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JP3433490B2 - Chip-shaped solid electrolytic capacitors - Google Patents

Chip-shaped solid electrolytic capacitors

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Publication number
JP3433490B2
JP3433490B2 JP32829993A JP32829993A JP3433490B2 JP 3433490 B2 JP3433490 B2 JP 3433490B2 JP 32829993 A JP32829993 A JP 32829993A JP 32829993 A JP32829993 A JP 32829993A JP 3433490 B2 JP3433490 B2 JP 3433490B2
Authority
JP
Japan
Prior art keywords
solid electrolytic
anode
lead frame
electrolytic capacitor
capacitor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP32829993A
Other languages
Japanese (ja)
Other versions
JPH07183170A (en
Inventor
一美 内藤
幸治 松村
Original Assignee
昭和電工株式会社
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Filing date
Publication date
Application filed by 昭和電工株式会社 filed Critical 昭和電工株式会社
Priority to JP32829993A priority Critical patent/JP3433490B2/en
Publication of JPH07183170A publication Critical patent/JPH07183170A/en
Application granted granted Critical
Publication of JP3433490B2 publication Critical patent/JP3433490B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)

Description

【発明の詳細な説明】 【0001】 【産業上の利用分野】本発明はチップ状固体電解コンデ
ンサに関する。 【0002】 【従来の技術】従来のチップ状固体電解コンデンサは、
図4及び図5に示すように表面に誘電体酸化皮膜層2を
有するアルミニウム、タンタル、ニオブ等の弁作用金属
からなる平板状の陽極基体1の表面に陽極部となる一部
を除いて半導体層3及び導電体層4を順次積層した固体
電解コンデンサ素子5(以下コンデンサ素子と称する)
を形成し、次いでこのコンデンサ素子5をリードフレー
ム6に接続するが、リードフレーム6の2ヶ所の凸部6
a、6bを間隔をおいて対向させ、それぞれの凸部6
a、6bに前記コンデンサ素子5の陽極部7と導電体層
形成部8を載置している。 【0003】そして前者は熔接9などで、後者は銀ペー
スト等の導電材10でリードフレーム6の凸部6a、6
bに電気的、かつ機械的に接続した後、外装樹脂で封止
して、チップ状固体電解コンデンサが構成されている。
そしてこの封口した固体電解コンデンサは、容量等の電
気性能を満たすことが要求され、さらに負荷テスト、耐
湿テスト等の抜き取り検査が合格したものを製品として
いる。 【0004】 【発明が解決しようとする課題】前述したコンデンサ素
子は、耐湿テスト時、湿気がリードフレームから進入
し、コンデンサ素子の誘電体酸化皮膜層近くまで接近
し、作製したコンデンサの容量並びにtanδ値を上昇
させるという欠点があった。このような欠点を防ぐため
に、コンデンサ素子を耐水性の樹脂で覆うことが考えら
れているが、作業性が悪く、またコスト上の問題があっ
た。 【0005】 【課題を解決するための手段】本発明は、前述した問題
点を解決するためになされたものであって、その要旨は
陽極部と導電体層形成部を有する固体電解コンデンサ素
子の前記陽極部と導電体層形成部の一方の面とが一対の
対向して配置された凸部を有するリードフレームの前記
凸部にそれぞれ載置して接合されているチップ状固体電
解コンデンサにおいて、前記リードフレームの陽極部が
載置される側の凸部の先端部に切り欠き部が設けられて
おり、残部に前記コンデンサ素子の陽極部が載置接合さ
れているチップ状固体電解コンデンサにある。 【0006】以下、本発明について詳細に説明する。本
発明において固体電解コンデンサの陽極として用いられ
る弁作用を有する陽極基体としては、例えばアルミニウ
ム、タンタル、及びこれらを基質とする合金等、弁作用
を有する金属がいずれも使用できる。そして陽極基体の
形状としては、平板状のアルミニウムの箔や板があげら
れる。陽極基体の表面に設ける誘電体酸化皮膜層は、弁
作用金属の表面部分に設けられた弁作用金属自体の酸化
物層であってもよく、或は、弁作用金属箔の表面上に設
けられた他の誘電体酸化物の層であってもよいが、特に
弁作用金属自体の酸化物からなる層であることが望まし
い。 【0007】本発明では、表面に誘電体酸化皮膜層が形
成された平板状の陽極基体の端部の一区画に陽極部が設
けられており、陽極部とした以外の残りの誘電体酸化皮
膜層上に半導体層を形成させているが、半導体層の種類
には特に制限はなく、従来公知の半導体層が使用でき
る。この中でとりわけ本願出願人の出願による二酸化鉛
と硫酸鉛からなる半導体層(特開昭62−256423
号公報、特開昭63−51621号公報)が、作製した
固体電解コンデンサの高周波性能が良好なために好まし
い。また、テトラチオテトラセンとクロラニルの錯体を
半導体層として形成させる方法(特開昭62−2912
3号公報)、複素5員環高分子化合物にドーパントをド
ープした電導性高分子化合物からなる半導体層(特開昭
60−37114号公報)もその一例である。そしてこ
のような半導体層上には、例えばカーボンペースト及び
/又は銀ペースト等の従来公知の導電ペーストを積層し
て導電体層を形成して導電体層形成部を構成している。 【0008】また本発明においては、前述した陽極部と
導電体層形成部との界面に絶縁性樹脂によってはち巻き
状に樹脂層部をあらかじめ形成しておくと半導体層を形
成するときに半導体層の形成面積が一定しバラツキの少
ない容量のものが得られる。次に、このように導電体層
まで形成されたコンデンサ素子を一対の対向して配置さ
れたリードフレームに接続する方法を説明する。図1
は、固体電解コンデンサ素子5をリードフレーム6に接
続した状態を示す平面図である。図1において、陽極基
体1の表面に誘電体酸化皮膜層2が形成されており、そ
の上に半導体層3、さらにその上に導電体層4が形成さ
れた固体電解コンデンサ素子5の陽極部7と導電体層形
成部8とがリードフレーム6の各凸部6a、6bに各々
載置接合されているが、陽極部7はリードフレームの凸
部6aの先端部に切り欠き部11を設け、残部12に載
置接合されている。図2は、図1の断面図である。 【0009】本願発明において、リードフレームの陽極
部が載置される側の凸部の先端部に切り欠き部を設けた
のは、陽極部側からの湿気の進入が、導電体層形成部側
からよりも多く切り欠き部を設ける効果が大きいからで
ある。従って、必要に応じて導電体層形成部が載置され
る側のリードフレーム凸部の先端部にも切り欠き部を設
けてもよいことはいうまでもない。 【0010】リードフレームの凸部6aの先端部に設け
られる切り欠き部11の形状及び寸法は固体電解コンデ
ンサ素子5の寸法、陽極部7の寸法、リードフレームの
凸部の寸法等によって変化するので一概に決定できない
が、後述する封止後に、外部からの湿気の進入を緩和さ
せるために、切り欠き部11を設けた後の残部12の形
状、寸法を可能なかぎり小さくすることと、残部12を
小さくすることによる陽極部接続の不良発生という背反
することとの両者を充分に吟味して設計することが肝要
である。図3にリードフレームの凸部6aの先端部に設
けた切り欠き部11の形状の4例を示したが、本願発明
はこれらに限定されるものではない。図3において、コ
ンデンサ素子5の陽極部7は、切り欠き部を設けた後の
残部12に載置される。リードフレーム凸部6aに設け
る切り欠き部の個数は複数個であってもよい。 【0011】このようにしてリードフレームに載置され
たコンデンサ素子は、陽極部は熔接、導電ペースト、半
田等で接続し、一方導電体層形成部は導電ペースト、半
田等で接続した後、リードフレームの一部を残して、エ
ポキシ樹脂等の外装樹脂13により、トランスファー成
形機などで封止成形を行った後、リードフレームの凸部
をコンデンサ素子の近辺で切断してチップ状の固体電解
コンデンサとしている。 【0012】 【作用】コンデンサ素子の陽極部と、リードフレームと
の接続をリードフレームの凸部の先端部に設けた切り欠
き部の残部で行っているので、リードフレームを介し
て、湿気が誘電体酸化皮膜層に進入することが緩和され
る。 【0013】 【実施例】以下、実施例および比較例を示して本発明を
さらに詳しく説明する。 実施例1〜4 りん酸とりん酸アンモニウム水溶液中で化成処理して表
面に誘電体酸化皮膜層を形成した45μF/cm2 のア
ルミニウムエッチング箔(以下、化成箔と称する。)の
小片4mm×3mmを用意した。この化成箔の端から1
mm×3mmの部分を陽極部とし、残りの3mm×3m
mの部分を酢酸鉛三水和物2.4モル/l水溶液と過硫
酸アンモニウム4.0モル/l水溶液の混合液に浸漬
し、60℃で20分放置し、二酸化鉛と硫酸鉛からなる
半導体層を形成した。このような操作を3回行った後、
半導体層上にカーボンペーストおよび銀ペーストを順に
積層して導電体層を形成し、コンデンサ素子を作製し
た。一方別に用意したリードフレーム(材質42アロ
イ、半田メッキ、厚み0.1mm、凸部の寸法:幅3.
0mm、凸部の先端間隔0.5mm)の一方の凸部先端
に表1に示した寸法の切り欠き部を設け、残部にコンデ
ンサ素子の陽極部を載置し、他方の凸部にコンデンサ素
子の導電体層形成部の一方の面を載置し、前者は熔接
で、後者は銀ペーストで接続した。その後、エポキシ樹
脂を用いてトランスファー成形して外形寸法7mm×4
mm×3mmのチップ状固体電解コンデンサを作製し
た。 【0014】実施例5〜8 実施例1〜4で、半導体層を酢酸鉛三水和物2.0モル
/l水溶液に化成箔を浸漬して、別に用意した白金陰極
との間で電気化学的に形成した二酸化鉛にした以外は、
実施例1〜4と同様にしてチップ状固体電解コンデンサ
をそれぞれ作製した。 【0015】比較例1 実施例1で、リードフレームに切り欠き部を設けずにコ
ンデンサ素子の陽極部をリードフレームの凸部に載置接
続した以外は実施例1と同様にしてチップ状固体電解コ
ンデンサを作製した。以上のように作製した直後の固体
電解コンデンサの性能及び85℃、85%RHの耐湿テ
ストを200時間行った後のコンデンサの性能を表2に
示した。なお、各実施例又は比較例は全数値n=50点
の平均値である。 【0016】なお、これまで単層の固体電解コンデンサ
を例にとって本発明の内容を具体的に説明してきたが、
本発明は積層の固体電解コンデンサにも適用できること
はいうまでもない。 【0017】 【表1】 【0018】 【表2】【0019】 【発明の効果】本発明のチップ状固体電解コンデンサ
は、コンデンサ素子の陽極部をリードフレームの凸部の
先端部に切り欠き部を設け残部に接続させているため、
耐湿テスト後の容量とtanδ値の上昇がおさえられ
る。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip solid electrolytic capacitor. [0002] A conventional chip-shaped solid electrolytic capacitor is
As shown in FIGS. 4 and 5, the surface of a flat plate-shaped anode substrate 1 made of a valve metal such as aluminum, tantalum, or niobium having a dielectric oxide film layer 2 on the surface thereof except for a part serving as an anode portion is formed of a semiconductor. Solid electrolytic capacitor element 5 in which layer 3 and conductor layer 4 are sequentially laminated (hereinafter referred to as capacitor element)
Is formed, and this capacitor element 5 is connected to a lead frame 6.
a and 6b are opposed to each other with an interval, and
The anode part 7 and the conductor layer forming part 8 of the capacitor element 5 are mounted on a and 6b. [0003] The former is a welding 9 or the like, and the latter is a conductive material 10 such as silver paste or the like.
After being electrically and mechanically connected to b, the chip-shaped solid electrolytic capacitor is formed by sealing with an exterior resin.
The sealed solid electrolytic capacitor is required to satisfy electrical performance such as capacity and the like, and is a product that has passed a sampling test such as a load test and a moisture resistance test. In the above-described capacitor element, during the moisture resistance test, moisture enters from the lead frame and approaches the dielectric oxide film layer of the capacitor element. There was the disadvantage of increasing the value. In order to prevent such a drawback, it has been considered to cover the capacitor element with a water-resistant resin. However, there is a problem in workability and cost. SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and its gist is to provide a solid electrolytic capacitor element having an anode part and a conductor layer forming part. In the chip-shaped solid electrolytic capacitor, the anode portion and one surface of the conductor layer forming portion are respectively mounted and joined to the protrusions of the lead frame having a pair of opposedly disposed protrusions. The chip-shaped solid electrolytic capacitor has a notch provided at the tip of the convex portion on the side where the anode portion of the lead frame is mounted, and the remaining portion to which the anode portion of the capacitor element is mounted and joined. . Hereinafter, the present invention will be described in detail. In the present invention, as the anode base having a valve action used as the anode of the solid electrolytic capacitor, any metal having a valve action such as aluminum, tantalum, and alloys using these as a substrate can be used. Examples of the shape of the anode substrate include a flat aluminum foil and plate. The dielectric oxide film layer provided on the surface of the anode substrate may be an oxide layer of the valve action metal itself provided on the surface portion of the valve action metal, or may be provided on the surface of the valve action metal foil. Alternatively, a layer of another dielectric oxide may be used, but a layer made of an oxide of the valve metal itself is particularly desirable. In the present invention, the anode portion is provided in one section of the end portion of the plate-shaped anode substrate having the dielectric oxide film layer formed on the surface, and the remaining dielectric oxide film other than the anode portion is provided. Although a semiconductor layer is formed on the layer, the type of the semiconductor layer is not particularly limited, and a conventionally known semiconductor layer can be used. Among them, a semiconductor layer composed of lead dioxide and lead sulfate, which was filed by the present applicant (JP-A-62-256423).
JP-A-63-51621) is preferable because the high frequency performance of the manufactured solid electrolytic capacitor is good. Also, a method of forming a complex of tetrathiotetracene and chloranil as a semiconductor layer (JP-A-62-2912)
No. 3) and a semiconductor layer composed of a conductive polymer compound obtained by doping a dopant into a 5-membered heterocyclic polymer compound (Japanese Patent Application Laid-Open No. 60-37114) are also examples. On the semiconductor layer, a conductive layer is formed by laminating a conventionally known conductive paste such as a carbon paste and / or a silver paste to form a conductive layer forming portion. In the present invention, if a resin layer portion is formed in advance in a spiral shape with an insulating resin at the interface between the above-described anode portion and the conductor layer forming portion, the semiconductor layer is formed when the semiconductor layer is formed. Can be obtained with a constant area and a small variation. Next, a method of connecting the capacitor element formed up to the conductor layer in this way to a pair of opposing lead frames will be described. FIG.
FIG. 5 is a plan view showing a state where the solid electrolytic capacitor element 5 is connected to a lead frame 6. In FIG. 1, a dielectric oxide film layer 2 is formed on the surface of an anode substrate 1, a semiconductor layer 3 is further formed thereon, and a conductive layer 4 is further formed thereon. And the conductor layer forming portion 8 are mounted and joined to the respective protruding portions 6a and 6b of the lead frame 6, but the anode portion 7 is provided with a notch portion 11 at the tip of the protruding portion 6a of the lead frame. It is mounted and joined to the remaining portion 12. FIG. 2 is a sectional view of FIG. In the present invention, the notch is provided at the tip of the projection on the side on which the anode of the lead frame is mounted, because the ingress of moisture from the anode side causes the conductor layer forming section to enter. This is because the effect of providing more cutout portions is greater than that of the above. Therefore, it is needless to say that a notch may be provided also at the tip of the lead frame convex portion on the side where the conductor layer forming portion is mounted, if necessary. The shape and size of the notch 11 provided at the tip of the protrusion 6a of the lead frame vary depending on the size of the solid electrolytic capacitor element 5, the size of the anode 7, the size of the protrusion of the lead frame, and the like. Although it cannot be determined unconditionally, the shape and size of the remaining portion 12 after the notch portion 11 is provided should be reduced as much as possible in order to alleviate the invasion of moisture from the outside after the sealing described later. It is important that the design is carefully examined in consideration of both the conflicting problem of the occurrence of a failure in the connection of the anode part due to the reduction of the diameter. FIG. 3 shows four examples of the shape of the notch 11 provided at the tip of the protrusion 6a of the lead frame, but the present invention is not limited to these. In FIG. 3, the anode part 7 of the capacitor element 5 is mounted on the remaining part 12 after the notch is provided. The number of cutouts provided in the lead frame protrusion 6a may be plural. In the capacitor element thus mounted on the lead frame, the anode portion is connected by welding, conductive paste, solder, or the like, while the conductor layer forming portion is connected by conductive paste, solder, or the like, and then connected to the lead. After sealing molding with a transfer molding machine or the like using an exterior resin 13 such as an epoxy resin while leaving a part of the frame, a convex portion of the lead frame is cut near the capacitor element to form a chip-shaped solid electrolytic capacitor. And Since the connection between the anode of the capacitor element and the lead frame is made at the remaining portion of the notch provided at the tip of the protrusion of the lead frame, moisture is radiated through the lead frame. Penetration into the body oxide layer is mitigated. The present invention will be described below in more detail with reference to examples and comparative examples. Examples 1 to 4 Small pieces of a 45 μF / cm 2 aluminum etching foil (hereinafter referred to as a chemical conversion foil) having a surface formed with a dielectric oxide film layer by a chemical conversion treatment in an aqueous solution of phosphoric acid and ammonium phosphate, 4 mm × 3 mm Was prepared. 1 from the end of this chemical foil
A part of 3 mm x 3 mm is used as an anode part with the remaining 3 mm x 3 mm.
The part m is immersed in a mixed solution of a 2.4 mol / l aqueous solution of lead acetate trihydrate and an aqueous solution of 4.0 mol / l ammonium persulfate and left at 60 ° C. for 20 minutes to obtain a semiconductor composed of lead dioxide and lead sulfate. A layer was formed. After performing these operations three times,
A carbon paste and a silver paste were sequentially laminated on the semiconductor layer to form a conductor layer, thereby producing a capacitor element. On the other hand, a separately prepared lead frame (material 42 alloy, solder plating, thickness 0.1 mm, size of protrusion: width 3.
(0 mm, the interval between the tips of the projections is 0.5 mm). One surface of the conductive layer forming portion was mounted, and the former was connected by welding and the latter was connected by silver paste. After that, transfer molding is performed using epoxy resin, and the outer dimensions are 7 mm x 4
A 3 mm × 3 mm chip-shaped solid electrolytic capacitor was produced. Examples 5 to 8 In Examples 1 to 4, a chemical conversion foil was immersed in a 2.0 mol / l aqueous solution of lead acetate trihydrate to form a semiconductor layer. Except for the lead dioxide formed
In the same manner as in Examples 1 to 4, chip-shaped solid electrolytic capacitors were produced. Comparative Example 1 In the same manner as in Example 1, except that the notch was not provided in the lead frame and the anode of the capacitor element was mounted and connected to the protrusion of the lead frame, the solid electrolytic capacitor was used in the same manner as in Example 1. A capacitor was manufactured. Table 2 shows the performance of the solid electrolytic capacitor immediately after being manufactured as described above and the performance of the capacitor after a humidity resistance test at 85 ° C. and 85% RH for 200 hours. In addition, each Example or Comparative Example is an average value of all numerical values n = 50 points. Although the content of the present invention has been specifically described above by taking a single-layer solid electrolytic capacitor as an example,
It goes without saying that the present invention can be applied to a laminated solid electrolytic capacitor. [Table 1] [Table 2] According to the chip-shaped solid electrolytic capacitor of the present invention, the anode of the capacitor element is provided with a notch at the tip of the projection of the lead frame and is connected to the remainder.
The increase in the capacity and the tan δ value after the moisture resistance test is suppressed.

【図面の簡単な説明】 【図1】固体電解コンデンサ素子をリードフレームに接
続した状態を示す平面図である。 【図2】固体電解コンデンサ素子をリードフレームに接
続した状態を示す断面図である。 【図3】固体電解コンデンサ素子をリードフレームに接
続した状態を示す他例の断面図である。 【図4】従来のチップ状固体電解コンデンサをリードフ
レームに載置した状態を示す平面図である。 【図5】従来のチップ状固体電解コンデンサをリードフ
レームに載置した状態を示す断面図である。 【符号の説明】 1 陽極基体 2 誘電体酸化皮膜層 3 半導体層 4 導電体層 5 固体電解コンデンサ素子 6a リードフレームの陽極部が載置される側の凸部 6b リードフレームの導電体層形成部が載置される側
の凸部 7 陽極部 8 導電体層形成部 9 熔接 10 導電材 11 切り欠き部 12 残部 13 外装樹脂
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a plan view showing a state where a solid electrolytic capacitor element is connected to a lead frame. FIG. 2 is a cross-sectional view showing a state where a solid electrolytic capacitor element is connected to a lead frame. FIG. 3 is a sectional view of another example showing a state where the solid electrolytic capacitor element is connected to a lead frame. FIG. 4 is a plan view showing a state in which a conventional chip-shaped solid electrolytic capacitor is mounted on a lead frame. FIG. 5 is a cross-sectional view showing a state where a conventional chip-shaped solid electrolytic capacitor is mounted on a lead frame. [Description of Signs] 1 Anode substrate 2 Dielectric oxide film layer 3 Semiconductor layer 4 Conductor layer 5 Solid electrolytic capacitor element 6a Protrusion 6b on the side on which anode part of lead frame is mounted Lead conductor layer forming part of lead frame The convex part 7 on the side on which is mounted The anode part 8 The conductor layer forming part 9 The welding 10 The conductive material 11 The notch part 12 The remaining part 13 The exterior resin

Claims (1)

(57)【特許請求の範囲】 【請求項1】 陽極部と導電体層形成部を有する固体電
解コンデンサ素子の前記陽極部と導電体層形成部の一方
の面とが一対の対向して配置された凸部を有するリード
フレームの前記凸部にそれぞれ載置して接合されている
チップ状固体電解コンデンサにおいて、前記リードフレ
ームの陽極部が載置される側の凸部の先端部に切り欠き
部が設けられており、残部に前記コンデンサ素子の陽極
部が載置接合されていることを特徴とするチップ状固体
電解コンデンサ。
(57) Claims 1. A solid electrolytic capacitor element having an anode portion and a conductor layer forming portion, wherein the anode portion and one surface of the conductor layer forming portion are arranged in a pair facing each other. In the chip-shaped solid electrolytic capacitor which is mounted on and bonded to the protrusion of the lead frame having the formed protrusion, a notch is formed at the tip of the protrusion on the side where the anode of the lead frame is mounted. Wherein the anode portion of the capacitor element is placed and joined to the remaining portion.
JP32829993A 1993-12-24 1993-12-24 Chip-shaped solid electrolytic capacitors Expired - Lifetime JP3433490B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32829993A JP3433490B2 (en) 1993-12-24 1993-12-24 Chip-shaped solid electrolytic capacitors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32829993A JP3433490B2 (en) 1993-12-24 1993-12-24 Chip-shaped solid electrolytic capacitors

Publications (2)

Publication Number Publication Date
JPH07183170A JPH07183170A (en) 1995-07-21
JP3433490B2 true JP3433490B2 (en) 2003-08-04

Family

ID=18208681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32829993A Expired - Lifetime JP3433490B2 (en) 1993-12-24 1993-12-24 Chip-shaped solid electrolytic capacitors

Country Status (1)

Country Link
JP (1) JP3433490B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4789252B2 (en) * 2006-04-12 2011-10-12 Necトーキン株式会社 Multilayer capacitor

Also Published As

Publication number Publication date
JPH07183170A (en) 1995-07-21

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