JP2608701B2 - Inspection circuit for protective device - Google Patents
Inspection circuit for protective deviceInfo
- Publication number
- JP2608701B2 JP2608701B2 JP60209349A JP20934985A JP2608701B2 JP 2608701 B2 JP2608701 B2 JP 2608701B2 JP 60209349 A JP60209349 A JP 60209349A JP 20934985 A JP20934985 A JP 20934985A JP 2608701 B2 JP2608701 B2 JP 2608701B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- input
- value
- circuit
- transformer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 title claims description 79
- 230000001681 protective effect Effects 0.000 title 1
- 238000004804 winding Methods 0.000 claims description 15
- 230000005856 abnormality Effects 0.000 claims description 4
- 230000002950 deficient Effects 0.000 claims 1
- 230000001131 transforming effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 8
- 230000001629 suppression Effects 0.000 description 8
- 230000006866 deterioration Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Emergency Protection Circuit Devices (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は保護装置の点検回路に関し、例えば母線保護
装置等に適用できる点検回路に関するものである。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection circuit for a protection device, and more particularly to an inspection circuit applicable to a bus protection device and the like.
第３図は最も一般的に行われている文献三菱電機技法
に示された従来の母線保護装置点検回路の接続図例で、
（１）は線路または母線等の電力系統、（２）は線路等
に接続されている変流器、（３）は母線保護リレー用入
力装置、（4A），（4B），（4C）は抑制トランス、（5
A），（5B），（5C）は差動トランス、（6A），（6
B），（6C）は抑制回路点検巻線、（7A），（7B），（7
C）は抑制トランス２次巻線、（8A），（8B），（8
C），（8D）は抑制回路リード線、（９）は点検判定要
素、（10）は母線保護リレー、（11）は点検電源トラン
ス、等からなる母線保護装置の点検回路である。FIG. 3 is an example of a connection diagram of a conventional bus protection device inspection circuit shown in the most commonly performed literature Mitsubishi Electric Technology.
(1) is a power system such as a line or a bus, (2) is a current transformer connected to the line or the like, (3) is an input device for a bus protection relay, (4A), (4B), and (4C) are Suppression transformer, (5
A), (5B), (5C) are differential transformers, (6A), (6
B) and (6C) are suppression circuit inspection windings, (7A), (7B), (7
C) suppressor secondary winding, (8A), (8B), (8
C) and (8D) are suppression circuit lead wires, (9) is an inspection judgment element, (10) is a bus protection relay, and (11) is an inspection circuit of a bus protection device including an inspection power transformer and the like.
次に動作について説明する。第３図において、点検入
力AC 200Vを点検電源トランス（11）を介して母線保護
リレー用入力装置（３）内の抑制回路点検巻線（6A），
（6B），（6C）に印加し、点検判定要素（９）が動作す
ることを確認すれば、点検は良判定となる。他方、入力
装置（３）の２次回路（8A），（8B），（8C），（8D）
のいずれかが断線すれば点検判定要素（９）は入力電圧
が欠けるので動作せず、点検不良となり、異常を検出す
ることが可能である。Next, the operation will be described. In FIG. 3, the inspection input AC 200V is applied to the suppression circuit inspection winding (6A) in the bus protection relay input device (3) via the inspection power transformer (11).
When the voltage is applied to (6B) and (6C) and it is confirmed that the inspection determination element (9) operates, the inspection is a good determination. On the other hand, the secondary circuits (8A), (8B), (8C), and (8D) of the input device (3)
If any one of the above is disconnected, the inspection determination element (9) does not operate because the input voltage is lacking, resulting in an inspection failure and an abnormality can be detected.
なお、点検判定要素（９）は母線保護リレー（10）の
動作電圧の20〜30％で動作するものであり、点検入力に
より母線保護リレー（10）は動作しない。入力装置回路
の点検は、従来から点検電源トランス（11）より入力を
印加し、点検判定要素（９）が動作、不動作で点検判定
“良”、“否”を決定している。The inspection judgment element (9) operates at 20 to 30% of the operating voltage of the bus protection relay (10), and the bus protection relay (10) does not operate according to the inspection input. In the inspection of the input device circuit, conventionally, an input is applied from an inspection power transformer (11), and the inspection determination element (9) is operated or not operated to determine the inspection determination “good” or “fail”.
そして、点検判定要素（９）はある一定レベル値以上
あれば動作するので、入力電圧が不足になる異常、例え
ば抑制回路点検巻線（6A），（6B），（6C）、抑制トラ
ンス２次巻線（7A），（7B），（7C）の断線，短絡、抑
制回路リード線（8A），（8B），（8C），（8D）の断
線，短絡は検出することが可能である。しかし入力電圧
が過大となる異常、例えば入力装置内部の半導体部品の
劣化、過大入力電圧の印加などにより一定レベル値以上
の電圧が発生しても、現在の点検判定方式だと検出する
ことが不可能である。Then, since the inspection judgment element (9) operates if it is equal to or more than a certain level value, an abnormality in which the input voltage becomes insufficient, for example, the suppression circuit inspection windings (6A), (6B), (6C), and the suppression transformer secondary Disconnection and short-circuit of windings (7A), (7B) and (7C), and disconnection and short-circuit of suppression circuit leads (8A), (8B), (8C) and (8D) can be detected. However, even if a voltage exceeding a certain level value occurs due to an abnormality that causes an excessive input voltage, for example, deterioration of semiconductor components inside the input device or application of an excessive input voltage, it is not possible to detect that the current inspection determination method is used. It is possible.
従来の母線保護装置の点検回路は以上のように、点検
判定要素に印加される各入力電圧がある一定レベル値以
上あれば、点検判定要素（９）が「異常なし」と判定す
るので、過大電圧が印加されていても現在の点検回路で
は見つけることが出来ない欠点があつた。As described above, the inspection circuit of the conventional bus protection device determines that the inspection determination element (9) is "abnormal" if each input voltage applied to the inspection determination element is equal to or more than a certain level value. Even when voltage is applied, there is a disadvantage that cannot be found in the current inspection circuit.
この発明は上記のような従来のものの欠点を除去する
ためになされたもので、入力装置の出力が異常に小さい
場合のみでなく、異常に大きい場合にも検出できるよう
に点検能力を向上させることを目的とするものである。SUMMARY OF THE INVENTION The present invention has been made in order to eliminate the above-mentioned drawbacks of the conventional device, and has an object to improve the inspection capability so that not only when the output of the input device is abnormally small but also when the output of the input device is abnormally large. It is intended for.
この発明に係る保護装置の点検回路は、基準入力と入
力装置からの入力とをそれぞれトランスに通して上記基
準入力と上記入力装置からの入力とがキヤンセルされる
回路構成として上記基準入力と上記入力装置からの入力
とを比較演算して点検判定するようにしたものである。The inspection circuit of the protection device according to the present invention has a circuit configuration in which the reference input and the input from the input device are respectively passed through a transformer to cancel the reference input and the input from the input device. Inspection and judgment are made by comparing and calculating the input from the device.
この発明における保護装置の点検回路においては、基
準入力と入力装置からの入力とをそれぞれトランスに通
して上記基準入力と上記入力装置からの入力とがキヤン
セルされる回路構成としたので、上記入力装置からの入
力が異常に小さい場合のみでなく、異常に大きい場合も
検出でき、従つて例えば入力装置内での断線のみでな
く、例えば入力装置内の半導体の劣化による電圧上昇等
も検出できる。In the inspection circuit of the protection device according to the present invention, the reference input and the input from the input device are each passed through a transformer to cancel the reference input and the input from the input device. It is possible to detect not only the case where the input from the input device is abnormally small, but also the case where the input from the input device is abnormally large. Therefore, for example, not only the disconnection in the input device but also the voltage rise due to the deterioration of the semiconductor in the input device can be detected.
以下この発明の一実施例を図において説明する。第１
図において、（Ｖ）は基準入力電圧、(VA),(VB),(VC)は
演算入力電圧、（14A），（14B），（14C）は演算入力
トランス、（13A），（13B），（13C）は基準入力トラ
ンス、（15A），（15B），（15C）は演算入力トランス
（14A）〜（14C）の出力と基準入力トランス（13A）〜
（13C）の出力がキャンセルされた出力を全波整流し
た、即ち２つの出力の差の絶対値を出力する全波整流回
路、（16）は点検判定回路である。An embodiment of the present invention will be described below with reference to the drawings. First
In the figure, (V) is a reference input voltage, (V A ), (V B ), (V C ) are operation input voltages, (14A), (14B), (14C) are operation input transformers, (13A), (13B), (13C) are reference input transformers, (15A), (15B), (15C) are operation input transformers (14A) to (14C) and reference input transformers (13A) to
A full-wave rectification circuit that full-wave rectifies the output from which the output of (13C) is canceled, that is, outputs the absolute value of the difference between the two outputs, and (16) is an inspection determination circuit.
第１図全体は点検判定要素の内部回路図である。 FIG. 1 is an internal circuit diagram of the inspection determination element.
第２図において、（6A），（6B），（6C）は差動回路
点検巻線、（7A），（7B），（7C）は差動トランス２次
巻線、（8A），（8B），（8C）は抑制回路リード線、
（12A）は点検電源トランス（11）の２次巻線、（12B）
は基準入力電圧を発生させる点検電源トランスの３次巻
線、（13）はこの点検電源トランス（11）の３次巻線
（12B）により発生する基準入力電圧、（14）は点検電
源トランス（11）の２次巻線（12A）により入力装置
（３）を通して発生する演算入力電圧である。In FIG. 2, (6A), (6B), (6C) are differential circuit inspection windings, (7A), (7B), (7C) are differential transformer secondary windings, (8A), (8B) ), (8C) are suppression circuit leads,
(12A) is the secondary winding of the inspection power transformer (11), (12B)
Is the tertiary winding of the inspection power transformer that generates the reference input voltage, (13) is the reference input voltage generated by the tertiary winding (12B) of the inspection power transformer (11), and (14) is the inspection power transformer ( This is an operation input voltage generated through the input device (3) by the secondary winding (12A) of 11).
他は第３図と同じである。 Others are the same as FIG.
第２図において、点検時のみ点検電源トランス（11）
より入力装置（３）を通して入力される演算入力は第３
図の場合と同様の回路図である。In Fig. 2, power supply transformer (11) for inspection only during inspection
The operation input input through the input device (3) is the third input.
It is a circuit diagram similar to the case of the figure.
従来回路（第３図）では検出できなかつた点検入力要
素に印加される電圧が一定レベル値を越える過大電圧値
でも、点検電源トランス（11）より印加される基準入力
値と比較演算（基準入力値−演算入力値）し、その差の
絶対値がある規定値（誤差裕度値）以下であることで点
検判定“良”と判定することが可能である。Even if the voltage applied to the inspection input element, which cannot be detected by the conventional circuit (FIG. 3), exceeds the predetermined level, the voltage applied to the inspection input element is compared with the reference input value applied from the inspection power supply transformer (11). (Value-calculation input value), and when the absolute value of the difference is equal to or smaller than a predetermined value (error margin value), it is possible to determine that the inspection is “good”.
例えば、第３図に示す従来の点検回路では、点検判定
要素の検出値が10Vとすると点検入力演算値が10V以上で
点検判定“良”とし、10V以下で点検判定“否”となる
ので過大電圧（数百ボルト）でも点検判定“良”となつ
ていたが、今回発明した点検判定要素（第１図）を使つ
た一実施例による点検回路図（第２図）により、規定値
（誤差裕度値）を±2Vと決めると基準入力値（13）10V
に対して、点検入力演算値（14）が12V以下で点検判定
“良”となり、13Vになると点検判定“否”となり精度
点検が可能となる。また、点検入力演算値が8V以上で点
検判定“良”となり、7Vになると（微小電圧）点検判定
“否”となり精度点検が可能となる。For example, in the conventional inspection circuit shown in FIG. 3, if the detected value of the inspection determination element is 10 V, the inspection input calculation value is 10 V or more, the inspection determination is “good”, and if the detection input calculation value is 10 V or less, the inspection determination is “not good”. Although the inspection judgment was "good" even at the voltage (several hundred volts), the inspection circuit diagram (FIG. 2) according to the embodiment using the inspection judgment element (FIG. 1) of the present invention, provided a specified value (error). If the tolerance value is determined to be ± 2V, the reference input value (13) 10V
On the other hand, when the inspection input calculation value (14) is 12 V or less, the inspection judgment is “good”. In addition, when the inspection input calculation value is 8 V or more, the inspection determination is “good”, and when it is 7 V (small voltage), the inspection determination is “no”, and the accuracy inspection is possible.
第１図は今回発明回路の点検判定要素（９）の内部回
路図である。基準入力電圧（Ｖ）と演算入力電圧(VA),
(VB),(VC)を基準入力トランス（13A），（13B），（13
C）と演算入力トランス（14A），（14B），（14C）とを
通して突き合わせキヤンセルするような回路構成として
いる。よつて、判定回路（16）の規定値を±2Vと設定し
ておくと、基準入力値（Ｖ）10Vに対して、点検演算入
力値(VA),(VB),(VC)が12V以下又は8V以上で点検判定
“良”となり、13V,7Vと点検演算入力値が変化すると点
検判定“否”となり精度点検が可能となるのである。FIG. 1 is an internal circuit diagram of the inspection judgment element (9) of the circuit of the present invention. Reference input voltage (V) and calculation input voltage (V A ),
(V B ) and (V C ) are used as reference input transformers (13A), (13B), (13
C) and the operation input transformers (14A), (14B), and (14C). Therefore, if the specified value of the judgment circuit (16) is set to ± 2 V, the check calculation input values (V A ), (V B ), and (V C ) are compared with the reference input value (V) of 10 V. Is 12 V or less or 8 V or more, the inspection judgment is “good”, and if the inspection calculation input value changes to 13 V, 7 V, the inspection judgment is “No” and the accuracy inspection is possible.
また、上記実施例では母線保護装置の入力装置２次回
路の点検判定要素について説明したが、他のリレー装置
（例えば変圧器保護装置、搬送保護装置、発電機保護装
置、表示線保護装置他）で点検判定要素（第１図）を設
置して点検しようとする回路（被点検回路）がある点検
判定回路であつてもよく、上記実施例と同様の効果を奏
する。Further, in the above-described embodiment, the inspection determination element of the input device secondary circuit of the bus protection device has been described, but other relay devices (for example, a transformer protection device, a transport protection device, a generator protection device, a display line protection device, and the like). The inspection determination circuit may be a circuit (circuit to be inspected) in which the inspection determination element (FIG. 1) is to be installed and inspected, and the same effect as in the above embodiment can be obtained.
以上のようにこの発明によれば、基準入力と入力装置
からの入力とをそれぞれトランスに通して上記基準入力
と上記入力装置からの入力とがキヤンセルされる回路構
成にして上記基準入力と上記入力装置の出力の差の絶対
値を比較演算して点検判定するようにしたので、トラン
スと点検判定回路を設けるだけで、上記入力装置の出力
が異常に小さい場合のみでなく、異常に大きい場合も確
実に検出出来、従つて例えば断線のみでなく入力装置内
の半導体の劣化による電圧上昇、過大入力電圧の印加等
をも検出できるという効果がある。As described above, according to the present invention, the reference input and the input from the input device are each passed through a transformer, and the reference input and the input from the input device are cancelled. The absolute value of the difference between the outputs of the devices is compared to determine the inspection, so only providing a transformer and the inspection determination circuit can be used not only when the output of the input device is abnormally small but also when the output is abnormally large. This has the effect of reliably detecting, for example, not only disconnection but also voltage rise due to deterioration of the semiconductor in the input device, application of excessive input voltage, and the like.
第１図はこの発明の一実施例の要部つまり点検判定要素
の内部回路を示す接続図、第２図はこの発明の一実施例
を示す接続図で、第１図の点検判定要素を使つた例を示
してある。第３図は従来の母線保護装置の点検回路図で
ある。 なお、各図中同一符号は同一または相当する部分を示
す。FIG. 1 is a connection diagram showing an essential part of one embodiment of the present invention, that is, an internal circuit of an inspection judging element, and FIG. 2 is a connection diagram showing an embodiment of the present invention, which uses the inspection judging element of FIG. An example is shown. FIG. 3 is an inspection circuit diagram of a conventional bus protection device. In the drawings, the same reference numerals indicate the same or corresponding parts.
Claims (1)
変成する入力装置、 この入力装置の出力電流により付勢される保護リレー、 点検時に上記入力トランスの点検巻線へ単相の点検入力
を給電し単相の基準入力値を出力する出力巻線を有する
点検電圧トランス、 及び上記入力トランスの出力巻線と上記点検電圧トラン
スの出力巻線とに接続され、点検時、各相毎に上記基準
入力値と上記入力トランスの出力値とを比較演算し上記
入力装置の異常を検出する点検判定要素を備えてなる保
護装置の点検回路において、上記点検判定要素は、点検
時、各相毎に該基準入力値と上記入力トランスの出力値
との差の絶対値を得、該絶対値の大きさが規定値を越え
たとき不良と判定することを特徴とする保護装置の点検
回路。1. An input device for transforming each phase current of a power system by an input transformer, a protection relay activated by an output current of the input device, and a single-phase check input to a check winding of the input transformer during a check. An inspection voltage transformer having an output winding for supplying power and outputting a single-phase reference input value, and being connected to an output winding of the input transformer and an output winding of the inspection voltage transformer, In the inspection circuit of the protection device including an inspection determination element for comparing and calculating a reference input value and an output value of the input transformer and detecting an abnormality of the input device, the inspection determination element is provided for each phase during inspection. An inspection circuit for a protection device, wherein an absolute value of a difference between the reference input value and an output value of the input transformer is obtained, and when the magnitude of the absolute value exceeds a specified value, it is determined to be defective.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60209349A JP2608701B2 (en) | 1985-09-19 | 1985-09-19 | Inspection circuit for protective device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60209349A JP2608701B2 (en) | 1985-09-19 | 1985-09-19 | Inspection circuit for protective device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6268015A JPS6268015A (en) | 1987-03-27 |
| JP2608701B2 true JP2608701B2 (en) | 1997-05-14 |
Family
ID=16571477
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60209349A Expired - Lifetime JP2608701B2 (en) | 1985-09-19 | 1985-09-19 | Inspection circuit for protective device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2608701B2 (en) |
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| US8618659B2 (en) | 2011-05-03 | 2013-12-31 | Tessera, Inc. | Package-on-package assembly with wire bonds to encapsulation surface |
| US9105483B2 (en) | 2011-10-17 | 2015-08-11 | Invensas Corporation | Package-on-package assembly with wire bond vias |
| US8835228B2 (en) | 2012-05-22 | 2014-09-16 | Invensas Corporation | Substrate-less stackable package with wire-bond interconnect |
| US9391008B2 (en) | 2012-07-31 | 2016-07-12 | Invensas Corporation | Reconstituted wafer-level package DRAM |
| US8975738B2 (en) | 2012-11-12 | 2015-03-10 | Invensas Corporation | Structure for microelectronic packaging with terminals on dielectric mass |
| US8878353B2 (en) | 2012-12-20 | 2014-11-04 | Invensas Corporation | Structure for microelectronic packaging with bond elements to encapsulation surface |
| US10886250B2 (en) | 2015-07-10 | 2021-01-05 | Invensas Corporation | Structures and methods for low temperature bonding using nanoparticles |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5725119A (en) * | 1980-07-18 | 1982-02-09 | Meidensha Electric Mfg Co Ltd | Device for inspecting and monitoring protection relay |
-
1985
- 1985-09-19 JP JP60209349A patent/JP2608701B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6268015A (en) | 1987-03-27 |
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