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JP2762726B2 - Electrophotographic process - Google Patents

Electrophotographic process

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Publication number
JP2762726B2
JP2762726B2 JP21976090A JP21976090A JP2762726B2 JP 2762726 B2 JP2762726 B2 JP 2762726B2 JP 21976090 A JP21976090 A JP 21976090A JP 21976090 A JP21976090 A JP 21976090A JP 2762726 B2 JP2762726 B2 JP 2762726B2
Authority
JP
Japan
Prior art keywords
light
photoreceptor
electrophotographic process
amount
fatigue
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP21976090A
Other languages
Japanese (ja)
Other versions
JPH04101155A (en
Inventor
清三 北川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
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Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP21976090A priority Critical patent/JP2762726B2/en
Publication of JPH04101155A publication Critical patent/JPH04101155A/en
Application granted granted Critical
Publication of JP2762726B2 publication Critical patent/JP2762726B2/en
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Expired - Lifetime legal-status Critical Current

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  • Photoreceptors In Electrophotography (AREA)
  • Discharging, Photosensitive Material Shape In Electrophotography (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は発光ダイオード(LED),半導体レーザダ
イオード(LD)などを光源とする比較的長波長の光を露
光光とする電子写真方式のプリンタの電子写真プロセス
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an electrophotographic printer which uses a light emitting diode (LED), a semiconductor laser diode (LD) or the like as a light source and uses relatively long wavelength light as exposure light. Related to the electrophotographic process.

〔従来の技術〕[Conventional technology]

発光ダイオード,半導体レーザダイオードなどの比較
的長波長の光に高感度を有する電子写真用感光体として
は、高Te濃度のSe−Te合金からなる電荷発生層を備えた
機能分離型Se−Te系感光体(以下、単にSe−Te系感光体
とも称する)が知られている。このようなSe−Te系感光
体は他のSe系感光体と同様に、物性上繰り返し連続使
用、あるいは使用環境温度の変化により特性が変わり易
く、そのために、このような感光体を用いる電子写真プ
ロセスにおいては、従来、除電光には感光層に比較的影
響を与えることの少ないと思われる波長500nm以下の短
波長光が使われてきた。しかしながら、近年、得られる
画像の印字濃度,解像度などの画質向上に伴い、前述の
除電光では露光光による前サイクルでの画像のメモリが
著しく現れることが明らかとなり、現在では、除電光と
して波長600〜660nmの従来よりも長波長の光が弱い光量
(使用する感光体の半減衰露光量の4倍〜10倍程度)で
用いられることが多くなってきている。
As a photoreceptor for electrophotography, such as a light emitting diode and a semiconductor laser diode, which has high sensitivity to light of a relatively long wavelength, a function-separated type Se-Te type having a charge generation layer made of a high Te concentration Se-Te alloy 2. Description of the Related Art Photoconductors (hereinafter, also simply referred to as Se-Te-based photoconductors) are known. Like other Se-based photoreceptors, such Se-Te-based photoreceptors tend to change in properties due to repeated use in physical properties or changes in use environment temperature, and therefore, electrophotography using such a photoreceptor In the process, short-wavelength light having a wavelength of 500 nm or less, which is considered to have relatively little effect on the photosensitive layer, has been used as the neutralization light. However, in recent years, with the improvement in image quality such as print density and resolution of an obtained image, it has been clarified that the above-described static elimination light significantly appears in an image memory in a previous cycle by exposure light. Light having a longer wavelength of 660 nm than in the past has been increasingly used with a weak light amount (about 4 to 10 times the half-attenuated exposure amount of the photoreceptor used).

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

除電光に600nm〜660nmの光を使用する感光体の半減衰
露光量の4倍〜10倍程度の光量で用いる電子写真プロセ
スでは高Te濃度の電荷発生層を備えた機能分離型Se−Te
系感光体を用いた場合でも、除電は良好に行われた画像
にメモリが現れることはなく、かつ、感光体特性は比較
的安定しているが、より高品位の画質(より安定した高
印字濃度,高解像度)の画像を追求するプリンタにおい
ては、印字初期(数十サイクル程度)の帯電低下(明部
電位低下)による印字濃度変化、あるいは環境温度変化
による印字特性変化が問題となり、市場要求を満足し得
なくなってきている。
A function-separated type Se-Te with a high Te concentration charge generation layer is used in an electrophotographic process using a light amount of about 4 to 10 times the half-attenuation exposure amount of a photoreceptor that uses light of 600 nm to 660 nm for static elimination light.
Even when a photoreceptor is used, no charge appears on the image where the charge has been successfully removed and the photoreceptor characteristics are relatively stable, but higher quality image quality (more stable high printing In a printer pursuing a high density (high density, high resolution) image, a change in print density due to a decrease in charge (decrease in light area potential) in the initial stage of printing (about several tens of cycles) or a change in print characteristics due to a change in environmental temperature becomes a problem. Is no longer satisfying.

この発明は、上述の問題点を解消して、LED,LDなどを
露光光源とする電子写真方式のプリンタに画像形成部材
として高Te濃度のSe−Te合金からなる機能分離型Se−Te
系感光体を用いた場合、印字初期時の印字濃度変化およ
び環境温度変化による印字特性変化を抑制し、しかもメ
モリの現れない高品質呑画像を安定して得ることができ
る電子写真プロセスを提供することを解決しようとする
課題とする。
The present invention solves the above-mentioned problems, and a function-separated type Se-Te made of a high Te concentration Se-Te alloy is used as an image forming member in an electrophotographic printer using an LED, LD, or the like as an exposure light source.
Provided is an electrophotographic process capable of suppressing a change in printing characteristics due to a change in print density and a change in environmental temperature at the beginning of printing when using a photoreceptor, and capable of stably obtaining a high-quality image with no memory. It is an issue to be solved.

〔課題を解決するための手段〕[Means for solving the problem]

上記の課題は、この発明によれば、画像形成部材とし
ての電子写真用感光体の表面で帯電,画像露光,トナー
現像,トナー像転写,光除電,クリーニングの各工程が
順次行われる電子写真プロセスにおいて、 (a)画像形成部材として高Te濃度のSe−Te合金からな
る感光層を備えた機能分離型Se−Te系感光体を用い、 (b)光除電の工程の除電光に波長600nm以上660nm以下
の範囲内の光を用いること (c)付加的に前疲労を生じさせるために、前記(b)
項の除電光を用い、前記(a)項の感光体の示す室温
(22℃)での半減衰露光量の10倍以上の光量で感光体に
対して帯電一光照射を数サイクル行った後、前記電子写
真プロセスを行うことによって解決される。
According to the present invention, there is provided an electrophotographic process in which respective steps of charging, image exposure, toner development, toner image transfer, photostatic elimination, and cleaning are sequentially performed on the surface of an electrophotographic photosensitive member as an image forming member. (A) using a function-separated Se-Te type photoreceptor having a photosensitive layer made of a high Te concentration Se-Te alloy as an image forming member; Using light within the range of 660 nm or less. (C) To cause additional pre-fatigue,
After performing several cycles of single-charging irradiation on the photoreceptor with a light amount of 10 times or more the half-attenuation exposure amount at room temperature (22 ° C.) indicated by the photoreceptor of the above item (a) using the charge removing light of item (a) The problem is solved by performing the electrophotographic process.

また、前記電子写真プロセスにおいて、前記(c)項
の前疲労のサイクル数を感光体の表面温度に応じて変化
させることが望ましい。さらにまた、前記電子写真プロ
セスにおいて、光除電の工程での除電光量を、前記
(a)項の感光体の示す室温(22℃)での半減衰露光量
の3倍以上7倍以下の範囲内で感光体の表面温度に応じ
て変化させることも望ましい。
In the electrophotographic process, it is preferable that the number of cycles of pre-fatigue in the item (c) is changed according to the surface temperature of the photoconductor. Further, in the electrophotographic process, the light elimination light amount in the step of light elimination is within a range of 3 times or more and 7 times or less of the half-attenuated exposure amount at room temperature (22 ° C.) of the photoreceptor described in the above item (a). It is also desirable to change the temperature according to the surface temperature of the photoconductor.

〔作用〕[Action]

画像形成部材としてSe−Te系感光体を用いても、除電
工程の除電光として波長600nm以上660nm以下の範囲内の
光を用いることにより得られる画像にメモリが現れるこ
とを防ぐことができる。
Even when a Se-Te type photoreceptor is used as the image forming member, it is possible to prevent a memory from appearing in an image obtained by using light having a wavelength of 600 nm or more and 660 nm or less as static elimination light in the static elimination step.

また、Se−Te系感光体の繰り返し連続使用時の初期の
帯電低下および環境温度変化による特性変動の要因とし
ては、 (A)初期の帯電低下の要因 (a)感光体基体から感光層への電荷の注入 (b)感光体表面から感光層への電荷の注入 (c)感光層内の空間電荷の蓄積 (B)環境温度変化による特性変動の要因 (a)感光層内での熱励起キャリア発生量の変化 (b)感光層内の電荷の移動度の変化 (c)電荷発生層内での露光時のキャリア発生効率の変
化 が考えられるが、この発明では(A)の(C)項および
(B)の(C)項に着目して電子写真プロセスの改良を
行った。すなわち、感光体に帯電一光照射を数回繰り返
す前疲労を与え空間電荷を蓄積した後印字を開始するこ
ととし、(A)の(C)項に示した印字開始後に空間電
荷が蓄積して帯電低下が生じる現象を防ぐ。前疲労にお
ける光照射には除電光を利用し、光量は感光体の示す室
温(22℃)での半減衰露光量の10倍以上とすると好適で
ある。また、感光体の表面温度に対応させて前記前疲労
のサイクル数を変え、さらに除電工程での除電光量を感
光体の室温(22℃)での半減衰露光の3倍以上7倍以下
の範囲内で変化させることにより、(B)の(c)項の
環境温度変化によるキャリア発生効率の変化を少なくす
る。かくして、感光体の印字初期時の帯電低下および環
境温度変化による特性変動を抑制し、初期時の印字濃度
変化が少なく、異なる環境温度でも安定した高画質で、
しかもメモリの現れない画像が得られる電子写真プロセ
スを得ることができる。
Factors of initial charge reduction and characteristic fluctuation due to environmental temperature change during repeated continuous use of the Se—Te-based photoreceptor include (A) factors of initial charge reduction and (a) factors from the photoreceptor substrate to the photosensitive layer. Injection of charge (b) Injection of charge from photoconductor surface to photosensitive layer (c) Accumulation of space charge in photosensitive layer (B) Factor of characteristic fluctuation due to environmental temperature change (a) Thermally excited carriers in photosensitive layer Changes in the amount of generation (b) Changes in the mobility of charges in the photosensitive layer (c) Changes in the carrier generation efficiency during exposure in the charge generation layer can be considered, but in the present invention, item (C) of (A) The electrophotographic process was improved by focusing on item (C) of (B). That is, the photoreceptor is subjected to fatigue before repetition of repeated irradiation with one light, accumulates space charges and starts printing, and space charges accumulate after the start of printing shown in (C) of (A). Prevents the phenomenon of charge reduction. It is preferable to use a neutralizing light for light irradiation in the pre-fatigue, and to set the light amount to 10 times or more the half-attenuation exposure amount of the photoconductor at room temperature (22 ° C.). Further, the number of cycles of the pre-fatigue is changed in accordance with the surface temperature of the photoreceptor. , The change in the carrier generation efficiency due to the environmental temperature change in the item (c) of (B) is reduced. In this way, it is possible to suppress the change in characteristics due to the decrease in the charge of the photoconductor at the initial stage of printing and the change in the environmental temperature, the change in the print density at the initial stage is small, and the high image quality is stable even at different environmental temperatures.
In addition, it is possible to obtain an electrophotographic process capable of obtaining an image in which no memory appears.

〔実施例〕〔Example〕

第1図は、この発明の電子写真プロセスの画像形成部
材として用いられる機能分離型Se−Te系感光体の一例の
模式的断面図で、Alからなる導電性基体1上に純Seから
なる膜厚45μmの電荷輸送層,Te46重量%のSe−Te合金
からなる膜厚0.1μmの電荷発生層,As1.5重量%のSe−A
s合金からなる膜厚3μmの表面保護層が順次蒸着によ
り成膜積層されたものである。また、第2図か感光体の
実際特性評価装置のマシンプロセスの一例の概念図であ
って、5ドラム状の感光体であり、そのまわりに帯電器
6、半導体レーザビームの露光光7,現像部電位センサ,
転写器9,AC分離器10,波長600nm〜660nmの除電光11,クリ
ーナ12が感光体の軸に対して図示の角度(実際の一例の
プリンタと同等)で配置されている。除電光11の光量は
可変で、また、除電光11を前疲労光に用い帯電器6と組
み合わせて帯電一光照射の前疲労(サイクル数可変)を
与えることができる。
FIG. 1 is a schematic cross-sectional view of an example of a function-separated type Se—Te photoconductor used as an image forming member in the electrophotographic process of the present invention, in which a film made of pure Se is formed on a conductive substrate 1 made of Al. 45 μm thick charge transport layer, 0.1 μm thick charge generation layer made of 46% by weight of Se—Te alloy, 1.5% by weight of Se—A
A surface protection layer made of an s alloy and having a thickness of 3 μm is formed by sequentially depositing and depositing a film. FIG. 2 is a conceptual diagram of an example of a machine process of an actual photosensitive member characteristic evaluation apparatus, which is a five-drum photosensitive member, around which a charger 6, a semiconductor laser beam exposure light 7, External potential sensor,
A transfer unit 9, an AC separator 10, a neutralizing light 11 having a wavelength of 600 nm to 660 nm, and a cleaner 12 are arranged at the illustrated angle (equivalent to an actual printer) with respect to the axis of the photoconductor. The light quantity of the static elimination light 11 is variable, and the static elimination light 11 can be used as the pre-fatigue light and combined with the charger 6 to provide the pre-fatigue (variable number of cycles) of the irradiation with one charging light.

上述のような実機特性評価装置により、機能分離型Se
−Te系感光体の実機特性を評価した。感光体の半減衰露
光量E1/2は感光体の表面温度により第3図に一例を示
すように大きく変化する。一般に除電光量は室温(22
℃)での半減衰露光量E1/2(22℃)の4倍程度が最適
と考えられており、これを基準として、サーミスタなど
により感光体の表面温度を検知し、記憶装置に記録して
おいた感光体の表面温度と半減衰露光量とのデータと照
らし合わせて各表面温度における最適除電光量を設定で
きるようにした。例えば表面温度5℃ではE1/2(22
℃)の約7倍,表面温度40℃ではE1/2(22℃)の約3
倍が最適除電光量となる。
With the above-mentioned actual equipment characteristic evaluation device,
The actual characteristics of the Te photoreceptor were evaluated. The half-attenuation exposure amount E1 / 2 of the photoreceptor greatly changes depending on the surface temperature of the photoreceptor, as shown in an example in FIG. Generally, the amount of static elimination is room temperature (22
It is considered that about four times the half-attenuated exposure amount E 1/2 (22 ° C.) at about 100 ° C.) is used. Based on this, the surface temperature of the photoreceptor is detected by a thermistor or the like, and recorded in a storage device. The data of the surface temperature of the photoreceptor and the half-attenuated exposure amount described above can be used to set the optimum amount of static elimination at each surface temperature. For example, at a surface temperature of 5 ° C., E 1/2 (22
℃), and about 3 times E 1/2 (22 ℃) at a surface temperature of 40 ℃.
Double is the optimal amount of charge removal.

次に、室温において、前疲労サイクルを5サイクル一
定とし、前疲労光(除電光)の光量を変化させて5サイ
クルの前疲労を与えた後、評価装置の一連のマシンプロ
セスを繰り返し、初期時(〜25サイクル)の帯電低下量
(現像部電位センサで測定)と前疲労光光量との関係を
調べたところ、第4図に示すように前疲労光光量がE
1/2(22℃)の10倍程度で帯電低下量が飽和することが
判った。そこで、前疲労光の光量をE1/2(22℃)を10
倍と定め、感光体表面温度と初期時の帯電低下量が飽和
するに要する前疲労サイクル数との関係を求めたとこ
ろ、第5図に示す結果が得られた。これら第4図および
第5図のデータを記憶装置に記録し、感光体表面温度に
応じて前疲労光光量および最適前疲労サイクル数を設定
できるようにした。以上のようにして、感光体表面温度
に応じて、前疲労光光量,前疲労サイクル数,除電光量
を適切に設定した位置で帯電低下量を測定した実施例に
おいては、第6図に示すように、従来の前疲労を行わず
かつ除電光量をE1/2(22℃)の6倍一定として測定し
た比較例に比べて、感光体表面温度が変化したときの帯
電安定性が著しく向上していることが判った。
Next, at room temperature, the pre-fatigue cycle was fixed at 5 cycles, the amount of pre-fatigue light (static elimination light) was changed to give 5 cycles of pre-fatigue, and a series of machine processes of the evaluation apparatus were repeated. When the relationship between the amount of charge decrease (measured by the developing unit potential sensor) and the amount of pre-fatigue light was examined (up to 25 cycles), as shown in FIG.
It was found that the charge reduction was saturated at about 10 times 1/2 (22 ° C.). Therefore, the amount of pre-fatigue light is set to E 1/2 (22 ° C) by 10
The relationship between the surface temperature of the photoreceptor and the number of pre-fatigue cycles required for the initial charge reduction amount to be saturated was determined. The result shown in FIG. 5 was obtained. The data shown in FIGS. 4 and 5 are recorded in a storage device so that the amount of pre-fatigue light and the optimum number of pre-fatigue cycles can be set in accordance with the surface temperature of the photoreceptor. As described above, in the embodiment in which the amount of charge reduction is measured at a position where the amount of pre-fatigue light, the number of pre-fatigue cycles, and the amount of charge elimination are appropriately set in accordance with the surface temperature of the photoreceptor, as shown in FIG. In addition, the charging stability when the surface temperature of the photoconductor is changed is remarkably improved as compared with the conventional comparative example in which the pre-fatigue was not performed and the amount of static electricity removal was fixed at 6 times E 1/2 (22 ° C.). It turned out that.

以上の結果に基づいて、機能分離型Se−Te系感光体を
用い、記憶装置に記録された使用される感光体の半減衰
露光量と感光体表面温度との関係を示すデータおよび初
期時の帯電低下量が飽和するまでの前疲労サイクル数と
感光体表面温度との関係を示すデータにより、前疲労光
光量,前疲労サイクル数,除電光光量を適切に設定され
た半導体レーザビームプリンタで印字を行った結果、印
字初期時の印字濃度変化および環境温度変化による印字
特性変化が少なく、しかもメモリの現れない高品質の画
像が安定して得られることが確認された。
Based on the above results, using a function-separated Se-Te photoreceptor, data showing the relationship between the half-attenuated exposure amount of the photoreceptor used and the photoreceptor surface temperature recorded in the storage device and the initial time Prints with a semiconductor laser beam printer that sets the pre-fatigue light quantity, pre-fatigue cycle number, and static elimination light quantity appropriately based on the data indicating the relationship between the number of pre-fatigue cycles and the photoconductor surface temperature until the amount of charge reduction saturates. As a result, it was confirmed that a change in print characteristics due to a change in print density and a change in environmental temperature at the beginning of printing was small, and a high-quality image in which no memory appeared was stably obtained.

〔発明の効果〕〔The invention's effect〕

この発明によれば、除電光として波長600nm〜660nmの
光を用い、使用する感光体の半減衰露光量および環境温
度に応じた前疲労および除電を行う電子写真プロセスと
する。このような電子写真プロセスによれば、LED,LDな
どを露光光源とする電子写真方式のプリンタに像形成部
材として高Te濃度のSe−Te合金からなる機能分離型Se−
Te系感光体を用いた場合、印字初期時の印字濃度変化お
よび環境温度変化による印字特性変化を抑制することが
でき、しかもメモリの現れることもなく、高品質の画像
を安定して得ることが可能となる。
According to the present invention, an electrophotographic process is performed in which light having a wavelength of 600 nm to 660 nm is used as a charge removing light, and pre-fatigue and charge removal are performed in accordance with a half-decay exposure amount of a photoreceptor to be used and an environmental temperature. According to such an electrophotographic process, a function-separated Se-film made of a high Te-concentration Se-Te alloy is used as an image forming member in an electrophotographic printer using an LED, LD or the like as an exposure light source.
When using a Te-based photoreceptor, it is possible to suppress changes in printing characteristics due to changes in print density and environmental temperature at the beginning of printing, and to obtain high-quality images stably without the appearance of memory. It becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

第1図はこの発明の電子写真プロセスに用いられる感光
体の一例の模式的断面図、第2図は感光体の実機特性評
価装置のマシンプロセスの一例の概念図、第3図は感光
体の表面温度と半減衰露光量との関係の一例を示す線
図、第4図は第2図に示した装置における前疲労光光量
と25サイクルまでの帯電低下量との関係の一例を示す線
図、第5図は第2図の装置における感光体表面温度と初
期時の帯電低下量が飽和するまでの前疲労サイクル数と
の関係の一例を示す線図、第6図は第2図に示した装置
における実施例と比較例の感光体表面温度と250サイク
ルまでの帯電低下量との関係の一例を示す線図である。 1……導電性基体、2……電荷輸送層、3……電荷発生
層、4……表面保護層、5……感光体、6……帯電器、
7……露光光、8……現像部電位センサ、9……転写
器、10……AC分離器、11……除電光、12……クリーナ。
FIG. 1 is a schematic cross-sectional view of an example of a photoreceptor used in the electrophotographic process of the present invention, FIG. 2 is a conceptual diagram of an example of a machine process of a device for evaluating actual characteristics of a photoreceptor, and FIG. FIG. 4 is a diagram showing an example of the relationship between the surface temperature and the amount of half-decay exposure, and FIG. 4 is a diagram showing an example of the relationship between the amount of pre-fatigue light and the amount of charge reduction up to 25 cycles in the apparatus shown in FIG. FIG. 5 is a diagram showing an example of the relationship between the photoreceptor surface temperature and the number of pre-fatigue cycles until the initial charge reduction amount is saturated in the apparatus shown in FIG. 2, and FIG. 6 is a diagram shown in FIG. FIG. 6 is a diagram showing an example of the relationship between the photoconductor surface temperature and the amount of charge reduction up to 250 cycles in the example and the comparative example in the apparatus in which the present invention is performed. DESCRIPTION OF SYMBOLS 1 ... Conductive substrate, 2 ... Charge transport layer, 3 ... Charge generation layer, 4 ... Surface protective layer, 5 ... Photoconductor, 6 ... Charger,
7 Exposure light, 8 Development section potential sensor, 9 Transfer device, 10 AC separator, 11 Static elimination light, 12 Cleaner.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平2−256084(JP,A) 特開 平1−191890(JP,A) 特開 昭64−84284(JP,A) 特開 昭63−36285(JP,A) 特開 昭62−246076(JP,A) 特開 昭62−160471(JP,A) 特開 平1−186991(JP,A) 特開 昭63−101885(JP,A) 特開 昭62−85282(JP,A) 特開 昭60−209753(JP,A) 特開 平3−67291(JP,A) (58)調査した分野(Int.Cl.6,DB名) G03G 21/00 345 G03G 21/08 G03G 15/00 303 G03G 5/08 101──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-2-256084 (JP, A) JP-A-1-191890 (JP, A) JP-A-64-84284 (JP, A) JP-A-63-63 JP-A-62-246076 (JP, A) JP-A-62-160471 (JP, A) JP-A-1-186991 (JP, A) JP-A-63-101885 (JP, A) JP-A-62-85282 (JP, A) JP-A-60-209753 (JP, A) JP-A-3-67291 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) G03G 21/00 345 G03G 21/08 G03G 15/00 303 G03G 5/08 101

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】画像形成部材としての電子写真用感光体の
表面で帯電,画像露光,トナー現像,トナー像転写,光
除電,クリーニングの各工程が順次行われる電子写真プ
ロセスにおいて、 (a)画像形成部材として高Te濃度のSe−Te合金からな
る感光層を備えた機能分離型Se−Te系感光体を用い、 (b)光除電の工程の除電光に波長600nm以上660nm以下
の範囲内の光を用いること (c)付加的に前疲労を生じさせるために前記(b)項
の除電光を用い、前記(a)項の感光体の示す室温(22
℃)での半減衰露光量の10倍以上の光量で該感光体に対
して帯電一光照射を数サイクル行った後、前記電子写真
プロセスを行うことを特徴とする電子写真プロセス。
1. An electrophotographic process in which charging, image exposure, toner development, toner image transfer, photostatic elimination, and cleaning are sequentially performed on the surface of an electrophotographic photosensitive member as an image forming member. A function-separated type Se-Te type photoreceptor having a photosensitive layer composed of a high Te concentration Se-Te alloy is used as a forming member. (C) The charge removal light of the item (b) is used to additionally cause pre-fatigue, and the room temperature (22)
An electrophotographic process, wherein the photoreceptor is irradiated with a single light beam for several cycles with an amount of light that is at least 10 times the half-attenuated exposure amount at (° C.), and then the electrophotographic process is performed.
【請求項2】前記(c)項の前疲労のサイクル数を感光
体の表面温度に応じて所定の変化をさせたことを特徴と
する前記請求項第一項記載の電子写真プロセス。
2. The electrophotographic process according to claim 1, wherein the number of cycles of the pre-fatigue in the item (c) is changed by a predetermined value according to the surface temperature of the photosensitive member.
【請求項3】光除電の工程での除電光量を、前記(a)
項の感光体の室温(22℃)での半減衰露光量の3倍以上
7倍以下の範囲内で感光体の表面温度に応じた所定の変
化をさせたことを特徴とする前記請求項第一項記載の電
子写真プロセス。
3. The method according to claim 1, wherein the light elimination light quantity in the light erasing step is determined by the method (a).
A predetermined change according to the surface temperature of the photoreceptor within a range of three times to seven times the half-attenuation exposure amount of the photoreceptor at room temperature (22 ° C.). An electrophotographic process according to claim 1.
JP21976090A 1990-08-21 1990-08-21 Electrophotographic process Expired - Lifetime JP2762726B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21976090A JP2762726B2 (en) 1990-08-21 1990-08-21 Electrophotographic process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21976090A JP2762726B2 (en) 1990-08-21 1990-08-21 Electrophotographic process

Publications (2)

Publication Number Publication Date
JPH04101155A JPH04101155A (en) 1992-04-02
JP2762726B2 true JP2762726B2 (en) 1998-06-04

Family

ID=16740575

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21976090A Expired - Lifetime JP2762726B2 (en) 1990-08-21 1990-08-21 Electrophotographic process

Country Status (1)

Country Link
JP (1) JP2762726B2 (en)

Also Published As

Publication number Publication date
JPH04101155A (en) 1992-04-02

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