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JP4265306B2 - Wafer delivery device - Google Patents

Wafer delivery device Download PDF

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Publication number
JP4265306B2
JP4265306B2 JP2003183940A JP2003183940A JP4265306B2 JP 4265306 B2 JP4265306 B2 JP 4265306B2 JP 2003183940 A JP2003183940 A JP 2003183940A JP 2003183940 A JP2003183940 A JP 2003183940A JP 4265306 B2 JP4265306 B2 JP 4265306B2
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JP
Japan
Prior art keywords
wafer
liquid
sealed container
valve
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2003183940A
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Japanese (ja)
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JP2005019779A (en
Inventor
義一 小澤
渡辺  勝
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Tokyo Seimitsu Co Ltd
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Tokyo Seimitsu Co Ltd
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

【0001】
【発明の属する技術分野】
本発明はウェーハ受渡し装置に関し、 特に化学的機械研磨(CMP:Chemical Mechanical Polishing )装置等に用いられ、搬送手段からウェーハを受取り、受取ったウェーハを別の搬送手段へ渡すウェーハ受渡し装置に関する。
【0002】
【従来の技術】
近年、半導体技術の発展により、デザインルールの微細化、多層配線化が進み、またコスト低減を進める上においてウェーハの大口径化も進行してきている。そのため、従来のようにパターンを形成した層の上にそのまま次の層のパターンを形成しようとした場合、前の層の凹凸のために次の層では良好なパターンを形成することが難しく、欠陥などが生じやすかった。
【0003】
そこで、パターンを形成した層の表面を平坦化し、その後で次の層のパターンを形成することが行われている。この場合、CMP法によるウェーハの研磨装置が用いられている。
【0004】
このCMP法によるウェーハの研磨装置として、表面に研磨パッドが貼付された円盤状の研磨定盤と、ウェーハの一面を保持してウェーハの他面を研磨パッドに当接させるウェーハキャリアとを有し、研磨定盤を回転させるとともにウェーハキャリアを回転させながらウェーハを研磨パッドに当接させ、研磨パッドとウェーハとの間に研磨剤であるスラリを供給しながらウェーハの他面を研磨するCMP装置が、一般に広く知られている。
【0005】
このCMP装置内にはウェーハを搬送する複数の搬送装置が組込まれ、ウェーハはこの複数の搬送装置によってCMP装置の各部に搬送されて研磨され、表面が平坦化される。また、1つの搬送装置と他の搬送装置との間のウェーハの受渡しのために、ウェーハ受渡しステージが組込まれている。
【0006】
このウェーハ受渡しステージとして、ウェーハの径より僅かに大径の凹部を有し、凹部の底面に給水口が設けられたステージであって、搬送装置からウェーハを受取る時は凹部の底面で受けるとともに凹部の側面で位置決めをし、ウェーハを別の搬送装置に渡す時は凹部に給水し、ウェーハをフローティングさせて持ち上げるようにしたロードステージが提案されている(例えば、特許文献1参照。)。
【0007】
【特許文献1】
特開2000−124174号公報
【0008】
【発明が解決しようとする課題】
ところが、CMP装置のようなスラリを用いるウエット加工の場合、研磨後のウェーハを研磨ヘッドのウェーハキャリアから受渡しをする際に、ウェーハはウェーハキャリアから均一に剥離されず斜めに落下することがある。このような場合、前述の特許文献1に記載されたウェーハ受渡しステージではウェーハのエッジが受渡しステージの底面に衝突し、エッジ部を損傷する恐れがあった。
【0009】
また、ウェーハが斜めに落下するためにステージの凹部の側面に乗り上げ、ウェーハの位置決めができないことがあった。更に、ウェーハを他の搬送装置に渡す時に、ウェーハが液体の表面から剥がれ難く、スムーズに受渡しできないという問題もあった。
【0010】
また、ウェーハ受渡しステージ内でウェーハをフローティングさせた液体を排水する時は、ステージの小型化のために、ステージに設けられた排水口の口径を大きくすることができず、排水に時間が掛かり、ウェーハの受け渡しに多大な時間を要していた。また、小径の排水口から短時間で排水する場合、ドレイン配管に真空ポンプを接続する方法も知られているが、この方法は排水手段としては大掛かりで、高価であるという欠点を有していた。
【0011】
このため、研磨後のウェーハを短時間で安定して受渡しする搬送系を実現するのは非常に困難であった。
【0012】
本発明は、このような事情に鑑みてなされたもので、ウェーハを搬送手段から受取る時に、ウエット加工されたウェーハであっても容易に衝撃を低く抑えた状態で受取ることができ、またウェーハを搬送手段に受渡す時に、短時間でウェーハを容易に剥離し易くし、安定して搬送装置に受け渡すことのできるウェーハ受渡し装置を提供することを目的とする。
【0013】
【課題を解決する為の手段】
ェーハを第1の搬送手段から受取り、受取ったウェーハを第2の搬送手段へ渡すウェーハ受渡し装置において、内部に液体を貯留可能な受渡しステージと、該受渡しステージ内に液体を供給する給液手段と、前記受渡しステージ内の液体を排出する排液手段と、前記受渡しステージ内に設けられ、受渡しステージ内の液体が排出された時に前記ウェーハを支持する支持部材とを有し、前記排液手段は、予め液体が貯留される密閉容器と、前記受渡しステージの下部に設けられたドレインパイプと、前記ドレインパイプと接続され、前記密閉容器の上部に設けられる第1の弁と、前記密閉容器の下部に設けられ前記第1の弁よりも口径の大きい第2の弁と、前記第2の弁が設けられた前記第1の弁よりも口径の大きい排液口と、を備え前記ウェーハを前記第1の搬送手段から受取る時は前記液体の液面でウェーハを受取り、前記ウェーハを第2の搬送手段に渡す時は、前記第1の弁を開放するとともに前記第2の弁を開放し、該排液口から前記密閉容器内に予め貯留されていた液体を排出して前記密閉容器内を減圧させることにより前記受渡しステージ内の液体を前記密閉容器内に排出させ前記ウェーハを前記支持部材で支持した状態で渡すことを特徴としている。
【0014】
請求項1の発明によれば、ウェーハを受取る時は液面で受取り、受け渡す時には液体を急速に排出して液体の表面張力の影響をなくすので、短時間で安定して受け渡すことができる。
【0020】
【発明の実施の形態】
以下添付図面に従って本発明に係るウェーハ受渡し装置の好ましい実施の形態について詳説する。尚各図において、同一の部材については同一の番号又は記号を付している。
【0021】
図1、及び図2はウェーハ受渡し装置の実施形態を表わす概念図であり、図1は第1の搬送手段からウェーハを受取る状態を表わし、図2は第2の搬送手段にウェーハを渡す状態を表わしている。
【0022】
ウェーハ受渡し装置10は、内部に液体を貯留可能な受渡しステージ11、受渡しステージ11に設けられた複数の支持部材12、12、…、受渡しステージ11内に貯留された液体である純水13、及び給水パイプ14Aを介して受渡しステージ11内に純水13を給水する給液手段である純水供給源15、及びドレインパイプを介して受渡しステージ11内の純水13を急速に排水する密閉容器(急速排液手段)16等で構成されている。
【0023】
受渡しステージ11は、円形の凹部を有しており、凹部の内径は受け渡しするウェーハWの外径よりも僅かに大径になっていて、ウェーハWはここでセンタリングされるようになっている。
【0024】
純水供給源15は、図示しない純水製造装置、純水タンク、供給ポンプ等からなっており、電磁弁15Aを介して給水チューブ15Bで受渡しステージ11の給水パイプ14Aに接続され、受渡しステージ11の凹部に純水13を供給する。
【0025】
受渡しステージ11の凹部の底部に設けられた支持部材12、12、…は円周上に等間隔で6個配置され、底部から2〜3mm突出している。受渡しステージ11内に貯留する純水13は、支持部材12、12、…の先端が約2mm埋没する深さまで注水するのが好ましい。
【0026】
急速排液手段である密閉容器16には予め十分な純水13が貯留されている。また、密閉容器16は、底部に大口径の排液口16Dが形成されており、大口径の排液口16Dには大口径の排水弁である大口径電磁弁16Aが取付けられ、内部に貯留されている純水13を急速に排水することができる。
【0027】
また、密閉容器16は、上面に取付けられた電磁弁16Bを介してドレインチューブ16Cで受渡しステージ11のドレインパイプ14Bに接続され、受渡しステージ11の凹部に貯留された純水13を密閉容器16内に排水できるようになっている。
【0028】
この密閉容器16は、ドレインチューブ16Cで受渡しステージ11と接続されているので、必ずしも受渡しステージ11の直近に配置する必要はなく、スペース的に余裕のある場所に設置すればよい。従って、受渡しステージ11が狭いスペースに設けられていても容易に接続できる。
【0029】
次に、このように構成されたウェーハ受渡し装置10の作用について説明する。最初に第1の搬送装置である研磨ヘッドのウェーハキャリア31からウェーハWを受取る時は、図1に示すように、先ず密閉容器16の電磁弁16Bが閉じ、次いで給液手段である純水供給源15に設けられた電磁弁15Aが開き、受渡しステージ11は、純水供給源15よって前述の深さまで純水13が注水されて待機している。
【0030】
次に加工済みのウェーハWを吸着したウェーハキャリア31が受渡しステージ11の上方まで移動し、純水13の液面近くまで下降してからウェーハWの吸着を解除する。ウェーハWがウェーハキャリア31から均等に剥離されずに傾いて落下しても、純水13の液面に衝撃を低く抑えた状態で着水(以下この状態を軟着陸と称する)して、受渡しステージ11の凹部にセンタリングされた状態で保持される。
【0031】
次に、ウェーハWをウェーハ受渡し装置10から第2の搬送手段41に受け渡す時は、図2に示すように、密閉容器16の電磁弁16Bが開くとともに大口径電磁弁16Aが開く。大口径電磁弁16Aが開くと密閉容器16内に貯留されていた純水13が大口径の排液口16Dから急速に外部に排水される。すると密閉容器16内が減圧状態になるので、受渡しステージ11内に貯留されていた純水13が急速に密閉容器16内に流入し、受渡しステージ11内の純水13が完全に排水される。
【0032】
密閉容器16内の純水13を、受渡しステージ11内に貯留されていた純水13の量と同量だけ排水した時点で大口径電磁弁16Aが閉じられる。これにより前述の動作を繰返し行っても、密閉容器16内には常に所定量の純水13が貯留されることになる。
【0033】
前述のようにして、受渡しステージ11内の純水13が排水されると、ウェーハWは支持部材12、12、…に支持される。この状態で第2の搬送手段41の吸着ヘッド41Aが下降し、ウェーハWを吸着して搬送する。この時、支持部材12、12、…の先端とウェーハWとの接触面積が微小であるため、ウェーハWが濡れていても表面張力の影響は無視でき、ウェーハWを容易に受け渡すことができる。
【0034】
このようにウェーハWを第1の搬送手段である研磨ヘッドのウェーハキャリア31から受取る時は、ウェーハWを受渡しステージ11内に貯留された純水13の水面に軟着陸させ、衝撃を抑えた状態で受取ることができる。
【0035】
また、ウェーハWをウェーハ受渡し装置10から第2の搬送手段41に渡す時は、急速排液手段である密閉容器16で受渡しステージ11内に貯留された純水13を急速に排水し、ウェーハWを支持部材12、12、…に支持させた状態で渡すので、純水13の表面張力の影響がなくなり、ウェーハWを容易に渡すことができる。
【0036】
なお、前述の実施の形態では、液体として純水13を用いたが、本発明はこれに限らず、被加工面を汚染したり化学反応を起こさせたりしないものなら種々の液体が使用可能である。
【0037】
また、ウェーハWをウェーハ受渡し装置10から第2の搬送手段41に渡す時に、受渡しステージ11内に貯留された純水13を完全に排水したが、完全には排水せずにウェーハWと純水13との接触が断たれるか、又は接触面積が減少する水位まで排水するようにしてもよい。
【0038】
【発明の効果】
以上説明したように本発明によれば、ウェーハを搬送手段からウェーハ受渡し装置に受取る時は、液体の液面でウェーハを受取るので、ウエット加工されたウェーハで搬送手段から剥がれ難く斜めに落下しても、衝撃を低く抑えた状態で容易にウェーハ受渡し装置に載置させることができる。
【0039】
また、ウェーハをウェーハ受渡し装置から搬送手段に渡す時は、ウェーハ受渡し装置の受渡しステージ内に貯留されていた液体を急速に排出して、液体とウェーハとの接触を断つか又は接触面積を減少させ、ウェーハを載置面から剥がれやすい状態にして渡すので、ウェーハを短時間で安定して搬送手段に渡すことができる。
【図面の簡単な説明】
【図1】本発明の実施の形態に係るウェーハ受渡し装置のウェーハを受取る状態を表わす概念図
【図2】本発明の実施の形態に係るウェーハ受渡し装置のウェーハを渡す状態を表わす概念図
【符号の説明】
10…ウェーハ受渡し装置、11…受渡しステージ、12…支持部材、13…純水(液体)、14B…ドレインパイプ、15…純水供給源(給液手段)、16…密閉容器(急速排液手段)、16A…大口径電磁弁(大口径の排水弁)、16D…大口径の排液口、31…ウェーハキャリア(第1の搬送手段)、41…第2の搬送手段、W…ウェーハ
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a wafer delivery apparatus, and more particularly to a wafer delivery apparatus that is used in a chemical mechanical polishing (CMP) apparatus and the like, receives a wafer from a transfer means, and passes the received wafer to another transfer means.
[0002]
[Prior art]
In recent years, with the development of semiconductor technology, the miniaturization of design rules and the increase in the number of multilayer wirings have progressed, and the wafer diameter has been increased in order to reduce costs. Therefore, when trying to form the pattern of the next layer as it is on the layer where the pattern is formed as in the past, it is difficult to form a good pattern in the next layer due to the unevenness of the previous layer, It was easy to occur.
[0003]
Therefore, the surface of the layer on which the pattern is formed is flattened, and then the pattern of the next layer is formed. In this case, a wafer polishing apparatus using a CMP method is used.
[0004]
As a wafer polishing apparatus by this CMP method, a disk-shaped polishing surface plate having a polishing pad affixed to the surface, and a wafer carrier that holds one surface of the wafer and makes the other surface of the wafer contact the polishing pad A CMP apparatus that polishes the other surface of the wafer while rotating the polishing platen and bringing the wafer into contact with the polishing pad while rotating the wafer carrier and supplying a slurry as an abrasive between the polishing pad and the wafer. Generally known widely.
[0005]
A plurality of transfer devices for transferring a wafer are incorporated in the CMP apparatus, and the wafer is transferred to each part of the CMP apparatus by the plurality of transfer apparatuses and polished to flatten the surface. In addition, a wafer delivery stage is incorporated for delivering a wafer between one transfer device and another transfer device.
[0006]
The wafer delivery stage is a stage having a concave portion slightly larger than the diameter of the wafer and provided with a water supply port on the bottom surface of the concave portion. When receiving the wafer from the transfer device, the concave portion is received on the bottom surface of the concave portion. A load stage has been proposed in which positioning is performed on the side of the wafer and water is supplied to the recess when the wafer is transferred to another transfer device, and the wafer is floated and lifted (see, for example, Patent Document 1).
[0007]
[Patent Document 1]
Japanese Patent Laid-Open No. 2000-124174
[Problems to be solved by the invention]
However, in the case of wet processing using a slurry such as a CMP apparatus, when the polished wafer is transferred from the wafer carrier of the polishing head, the wafer may fall off obliquely without being uniformly peeled from the wafer carrier. In such a case, in the wafer delivery stage described in Patent Document 1, the edge of the wafer may collide with the bottom surface of the delivery stage and damage the edge portion.
[0009]
In addition, since the wafer falls obliquely, the wafer rides on the side surface of the concave portion of the stage, and the wafer may not be positioned. Further, when the wafer is transferred to another transfer device, there is a problem that the wafer is not easily peeled off from the surface of the liquid and cannot be transferred smoothly.
[0010]
Also, when draining the liquid that floats the wafer in the wafer delivery stage, the diameter of the drain port provided on the stage cannot be increased due to the miniaturization of the stage, and draining takes time. It took a lot of time to deliver the wafer. Also, when draining from a small-diameter drain in a short time, a method of connecting a vacuum pump to the drain pipe is also known, but this method has a disadvantage that it is large as a draining means and is expensive. .
[0011]
For this reason, it has been very difficult to realize a transfer system that stably delivers a polished wafer in a short time.
[0012]
The present invention has been made in view of such circumstances, and when a wafer is received from a transfer means, even a wet-processed wafer can be easily received in a state where the impact is kept low. It is an object of the present invention to provide a wafer transfer device that can easily peel off a wafer in a short time when it is transferred to a transfer means and can be transferred stably to a transfer device.
[0013]
[Means for solving the problems]
The c Eha receive from the first conveying means, the wafer transfer device that passes a wafer received to the second conveying means, and transfer stage capable of storing the liquid therein, liquid supply means for supplying liquid into the receiving pass stage If has a drainage unit that issues discharge the liquid in the transfer stage, is provided in the delivery in stage, and a support member for supporting the wafer when the liquid in the transfer stage is discharged, said effluent The means includes a sealed container in which liquid is stored in advance, a drain pipe provided at a lower part of the delivery stage, a first valve connected to the drain pipe and provided at an upper part of the sealed container, and the sealed container wherein c comprises between large second valve aperture than the first valve provided at the lower portion, and a large drain port of diameter than the said second valve is provided first valve When receiving the Doha from said first conveying means receives the wafer in the liquid surface of the liquid, when passing the wafer to the second conveying means, said second valve while opening the first valve The liquid stored in the sealed container is discharged from the drainage port and the inside of the sealed container is depressurized to discharge the liquid in the delivery stage into the sealed container. It is characterized by passing in a state of being supported by the support member.
[0014]
According to the first aspect of the present invention, when the wafer is received, it is received at the liquid level. When the wafer is transferred, the liquid is rapidly discharged to eliminate the influence of the surface tension of the liquid, so that the wafer can be transferred stably in a short time. .
[0020]
DETAILED DESCRIPTION OF THE INVENTION
A preferred embodiment of a wafer delivery apparatus according to the present invention will be described in detail below with reference to the accompanying drawings. In addition, in each figure, the same number or the code | symbol is attached | subjected about the same member.
[0021]
1 and 2 are conceptual diagrams showing an embodiment of a wafer delivery apparatus. FIG. 1 shows a state in which a wafer is received from a first transfer means, and FIG. 2 shows a state in which the wafer is delivered to a second transfer means. It represents.
[0022]
The wafer delivery apparatus 10 includes a delivery stage 11 capable of storing a liquid therein, a plurality of support members 12, 12,... Provided in the delivery stage 11, pure water 13 that is a liquid stored in the delivery stage 11, and A pure water supply source 15 which is a liquid supply means for supplying pure water 13 into the delivery stage 11 via the water supply pipe 14A, and a sealed container for rapidly draining the pure water 13 within the delivery stage 11 via the drain pipe ( (Rapid draining means) 16 and the like.
[0023]
The delivery stage 11 has a circular recess, and the inner diameter of the recess is slightly larger than the outer diameter of the wafer W to be delivered, and the wafer W is centered here.
[0024]
The pure water supply source 15 includes a pure water production apparatus, a pure water tank, a supply pump, and the like (not shown). The pure water supply source 15 is connected to the water supply pipe 14A of the delivery stage 11 through a solenoid valve 15A through a water supply tube 15B. Pure water 13 is supplied to the recess.
[0025]
Six support members 12, 12,... Provided at the bottom of the recess of the delivery stage 11 are arranged at equal intervals on the circumference and protrude from the bottom by 2 to 3 mm. The pure water 13 stored in the delivery stage 11 is preferably poured to a depth at which the tips of the support members 12, 12,.
[0026]
Sufficient pure water 13 is stored in advance in a sealed container 16 serving as a quick drain means. The sealed container 16 has a large-diameter drainage port 16D formed at the bottom, and a large-diameter drainage port 16D is provided with a large-diameter solenoid valve 16A, which is a large-diameter drain valve, and is stored inside. The purified pure water 13 can be drained rapidly.
[0027]
The sealed container 16 is connected to the drain pipe 14B of the delivery stage 11 by a drain tube 16C via a solenoid valve 16B attached to the upper surface, and the pure water 13 stored in the recess of the delivery stage 11 is passed through the sealed container 16 inside. It can be drained.
[0028]
Since the sealed container 16 is connected to the delivery stage 11 by the drain tube 16C, it is not always necessary to place the sealed container 16 in the immediate vicinity of the delivery stage 11, and it may be installed in a place with sufficient space. Therefore, even if the delivery stage 11 is provided in a narrow space, it can be easily connected.
[0029]
Next, the operation of the wafer delivery apparatus 10 configured as described above will be described. When the wafer W is first received from the wafer carrier 31 of the polishing head as the first transfer device, as shown in FIG. 1, first, the electromagnetic valve 16B of the hermetic container 16 is closed, and then pure water supply as a liquid supply means is provided. The electromagnetic valve 15A provided in the source 15 is opened, and the delivery stage 11 is on standby with the pure water 13 being poured into the above-described depth by the pure water supply source 15.
[0030]
Next, the wafer carrier 31 adsorbing the processed wafer W moves to above the delivery stage 11 and descends to near the liquid surface of the pure water 13, and then the adsorption of the wafer W is released. Even if the wafer W is tilted and dropped from the wafer carrier 31 without being evenly separated, the wafer W is landed on the liquid surface of the pure water 13 with a low impact (hereinafter referred to as soft landing), and a delivery stage. 11 is held in the centered state in the recess.
[0031]
Next, when the wafer W is transferred from the wafer transfer apparatus 10 to the second transfer means 41, as shown in FIG. 2, the electromagnetic valve 16B of the sealed container 16 is opened and the large-diameter electromagnetic valve 16A is opened. When the large-diameter solenoid valve 16A is opened, the pure water 13 stored in the sealed container 16 is rapidly drained to the outside from the large-diameter drain port 16D. Then, since the inside of the sealed container 16 is in a reduced pressure state, the pure water 13 stored in the delivery stage 11 rapidly flows into the sealed container 16 and the pure water 13 in the delivery stage 11 is completely drained.
[0032]
When the pure water 13 in the sealed container 16 is drained by the same amount as that of the pure water 13 stored in the delivery stage 11, the large-diameter solenoid valve 16A is closed. Thereby, even if the above-described operation is repeated, a predetermined amount of pure water 13 is always stored in the sealed container 16.
[0033]
As described above, when the pure water 13 in the delivery stage 11 is drained, the wafer W is supported by the support members 12, 12,. In this state, the suction head 41A of the second transfer means 41 is lowered to suck and transfer the wafer W. At this time, since the contact area between the tips of the support members 12, 12,... And the wafer W is very small, even if the wafer W is wet, the influence of the surface tension can be ignored and the wafer W can be easily transferred. .
[0034]
As described above, when the wafer W is received from the wafer carrier 31 of the polishing head which is the first transfer means, the wafer W is softly landed on the surface of the pure water 13 stored in the delivery stage 11 and the impact is suppressed. You can receive it.
[0035]
Further, when the wafer W is transferred from the wafer transfer apparatus 10 to the second transfer means 41, the pure water 13 stored in the transfer stage 11 is rapidly drained by the sealed container 16 which is a quick drain means, and the wafer W is discharged. Are supported in a state of being supported by the support members 12, 12,..., The influence of the surface tension of the pure water 13 is eliminated, and the wafer W can be easily delivered.
[0036]
In the above-described embodiment, pure water 13 is used as the liquid. However, the present invention is not limited to this, and various liquids can be used as long as they do not contaminate the surface to be processed or cause a chemical reaction. is there.
[0037]
Further, when the wafer W is transferred from the wafer transfer apparatus 10 to the second transfer means 41, the pure water 13 stored in the transfer stage 11 is completely drained, but the wafer W and the pure water are not drained completely. You may make it drain to the water level from which the contact with 13 is cut | disconnected or a contact area reduces.
[0038]
【The invention's effect】
As described above, according to the present invention, when the wafer is received from the transfer means to the wafer delivery device, the wafer is received at the liquid level. However, it can be easily placed on the wafer delivery device with the impact kept low.
[0039]
Also, when the wafer is transferred from the wafer transfer device to the transfer means, the liquid stored in the transfer stage of the wafer transfer device is quickly discharged to cut off the contact between the liquid and the wafer or reduce the contact area. Since the wafer is transferred in a state in which it is easily peeled off from the mounting surface, the wafer can be stably transferred to the transfer means in a short time.
[Brief description of the drawings]
FIG. 1 is a conceptual diagram showing a state of receiving a wafer in a wafer delivery apparatus according to an embodiment of the present invention. FIG. 2 is a conceptual diagram showing a state of delivering a wafer in the wafer delivery apparatus according to an embodiment of the invention. Explanation of]
DESCRIPTION OF SYMBOLS 10 ... Wafer delivery apparatus, 11 ... Delivery stage, 12 ... Support member, 13 ... Pure water (liquid), 14B ... Drain pipe, 15 ... Pure water supply source (liquid supply means), 16 ... Sealed container (rapid drainage means) ), 16A ... Large-diameter solenoid valve (large-diameter drain valve), 16D ... Large-diameter drain port, 31 ... Wafer carrier (first transfer means), 41 ... Second transfer means, W ... Wafer

Claims (1)

ウェーハを第1の搬送手段から受取り、受取ったウェーハを第2の搬送手段へ渡すウェーハ受渡し装置において、
内部に液体を貯留可能な受渡しステージと、
該受渡しステージ内に液体を供給する給液手段と、
前記受渡しステージ内の液体を排出する排液手段と、
前記受渡しステージ内に設けられ、受渡しステージ内の液体が排出された時に前記ウェーハを支持する支持部材とを有し、
前記排液手段は、
予め液体が貯留される密閉容器と、
前記受渡しステージの下部に設けられたドレインパイプと、
前記ドレインパイプと接続され、前記密閉容器の上部に設けられる第1の弁と、
前記密閉容器の下部に設けられ前記第1の弁よりも口径の大きい第2の弁と、
前記第2の弁が設けられた前記第1の弁よりも口径の大きい排液口と、を備え
前記ウェーハを前記第1の搬送手段から受取る時は前記液体の液面でウェーハを受取り、
前記ウェーハを第2の搬送手段に渡す時は、前記第1の弁を開放するとともに前記第2の弁を開放し、該排液口から前記密閉容器内に予め貯留されていた液体を排出して前記密閉容器内を減圧させることにより前記受渡しステージ内の液体を前記密閉容器内に排出させ前記ウェーハを前記支持部材で支持した状態で渡すことを特徴とするウェーハ受渡し装置。
In a wafer transfer apparatus that receives a wafer from a first transfer means and passes the received wafer to a second transfer means,
A delivery stage capable of storing liquid inside;
Liquid supply means for supplying liquid into the delivery stage;
And drainage means that issues discharge the liquid in the transfer stage,
A support member that is provided in the delivery stage and supports the wafer when the liquid in the delivery stage is discharged;
The drainage means is
A sealed container in which liquid is stored in advance;
A drain pipe provided at a lower portion of the delivery stage;
A first valve connected to the drain pipe and provided at the top of the sealed container;
A second valve provided at a lower portion of the sealed container and having a larger diameter than the first valve;
When receiving the wafer and a large drain port of diameter than the said second valve is provided first valve from said first conveying means receives the wafer in the liquid surface of the liquid,
When passing the wafer to the second transfer means, the first valve is opened and the second valve is opened, and the liquid previously stored in the sealed container is discharged from the drain port. Then, the inside of the sealed container is decompressed to discharge the liquid in the delivery stage into the sealed container, and the wafer is delivered in a state of being supported by the support member.
JP2003183940A 2003-06-27 2003-06-27 Wafer delivery device Expired - Fee Related JP4265306B2 (en)

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