JP3243906B2 - Method for joining semiconductor device to external terminal - Google Patents
Method for joining semiconductor device to external terminalInfo
- Publication number
- JP3243906B2 JP3243906B2 JP26985493A JP26985493A JP3243906B2 JP 3243906 B2 JP3243906 B2 JP 3243906B2 JP 26985493 A JP26985493 A JP 26985493A JP 26985493 A JP26985493 A JP 26985493A JP 3243906 B2 JP3243906 B2 JP 3243906B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- external terminal
- external
- terminal
- connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/328—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by welding
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/403—Edge contacts; Windows or holes in the substrate having plural connections on the walls thereof
Landscapes
- Laser Beam Processing (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体装置と外部端子
との接合方法に関する。より詳しくは、半導体装置と外
部端子とをレーザー光を用いて確実に熔接できる接合方
法に関する。The present invention relates to a method for joining a semiconductor device to an external terminal. More specifically, the present invention relates to a bonding method capable of reliably welding a semiconductor device and an external terminal using laser light.
【0002】[0002]
【従来の技術】配線回路基板に半導体チップが搭載され
た半導体装置の外部導通用の接続端子と、外部端子とを
接合する場合、近年の回路基板の高密度化に対応してフ
ァインピッチで接続できるワイヤーボンディング法やバ
ンプ法により行われるようになっている。2. Description of the Related Art When a connection terminal for external conduction and an external terminal of a semiconductor device having a semiconductor chip mounted on a printed circuit board are bonded to the external terminal, the connection is made at a fine pitch in response to the recent increase in the density of circuit boards. It is performed by a wire bonding method or a bump method that can be used.
【0003】ワイヤーボンディング法で接合する場合に
は、半導体装置の周辺部に、外部端子を両面テープなど
で固定し、外部端子の先端と半導体装置の外部導通用の
接続端子とをボンディングワイヤーで接合している。ま
た、バンプ法で接続する場合には、半導体装置の接続端
子にバンプを形成し、そのバンプに外部端子を熱圧着さ
せることにより接合している。In the case of bonding by a wire bonding method, external terminals are fixed to the peripheral portion of the semiconductor device with a double-sided tape or the like, and the end of the external terminal and a connection terminal for external conduction of the semiconductor device are bonded by a bonding wire. are doing. In the case of connection by a bump method, a bump is formed on a connection terminal of a semiconductor device, and an external terminal is bonded to the bump by thermocompression bonding.
【0004】しかしながら、これらの方法により半導体
装置と外部端子とを接合した場合には、接合強度が十分
でなく、ワイヤーが切断したり、バンプ金属にクラック
が発生したりし、接続信頼性が不十分であるという問題
があった。また、接続材料として金をはじめとして貴金
属を使用する場合が多く、接続コストが増大するという
問題もあった。However, when the semiconductor device and the external terminal are joined by these methods, the joining strength is not sufficient, and the wire is cut or the bump metal is cracked, resulting in poor connection reliability. There was a problem that it was enough. In addition, a noble metal such as gold is often used as a connection material, and there has been a problem that the connection cost increases.
【0005】このため、図5(a)に示すように、絶縁
層2とそれを挟持する導体層3とからなる半導体装置の
配線回路基板1の外部導通用の接続端子部3aに、外部
端子4を接着剤で固定せずに押さえ治具を使用して位置
合わせして密接させ、そして図5(b)に示すように、
外部端子4の先端にYAGレーザーなどのレーザー光h
νを照射し、これにより外部端子4と半導体装置の接続
端子部3aとを高い接合強度で熔接することが試みられ
ている(図5(c))。For this reason, as shown in FIG. 5A, an external terminal is connected to a connection terminal portion 3a for external conduction of a printed circuit board 1 of a semiconductor device comprising an insulating layer 2 and a conductor layer 3 sandwiching the insulating layer. 4 is not fixed with an adhesive, but is positioned and closely contacted using a holding jig, and as shown in FIG.
Laser light h such as a YAG laser is applied to the tip of the external terminal 4.
Irradiation with ν has been attempted to weld the external terminal 4 and the connection terminal portion 3a of the semiconductor device with high bonding strength (FIG. 5C).
【0006】[0006]
【発明が解決しようとする課題】しかしながら、外部端
子4がファインピッチ化するに従って、外部端子4と半
導体装置の接続端子部3aとを押さえ治具だけで所定位
置において密接させることが困難になり、このため図6
に示すように外部端子4が接続端子部3aから浮き上が
ってしまったり、また、所定位置からずれたりして両者
が密接しなくなり、レーザー光を外部端子4の先端に照
射しても意図したように熔接できないという問題があっ
た。However, as the external terminals 4 become finer in pitch, it becomes more difficult to make the external terminals 4 and the connection terminal portions 3a of the semiconductor device in close contact with each other at a predetermined position using only a holding jig. Therefore, FIG.
As shown in the figure, the external terminal 4 is lifted up from the connection terminal portion 3a or deviated from a predetermined position so that they do not come into close contact with each other. There was a problem that welding was not possible.
【0007】本発明は以上のような従来技術の問題点を
解決しようとするものであり、半導体装置と外部端子と
をレーザー光を用いて所定位置で確実に熔接接合できる
ようにすることを目的とする。An object of the present invention is to solve the above-mentioned problems of the prior art, and an object of the present invention is to ensure that a semiconductor device and an external terminal can be securely welded at a predetermined position by using a laser beam. And
【0008】[0008]
【課題を解決するための手段】本発明者は、半導体装置
と外部端子とをレーザー光を用いて熔接接合する場合
に、外部端子を半導体基板に接着剤を使用して予め仮固
定し、そしてその時に接着剤の厚さをキャンセルするよ
うに外部端子を予めディプレスしておくことにより上述
の目的が達成できることを見出し、本発明を完成させる
に至った。SUMMARY OF THE INVENTION The present inventor has proposed that when a semiconductor device and an external terminal are welded and joined by using a laser beam, the external terminal is preliminarily fixed to a semiconductor substrate using an adhesive, and at that time the external terminals so as to cancel the thickness of the adhesive in advance by the de-pressed to contact wolfberry to found that the above object can be achieved, thereby completing the present invention.
【0009】即ち、本発明は、半導体装置の周辺部に外
部端子を接着剤で仮固定し、接着剤の厚みに略相当する
距離だけ外部端子の先端部を予めディプレスしておくこ
とにより外部端子の先端部を半導体装置の外部導通用の
接続端子部に密着させ、そして外部端子の先端にレーザ
ー光を照射することにより外部端子と半導体装置の接続
端子部とを熔接することを特徴とする、半導体装置と外
部端子との接合方法を提供する。That is, according to the present invention, an external terminal is temporarily fixed to a peripheral portion of a semiconductor device with an adhesive, and a tip portion of the external terminal is depressed in advance by a distance substantially corresponding to the thickness of the adhesive, whereby an external terminal is formed. The terminal of the terminal is brought into close contact with the connection terminal for external conduction of the semiconductor device, and the external terminal is welded to the connection terminal of the semiconductor device by irradiating a laser beam to the end of the external terminal. And a method for joining a semiconductor device and an external terminal.
【0010】[0010]
【0011】[0011]
【作用】本発明の接合方法においては、半導体装置の配
線回路基板の外部導通用の接続端子部と外部端子とを接
着剤で仮固定する。従って、外部端子と半導体装置の位
置合わせ精度が向上する。更に、接着剤の厚みに略相当
する距離だけ外部端子の先端部を半導体装置方向へ予め
ディプレスしておく。これにより、外部端子と半導体装
置の接続端子部とを密接させることが可能となる。In the bonding method according to the present invention, the connection terminals for external conduction of the printed circuit board of the semiconductor device and the external terminals are temporarily fixed with an adhesive. Therefore, the positioning accuracy between the external terminal and the semiconductor device is improved. Further, the tip of the external terminal is depressed in advance toward the semiconductor device by a distance substantially corresponding to the thickness of the adhesive. This makes it possible to bring the external terminals into close contact with the connection terminal portions of the semiconductor device.
【0012】なお、本発明の範囲ではないが、接着剤の
厚みに略相当する深さの凹部を外部端子又は半導体装置
の表面に予め形成しておき、そこに接着剤を入れて両者
を密接させたまま仮固定することもできる。 Although not within the scope of the present invention, a concave portion having a depth substantially corresponding to the thickness of the adhesive is formed in advance on the external terminal or the surface of the semiconductor device, and the adhesive is put into the concave portion to bring the two into close contact. It can be temporarily fixed while it is kept .
【0013】[0013]
【実施例】以下、本発明の接合方法を図面に基づいて詳
細に説明する。なお、各図において同じ番号は同じ又は
同等の構成要素を示している。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The joining method of the present invention will be described below in detail with reference to the drawings. In each of the drawings, the same numbers indicate the same or equivalent components.
【0014】図1及び図2は、外部端子をディプレスす
る場合の本発明の接合方法の工程図であり、図3は、外
部端子に凹部を設けた場合の工程図であり、そして図4
は半導体装置側に凹部を設けた場合の工程図である。FIGS. 1 and 2 are process diagrams of the bonding method of the present invention when depressing external terminals, FIG. 3 is a process diagram when concave portions are provided in the external terminals, and FIG.
FIG. 4 is a process diagram when a concave portion is provided on the semiconductor device side.
【0015】図1に示した方法では、まず、半導体装置
の配線回路基板1の周辺部に接着剤として、熱可塑性の
ポリイミドテープなどの両面接着テープ5を貼り付ける
(同図(a))。In the method shown in FIG. 1, a double-sided adhesive tape 5 such as a thermoplastic polyimide tape is first adhered to the periphery of the printed circuit board 1 of the semiconductor device as an adhesive (FIG. 1A).
【0016】次に、予め先端部4aをディプレスした外
部端子4を両面接着テープ5に位置合せした後、圧着し
て仮固定する(同図(b))。Next, after positioning the external terminal 4 whose front end 4a has been depressed in advance on the double-sided adhesive tape 5, the external terminal 4 is crimped and temporarily fixed (FIG. 2B).
【0017】次に外部端子の先端に、十分な熔接エネル
ギーを供給できるレーザー光hν、例えばYAGレーザ
ー光を小さなスポット(例えば、200μm径スポッ
ト)状に照射し(同図(c))、半導体装置の接続端子
部3aと外部端子4とを熔接接合する(同図(d))。
これにより、半導体装置の接続端子部3aと外部端子4
とを、高い接続強度で接合することができ、しかも接続
信頼性を著しく向上させることができる。Next, the tip of the external terminal is irradiated with a laser beam hν capable of supplying a sufficient welding energy, for example, a YAG laser beam in the form of a small spot (for example, a spot having a diameter of 200 μm) (FIG. 2C), Is welded to the connection terminal portion 3a and the external terminal 4 (FIG. 4D).
Thereby, the connection terminal portion 3a and the external terminal 4 of the semiconductor device
Can be joined with high connection strength, and the connection reliability can be significantly improved.
【0018】図2は、接着剤として紫外線硬化型樹脂を
使用した例であり、まず、半導体装置の配線回路基板1
の周辺部に接着剤として紫外線硬化型樹脂6をディスペ
ンサーなどにより供給する(同図(a))。FIG. 2 shows an example in which an ultraviolet-curing resin is used as an adhesive. First, a printed circuit board 1 of a semiconductor device is used.
The ultraviolet curable resin 6 is supplied as an adhesive to the peripheral portion of the substrate by a dispenser or the like (FIG. 3A).
【0019】次に、紫外線硬化型樹脂6上から予め先端
部4aをディプレスした外部端子4を位置合せし、半導
体装置の接続端子部3aに密接させる(同図(b))。Next, the external terminal 4 whose tip 4a is depressed in advance from the ultraviolet curing resin 6 is aligned and brought into close contact with the connection terminal 3a of the semiconductor device (FIG. 2B).
【0020】次に、外部端子4の先端部4aを接続端子
部3aに密接させたまま紫外線硬化型樹脂6に紫外線U
Vを照射して外部端子4を半導体装置に仮固定する(同
図(c))。Next, while the tip portion 4a of the external terminal 4 is kept in close contact with the connection terminal portion 3a, ultraviolet rays U
By irradiating V, the external terminals 4 are temporarily fixed to the semiconductor device (FIG. 3C).
【0021】次に外部端子4の先端に、十分な熔接エネ
ルギーを供給できるレーザー光hνを照射し(同図
(d))、半導体装置の接続端子部3aと外部端子4と
を熔接接合する(同図(e))。これにより、半導体装
置の接続端子部3aと外部端子4とを、高い接続強度で
接合することができ、しかも接続信頼性を著しく向上さ
せることができる。Next, the tip of the external terminal 4 is irradiated with a laser beam hν capable of supplying a sufficient welding energy (FIG. 3D), and the connection terminal portion 3a of the semiconductor device and the external terminal 4 are welded ( FIG. Thereby, the connection terminal portion 3a and the external terminal 4 of the semiconductor device can be joined with high connection strength, and the connection reliability can be significantly improved.
【0022】図3に示した方法においては、まず、半導
体装置の配線回路基板1の周辺部に接着剤として、熱可
塑性のポリイミドテープなどの両面接着テープ5を貼り
付ける(同図(a))。In the method shown in FIG. 3, first, a double-sided adhesive tape 5 such as a thermoplastic polyimide tape is attached to the periphery of the printed circuit board 1 of the semiconductor device as an adhesive (FIG. 3A). .
【0023】一方、外部端子4にハーフエッチング法な
どにより予め形成しておいた凹部4bに両面接着テープ
5を嵌入させるように位置合わせし(同図(b))、加
熱圧着して仮固定する。これにより、外部端子4の先端
部4aと半導体装置の外部導通用の接続端子部3aとが
確実に密接する(同図(c))。On the other hand, the external terminals 4 are aligned so that the double-sided adhesive tape 5 is fitted into the concave portions 4b formed in advance by a half-etching method or the like (FIG. 4B), and are temporarily fixed by heat compression. . This ensures that the distal end portion 4a of the external terminal 4 and the connection terminal portion 3a for external conduction of the semiconductor device are in close contact with each other (FIG. 3C).
【0024】次に外部端子の先端に、十分な熔接エネル
ギーを供給できるレーザー光hνを照射し(同図
(d))、半導体装置の接続端子部3aと外部端子4と
を熔接接合する(同図(e))。これにより、半導体装
置の接続端子部3aと外部端子4とを、高い接続強度で
接合することができ、しかも接続信頼性を著しく向上さ
せることができる。Next, the tip of the external terminal is irradiated with a laser beam hν capable of supplying a sufficient welding energy (FIG. 4 (d)), and the connection terminal portion 3a of the semiconductor device and the external terminal 4 are welded (see FIG. Figure (e). Thereby, the connection terminal portion 3a and the external terminal 4 of the semiconductor device can be joined with high connection strength, and the connection reliability can be significantly improved.
【0025】図4に示した方法において、外部端子4に
凹部4bを形成する代わりに、半導体装置の配線回路基
板1の周辺部に凹部2bを形成し(同図(a))、その
凹部2bの中に両面接着テープ5を貼りつけ、その上か
ら外部端子4を仮固定した例((同図(b))である。In the method shown in FIG. 4, instead of forming the recess 4b in the external terminal 4, a recess 2b is formed in the periphery of the printed circuit board 1 of the semiconductor device (FIG. 4A), and the recess 2b is formed. In this example, the double-sided adhesive tape 5 is adhered to the inside, and the external terminals 4 are temporarily fixed thereon ((b) in FIG. 3).
【0026】外部端子4を仮固定した後は、外部端子4
の先端4aにレーザー光hνを照射し(同図(c))、
半導体装置の接続端子部3aと外部端子4とを熔接接合
する(同図(d))。After the external terminals 4 are temporarily fixed, the external terminals 4
Is irradiated with a laser beam hν on the tip 4a (FIG. 3 (c)),
The connection terminals 3a of the semiconductor device and the external terminals 4 are welded and joined (FIG. 4D).
【0027】[0027]
【発明の効果】本発明の半導体装置と外部端子との接合
方法によれば、半導体装置と外部端子とをレーザー光を
用いて所定位置で確実に熔接接合できる。According to the method for joining a semiconductor device and an external terminal of the present invention, the semiconductor device and the external terminal can be reliably welded and joined at a predetermined position by using a laser beam.
【図1】本発明の接合方法の工程図である。FIG. 1 is a process chart of a bonding method of the present invention.
【図2】本発明の接合方法の工程図である。FIG. 2 is a process chart of the bonding method of the present invention.
【図3】参考となる接合方法の工程図である。FIG. 3 is a process diagram of a bonding method serving as a reference .
【図4】参考となる接合方法の工程図である。FIG. 4 is a process diagram of a bonding method serving as a reference .
【図5】従来の接合方法の工程図である。FIG. 5 is a process chart of a conventional bonding method.
【図6】外部端子と半導体装置の接続不良状態の説明図
である。FIG. 6 is an explanatory diagram of a connection failure state between an external terminal and a semiconductor device.
1 配線回路基板 2 絶縁層 3 導体層 3a 接続端子部 4 外部端子 4a 外部端子先端部 5 両面接着テープ 6 紫外線硬化型樹脂 hν レーザー光 DESCRIPTION OF SYMBOLS 1 Wiring circuit board 2 Insulating layer 3 Conductive layer 3a Connection terminal part 4 External terminal 4a External terminal tip part 5 Double-sided adhesive tape 6 Ultraviolet curing resin hν laser beam
Claims (1)
で仮固定する際に、接着剤の厚みに略相当する距離だけ
外部端子の先端部を予めディプレスしておくことにより
外部端子の先端部を半導体装置の外部導通用の接続端子
部に密着させ、そして外部端子の先端にレーザー光を照
射することにより外部端子と半導体装置の接続端子部と
を熔接することを特徴とする、半導体装置と外部端子と
の接合方法。When an external terminal is temporarily fixed to a peripheral portion of a semiconductor device with an adhesive, the distal end of the external terminal is depressed in advance by a distance substantially corresponding to the thickness of the adhesive, so that the external terminal can be fixed. A semiconductor, wherein the tip is brought into close contact with a connection terminal for external conduction of the semiconductor device, and a laser beam is applied to the tip of the external terminal to weld the external terminal to the connection terminal of the semiconductor device. How to join the device to external terminals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26985493A JP3243906B2 (en) | 1993-09-30 | 1993-09-30 | Method for joining semiconductor device to external terminal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26985493A JP3243906B2 (en) | 1993-09-30 | 1993-09-30 | Method for joining semiconductor device to external terminal |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07106490A JPH07106490A (en) | 1995-04-21 |
JP3243906B2 true JP3243906B2 (en) | 2002-01-07 |
Family
ID=17478128
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26985493A Expired - Fee Related JP3243906B2 (en) | 1993-09-30 | 1993-09-30 | Method for joining semiconductor device to external terminal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3243906B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3750313B2 (en) * | 1997-10-03 | 2006-03-01 | 株式会社デンソー | Welded structure |
DE19901623B4 (en) * | 1999-01-18 | 2007-08-23 | Pac Tech-Packaging Technologies Gmbh | Method and device for thermal connection of pads of two substrates |
-
1993
- 1993-09-30 JP JP26985493A patent/JP3243906B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH07106490A (en) | 1995-04-21 |
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