ja not_active Expired - Fee Related
-
2006
- 2006-05-22 US US11/439,405 patent/US7583460B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2006333272A (ja) | 2006-12-07 |
US7583460B2 (en) | 2009-09-01 |
US20060267650A1 (en) | 2006-11-30 |
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