[go: up one dir, main page]

JP2601776Y2 - microscope - Google Patents

microscope

Info

Publication number
JP2601776Y2
JP2601776Y2 JP1993057687U JP5768793U JP2601776Y2 JP 2601776 Y2 JP2601776 Y2 JP 2601776Y2 JP 1993057687 U JP1993057687 U JP 1993057687U JP 5768793 U JP5768793 U JP 5768793U JP 2601776 Y2 JP2601776 Y2 JP 2601776Y2
Authority
JP
Japan
Prior art keywords
dark
field
slider
illumination
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1993057687U
Other languages
Japanese (ja)
Other versions
JPH0726815U (en
Inventor
修哉 城ヶ崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optic Co Ltd filed Critical Olympus Optic Co Ltd
Priority to JP1993057687U priority Critical patent/JP2601776Y2/en
Publication of JPH0726815U publication Critical patent/JPH0726815U/en
Application granted granted Critical
Publication of JP2601776Y2 publication Critical patent/JP2601776Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Microscoopes, Condenser (AREA)

Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、落射暗視野検鏡と他の
検鏡とを切換え可能な顕微鏡に係わり、特に落射暗視野
検鏡のときのスライダ挿脱口における照明光と観察光と
を分離することにより、観察像の劣化を防止し得る顕微
鏡に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope capable of switching between an epi-illumination dark-field speculum and another speculum. The present invention relates to a microscope capable of preventing deterioration of an observed image by being separated.

【0002】[0002]

【従来の技術】従来、被検物表面の極めて微小な凹凸を
確認可能な微分干渉観察法と、被検体表面の微小な凹凸
を確認可能な落射暗視野観察法とを切換え可能とした顕
微鏡が知られている。
2. Description of the Related Art Conventionally, a microscope capable of switching between a differential interference observation method capable of confirming extremely minute irregularities on the surface of a test object and an incident dark-field observation method capable of confirming minute irregularities on the surface of an object has been developed. Are known.

【0003】図5はこの種の顕微鏡の落射微分干渉光学
系を示す図である。この落射微分干渉法は、光源1より
出射された照明光が集光レンズ2、開口絞りAS3、視
野絞りFS4及びFSレンズ群5を通過した後にポララ
イザ6によって直線偏光され、かつ直線偏光された光線
が観察光路上に配置されたハーフミラー7によって反射
されて上部暗視野用筒8の中心部を通過して微分干渉用
プリズム9に入射する。なお、微分干渉用プリズム9は
落射微分干渉用スライダ10に保持されている。
FIG. 5 is a diagram showing an incident-light differential interference optical system of this type of microscope. In this epi-illumination differential interference method, the illumination light emitted from the light source 1 is linearly polarized by the polarizer 6 after passing through the condenser lens 2, the aperture stop AS3, the field stop FS4, and the FS lens group 5, and the linearly polarized light beam Is reflected by the half mirror 7 disposed on the observation optical path, passes through the center of the upper dark field tube 8, and enters the differential interference prism 9. Note that the differential interference prism 9 is held by an incident-light differential interference slider 10.

【0004】微分干渉用プリズム9は、ポラライザ6に
より直線偏光された光線を振動方向の異なる二つの光線
に分離すると共に、この二つの光線を下部暗視野用筒1
1の内側及び対物レンズ12を通して試料13に照射さ
せる。なお、対物レンズ12は周囲を暗視野用リングレ
ンズ14に囲まれており、これら対物レンズ12及び暗
視野用リングレンズ14が暗視野対物レンズ15を構成
している。
The differential interference prism 9 separates the light beam linearly polarized by the polarizer 6 into two light beams having different vibration directions, and separates the two light beams into the lower dark field tube 1.
The sample 13 is irradiated on the inside of the sample 1 and through the objective lens 12. The objective lens 12 is surrounded by a dark-field ring lens 14. The objective lens 12 and the dark-field ring lens 14 constitute a dark-field objective lens 15.

【0005】一方、試料13からの観察光は対物レンズ
12を通って微分干渉用プリズム9により結合された
後、ハーフミラー7を通過してアナライザ16に入射さ
れる。アナライザ16は微分干渉用プリズム9によって
結合された二つの光線を干渉させるように作用し、干渉
させられた二つの光線は結像レンズ17にて結像されて
干渉色のコントラストをもつ微分干渉像を生じる。
On the other hand, observation light from the sample 13 passes through the objective lens 12 and is coupled by the prism 9 for differential interference, and then passes through the half mirror 7 and enters the analyzer 16. The analyzer 16 acts so as to cause the two rays combined by the differential interference prism 9 to interfere with each other. The two rays caused to interfere with each other are imaged by the imaging lens 17 to have a differential interference image having a contrast of the interference color. Is generated.

【0006】なお、このような光学系を用いた顕微鏡で
は、図6及び図7に示すように、上部暗視野用筒8が取
付け座18に形成されており、また下部暗視野用筒11
がレボルバ21に形成されている。取付け座18は上部
暗視野用筒8及び下部暗視野用筒11の間にスライダ挿
脱口19が形成され、このスライダ挿脱口19に落射微
分干渉用スライダ10を挿脱自在に保持している。ま
た、取付け座18はスライダ挿脱口19の下方に回転自
在に設けられたレボルバ21を有し、レボルバ21に暗
視野対物レンズ15が取付けられている。
In a microscope using such an optical system, as shown in FIGS. 6 and 7, an upper dark field tube 8 is formed on a mounting seat 18, and a lower dark field tube 11 is provided.
Are formed on the revolver 21. The mounting seat 18 has a slider insertion / removal opening 19 formed between the upper dark-field tube 8 and the lower dark-field tube 11, and holds the slider 10 for epi-differential differential interference in the slider insertion / removal opening 19. The mounting seat 18 has a revolver 21 rotatably provided below the slider insertion / removal opening 19, and the dark field objective lens 15 is mounted on the revolver 21.

【0007】ここで、このような落射微分干渉光学系を
落射暗視野光学系に切換える場合について説明する。図
8はこの落射暗視野光学系を示す図である。この落射暗
視野光学系は、図5に示す落射微分干渉光学系からポラ
ライザ6、アナライザ16及び落射微分干渉用スライダ
10を光路上より除去し、ハーフミラー7に代えて暗視
野用キューブ22を取付けたものである。
Here, a case where such an epi-illumination differential interference optical system is switched to an epi-illumination dark field optical system will be described. FIG. 8 is a diagram showing the epi-illumination dark-field optical system. In this epi-illumination dark-field optical system, the polarizer 6, the analyzer 16, and the slider 10 for epi-illumination differential interference are removed from the optical path from the epi-illumination differential interference optical system shown in FIG. It is a thing.

【0008】すなわち、光源1より出射された照明光は
FSレンズ群5を通過した後に暗視野用キューブ22に
よって反射され、反射光が暗視野用筒8,11の外側及
び暗視野用リングレンズ14を通して試料13に照射さ
れる。試料13からの観察光は対物レンズ12及び暗視
野用筒8,11の内側を通って結像レンズ17にて結像
され、観察像が得られる。
That is, the illumination light emitted from the light source 1 is reflected by the dark-field cube 22 after passing through the FS lens group 5, and the reflected light is outside the dark-field cylinders 8 and 11 and the dark-field ring lens 14. The sample 13 is radiated through the sample 13. Observation light from the sample 13 passes through the objective lens 12 and the inside of the dark-field tubes 8 and 11 and is formed into an image by the imaging lens 17 to obtain an observation image.

【0009】なお、落射微分干渉光学系及び落射暗視野
光学系は、前述した通り、ポラライザ6、アナライザ1
6並びに落射微分干渉用スライダ10の着脱及びミラー
7と暗視野用キューブ22との入換えにより、交互に変
換可能となっている。
The epi-differential interference optical system and the epi-dark field optical system are composed of the polarizer 6 and the analyzer 1 as described above.
6 and alternately by attaching / detaching the slider 10 for epi-illumination differential interference and exchanging the mirror 7 with the cube 22 for dark field.

【0010】[0010]

【考案が解決しようとする課題】しかしながら以上のよ
うな顕微鏡では、落射微分干渉光学系から落射暗視野光
学系に切換える際に、光路上から落射微分干渉用スライ
ダ10を抜き取るが、図9及び図10に示すように、こ
の落射微分干渉用スライダ10の入っていた空間に照明
光と観察光とを分離する暗視野用の筒がないため、照明
光が観察光に入射して観察像が劣化してしまう問題があ
る。
However, in the above-mentioned microscope, the slider 10 for epi-illumination differential interference is extracted from the optical path when switching from the epi-illumination differential interference optical system to the epi-illumination dark field optical system. As shown in FIG. 10, there is no dark-field tube for separating the illumination light and the observation light in the space where the incident-light differential interference slider 10 is located, so that the illumination light is incident on the observation light and the observation image is degraded. There is a problem.

【0011】本考案は上記実情を考慮してなされたもの
で、落射暗視野検鏡のときのスライダ挿脱口における照
明光と観察光とを分離することにより、鮮明な観察像を
得ることが可能な顕微鏡を提供することを目的とする。
The present invention has been made in consideration of the above-described circumstances, and a clear observation image can be obtained by separating illumination light and observation light at a slider insertion / removal opening in an epi-illumination dark field microscope. The objective is to provide a simple microscope.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するため
に請求項1に対応する考案は、対物レンズからの観察光
を遮ることなく観察光路上に配置された照明光入射部に
より、照明光を入射させて観察試料を照明する落射照明
光学系を備え、前記照明光入射部と前記対物レンズとの
間にスライダ挿脱口を設け、このスライダ挿脱口にスラ
イダを挿脱することにより、検鏡法を切替える顕微鏡に
おいて、落射暗視野検鏡のとき、前記スライダに代えて
前記スライダ挿脱口に挿入され、照明光と観察光とを分
離する分離筒を形成する暗視野用スライダを備えた顕微
鏡である。
According to a first aspect of the present invention, there is provided an illumination light input unit disposed on an observation optical path without interrupting observation light from an objective lens. And an epi-illumination optical system for illuminating the observation sample by allowing light to enter, a slider insertion / removal opening is provided between the illumination light incident portion and the objective lens, and a slider is inserted / removed into / from the slider insertion / removal opening. In the microscope that switches the method, in the case of an epi-illumination dark-field spectroscope, a microscope equipped with a dark-field slider that is inserted into the slider insertion / removal opening instead of the slider and forms a separation tube that separates illumination light and observation light. is there.

【0013】また、請求項2に対応する考案は、上記暗
視野用スライダが前記落射暗視野検鏡のときとは異なる
ときに使用可能な光学素子を備えた請求項1に対応する
顕微鏡である。
A second aspect of the present invention is a microscope according to the first aspect, further comprising an optical element that can be used when the dark-field slider is different from that used in the incident-light dark-field microscope. .

【0014】[0014]

【作用】従って、請求項1に対応する考案は以上のよう
な手段を講じたことにより、落射暗視野検鏡のとき、ス
ライダ挿脱口に挿入された暗視野用スライダが、照明光
と観察光とを分離する分離筒を形成するので、落射暗視
野検鏡のときのスライダ挿脱口における照明光と観察光
とを分離することにより、鮮明な観察像を得ることがで
きる。
Therefore, the invention according to the first aspect of the present invention employs the above-described means. In the case of an epi-illumination dark-field speculum, the dark-field slider inserted into the slider insertion / removal slot emits illumination light and observation light. Since a separation tube is formed to separate the illumination light and the observation light at the slider insertion / removal port in the case of the epi-illumination dark field spectroscope, a clear observation image can be obtained.

【0015】また、請求項2に対応する考案は、上記暗
視野用スライダが落射暗視野検鏡のときとは異なるとき
に使用可能な光学素子を備えているので、請求項1の作
用に加え、落射暗視野検鏡からこの光学素子を用いる他
の検鏡へ容易に切換えることができる。
According to a second aspect of the present invention, the dark-field slider has an optical element that can be used when the dark-field slider is different from an epi-illumination dark-field speculum. It is easy to switch from an epi-illumination dark-field speculum to another speculum using this optical element.

【0016】[0016]

【実施例】以下、本考案の実施例について図面を参照し
ながら説明する。図1は本考案の第1の実施例に係る顕
微鏡に適用される暗視野用スライダの構成を示す斜視図
及びそのA−A線矢視断面図であり、図2はこの暗視野
用スライダをスライダ挿脱口に挿入した場合の取付け座
18の断面図であって、図5乃至図10と同一部分には
同一符号を付してその詳しい説明は省略し、ここでは異
なる部分についてのみ述べる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a perspective view showing a configuration of a dark field slider applied to the microscope according to the first embodiment of the present invention, and a sectional view taken along line AA of FIG. 2. FIG. FIG. 11 is a cross-sectional view of the mounting seat 18 when inserted into the slider insertion / removal opening. The same parts as those in FIGS. 5 to 10 are denoted by the same reference numerals, and detailed description thereof is omitted. Only different parts will be described here.

【0017】ここで、暗視野用スライダ31は、上部及
び下部暗視野用筒8,11よりも大きい径の開口部32
が形成されると共に、この開口部32の内側に向けて3
つの梁部33a〜33cが設けられ、各梁部33a〜3
3cが上部及び下部暗視野用筒8,11と同一径の円筒
状に形成された分離筒34を固定している。
The dark field slider 31 has an opening 32 having a diameter larger than that of the upper and lower dark field tubes 8 and 11.
Are formed, and 3
Three beam portions 33a to 33c are provided, and each beam portion 33a to 33c is provided.
Reference numeral 3c fixes a separation tube 34 formed in a cylindrical shape having the same diameter as the upper and lower dark field tubes 8 and 11.

【0018】次に、このような顕微鏡の作用を説明す
る。微分干渉用光学系から暗視野用光学系に切換えると
き、操作者の操作により、ポラライザ6、アナライザ1
6並びに落射微分干渉用スライダ10が除去されると共
に、ミラー7と暗視野用キューブ22とが入換えられ、
図2に示すように、暗視野用スライダ31がスライダ挿
脱口19に挿入されたとする。
Next, the operation of such a microscope will be described. When switching from the differential interference optical system to the dark field optical system, the polarizer 6 and the analyzer 1 are operated by the operator.
6 and the slider 10 for epi-illumination differential interference are removed, and the mirror 7 and the dark-field cube 22 are replaced.
It is assumed that the dark field slider 31 is inserted into the slider insertion / removal opening 19 as shown in FIG.

【0019】光源1からの照明光は暗視野用キューブ2
2にて反射され、この反射光が上部暗視野用筒8、分離
筒34並びに下部暗視野用筒11の外側を通過して暗視
野対物レンズ15内の暗視野用リングレンズ14を通っ
て試料13に照射される。
The illumination light from the light source 1 is a dark-field cube 2
The reflected light passes through the upper dark-field tube 8, the separation tube 34 and the outside of the lower dark-field tube 11, passes through the dark-field ring lens 14 in the dark-field objective lens 15, and then the sample is reflected. 13 is irradiated.

【0020】一方、試料13からの観察光は、対物レン
ズ12を通ると共に、下部暗視野用筒11、分離筒34
及び上部暗視野用筒8の内側を通って結像レンズ17に
て結像され、観察像が得られる。
On the other hand, the observation light from the sample 13 passes through the objective lens 12 and the lower dark-field tube 11 and the separation tube 34.
Then, an image is formed by the imaging lens 17 through the inside of the upper dark-field tube 8, and an observation image is obtained.

【0021】このとき、分離筒34が照明光と観察光と
を分離することにより、照明光の観察光への入射を阻止
しているので、観察像の劣化を防止し、より鮮明な観察
像を得ることができる。
At this time, the separation cylinder 34 separates the illumination light and the observation light, thereby preventing the illumination light from being incident on the observation light, thereby preventing the observation image from deteriorating and providing a clearer observation image. Can be obtained.

【0022】上述したように第1の実施例によれば、落
射暗視野検鏡のとき、スライダ挿脱口19に挿入された
暗視野用スライダ31が、照明光と観察光とを分離する
ようにしたので、従来とは異なり、照明光の観察光への
入射を阻止して観察像の劣化を防止し、より鮮明でコン
トラストのある観察像を得ることができる。
As described above, according to the first embodiment, in the case of an epi-illumination dark-field speculum, the dark-field slider 31 inserted into the slider slot 19 separates the illumination light and the observation light. Therefore, unlike the related art, it is possible to prevent the observation light from deteriorating by preventing the illumination light from being incident on the observation light, and to obtain a clearer and higher-contrast observation image.

【0023】次に、本考案の第2の実施例に係る顕微鏡
について説明する。図3はこの顕微鏡に適用される暗視
野用スライダの構成を示す斜視図である。この暗視野用
スライダ41は、スライダ部42及び暗視野用筒部43
から構成されている。
Next, a microscope according to a second embodiment of the present invention will be described. FIG. 3 is a perspective view showing a configuration of a dark field slider applied to this microscope. The dark field slider 41 includes a slider section 42 and a dark field cylindrical section 43.
It is composed of

【0024】暗視野用筒部43は、上部及び下部暗視野
用筒8,11と同一の径で円筒状に形成された分離筒4
4を有し、この分離筒44の上部から水平方向の外側に
向けて3つの梁部45a〜45cが設けられている。各
梁部45a〜45cは暗視野時の照明光通路よりも大き
い径の輪状に形成されたツバ部46に取付けられてい
る。すなわち、ツバ部46の内径と分離筒44の外径と
の間に各梁部45a〜45cが介在している。換言する
と、分離筒44の外径は、ツバ部46の内径よりも各梁
部45a〜45cの分だけ小さい値となっている。
The dark-field tube 43 is formed of a separation tube 4 having the same diameter as the upper and lower dark-field tubes 8 and 11 and having a cylindrical shape.
4, and three beam portions 45a to 45c are provided from the upper portion of the separation cylinder 44 toward the outside in the horizontal direction. Each of the beam portions 45a to 45c is attached to a collar portion 46 formed in a ring shape having a diameter larger than the illumination light path in the dark field. That is, the inner diameter of the collar 46 and the outer diameter of the separation cylinder 44
Each of the beams 45a to 45c is interposed therebetween. Paraphrase
And the outer diameter of the separation cylinder 44 is smaller than the inner diameter of the collar 46 by each beam.
The value is smaller by the portions 45a to 45c.

【0025】一方、スライダ部42はツバ部46の内径
と同一の径をもつ開口部47が形成され、且つこの開口
部47の周囲にツバ部46の外径よりも僅かに大きい径
の保持穴48がツバ部46の厚さと同一の深さをもつよ
うに形成されている。すなわち、分離筒44の外径は、
開口部47の径よりも各梁部45a〜45cの分だけ小
さい値となる。また、保持穴48はツバ部46に係合し
てツバ部46を保持するものであり、ツバ部46を容易
に着脱可能とするためにスライダ部42の側部側で一部
が切欠され、さらに、ツバ部46を固定するための3つ
のマグネット49a〜49cが埋設されている。また、
ツバ部46は保持穴48の各マグネット49a〜49c
に対応する下部に図示しないマグネットまたは磁性体が
設けられ、このマグネットが保持穴48の各マグネット
49a〜49cに吸着可能となっている。
On the other hand, the slider portion 42 has an opening 47 having the same diameter as the inner diameter of the flange 46, and a holding hole having a diameter slightly larger than the outer diameter of the flange 46 around the opening 47. 48 is formed so as to have the same depth as the thickness of the brim portion 46. That is, the outer diameter of the separation cylinder 44 is
Smaller than the diameter of the opening 47 by the width of each of the beams 45a to 45c
Value. The holding hole 48 engages with the flange 46 to hold the flange 46. In order to make the flange 46 easily detachable, a part of the holding hole 48 is cut off on the side of the slider 42, Further, three magnets 49a to 49c for fixing the collar 46 are embedded. Also,
The flange 46 is provided with each of the magnets 49a to 49c of the holding hole 48.
A magnet or a magnetic material (not shown) is provided at a lower portion corresponding to the above, and this magnet can be attracted to each of the magnets 49 a to 49 c of the holding hole 48.

【0026】従って、スライダ部42の保持穴48に暗
視野用筒部43のツバ部46を係合させ、且つ保持穴4
8の各マグネット49a〜49cにツバ部46の各マグ
ネット49a〜49cを吸着させることにより、暗視野
用スライダ41が形成される。
Accordingly, the flange 46 of the dark-field tube 43 is engaged with the holding hole 48 of the slider 42 and the holding hole 4
The dark field slider 41 is formed by causing the magnets 49a to 49c of the 8 to attract the magnets 49a to 49c of the brim portion 46.

【0027】なお、マグネットはスライダ41または分
離筒44の少なくとも一方に設け、このマグネットと対
峙する他方にマグネットまたは磁性体を設けることによ
り、分離筒44をスライダ41に磁気的に位置決め固定
することができる。
The magnet is provided on at least one of the slider 41 and the separation tube 44, and a magnet or a magnetic body is provided on the other side of the magnet so that the separation tube 44 can be magnetically positioned and fixed to the slider 41. it can.

【0028】以下、前述した通り、暗視野用スライダ4
1が取付け座18に挿入されることにより、落射暗視野
光学系が構成されて鮮明な観察像を得ることができる。
上述したように第2の実施例によれば、暗視野用スライ
ダ41をスライダ部42及び暗視野用筒部43を組合わ
せて構成しても、第1の実施例を同様に実施して同様の
効果を得ることができる。
Hereinafter, as described above, the dark-field slider 4
By inserting 1 into the mounting seat 18, an epi-illumination dark-field optical system is formed, and a clear observation image can be obtained.
As described above, according to the second embodiment, even if the dark-field slider 41 is configured by combining the slider section 42 and the dark-field cylinder section 43, the first embodiment is implemented in the same manner. The effect of can be obtained.

【0029】次に、本考案の第3の実施例に係る顕微鏡
について説明する。図4はこの顕微鏡に適用される暗視
野用スライダの構成を示す斜視図及びそのB−B線矢視
断面図である。
Next, a microscope according to a third embodiment of the present invention will be described. FIG. 4 is a perspective view showing a configuration of a dark field slider applied to this microscope, and a cross-sectional view taken along line BB of FIG.

【0030】この暗視野用スライダ51は、奥側の端部
51aに梁部52が設けられ、この梁部52が上部及び
下部暗視野用筒8,11と同一径の円筒状に形成された
分離筒53を固定している。
The dark field slider 51 is provided with a beam portion 52 at a rear end 51a, and the beam portion 52 is formed in a cylindrical shape having the same diameter as the upper and lower dark field tubes 8 and 11. The separation cylinder 53 is fixed.

【0031】また、暗視野用スライダ51は、この分離
筒53よりも手前側で光学素子としての微分干渉用プリ
ズム54を有している。暗視野用スライダ51は、上下
方向に沿って側部に第1の溝55が形成され、且つこの
第1の溝55から分離筒53の内側中央と微分干渉用プ
リズム54の中央との間の距離だけ離間して第1の溝5
5に平行に第2の溝56が形成されている。
The dark-field slider 51 has a differential interference prism 54 as an optical element on the front side of the separation tube 53. In the dark-field slider 51, a first groove 55 is formed on a side portion along the vertical direction, and a first groove 55 is formed between the first groove 55 and the center of the inside of the separation tube 53 and the center of the differential interference prism 54. First groove 5 separated by a distance
A second groove 56 is formed in parallel with 5.

【0032】一方、図示しない取付け座18では、暗視
野用スライダ51がスライダ挿脱口19に挿入され、こ
の暗視野用スライダ51の分離筒53の内側中心を光路
の中央に一致させたとき、暗視野用スライダ51の側部
に形成された第1の溝55に係合するように、内部にク
リック機構(図示せず)が設けられている。
On the other hand, in the mounting seat 18 (not shown), the dark-field slider 51 is inserted into the slider insertion / removal opening 19, and when the inner center of the separation tube 53 of the dark-field slider 51 is aligned with the center of the optical path, the dark field slider is dark. A click mechanism (not shown) is provided inside so as to engage with a first groove 55 formed on a side portion of the visual field slider 51.

【0033】次に、このような顕微鏡の作用を説明す
る。操作者の操作により、暗視野用スライダ51がスラ
イダ挿脱口19に挿入されると共に、取付け座18のク
リック機構が第1の溝55に係合し、暗視野用スライダ
51が位置決めされる。このとき、暗視野用スライダ5
1の分離筒53は光路に挿入されており、顕微鏡は落射
暗視野光学系を構成する。
Next, the operation of such a microscope will be described. By the operation of the operator, the dark-field slider 51 is inserted into the slider insertion / removal opening 19, and the click mechanism of the mounting seat 18 is engaged with the first groove 55, whereby the dark-field slider 51 is positioned. At this time, the dark-field slider 5
One separation tube 53 is inserted into the optical path, and the microscope constitutes an epi-illumination dark-field optical system.

【0034】一方、落射暗視野光学系から微分干渉光学
系に切換えるとき、ポラライザ16の取付け等を前述同
様に行った後、操作者の操作により、暗視野用スライダ
51がさらに挿入され、取付け座18のクリック機構が
第2の溝56に係合して暗視野用スライダ51を位置決
めする。このとき、暗視野用スライダ51が保持する微
分干渉用プリズム54は光路に挿入されており、顕微鏡
は微分干渉光学系を構成する。
On the other hand, when switching from the epi-illumination dark-field optical system to the differential interference optical system, the polarizer 16 is mounted in the same manner as described above, and the dark-field slider 51 is further inserted by the operation of the operator. The click mechanism 18 engages with the second groove 56 to position the dark field slider 51. At this time, the differential interference prism 54 held by the dark field slider 51 is inserted in the optical path, and the microscope forms a differential interference optical system.

【0035】再度、微分干渉光学系から落射暗視野光学
系に切換えるとき、ポラライザ16の取り外し等を前述
同様に行った後、操作者の操作により、暗視野用スライ
ダ51を引いて取付け座18のクリック機構を第1の溝
55に係合させる。
When switching from the differential interference optical system to the epi-illumination dark-field optical system again, the polarizer 16 is removed in the same manner as described above, and then the dark-field slider 51 is pulled by an operator's operation to mount the mounting seat 18. The click mechanism is engaged with the first groove 55.

【0036】このように、1つの暗視野用スライダ51
を用いて落射暗視野光学系及び微分干渉光学系を切換え
ることができ、且つ分離筒53により、前述同様に鮮明
な観察像を得ることができる。
As described above, one dark field slider 51
Can be used to switch between the epi-illumination dark-field optical system and the differential interference optical system, and a clear observation image can be obtained by the separation cylinder 53 as described above.

【0037】上述したように第3の実施例によれば、暗
視野用スライダ51が落射暗視野検鏡のときとは異なる
ときに使用可能な微分干渉用プリズム54を備えている
ので、第1の実施例の効果に加え、落射暗視野検鏡から
この微分干渉用プリズム54を用いる落射微分干渉検鏡
への切換えを容易に行うことができる。
As described above, according to the third embodiment, since the dark-field slider 51 is provided with the differential interference prism 54 that can be used when the dark-field slider 51 is different from that of the epi-illumination dark-field spectroscope, In addition to the effects of the embodiment, it is possible to easily switch from the epi-illumination dark-field speculum to the epi-illumination differential interference spectroscopy using the differential interference prism 54.

【0038】なお、上記第1乃至第3の実施例では、落
射暗視野検鏡の他に落射微分干渉検鏡を使用可能な場合
について説明したが、これに限らず、落射暗視野検鏡の
他に偏光法等の検鏡法を使用可能な構成としても、ま
た、無限遠光学系や有限光学系に構成しても、本考案を
同様に実施して同様の効果を得ることができる。
In the first to third embodiments, a case has been described in which an epi-illumination differential interference spectroscope can be used in addition to the epi-illumination dark-field spectroscope. However, the present invention is not limited to this. The present invention can be carried out in the same manner and the same effect can be obtained regardless of the configuration in which a speculum method such as a polarization method can be used, or the configuration of an infinite optical system or a finite optical system.

【0039】また、上記第3の実施例では、落射微分干
渉検鏡を使用可能なことに伴って暗視野用スライダ51
が微分干渉用プリズム54を保持する場合について説明
したが、これに限らず、他の検鏡法を使用可能として該
他の検鏡法に用いる光学素子を暗視野用スライダが保持
する構成としても、本考案を同様に実施して同様の効果
を得ることができる。その他、本考案はその要旨を逸脱
しない範囲で種々変形して実施できる。
Further, in the third embodiment, the dark-field slider 51
Has described the case where the differential interference prism 54 is held. However, the present invention is not limited to this, and the dark field slider may hold an optical element used for the other light inspection method by using another light inspection method. The same effect can be obtained by implementing the present invention in the same manner. In addition, the present invention can be implemented with various modifications without departing from the gist thereof.

【0040】[0040]

【考案の効果】以上説明したように請求項1の考案によ
れば、落射暗視野検鏡のとき、スライダ挿脱口に挿入さ
れた暗視野用スライダが、照明光と観察光とを分離する
分離筒を形成するようにしたので、落射暗視野検鏡のと
きのスライダ挿脱口における照明光と観察光とを分離す
ることにより、鮮明な観察像を得ることができる顕微鏡
を提供できる。
As described above, according to the first aspect of the present invention, in the case of an epi-illumination dark-field speculum, the dark-field slider inserted into the slider insertion opening separates the illumination light and the observation light. Since the tube is formed, it is possible to provide a microscope capable of obtaining a clear observation image by separating the illumination light and the observation light at the slider insertion / removal port in the case of the epi-illumination dark field spectroscope.

【0041】また、請求項2の考案によれば、暗視野用
スライダが落射暗視野検鏡のときとは異なるときに使用
可能な光学素子を備えるようにしたので、請求項1の効
果に加え、落射暗視野検鏡からこの光学素子を用いる他
の検鏡へ容易に切換できる顕微鏡を提供できる。
According to the second aspect of the present invention, the dark field slider is provided with an optical element which can be used when the dark field slider is different from that of the epi-illumination dark field speculum. Thus, it is possible to provide a microscope that can be easily switched from an epi-illumination dark-field microscope to another microscope using this optical element.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本考案の第1の実施例に係る顕微鏡に適用され
る暗視野用スライダの構成を示す斜視図及びそのA−A
線矢視断面図。
FIG. 1 is a perspective view showing a configuration of a dark field slider applied to a microscope according to a first embodiment of the present invention, and its AA.
FIG.

【図2】同実施例における取付け座の断面図。FIG. 2 is a sectional view of a mounting seat in the embodiment.

【図3】本考案の第2の実施例に係る顕微鏡に適用され
る暗視野用スライダの構成を示す斜視図。
FIG. 3 is a perspective view showing a configuration of a dark field slider applied to the microscope according to the second embodiment of the present invention.

【図4】本考案の第3の実施例に係る顕微鏡に適用され
る暗視野用スライダの構成を示す斜視図及びそのB−B
線矢視断面図。
FIG. 4 is a perspective view showing the configuration of a dark field slider applied to the microscope according to the third embodiment of the present invention, and its BB line.
FIG.

【図5】従来の顕微鏡の落射微分干渉光学系を示す図。FIG. 5 is a diagram illustrating an epi-illumination differential interference optical system of a conventional microscope.

【図6】従来の顕微鏡の取付け座の構成を示す平面図。FIG. 6 is a plan view illustrating a configuration of a mounting seat of a conventional microscope.

【図7】従来の顕微鏡の取付け座の構成を示す側面図及
び断面図。
FIG. 7 is a side view and a cross-sectional view showing a configuration of a mounting seat of a conventional microscope.

【図8】従来の顕微鏡の落射暗視野光学系を示す図。FIG. 8 is a diagram showing an epi-illumination dark-field optical system of a conventional microscope.

【図9】従来の顕微鏡の取付け座の構成を示す平面図。FIG. 9 is a plan view showing a configuration of a mounting seat of a conventional microscope.

【図10】従来の顕微鏡の取付け座の構成を示す側面図
及び断面図。
FIG. 10 is a side view and a cross-sectional view showing a configuration of a mounting seat of a conventional microscope.

【符号の説明】[Explanation of symbols]

31,41,51…暗視野用スライダ、32,47…開
口部、33a〜33c,45a〜45c,52…梁部、
34,44,53…分離筒、42…スライダ部、43…
暗視野用筒部、46…ツバ部、48…保持穴、49a〜
49c…マグネット、55…第1の溝、56…第2の
溝。
31, 41, 51 ... dark field slider, 32, 47 ... opening, 33a to 33c, 45a to 45c, 52 ... beam,
34, 44, 53 ... separation cylinder, 42 ... slider part, 43 ...
Dark field tube part, 46 ... collar part, 48 ... holding hole, 49a-
49c: magnet, 55: first groove, 56: second groove.

Claims (2)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 対物レンズからの観察光を遮ることなく
観察光路上に配置された照明光入射部により、照明光を
入射させて観察試料を照明する落射照明光学系を備え、
前記照明光入射部と前記対物レンズとの間にスライダ挿
脱口を設け、このスライダ挿脱口にスライダを挿脱する
ことにより、検鏡法を切替える顕微鏡において、 落射暗視野検鏡のとき、前記スライダに代えて前記スラ
イダ挿脱口に挿入され、照明光と観察光とを分離する分
離筒を形成する暗視野用スライダを備えたことを特徴と
する顕微鏡。
1. An epi-illumination optical system for illuminating an observation sample by irradiating illumination light with an illumination light incident portion arranged on an observation optical path without blocking observation light from an objective lens,
A microscope that switches a microscopy method by providing a slider insertion / removal opening between the illumination light incident portion and the objective lens and inserting / removing a slider into / from the slider insertion / removal opening; A microscope provided with a dark-field slider which is inserted into the slider insertion / removal opening and forms a separation tube for separating illumination light and observation light.
【請求項2】 暗視野用スライダは、前記落射暗視野検
鏡のときとは異なるときに使用可能な光学素子を備えた
ことを特徴とする請求項1記載の顕微鏡。
2. The microscope according to claim 1, wherein the dark-field slider includes an optical element that can be used at a time different from that of the incident-light dark-field microscope.
JP1993057687U 1993-10-26 1993-10-26 microscope Expired - Lifetime JP2601776Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1993057687U JP2601776Y2 (en) 1993-10-26 1993-10-26 microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1993057687U JP2601776Y2 (en) 1993-10-26 1993-10-26 microscope

Publications (2)

Publication Number Publication Date
JPH0726815U JPH0726815U (en) 1995-05-19
JP2601776Y2 true JP2601776Y2 (en) 1999-12-06

Family

ID=13062860

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1993057687U Expired - Lifetime JP2601776Y2 (en) 1993-10-26 1993-10-26 microscope

Country Status (1)

Country Link
JP (1) JP2601776Y2 (en)

Also Published As

Publication number Publication date
JPH0726815U (en) 1995-05-19

Similar Documents

Publication Publication Date Title
US5966204A (en) Near-infrared microscope
JPH0735986A (en) Inverted type and erected type microscope
JP4671463B2 (en) Illumination optical system and microscope equipped with illumination optical system
US3925793A (en) Eye fundus camera with focus setting device
JP3656252B2 (en) Differential interference microscope
US20070194206A1 (en) Confocal laser scanning microscope
JP5162781B2 (en) Microscope assembly
JPH01503493A (en) Scanning confocal optical microscope
US20020131165A1 (en) Inverted microscope system
US5808790A (en) Integrated microscope providing near-field and light microscopy
US4512640A (en) Polarizing microscope
JP3523348B2 (en) Slit lamp microscope
US5296962A (en) High sensitivity microscope
JP2601776Y2 (en) microscope
JP2004163555A (en) Vertical illumination microscope and objective for vertical illumination microscope
JP2004318181A (en) Inverted microscope
JPH07218425A (en) Faraday microscope
JP2599309Y2 (en) Epi-illumination device
JP3178592B2 (en) Confocal microscope
JP2001083430A (en) Inverted microscope device
JPH07253545A (en) Differantial interference microscope
JP2000035540A (en) Differential interference microscope
JPH1020199A (en) Compound microscope
US20050099679A1 (en) Microscope especially inverted microscope
JP2002031763A (en) Optical element switching turret

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19990831

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071001

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081001

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091001

Year of fee payment: 10

EXPY Cancellation because of completion of term
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091001

Year of fee payment: 10