JP2570353B2 - Data line test method - Google Patents

Description

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a data line test system for measuring a bit error of a digital subscriber line in a digital exchange.

[Prior Art] Conventionally, as shown in FIG. 3, this type of data circuit test system is performed between data terminals accommodated in a switching system, that is, end-to-end. A device for bit error measurement was connected instead of the data terminal, the line was connected end-to-end, and a loopback was performed on one side to perform a bit error measurement test. The test method will be described briefly. The line between the bit error measuring device 7 and the data terminal 52 on the side to be looped back is connected, the data terminal interface device 12 is set to the loop back mode by key operation or the like, and the bit error is set. Measuring instrument 7 to data terminal interface device 11, digital data subscriber line device
21, the test pattern data is sent out via the time division switch 3, the data terminal interface device 12 detects the turned back test pattern data, and measures the bit error.

In addition, as shown in FIG.
Is provided, the bit error measurement is set for each terminal, and only the test of the own subscriber line is performed from an arbitrary data terminal.

[Problems to be Solved by the Invention] However, the above-described conventional data line test method has an end-to-end connection between data terminal devices accommodated in an exchange.
Since the test is performed from end to end, the subscriber line
There is a round, and if an error occurs in the bit error measurement test and there is an abnormality in the line, there is a disadvantage that it is not possible to distinguish which line has an abnormality.

Further, there is a disadvantage that a device for measuring bit errors is required, and it is not possible to arbitrarily and easily perform a test from each data terminal.

Further, there is a drawback that a test instruction can be given only from the data terminal connected to the subscriber's line under test, and only the test for the own subscriber's line is possible.

[Means for Solving the Problems] It is an object of the present invention to solve the above problems and to provide a data line test system capable of easily performing a line bit error test without using a bit error measuring device. And

In order to achieve the above object, a data line test method according to the present invention is a digital switch which accommodates data terminal equipment and provides a data communication function service. A time-division switch interface circuit for transmitting data multiplexed to a plurality of channels, a generation circuit for generating test pattern data for a data line test and transmitting the test pattern data to the time-division switch interface circuit, and a time-division switch interface circuit from a data terminal. A detection circuit for detecting the test pattern data folded back through the circuit and measuring a bit error; and returning response data to control data from a central processing control device of the digital exchange, and controlling the generation circuit and the detection circuit. Control circuit to perform and time division It instructs the bit error measurement to the control circuit by receiving the bit error measurement instruction from a specified data terminals connected through a switch,
A data line simple test apparatus provided with a circuit for notifying the data terminal of a measurement result from the control circuit; and the digital exchange is provided with a data terminal for directly interfacing the data line simple test apparatus with the data terminal equipment. The data terminal and the data line simple test device are controlled by turning the subscriber number of the data line simple test device from any data terminal by controlling the same as the digital data subscriber line device located on the exchange side facing the interface device. By connecting the data terminals, bit error measurement tests for any digital data subscriber line can be performed singly or simultaneously from the data terminal.

Example Next, an example of the present invention will be described with reference to the drawings.

FIG. 1 is a diagram showing a relay system of a data line test system according to an embodiment of the present invention.

In the figure, data terminals 50, 51, 52 interface directly with data terminal interface devices 10, 11, 12 and are accommodated in a digital exchange. The digital data subscriber line devices 20, 21, and 22 are interface devices for exchanging communication data via the data terminal interface devices 10, 11, and 12 through time-division switches, and are controlled by the central processing controller 6 of the exchange. This is a device that controls the data terminal interface devices 10, 11, and 12 based on.

The time-division switch 3 connects each of the digital data subscriber line devices 20, 21, and 22, and connects the data line simple test device 4 to a position facing the digital data subscriber line devices 20, 21, and 22. The data line simple test apparatus 4 receives an instruction of a bit error measurement test of an arbitrary line from an arbitrary specific terminal, 50 in the figure, and outputs a measurement result.

 Next, the operation of the present embodiment will be described.

By calling the subscriber number assigned to the data line simple test device 4 from the data terminal 50, the data terminal 50 and the data line simple test device 4 are connected, and the subscriber number under test input from the data terminal 50 is entered. The data line simple test apparatus 4 can receive the data. The subscriber under test is analyzed by analyzing the subscriber number under test received from the data terminal 50 in the data line simple test apparatus 4 and then performed by the data line simple test apparatus 4 to the subscriber under test to call the subscriber under test. . At this time, the data terminal interface device 1 of the subscriber under test
1 and 12 are automatic answering modes in which a communication path is connected at the same time as an incoming call. Sends test pattern data from the data terminal interface device 1
The test pattern data looped back at 1 and 12 is detected by the data line simple test apparatus 4 and the bit error is measured. The measurement time is input simultaneously when the subscriber number under test is input from the data terminal 50 in advance. Here, if the measurement time has not been input, it follows a predetermined initial value.

When the measured measurement time has elapsed, the data line simple test apparatus 4 automatically disconnects the call to the subscriber under test and notifies the data terminal 50 of the bit error measurement result obtained. The data terminal 50 can set not only one subscriber under test but also a plurality of subscribers under test, and can simultaneously perform bit error tests on a plurality of lines.

FIG. 4 is a functional block diagram of the data line simple test apparatus 4.

In the figure, a time-division switch interface circuit 41
The test pattern data detection circuit 42 receives data signals of a plurality of channels multiplexed from the time-division switch.
To separate channels for transmission. The test pattern data generation circuit 43 generates test pattern data for a bit error test and generates a time-division switch interface circuit.
Send to 41. The data signal from the test pattern data generation circuit 43 is multiplexed with the data signal from another test pattern data generation circuit by the time division switch interface circuit 41 and sent to the time division switch. The test instruction terminal interface circuit 44 is a circuit that receives the number of the subscriber under test from the test instruction terminal, passes it to the control circuit 46, receives the measurement result from the control circuit 46, and sends it to the test instruction terminal. The central processing controller interface circuit 45 is a circuit for interfacing the transmission and reception of control signals between the central processing controller of the exchange and the control circuit 46 in the data line simple test apparatus. The control circuit 46 operates as if the control signal from the central processing controller was received by the digital data subscriber line device.
43 and the test pattern data detection circuit 42.

There is no distinction between the data line simple test equipment and the digital data subscriber line equipment as the software of the exchange.
By turning the subscriber number for the bit error measurement test predetermined by the operator, the operator is connected to this data line simple test device, performs a bit error measurement test of any line, and checks the quality of the data line it can. These tests are performed not only within the own station but also between stations connected by a digital dedicated line.

[Effects of the Invention] As described above, according to the present invention, a data line simple test device is provided so as to be controlled by a central processing control device of a digital exchange equivalent to a digital data subscriber line device, and subscribed for bit error testing. By assigning the subscriber number, one terminal can be connected by turning the subscriber number of the data line simple test apparatus without using a bit error measuring device by connecting from any data terminal to another test data terminal. This makes it possible to easily and simultaneously perform a bit error test on a plurality of other lines and check the quality of the data line. Furthermore, there is an effect that the software program of the exchange can be handled without special changes.

[Brief description of the drawings]

FIG. 1 is a diagram showing a relay system of a data line test system according to one embodiment of the present invention, FIG. 2 is a functional block diagram of a data line simple test device used in the data line test system according to one embodiment of the present invention, FIG. 3 and FIG. 4 are diagrams showing a relay system of the conventional data line test system. 10, 11, 12: Data terminal interface device 20, 21, 22: Digital data subscriber line device 3: Time division switch 4, 8: Simple data line test device 41: Time division switch interface circuit 42: Test pattern data detection circuit 43: Test pattern data generation circuit 44: Test instruction terminal interface circuit 45: Central processing controller interface circuit 46: Control circuit 50, 51, 52: Data terminal 6: Central processing controller 7: Bit error measuring instrument

Claims (1)

(57) [Claims] In a digital exchange accommodating data terminal equipment and providing a data communication function service, a time-division switch receives data multiplexed on a plurality of channels from a time-division switch and transmits data multiplexed on a plurality of channels to the time-division switch. A switch interface circuit, a generation circuit for generating test pattern data for a data line test and sending the test pattern data to the time division switch interface circuit, and the test pattern data folded back from the data terminal via the time division switch interface circuit And a control circuit for returning response data to the control data from the central processing control unit of the digital exchange, and controlling the generation circuit and the detection circuit, and a time division switch. Specific data terminal Receiving a bit error measurement instruction from the control circuit, instructing the control circuit to perform bit error measurement, and a circuit for notifying a measurement result from the control circuit to the data terminal. The digital exchange controls the data line simple test device in the same manner as a digital data subscriber line device located on the exchange side opposite to a data terminal interface device installed on the data terminal device side and directly interfacing, and from any data terminal. By turning the subscriber number of the data line simple test device and connecting the data terminal and the data line simple test device, the bit error measurement test of any digital data subscriber line from the data terminal alone or A data line test method characterized in that multiple tests are performed simultaneously.