JP4278046B2 - ヒータ機構付き静電チャック - Google Patents
ヒータ機構付き静電チャック Download PDFInfo
- Publication number
- JP4278046B2 JP4278046B2 JP2003379997A JP2003379997A JP4278046B2 JP 4278046 B2 JP4278046 B2 JP 4278046B2 JP 2003379997 A JP2003379997 A JP 2003379997A JP 2003379997 A JP2003379997 A JP 2003379997A JP 4278046 B2 JP4278046 B2 JP 4278046B2
- Authority
- JP
- Japan
- Prior art keywords
- chuck
- chuck body
- flat plate
- heater
- heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
11 グラファイト
12 PBN絶縁層
13 略カップ形状のチャック本体
13‘ 略ハット形状のチャック本体
13a 平板部
13b 側面部
13c 足部
14 チャック電極
15 ヒータ層
16 電力供給PG端子
17 オーバーコート層
18 熱反射板
19 ヒータ層
20 ポスト端子
21 ウエハ
Claims (2)
- 絶縁基材を用いて平板部と該平板部の周囲から下方に延長する側面部とを有するカップ形状のチャック本体を一体的に形成し、このチャック本体の平板部の表面側にチャック電極を設けるとともにその表面側および側面部外面側上端部にヒータ層を設け、チャック電極および各ヒータ層に個別に電力を供給するための端子をチャック本体の側面部の下端近辺に設け、且つ、チャック本体の側面部の内側に熱反射板を設けて平板部表面側のヒータ層の熱が下方に逃げることを防止するとともにチャック本体の外側にリング状の熱反射板を設けて側面部外面側上端部のヒータ層の熱が下方に逃げることを防止したことを特徴とするヒータ機構付き静電チャック。
- 絶縁基材を用いて平板部と該平板部の周囲から下方に延長する側面部と該側面部の下端から外方に延長する足部とを有するハット形状のチャック本体を一体的に形成し、このチャック本体の平板部の表面側にチャック電極を設けるとともにその表面側および側面部外面側上端部にヒータ層を設け、チャック電極および各ヒータ層に個別に電力を供給するための端子をチャック本体の足部に設け、且つ、チャック本体の側面部の内側に熱反射板を設けて平板部表面側のヒータ層の熱が下方に逃げることを防止するとともにチャック本体の外側にリング状の熱反射板を設けて側面部外面側上端部のヒータ層の熱が下方に逃げることを防止したことを特徴とするヒータ機構付き静電チャック。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003379997A JP4278046B2 (ja) | 2003-11-10 | 2003-11-10 | ヒータ機構付き静電チャック |
DE112004001044.6T DE112004001044B4 (de) | 2003-11-10 | 2004-11-09 | Elektrostatische Aufspannvorrichtung mit Heizvorrichtung |
CNB2004800141080A CN100444349C (zh) | 2003-11-10 | 2004-11-09 | 包括加热器装置的静电卡盘 |
KR1020057022861A KR20060097562A (ko) | 2003-11-10 | 2004-11-09 | 정전 척 |
PCT/US2004/037416 WO2005048341A1 (en) | 2003-11-10 | 2004-11-09 | Electrostatic chuck including a heater mechanism |
TW093134337A TW200532842A (en) | 2003-11-10 | 2004-11-10 | Electrostatic chuck including a heater mechanism |
US10/985,718 US7397648B2 (en) | 2003-11-10 | 2004-11-10 | Electrostatic chuck including a heater mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003379997A JP4278046B2 (ja) | 2003-11-10 | 2003-11-10 | ヒータ機構付き静電チャック |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005142496A JP2005142496A (ja) | 2005-06-02 |
JP4278046B2 true JP4278046B2 (ja) | 2009-06-10 |
Family
ID=34587236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003379997A Expired - Lifetime JP4278046B2 (ja) | 2003-11-10 | 2003-11-10 | ヒータ機構付き静電チャック |
Country Status (7)
Country | Link |
---|---|
US (1) | US7397648B2 (ja) |
JP (1) | JP4278046B2 (ja) |
KR (1) | KR20060097562A (ja) |
CN (1) | CN100444349C (ja) |
DE (1) | DE112004001044B4 (ja) |
TW (1) | TW200532842A (ja) |
WO (1) | WO2005048341A1 (ja) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3945527B2 (ja) * | 2004-11-30 | 2007-07-18 | 住友電気工業株式会社 | ウェハプローバ用ウェハ保持体およびそれを搭載したウェハプローバ |
JP2007042958A (ja) * | 2005-08-05 | 2007-02-15 | Sumitomo Electric Ind Ltd | ウェハプローバ用ウェハ保持体およびそれを搭載したウェハプローバ |
JP4524268B2 (ja) * | 2006-04-28 | 2010-08-11 | 信越化学工業株式会社 | 静電チャック機能付きセラミックヒーター及びその製造方法 |
TWI359473B (en) * | 2006-07-19 | 2012-03-01 | Ngk Insulators Ltd | Electrostatic chuck heater |
JP2008060245A (ja) * | 2006-08-30 | 2008-03-13 | Momentive Performance Materials Japan Kk | 基板加熱装置 |
US7772098B2 (en) | 2007-03-29 | 2010-08-10 | Panasonic Corporation | Method for manufacturing semiconductor device |
US7992877B2 (en) * | 2007-09-06 | 2011-08-09 | Kla-Tencor Corporation | Non contact substrate chuck |
KR101867646B1 (ko) | 2011-06-30 | 2018-06-14 | 모멘티브 파포만스 마테리아루즈 쟈판 고도가이샤 | 추적성이 표시된 제품 및 제품의 추적성을 표시하는 방법 |
JP5679226B2 (ja) * | 2011-06-30 | 2015-03-04 | モメンティブ・パフォーマンス・マテリアルズ・ジャパン合同会社 | トレーサビリティが表示されたpbnオーバーコート製品およびpbn製品に対するトレーサビリティ表示方法 |
CN110085546B (zh) * | 2013-08-05 | 2023-05-16 | 应用材料公司 | 用于薄基板搬运的静电载体 |
JP6441927B2 (ja) * | 2013-08-06 | 2018-12-19 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 局部的に加熱されるマルチゾーン式の基板支持体 |
WO2015153756A1 (en) * | 2014-04-01 | 2015-10-08 | Entegris, Inc. | Heated electrostatic chuck |
US10008404B2 (en) | 2014-10-17 | 2018-06-26 | Applied Materials, Inc. | Electrostatic chuck assembly for high temperature processes |
US10008399B2 (en) | 2015-05-19 | 2018-06-26 | Applied Materials, Inc. | Electrostatic puck assembly with metal bonded backing plate for high temperature processes |
CN107113921B (zh) * | 2015-08-20 | 2020-09-11 | 日本碍子株式会社 | 静电卡盘加热器 |
US10249526B2 (en) * | 2016-03-04 | 2019-04-02 | Applied Materials, Inc. | Substrate support assembly for high temperature processes |
US10957572B2 (en) | 2018-05-02 | 2021-03-23 | Applied Materials, Inc. | Multi-zone gasket for substrate support assembly |
CN110911332B (zh) * | 2018-09-14 | 2022-11-25 | 北京北方华创微电子装备有限公司 | 静电卡盘 |
CN113853513B (zh) * | 2019-05-21 | 2024-12-24 | 东华隆株式会社 | 温度调节单元 |
KR20220059742A (ko) | 2020-11-03 | 2022-05-10 | 삼성전자주식회사 | 온도 조절 부재를 포함하는 반도체 공정 설비 |
CN114496886A (zh) * | 2020-11-13 | 2022-05-13 | 新光电气工业株式会社 | 基板固定装置、静电吸盘和静电吸盘的制造方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5313048A (en) * | 1992-07-07 | 1994-05-17 | Morris Berg | High temperature research furnace with V-Shaped Guide Member |
JPH07297268A (ja) * | 1993-12-27 | 1995-11-10 | Shin Etsu Chem Co Ltd | 静電チャック付セラミックスヒーター |
JPH07307377A (ja) * | 1993-12-27 | 1995-11-21 | Shin Etsu Chem Co Ltd | 静電チャック付セラミックスヒーター |
JP2720381B2 (ja) | 1995-10-03 | 1998-03-04 | アドバンス・セラミックス・インターナショナル コーポレーション | 任意の電気抵抗率を有する熱分解窒化ホウ素成形体の製造方法 |
US5796074A (en) * | 1995-11-28 | 1998-08-18 | Applied Materials, Inc. | Wafer heater assembly |
JP4641569B2 (ja) * | 1998-07-24 | 2011-03-02 | 日本碍子株式会社 | 窒化アルミニウム質焼結体、耐蝕性部材、金属埋設および半導体保持装置 |
JP4505169B2 (ja) * | 1999-09-29 | 2010-07-21 | 東京エレクトロン株式会社 | 多重領域抵抗ヒータ |
EP1588404A2 (en) | 2003-01-17 | 2005-10-26 | General Electric Company | Wafer handling apparatus |
-
2003
- 2003-11-10 JP JP2003379997A patent/JP4278046B2/ja not_active Expired - Lifetime
-
2004
- 2004-11-09 KR KR1020057022861A patent/KR20060097562A/ko not_active Application Discontinuation
- 2004-11-09 DE DE112004001044.6T patent/DE112004001044B4/de not_active Expired - Lifetime
- 2004-11-09 CN CNB2004800141080A patent/CN100444349C/zh not_active Expired - Lifetime
- 2004-11-09 WO PCT/US2004/037416 patent/WO2005048341A1/en active Application Filing
- 2004-11-10 US US10/985,718 patent/US7397648B2/en active Active
- 2004-11-10 TW TW093134337A patent/TW200532842A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
CN1795551A (zh) | 2006-06-28 |
DE112004001044B4 (de) | 2016-12-15 |
WO2005048341A1 (en) | 2005-05-26 |
US7397648B2 (en) | 2008-07-08 |
TW200532842A (en) | 2005-10-01 |
DE112004001044T5 (de) | 2006-09-28 |
JP2005142496A (ja) | 2005-06-02 |
CN100444349C (zh) | 2008-12-17 |
US20060098379A1 (en) | 2006-05-11 |
KR20060097562A (ko) | 2006-09-14 |
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