JP3061899U - Contact probe using conductive rubber for the contact part - Google Patents
Contact probe using conductive rubber for the contact partInfo
- Publication number
- JP3061899U JP3061899U JP1999002295U JP229599U JP3061899U JP 3061899 U JP3061899 U JP 3061899U JP 1999002295 U JP1999002295 U JP 1999002295U JP 229599 U JP229599 U JP 229599U JP 3061899 U JP3061899 U JP 3061899U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- contact probe
- conductive rubber
- probe
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】
【目的】 このコンタクトプローブは被試験部に
ソフトに、且つ面状に接触するため、従来の金属針状の
コンタクトプローブにくらべすべったり、曲がったりす
ることがなく、したがって被試験部を損傷することもな
い。
【構成】 コンタクトプローブソケット１、バレ
ル２、プランジャー３、スプリング７、プランジャー先
端部４ａからなっており、この先端部が導電性ゴムで構
成されている。
(57) [Summary] [Purpose] This contact probe makes soft and planar contact with the part to be tested. There is no damage to the test section. The present invention comprises a contact probe socket 1, a barrel 2, a plunger 3, a spring 7, and a plunger tip 4a, and the tip is made of conductive rubber.
Description
【０００１】 ［従来の技術］ 電子回路の基板あるいは電子部品を試験する場合、電気信号を注入、抽出する のに被試験箇所に、金属コンタクトプローブをバネ圧によりおしつけ接触導電さ せるが、被試験箇所がハンダあるいは部品上である場合、凹凸あるいは傾斜があ る場合が多く、従来の金属コンタクトプローブでは、まがったり、すべったりす ることがあった。[Prior Art] When testing a circuit board or an electronic component of an electronic circuit, a metal contact probe is pressed by a spring pressure to make a contact conductive at a portion to be tested in order to inject and extract an electric signal. When the location is on solder or a part, there are many irregularities or inclinations, and the conventional metal contact probe sometimes rolled or slipped.
【０００２】 このため、接触不良を生じたり、製品に傷がついたり、コンタクトプローブが破 損することもあった。[0002] For this reason, a contact failure may occur, a product may be damaged, or a contact probe may be damaged.
【０００３】 ［考案の効果］ この考案は加圧機構等は従来のコンタクトプーブとかわらないコンタクトプロ ーブの先端に導電ゴムをとりつけ、これを被試験箇所との接触部としたものであ る。 この考案のコンタクトプローブは、加圧されると、ゴムの弾性により、被試験箇 所に応じて変形し、接触効果を増し、ゴムの大きい摩擦抵抗により、すべること もない。その結果、被測定箇所を傷つけることなく安定した計測が可能となる。[Effects of the Invention] In this invention, a conductive mechanism is attached to the tip of a contact probe which is not different from a conventional contact probe in a pressure mechanism or the like, and this is used as a contact portion with a portion to be tested. . When the contact probe of the present invention is pressurized, it is deformed according to the part to be tested due to the elasticity of the rubber, thereby increasing the contact effect, and does not slip due to the large frictional resistance of the rubber. As a result, stable measurement can be performed without damaging the portion to be measured.
【図１】この考案のコンタクトプローブの絶縁ボードへ
の取り付け図FIG. 1 is a diagram of mounting the contact probe of the present invention on an insulating board.
【図２】この考案のコンタクトプローブを被試験箇所に
接触させた時の図FIG. 2 is a diagram when the contact probe of the present invention is brought into contact with a portion to be tested.
【図３】この考案のコンタクトプローブを凹凸あるいは
傾斜のある被試験箇所に接触させた時の図FIG. 3 is a diagram when the contact probe of the present invention is brought into contact with a test portion having irregularities or an inclination.
【図４】従来のコンタクトプローブを凹凸あるいは傾斜
のある被試験箇所に接触させた時の図FIG. 4 is a diagram when a conventional contact probe is brought into contact with a portion to be tested having irregularities or inclinations.
１ コンタクトプローブソケット ２ バレル ３ プランジャー ４ａ 導電性ゴム部 ４ｂ 従来のコンタクトプローブの先端部 ５ コンタクトプーブ固定絶縁ベース ６ 被試験箇所電極部 ７ スプリング DESCRIPTION OF SYMBOLS 1 Contact probe socket 2 Barrel 3 Plunger 4a Conductive rubber part 4b Tip of conventional contact probe 5 Contact probe fixing insulating base 6 Electrode part under test 7 Spring
Claims (1)
的試験のためのコンタクトプローブで被試験箇所との接
触部であるコンタクトプローブ先端部に導電性ゴムを使
用したコンタクトプローブ。1. A contact probe for conducting an electrical test of a printed wiring board and an electronic component, wherein a conductive rubber is used at a tip portion of the contact probe which is a contact portion with a portion to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1999002295U JP3061899U (en) | 1999-03-04 | 1999-03-04 | Contact probe using conductive rubber for the contact part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1999002295U JP3061899U (en) | 1999-03-04 | 1999-03-04 | Contact probe using conductive rubber for the contact part |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP3061899U true JP3061899U (en) | 1999-09-24 |
Family
ID=43195657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1999002295U Expired - Lifetime JP3061899U (en) | 1999-03-04 | 1999-03-04 | Contact probe using conductive rubber for the contact part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3061899U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001096443A (en) * | 1999-09-29 | 2001-04-10 | Kyocera Corp | Indexable cutting tool holder |
| JP3515479B2 (en) | 2000-04-05 | 2004-04-05 | 北川工業株式会社 | Conductive member and method of manufacturing the same |
| JP2014102193A (en) * | 2012-11-21 | 2014-06-05 | Toshiba Corp | Remaining life assessment probe and measuring device |
-
1999
- 1999-03-04 JP JP1999002295U patent/JP3061899U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001096443A (en) * | 1999-09-29 | 2001-04-10 | Kyocera Corp | Indexable cutting tool holder |
| JP3515479B2 (en) | 2000-04-05 | 2004-04-05 | 北川工業株式会社 | Conductive member and method of manufacturing the same |
| JP2014102193A (en) * | 2012-11-21 | 2014-06-05 | Toshiba Corp | Remaining life assessment probe and measuring device |
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